CN106248225A - Self-reference spectral interference femto-second laser pulse measurement apparatus based on transient grating effect - Google Patents
Self-reference spectral interference femto-second laser pulse measurement apparatus based on transient grating effect Download PDFInfo
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- CN106248225A CN106248225A CN201610551527.2A CN201610551527A CN106248225A CN 106248225 A CN106248225 A CN 106248225A CN 201610551527 A CN201610551527 A CN 201610551527A CN 106248225 A CN106248225 A CN 106248225A
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- 230000003595 spectral effect Effects 0.000 title claims abstract description 20
- 230000000694 effects Effects 0.000 title claims abstract description 17
- 230000001052 transient effect Effects 0.000 title claims abstract description 14
- 238000009532 heart rate measurement Methods 0.000 title claims abstract description 9
- 238000007747 plating Methods 0.000 claims abstract description 24
- 239000012528 membrane Substances 0.000 claims abstract description 17
- 239000000835 fiber Substances 0.000 claims abstract description 15
- 230000003287 optical effect Effects 0.000 claims abstract description 14
- 238000001228 spectrum Methods 0.000 claims abstract description 10
- 239000011248 coating agent Substances 0.000 claims description 4
- 238000000576 coating method Methods 0.000 claims description 4
- 239000013307 optical fiber Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 16
- 230000035945 sensitivity Effects 0.000 abstract description 4
- 230000009021 linear effect Effects 0.000 abstract description 2
- 230000009466 transformation Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 6
- 238000005388 cross polarization Methods 0.000 description 4
- 230000008676 import Effects 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 241000208340 Araliaceae Species 0.000 description 3
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 3
- 235000003140 Panax quinquefolius Nutrition 0.000 description 3
- 235000008434 ginseng Nutrition 0.000 description 3
- 241000239290 Araneae Species 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000005305 interferometry Methods 0.000 description 2
- 230000033228 biological regulation Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000013065 commercial product Substances 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000011514 reflex Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0213—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
Abstract
A kind of self-reference spectral interference femto-second laser pulse measurement apparatus based on transient grating effect, including: 3/4ths metallic-membrane plating reflectors, decay time delay sheet, the first off-axis parabolic mirror, third-order nonlinear optical medium, the second off-axis parabolic mirror, filter, lens, single-mode fiber and fiber spectrometer；Device is produced from reference light by the transient grating effect of third-order non-linear medium, and with certain postpone to have decayed treat that light-metering spatially overlaps and is focused into spectrogrph and be derived from reference to interference spectrum, utilize Fourier transformation spectral interference algorithm to rebuild optical time domain shape to be measured and phase place and frequency domain spectra shape and phase place.The present invention improves the energy sensitivity of self-reference spectral interference method, for the femto-second laser pulse of order of megahertz, can measure single pulse energy less than single receive Jiao treat light-metering.
Description
Technical field
The present invention relates to femto-second laser pulse field of measuring technique, particularly one utilizes transient grating effect to be produced from
The femto-second laser pulse measurement apparatus of the self-reference light needed for reference light spectral interference method.
Background technology
Femtosecond laser along with its scientific research, biology, medical treatment, process, communicate, the needs in the field such as national defence, obtained extremely
Development rapidly.And femto-second laser pulse shape and pulse width are as the important optical parameter of femto-second laser pulse, to them
Measurement or in real time monitoring seem the most necessary.Therefore, find one simply, easily and fast, effectively to measure and monitoring in real time
Method and apparatus, for promote femtosecond laser self-growth and expand its have the most great work in the application of every field
With.
At present, most widely used femto-second laser pulse measures technology has: 1. frequency discrimination raster method (Frequency
Resolved Optical Gating,FROG)；2. spectral phase interferometry for direct electrical reconstruction (Spectral Phase
Interferometry for Direct Electric-field Reconstruction,SPIDER).These two kinds of technology are all
It is based on self-reference, and by non-colinear harmonic generating method, realizes the single-shot to femto-second laser pulse and measure.But,
These two kinds of technology are not direct for the algorithm rebuilding femto-second laser pulse, need the longer time.In SPIDER technology, logical
Often needing nonlinear crystal to change generation and measure signal, due to the phase-matching condition of nonlinear optical crystal, this makes often
Platform measuring instrument can only be adapted to specific spectral region, thus limits the application in wide spectral range of these methods, and
And these systems are the most complex with the process of measurement.
Self-reference spectral interference method proposed in 2010, and the method has linearly, resolves, sensitive, characteristic accurately, more
For it is important that have direct rebuilding spectrum and phase solution iterative algorithm, whole algorithm can complete in one or two second, can
To realize femto-second laser pulse being measured in real time and monitoring.In self-reference spectral interference method, need by three rank non-
Linear effect light to be measured itself produces reference light, i.e. self-reference.In view of simplicity and the effectiveness of measurement of light path, at present this
The Third-order nonlinearity of sample includes the generation of cross polarization ripple, self-diffraction effect and self-diffraction effect, and three kinds of methods are respectively arranged with excellent
Gesture, wherein, self-reference spectral interference method based on cross polarization wave effect has been developed to commercial product Wizzler.Should
The femto-second laser pulse of micro-burnt magnitude, due to the energy sensitivity reason of cross polarization wave effect, can only be measured by device.
But, in our a lot of ultrafast phenomenas detect, used laser single-pulse energy and final produced flashlight
Energy is often receiving burnt magnitude, the most single receives below burnt magnitude.In this case, based on cross polarization wave effect
The Wizzler of self-reference spectral interference method just seem helpless.
Summary of the invention
It is an object of the invention to overcome the shortcoming of above-mentioned prior art, propose a kind of based on transient grating effect from ginseng
Examine spectral interference femto-second laser pulse measurement apparatus.Utilize the energy sensitivity characteristic that transient grating Benefit Transfer is high, design
One self-reference spectral interference femto-second laser pulse measurement apparatus, apparatus structure is simple, small and exquisite, and regulation is simple, data acquisition with
Data process rapidly, and go for different pulse width and the femtosecond laser pulse width of different wavelength range and pulse
The measurement of shape and in real time monitoring, it is thus achieved that spectrum phase can feed back to the phase compensation device be correlated with, optimize femtosecond laser
The output of pulse, for the femto-second laser pulse of order of megahertz, this invention device can measure single pulse energy less than single
Receive Jiao treat light-metering.
The technical solution of the present invention is as follows:
A kind of self-reference spectral interference femto-second laser pulse measurement apparatus based on transient grating effect, feature is its structure
One-tenth includes: 3/4ths metallic-membrane plating reflectors, decay time delay sheet, the first off-axis parabolic mirror, third-order nonlinear optical medium,
Second off-axis parabolic mirror, filter, lens, single-mode fiber, fiber spectrometer.Described component position relationship combines figure
1 carry out as described below:
Treat that light-metering imports measurement apparatus along arrow direction, through 3/4ths described metallic-membrane plating reflector reflections, institute
3/4ths metallic-membrane plating reflectors stated are as shown in the illustration a in figure, and 1,2,3 regions are not plated film for plating high-reflecting film region, 4 regions
Region, such special plated film make described in treat that light-metering is spatially divided into four beam sections, wherein through described
The three-beam that the 1 of 3/4ths metallic-membrane plating reflectors, 2,3 plating high-reflecting film regions are reflected is anti-through the first described off axis paraboloid mirror
Penetrate mirror to be focused in described third-order nonlinear optical medium, due to transient grating effect, it will produce light beam and be called from ginseng
Examine light, through 4 light that coating film area is not reflected of 3/4ths described metallic-membrane plating reflectors through described decay time delay sheet pair
This light beam introduces decay and time delay, then is focused into described third-order non-linear through the first described off-axis parabolic mirror
As treating light-metering in optical medium, due to apparatus structure reason, produced described self-reference light and the described of time delay that decay
Treat light-metering spatially conllinear, light beam will collimate through the second described off-axis parabolic mirror, then by described
The filter shown in illustration b leach comprise only as described in self-reference light and as described in the light beam for the treatment of light-metering of decay time delay, profit
With described lens, the light beam treating light-metering of described self-reference light and described decay time delay is focused into described single-mode fiber
In, and import light in described spectrogrph by described single-mode fiber, will obtain described from ginseng in described spectrogrph
Examine the interference spectrum of the light beam treating light-metering of light and described decay time delay.
The present invention has a following distinguishing feature:
1, the present invention utilizes 3/4ths metallic-membrane plating reflectors, treats that light-metering is through wherein plating the part in high-reflecting film region for producing
It is conigenous reference light, attenuated through the part of the regional reflex of not plated film, as treating that it will be measured by light-metering；
2, the present invention utilizes decay time delay sheet, treats light-metering and reflects through 3/4ths metallic-membrane plating reflectors not coating film area
Part attenuated after be further introduced into decay and time delay；
3, the present invention utilizes off-axis parabolic mirror be focused light beam and collimate；
4, the present invention utilizes single-mode fiber that the light to be measured of last self-reference light and the time delay that decays is imported optical fiber light
In spectrometer.
5, the present invention has higher energy sensitivity, for the femto-second laser pulse of order of megahertz, and this invention device
Can measure single pulse energy less than single receive Jiao treat light-metering.
Accompanying drawing explanation
Fig. 1 is the light path of present invention self-reference based on transient grating effect spectral interference femto-second laser pulse measurement apparatus
Figure.
Detailed description of the invention
The present invention is described in further detail with embodiment below in conjunction with the accompanying drawings, but should not limit the present invention's with this
Protection domain.
First, apparatus of the present invention are utilized to obtain interference spectrum signal.
One embodiment of the present of invention device is as shown in Figure 1.Light path includes: 3/4ths metallic-membrane plating reflectors (M), decay are prolonged
Time slice (P1), the first off-axis parabolic mirror (PM1), third-order nonlinear optical medium (P2), the second off axis paraboloid mirror reflection
Mirror (PM2), filter (A), lens (L), single-mode fiber (F) and fiber spectrometer (S).Described component position relationship combines figure
1 carry out as described below:
Treat that light-metering imports measurement apparatus along arrow direction, through 3/4ths described metallic-membrane plating reflector M reflections, institute
3/4ths metallic-membrane plating reflectors stated are as shown in the illustration a in figure, and 1,2,3 regions are not plated film for plating high-reflecting film region, 4 regions
Region, such special plated film make described in treat that light-metering is spatially divided into four beam sections, wherein through described
The three-beam that 1,2, the 3 plating high-reflecting film regions of 3/4ths metallic-membrane plating reflector M are reflected is through the first described off axis paraboloid mirror
Reflecting mirror PM1 is focused in described third-order nonlinear optical medium P2, due to transient grating effect, it will produce light beam
Doing self-reference light, 4 light that coating film area is not reflected through 3/4ths described metallic-membrane plating reflector M prolong through described decay
Time slice P1 introduces decay and time delay to this light beam, then is focused into described through the first described off-axis parabolic mirror PM1
Third-order nonlinear optical medium P2 in as treating light-metering, due to apparatus structure reason, produced described self-reference light with decline
Subtracting the described of time delay and treat light-metering spatially conllinear, light beam will enter through the second described off-axis parabolic mirror PM2
Row collimation, then leached by the described filter A shown in illustration b comprise only as described in self-reference light and as described in decay time delay
The light beam treating light-metering, the light beam treating light-metering of described self-reference light and described decay time delay is gathered by the lens L described in utilization
Jiao enters in described single-mode fiber F, and imports light in described spectrogrph S by described single-mode fiber F, at described light
Spectrometer S will obtain the interference spectrum of the light beam treating light-metering of described self-reference light and described decay time delay.
Finally, by the interference spectrum signal of gained is carried out Fourier trasform spectroscopy coherent algorithm calculating, obtain to be measured
Femto-second laser pulse time-domain pulse shape and phase place and frequency-domain impulse spectrum and phase place.
Claims (2)
1. a self-reference spectral interference femto-second laser pulse measurement apparatus based on transient grating effect, is characterised by that it is constituted
Including: 3/4ths metallic-membrane plating reflectors (M), decay time delay sheet (P1), the first off-axis parabolic mirror (PM1), three rank non-thread
Property optical medium (P2), the second off-axis parabolic mirror (PM2), filter (A), lens (L), single-mode fiber (F) and optical fiber
Spectrogrph (S)；
Described 3/4ths metallic-membrane plating reflectors (M) are divided into four regions, wherein three region plating high-reflecting films, the 4th region
Not plated film；
Portion of incident light, after the reflection in three plating high-reflecting film regions of described 3/4ths metallic-membrane plating reflectors (M), injects institute
The first off-axis parabolic mirror (PM1) stated, injects after focusing and produces one in described third-order nonlinear optical medium (P2)
Bundle transient grating flashlight, as self-reference light；
Portion of incident light is after the reflection of one of described 3/4ths metallic-membrane plating reflectors (M) not coating film area, through described
After decay time delay sheet (P2) decay and time delay, inject described the first off-axis parabolic mirror (PM1), inject described after focusing
Third-order nonlinear optical medium (P2), as treating light-metering；
Described self-reference light and until light-metering after described second off-axis parabolic mirror (PM2) collimation, successively through described
Filter (A) and described lens (L) be focused in described single-mode fiber (F), and by this single-mode fiber (F) by photoconduction
Enter in described fiber spectrometer (S), it is thus achieved that the interference spectrum of light beam.
Self-reference spectral interference femto-second laser pulse based on transient grating effect the most according to claim 1 measures dress
Put, it is characterised in that described the first off-axis parabolic mirror (PM1) and the second off-axis parabolic mirror (PM2) are to light
Bundle is focused and collimates.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108269632A (en) * | 2016-12-30 | 2018-07-10 | 核工业西南物理研究院 | A kind of megahertz charge exchange spectrum diagnostic system |
| CN109060150A (en) * | 2018-07-26 | 2018-12-21 | 天津大学 | Ultrashort pulse time width measuring device and method based on spectral interference |
| CN111412986A (en) * | 2019-01-07 | 2020-07-14 | 中国移动通信有限公司研究院 | Optical signal waveform detection device and method |
| CN111817786A (en) * | 2020-06-19 | 2020-10-23 | 上海师范大学 | Transient energy chirp reconstruction method for electron beam |
| CN112180537A (en) * | 2020-09-28 | 2021-01-05 | 北京大学 | Array mirror frame for measuring ultrafast optical signal |
| CN116448243A (en) * | 2023-06-19 | 2023-07-18 | 中国工程物理研究院激光聚变研究中心 | Three-dimensional light field self-reference measurement device and method based on cross polarized waves |
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| CN102313605A (en) * | 2011-07-15 | 2012-01-11 | 中国科学院上海光学精密机械研究所 | Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time |
| CN102998006A (en) * | 2012-11-12 | 2013-03-27 | 中国科学院上海光学精密机械研究所 | Measuring device for femtosecond laser pulse shapes |
| WO2015118481A1 (en) * | 2014-02-10 | 2015-08-13 | Victoria Link Ltd | Transient grating time resolved luminescence measurements |
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2016
- 2016-07-14 CN CN201610551527.2A patent/CN106248225A/en active Pending
Patent Citations (3)
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| CN102313605A (en) * | 2011-07-15 | 2012-01-11 | 中国科学院上海光学精密机械研究所 | Method and device for measuring self-referenced spectral interference femtosecond laser pulse in real time |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108269632A (en) * | 2016-12-30 | 2018-07-10 | 核工业西南物理研究院 | A kind of megahertz charge exchange spectrum diagnostic system |
| CN108269632B (en) * | 2016-12-30 | 2019-10-22 | 核工业西南物理研究院 | A kind of megahertz charge exchange spectrum diagnostic system |
| CN109060150A (en) * | 2018-07-26 | 2018-12-21 | 天津大学 | Ultrashort pulse time width measuring device and method based on spectral interference |
| CN111412986A (en) * | 2019-01-07 | 2020-07-14 | 中国移动通信有限公司研究院 | Optical signal waveform detection device and method |
| CN111412986B (en) * | 2019-01-07 | 2023-01-13 | 中国移动通信有限公司研究院 | Optical signal waveform detection device and method |
| CN111817786A (en) * | 2020-06-19 | 2020-10-23 | 上海师范大学 | Transient energy chirp reconstruction method for electron beam |
| CN112180537A (en) * | 2020-09-28 | 2021-01-05 | 北京大学 | Array mirror frame for measuring ultrafast optical signal |
| CN112180537B (en) * | 2020-09-28 | 2021-08-10 | 北京大学 | Array mirror frame for measuring ultrafast optical signal |
| CN116448243A (en) * | 2023-06-19 | 2023-07-18 | 中国工程物理研究院激光聚变研究中心 | Three-dimensional light field self-reference measurement device and method based on cross polarized waves |
| CN116448243B (en) * | 2023-06-19 | 2023-09-22 | 中国工程物理研究院激光聚变研究中心 | Three-dimensional light field self-reference measurement device and method based on cross polarized waves |
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