CN110379737A - A kind of automatic test lettering collecting equipment of QFN chip - Google Patents
A kind of automatic test lettering collecting equipment of QFN chip Download PDFInfo
- Publication number
- CN110379737A CN110379737A CN201910621145.6A CN201910621145A CN110379737A CN 110379737 A CN110379737 A CN 110379737A CN 201910621145 A CN201910621145 A CN 201910621145A CN 110379737 A CN110379737 A CN 110379737A
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- China
- Prior art keywords
- station
- turntable
- equipment cabinet
- radium
- mark
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67282—Marking devices
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Specific Conveyance Elements (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
The invention discloses a kind of automatic test lettering collecting equipments of QFN chip, including equipment cabinet, the equipment cabinet top is provided with turntable station, and equipment cabinet top is disposed with along the vibrating disk pan feeding station of turntable station excircle distribution, turn to station, testing station, radium-shine station, defective products discharge station, encapsulate disk type receiving mechanism and tray disc type receiving mechanism, the equipment cabinet top is equipped with radium-shine mark turntable between turntable station and radium-shine station at position, the equipment cabinet top is equipped with the Image detection mechanism for detection chip direction between steering station and vibrating disk at position, the equipment cabinet top is equipped with the first mark testing agency between testing station and radium-shine station at position.High degree of automation of the present invention saves manpower, improves working efficiency, easy to operate, reduces operational sequence, improves production efficiency, and discharge method multiplicity meets different production needs.
Description
Technical field
The present invention relates to the automatic test lettering rewindings of semicon industry technical field more particularly to a kind of QFN chip to set
It is standby.
Background technique
QFN (Quad Flat No-leadPackage, quad flat non-pin package), one of surface mount packages.
It is now to be known as LCC more.QFN is title as defined in Japan Electromechanical Industry Association.Four sides are encapsulated configured with electrode contacts, due to nothing
Pin, attachment occupied area ratio QFP is small, highly lower than QFP.
QFN chip product producing process is complicated, production equipment is expensive, test parameter is more, and rewinding mode is more, existing QFN
Chip lettering collecting equipment, inefficient, the production cycle is long, high production cost, the degree of automation is not high, so now proposing one kind
The automatic test lettering collecting equipment of QFN chip.
Summary of the invention
The purpose of the present invention is to solve disadvantages existing in the prior art, and a kind of QFN chip proposed is automatic
Test lettering collecting equipment.
To achieve the goals above, present invention employs following technical solutions:
A kind of automatic test lettering collecting equipment of QFN chip, including equipment cabinet, the equipment cabinet top are provided with turntable
It stands, and equipment cabinet top is disposed with the vibrating disk pan feeding station along the distribution of turntable station excircle, turns to station, is testing station, radium-shine
It stands, defective products discharge station, encapsulate disk type receiving mechanism and tray disc type receiving mechanism, the equipment cabinet top is close to turntable station
Radium-shine mark turntable is equipped at position between radium-shine station, the equipment cabinet top is between steering station and vibrating disk at position
Equipped with the Image detection mechanism for detection chip direction, the equipment cabinet top is between testing station and radium-shine station at position
Equipped with the first mark testing agency, the equipment cabinet top is equipped with second between radium-shine station and radium-shine mark turntable at position
Mark testing agency, the equipment cabinet top are equipped with radium-shine mark turntable at position between radium-shine station and turntable station.
Further, the turntable station includes turntable, and is fixedly installed at turntable sidewall edge position equidistant in ring
The vacuum intake pen of shape distribution, turntable bottom end are equipped with the turntable drive motor for driving its rotation, turntable drive motor bottom end
Equipped with bracket, and bracket is formed a fixed connection by bolt and equipment cabinet, and turntable station top is arranged with shield, described anti-
Shield top is connected with L shape support frame, and L shape support frame is bolted far from shield one end and equipment cabinet top.
Further, vibrating disk pan feeding station includes vibrating disk seat, and vibrating disk seat top side is equipped with vibration
Disk, vibrating disk seat top are equipped with material guiding plate, are equipped with the annular being distributed in a ring at material guiding plate sidewall edge position and lead
Hopper, the material guiding plate sidewall edge are provided with deflector chute along a tangential direction, and described deflector chute one end and turntable are mutually close, and lead
Hopper other end is connected with annular deflector chute.
Further, the station that turns to includes the steering station bracket for being fixedly connected with equipment cabinet, and turns to station bracket
Side, which is equipped with, turns to drive motor, and the output shaft for turning to drive motor is connected with steering shaft, and steering shaft is connected with guided mode
Frame.
Further, the quantity of the testing station is N number of, and N is positive integer, and the testing station includes being used for and equipment cabinet
The testing station bracket being fixedly connected, and testing station cantilever tip side is equipped with pin sockets, and pin sockets are connected by signal wire
It is connected to Kelvin's tester.
Further, the radium-shine mark turntable includes the mark disc carrier for connecting with equipment cabinet, and mark disk branch
Frame side is equipped with mark disk drive motor, and the mark disk drive motor output shaft is fixedly connected with mark disk.
Further, the radium-shine station includes the radium-shine station bracket for connecting with equipment cabinet, and radium-shine station cantilever tip
It is fixedly installed the laser being obliquely installed, the laser preferably takes Leix laser.
Further, first mark testing agency includes the adjustable support for being fixed at equipment cabinet top, and can
Bracket side is adjusted to be equipped with light source generator and image sensor.
Further, second mark testing agency includes the pedestal being fixedly connected with equipment cabinet top, and pedestal top
End is fixedly installed D image detector.
Further, defective products discharge station side is equipped with feed opening compatible with turntable station, and defective products is discharged
It is equipped in standing into magazine, the slideway being connected into magazine and feed opening, the defective products discharge is equipped in the defective products discharge station
Quantity of standing is N number of, and N is positive integer.
The invention has the benefit that
Compared with prior art, which can carry out automatic test lettering to QFN chip, and high degree of automation is saved
Manpower improves working efficiency, easy to operate, reduces operational sequence, improves production efficiency, and discharge method multiplicity meets different
Production needs.
Detailed description of the invention
Vertical view when Fig. 1 is a kind of automatic test lettering collecting equipment removal shield of QFN chip proposed by the present invention
Structural schematic diagram；
Fig. 2 is a kind of overlooking structure diagram of the automatic test lettering collecting equipment of QFN chip proposed by the present invention；
Fig. 3 is a kind of schematic perspective view of the automatic test lettering collecting equipment of QFN chip proposed by the present invention；
Fig. 4 is a kind of automatic test lettering collecting equipment tray disc type receiving mechanism of QFN chip proposed by the present invention
Structural schematic diagram；
Fig. 5 is that a kind of automatic test lettering collecting equipment of QFN chip proposed by the present invention encapsulates disk type receiving mechanism
Structural schematic diagram；
Fig. 6 is a kind of structure at the automatic test lettering collecting equipment vibrating disk pan feeding station of QFN chip proposed by the present invention
Schematic diagram；
Fig. 7 is a kind of structural schematic diagram at the automatic test lettering collecting equipment turntable station of QFN chip proposed by the present invention；
Fig. 8 is that a kind of automatic test lettering collecting equipment of QFN chip proposed by the present invention turns to the structural schematic diagram at station；
Fig. 9 is a kind of structural schematic diagram of the automatic test lettering collecting equipment testing station of QFN chip proposed by the present invention；
Figure 10 is a kind of structure of the radium-shine mark turntable of automatic test lettering collecting equipment of QFN chip proposed by the present invention
Schematic diagram；
Figure 11 is a kind of structural representation at the automatic radium-shine station of test lettering collecting equipment of QFN chip proposed by the present invention
Figure；
Figure 12 is a kind of structural representation of the automatic test lettering collecting equipment equipment cabinet of QFN chip proposed by the present invention
Figure；
Figure 13 is a kind of the second mark of automatic test lettering collecting equipment testing agency of QFN chip proposed by the present invention
Structural schematic diagram；
Figure 14 is a kind of structure of the automatic test lettering collecting equipment defective products discharge station of QFN chip proposed by the present invention
Schematic diagram.
In figure: 1 vibrating disk pan feeding station, 1-1 vibrating disk, 1-2 material guiding plate, 1-3 deflector chute, 1-4 vibrating disk seat, 2 turntable stations,
2-1 vacuum intake pen, 2-2 turntable, 2-3 turntable drive motor, 2-4 bracket, 3 turn to station, 3-1 steering station bracket, 3-2 steering
Axis, 3-3 turn to drive motor, 4 testing stations, the testing station 4-1 bracket, 4-2 pin sockets, 5 radium-shine mark turntables, 5-1 mark disk,
5-2 mark disk drive motor, 5-3 mark disc carrier, 6 radium-shine stations, the radium-shine station bracket of 6-1,6-2 laser, 7 first marks detection
Mechanism, 7-1 adjustable support, 7-2 light source generator, 7-3 image sensor, 8 second mark testing agencies, 8-1 3D Image detection
Device, 8-2 pedestal, 9 defective products discharge stations, 9-1 feed opening, 9-2 enter magazine, 10 encapsulation disk type receiving mechanisms, 11 tray disc types
Receiving mechanism, 12 equipment cabinets, 13 L shape support frames, 14 shields.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.
Referring to Fig.1-14, including equipment cabinet 12,12 top side outer wall of equipment cabinet are equipped with vibrating disk pan feeding station 1, and equipment
12 top outer wall of cabinet is equipped with turntable station 2 at 1 position of vibrating disk pan feeding station, and vibrating disk pan feeding station 1 includes vibrating disk seat 1-4,
And the vibrating disk top seat 1-4 side is equipped with vibrating disk 1-1, the vibrating disk top seat 1-4 is equipped with material guiding plate 1-2, material guiding plate 1-2 side wall
The annular deflector chute being distributed in a ring is equipped at marginal position, material guiding plate 1-2 sidewall edge is provided with deflector chute along a tangential direction
1-3, the one end deflector chute 1-3 and turntable 2-2 phase are close, and deflector chute 1-3 other end is connected with annular deflector chute, QFN core
Piece is entered by vibrating disk pan feeding station 1, by 1 sorting of vibrating disk pan feeding station, is exited into turntable station 2 by deflector chute 1-3, is turned
Disk station 2 includes turntable 2-2, and is fixedly installed the equidistant vacuum intake being distributed in a ring at turntable 2-2 sidewall edge position
2-1, the bottom end turntable 2-2 are equipped with the turntable drive motor 2-3 for driving its rotation, and the turntable bottom end drive motor 2-3 is equipped with bracket
2-4, and bracket 2-4 is formed a fixed connection by bolt with equipment cabinet 12,2 top of turntable station is arranged with shield 14, shield
14 tops are connected with L shape support frame 13, and L shape support frame 13 is solid by bolt far from 14 one end of shield and 12 top of equipment cabinet
It is fixed, absorption fixation is carried out to QFN chip by vacuum intake 2-1,12 top outer wall of equipment cabinet is close to 2 marginal position of turntable station
Place is equipped with the steering station 3 turned to for realizing chip, examines at position equipped with image between station 3 and vibrating disk pan feeding station 1 turning to
Mechanism is surveyed, Image detection mechanism identifies the direction of QFN chip, when QFN chip is transferred to steering station 3, turns to 3 effect of station, right
QFN chip is turned to, so that QFN chip direction is consistent, 12 top outer wall of equipment cabinet is equipped with edge at 3 positions of steering station and turns
The testing station 4 that 2 excircle of disk station equidistantly distributes, the quantity of testing station 4 is N number of, and N is positive integer, and testing station 4 includes being used for
The testing station bracket 4-1 being fixedly connected with equipment cabinet 12, and the testing station top bracket 4-1 side is equipped with pin sockets 4-2, and draws
Foot socket 4-2 is connected with Kelvin's tester by signal wire, and QFN chip is tested in testing station 4.
12 top outer wall of equipment cabinet is equipped with radium-shine mark turntable 5 at 4 position of testing station, and radium-shine mark turntable 5 includes
Mark disc carrier 5-3 for being connect with equipment cabinet 12, and the mark side disc carrier 5-3 is equipped with mark disk drive motor 5-2, beats
Bidding quotation drive motor 5-2 output shaft is fixedly connected with mark disk 5-1, and 12 top outer wall of equipment cabinet is close to radium-shine mark turntable 5
It is equipped with radium-shine station 6 at position, radium-shine station 6 includes radium-shine station bracket 6-1 for connecting with equipment cabinet 12, and radium-shine station bracket 6-
1 top is fixedly installed the laser 6-2 being obliquely installed, and laser 6-2 preferably takes Leix laser, when QFN chip shifts
To at radium-shine 5 position of mark turntable, QFN chip is transferred on radium-shine mark turntable 5, QFN chip is carried out by radium-shine station 6
Lettering.
12 top of equipment cabinet is equipped with the first mark testing agency 7, equipment at position between testing station 4 and radium-shine station 6
12 top of cabinet is equipped with the second mark testing agency 8, the first mark inspection between radium-shine station 6 and radium-shine mark turntable 5 at position
Surveying mechanism 7 includes the adjustable support 7-1 for being fixed at 12 top of equipment cabinet, and the side adjustable support 7-1 is equipped with light source
Device 7-2 and image sensor 7-3, the second mark testing agency 8 include the pedestal 8-2 being fixedly connected with equipment cabinet top, and base
The top seat 8-2 is fixedly installed 3D image detector 8-1, the first mark testing agency 7 and the detection of the second mark testing agency 8
Whether QFN chip lettering content and chip appearance are qualified, and 12 top outer wall of equipment cabinet is equipped at 6 one side positions of radium-shine station
The defective products discharge station 9 that 2 excircle equidistantly distributes along turntable station, 9 side of defective products discharge station are equipped with and are adapted with turntable station 2
Feed opening 9-1, and be equipped in defective products discharge station 9 into magazine 9-2, be equipped in defective products discharge station 9 be connected into magazine 9-2 and
The slideway of feed opening 9-1,9 quantity of defective products discharge station is N number of, and N is positive integer, test defective products and Image detection defective products
It is discharged by defective products discharge station 9,12 top outer wall of equipment cabinet is successively arranged at 9 position of defective products discharge station along turntable station
The encapsulation disk type receiving mechanism 10 and tray disc type receiving mechanism 11 of 2 excircles distribution, qualified QFN chip can lead to respectively
It crosses 11 two kinds of receiving mechanisms of encapsulation disk type receiving mechanism 10 and tray disc type receiving mechanism and carries out rewinding.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
Anyone skilled in the art in the technical scope disclosed by the present invention, according to the technique and scheme of the present invention and its
Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.
Claims (10)
1. a kind of automatic test lettering collecting equipment of QFN chip, including equipment cabinet (12), which is characterized in that the equipment cabinet
(12) top is provided with turntable station (2), and equipment cabinet (12) top is disposed with the vibration along the distribution of turntable station (2) excircle
Disk pan feeding station (1) turns to station (3), testing station (4), radium-shine station (6), defective products discharge station (9), encapsulation disk type receiving mechanism
(10) and tray disc type receiving mechanism (11), equipment cabinet (12) top position between turntable station (2) and radium-shine station (6)
Place is equipped with radium-shine mark turntable (5), and equipment cabinet (12) top is equipped at position between steering station (3) and vibrating disk and uses
Image detection mechanism in detection chip direction, meta position of equipment cabinet (12) top close to testing station (4) and radium-shine station (6)
It sets place and is equipped with the first mark testing agency (7), equipment cabinet (12) top is close to radium-shine station (6) and radium-shine mark turntable (5)
Between the second mark testing agency (8) is equipped at position, equipment cabinet (12) top is close to radium-shine station (6) and turntable station (2)
Between radium-shine mark turntable (5) is equipped at position.
2. a kind of automatic test lettering collecting equipment of QFN chip according to claim 1, which is characterized in that described turn
Disk station (2) includes turntable (2-2), and be fixedly installed at turntable (2-2) sidewall edge position it is equidistant be distributed in a ring it is true
Suction material pen (2-1), the turntable bottom end (2-2) are equipped with the turntable drive motor (2-3) for driving its rotation, the turntable drive motor
The bottom end (2-3) is equipped with bracket (2-4), and bracket (2-4) is formed a fixed connection by bolt with equipment cabinet (12), the turntable station
(2) top is arranged with shield (14), and shield (14) top is connected with L shape support frame (13), and L shape support frame (13)
It is bolted far from shield (14) one end with equipment cabinet (12) top.
3. a kind of automatic test lettering collecting equipment of QFN chip according to claim 2, which is characterized in that the vibration
Moving plate pan feeding station (1) includes vibrating disk seat (1-4), and the top side the vibrating disk seat (1-4) is equipped with vibrating disk (1-1), institute
It states the vibrating disk seat top (1-4) and is equipped with material guiding plate (1-2), be equipped at material guiding plate (1-2) sidewall edge position and divide in a ring
The annular deflector chute of cloth, material guiding plate (1-2) sidewall edge are provided with deflector chute (1-3), the deflector chute along a tangential direction
The one end (1-3) and turntable (2-2) are mutually close, and deflector chute (1-3) other end is connected with annular deflector chute.
4. a kind of automatic test lettering collecting equipment of QFN chip according to claim 3, which is characterized in that described turn
To the steering station bracket (3-1) that station (3) include for being fixedly connected with equipment cabinet (12), and turns to station side bracket (3-1) and set
Have steering drive motor (3-3), the output shaft for turning to drive motor (3-3) is connected with steering shaft (3-2), and steering shaft
(3-2) is connected with guided mode frame.
5. a kind of automatic test lettering collecting equipment of QFN chip according to claim 4, which is characterized in that the survey
The quantity at examination station (4) is N number of, and N is positive integer, and the testing station (4) includes the survey for being fixedly connected with equipment cabinet (12)
Examination station bracket (4-1), and the top side testing station bracket (4-1) is equipped with pin sockets (4-2), and pin sockets (4-2) pass through
Signal wire is connected with Kelvin's tester.
6. a kind of automatic test lettering collecting equipment of QFN chip according to claim 5, which is characterized in that the radium
Penetrating mark turntable (5) includes the mark disc carrier (5-3) for connecting with equipment cabinet (12), and the side mark disc carrier (5-3)
Equipped with mark disk drive motor (5-2), mark disk drive motor (5-2) output shaft is fixedly connected with mark disk (5-1).
7. a kind of automatic test lettering collecting equipment of QFN chip according to claim 6, which is characterized in that the radium
Penetrating station (6) includes the radium-shine station bracket (6-1) for connecting with equipment cabinet (12), and the fixation of the radium-shine station bracket top (6-1) is set
It is equipped with the laser (6-2) being obliquely installed, the laser (6-2) preferably takes Leix laser.
8. a kind of automatic test lettering collecting equipment of QFN chip according to claim 7, which is characterized in that described
Adjustable support (7-1) of the one mark testing agency (7) including being fixed at equipment cabinet (12) top, and adjustable support (7-1)
Side is equipped with light source generator (7-2) and image sensor (7-3).
9. a kind of automatic test lettering collecting equipment of QFN chip according to claim 8, which is characterized in that described
Two mark testing agencies (8) include the pedestal (8-2) being fixedly connected with equipment cabinet (12) top, and the top pedestal (8-2) is fixed
It is provided with 3D image detector (8-1).
10. a kind of automatic test lettering collecting equipment of QFN chip according to claim 9, which is characterized in that it is described not
Non-defective unit discharge station (9) side be equipped with turntable station (2) compatible feed opening (9-1), and defective products discharge station (9) in be equipped with into
Magazine (9-2) is equipped in the defective products discharge station (9) and is connected to the slideway into magazine (9-2) and feed opening (9-1), it is described not
Non-defective unit discharge station (9) quantity is N number of, and N is positive integer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910621145.6A CN110379737A (en) | 2019-07-10 | 2019-07-10 | A kind of automatic test lettering collecting equipment of QFN chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910621145.6A CN110379737A (en) | 2019-07-10 | 2019-07-10 | A kind of automatic test lettering collecting equipment of QFN chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110379737A true CN110379737A (en) | 2019-10-25 |
Family
ID=68252601
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910621145.6A Pending CN110379737A (en) | 2019-07-10 | 2019-07-10 | A kind of automatic test lettering collecting equipment of QFN chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110379737A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111900100A (en) * | 2020-09-01 | 2020-11-06 | 上海赢朔电子科技股份有限公司 | Automatic feeding and discharging mechanism for high-temperature test of QFN chip |
| CN111921884A (en) * | 2020-07-30 | 2020-11-13 | 游飞 | Chip sorting machine |
| CN114188244A (en) * | 2021-11-17 | 2022-03-15 | 苏州康沃斯智能装备有限公司 | Automatic code printing and inserting machine |
| CN114671226A (en) * | 2022-05-26 | 2022-06-28 | 四川晁禾微电子有限公司 | Paster triode material feeding unit |
-
2019
- 2019-07-10 CN CN201910621145.6A patent/CN110379737A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111921884A (en) * | 2020-07-30 | 2020-11-13 | 游飞 | Chip sorting machine |
| CN111921884B (en) * | 2020-07-30 | 2022-05-17 | 智蜂机电科技(东莞)有限公司 | Chip sorting machine |
| CN111900100A (en) * | 2020-09-01 | 2020-11-06 | 上海赢朔电子科技股份有限公司 | Automatic feeding and discharging mechanism for high-temperature test of QFN chip |
| CN114188244A (en) * | 2021-11-17 | 2022-03-15 | 苏州康沃斯智能装备有限公司 | Automatic code printing and inserting machine |
| CN114671226A (en) * | 2022-05-26 | 2022-06-28 | 四川晁禾微电子有限公司 | Paster triode material feeding unit |
| CN114671226B (en) * | 2022-05-26 | 2022-08-16 | 四川晁禾微电子有限公司 | Paster triode material feeding unit |
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