CN104121994A - Transient grating effect based femtosecond laser pulse measuring device - Google Patents
Transient grating effect based femtosecond laser pulse measuring device Download PDFInfo
- Publication number
- CN104121994A CN104121994A CN201410327593.2A CN201410327593A CN104121994A CN 104121994 A CN104121994 A CN 104121994A CN 201410327593 A CN201410327593 A CN 201410327593A CN 104121994 A CN104121994 A CN 104121994A
- Authority
- CN
- China
- Prior art keywords
- light beam
- concave mirror
- mirror
- aperture
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Lasers (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses a transient grating effect based femtosecond laser pulse measuring device. The transient grating effect based femtosecond laser pulse measuring device is characterized in that incident to-be-measured laser pulses are divided into four beams, the three beams generate self-reference light through a transient grating effect of three-phase nonlinear mediums, the three beams and the fourth beam of to-be-measured light are superposed in space and focused into a spectrometer to enable self-reference interference spectrums to be obtained, femtosecond laser pulse shapes, laser spectrums and spectrum phases are calculated through a self-reference spectrum coherent method due to measurement of interference spectrums. The transient grating effect based femtosecond laser pulse measuring device has the advantages of being compact and stable in structure and miniaturized in integrity due to the fact that a focusing system is formed by a concave mirror and a convex mirror or a plane mirror and the concave mirror and not needing an optical polarization element and being applied to femtosecond laser optical systems with the spectrum and the pulse width to be respectively from 200 to 3000nm and 10 to 300fs.
Description
Technical field
The present invention relates to femto-second laser pulse and measure, particularly a kind of femto-second laser pulse measurement mechanism based on transient grating effect.
Background technology
Femtosecond laser, along with it is at the needs in the fields such as scientific research, biology, medical treatment, processing, communication, national defence, has obtained development extremely rapidly.And femto-second laser pulse shape and pulse width be as the important optical parameter of femto-second laser pulse, it is very necessary that the measurement to them or Real-Time Monitoring seem.Therefore, find a kind of simply, easily and fast, effectively measurement and the method and apparatus of Real-Time Monitoring, have extremely great effect for promoting femtosecond laser self-growth and expanding its application in every field.
At present, the most widely used femto-second laser pulse measuring technique has: 1. frequency discrimination raster method (Frequency Resolved Optical Gating, FROG); 2. spectral phase interferometry for direct electrical reconstruction (Spectral Phase Interferometry for Direct Electric-field Reconstruction, SPIDER).These two kinds of technology are all based on self-reference, and by non-colinear harmonic generating method, realize the single-shot of femto-second laser pulse is measured.But these two kinds of technology are not direct for the algorithm of rebuilding femto-second laser pulse, time that need to be longer.In SPIDER technology, conventionally need nonlinear crystal to change generation measuring-signal, due to the phase-matching condition of nonlinear optical crystal, this makes every surveying instrument can only be adapted to specific spectral range, thereby limited the application of these methods in wide spectral range, and these systems and measuring process are all comparatively complicated.Self-reference spectral interference method (self-referenced spectral interferometry, SRSI) based on cross polarization ripple (cross-polarized wave, XPW) is also used to measure laser pulse recently.In the method, only need 3 simple iterative computation just can obtain very soon spectrum and the phase place of testing laser, this is the most simple and convenient so far, and the method that can carry out the measurement of pulse width single-shot.But the method needs optical polarization element.Because optical polarization element is only effective to specific optical maser wavelength, and there is certain spectral width, so also just limited this method and instrument and can only within the scope of special spectrum, apply.The dispersion of polarization optical element also makes it, and to 10fs, following short pulse measurement is restricted.In similar SRSI method, we also proposed recently two kinds respectively based on self-diffraction effect [referring to document 1:J.Liu, Y.L.Jiang, T.Kobayashi, R.X.Li, and Z.Z.Xu, " Self-referenced spectral interferometry based on self-diffraction effect, " J.Opt.Soc.Am.B29 (1): 29-34 (2012); Referring to patent: application number: 201210267065.3] and transient grating effect [referring to document 2:J.Liu, F.J.Li, Y.L.Jiang, C.Li, Y.X.Leng, T.Kobayashi, R.X.Li, and Z.Z.Xu, " Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization; " Opt.Lett.37,4829 (2012); Referring to patent: application number: 201210079324.X] femto-second laser pulse measuring method, these two kinds of methods are not subject to the restriction of dispersion, but this two structurally still comparatively complicated.
Summary of the invention
The present invention provides a kind of femto-second laser pulse measurement mechanism based on transient grating effect.The present invention adopts telescope or microcobjective light channel structure, apparatus structure is simple, small and exquisite, regulate simple and easy, data acquisition and data processing are rapid, and go for the femtosecond laser pulse width of different pulse widths and different wavelength range and the measurement of pulse shape and Real-Time Monitoring, the spectrum phase obtaining can feed back to relevant phase compensation device, optimizes the output of femto-second laser pulse.
Technical solution of the present invention is as follows:
A femto-second laser pulse measurement mechanism based on transient grating effect, feature is that its formation comprises: the spectrometer of the first concave mirror, convex reflecting mirror, four aperture plates, variable neutral decay time delay sheet, third-order nonlinear optical medium, aperture plate, the second concave mirror and high spectral accuracy.Described component position relationship is as follows:
The first described concave mirror center has an aperture, and four described aperture plates have four apertures that are square profile, described the first concave mirror and a focusing system of described convex reflecting mirror composition.Femtosecond laser light beam to be measured is through the aperture of described the first concave mirror, and focus on through described focusing system, between described convex reflecting mirror and the focus of described focusing system, described four aperture plates are placed in appropriate location, described focused beam is divided into four bundles and is called the first light beam, the second light beam, the 3rd light beam and the 4th light beam, between four described aperture plates and described focal plane, place described variable neutral decay time delay sheet and the 4th described light beam is decayed and introduced time delay as treating photometry, the first described light beam, the second light beam and the 3rd light beam Free propagation in air, and in the described third-order nonlinear optical medium at described focal plane place, produce transient grating effect and form transient grating signal light-wave as with reference to light, described until photometry after described third-order nonlinear optical medium with described reference light at space coincidence, the laser pulse that two bundles overlap enters successively together the spectrometer of described high spectral accuracy and measures after described aperture plate and described the second concave mirror reflection, obtain the self-reference interference spectrum of femtosecond laser to be measured.
A kind of femto-second laser pulse measurement mechanism based on transient grating effect, feature is that its formation comprises: four aperture plates, variable neutral decay time delay sheet, plane mirror, the spectrometer of the first concave mirror, third-order nonlinear optical medium, aperture plate, the second concave mirror and high spectral accuracy.Described component position relationship is as follows:
Four described aperture plates have four apertures that are square profile, described aperture of the first concave mirror center band, described plane mirror and a focusing system of the first concave mirror composition.Femtosecond laser light beam to be measured is divided into four bundles after described four aperture plates, be called the first light beam, the second light beam, the 3rd light beam and the 4th light beam, the first described light beam, focusing system described in the second light beam and the 3rd light beam, be focused into the described third-order nonlinear optical medium of the focal plane place placement of described focusing system, and in described third-order nonlinear optical medium, produce transient grating effect and form transient grating signal light-wave as with reference to light, photometry is treated in the 4th described light beam conduct after described variable neutral decay time delay sheet is decayed and introduced time delay, through described focusing system, then pass through described third-order nonlinear optical medium and described reference light at space coincidence.The laser pulse that two bundles overlap enters successively together the spectrometer of described high spectral accuracy and measures after described aperture plate and described the second concave mirror reflection, obtains the self-reference interference spectrum of femtosecond laser to be measured.
The present invention has following distinguishing feature:
1, the present invention has used the first concave mirror and a focusing system of convex reflecting mirror composition in the first typical device, plane mirror and a focusing system of the first concave mirror composition in the second typical device, are used, this makes apparatus structure compacter, stable, and whole device is more microminiaturized;
2, the variable neutral decay time delay sheet using in the present invention, in treating photometry introducing time delay, and it is carried out to strength retrogression, in order to the energy Ratios between photometry for the treatment of of real-time adjusting gained reference light and delay, thereby distinguish reference light and treat photometry and ensure that the modulation of interference spectrum is accurate.
3, the present invention is applicable to spectrum, the pulsewidth femtosecond laser optical system in 200-3000nm and in 10-300fs respectively.In addition, it is megahertz and the pulse width of single-shot femto-second laser pulse and the measurement of pulse shape that the present invention is applicable to repetition frequency simultaneously, and can be used for the real-time monitoring of femto-second laser pulse, the spectrum phase obtaining can feed back to relevant phase compensation device, optimizes the output of femto-second laser pulse.
Brief description of the drawings
Fig. 1, Fig. 2 is respectively two representative instance device index paths of the present invention.
Fig. 3 utilizes example device Fig. 1 of the present invention to measure 800nm centre wavelength 40fs laser pulse experimental result picture, has provided respectively the spectrum (dotted line) of pulse to be measured, the coherent swpectrum (solid line) of transient grating signal spectrum (dash line), incident pulse and transient grating signal producing.
Embodiment
First, the optical module of utilization based on transparent medium transient grating effect and the spectrometer acquisition interference spectrum signal of high spectral accuracy.
One embodiment of the present of invention device as shown in Figure 1.Light path mainly comprises: 1 is incident femtosecond laser light beam; 2 is the first concave mirror; 3 is convex reflecting mirror; 4 is four aperture plates; 5 is variable neutral decay time delay sheet; 6 is third-order nonlinear optical medium, in order to produce transient grating effect; 7 is aperture plate, is used for seeing through flashlight and blocks parasitic light; 8 is the second concave mirror; 9 is the spectrometer of high spectral accuracy, is used for measuring laser spectrum and interference spectrum.
In the light path shown in Fig. 1, described the first concave mirror 2 and described convex reflecting mirror 3 form a focusing system; The equal aperture of bore that four described aperture plate 4 You Sige center quadrates are arranged, is used for choosing four parts on incident laser hot spot, forms the four bundle laser that equate bore.
The light path tendency of Fig. 1 embodiment device is as follows: a branch of hot spot enough large incoming laser beam 1 through described focusing system, (light path in the tendency of described focusing system is: after the central small hole of described incoming laser beam 1 through the first described concave mirror 2, reflect through described convex reflecting mirror 3, reflect through described concave mirror 2 again) after, through four described aperture plates 4, four apertures of four described aperture plates 4 are by equating four bundle laser of bore, be called first, second, the 3rd, the 4th light beam, this four bundles laser is positioned at four angles of square, the 4th described light beam sees through the described variable neutral decay time delay sheet 5 of a suitable thickness, the photometry for the treatment of that obtains decaying after time delay, and described first, second, the 3rd light beam Free propagation in air, described photometry and described first of the Free propagation in air treated, second, between the 3rd light beam, there is regular hour delay.The described third-order nonlinear optical medium 6 at the focusing system focal plane place of first, second, third described light beam described in being placed in is due to transient grating effect, produce transient grating signal light-wave as with reference to light, institute's reference light that produces just in time follows the described photometry for the treatment of spatially to overlap.Utilize aperture plate 7 choose reference light and treat photometry and block parasitic light, focus in high precision spectrometer 9 through the second concave mirror 8, record interference spectrum signal.
In Fig. 1 embodiment device, the central small hole size of the first concave mirror 2 is determined according to incident laser spot size, and launching spot is slightly larger than this aperture conventionally.Four aperture size and the spacing of four aperture plates 4 are chosen according to its spot size of directive, be independent of each other, and the energy passing through are principle to the maximum with four hot spots.The film of the first concave mirror 2, convex reflecting mirror 3 and the second concave mirror 8 can plate corresponding silverskin, golden film and medium high-reflecting film according to incident laser centre wavelength is different.The selection of third-order non-linear medium 6 materials need to be transparent to incident laser, and third-order non-linear coefficient wants high.9 is the spectrometer of high spectral accuracy, can improve measuring accuracy.
Finally, calculate by the interference spectrum signal of gained being carried out to self-reference spectrum coherent approach, obtain femto-second laser pulse shape, laser spectrum and spectrum phase to be measured.
Adopt the device shown in Fig. 1, and in conjunction with above-mentioned embodiment, femto-second laser pulse is measured.When the laser pulse 1 of incident is repetition frequency 1KHz, centre wavelength is 800nm, and pulse energy has obtained the result of Fig. 3 while being 1.7uJ.Certainly this incident laser pulse condition should not limit the scope of the invention.
Claims (2)
1. the femto-second laser pulse measurement mechanism based on transient grating effect, be characterised in that its formation comprises: be the first concave mirror (2) successively along light beam input direction, convex reflecting mirror (3), four aperture plates (4), variable neutral decay time delay sheet (5), third-order nonlinear optical medium (6), aperture plate (7), the spectrometer (9) of the second concave mirror (8) and high spectral accuracy, described the first concave mirror (2) center has an aperture, four described aperture plates (4) have four apertures that are square profile, focusing system of the relative composition of reflecting surface of described the first concave mirror (2) and described convex reflecting mirror (3), femtosecond laser light beam to be measured (1) passes through the aperture of described the first concave mirror (2) successively, convex reflecting mirror (3), the first concave mirror (2) is also focused on by described focusing system, between described convex reflecting mirror and the focal plane of described focusing system, place four described aperture plates (4), described focused beam is divided into four bundles and is called the first light beam, the second light beam, the 3rd light beam and the 4th light beam, between four described aperture plates (4) and described focal plane, in the light path of the 4th light beam, place described variable neutral decay time delay sheet (5), the 4th described light beam is decayed to time delay as treating photometry, the first described light beam, the second light beam and the 3rd light beam Free propagation in air, and in the described third-order nonlinear optical medium (6) at described focal plane place, produce transient grating effect and form transient grating signal as with reference to light, the spectrometer (9) of described high spectral accuracy described in entering after described aperture plate (7) and described the second concave mirror reflection (8) successively together with space coincidence with described reference light after described third-order nonlinear optical medium (6) until photometry is measured, obtain the self-reference interference spectrum of femtosecond laser to be measured.
2. the femto-second laser pulse measurement mechanism based on transient grating effect, be characterised in that its formation comprises: be four aperture plates (2) successively along light beam input direction, variable neutral decay time delay sheet (3), plane mirror (4), the first concave mirror (5), third-order nonlinear optical medium (6), aperture plate (7), the spectrometer (9) of the second concave mirror (8) and high spectral accuracy, four described aperture plates (2) have four apertures that are square profile, described the first concave mirror (5) center has an aperture, focusing system of the relative composition of reflecting surface of described plane mirror (4) and the first concave mirror (5), femtosecond laser light beam to be measured (1) is divided into four bundles after described four aperture plates (2), be called the first light beam, the second light beam, the 3rd light beam and the 4th light beam, four described bundle light are successively through the first concave mirror (5), plane mirror (4) also passes the aperture at the first concave mirror (5) center, be focused into the described third-order nonlinear optical medium (6) of the focal plane place placement of described focusing system by described focusing system, and in described third-order nonlinear optical medium (6), the first described light beam, the second light beam and the 3rd light beam produce transient grating effect and form transient grating signal light-wave as with reference to light, the 4th described light beam is measured as the spectrometer (9) of the high spectral accuracy described in entering after described aperture plate (7) and described the second concave mirror (8) reflection successively together with space coincidence until photometry and described reference light after being placed in described variable neutral decay time delay sheet (3) the decay time delay between described four aperture plates (2) and described plane mirror (4), obtain the self-reference interference spectrum of femtosecond laser to be measured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410327593.2A CN104121994A (en) | 2014-07-10 | 2014-07-10 | Transient grating effect based femtosecond laser pulse measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410327593.2A CN104121994A (en) | 2014-07-10 | 2014-07-10 | Transient grating effect based femtosecond laser pulse measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN104121994A true CN104121994A (en) | 2014-10-29 |
Family
ID=51767501
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410327593.2A Pending CN104121994A (en) | 2014-07-10 | 2014-07-10 | Transient grating effect based femtosecond laser pulse measuring device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN104121994A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104614072A (en) * | 2015-02-10 | 2015-05-13 | 中国科学院上海光学精密机械研究所 | Total-reflection mirror based two-dimensional spectral measurement device and method |
CN105157858A (en) * | 2015-10-09 | 2015-12-16 | 中国原子能科学研究院 | Transient-raster-diffraction-method-based ultraviolet single-shot autocorrelator |
CN106052751A (en) * | 2016-05-13 | 2016-10-26 | 中国科学院物理研究所 | Laser measuring apparatus of frequency-resolved optical gating based on transient grating |
CN118150131A (en) * | 2024-05-13 | 2024-06-07 | 厦门纽立特电子科技有限公司 | Space coherence testing device of femtosecond laser |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060033930A1 (en) * | 2002-09-20 | 2006-02-16 | Japan Science And Technology Agency | Time-resolved nonlinear complex sensitivity measuring instrument |
CN102636272A (en) * | 2012-03-22 | 2012-08-15 | 中国科学院上海光学精密机械研究所 | Femtosecond laser pulse measurement method based on transient grating effect and device |
CN102778301A (en) * | 2012-07-31 | 2012-11-14 | 中国科学院上海光学精密机械研究所 | Real-time measuring device of self-reference spectrum interference femtosecond laser pulse |
CN102944313A (en) * | 2012-11-12 | 2013-02-27 | 中国科学院上海光学精密机械研究所 | Multifunctional femtosecond laser pulse measuring device |
CN203164521U (en) * | 2013-03-18 | 2013-08-28 | 中国工程物理研究院应用电子学研究所 | Simple Cassegrain type beam expanding device |
-
2014
- 2014-07-10 CN CN201410327593.2A patent/CN104121994A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060033930A1 (en) * | 2002-09-20 | 2006-02-16 | Japan Science And Technology Agency | Time-resolved nonlinear complex sensitivity measuring instrument |
CN102636272A (en) * | 2012-03-22 | 2012-08-15 | 中国科学院上海光学精密机械研究所 | Femtosecond laser pulse measurement method based on transient grating effect and device |
CN102778301A (en) * | 2012-07-31 | 2012-11-14 | 中国科学院上海光学精密机械研究所 | Real-time measuring device of self-reference spectrum interference femtosecond laser pulse |
CN102944313A (en) * | 2012-11-12 | 2013-02-27 | 中国科学院上海光学精密机械研究所 | Multifunctional femtosecond laser pulse measuring device |
CN203164521U (en) * | 2013-03-18 | 2013-08-28 | 中国工程物理研究院应用电子学研究所 | Simple Cassegrain type beam expanding device |
Non-Patent Citations (1)
Title |
---|
张国顺: "《现代激光制造技术》", 28 February 2006, 化学工业出版社 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104614072A (en) * | 2015-02-10 | 2015-05-13 | 中国科学院上海光学精密机械研究所 | Total-reflection mirror based two-dimensional spectral measurement device and method |
CN105157858A (en) * | 2015-10-09 | 2015-12-16 | 中国原子能科学研究院 | Transient-raster-diffraction-method-based ultraviolet single-shot autocorrelator |
CN106052751A (en) * | 2016-05-13 | 2016-10-26 | 中国科学院物理研究所 | Laser measuring apparatus of frequency-resolved optical gating based on transient grating |
CN106052751B (en) * | 2016-05-13 | 2019-10-25 | 中国科学院物理研究所 | A kind of frequency resolution optical switch laser measuring device based on transient grating |
CN118150131A (en) * | 2024-05-13 | 2024-06-07 | 厦门纽立特电子科技有限公司 | Space coherence testing device of femtosecond laser |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102636272B (en) | Femtosecond laser pulse measurement method based on transient grating effect and device | |
CN102313605B (en) | Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time | |
CN101216350B (en) | High-power ultrashort laser pulse contrast measuring device and measuring method | |
CN107421910B (en) | Terahertz strong field system of ultrashort pulse pump based on wave surface inclination method | |
CN103712689A (en) | Continuous laser device spectral line width measurement device based on optical frequency comb | |
CN102998006A (en) | Measuring device for femtosecond laser pulse shapes | |
CN107677379B (en) | Femtosecond laser pulse waveform measuring device | |
CN105403533A (en) | Method for measuring optical nonlinearity of material through multiple channels | |
CN104121994A (en) | Transient grating effect based femtosecond laser pulse measuring device | |
CN110554513B (en) | Optical fiber array device for debugging grating compressor and debugging method thereof | |
CN106248225A (en) | Self-reference spectral interference femto-second laser pulse measurement apparatus based on transient grating effect | |
CN104535201A (en) | Measuring device for contrast ratio of high-power ultrashort laser pulses | |
Tzankov et al. | Broadband optical parametric amplification in the near UV–VIS | |
CN204330141U (en) | A kind of apparatus for measuring high power ultra-short laser pulse contrast | |
CN102944313A (en) | Multifunctional femtosecond laser pulse measuring device | |
CN102255225B (en) | Independent chirp parameter regulating system for realizing two-tone laser field | |
CN105181155A (en) | Terahertz pulse single-time detection system and detection method based on single-mode fiber | |
CN102778301B (en) | Real-time measuring device of self-reference spectrum interference femtosecond laser pulse | |
CN104729723A (en) | Measurement method of chirp characteristics of linear chirp pulses | |
CN201166588Y (en) | High-power ultrashort laser pulse contrast measuring device | |
CN108318143A (en) | Measuring system for high repetition rate ultrashort optical pulse carrier envelope phase | |
CN100424483C (en) | Ultrashort pulse frequency resolution optical switching method measuring device | |
CN110319941A (en) | Using devitrified glass as the ultrashort pulse detector based on lateral frequency multiplication of frequency multiplication medium | |
CN202002885U (en) | Device for measuring optical nonlinearity of material by using dual transient phase object (T-PO) technology | |
CN101799332A (en) | Ultra-short pulse diagnostic method based on molecular arrangement and orientation |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20141029 |