CN205940777U - Laser pulse shape measuring device based on third -order correlation method - Google Patents
Laser pulse shape measuring device based on third -order correlation method Download PDFInfo
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Abstract
The utility model discloses a laser pulse shape measuring device based on third -order correlation method. Become light into transmitted light and reverberation by the collimated laser beam that is surveyed behind the spectroscope, the transmitted light falls into transmitted light and reverberation through semitransparent mirror again, transmitted light and reverberation through two frequency doubled lights of doubling of frequency crystal generation, convert time intensity information into intensity autocorrelation one -dimensional spatial information, folded light beam behind this two doublings of frequency light beam and the spectroscope with the frequency crystal on realize converting time intensity information into intensity third -order correlation two dimension spatial information by three frequency conversion. The utility model discloses a simple reconsitution technique not only can obtain pulse width information, can also obtain impulse waveform information accurately, can handle the psec, fly a second impulse waveform. With low costs, the simple structure of measuring device, it is convenient to adjust.
Description
Technical field
This utility model belong to ultrashort laser pulse technical field of measurement and test and in particular to a kind of based on third-order correlation method swash
Optical pulse waveform measurement apparatus.
Background technology
At present, typically by measuring second order, single three rank intensity correlation functions postponing deduce the arteries and veins of ultrashort laser pulse
Width, but, only record second order, single three rank intensity correlation functions postponing not can determine that the shape of pulse, therefore second order, three ranks
Correlator is mainly used to measure the contrast of pulse.Entitled《Apparatus for measuring high power ultra-short laser pulse contrast》Practicality
New patent（The patent No.：ZL 2007 2007 7677.0）Disclose a kind of three rank G by singly postponing(3)(τ) intensity is related
Function is obtaining the measuring method of contrast ration, entitled《A kind of device for measuring contrast ratio of single-time ultrashort laser pulses》's
Utility model patent（The patent No.：ZL 2010 2029 3190.8）Disclose one kind and form two lists using two delay devices
The three rank autocorrelation signals postponing, the method acquisition contrast information of test coherent signal main peak and pulse front edge respectively.FROG
Although and its mutation can measure the shape of pulse, calculating complicated, and pulse width measure being limited in scope.
Content of the invention
In order to overcome, existing e measurement technology measurement range in ultrashort laser pulse waveform measurement is limited, recover impulse wave
Shape calculates complicated deficiency, and this utility model provides a kind of laser pulse waveform measuring device based on third-order correlation method.
This utility model solves its technical problem and be employed technical scheme comprise that：
Laser pulse waveform measuring device based on third-order correlation method of the present utility model, is characterized in, described device
In, spectroscope, semi-transparent semi-reflecting lens are set gradually on high-power laser pulse incident direction.Laser pulse is by described light splitting
Mirror is divided into transmitted light and reflected light, and transmitted light is divided into transmitted light and reflected light again through semi-transparent semi-reflecting lens.In semi-transparent semi-reflecting lens
Reflected light path be disposed with reflecting mirror I, frequency-doubling crystal, light barrier I, the transmitted light path of semi-transparent semi-reflecting lens sets gradually
There are delay modulator I, reflecting mirror II, frequency-doubling crystal, light barrier II；The reflected mirror of reflected light I of semi-transparent semi-reflecting lens reflexes to again
Frequency crystal, reflected light is absorbed by light barrier I after frequency-doubling crystal transmission；The delayed regulation of transmitted light of described semi-transparent semi-reflecting lens
Device I projects reflecting mirror II after carrying out optical path delay, reflected mirror II reflexes to frequency-doubling crystal, and reflected light is through frequency-doubling crystal transmission
Absorbed by light barrier II afterwards；Project frequency-doubling crystal from the light beam of reflecting mirror I reflection with the light beam from reflecting mirror II reflection simultaneously
On, realize frequency-doubled conversion in two the reflected beams overlapping regions, two frequency doubled lights of generation are along the side with frequency-doubling crystal perpendicular
To output；Two frequency multiplication beam directions of frequency-doubling crystal output set gradually guide-lighting microscope group and frequency crystal, attenuator I, CCD
Ⅰ；Two described frequency multiplication light beams project and frequency crystal after reflecting through guide-lighting microscope group, two frequency multiplication light beams through and frequency crystal transmission after throw
It is mapped to attenuator I and carries out strength retrogression, enter CCD I；It is disposed with reflecting mirror III, postpones to adjust in spectroscopical reflected light path
Section device II, reflecting mirror IV, reflecting mirror V and frequency crystal, light barrier III；The described reflected mirror of spectroscopical reflected light III reflects
Enter delay modulator II afterwards and carry out optical path delay, from light beam reflected mirror IV, the reflection successively again of delay modulator II outgoing
Project after mirror V and frequency crystal, from reflecting mirror V reflection fundamental frequency light through and frequency crystal transmission after absorbed by light barrier III；From
The fundamental frequency light of reflecting mirror V reflection and two frequency doubled lights of guide-lighting microscope group outgoing project simultaneously and frequency crystal on, in described fundamental frequency
Frequency tripling conversion is realized in the overlapping region of light and two frequency doubled lights, the frequency tripling light of generation along with and the perpendicular side of frequency plane of crystal
To output；Attenuator II, CCD II are set gradually on frequency tripling beam direction, frequency tripling light beam carries out intensity through attenuator II
Decay, enters CCD II；Described CCD I, CCD II external computer respectively, the signal from CCD I, CCD II finally enters meter
Calculation machine carries out data processing.
Described guide-lighting microscope group is made up of four pieces of guide-lighting mirrors.Two frequency multiplication light beam transmission directions are disposed with guide-lighting mirror
Ith, guide-lighting mirror II, guide-lighting mirror III, guide-lighting mirror IV.Incoming Level beam is reflected by guide-lighting mirror I vertically upward, and guide-lighting mirror II will be vertical
Beam level reflects, and horizontal reflected beam exit direction is vertical with incoming Level beam, and horizontal reflected beam is hung down by guide-lighting mirror III
Directly be reflected down, the beam level reflecting vertically downward is reflected by guide-lighting mirror IV, the horizontal reflected beam of final outgoing with incident
In the same plane, horizontal reflected beam is vertical with incoming Level beam for horizontal light beam.
Described frequency-doubling crystal and frequency crystal adopt 90oNon-co- lines matching.According to different laser wavelength of incidence from not
Same crystalline material such as BBO, KDP etc., can be with using different noncollinear phase matching mode such as ooe, oee etc..
The beneficial effects of the utility model are：
1. measurement apparatus low cost of the present utility model, structure are simple, easy to adjust, using frequency-doubling crystal and and frequency crystalline substance
Body phase combines, and three rank pulse strength time correlation signals is converted to beneficial to the spatial-intensity Two dimensional Distribution detecting, by simple
Reconfiguration technique, pulse width information not only can be obtained, can also accurately obtain pulse shape information.
2. this utility model adopts 90 degree of noncollinear phase matchings, and double delay devices can increase the time with independent regulation
Measurement range.
Brief description
Fig. 1 is the laser pulse waveform measuring device light path schematic diagram based on third-order correlation method of the present utility model；
Fig. 2 is the guide-lighting microscope group light path schematic diagram in this utility model；
In figure, 1. spectroscope 2. semi-transparent semi-reflecting lens 3. reflecting mirror I 4. delay modulator I 5. reflecting mirror II 6.
Guide-lighting microscope group 10. reflecting mirror III 11. delay modulator II 12. of frequency-doubling crystal 7. light barrier, I 8. light barrier II 9.
Reflecting mirror IV 13. reflecting mirror V 14. and frequency crystal 15. attenuator, I 16. CCD, I 17. attenuator II 18. CCD
II 19. light barrier III 9-1. leaded light mirror I 9-2. leaded light mirror II 9-3. leaded light mirror III 9-4. leaded light mirror IV.
Specific embodiment
With reference to the accompanying drawings and examples this utility model is further illustrated, but should not limited with this of the present utility model
Protection domain.
Embodiment 1
Fig. 1 is the laser pulse waveform measuring device light path schematic diagram based on third-order correlation method of the present utility model, and Fig. 2 is
Guide-lighting microscope group light path schematic diagram in this utility model, is the A of guide-lighting microscope group in Fig. 1 to side view.In Fig. 1, Fig. 2, this
In the laser pulse waveform measuring device based on third-order correlation method of utility model, in high-power laser pulse incident direction according to
Secondary setting spectroscope 1, semi-transparent semi-reflecting lens 2；Laser pulse is divided into transmitted light and reflected light, transmitted light by described spectroscope 1
It is divided into transmitted light and reflected light through semi-transparent semi-reflecting lens 2 again；It is disposed with reflecting mirror in the reflected light path of semi-transparent semi-reflecting lens 2
I 3, frequency-doubling crystal 6, light barrier I 7, are disposed with delay modulator I 4, reflecting mirror on the transmitted light path of semi-transparent semi-reflecting lens 2
II 5, frequency-doubling crystal 6, light barrier II 8；The reflected mirror of reflected light I 3 of semi-transparent semi-reflecting lens 2 reflexes to frequency-doubling crystal 6, reflected light warp
Absorbed by light barrier I 7 after frequency-doubling crystal 6 transmission；The delayed actuator of transmitted light I 4 of described semi-transparent semi-reflecting lens 2 carries out light path
Reflecting mirror II 5 is projected, reflected mirror II 5 reflexes to frequency-doubling crystal 6, and reflected light is kept off after frequency-doubling crystal 6 transmission after delay
Mating plate II 8 absorbs；Light beam from reflecting mirror I 3 reflection and the light beam from reflecting mirror II 5 reflection project frequency-doubling crystal 6 simultaneously,
Realize frequency-doubled conversion in two the reflected beams overlapping regions, two frequency doubled lights of generation are along the direction with frequency-doubling crystal 6 perpendicular
Output；Two frequency multiplication beam directions of frequency-doubling crystal 6 output set gradually guide-lighting microscope group 9 and frequency crystal 14, attenuator I 15,
CCDⅠ16；Two described frequency multiplication light beams project and frequency crystal 14 after reflecting through guide-lighting microscope group, two frequency multiplication light beam warps and frequency crystal
Project attenuator I 15 after 14 transmissions and carry out strength retrogression, enter CCD I 16；It is disposed with the reflected light path of spectroscope 1
Reflecting mirror III 10, delay modulator II 11, reflecting mirror IV 12, reflecting mirror V 13 and frequency crystal 14, light barrier III 19；Described
Enter delay modulator II 11 after the reflected mirror of reflected light III 10 reflection of spectroscope 1 and carry out optical path delay, from delay modulator
The light beam of II 11 outgoing more successively reflected mirror IV 12, project and frequency crystal 14 after reflecting mirror V 13, anti-from reflecting mirror V 13
The fundamental frequency light penetrated through and frequency crystal 14 transmission after by light barrier III 19 absorb；Fundamental frequency light and guide-lighting mirror from reflecting mirror V 13 reflection
Organize 9 outgoing two frequency doubled lights project simultaneously with frequency crystal 14 on, real in the overlapping region of described fundamental frequency light and two frequency doubled lights
Existing frequency tripling conversion, the frequency tripling light of generation along with and frequency crystal 14 perpendicular direction output；In frequency tripling light beam side
Set gradually attenuator II 17, CCD II 18 upwards, frequency tripling light beam carries out strength retrogression through attenuator II 17, enter CCD II
18；Described CCD I 16, CCD II 18 external computer respectively, the signal from CCD I 16, CCD II 18 finally enters computer
Carry out data processing.
Described guide-lighting microscope group 9 is made up of four pieces of guide-lighting mirrors；Two frequency multiplication light beam transmission directions are disposed with leaded light
Mirror I 9-1, guide-lighting mirror II 9-2, guide-lighting mirror III 9-3, guide-lighting mirror IV 9-4；Guide-lighting mirror I 9-1 is anti-vertically upward by incoming Level beam
Penetrate, by normal beam horizontal reflection, horizontal reflected beam exit direction is vertical with incoming Level beam for guide-lighting mirror II 9-2, guide-lighting
Horizontal reflected beam is reflected by mirror III 9-3 vertically downward, and the beam level reflecting vertically downward is reflected by guide-lighting mirror IV 9-4,
With incoming Level beam in the same plane, horizontal reflected beam is hung down the horizontal reflected beam of whole outgoing with incoming Level beam
Directly, as shown in Figure 2.
Described frequency-doubling crystal 6 and frequency crystal 14 adopt 90oNon-co- lines matching.According to different laser wavelength of incidence choosings
With different crystalline materials such as BBO, KDP etc., can be with using different noncollinear phase matching mode such as ooe, oee etc..
Laser pulse time signal I (t) is converted to space second order correlation in the horizontal direction by described frequency-doubling crystal 6
Signal G(2)(x1).
The coherent signal G in the horizontal direction that frequency-doubling crystal 6 is produced by described guide-lighting microscope group 9(2)(x1) be converted to edge
The coherent signal G of vertical direction(2)Y coherent signal is converted to horizontal polarization by vertical polarization by () simultaneously.
Fundamental frequency pulsed light and two frequency doubled lights are carried out and frequency by described and frequency crystal 14, are converted to third-order correlation signal G(3)
(x,y).
Described delay modulator I 4, delay modulator II 11 not only can determine zero point G of three rank intensity coherent signals(3)(x=0, y=0), can also extend G(3)The field range of (x, y).
Of the present utility model based on third-order correlation method laser pulse shape measurement ultimate principle be：Related using second order
Function G(2)(τ) postpone triple correlation function G with double(3)( τ1, τ2) can accurately determine the spectral distribution of light pulse, then lead to
Cross Fourier transform and obtain impulse waveform；And by frequency-doubling crystal and and frequency crystal non-colinear frequency conversion, can by when
Between correlation function G(2)(τ)、G(3)( τ1, τ2) be converted to time-space coordinate one-to-one, can be with space measured directly
Intensity distributions G(2)(x1)、G(3)(x, y), then measured pulse waveform is recovered by simple time-space coordinate transform.
From correlation function recover impulse waveform ultimate principle be：
By second-order qs-correlation function G(2)(τ) amplitude of the spectral intensity of light pulse can be obtained | I (ν) |：
（1）
In formula, ν represents frequency, and i represents unit complexor, τ express time.
Triple correlation function G is postponed by dual-time(3)( τ1, τ2) can obtain light pulse spectral intensity phase
(ν)：
；（2）
（3）
So, by second-order qs-correlation function G(2)(τ) postpone triple correlation function G with double(3)( τ1, τ2) can determine light
Spectral distribution I (ν) of pulse=| I (ν) | exp（iφ(ν)）, then impulse waveform just can be recovered by Fourier transform：
（4）
Comprised the following steps using measurement apparatus of the present utility model measurement ultrashort laser pulse waveform：
1. frequency doubled light aplanatism calibration：Pulse width is less than 1 psec, beam modulation near field degree is less than 1.2, near field contrast
Horizontal polarization laser pulse less than 0.06 is input to this device, adjusts delay modulator I 4, makes two frequency doubled lights of generation
By force, and the strongest region be located at CCD I 16 target surface center, described horizontal coordinate position is designated as zero x1=0, CCD I
The grey scale change image obtaining in the horizontal direction on 16 is second order coherent signal G(2)(x1).
2. frequency tripling light aplanatism calibration:Adjust delay modulator II 11, make the frequency tripling light of generation the strongest and the strongest
Bright spot is located at the target surface center of CCD II 18, and described coordinate position is designated as zero（X=0, y=0）, on CCD II 18
The grey scale change image obtaining is third-order correlation signal G(3)( x, y).
3. space-time transformation coefficient calibration:Adjust delay modulator I 4, increase the light path 0.3mm of this light path, that is, be equivalent to
Time delay 1 psec, records the direction of facular point deviation from origin and amount of movement Δ x on CCD I 16, CCD II 181, Δ y；
Adjust delay modulator II 11, increase the light path 0.3mm of this light path, that is, be equivalent to time delay 1 psec, record CCD II
The direction of facular point deviation from origin and amount of movement Δ x on 18, obtain the proportionality coefficient of correlation function time delay and coordinate：k1
=Δ x1、k2=Δ y, k3=Δ x（Unit：mm/ps）, i.e. G(2)(τ=x1/k1), G(3)( τ1=x/k3, τ2=y/k2).
4. calculate amplitude | the I (ν) | of spectral intensity:Obtain spectral intensity amplitude | the I (ν) | of light pulse using below equation
（5）
Here, Δ x is the pixel dimension of CCD I 16, xiFor i-th pixel of horizontal direction with a distance from initial point, 2Ni is light
The pixel number of horizontal direction shared by speckle.
5. calculate the phase (ν) of spectral intensity:Using formula（2）、（3）Obtain the spectral intensity phase (ν) of light pulse,
Integration need to be changed to sue for peace during calculating, range of summation is region shared by hot spot on CCD II 18.
6. utilize formula（4）Obtain laser pulse shape.
In the present embodiment, incident laser pulse wavelength is 1053nm, and pulse width is about 1ps, and energy is about 10mJ, light beam
Bore is 1cm, horizontal polarization, frequency-doubling crystal 6 with and frequency crystal 14 all using KDP material, all using non-colinear ooe position phase
Join.Two basic frequency beams coming from semi-transparent semi-reflecting lens 2 transmission and reflection are with about 30oIncident angle symmetrically incide frequency-doubling crystal
On 6, two frequency doubled lights of generation export along frequency-doubling crystal 6 normal to a surface direction, by after guide-lighting microscope group 9 by two frequency multiplication light beams
Partially it turn 90 degrees, at this moment two frequency doubled lights of CCD I 16 record are second order coherent signal G(2)(τ=y/k1), related direction is perpendicular
Nogata is to being converted to horizontal polarization, space-time transformation coefficient k by the deflected state of two frequency doubled lights by vertical polarization simultaneously1≈0.58mm/
ps；It is made simultaneously incident to and frequency crystal with the basic frequency beam coming from spectroscope 1 reflection from guide-lighting microscope group 9 two frequency doubled lights out
On 14, the angle of incidence of basic frequency beam is about 170, the angle of incidence of two frequency doubled lights is about 100, produce frequency tripling in light beam overlapping region
Light, the frequency tripling light edge of generation and frequency crystal 14 normal to a surface direction export, and at this moment the frequency tripling light of CCD II 18 record is
For third-order correlation signal G(3)( τ1=x/k3, τ2=y/k2), space-time transformation coefficient k2≈ 0.58mm/ps, k3≈0.49mm/ps；
Carry out data processing finally by computer, obtain laser pulse shape distribution.
Claims (3)
1. a kind of laser pulse waveform measuring device based on third-order correlation method, is characterized in that：In described device, in high power
Spectroscope is set gradually in laser pulse incident direction（1）, semi-transparent semi-reflecting lens（2）；Laser pulse passes through described spectroscope（1）
It is divided into transmitted light and reflected light, transmitted light is through semi-transparent semi-reflecting lens（2）It is divided into transmitted light and reflected light again；In semi-transparent semi-reflecting lens
（2）Reflected light path be disposed with reflecting mirror I（3）, frequency-doubling crystal（6）, light barrier I（7）, in semi-transparent semi-reflecting lens（2）Saturating
Penetrate and delay modulator I is disposed with light path（4）, reflecting mirror II（5）, frequency-doubling crystal（6）, light barrier II（8）；Semi-transparent semi-reflecting
Mirror（2）The reflected mirror of reflected light I（3）Reflex to frequency-doubling crystal（6）, reflected light is through frequency-doubling crystal（6）By light barrier I after transmission
（7）Absorb；Described semi-transparent semi-reflecting lens（2）The delayed actuator of transmitted light I（4）Reflecting mirror is projected after carrying out optical path delay
Ⅱ（5）, reflected mirror II（5）Reflex to frequency-doubling crystal（6）, reflected light is through frequency-doubling crystal（6）By light barrier II after transmission（8）
Absorb；From reflecting mirror I（3）Reflection light beam with from reflecting mirror II（5）The light beam of reflection projects frequency-doubling crystal simultaneously（6）On,
Realize frequency-doubled conversion, two frequency doubled lights edges of generation and frequency-doubling crystal in two the reflected beams overlapping regions（6）The side of perpendicular
To output；In frequency-doubling crystal（6）Guide-lighting microscope group is set gradually on two frequency multiplication beam directions of output（9）, and frequency crystal（14）, decline
Subtract piece I（15）、CCDⅠ（16）；Two described frequency multiplication light beams project and frequency crystal after reflecting through guide-lighting microscope group（14）, two frequencys multiplication
Light beam warp and frequency crystal（14）Attenuator I is projected after transmission（15）Carry out strength retrogression, enter CCD I（16）；In spectroscope
（1）Reflected light path be disposed with reflecting mirror III（10）, delay modulator II（11）, reflecting mirror IV（12）, reflecting mirror V
（13）, and frequency crystal（14）, light barrier III（19）；Described spectroscope（1）The reflected mirror of reflected light III（10）Reflection is laggard
Enter delay modulator II（11）Carry out optical path delay, from delay modulator II（11）The light beam of outgoing reflected mirror IV successively again
（12）, reflecting mirror V（13）After project and frequency crystal（14）, from reflecting mirror V（13）The fundamental frequency light warp of reflection and frequency crystal
（14）By light barrier III after transmission（19）Absorb；From reflecting mirror V（13）The fundamental frequency light of reflection and guide-lighting microscope group（9）The two of outgoing
Frequency doubled light projects and frequency crystal simultaneously（14）On, realize frequency tripling in the overlapping region of described fundamental frequency light and two frequency doubled lights and turn
Change, the frequency tripling light of generation along with and frequency crystal（14）The direction output of perpendicular；On frequency tripling beam direction successively
Setting attenuator II（17）、CCDⅡ（18）, frequency tripling light beam is through attenuator II（17）Carry out strength retrogression, enter CCD II
（18）；Described CCD I（16）、CCDⅡ（18）External computer respectively, from CCD I（16）、CCDⅡ（18）Signal last
Enter computer and carry out data processing.
2. the laser pulse waveform measuring device based on third-order correlation method according to claim 1, is characterized in that：Described
Guide-lighting microscope group（9）It is made up of four pieces of guide-lighting mirrors；Two frequency multiplication light beam transmission directions are disposed with guide-lighting mirror I（9-1）, guide-lighting
Mirror II（9-2）, guide-lighting mirror III（9-3）, guide-lighting mirror IV（9-4）；Guide-lighting mirror I（9-1）Incoming Level beam is reflected vertically upward,
Guide-lighting mirror II（9-2）By normal beam horizontal reflection, horizontal reflected beam exit direction is vertical with incoming Level beam, guide-lighting mirror
Ⅲ（9-3）Horizontal reflected beam is reflected vertically downward, guide-lighting mirror IV（9-4）The beam level reflecting vertically downward is reflected,
With incoming Level beam in the same plane, horizontal reflected beam is hung down the horizontal reflected beam of final outgoing with incoming Level beam
Directly.
3. the laser pulse waveform measuring device based on third-order correlation method according to claim 1, is characterized in that：Described
Frequency-doubling crystal（6）, and frequency crystal（14）Using 90oNon-co- lines matching.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106052886A (en) * | 2016-07-13 | 2016-10-26 | 中国工程物理研究院激光聚变研究中心 | Laser pulse shape measurer based on third-order correlation method |
| CN107677379A (en) * | 2017-09-30 | 2018-02-09 | 中国工程物理研究院激光聚变研究中心 | A kind of femto-second laser pulse waveform meter |
| CN107782456A (en) * | 2017-09-30 | 2018-03-09 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse measurement apparatus |
| CN108775966A (en) * | 2018-09-05 | 2018-11-09 | 中国工程物理研究院激光聚变研究中心 | A kind of double delay third-order relevant instruments |
| CN113155280A (en) * | 2021-04-16 | 2021-07-23 | 北京大学 | Three-order correlator high-fidelity device and control method thereof |
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2016
- 2016-07-13 CN CN201620734206.1U patent/CN205940777U/en not_active Withdrawn - After Issue
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106052886A (en) * | 2016-07-13 | 2016-10-26 | 中国工程物理研究院激光聚变研究中心 | Laser pulse shape measurer based on third-order correlation method |
| CN106052886B (en) * | 2016-07-13 | 2019-11-08 | 中国工程物理研究院激光聚变研究中心 | Laser pulse waveform measuring device based on third-order correlation method |
| CN107677379A (en) * | 2017-09-30 | 2018-02-09 | 中国工程物理研究院激光聚变研究中心 | A kind of femto-second laser pulse waveform meter |
| CN107782456A (en) * | 2017-09-30 | 2018-03-09 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse measurement apparatus |
| CN107677379B (en) * | 2017-09-30 | 2023-06-09 | 中国工程物理研究院激光聚变研究中心 | Femtosecond laser pulse waveform measuring device |
| CN108775966A (en) * | 2018-09-05 | 2018-11-09 | 中国工程物理研究院激光聚变研究中心 | A kind of double delay third-order relevant instruments |
| CN108775966B (en) * | 2018-09-05 | 2023-06-09 | 中国工程物理研究院激光聚变研究中心 | Double-delay third-order correlator |
| CN113155280A (en) * | 2021-04-16 | 2021-07-23 | 北京大学 | Three-order correlator high-fidelity device and control method thereof |
| CN113155280B (en) * | 2021-04-16 | 2022-07-26 | 北京大学 | Three-order correlator high-fidelity device and control method thereof |
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Granted publication date: 20170208 Effective date of abandoning: 20191108 |
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