CN106052886B - Laser pulse waveform measuring device based on third-order correlation method - Google Patents
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The invention discloses a kind of laser pulse waveform measuring devices based on third-order correlation method.Light is become transmitted light and reflected light after spectroscope by tested collimated laser beam, transmitted light is divided into transmitted light and reflected light through semi-transparent semi-reflecting lens again, the transmitted light and reflected light generates two frequency doubled lights through frequency-doubling crystal, time strength information is converted into intensity auto-correlation one-dimensional space information, the reflected beams after the two frequencys multiplication light beam and spectroscope are converted with realization frequency tripling on frequency crystal, and time strength information is converted to intensity third-order correlation two-dimensional space information.The present invention can not only obtain pulse width information by simple reconfiguration technique, additionally it is possible to accurately obtain pulse shape information, be capable of handling picosecond, femtosecond pulse waveform.Measuring device is at low cost, structure is simple, easy to adjust.
Description
Technical field
The invention belongs to ultrashort laser pulse the field of test technology, and in particular to a kind of laser arteries and veins based on third-order correlation method
Rush waveform meter.
Background technique
Currently, generally deducing the arteries and veins of ultrashort laser pulse by the three rank intensity correlation functions of measurement second order, Dan Yanchi
Width still only measures second order, the three rank intensity correlation functions of Dan Yanchi not can determine that the shape of pulse, therefore second order, three ranks
Correlator is mainly used to measure the contrast of pulse.Entitled " apparatus for measuring high power ultra-short laser pulse contrast " it is practical
New patent (patent No.: ZL 2,007 2,007 7677.0) discloses a kind of three rank G by singly postponing(3)(τ) intensity is related
Function obtains the measurement method of contrast ration, entitled " a kind of device for measuring contrast ratio of single-time ultrashort laser pulses "
Utility model patent (patent No.: ZL 2,010 2,029 3190.8) discloses a kind of using two delay devices two lists of formation
Three rank autocorrelation signals of delay, the method for testing coherent signal main peak and pulse front edge respectively obtain contrast information.FROG
And its although mutation can measure the shape of pulse, calculate complicated, and pulse width measure is limited in scope.
Summary of the invention
In order to overcome, existing measuring technique measurement range in ultrashort laser pulse waveform measurement is limited, restores impulse wave
Shape calculates complicated deficiency, and the present invention provides a kind of laser pulse waveform measuring device based on third-order correlation method.
The technical solution adopted by the present invention to solve the technical problems is:
Laser pulse waveform measuring device based on third-order correlation method of the invention, its main feature is that, in the device, In
Spectroscope, semi-transparent semi-reflecting lens are set gradually in high-power laser pulse incident direction.Laser pulse passes through the spectroscope point
At transmitted light and reflected light, transmitted light is divided into transmitted light and reflected light through semi-transparent semi-reflecting lens again.In the anti-of semi-transparent semi-reflecting lens
It penetrates optical path and is disposed with reflecting mirror I, frequency-doubling crystal, light barrier I, be disposed with and prolong on the transmitted light path of semi-transparent semi-reflecting lens
Slow adjuster I, reflecting mirror II, frequency-doubling crystal, light barrier II；The reflected light of semi-transparent semi-reflecting lens is reflected into frequency multiplication crystalline substance through reflecting mirror I
Body, reflected light are absorbed after frequency-doubling crystal transmits by light barrier I；The delayed adjuster I of the transmitted light of the semi-transparent semi-reflecting lens
Reflecting mirror II is projected after carrying out optical path delay, is reflected into frequency-doubling crystal through reflecting mirror II, reflected light is after frequency-doubling crystal transmits
It is absorbed by light barrier II；The light beam reflected from reflecting mirror I projects on frequency-doubling crystal simultaneously with the light beam reflected from reflecting mirror II,
Frequency-doubled conversion is realized in two the reflected beams overlapping regions, and two frequency doubled lights of generation are along defeated with the direction of frequency-doubling crystal perpendicular
Out；Guide-lighting microscope group and frequency crystal, attenuator I, CCD I are set gradually on two frequency multiplication beam directions of frequency-doubling crystal output；Institute
The two frequency multiplication light beams stated project after the reflection of guide-lighting microscope group to be projected after transmiting with frequency crystal with frequency crystal, two frequency multiplication light beams
Attenuator I carries out strength retrogression, into CCD I；Reflecting mirror III, delay modulator are disposed in spectroscopical reflected light path
II, reflecting mirror IV, reflecting mirror V and frequency crystal, light barrier III；Spectroscopical reflected light reflects laggard through reflecting mirror III
Enter delay modulator II and carry out optical path delay, the light beam being emitted from delay modulator II is again successively through reflecting mirror IV, reflecting mirror V
After project with frequency crystal, absorbed after the fundamental frequency light reflected from reflecting mirror V passes through and frequency crystal transmits by light barrier III；From reflection
Two frequency doubled lights of fundamental frequency light and the outgoing of guide-lighting microscope group that mirror V reflects project simultaneously on frequency crystal, the fundamental frequency light with
Frequency tripling conversion is realized in the overlapping region of two frequency doubled lights, and the frequency tripling light of generation is along defeated with the direction perpendicular with frequency plane of crystal
Out；Attenuator II, CCD II are set gradually on frequency tripling beam direction, frequency tripling light beam carries out strength retrogression through attenuator II,
Into CCD II；CCD I, the CCD II distinguishes external computer, the signal from CCD I, CCD II finally enter computer into
Row data processing.
The guide-lighting microscope group is made of four pieces of guide-lighting mirrors.Guide-lighting mirror is disposed in two frequency multiplication light beam transmission directions
I, guide-lighting mirror II, guide-lighting mirror III, guide-lighting mirror IV.Guide-lighting mirror I reflects incoming Level beam vertically upward, and guide-lighting mirror II will be vertical
Beam level reflection, horizontal reflected beam exit direction is vertical with incoming Level beam, and guide-lighting mirror III hangs down horizontal reflected beam
It is directly reflected down, guide-lighting mirror IV reflects the beam level reflected vertically downward, the horizontal reflected beam being finally emitted and incidence
In the same plane, horizontal reflected beam is vertical with incoming Level beam for horizontal light beam.
The frequency-doubling crystal and frequency crystal uses 90oNon-colinear matching.It is selected not according to different laser wavelength of incidence
Same crystalline material such as BBO, KDP etc., can be matched mode such as ooe, oee etc. using different non-colinear positions.
The beneficial effects of the present invention are:
1. measuring device of the invention is at low cost, structure is simple, easy to adjust, using frequency-doubling crystal and and frequency crystal phase
Three rank pulse strength time correlation signals are converted to the spatial-intensity Two dimensional Distribution conducive to detection by combination, by simply heavy
Structure technology can not only obtain pulse width information, can also accurately obtain pulse shape information.
2. the present invention is matched using 90 degree of non-colinear positions, double delay devices can be separately adjustable, increases time measurement
Range.
Detailed description of the invention
Fig. 1 is the laser pulse waveform measuring device light path schematic diagram of the invention based on third-order correlation method；
Fig. 2 is the guide-lighting microscope group light path schematic diagram in the present invention；
In figure, 1. spectroscope, 2. semi-transparent semi-reflecting lens, 3. reflecting mirror, I 4. delay modulator, I 5. reflecting mirror II 6.
10. reflecting mirror of the guide-lighting microscope group of 7. light barrier of frequency-doubling crystal, I 8. light barrier II 9., III 11. delay modulator II 12.
II 18. CCD of IV 13. reflecting mirror V 14. of reflecting mirror and I 17. attenuator of frequency crystal 15. attenuator, I 16. CCD
II 19. light barrier, III 9-1. leaded light mirror, I 9-2. leaded light mirror, II 9-3. leaded light mirror, III 9-4. leaded light mirror IV.
Specific embodiment
Present invention will be further explained below with reference to the attached drawings and examples, but protection model of the invention should not be limited with this
It encloses.
Embodiment 1
Fig. 1 is the laser pulse waveform measuring device light path schematic diagram of the invention based on third-order correlation method, and Fig. 2 is this hair
Guide-lighting microscope group light path schematic diagram in bright is the A of the guide-lighting microscope group in Fig. 1 to side view.In Fig. 1, Fig. 2, base of the invention
In the laser pulse waveform measuring device of third-order correlation method, spectroscope is set gradually in high-power laser pulse incident direction
1, semi-transparent semi-reflecting lens 2；Laser pulse is divided into transmitted light and reflected light by the spectroscope 1, and transmitted light is through semi-transparent semi-reflecting lens 2
It is divided into transmitted light and reflected light again；The reflected light path of semi-transparent semi-reflecting lens 2 be disposed with reflecting mirror I 3, frequency-doubling crystal 6,
Light barrier I 7, be disposed on the transmitted light path of semi-transparent semi-reflecting lens 2 delay modulator I 4, reflecting mirror II 5, frequency-doubling crystal 6,
Light barrier II 8；The reflected light of semi-transparent semi-reflecting lens 2 is reflected into frequency-doubling crystal 6 through reflecting mirror I 3, and reflected light is transmitted through frequency-doubling crystal 6
It is absorbed afterwards by light barrier I 7；The delayed adjuster I 4 of the transmitted light of the semi-transparent semi-reflecting lens 2 projects after carrying out optical path delay
Reflecting mirror II 5 is reflected into frequency-doubling crystal 6 through reflecting mirror II 5, and reflected light is absorbed after the transmission of frequency-doubling crystal 6 by light barrier II 8；
The light beam reflected from reflecting mirror I 3 projects on frequency-doubling crystal 6 simultaneously with the light beam reflected from reflecting mirror II 5, in two the reflected beams
Frequency-doubled conversion is realized in overlapping region, and two frequency doubled lights of generation are exported along with the direction of 6 perpendicular of frequency-doubling crystal；In frequency multiplication crystalline substance
Guide-lighting microscope group 9 and frequency crystal 14, attenuator I 15, CCD I 16 are set gradually on the two frequency multiplication beam directions that body 6 exports；Described
Two frequency multiplication light beams project after the reflection of guide-lighting microscope group to be projected after transmiting with frequency crystal 14 with frequency crystal 14, two frequency multiplication light beams
Attenuator I 15 carries out strength retrogression, into CCD I 16；Reflecting mirror III 10, delay are disposed in the reflected light path of spectroscope 1
Adjuster II 11, reflecting mirror IV 12, reflecting mirror V 13 and frequency crystal 14, light barrier III 19；The reflected light of the spectroscope 1
Enter delay modulator II 11 after the reflection of reflecting mirror III 10 and carry out optical path delay, the light beam being emitted from delay modulator II 11 is again
It successively projects after reflecting mirror IV 12, reflecting mirror V 13 and frequency crystal 14, the fundamental frequency light warp and frequency reflected from reflecting mirror V 13
Crystal 14 is absorbed after transmiting by light barrier III 19；Two frequencys multiplication that the fundamental frequency light and guide-lighting microscope group 9 reflected from reflecting mirror V 13 is emitted
Light is projected simultaneously on frequency crystal 14, is realized frequency tripling conversion in the overlapping region of the fundamental frequency light and two frequency doubled lights, is produced
Raw frequency tripling light is exported along with the direction with 14 perpendicular of frequency crystal；Decaying is set gradually on frequency tripling beam direction
Piece II 17, CCD II 18, frequency tripling light beam carries out strength retrogression through attenuator II 17, into CCD II 18；The CCD I 16,
CCD II 18 distinguishes external computer, and the signal from CCD I 16, CCD II 18 finally enters computer and carries out data processing.
The guide-lighting microscope group 9 is made of four pieces of guide-lighting mirrors；Leaded light is disposed in two frequency multiplication light beam transmission directions
I 9-1 of mirror, II 9-2 of guide-lighting mirror, III 9-3 of guide-lighting mirror, IV 9-4 of guide-lighting mirror；Guide-lighting I 9-1 of mirror is anti-vertically upward by incoming Level beam
It penetrates, for guide-lighting II 9-2 of mirror by normal beam horizontal reflection, horizontal reflected beam exit direction is vertical with incoming Level beam, guide-lighting
III 9-3 of mirror reflects horizontal reflected beam vertically downward, and guide-lighting IV 9-4 of mirror reflects the beam level reflected vertically downward, most
In the same plane, horizontal reflected beam and incoming Level beam hang down the horizontal reflected beam and incoming Level beam being emitted eventually
Directly, as shown in Figure 2.
The frequency-doubling crystal 6 and frequency crystal 14 uses 90oNon-colinear matching.It is selected according to different laser wavelength of incidence
With different crystalline materials such as BBO, KDP etc., can be matched mode such as ooe, oee etc. using different non-colinear positions.
Laser pulse time signal I (t) is converted to space second order correlation in the horizontal direction by the frequency-doubling crystal 6
Signal G(2)(x1)。
The coherent signal G in the horizontal direction that the guide-lighting microscope group 9 generates frequency-doubling crystal 6(2)(x1) be converted to edge
The coherent signal G of vertical direction(2)(y), while by coherent signal by vertical polarization horizontal polarization is converted to.
Fundamental frequency pulsed light and two frequency doubled lights are carried out and frequently, are converted to third-order correlation signal G by described and frequency crystal 14(3)
(x,y)。
The delay modulator I 4, delay modulator II 11 can not only determine the zero point G of three rank intensity coherent signals(3)(x=0, y=0) can also extend G(3)The field range of (x, y).
The basic principle of laser pulse shape measurement based on third-order correlation method of the invention is: utilizing second-order qs-correlation function
G(2)(τ) and double delay triple correlation function G(3)( τ1, τ2) it can accurately determine the spatial distribution of light pulse, then pass through Fu
Vertical leaf transformation finds out impulse waveform；And by frequency-doubling crystal and with the non-colinear frequency conversion of frequency crystal, can be by time phase
Close function G(2)(τ)、G(3)( τ1, τ2) be converted to time-space coordinate it is one-to-one, can be with spatial-intensity measured directly
It is distributed G(2)(x1)、G(3)(x, y), then measured pulse waveform is recovered by simple time-space coordinate transform.
The basic principle for restoring impulse waveform from correlation function is:
Pass through second-order qs-correlation function G(2)(τ) can obtain the amplitude of the spectral intensity of light pulse | I (ν) |:
(1)
In formula, ν indicates frequency, and i indicates unit complexor, and τ indicates the time.
Postpone triple correlation function G by dual-time(3)( τ1, τ2) can obtain light pulse spectral intensity phase
(ν):
；(2)
(3)
In this way, by second-order qs-correlation function G(2)(τ) and double delay triple correlation function G(3)( τ1, τ2) it can determine light
The spatial distribution I (ν) of pulse=| I (ν) | exp(i φ (ν)), then impulse waveform can be restored by Fourier transform:
(4)
Using measuring device measurement ultrashort laser pulse waveform of the invention the following steps are included:
1. frequency doubled light aplanatism is calibrated: by pulse width less than 1 picosecond, beam modulation near field degree less than 1.2, near field contrast
Horizontal polarization laser pulse less than 0.06 is input to the device, adjusts delay modulator I 4, makes two frequency doubled lights generated most
By force, and most strong region is located at the target surface center of CCD I 16, and the horizontal coordinate position is denoted as coordinate origin x1=0, CCD I
The grey scale change image obtained in the horizontal direction on 16 is second order coherent signal G(2)(x1)。
2. frequency tripling light aplanatism is calibrated: adjusting delay modulator II 11, keep the frequency tripling light generated most strong, and is most strong
Bright spot is located at the target surface center of CCD II 18, and the coordinate position is denoted as coordinate origin (x=0, y=0), on CCD II 18
The grey scale change image of acquisition is third-order correlation signal G(3)( x, y)。
3. space-time transformation coefficient is calibrated: adjusting delay modulator I 4, increase the light path 0.3mm of the optical path, that is, be equivalent to
1 picosecond of time delay, record the direction of facular point deviation from origin and amount of movement Δ x on CCD I 16, CCD II 181, Δ y；
Delay modulator II 11 is adjusted, increases the light path 0.3mm of the optical path, that is, is equivalent to 1 picosecond of time delay, records CCD II
The direction of facular point deviation from origin and amount of movement Δ x on 18 obtain the proportionality coefficient of correlation function time delay and coordinate: k1
=Δ x1、k2=Δ y, k3=Δ x(unit: mm/ps), i.e. G(2)(τ=x1/k1), G(3)( τ1=x/k3, τ2=y/k2)。
4. calculating the amplitude of spectral intensity | I (ν) |: the spectral intensity amplitude of light pulse is obtained using following formula | I (ν) |
(5)
Here, Δ x is the pixel dimension of CCD I 16, xiIt is i-th of pixel of horizontal direction with a distance from origin, 2Ni is light
The pixel number of horizontal direction shared by spot.
5. calculating the phase (ν) of spectral intensity: the spectral intensity phase (ν) of light pulse is obtained using formula (2), (3),
Integral need to be changed to sum when calculating, range of summation is region shared by hot spot on CCD II 18.
6. obtaining laser pulse shape using formula (4).
In the present embodiment, incident laser pulse wavelength is 1053nm, and pulse width is about 1ps, and energy is about 10mJ, light beam
Bore is 1cm, horizontal polarization, frequency-doubling crystal 6 with and frequency crystal 14 be all made of KDP material, be all made of ooe phases of non-colinear
Match.It is transmitted from semi-transparent semi-reflecting lens 2 and reflects two basic frequency beams come with about 30oIncident angle be symmetrically incident on frequency-doubling crystal
On 6, two frequency doubled lights of generation are exported along 6 normal to a surface direction of frequency-doubling crystal, by after guide-lighting microscope group 9 by two frequency multiplication light beams
It turn 90 degrees partially, two frequency doubled lights that at this moment CCD I 16 is recorded are second order coherent signal G(2)(τ=y/k1), related direction is perpendicular
Histogram is to while being converted to horizontal polarization, space-time transformation coefficient k by vertical polarization for the deflected state of two frequency doubled lights1≈0.58mm/
ps；Two frequency doubled lights come out from guide-lighting microscope group 9 are incident on and frequency crystal simultaneously with the basic frequency beam come from the reflection of spectroscope 1
On 14, the incidence angle of basic frequency beam is about 170, the incidence angle of two frequency doubled lights is about 100, frequency tripling is generated in light beam overlapping region
Light, the frequency tripling light edge of generation and the output of 14 normal to a surface direction of frequency crystal, the frequency tripling light that at this moment CCD II 18 is recorded are
For third-order correlation signal G(3)( τ1=x/k3, τ2=y/k2), space-time transformation coefficient k2≈ 0.58mm/ps, k3≈0.49mm/ps；
Data processing is carried out finally by computer, obtains laser pulse shape distribution.
Claims (3)
1. a kind of laser pulse waveform measuring device based on third-order correlation method, it is characterized in that: in the device, in high power
Spectroscope (1), semi-transparent semi-reflecting lens (2) are set gradually in laser pulse incident direction；Laser pulse passes through the spectroscope (1)
It is divided into transmitted light and reflected light, transmitted light is divided into transmitted light and reflected light through semi-transparent semi-reflecting lens (2) again；In semi-transparent semi-reflecting lens
(2) reflected light path is disposed with reflecting mirror I (3), frequency-doubling crystal (6), light barrier I (7), in the saturating of semi-transparent semi-reflecting lens (2)
It penetrates in optical path and is disposed with delay modulator I (4), reflecting mirror II (5), frequency-doubling crystal (6), light barrier II (8)；It is semi-transparent semi-reflecting
The reflected light of mirror (2) is reflected into frequency-doubling crystal (6) through reflecting mirror I (3), and reflected light is after frequency-doubling crystal (6) transmit by light barrier I
(7) it absorbs；The delayed adjuster I (4) of the transmitted light of the semi-transparent semi-reflecting lens (2) projects reflecting mirror after carrying out optical path delay
II (5) are reflected into frequency-doubling crystal (6) through reflecting mirror II (5), and reflected light is after frequency-doubling crystal (6) transmit by light barrier II (8)
It absorbs；The light beam reflected from reflecting mirror I (3) projects on frequency-doubling crystal (6) simultaneously with the light beam reflected from reflecting mirror II (5),
Frequency-doubled conversion is realized in two the reflected beams overlapping regions, and two frequency doubled lights of generation are along the side with frequency-doubling crystal (6) perpendicular
To output；Guide-lighting microscope group (9) and frequency crystal (14) are set gradually on two frequency multiplication beam directions of frequency-doubling crystal (6) output, are declined
Subtract piece I (15), CCD I (16)；The two frequency multiplication light beams project and frequency crystal (14), two frequencys multiplication after the reflection of guide-lighting microscope group
Light beam projects attenuator I (15) after transmiting with frequency crystal (14) and carries out strength retrogression, into CCD I (16)；In spectroscope
(1) reflected light path is disposed with reflecting mirror III (10), delay modulator II (11), reflecting mirror IV (12), reflecting mirror V
(13) and frequency crystal (14), light barrier III (19)；The reflected light of the spectroscope (1) reflects laggard through reflecting mirror III (10)
Enter delay modulator II (11) and carry out optical path delay, the light beam being emitted from delay modulator II (11) is again successively through reflecting mirror IV
(12), it projects after reflecting mirror V (13) and is passed through and frequency crystal with frequency crystal (14), the fundamental frequency light reflected from reflecting mirror V (13)
(14) it is absorbed after transmiting by light barrier III (19)；The two of the fundamental frequency light and guide-lighting microscope group (9) outgoing that are reflected from reflecting mirror V (13)
Frequency doubled light is projected simultaneously on frequency crystal (14), realizes that frequency tripling turns in the overlapping region of the fundamental frequency light and two frequency doubled lights
It changes, the frequency tripling light of generation is exported along with the direction with frequency crystal (14) perpendicular；On frequency tripling beam direction successively
Attenuator II (17), CCD II (18) are set, and frequency tripling light beam carries out strength retrogression through attenuator II (17), into CCD II
(18)；The external computer of CCD I (16), CCD II (18) difference, it is last from CCD I (16), the signal of CCD II (18)
Data processing is carried out into computer.
2. the laser pulse waveform measuring device according to claim 1 based on third-order correlation method, it is characterized in that: described
Guide-lighting microscope group (9) is made of four pieces of guide-lighting mirrors；Guide-lighting mirror I (9-1), leaded light are disposed in two frequency multiplication light beam transmission directions
Mirror II (9-2), guide-lighting mirror III (9-3), guide-lighting mirror IV (9-4)；Guide-lighting mirror I (9-1) reflects incoming Level beam vertically upward,
Guide-lighting mirror II (9-2) is by normal beam horizontal reflection, and horizontal reflected beam exit direction is vertical with incoming Level beam, guide-lighting mirror
III (9-3) reflects horizontal reflected beam vertically downward, and guide-lighting mirror IV (9-4) reflects the beam level reflected vertically downward,
In the same plane, horizontal reflected beam and incoming Level beam hang down the horizontal reflected beam and incoming Level beam being finally emitted
Directly.
3. the laser pulse waveform measuring device according to claim 1 based on third-order correlation method, it is characterized in that: described
Frequency-doubling crystal (6) and frequency crystal (14) use 90oNon-colinear matching.
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| CN107677379B (en) * | 2017-09-30 | 2023-06-09 | 中国工程物理研究院激光聚变研究中心 | Femtosecond laser pulse waveform measuring device |
| CN107782456A (en) * | 2017-09-30 | 2018-03-09 | 中国工程物理研究院激光聚变研究中心 | A kind of ultrashort laser pulse measurement apparatus |
| CN108572061B (en) * | 2018-07-23 | 2023-10-13 | 中国工程物理研究院激光聚变研究中心 | Full-caliber harmonic conversion efficiency measuring system and measuring method thereof |
| CN108775966B (en) * | 2018-09-05 | 2023-06-09 | 中国工程物理研究院激光聚变研究中心 | Double-delay third-order correlator |
| CN109060151B (en) * | 2018-09-05 | 2023-08-15 | 中国工程物理研究院激光聚变研究中心 | Subnanosecond laser pulse contrast measuring device |
| CN113155280B (en) * | 2021-04-16 | 2022-07-26 | 北京大学 | Three-order correlator high-fidelity device and control method thereof |
| CN114888458B (en) * | 2021-08-17 | 2023-12-15 | 武汉华工激光工程有限责任公司 | Parallel rotary cutting machining device and method |
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