CN107677379B - Femtosecond laser pulse waveform measuring device - Google Patents
Femtosecond laser pulse waveform measuring device Download PDFInfo
- Publication number
- CN107677379B CN107677379B CN201710913257.XA CN201710913257A CN107677379B CN 107677379 B CN107677379 B CN 107677379B CN 201710913257 A CN201710913257 A CN 201710913257A CN 107677379 B CN107677379 B CN 107677379B
- Authority
- CN
- China
- Prior art keywords
- light
- frequency
- crystal
- reflecting mirror
- spectroscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000013078 crystal Substances 0.000 claims abstract description 81
- 238000005259 measurement Methods 0.000 claims abstract description 10
- 238000006243 chemical reaction Methods 0.000 claims description 13
- 230000000903 blocking effect Effects 0.000 claims description 11
- 230000003287 optical effect Effects 0.000 claims description 11
- 230000005540 biological transmission Effects 0.000 claims description 8
- 230000004888 barrier function Effects 0.000 claims description 3
- 230000010287 polarization Effects 0.000 description 4
- 238000005314 correlation function Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000005307 time correlation function Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 241000239290 Araneae Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
- Y02A90/00—Technologies having an indirect contribution to adaptation to climate change
- Y02A90/10—Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation
Abstract
The utility model discloses a femtosecond laser pulse waveform measuring device. In the measuring device, the measured horizontal polarized space uniform femtosecond fundamental frequency laser pulse is divided into transmitted light and reflected light after passing through a spectroscope, the transmitted light is divided into two beams, the two beams are incident on a frequency doubling crystal at a horizontal symmetrical angle to generate a vertical polarized autocorrelation frequency doubling signal, the frequency doubling signal and the reflected light beam of the spectroscope are incident on a frequency summation crystal along a vertical plane to generate a double-delay third-order intensity correlation frequency doubling signal, and thus pulse waveform information is obtained. The measuring device improves the time resolution of the measuring technology in femtosecond laser pulse waveform measurement. The measuring device has the advantages of compact structure, convenient adjustment and low cost.
Description
Technical Field
The utility model belongs to the technical field of ultrafast pulse laser testing, and particularly relates to a femtosecond laser pulse waveform measuring device.
Background
The pulse waveform is a key index of ultrafast laser pulse, and common measuring equipment such as a second-order and single-delay third-order correlator can only give the pulse width, so that the pulse shape is difficult to accurately give, and the pulse waveform is mainly used for measuring the contrast of the pulse and giving the pulse width approximately; the FROG, SPIDER and variants thereof, while capable of giving the shape of the pulse, are computationally complex and have a limited pulse width measurement range. The utility model patent (patent number ZL 2016 2 0734206.1) named as a laser pulse waveform measuring device based on a third-order correlation method and the utility model patent (patent number ZL 2016 2 0733875.7) named as an ultrashort laser pulse waveform measuring device disclose a method for obtaining a pulse waveform by measuring a dual-delay third-order intensity correlation signal, but diffraction effect caused by the longer transmission distance of a frequency multiplication beam reduces the time resolution of a measuring result.
Disclosure of Invention
In order to overcome the defect of limited time resolution in the measurement of the femtosecond laser pulse waveform by the existing measurement technology, the utility model provides a femtosecond laser pulse waveform measurement device.
The technical scheme adopted for solving the technical problems is as follows:
the utility model relates to a femtosecond laser pulse waveform measuring device, which is characterized in that a spectroscope I and a spectroscope II are sequentially arranged in the incidence direction of horizontally polarized spatially uniform femtosecond fundamental frequency laser pulses in the measuring device; the fundamental frequency laser pulse is divided into transmitted light and reflected light by the spectroscope I, and the transmitted light is divided into transmitted light and reflected light again by the spectroscope II; a reflection mirror I, a delay regulator I and a reflection mirror II are sequentially arranged on a transmission light path of the spectroscope II; a reflecting mirror III is arranged on the reflecting light path of the spectroscope II; the transmitted light of the spectroscope II is reflected to the delay regulator I through the reflector I to be projected to the reflector II after optical path delay; the light beam reflected from the spectroscope II is reflected by the reflecting mirror III and then projected onto the nonlinear crystal component to perform frequency multiplication conversion with the light beam reflected from the reflecting mirror II; a delay regulator II, a light guide lens group, a reflecting mirror IV and a reflecting mirror V are sequentially arranged on a reflecting light path of the spectroscope I; the light beam reflected from the spectroscope I is projected to the light guide lens group after being subjected to optical path delay by the delay regulator II, and the light beam emitted from the light guide lens group is projected onto the nonlinear crystal component in an inclined downward direction after being reflected by the reflecting mirror IV and the reflecting mirror V in sequence to perform frequency tripling conversion; a CCD is placed behind the nonlinear crystal element to receive the triple frequency light from the nonlinear crystal element. The CCD is externally connected with a computer, and signals from the CCD finally enter the computer for data processing.
The nonlinear crystal component consists of 4 elements; the frequency doubling crystal, the light blocking sheet I, the sum frequency crystal and the light blocking sheet II are sequentially arranged; the light beam reflected from the reflector II and the light beam reflected from the reflector III are incident on the frequency doubling crystal along the horizontal plane at symmetrical angles, the two light beams intersect at the center of the frequency doubling crystal, frequency doubling conversion is realized in the overlapping area of the two light beams in the frequency doubling crystal, the generated frequency doubling light is output along the direction perpendicular to the surface of the frequency doubling crystal, and the remaining two fundamental frequency light beams transmitted from the frequency doubling crystal are absorbed by the light blocking sheet I; the frequency multiplication light emitted from the frequency multiplication crystal and the fundamental frequency light from the reflector V are projected onto the frequency summation crystal at the same time along a vertical plane at a phase matching angle, the frequency multiplication light and the fundamental frequency light intersect at the center of the frequency summation crystal, the frequency multiplication conversion is realized in the overlapping area of two light beams, a dual-delay third-order related signal is generated, and the third-order related signal light is output along the direction vertical to the surface of the frequency summation crystal; the residual fundamental frequency beam and the residual frequency-doubled beam transmitted from the sum frequency crystal are absorbed by the light blocking sheet II.
The light guide lens group consists of two light guide lenses which are orthogonal up and down; a light guide mirror I and a light guide mirror II are sequentially arranged in the transmission direction of the fundamental frequency laser pulse; the light guide lens I is used for vertically and upwards emitting an incident horizontal light beam, the light guide lens II is used for horizontally reflecting the vertical light beam, and the emergent direction of the horizontal reflected light beam is perpendicular to the incident horizontal light beam.
The beneficial effects of the utility model are as follows:
1. the measuring device has the advantages of low cost, simple structure, convenient adjustment, and shortened frequency multiplication transmission distance and improved time resolution by arranging the frequency summation crystal immediately after the frequency multiplication crystal.
2. The utility model adopts two light guides which are orthogonal up and down to change the polarization state of the light beam, does not need to insert a polarizing element, and improves the compactness of the device.
Drawings
FIG. 1 is a schematic view of an optical path of a femtosecond laser pulse waveform measurement apparatus of the present utility model;
FIG. 2 is a schematic diagram of the optical path of a nonlinear crystal element in the present utility model;
FIG. 3 is a schematic view of the light path of the light guiding lens set of the present utility model;
in the figure, a spectroscope I2, a spectroscope II 3, a reflecting mirror I4, a delay adjuster I5, a reflecting mirror II 6, a reflecting mirror III 7, a nonlinear crystal component 8, a delay adjuster II 9, a light guide lens group 10, a reflecting mirror IV 11, a reflecting mirror V12, a CCD 7-1, a frequency doubling crystal 7-2, a light blocking sheet I7-3, a sum frequency crystal 7-4, a light blocking sheet II 9-1, a light guide lens I9-2 and a light guide lens II are shown.
Detailed Description
The utility model is further illustrated in the following figures and examples, which should not be taken to limit the scope of the utility model.
Example 1
FIG. 1 is a schematic diagram of a femtosecond laser pulse waveform measurement apparatus of the present utility model; FIG. 2 is a schematic view of the optical path of the nonlinear crystal element of the present utility model, which is an A-direction side view of the nonlinear crystal element of FIG. 1; fig. 3 is a schematic view of the light path of the light guiding lens set in the present utility model, which is a side view of the light guiding lens set in fig. 1 in the B-direction, and the arrow in the figure indicates the direction of the light beam. In fig. 1, 2 and 3, in the femtosecond laser pulse waveform measuring device of the utility model, a spectroscope i 1 and a spectroscope ii 2 are sequentially arranged in the incidence direction of the horizontally polarized spatially uniform femtosecond fundamental frequency laser pulse; the fundamental frequency laser pulse is divided into transmitted light and reflected light by the spectroscope I1, and the transmitted light is divided into transmitted light and reflected light again by the spectroscope II 2; a reflecting mirror I3, a delay regulator I4 and a reflecting mirror II 5 are sequentially arranged on a transmission light path of the spectroscope II 2; a reflecting mirror III 6 is arranged on the reflecting light path of the spectroscope II 2; the transmitted light of the spectroscope II 2 is reflected to the delay adjuster I4 through the reflector I3 to be projected to the reflector II 5 after the optical path delay; the light beam reflected from the spectroscope II 2 is reflected by the reflecting mirror III 6 and then projected onto the nonlinear crystal component 7 to perform frequency multiplication conversion together with the light beam reflected from the reflecting mirror II 5; a delay regulator II 8, a light guide lens group 9, a reflecting mirror IV 10 and a reflecting mirror V11 are sequentially arranged on a reflecting light path of the spectroscope I1; the light beam reflected from the spectroscope I1 is projected to the light guide lens group 9 after being subjected to optical path delay through the delay regulator II 8, and the light beam emitted from the light guide lens group 9 is projected onto the nonlinear crystal component 7 in an inclined downward direction after being reflected by the reflecting mirror IV 10 and the reflecting mirror V11 in sequence for triple frequency conversion; a CCD12 is placed behind the nonlinear crystal element 7 to receive the triple frequency light from the nonlinear crystal element 7; the CCD12 is externally connected with a computer, and signals from the CCD12 finally enter the computer for data processing.
The nonlinear crystal component 7 is composed of 4 elements; the frequency doubling crystal 7-1, the light blocking sheet I7-2, the sum frequency crystal 7-3 and the light blocking sheet II 7-4 are sequentially arranged; the light beam reflected from the reflecting mirror II 5 and the light beam reflected from the reflecting mirror III 6 are incident on the frequency doubling crystal 7-1 along the horizontal plane at symmetrical angles, the two light beams intersect at the center of the frequency doubling crystal 7-1, frequency doubling conversion is realized in the overlapping area of the two light beams in the frequency doubling crystal 7-1, the generated frequency doubling light is output along the direction perpendicular to the surface of the frequency doubling crystal 7-1, and the remaining two fundamental frequency light beams transmitted from the frequency doubling crystal 7-1 are absorbed by the light barrier I7-2, as shown in fig. 1; the frequency multiplication light emitted from the frequency multiplication crystal 7-1 and the fundamental frequency light from the reflector V11 are projected onto the sum frequency crystal 7-3 at the same time along the vertical plane at a phase matching angle, the frequency multiplication light and the fundamental frequency light intersect at the center of the sum frequency crystal 7-3, the frequency multiplication conversion is realized in the overlapping area of the two light beams, a double-delay third-order related signal is generated, and the third-order related signal light is output along the direction vertical to the surface of the sum frequency crystal 7-3; the residual fundamental frequency beam and the residual frequency-doubled beam transmitted from the sum frequency crystal 7-3 are absorbed by the light blocking sheet ii 7-4 as shown in fig. 2.
The light guide lens group 9 consists of two light guide lenses which are orthogonal up and down; the light guide mirror I9-1 and the light guide mirror II 9-2 are sequentially arranged in the transmission direction of the fundamental frequency laser pulse; the light guide lens I9-1 is used for emitting the incident horizontal light beam vertically upwards, the light guide lens II 9-2 is used for horizontally reflecting the vertical light beam, and the emergent direction of the horizontal reflected light beam is perpendicular to the incident horizontal light beam, as shown in fig. 3.
The light guide lens group 9 converts the fundamental frequency laser pulse from horizontal polarization to vertical polarization.
The frequency doubling crystal 7-1 and the sum frequency crystal 7-3 adopt 90 o Non-collinear ooe matching. In this embodiment, the frequency doubling crystal 7-1 and the sum frequency crystal 7-3 are made of KDP materials. Different crystal materials such as BBO, KDP and the like are selected according to different incident laser wavelengths.
The frequency doubling crystal 7-1 converts the horizontal polarized spatially uniform fundamental frequency laser pulse time signal I (t) into a vertical polarized frequency doubling signal G modulated along the horizontal direction (2) (x 1 ) The sum frequency crystal 7-3 sums the frequency of the fundamental frequency pulse light and the frequency multiplication light along the vertical plane to convert the fundamental frequency pulse light and the frequency multiplication light into a double-delay third-order related signal G (3) (x,y)。
The delay adjuster I4 and the delay adjuster II 8 not only can determine doubleDelay third-order correlation signal G (3) Zero point of (x, y), G can be extended (3) (x, y) field of view range.
The basic principle of the femtosecond laser pulse waveform measurement of the utility model is as follows: using a dual-delay third-order intensity time correlation function G (3) (τ 1 , τ 2 ) The temporal shape of the pulses can be uniquely determined; obtaining a directly measurable double-delay third-order space-related signal G by means of non-collinear frequency conversion of a frequency doubling crystal and a frequency summation crystal (3) (x, y), and then converted into a double-delay third-order intensity time correlation function G by simple time-space coordinate transformation (3) (τ 1 , τ 2 )。
The basic principle of recovering the pulse waveform from the correlation function is:
correlation signal G (3) (x, y) and a correlation function G (3) (τ 1 , τ 2 ) The relation of (2) is:
wherein k is 1 Represents the proportionality coefficient, alpha represents the incidence angle of two fundamental frequency beams incident on the frequency doubling crystal, beta represents the incidence angle of the fundamental frequency beams incident on the frequency summation crystal, epsilon represents the incidence angle of the frequency doubling beam incident on the frequency summation crystal, u 1ν Group velocity of fundamental beam in crystal, u 2ν Indicating the group velocity of the doubled beam within the crystal.
The dual-delay third-order intensity time correlation function G (3) (τ 1 ,τ 2 ) Rewritten as G (3) (τ 1 ,τ＝τ 2 －τ 1 2) then performing a Fourier transform to obtain a Fourier spectrum G (3) (ν 1 V) from which the fourier spectrum intensity amplitude I (v) of the light pulse can be obtained 1 )|：
Using dual delay third order correlationFunction G (3) (τ 1 τ) can obtain the Fourier spectrum phase φ (ν) of the optical pulse 1 )：
Finally, the pulse waveform I (t) is restored by inverse fourier transform:
in the embodiment, the central wavelength of the incident laser pulse is 800nm, the pulse width is about 0.1ps, the energy is about 10mJ, the aperture of the light beam is 1cm, the horizontal polarization is realized, the frequency doubling crystal 7-1 and the sum frequency crystal 7-3 are made of KDP materials, and non-collinear ooe phase matching is adopted. The two fundamental frequency beams reflected from the mirror II 5 and the mirror III 6 are reflected by about 30 o Is symmetrically incident on the frequency doubling crystal 7-1 along the horizontal direction, and the generated frequency doubling light beam is output along the normal direction of the surface of the frequency doubling crystal 7-1, and the frequency doubling light beam is approximately 17 degrees with the fundamental frequency light beam reflected from the reflecting mirror V11 o Is incident on the sum frequency crystal 7-3 in the vertical direction with the incidence angle of the fundamental frequency beam being about 11.8 0 The incidence angle of the doubled light is about 5.8 0 Generating triple frequency light in the beam overlapping area, and outputting the generated triple frequency light along the normal direction of the surface of the sum frequency crystal 7-3, wherein the triple frequency light recorded by the CCD12 is a double-delay third-order related signal
The method comprises the steps of carrying out a first treatment on the surface of the Here α≡14.73 o ，β≈11.78 o ，ε≈5.86 o Group velocity u 1ν 、u 2ν The numerical value of (2) is obtained according to an optical manual, and finally, the data processing is carried out by a computer according to the principle, so as to obtain the laser pulse waveform distribution. />
Claims (3)
1. A femtosecond laser pulse waveform measuring device is characterized in that: in the femtosecond laser pulse waveform measuring device, a spectroscope I (1) and a spectroscope II (2) are sequentially arranged in the incidence direction of the horizontally polarized spatially uniform femtosecond fundamental frequency laser pulse; the fundamental frequency laser pulse is divided into transmitted light and reflected light by the spectroscope I (1), and the transmitted light is divided into transmitted light and reflected light again by the spectroscope II (2); a reflecting mirror I (3), a delay regulator I (4) and a reflecting mirror II (5) are sequentially arranged on a transmission light path of the spectroscope II (2); a reflecting mirror III (6) is arranged on the reflecting light path of the spectroscope II (2); the transmitted light of the spectroscope II (2) is reflected to the delay adjuster I (4) through the reflector I (3) to be projected to the reflector II (5) after the optical path delay; the light beam reflected from the beam splitter II (2) is reflected by the reflecting mirror III (6) and then projected onto the nonlinear crystal component (7) at the same time as the light beam reflected from the reflecting mirror II (5) for frequency multiplication conversion; a delay regulator II (8), a light guide lens group (9), a reflecting mirror IV (10) and a reflecting mirror V (11) are sequentially arranged on a reflecting light path of the spectroscope I (1); the light beam reflected from the spectroscope I (1) is projected to the light guide lens group (9) after being subjected to optical path delay by the delay regulator II (8), and the light beam emitted from the light guide lens group (9) is projected onto the nonlinear crystal component (7) in an inclined downward direction after being reflected by the reflecting mirror IV (10) and the reflecting mirror V (11) in sequence for frequency tripling conversion; placing a CCD (12) behind the nonlinear crystal element (7) to receive the triple frequency light from the nonlinear crystal element (7); the CCD (12) is externally connected with a computer, and signals from the CCD (12) finally enter the computer for data processing.
2. The femtosecond laser pulse waveform measurement apparatus according to claim 1, wherein: the nonlinear crystal component (7) is composed of 4 elements; the frequency doubling crystal (7-1), the light barrier I (7-2), the sum frequency crystal (7-3) and the light barrier II (7-4) are sequentially arranged in sequence; the light beam reflected from the reflecting mirror II (5) and the light beam reflected from the reflecting mirror III (6) are incident on the frequency doubling crystal (7-1) along the horizontal plane at symmetrical angles, the light beam reflected from the reflecting mirror II (5) and the light beam reflected from the reflecting mirror III (6) intersect at the center of the frequency doubling crystal (7-1), frequency doubling conversion is realized in the overlapping area of the two light beams in the frequency doubling crystal (7-1), the generated frequency doubling light is output along the direction perpendicular to the surface of the frequency doubling crystal (7-1), and the remaining two fundamental frequency light beams transmitted from the frequency doubling crystal (7-1) are absorbed by the light blocking sheet I (7-2); the frequency multiplication light emitted from the frequency multiplication crystal (7-1) and the fundamental frequency light from the reflector V (11) are projected onto the frequency summation crystal (7-3) at the same time along the vertical plane at a phase matching angle, the frequency multiplication light and the fundamental frequency light intersect at the center of the frequency summation crystal (7-3), the frequency multiplication conversion is realized in the overlapping area of two light beams, a dual-delay third-order related signal is generated, and the third-order related signal light is output along the direction vertical to the surface of the frequency summation crystal (7-3); the residual fundamental frequency beam and the residual frequency multiplication beam transmitted through the sum frequency crystal (7-3) are absorbed by the light blocking sheet (7-4).
3. The femtosecond laser pulse waveform measurement apparatus according to claim 1, wherein: the light guide lens group (9) consists of two light guide lenses which are orthogonal up and down; a light guide mirror I (9-1) and a light guide mirror II (9-2) are sequentially arranged in the transmission direction of the fundamental frequency laser pulse; the light guide lens I (9-1) is used for emitting the incident horizontal light beam vertically upwards, the light guide lens II (9-2) is used for horizontally reflecting the vertical light beam, and the emergent direction of the horizontal reflected light beam is perpendicular to the incident horizontal light beam.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710913257.XA CN107677379B (en) | 2017-09-30 | 2017-09-30 | Femtosecond laser pulse waveform measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710913257.XA CN107677379B (en) | 2017-09-30 | 2017-09-30 | Femtosecond laser pulse waveform measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107677379A CN107677379A (en) | 2018-02-09 |
| CN107677379B true CN107677379B (en) | 2023-06-09 |
Family
ID=61138315
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710913257.XA Active CN107677379B (en) | 2017-09-30 | 2017-09-30 | Femtosecond laser pulse waveform measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107677379B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108775966B (en) * | 2018-09-05 | 2023-06-09 | 中国工程物理研究院激光聚变研究中心 | Double-delay third-order correlator |
| CN109612594A (en) * | 2019-01-15 | 2019-04-12 | 中国工程物理研究院激光聚变研究中心 | A kind of laser pulse waveform measuring device and method based on correlation method three times |
| CN109612593A (en) * | 2019-01-15 | 2019-04-12 | 中国工程物理研究院激光聚变研究中心 | A kind of device and method for the measurement of ultrashort pulse time waveform |
| CN109506791A (en) * | 2019-01-16 | 2019-03-22 | 中国工程物理研究院激光聚变研究中心 | A kind of single-shot time subnanosecond laser pulse waveform meter |
| CN109506793A (en) * | 2019-01-16 | 2019-03-22 | 中国工程物理研究院激光聚变研究中心 | A kind of single-shot time femto-second laser pulse waveform meter |
| CN109682483A (en) * | 2019-02-01 | 2019-04-26 | 中国工程物理研究院激光聚变研究中心 | A kind of single-shot time Ps Laser Pulse waveform meter |
| CN113155280B (en) * | 2021-04-16 | 2022-07-26 | 北京大学 | Three-order correlator high-fidelity device and control method thereof |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2394329A1 (en) * | 2000-01-07 | 2001-07-12 | Gang He | Optical spectrum analyzer |
| EP1199590A1 (en) * | 2000-10-20 | 2002-04-24 | Carl Zeiss | 8 mirror microlithography projection lens |
| CN1888836A (en) * | 2006-07-21 | 2007-01-03 | 中国科学院上海光学精密机械研究所 | Flying second pulse simple real-time measuring instrument |
| CN2927012Y (en) * | 2006-07-21 | 2007-07-25 | 中国科学院上海光学精密机械研究所 | Simple fly-second realtime measuring equipment |
| CN201078759Y (en) * | 2006-08-23 | 2008-06-25 | 浦比俊引特艾克堤夫科技公司 | Reality image projection apparatus with plastic curved surface mirror for enhancing image and correcting aberration |
| CN201293685Y (en) * | 2008-11-21 | 2009-08-19 | 中国科学院上海光学精密机械研究所 | Third-order relevant instrument with double delay light paths |
| CN101694544A (en) * | 2009-10-21 | 2010-04-14 | 中国科学院上海光学精密机械研究所 | Device for enhancing power density of focal spot of large light-spot laser system |
| CN102426062A (en) * | 2011-09-26 | 2012-04-25 | 复旦大学 | Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device |
| CN103712699A (en) * | 2014-01-08 | 2014-04-09 | 中国工程物理研究院激光聚变研究中心 | Laser pulse contrast ratio measurement device based on optical limiting |
| CN103712688A (en) * | 2014-01-08 | 2014-04-09 | 中国工程物理研究院激光聚变研究中心 | High-power ultra-short laser real-time near field intensity distribution measuring device |
| CN104242045A (en) * | 2014-09-30 | 2014-12-24 | 中国工程物理研究院应用电子学研究所 | Annular-spot chip amplifier |
| CN106052886A (en) * | 2016-07-13 | 2016-10-26 | 中国工程物理研究院激光聚变研究中心 | Laser pulse shape measurer based on third-order correlation method |
| CN106197693A (en) * | 2016-07-13 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse waveform meter |
| CN205808565U (en) * | 2016-07-13 | 2016-12-14 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse waveform meter |
| CN205940777U (en) * | 2016-07-13 | 2017-02-08 | 中国工程物理研究院激光聚变研究中心 | Laser pulse shape measuring device based on third -order correlation method |
| CN207180885U (en) * | 2017-09-30 | 2018-04-03 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse measurement apparatus |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105917277B (en) * | 2014-01-07 | 2020-04-17 | 视瑞尔技术公司 | Display device for holographic reconstruction |
-
2017
- 2017-09-30 CN CN201710913257.XA patent/CN107677379B/en active Active
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2394329A1 (en) * | 2000-01-07 | 2001-07-12 | Gang He | Optical spectrum analyzer |
| EP1199590A1 (en) * | 2000-10-20 | 2002-04-24 | Carl Zeiss | 8 mirror microlithography projection lens |
| CN1888836A (en) * | 2006-07-21 | 2007-01-03 | 中国科学院上海光学精密机械研究所 | Flying second pulse simple real-time measuring instrument |
| CN2927012Y (en) * | 2006-07-21 | 2007-07-25 | 中国科学院上海光学精密机械研究所 | Simple fly-second realtime measuring equipment |
| CN201078759Y (en) * | 2006-08-23 | 2008-06-25 | 浦比俊引特艾克堤夫科技公司 | Reality image projection apparatus with plastic curved surface mirror for enhancing image and correcting aberration |
| CN201293685Y (en) * | 2008-11-21 | 2009-08-19 | 中国科学院上海光学精密机械研究所 | Third-order relevant instrument with double delay light paths |
| CN101694544A (en) * | 2009-10-21 | 2010-04-14 | 中国科学院上海光学精密机械研究所 | Device for enhancing power density of focal spot of large light-spot laser system |
| CN102426062A (en) * | 2011-09-26 | 2012-04-25 | 复旦大学 | Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device |
| CN103712699A (en) * | 2014-01-08 | 2014-04-09 | 中国工程物理研究院激光聚变研究中心 | Laser pulse contrast ratio measurement device based on optical limiting |
| CN103712688A (en) * | 2014-01-08 | 2014-04-09 | 中国工程物理研究院激光聚变研究中心 | High-power ultra-short laser real-time near field intensity distribution measuring device |
| CN104242045A (en) * | 2014-09-30 | 2014-12-24 | 中国工程物理研究院应用电子学研究所 | Annular-spot chip amplifier |
| CN106052886A (en) * | 2016-07-13 | 2016-10-26 | 中国工程物理研究院激光聚变研究中心 | Laser pulse shape measurer based on third-order correlation method |
| CN106197693A (en) * | 2016-07-13 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse waveform meter |
| CN205808565U (en) * | 2016-07-13 | 2016-12-14 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse waveform meter |
| CN205940777U (en) * | 2016-07-13 | 2017-02-08 | 中国工程物理研究院激光聚变研究中心 | Laser pulse shape measuring device based on third -order correlation method |
| CN207180885U (en) * | 2017-09-30 | 2018-04-03 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse measurement apparatus |
Non-Patent Citations (5)
| Title |
|---|
| Measuring ultrashort laser pulses in the time-frequency domain using frequency-Resolved optical Gating;Rick Trebino等;Review Science Instrument;第68卷(第9期);全文 * |
| 单发次皮秒脉冲宽度的二阶自相关法测试;孙志红 等;激光与红外;第39卷(第8期);全文 * |
| 基于三阶相关法的超快脉冲波形重构技术研究;申淼 等;中国优秀硕士学位论文全文数据库基础科学辑(第1期);全文 * |
| 基于椭球反射镜大角度光束扫描的光学衍射层析技术的研究;李梦周;中国优秀硕士学位论文全文数据库基础科学辑(第6期);全文 * |
| 超短激光脉冲波形的单次测量技术;夏彦文 等;物理学报物理学报;第66卷(第4期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107677379A (en) | 2018-02-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107677379B (en) | Femtosecond laser pulse waveform measuring device | |
| CN106197693B (en) | A kind of ultrashort laser pulse waveform meter | |
| CN102636272B (en) | Femtosecond laser pulse measurement method based on transient grating effect and device | |
| US11143558B2 (en) | Method and system for measuring transient time width of ultrashort pulse | |
| CN106052886B (en) | Laser pulse waveform measuring device based on third-order correlation method | |
| CN101216350B (en) | High power ultra-short laser pulse contrast measuring apparatus and measurement method | |
| CN103698025A (en) | Domain wall-based nonlinear impulse autocorrelation measuring method and measuring device | |
| CN104535201B (en) | A kind of apparatus for measuring high power ultra-short laser pulse contrast | |
| CN104697649A (en) | Single-shot laser pulse detection device | |
| CN104121995A (en) | Device and method for measuring time-domain width of femtosecond pulse | |
| CN205940777U (en) | Laser pulse shape measuring device based on third -order correlation method | |
| CN205808565U (en) | A kind of ultrashort laser pulse waveform meter | |
| JPH0545230A (en) | Method and device for measuring width of optical pulse | |
| CN103712699A (en) | Laser pulse contrast ratio measurement device based on optical limiting | |
| CN204330141U (en) | A kind of apparatus for measuring high power ultra-short laser pulse contrast | |
| CN108775966B (en) | Double-delay third-order correlator | |
| CN107782456A (en) | A kind of ultrashort laser pulse measurement apparatus | |
| CN102944313A (en) | Multifunctional femtosecond laser pulse measuring device | |
| CN114333522A (en) | Single-photon and double-photon interference device and control method thereof | |
| CN109060151A (en) | A kind of subnanosecond laser pulse contrast measuring device | |
| CN207180885U (en) | A kind of ultrashort laser pulse measurement apparatus | |
| CN201166588Y (en) | Apparatus for measuring high power ultra-short laser pulse contrast | |
| CN102778301B (en) | Real-time measuring device of self-reference spectrum interference femtosecond laser pulse | |
| CN208953135U (en) | A kind of double delay third-order relevant instruments | |
| CN100424483C (en) | Measuring device using supershort pulse frequency resolution optical switch method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |