CN200993600Y - Polarized semiconductor photo diode self-correlation measuring device - Google Patents
Polarized semiconductor photo diode self-correlation measuring device Download PDFInfo
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- CN200993600Y CN200993600Y CN 200620158664 CN200620158664U CN200993600Y CN 200993600 Y CN200993600 Y CN 200993600Y CN 200620158664 CN200620158664 CN 200620158664 CN 200620158664 U CN200620158664 U CN 200620158664U CN 200993600 Y CN200993600 Y CN 200993600Y
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 22
- 230000010287 polarization Effects 0.000 claims abstract description 15
- 230000003287 optical effect Effects 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 13
- 238000005259 measurement Methods 0.000 claims description 9
- 238000005375 photometry Methods 0.000 claims description 4
- 238000010521 absorption reaction Methods 0.000 description 7
- 239000013078 crystal Substances 0.000 description 6
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- 230000005540 biological transmission Effects 0.000 description 2
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- 239000006185 dispersion Substances 0.000 description 1
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Abstract
The utility model relates to a polarimetric semiconductor LED self-correlation measuring device to measure pulse width of ultra-short pulse laser. Lasers to be measured pass through a collimating lens (1) and a half wave plate (2) in sequence and then reach at a polarizing-prism (3). Therefore, the laser is divided into two vertical beams of laser featuring the same intensity but varied polarization state, of which one beam of laser passes a first quarter-wave plate (4) and then is vertically cast onto a first total reflecting mirror (6) and finally reflected to the polarizing-prism (3) through the first total reflecting mirror (6). In addition, the other beam of laser passes a second quarter-wave plate (7) and then is vertically cast onto a second total reflecting mirror (8) and finally reflected to the polarizing-prism (3) through the second total reflecting mirror (8). Thus, two beams of laser are aggregated onto a semiconductor LED (10) after passing through the polarizing-prism (3) and a concave mirror (9). Due to the polarizing structure, the utility model has the advantages of less loss, capacity to measure at lower average power and high measuring precision.
Description
Technical field
The utility model is a kind of polarization type optical semiconductor diode autocorrelation measurement device, is used to measure the pulse width of ultra-short pulse laser.
Background technology
At present correlation method is the main method that is used to measure the ultra-short pulse laser pulsewidth, can be divided into the method for quadratic harmonics and two-photon absorption method according to the difference of the sensitive detection parts of receiving optical signals, and two kinds of methods all can obtain identical autocorrelation signal.Wherein the method for quadratic harmonics is to measure the frequency-doubled signal that nonlinear crystal produces with photomultiplier, necessarily require to satisfy the phase-matching condition of crystal, thereby limited measurable pulse width, in addition because the frequency multiplication filter effect of crystal and group velocity mismatch affects arrive measurement of correlation, the cost that also must consider nonlinear crystal and photoelectric receiving device is higher, and nonlinear crystal is regulated relatively difficulty.And two-photon absorption method utilizes the two-photon absorption effect in the optical semiconductor diode, and hv satisfies E when incident photon energy
g/ 2<hv<E
gThe time, two-photon absorption can take place, promptly come the transition of electron gain with the energy of two photons, produce electron-hole pair, thereby form photocurrent.This method replaces nonlinear crystal and photomultiplier with the optical semiconductor diode, need not phase matching, does not have chromatic dispersion filtering, and is simple to operate, and greatly reduces cost.
Adopt the device of traditional Michelson interferometer with optical semiconductor diode correlation method, as shown in Figure 2, promptly incident light is divided into the identical two-beam of intensity with beam splitter 12, incide two right angle total reflective mirrors 13 respectively, 14, in an arm of interferometer, introduce a variable optical delay line, the light that the light that returns from the interferometer swing arm and another Shu Congjing arm return produces the second nonlinear response signals through another beam splitter 15 post-concentrations to optical semiconductor diode 10, the delay of adjusting two paths can obtain with the second nonlinear signal that postpones variation, this signal is proportional to the coherent signal of pulse, thereby extrapolates the width of ultrashort pulse.Because incident light is wanted twice through beam splitter before arriving the optical semiconductor diode, loss obviously increases, under the lower situation of incident light average power, converge at last light intensity on the optical semiconductor diode 10 can be very a little less than, and the optical semiconductor diode has certain dark current, therefore can not well respond for more weak light signal, cause and accurately to measure pulsewidth.
Summary of the invention
Technical problem to be solved in the utility model is to provide a kind of novel autocorrelation measurement device, promptly solve the shortcoming of above-mentioned autocorrelation measurement device with polarization type optical semiconductor diode autocorrelation measurement device, reduce the wastage, also can measure its pulse width accurately under the lower situation of photometry average power treating.
Technical solution of the present invention is:
A kind of polarization type optical semiconductor diode autocorrelation measurement device is provided, it is characterized in that according to two-photon absorption autocorrelation measurement method and irrelevant this advantage of polarization state of light, replace traditional Michelson interferometer with polarization type Michelson interference device, its concrete light path constitutes: will treat to incide after photometry is through collimation lens 1 one 1/2 wave plates, 2 backs and arrive a polarizing prism 3, be divided into the different and orthogonal two-beam of the identical but polarization state of intensity through polarizing prism 3, wherein a branch of light impinges perpendicularly on after through first quarter wave plate 4 on first total reflective mirror 6 that is driven by stepper motor 5, after 6 reflections of first total reflective mirror, turn back to polarizing prism 3 along former road first quarter wave plate 4, another Shu Guang impinges perpendicularly on second total reflective mirror 8 after through second quarter wave plate 7, after 8 reflections of second total reflective mirror, behind second quarter wave plate 7, turn back to polarizing prism 3 along former road, two-beam process polarizing prism 3 is after a concave mirror 9 focuses on post-concentrations to optical semiconductor diode 10, through oscillograph 11, on oscillograph 11, demonstrate autocorrelator trace, thereby can extrapolate pulse width.
Major advantage of the present utility model:
(1) adopt the polarization type structure, loss is little, can measure the measuring accuracy height than under the low average power.
(2) more convenient than traditional pulse width measure device debugging, operate simpler;
Description of drawings
The light channel structure synoptic diagram of Fig. 1 the utility model polarization type optical semiconductor diode autocorrelation measurement device
The two-photon absorption method light channel structure synoptic diagram that Fig. 2 is traditional
Among the figure: 1, collimation lens, 2,1/2 wave plate, 3, polarizing prism, 4, first quarter wave plate, 5, stepper motor, 6, first total reflective mirror, 7, second quarter wave plate, 8, second total reflective mirror, 9, concave mirror, 10, optical semiconductor diode, 11, oscillograph, 12, first beam splitter, 13, the first right angle total reflective mirror, 14, the second right angle total reflective mirror, 15, second beam splitter.
Embodiment
Below in conjunction with drawings and Examples the utility model is further specified.
In Fig. 1, treat to become after photometry is through collimation lens 1 directional light and impinge perpendicularly on one 1/2 wave plates, 2 back arrival, one polarizing prism 3, be divided into the identical but orthogonal two-beam in the polarization state difference and the direction of propagation of intensity through polarizing prism 3, wherein a branch of light impinges perpendicularly on after through first quarter wave plate 4 on first total reflective mirror 6 that is driven by stepper motor 5, after 6 reflections of first total reflective mirror, turn back to polarizing prism 3 along former road first quarter wave plate 4, another Shu Guang impinges perpendicularly on second total reflective mirror 8 after through second quarter wave plate 7, after 8 reflections of second total reflective mirror, behind second quarter wave plate 7, turn back to polarizing prism 3 along former road, two-beam process polarizing prism 3 is after a concave mirror 9 focuses on post-concentrations to optical semiconductor diode 10, through oscillograph 11, on oscillograph 11, demonstrate autocorrelator trace, thereby can extrapolate pulse width.
The utility model utilizes polarizing prism 3 that incident light is divided into the identical two-beam of intensity, the mutual vertical transmission direction in two-beam polarization direction is also vertical mutually, by rotating 1/2 wave plate 2, with two power meters the two-beam that is polarized prism 3 reflections and transmission is monitored, equate up to two-beam power, illustrate that then 1/2 wave plate 2 has rotated to the optimum position.Block wherein a branch of light, before concave mirror, place a power meter,, the power of another Shu Guang is monitored, maximal value is arranged, just illustrate that quarter wave plate has rotated to the optimum position up to power by rotating first quarter wave plate 4.Same operation is carried out another Shu Guang, rotates second quarter wave plate 7, reaches maximum up to power.Two-beam separately through concave mirror focus to the optical semiconductor diode, because polarization state of light and two-photon absorption effect are irrelevant, introduce 1/2 wave plate, polarizing prism and two quarter wave plates, control the polarisation of light direction, back light is through the complete transmission of polarizing prism with after reflecting fully like this, loss is very little, replaced the loss that traditional auto-correlation device back light brings through beam splitter once more, make under the lower situation of average power, just can measure autocorrelator trace, thus the counter time width of releasing pulse.
Claims (1)
1, polarization type optical semiconductor diode autocorrelation measurement device, mainly include concave mirror (9), optical semiconductor diode (10), oscillograph (11), it is characterized in that: also include collimation lens (1), polarizing prism (3), 1/2 wave plate (2), first quarter wave plate (4), second quarter wave plate (7), wherein, treat that photometry passes through collimation lens (1) successively, 1/2 wave plate (2) arrives a polarizing prism (3), be divided into the different and orthogonal two-beam of the identical but polarization state of intensity through polarizing prism (3), wherein a branch of light impinges perpendicularly on after through first quarter wave plate (4) on first total reflective mirror (6) that is driven by stepper motor (5), after first total reflective mirror (6) reflection, turn back to polarizing prism (3) along former road first quarter wave plate (4), another Shu Guang impinges perpendicularly on second total reflective mirror (8) after through second quarter wave plate (7), after second total reflective mirror (8) reflection, behind second quarter wave plate (7), turn back to polarizing prism (3) along former road, two-beam process polarizing prism (3) is after a concave mirror (9) focuses on post-concentration to optical semiconductor diode (10), through oscillograph (11), on oscillograph (11), demonstrate autocorrelator trace.
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CN 200620158664 CN200993600Y (en) | 2006-12-01 | 2006-12-01 | Polarized semiconductor photo diode self-correlation measuring device |
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CN 200620158664 CN200993600Y (en) | 2006-12-01 | 2006-12-01 | Polarized semiconductor photo diode self-correlation measuring device |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101900608A (en) * | 2010-06-23 | 2010-12-01 | 中国计量科学研究院 | Multifunctional wide-range ultra-short pulsed laser autocorrelator |
CN101576414B (en) * | 2008-05-09 | 2010-12-08 | 中国科学院半导体研究所 | Autocorrelation measuring apparatus for measuring glow ultrashort pulse full width at half maximum |
CN102062639A (en) * | 2010-11-24 | 2011-05-18 | 中国科学院半导体研究所 | Method for measuring overall pulse width of pulse laser based on frequency histogram |
CN102629102A (en) * | 2012-03-26 | 2012-08-08 | 中国科学院武汉物理与数学研究所 | Coherent bi-color light source device and method for generating coherent bi-color light |
CN108007585A (en) * | 2017-12-01 | 2018-05-08 | 北京无线电计量测试研究所 | A kind of femtosecond laser pulse width measure device |
CN110530514A (en) * | 2019-08-20 | 2019-12-03 | 西安空间无线电技术研究所 | A kind of device and method reducing the loss of balanced homodyne detection system optics |
-
2006
- 2006-12-01 CN CN 200620158664 patent/CN200993600Y/en not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101576414B (en) * | 2008-05-09 | 2010-12-08 | 中国科学院半导体研究所 | Autocorrelation measuring apparatus for measuring glow ultrashort pulse full width at half maximum |
CN101900608A (en) * | 2010-06-23 | 2010-12-01 | 中国计量科学研究院 | Multifunctional wide-range ultra-short pulsed laser autocorrelator |
CN102062639A (en) * | 2010-11-24 | 2011-05-18 | 中国科学院半导体研究所 | Method for measuring overall pulse width of pulse laser based on frequency histogram |
CN102062639B (en) * | 2010-11-24 | 2012-05-23 | 中国科学院半导体研究所 | Method for measuring overall pulse width of pulse laser based on frequency histogram |
CN102629102A (en) * | 2012-03-26 | 2012-08-08 | 中国科学院武汉物理与数学研究所 | Coherent bi-color light source device and method for generating coherent bi-color light |
CN108007585A (en) * | 2017-12-01 | 2018-05-08 | 北京无线电计量测试研究所 | A kind of femtosecond laser pulse width measure device |
CN110530514A (en) * | 2019-08-20 | 2019-12-03 | 西安空间无线电技术研究所 | A kind of device and method reducing the loss of balanced homodyne detection system optics |
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