CN107014492B - A kind of self-reference Terahertz electro-optic sampling spectrointerferometer and measuring system - Google Patents
A kind of self-reference Terahertz electro-optic sampling spectrointerferometer and measuring system Download PDFInfo
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- CN107014492B CN107014492B CN201710385861.XA CN201710385861A CN107014492B CN 107014492 B CN107014492 B CN 107014492B CN 201710385861 A CN201710385861 A CN 201710385861A CN 107014492 B CN107014492 B CN 107014492B
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- 238000005070 sampling Methods 0.000 title claims abstract description 21
- 239000013078 crystal Substances 0.000 claims abstract description 46
- 230000003595 spectral effect Effects 0.000 claims abstract description 19
- 238000005259 measurement Methods 0.000 claims abstract description 17
- 230000010287 polarization Effects 0.000 claims description 22
- 238000001228 spectrum Methods 0.000 claims description 15
- 230000005684 electric field Effects 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 7
- 238000005516 engineering process Methods 0.000 claims description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 4
- 210000001367 artery Anatomy 0.000 claims description 3
- 238000004080 punching Methods 0.000 claims description 3
- 230000011514 reflex Effects 0.000 claims description 3
- 210000003462 vein Anatomy 0.000 claims description 3
- 239000000523 sample Substances 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 7
- 238000004611 spectroscopical analysis Methods 0.000 abstract description 5
- 230000003287 optical effect Effects 0.000 abstract description 3
- 229910007709 ZnTe Inorganic materials 0.000 description 3
- 230000005611 electricity Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 241000239290 Araneae Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 238000001328 terahertz time-domain spectroscopy Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
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- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The present invention is suitable for Terahertz field of measuring technique more particularly to a kind of self-reference Terahertz electro-optic sampling spectrointerferometer and measuring system.Self-reference Terahertz electro-optic sampling spectrointerferometer provided by the present invention includes pulse stretcher, broad band half wave piece, lens, Terahertz electro-optic crystal, birefringece crystal, linear polarizer and spectrometer.Above-mentioned optical element is designed by cleverly self-reference interference structure, on the basis of being based on electro optic sampling and spectral interference principle, chirped pulse is used to realize the single measurement to high-intensitive terahertz pulse time-domain spectroscopy for probe.
Description
Technical field
The invention belongs to Terahertz field of measuring technique more particularly to a kind of self-reference Terahertz electro-optic sampling spectral interferences
Instrument and measuring system.
Background technique
THz wave has the unique properties such as high perspectivity, high security, high spectral resolution, therefore has important
Learning value and application potential.With being constantly progressive for terahertz optics technology, the intensity in terahertz signal source constantly enhances, and urges
Terahertz high field and nonlinear spectroscopy are given birth to.However, the terahertz light sufficiently strong, traditional due to terahertz pulse intensity
Conductance sampling and two kinds of electro optic sampling common technologies are no longer applicable in, and traditional technology, which can not be measured effectively, has high letter
It makes an uproar the strong terahertz pulse of ratio.
Summary of the invention
The present invention provides a kind of self-reference Terahertz electro-optic sampling spectrointerferometers, it is intended to which solution can not be measured effectively
There is the problem of strong terahertz pulse of high s/n ratio.
In order to solve the above technical problems, the invention is realized in this way, the present invention provides a kind of self-reference Terahertz electricity
Light samples spectrointerferometer, which includes:
Pulse stretcher, for by incident direct impulse broadening at chirped pulse, the chirped pulse that broadens into
Direct impulse is incident to broad band half wave piece；
The broad band half wave piece, it is modulated for adjusting the polarization direction of the direct impulse for having broadened into chirped pulse
The direct impulse of whole polarization direction is incident to lens；
The lens, for the direct impulse for having adjusted polarization direction to be focused to Terahertz electro-optic crystal；
The Terahertz electro-optic crystal, for being overlapped the direct impulse with incident terahertz pulse to be measured, with reality
Now the THz electric field strong signal of the terahertz pulse to be measured is loaded into the direct impulse, has been loaded with Terahertz field strength
The direct impulse of signal is incident to birefringece crystal；
The birefringece crystal, for making the direct impulse for being loaded with THz electric field strong signal generate the mutual time
The pulse pair of delay, respectively o light pulse and e light pulse, and the polarization direction of the o light pulse and e light pulse is orthogonal,
The pulse pair is incident to linear polarizer；
The linear polarizer, o light pulse and e light pulse for making the pulse pair it is uniform it is semi-transparent be incident upon spectrometer, thoroughly
The pulse pair polarization direction for crossing the linear polarizer is consistent；
The spectrometer, for recording the spectral interference data of the pulse pair after the linear polarizer, to be based on institute
It states spectral interference data and realizes the measurement of Terahertz electric light phase-modulation.
Further, the interferometer further includes relevant electric field reconstruction method (SPIDER) the technology measuring device of spectrum phase,
For measuring, obtaining to the time spectra characteristic of the direct impulse before the direct impulse is incident to stretcher
The time spectra characteristic of the direct impulse.
Further, the interferometer further includes silicon wafer；The silicon wafer is brilliant between the lens and the Terahertz electric light
Between body, for incident terahertz pulse to be measured to be transmitted through the Terahertz electro-optic crystal in low-loss situation, and
The direct impulse that the lens are emitted is reflexed into the Terahertz electro-optic crystal.
Further, the terahertz pulse to be measured for being incident to the Terahertz electro-optic crystal and the direct impulse exist
It time and is spatially overlapped.
Further, the mutual time delay for the pulse pair that the birefringece crystal generates is proportional to described birefringent
The refringence and its thickness of o light pulse and the e light pulse of crystal.
Further, the direct impulse is the ultrashort femtosecond pulse of linear polarization.
Further, the pulse stretcher is specifically used for the chirp arteries and veins by incident direct impulse broadening at picosecond
Punching.
Further, the o light pulse of the light transmission shaft of the linear polarizer and the pulse pair and e light pulse polarization direction at
45°。
The present invention also provides a kind of self-reference Terahertz electro-optic sampling spectral interference measuring system, the system includes upper
All elements in self-reference Terahertz electro-optic sampling spectrointerferometer stated, and there is above-mentioned self-reference Terahertz electric light to take
Function possessed by sample spectrointerferometer.
Compared with prior art, the present invention beneficial effect is:
The present invention provides a kind of self-reference Terahertz electro-optic sampling spectrointerferometer, which includes pulse broadening
Device, broad band half wave piece, lens, Terahertz electro-optic crystal, birefringece crystal, linear polarizer and spectrometer.Above-mentioned optical element
It is designed by cleverly self-reference interference structure, on the basis of being based on electro optic sampling and spectral interference principle, using chirp arteries and veins
Punching is that probe realizes the single measurement to high-intensitive terahertz pulse time-domain spectroscopy, improves strong terahertz pulse single measurement
Signal-to-noise ratio.
Detailed description of the invention
Fig. 1 is self-reference Terahertz electro-optic sampling spectrointerferometer structural schematic diagram provided in an embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
As one embodiment of the invention, as shown in Figure 1, a kind of self-reference Terahertz electric light provided by the invention takes
Sample spectrointerferometer, the interferometer include pulse stretcher 102, broad band half wave piece 103, first lens 106, Terahertz electricity
Luminescent crystal 109, birefringece crystal 111, linear polarizer 112 and spectrometer 113.In addition, as shown in Figure 1, THz pulse is indicated
Terahertz pulse, Probe pulse indicate direct impulse, and interferometer provided by the present embodiment further includes based on spectrum phase phase
The measuring device SPIDER101 of dry electric field reconstruction law technology, second lens 110, silicon wafer 108, for playing reflex
Reflecting mirror 104/105 and off axis paraboloidal mirror (OAPM) 107.
Pulse stretcher 102 is broadened into for broadening incident direct impulse Probe pulse at chirped pulse
The direct impulse of chirped pulse is incident to broad band half wave piece 103.In the present embodiment, direct impulse Probe pulse is polarization
Ultrashort femtosecond pulse, pulse stretcher 102 is by incident direct impulse broadening at the chirped pulse of picosecond.
Broad band half wave piece 103 has been adjusted for adjusting the polarization direction of the above-mentioned direct impulse for having broadened into chirped pulse
The direct impulse of polarization direction is incident to lens 106.
Lens 106, for the above-mentioned direct impulse for having adjusted polarization direction to be focused to Terahertz electro-optic crystal 109；
Terahertz electro-optic crystal 109, for making above-mentioned direct impulse and incident terahertz pulse THzpulse to be measured exist
It is overlapped over time and space in Terahertz electro-optic crystal 109, to realize above-mentioned terahertz pulse THz pulse to be measured too
Hertz field intensity signal is loaded into direct impulse, i.e. realization Electro-optical Modulation, has been loaded with the direct impulse of THz electric field strong signal
It is incident to birefringece crystal 111.The axial plane of Terahertz electro-optic crystal 109 is parallel with the plane of incidence.Wherein, terahertz pulse to be measured
THz pulse is to be incident to Terahertz electro-optic crystal 109, off axis paraboloidal mirror after off axis paraboloidal mirror OAPM107 focusing
107 are mainly used for focusing terahertz pulse.
Birefringece crystal 111, for making the above-mentioned direct impulse for being loaded with THz electric field strong signal generate the mutual time
The o light pulse and e light pulse of delay, the o light pulse and e light pulse are a pair of of pulse pair.O light pulse is inclined with e light pulse
Shaking, direction is orthogonal, which is incident to linear polarizer 112.The mutual time for the pulse pair that birefringece crystal 111 generates
Delay is proportional to the refringence of o light pulse and the e light pulse of the birefringece crystal, also proportional to the o light of the birefringece crystal
The thickness of pulse and e light pulse, and the intensity of the pulse pair is nearly equal.
Linear polarizer 112, o light pulse and e light pulse for making above-mentioned pulse pair it is uniform it is semi-transparent be incident upon spectrometer 113,
And it is consistent through the pulse pair polarization direction of linear polarizer 112.The o light of the light transmission shaft of the linear polarizer 112 and above-mentioned pulse pair
Pulse and e light pulse polarization direction are at 45 °.
Spectrometer 113, for recording the light of the above-mentioned pulse pair (i.e. o light pulse and e light pulse) after linear polarizer 112
Interference data is composed, to realize the measurement of Terahertz electric light phase-modulation based on the spectral interference data.Wherein, spectral interference data
In include Terahertz electric light phase-modulated information.
In the present embodiment, interferometer further includes the measuring device of electric field reconstruction law technology of being concerned with based on spectrum phase
SPIDER101, for before direct impulse Probe pulse is incident to stretcher, to direct impulse Probe pulse when
Between spectral characteristic measure, obtain the time spectra characteristic of direct impulse Probe pulse, for assist realize Terahertz when
Domain spectral measurement.
In the present embodiment, interferometer further includes silicon wafer 108, between lens 106 and Terahertz electro-optic crystal 109 it
Between, for incident terahertz pulse to be measured to be transmitted through Terahertz electro-optic crystal 109 in low-loss situation, and by lens
The direct impulse of 106 outgoing reflexes to Terahertz electro-optic crystal 109.
It should be noted that complete to measure terahertz time-domain spectroscopy, need to carry out experiment measure spectrum interference twice
Data, detailed process is as follows:
(1) in the case where no terahertz pulse is interfered, measurement obtains only direct impulse by above-mentioned interference instrument
After a series of elements, the direct impulse interference fringe data that spectrometer collection arrives make the direct impulse interference fringe data
For reference data.
(2) in the case where there is terahertz pulse interference, interference fringe data when what is measured has a terahertz signal,
This has interference fringe data when terahertz signal as detection data.
(3) the time spectra characteristic for measuring obtained direct impulse in advance and reference data and detection data, warp are combined
Crossing Fourier transformation processing can be obtained terahertz time-domain waveform.
In conclusion interferometer provided by first embodiment of the invention, optical element passes through cleverly self-reference
Interference structure design uses chirped pulse to realize pair for probe on the basis of being based on electro optic sampling and spectral interference principle
The single measurement of high-intensitive terahertz pulse time-domain spectroscopy improves strong terahertz pulse single measurement signal-to-noise ratio；And this implementation
Example records interference spectrum to realize that electric light phase-modulation measures, so that terahertz time-domain waveform is obtained, with tradition by spectrometer
Time-domain spectroscopy instrument is compared, have the advantages that in real time, high linearity and distortionless；In addition, for Terahertz light source, Terahertz
Pulse means that more by force pulse recurrence rate is lower, this cause to be measured with traditional pumping-probe technique can bring it is larger
Measurement error, and interferometer provided by the present embodiment can effectively avoid measurement error with single measurement.
As second embodiment of the invention, as shown in Figure 1, ultra-short pulse laser system is as sending direct impulse
System selects the Ti:Sapphire laser fs-laser system of 800nm, the part ultra-short pulse laser time spectra of output in the present embodiment
Characteristic is obtained with a SPIDER101 device measurement.The ultra-short pulse laser is broadened by stretcher 102 at about as direct impulse
The chirped pulse of 10ps.The direct impulse broadened passes through an achromatism half-wave plate 103 for the polarization direction of the direct impulse
It rotates, rotates 45 ° by original level (or vertical) direction.Then Terahertz electric light is focused it on through a lens 106
On crystal, the Terahertz electro-optic crystal is the ZnTe crystal of<110>degree in the present embodiment, inside Terahertz electro-optic crystal, is visited
It surveys pulse to be overlapped over time and space with terahertz pulse signal to be measured, THz electric field strong signal is loaded by electrooptic effect
Into direct impulse.After Terahertz electro-optic crystal, the direct impulse of THz electric field strong signal has been loaded with through 200mm thickness
α-bbo crystal, it is nearly equal but polarization direction is mutually perpendicular to and there are mutual time delay 600fs's to generate an intensity
Pulse pair, i.e. o light pulse and e light pulse.The pulse pair is at 45 ° through a light transmission shaft and the polarization direction of o light pulse and e light pulse
Linear polarization 112 after, received to obtain interference spectrum signal by a spectrometer.Corresponding spectral interference ring may be expressed as:
Wherein, Iref(ω) indicates reference light spectrum, Ipro(ω) indicates that detection light, β indicate intetference-fit strengthening, τ table
Show the time difference between detection light and reference light, φNL(ω) indicates the nonlinear phase that ZnTe crystal introduces, φTHz(ω) is indicated too
The phase that hertz signal introduces.Before systematic survey terahertz signal, one group is first measured without the light in the case of terahertz signal
Spectral interference fringe (i.e. reference data), and storing, the phase of interference fringe contains at this time: between reference light and detection light when
Between difference introduce phase ω τ and ZnTe crystal introduce nonlinear phase φNL(ω).Then it when there is terahertz signal, does
The phase of striped is related in addition to ω τ and φNLIt also include the phase that terahertz signal introduces except (ω)THz(ω).In conjunction with preparatory
Direct impulse time/spectral characteristic of measurement, handling by Fourier transformation can be obtained terahertz time-domain waveform, correspondingly
Terahertz pulse spectral information can be obtained.
In conclusion self-reference Terahertz electro-optic sampling spectrointerferometer, energy provided by second embodiment of the invention
Enough directly measurement phases have the advantages that High Linear, distortionless compared with conventional Time-domain spectrometer.And structure is simple, measurement side
Method is simple.
The present invention also provides a kind of self-reference Terahertz electro-optic sampling spectral interference measuring system, the system includes upper
All elements in self-reference Terahertz electro-optic sampling spectrointerferometer stated, and there is above-mentioned self-reference Terahertz electric light to take
Function possessed by sample spectrointerferometer, does not repeat in detail herein.
The foregoing is merely illustrative of the preferred embodiments of the present invention, all in spirit of the invention not to limit invention
With any modifications, equivalent replacements, and improvements made within principle etc., should all be included in the protection scope of the present invention.
Claims (9)
1. a kind of self-reference Terahertz electro-optic sampling spectrointerferometer, which is characterized in that the interferometer includes:
Pulse stretcher, for broadening incident direct impulse at chirped pulse, the detection for broadening into chirped pulse
Pulse is incident to broad band half wave piece；
The broad band half wave piece has adjusted partially for adjusting the polarization direction of the direct impulse for having broadened into chirped pulse
The direct impulse in vibration direction is incident to lens；
The lens, for the direct impulse for having adjusted polarization direction to be focused to Terahertz electro-optic crystal；
The Terahertz electro-optic crystal, for make the direct impulse and incidence terahertz pulse to be measured be overlapped, with realize by
The THz electric field strong signal of the terahertz pulse to be measured is loaded into the direct impulse, has been loaded with THz electric field strong signal
Direct impulse be incident to birefringece crystal；
The birefringece crystal, for making the direct impulse for being loaded with THz electric field strong signal generate mutual time delay
Pulse pair, respectively o light pulse and e light pulse, the pulse pair is incident to linear polarizer；
The linear polarizer, o light pulse and e light pulse for making the pulse pair it is uniform it is semi-transparent be incident upon spectrometer, through institute
The pulse pair polarization direction for stating linear polarizer is consistent；
The spectrometer, for recording the spectral interference data of the pulse pair after the linear polarizer, to be based on the light
It composes interference data and realizes the measurement of Terahertz electric light phase-modulation.
2. interferometer as described in claim 1, which is characterized in that the interferometer further includes the relevant electric field reconstruction of spectrum phase
Law technology measuring device, it is special to the time spectra of the direct impulse for before the direct impulse is incident to stretcher
Property measures, and obtains the time spectra characteristic of the direct impulse.
3. interferometer as described in claim 1, which is characterized in that the interferometer further includes silicon wafer；
The silicon wafer is between the lens and the Terahertz electro-optic crystal, for incident terahertz pulse to be measured to exist
Be transmitted through the Terahertz electro-optic crystal in low-loss situation, and the direct impulse that will transmit through the lens reflex to it is described too
Hertz electro-optic crystal.
4. interferometer as described in claim 1, which is characterized in that it is described be incident to the Terahertz electro-optic crystal it is to be measured too
Hertz pulse is overlapped over time and space with the direct impulse.
5. interferometer as described in claim 1, which is characterized in that the pulse pair that the birefringece crystal generates it is mutual
Time delay is proportional to the refringence and its thickness of o light pulse and the e light pulse of the birefringece crystal.
6. interferometer as described in claim 1, which is characterized in that the direct impulse is the ultrashort femtosecond pulse of linear polarization.
7. interferometer as described in claim 1, which is characterized in that the pulse stretcher is specifically used for incident detection arteries and veins
Punching broadens the chirped pulse at picosecond.
8. interferometer as described in claim 1, which is characterized in that the o of the light transmission shaft of the linear polarizer and the pulse pair
Light pulse and e light pulse polarization direction are at 45 °.
9. a kind of self-reference Terahertz electro-optic sampling spectral interference measuring system, which is characterized in that the system comprises such as rights
It is required that self-reference Terahertz electro-optic sampling spectrointerferometer described in any one of 1-8.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101701852A (en) * | 2009-09-18 | 2010-05-05 | 深圳大学 | Electro-optic sampling device used for measuring terahertz optical pulse and measuring method thereof |
| CN104614082A (en) * | 2014-12-10 | 2015-05-13 | 天津大学 | TeraHertz wave line width measurement device and method |
| CN105092514A (en) * | 2015-08-20 | 2015-11-25 | 中国科学院重庆绿色智能技术研究院 | Scattering type scanning near field terahertz microscope |
| CN206959990U (en) * | 2017-05-26 | 2018-02-02 | 深圳大学 | A kind of self-reference Terahertz electro-optic sampling spectrointerferometer and measuring system |
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| CA2880828C (en) * | 2012-08-01 | 2020-08-18 | Institut National De La Recherche Scientifique | Spectral-domain interferometric method and system for characterizing terahertz radiation |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101701852A (en) * | 2009-09-18 | 2010-05-05 | 深圳大学 | Electro-optic sampling device used for measuring terahertz optical pulse and measuring method thereof |
| CN104614082A (en) * | 2014-12-10 | 2015-05-13 | 天津大学 | TeraHertz wave line width measurement device and method |
| CN105092514A (en) * | 2015-08-20 | 2015-11-25 | 中国科学院重庆绿色智能技术研究院 | Scattering type scanning near field terahertz microscope |
| CN206959990U (en) * | 2017-05-26 | 2018-02-02 | 深圳大学 | A kind of self-reference Terahertz electro-optic sampling spectrointerferometer and measuring system |
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