CN110376459B - High-speed acquisition system and method for frequency-temperature characteristics of multi-channel crystal oscillator - Google Patents
High-speed acquisition system and method for frequency-temperature characteristics of multi-channel crystal oscillator Download PDFInfo
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- CN110376459B CN110376459B CN201910602161.0A CN201910602161A CN110376459B CN 110376459 B CN110376459 B CN 110376459B CN 201910602161 A CN201910602161 A CN 201910602161A CN 110376459 B CN110376459 B CN 110376459B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a high-speed acquisition system for the frequency-temperature characteristic of a multi-channel crystal oscillator. The device comprises an industrial control computer, a parallel data acquisition unit, a frequency measurement control unit, a temperature control unit, a test station and an external voltage stabilizing source; a plurality of test stations are arranged in the temperature control unit; the frequency measurement control unit is correspondingly connected with the test station through a test station connecting wire; the frequency measurement control unit is integrated on the parallel data acquisition unit through a network cable; the test station is connected with an external voltage stabilizing source through a flexible power line; the temperature control unit is connected with the industrial personal computer through a communication signal; and the industrial control computer is connected with the parallel data acquisition unit through a network cable. The invention has the advantage of accurately representing the frequency-temperature characteristic of the real-time work of the crystal oscillator. The invention also discloses an acquisition method of the high-speed acquisition system of the frequency-temperature characteristic of the multi-channel crystal oscillator.
Description
Technical Field
The invention relates to the field of automatic testing, in particular to a high-speed acquisition system of frequency-temperature characteristics of a multi-channel crystal oscillator. The invention also relates to an acquisition method of the high-speed acquisition system of the frequency-temperature characteristic of the multi-channel crystal oscillator.
Background
The crystal oscillator is a frequency output realized by a positive feedback oscillation circuit by utilizing the piezoelectric effect of a quartz crystal wafer. In modern electronic devices, a crystal oscillator is used as a reference source of time or frequency, corresponding to the heart of the electronic device. The working state and the output frequency of the crystal oscillator are necessarily influenced by the temperature change of the working environment of the electronic equipment.
The crystal oscillator industry adopts an automatic frequency-temperature characteristic testing system, and the frequency-temperature characteristic of the crystal oscillator is described by measuring the output frequency of the crystal oscillator at a certain temperature interval point; the method cannot accurately represent the frequency-temperature characteristic of the crystal oscillator during real-time working.
The frequency-temperature characteristic test of the crystal oscillator in the continuous working state by adopting manual work has the problems of data misjudgment, low efficiency and incapability of simultaneously testing a plurality of crystal oscillators;
for the test requirements of batch products or longer temperature cycle period, a test bottleneck is necessarily formed; in addition, if the original system fails to meet the requirement of high-speed acquisition, the instantaneous abnormal frequency jump cannot be captured, convenient data cognition cannot be obtained for the short-stability characteristic of the normal crystal oscillator, and the short-stability instrument purchased in the market generally has only a single channel and is expensive.
Therefore, there is a need to develop a system and a method for acquiring the frequency-temperature characteristic of the crystal oscillator, which have high efficiency and can accurately represent the frequency-temperature characteristic of the real-time operation of the crystal oscillator.
Disclosure of Invention
The first purpose of the invention is to provide a high-speed acquisition system of the frequency-temperature characteristic of a multi-channel crystal oscillator, which can simultaneously test a plurality of crystal oscillators and accurately represent the frequency-temperature characteristic of the real-time operation of the crystal oscillators.
The second purpose of the invention is to provide the acquisition method of the high-speed acquisition system of the frequency-temperature characteristic of the multi-channel crystal oscillator, which has the advantages of higher efficiency, higher data acquisition speed which can reach 50 milliseconds per time, and greatly improved fineness and measurement efficiency of the real-time frequency-temperature characteristic test.
In order to achieve the first object of the present invention, the technical solution of the present invention is: the high-speed acquisition system of the frequency-temperature characteristic of the multi-channel crystal oscillator comprises an industrial control computer, a parallel data acquisition unit, a frequency measurement control unit, a temperature control unit, a test station and an external voltage stabilizing source;
a plurality of test stations are arranged in the temperature control unit; the frequency measurement control unit is correspondingly connected with the test station through a test station connecting wire;
the frequency measurement control unit is integrated on the parallel data acquisition unit through a network cable;
the test station is connected with an external voltage stabilizing source through a flexible power line;
the temperature control unit is connected with the industrial personal computer;
and the industrial control computer is connected with the parallel data acquisition unit through a network cable.
In the technical scheme, the industrial personal computer is provided with a network card interface connected with the parallel data acquisition unit;
the temperature control unit at least comprises an environment temperature test box;
the environment temperature test box and the industrial control computer are both provided with RS-485 interfaces;
the industrial control computer is provided with a high-speed CPU with a main frequency of more than or equal to 3.2GHz and an operating memory of more than or equal to 8G and a storage hard disk with a capacity of more than or equal to 500G.
In the above technical solution, the frequency measurement control unit at least includes a frequency counter;
the frequency counter is provided with a network cable interface and supports a TCP/IP protocol;
and the temperature control unit is provided with a communication signal line and is connected with the industrial personal computer through the communication signal line and an RS-485 interface.
In the technical scheme, the test station is provided with a pin jack;
the output end of each test station is correspondingly connected with the frequency counter through a test station connecting wire;
the test station connecting wire is a frequency signal wire.
In the technical scheme, the temperature field environment provided by the environment temperature test box is-55 ℃ to +125 ℃; the environment temperature test box is internally provided with a temperature sensor, and the outside of the environment temperature test box is provided with an interactive interface matched with a temperature curve;
the external voltage-stabilizing source provides a multi-channel voltage-stabilizing power supply of 0V-48V.
In order to achieve the second object of the present invention, the technical solution of the present invention is: the acquisition method of the high-speed acquisition system of the frequency-temperature characteristic of the multichannel crystal oscillator is characterized by comprising the following steps of: comprises the following steps of (a) carrying out,
the method comprises the following steps: setting a test station;
step two: setting a temperature curve;
calling a set standby standard temperature curve by selecting a program number;
or a temperature curve is set on an industrial control computer,
setting parameters of the temperature curve comprise limit low temperature and constant temperature time, limit high temperature and constant temperature time, heating rate between the limit low temperature and the limit high temperature, cooling rate and temperature cycle times;
establishing a test system interface on an industrial control computer; establishing a database storage area to realize real-time data archiving; bringing each hardware interface into a background control program to realize control of each unit; establishing a relation between data and a data acquisition time point by adopting an industrial control computer system clock;
testing system interface and system control to send an initialization command;
step three: detecting the normal temperature frequency;
when the frequency test on the industrial control computer is normal, entering the next step; when the test is abnormal, carrying out manual inspection and correction, and then carrying out normal temperature frequency detection;
step four: starting a full-automatic test;
the parallel data acquisition unit and the temperature measurement control unit operate;
step five: after the test is finished, stopping frequency acquisition and recovering the environmental temperature test box to be standby at 25 ℃;
step six: automatically storing test data; realizing real-time data archiving;
step seven: manually copying/saving test data;
step eight: and (4) analyzing series of data.
In the above technical solution, in the first step, a plurality of parallel frequency counters are started for a parallel data acquisition unit and a multi-path frequency test unit according to the number of configured test stations, so as to realize parallel real-time acquisition of multi-path data, specifically:
the industrial control computer sends an initialization command to the frequency measurement counter;
a trigger communication mode is entered between the parallel data acquisition unit and the frequency measurement control unit;
multiple frequency counters are executed concurrently.
In the above technical solution, in the second step, the step of sending an initialization command by the test system interface and the system control specifically includes: clearing the communication error content of the frequency counter;
enabling the frequency counter to feed back the level of the measured frequency signal to the parallel data acquisition unit;
setting a frequency counter trigger level;
setting a frequency counter to immediately send measurement data to a parallel data acquisition unit when frequency measurement is completed each time;
setting a frequency counter to a continuous measurement mode;
the triggering communication mode is specifically as follows: the parallel data acquisition unit is in a data sending state of the waiting frequency counter;
when the frequency measurement data sent by the frequency counter reaches the parallel data acquisition unit, the parallel data acquisition unit immediately feeds back the frequency measurement data to the test system;
then the frequency measurement control unit enters the waiting frequency measurement data state again.
In the above technical solution, in the fourth step, the operation of the parallel data acquisition unit specifically includes:
each channel of the parallel data acquisition unit is in different working processes, and when frequency measurement data are received, the frequency data are immediately reported to a test system, and measurement results are displayed and filed;
the temperature measurement control operation specifically comprises the following steps:
when the system is started, the temperature measurement control unit sends an initialization command to the environmental temperature test chamber:
clearing the communication error content of the environmental temperature test box;
setting the environment temperature control content of the environment temperature test box;
setting an environment temperature test chamber to be in a continuous temperature measurement mode;
sending measurement data to the temperature measurement control unit immediately each time temperature measurement is completed;
the temperature measurement control unit immediately reports the temperature data to the test system.
In the above technical solution, in the sixth step, the real-time data archiving specifically includes:
when a temperature measurement control unit of the system feeds back temperature measurement data, immediately archiving the temperature measurement data and the data arrival time point;
when the parallel data acquisition unit of the system feeds back frequency measurement data, the temperature of the test environment is inquired according to the arrival time point of the frequency measurement data, and the frequency measurement data, the temperature and the time point are filed.
The invention has the following advantages:
(1) the invention sets adjacent temperature, temperature holding time and temperature change rate to the system through an industrial control computer, simultaneously tests the real-time frequency of the tested crystal oscillator in parallel, stores the sampling data on a hard disk of the industrial control computer in a task database mode, and provides a system, a method and data for the real-time frequency characteristic research and analysis of the quartz crystal oscillator under the condition of variable temperature;
(2) the data acquisition speed is high and can reach 50 milliseconds/time, so that the precision degree and the measurement efficiency of the real-time frequency-temperature characteristic test are greatly improved; the function of high-speed frequency acquisition based on variable temperature can be realized;
(3) the invention can accurately represent the frequency-temperature characteristic of the real-time work of the crystal oscillator, and the invention adopts the automation technology, thereby having higher efficiency and higher precision; the defects that data misjudgment and low efficiency exist in manual testing, and a plurality of crystal oscillators cannot be tested simultaneously are overcome;
(4) the invention can better realize the real-time frequency test of the quartz crystal oscillator under the variable temperature condition, effectively help to identify the frequency jump abnormity of the quartz crystal oscillator under the variable temperature condition, and promote the research and performance improvement of the characteristic of the quartz crystal oscillator under the variable temperature frequency condition;
(5) the high-speed frequency acquisition function under the variable-temperature condition, which is realized by the invention, provides test and control guarantee for certain use places which are particularly concerned about the frequency change under the variable-temperature condition, so that the frequency change (variable-temperature short-stable) under the variable-temperature condition is expected to become a new industrial standard index in the field of oscillators.
Drawings
FIG. 1 is a schematic view of the structure of the present invention.
FIG. 2 is a flow chart of the testing process of the present invention.
FIG. 3 is a graph showing the temperature change short-term stability test and determination of a 16MHz phase-locked crystal oscillator in an embodiment of the present invention.
Fig. 4 shows the test results of fig. 3.
FIG. 5 is a graph showing the frequency monitoring and determination of 5.5 times temperature cycle of a 100MHz constant temperature crystal oscillator according to an embodiment of the present invention.
Fig. 6 shows the test results of fig. 5.
FIG. 7 is a graph of capture (failure analysis) of frequency anomaly jumps occurring at a 10MHz crystal oscillator in an embodiment of the present invention.
Fig. 8 is the test results of fig. 7.
Fig. 9 is a schematic structural diagram of an embodiment of the present invention.
In the figure, 1-an industrial control computer, 2-a parallel data acquisition unit, 3-a frequency measurement control unit, 3.1-a frequency counter, 4-a temperature control unit, 4.1-an ambient temperature test box, 5-a test station, 6-an external voltage stabilizing source, 7-a tested crystal oscillator, 8-a network cable, 9-a test station connecting wire, 10-a flexible power line and 11-a communication signal wire.
In fig. 1 and 9, VDD is represented as: testing a working voltage end of a station; GND is represented as: testing station power ground and signal ground; OUT is expressed as: a test station output end; VDD, GND and OUT are respectively jacks configured on the test station; the crystal oscillator to be tested is respectively connected with VDD, GND and OUT.
In fig. 1, a point between two test stations arranged at intervals is an ellipsis, and here, it indicates that a plurality of test stations can be arranged according to actual requirements;
in fig. 1, the point between two frequency counters arranged at intervals is an ellipsis, which means that the frequency counters can be arranged in plurality according to actual requirements.
Detailed Description
The embodiments of the present invention will be described in detail with reference to the accompanying drawings, which are not intended to limit the present invention, but are merely exemplary. While the advantages of the invention will be clear and readily understood by the description.
With reference to the accompanying drawings: the high-speed acquisition system of the frequency-temperature characteristic of the multi-channel crystal oscillator comprises an industrial personal computer 1, a parallel data acquisition unit 2, a frequency measurement control unit 3, a temperature control unit 4, a test station 5 and an external voltage stabilizing source 6;
a plurality of test stations 5 are arranged in the temperature control unit 4; each test station 5 is correspondingly provided with a tested crystal oscillator 7; the frequency measurement control unit 3 is correspondingly connected with the test station 5 through a test station connecting wire 9, so as to be correspondingly connected with the tested crystal oscillator 7;
the frequency measurement control unit 3 is integrated on the parallel data acquisition unit 2 through a network cable 8;
the test station 5 is connected with an external voltage stabilizing source 6 through a flexible power line 10;
the temperature control unit 4 is connected with the industrial personal computer 1;
the industrial personal computer 1 is connected with the parallel data acquisition unit 2 through a network cable 8 (as shown in fig. 1).
Furthermore, the industrial personal computer 1 is configured with a network card interface connected with the parallel data acquisition unit 2, and the industrial personal computer 1 is connected with the parallel data acquisition unit 2 through the network card interface to realize high-speed data reading;
the temperature control unit 4 at least comprises an ambient temperature test chamber 4.1;
an RS-485 interface is configured on the environment temperature test box 4.1, the industrial personal computer 1 is configured with an RS-485 interface corresponding to the RS-485 interface of the environment temperature test box 4.1, and the industrial personal computer 1 is connected with the RS-485 interface of the environment temperature test box through the RS-485 interface arranged on the industrial personal computer 1, so that the interactive communication and the setting of the industrial personal computer and the environment temperature test box are realized;
the industrial personal computer 1 is provided with a high-speed CPU with a main frequency of more than or equal to 3.2GHz and an operating memory of more than or equal to 8G and a storage hard disk with a capacity of more than or equal to 500G, and the industrial personal computer can be provided with the CPU with the main frequency of 3.2GHz, the 8Gbit operating memory and the 500G hard disk, so that smooth real-time data acquisition and operation are ensured, and a large amount of data generated by testing can be sufficiently stored; the industrial control computer can be configured with other high-speed CPUs and high-capacity hard disks according to actual requirements.
Further, a network cable interface is arranged on the frequency measurement control unit 3; the parallel data acquisition unit 1 takes a router as a main body and is respectively connected with a network cable interface arranged on the frequency measurement control unit 3 through a network cable 8; and through IP distribution, parallel exchange and serial transmission of multi-channel data are realized.
Further, the frequency measurement control unit 3 comprises at least a frequency counter 3.1; the frequency counter 3.1 is configured with a network cable interface and supports a TCP/IP protocol;
the frequency counter 3.1 is correspondingly connected with the tested crystal oscillator 7.
Furthermore, a communication signal line 11 (namely a parallel cable) is arranged on the temperature control unit 4, and the temperature control unit 4 is connected with the RS-485 interface of the industrial personal computer 1 and the RS-485 interface of the environmental temperature test box through the communication signal line 11 (namely the parallel cable), so that the temperature reading and setting of the environmental temperature test box 4.1 are realized.
Further, the tested crystal oscillator 7 is arranged corresponding to the test station 5;
a pin jack matched with the tested crystal oscillator 7 is arranged on the test station 5; thereby realizing the connection of signals such as power supply, ground, output and the like of the tested crystal oscillator;
the output end of each test station 5 is correspondingly connected with the frequency counter 3.1 positioned outside the environmental temperature test chamber 4.1 through a test station connecting wire 9 (as shown in fig. 1);
the test station connecting wire 9 is a frequency signal wire.
Furthermore, the environment temperature test box 4.1 provides a temperature field environment of-55 ℃ to +125 ℃; a temperature sensor is arranged in the environment temperature test box 4.1, an interactive interface matched with a temperature curve is configured outside the environment temperature test box, and the environment temperature test box 4.1 supports an RS-485 interface; the test requirement of the tested crystal oscillator 7 is met;
the external voltage-stabilizing source 6 provides a multi-channel voltage-stabilizing power supply of 0V-48V; through the arrangement, different working voltage requirements of different crystal oscillators can be met; and because of multi-channel output, the tested crystal oscillator 7 can meet the requirement when needing to be configured with voltage-controlled voltage.
With reference to the accompanying drawings: the acquisition method of the high-speed acquisition system of the frequency-temperature characteristic of the multi-channel crystal oscillator (as shown in figure 2) comprises the following steps,
the method comprises the following steps: a test station 5 is arranged to realize parallel real-time acquisition of multi-path data;
step two: selecting or setting a temperature profile;
calling a set standby standard temperature curve by selecting a program number;
or a temperature curve is set on the industrial control computer 1,
setting parameters of the temperature curve comprise limit low temperature and constant temperature time, limit high temperature and constant temperature time, heating rate between the limit low temperature and the limit high temperature, cooling rate and temperature cycle times;
establishing a test system interface on the industrial control computer 1; establishing a database storage area to realize real-time data archiving; bringing each hardware interface into a background control program to realize control of each unit; establishing a relation between data and a data acquisition time point by adopting an industrial control computer system clock;
testing system interface and system control to send an initialization command;
step three: detecting the normal temperature frequency;
when the frequency test on the industrial personal computer 1 is normal, the next step is carried out; when the test is abnormal, carrying out manual inspection and correction, and then carrying out normal temperature frequency detection;
step four: starting a full-automatic test;
the parallel data acquisition unit 2 and the temperature measurement control unit 3 operate;
step five: after the test is finished, stopping frequency acquisition and recovering the environmental temperature test box to 4.1 ℃ for standby at 25 ℃;
step six: automatically storing test data; realizing real-time data archiving;
step seven: manually copying/saving test data;
step eight: and (4) analyzing series of data.
Further, in the first step, a plurality of parallel frequency counters are started for the parallel data acquisition unit 2 and the multi-channel frequency test unit according to the number of the configured test stations, so that the parallel real-time acquisition of the multi-channel data is realized, and the method specifically comprises the following steps:
the industrial personal computer 1 sends an initialization command to the frequency measurement counter 3.1;
a trigger communication mode is entered between the parallel data acquisition unit 2 and the frequency measurement control unit 3;
a plurality of frequency counters 3.1 are executed concurrently;
in the second step, the test system interface and the system control sending initialization command are specifically as follows: clearing the communication error content of the frequency counter 3.1;
the frequency counter 3.1 feeds the level of the measured frequency signal back to the parallel data acquisition unit 2;
setting a frequency counter 3.1 trigger level;
setting a frequency counter 3.1 to immediately send measurement data to a parallel data acquisition unit 2 every time frequency measurement is finished;
setting the frequency counter 3.1 to a continuous measurement mode;
the triggering communication mode is specifically as follows: the parallel data acquisition unit 2 is in a data sending state of a waiting frequency counter 3.1;
when the frequency measurement data sent by the frequency counter 3.1 reaches the parallel data acquisition unit 2, the parallel data acquisition unit 2 immediately feeds back the frequency measurement data to the test system;
then the frequency measurement control unit 3 enters the wait frequency measurement data state again.
Furthermore, in step four, the operation of the parallel data acquisition unit specifically includes: each channel of the parallel data acquisition unit 2 is in different working processes, and when frequency measurement data are received, the frequency data are immediately reported to a test system, and measurement results are displayed and filed;
the temperature measurement control unit 3 is a temperature measurement control unit of an independent channel, and the operation of the temperature measurement control unit 3 is specifically as follows: when the system is started, the temperature measurement control unit sends an initialization command to the environmental temperature test chamber:
clearing the communication error content of the environmental temperature test box;
setting the environment temperature control content of the environment temperature test box;
setting an environment temperature test chamber to be in a continuous temperature measurement mode;
sending measurement data to the temperature measurement control unit immediately each time temperature measurement is completed;
the temperature measurement control unit immediately reports the temperature data to the test system.
In the sixth step, the real-time data archiving specifically comprises:
when a temperature measurement control unit of the system feeds back temperature measurement data, immediately archiving the temperature measurement data and the data arrival time point;
when the parallel data acquisition unit of the system feeds back frequency measurement data, the temperature of the test environment is inquired according to the arrival time point of the frequency measurement data, and the frequency measurement data, the temperature and the time point are filed.
Examples
The high-speed acquisition system and the method for the frequency-temperature characteristic of the multi-channel crystal oscillator of a certain 16MHz phase-locked crystal oscillator, a 100MHz constant-temperature crystal oscillator and a 10MHz phase-locked crystal oscillator are taken as embodiments respectively, and the system and the method have guiding effects on the high-speed acquisition system for the frequency-temperature characteristic of the multi-channel crystal oscillator of other measured crystal oscillators.
The Ethernet interface of the industrial personal computer is connected with an eight-channel router through a network cable (actually, any N-channel router can be selected according to the test requirement, N is greater than or equal to 1), and an IP is configured for the frequency counter on each channel.
Wherein, the four channels on the router are respectively connected to a frequency counter 3.1 through network cables;
the frequency counters 3.1 are all configured with Ethernet interfaces and support the distributed control mode of the Ethernet interfaces; the frequency counter 3.1 corresponds to a test station 5 arranged in the environment temperature test box 4.1; the tested crystal oscillator 7 is arranged on the test station 5, and the frequency counter 3.1 is correspondingly connected with the tested crystal oscillator 7 through a test station connecting wire 9; the environmental temperature test chamber 4.1 is a high-low temperature test chamber;
the tested crystal oscillator 7 is arranged on the testing station 5, the tested crystal oscillator 7 and the testing station 5 are both arranged in the high-low temperature box test box 4.1, and the high-low temperature box test box 4.1 provides a temperature field environment with specified conditions;
the power supply of the test station 5 is provided by an external stabilized voltage power supply 6, the external stabilized voltage power supply 6 is connected with the test station 5 through a flexible power line 10, and the voltage setting of the external stabilized voltage power supply 6 can be independently set according to the voltage requirement of the actual tested crystal oscillator.
The high-low temperature box test box 4.1 is provided with an RS485 interface, and working parameters (such as temperature value combination, retention time of each temperature point and the like) of the high-low temperature box test box 4.1 can be transmitted to an RS485 port of an industrial control computer end through a signal transmission line for a test system to read and process.
The frequency counter 3.1 comprises a first frequency counter 3.11, a second frequency counter 3.12, a third frequency counter 3.13 and a fourth frequency counter 3.14 (actually, any number of the frequency counters can be expanded according to test requirements, and N is greater than or equal to 1); the first frequency counter 3.11, the second frequency counter 3.12, the third frequency counter 3.13 and the fourth frequency counter 3.14 are arranged at intervals;
the test stations 5 comprise a first test station 5.1, a second test station 5.2, a third test station 5.3 and a fourth test station 5.4; the first frequency counter 3.11, the second frequency counter 3.12, the third frequency counter 3.13 and the fourth frequency counter 3.14 are arranged at intervals;
the first frequency counter 3.11, the second frequency counter 3.12, the third frequency counter 3.13 and the fourth frequency counter 3.14 are in one-to-one correspondence with the first test station 5.1, the second test station 5.2, the third test station 5.3 and the fourth test station 5.4 respectively through the test station connecting wires 9.
The tested crystal oscillator 7 comprises a first tested crystal oscillator 7.1, a second tested crystal oscillator 7.2, a third tested crystal oscillator 7.3 and a fourth tested crystal oscillator 7.4; the first tested crystal oscillator 7.1 is positioned on the first testing station 5.1, the second tested crystal oscillator 7.2 is positioned on the second testing station 5.2, the third tested crystal oscillator 7.3 is positioned on the third testing station 5.3, and the fourth tested crystal oscillator 7.4 is positioned on the fourth testing station 5.4;
the first frequency counter 3.11 is correspondingly connected with the first tested crystal oscillator 7.1 through a test station connecting wire 9; the second frequency counter 3.12 is correspondingly connected with the second tested crystal oscillator 7.2 through a test station connecting wire 9; the third frequency counter 3.13 is correspondingly connected with the third tested crystal oscillator 7.3 through a test station connecting wire 9; the fourth frequency counter 3.14 is correspondingly connected with the fourth tested crystal oscillator 7.4 through a test station connecting wire 9;
the first test station 5.1, the second test station 5.2, the third test station 5.3 and the fourth test station 5.4 may be integrated on one unified test PCB or may be a combination of single independent test fixtures.
The first frequency counter 3.11, the second frequency counter 3.12, the third frequency counter 3.13 and the fourth frequency counter 3.14 are all connected through a GPS low-phase-noise ultra-high stable crystal oscillator time frequency system to realize clock synchronization and unification (as shown in FIG. 9).
Fig. 3 shows a temperature-change short-time stability test and determination curve of a 16MHz phase-locked crystal oscillator in an embodiment.
In fig. 3, the abscissa represents the test time in units of: second; the ordinate is expressed in frequency (in Hz) and temperature (in:. degree. C.);
as can be seen from fig. 4, in the temperature change short-time stability test and determination process of a certain 16MHz phase-locked crystal oscillator in the embodiment, the temperature change rate is 1.33 ℃/min, and the average acquisition speed is 96.5 times/min (about 62 ms/time). Therefore, the invention has the advantages of high data acquisition speed, high efficiency and high precision by adopting an automatic technology, can better realize the real-time frequency test of the quartz crystal oscillator under the condition of variable temperature, greatly improves the fineness and the measurement efficiency of the real-time frequency-temperature characteristic test, and can accurately represent the real-time working frequency-temperature characteristic of the crystal oscillator.
As can be seen from fig. 4, the acquisition speed of the embodiment is high and continuous, the locking state can be monitored or the lock losing abnormity or other weak links can be captured at the time intervals as dense as possible, and a practical experimental method and experimental data are provided for researching the suppression level of the frequency overshoot of the quartz crystal under the temperature-changing condition based on the phase-locking technology.
FIG. 5 shows the frequency monitoring and determination curve of a 100MHz constant temperature crystal oscillator in the example for 5.5 times of temperature cycles.
In fig. 5, the abscissa represents the test time in units of: day; the ordinate is expressed in frequency (in Hz) and temperature (in:. degree. C.);
as can be seen from FIG. 6, the average acquisition speed is 1.3 times/min in the process of monitoring and judging the temperature cycle frequency of a certain 100MHz constant temperature crystal oscillator for 5.5 times in the embodiment by adopting the invention; the ramp rate was 1.64 deg.C/min. As can be seen from fig. 6, an important feature of the present invention is that the temperature-varying setting and the frequency acquisition rate are controlled in a centralized manner, the frequency acquisition rate (frequency) can be adjusted according to the test task, the acquired monitoring data shows that the constant temperature crystal oscillator operates normally in a test period as long as 9H40MIN, and the temperature control characteristic of the constant temperature crystal oscillator is reflected in the frequency change under the temperature-varying condition, so as to provide a test method and a data support for studying the temperature control characteristic of the constant temperature crystal oscillator.
The capture (failure analysis) curve of the frequency anomaly jump happened to a certain 10MHz crystal oscillator in the embodiment is shown in FIG. 7.
In fig. 7, the ordinate represents: adjacent frequency hopping variable, unit is: hz;
in fig. 7, a represents the frequency of a 10MHz crystal oscillator measured in 2019 on 3, 20 and 3 months (i.e., the first measurement of a 10MHz crystal oscillator); b represents the frequency of a certain 10MHz crystal oscillator measured in 2019, 3, month and 21 (namely the second measurement frequency of the certain 10MHz crystal oscillator); c represents the frequency of a certain 10MHz crystal oscillator measured in 2019, 4, month and 11 days (namely the third measurement frequency of the certain 10MHz crystal oscillator); d represents the frequency of a certain 10MHz crystal oscillator measured in 2019 on 4, 12 and 4 months (namely the fourth measurement frequency of a certain 10MHz crystal oscillator).
It can be seen from fig. 8 that, in the capturing (failure analysis) process of the accidental frequency abnormal jump of a certain 10MHz crystal oscillator in the embodiment, the average acquisition speed is as follows: 82.3 times/min; the ramp rate was 1.64 deg.C/min. Therefore, the method and the device have the advantages that the acquisition speed is high, the accidental frequency abnormal jump phenomenon is captured at the frequency acquisition speed of 72 ms/time, and the acquisition method and the test data are provided for the accidental frequency abnormal jump fault mode.
And (4) conclusion: the invention can send various control commands to the downstream units and receive feedback data of each unit through a test interface of a test system on the industrial control computer 1, the frequency-temperature characteristic speed of the crystal oscillator can be acquired in real time and can reach 50 milliseconds/time, 216 and 000 frequency data, 216 and 000 time point data and 216 and 000 temperature point data can be acquired according to one test time and 3 hours, and a single task database file is about 200 Mbit.
In the prior art, multiple crystal oscillator tests are generally performed in sequence by one channel, multi-channel real-time tests cannot be realized, and test bottlenecks are inevitably formed for batch products or test requirements with long temperature cycle periods; in addition, the prior art cannot achieve the acquisition speed of high-speed acquisition for 50 ms/time, and abnormal frequency jump which occurs instantly cannot be captured; therefore, the realization of the system can solve the problems of multi-channel large-batch and high-speed acquisition.
By the test method, the real-time frequency test of the quartz crystal oscillator under the variable temperature condition can be preferably realized, the abnormal frequency jump of the quartz crystal oscillator under the variable temperature condition is effectively helped to be identified, and the research and performance improvement of the characteristic of the quartz crystal oscillator under the variable temperature frequency condition are promoted; the precision degree and the measurement efficiency of the real-time frequency-temperature characteristic test are greatly improved, the frequency-temperature characteristic of the real-time work of the crystal oscillator can be accurately represented, and an automation technology is adopted, so that the efficiency is high, and the precision is high.
In order to more clearly illustrate the advantages of the high-speed acquisition system and method for the frequency-temperature characteristic of the multichannel crystal oscillator of the invention compared with the prior art, the two technical schemes are compared by workers, and the comparison results are as follows:
as can be seen from the above table, compared with the prior art, the high-speed acquisition system and method for the frequency-temperature characteristic of the multi-channel crystal oscillator have the advantages of higher acquisition degree, capability of capturing abnormal frequency jump which occurs instantly, higher detection precision and capability of simultaneously testing a plurality of crystal oscillators.
Other parts not described belong to the prior art.
Claims (5)
1. The high-speed acquisition method of the real-time frequency-temperature characteristic of the multi-channel crystal oscillator is characterized by comprising the following steps of: acquiring the frequency-temperature characteristic of the crystal oscillator in real time by adopting a high-speed acquisition system of the real-time working frequency-temperature characteristic of the multi-channel crystal oscillator;
the high-speed acquisition system of the real-time working frequency-temperature characteristic of the multi-channel crystal oscillator comprises an industrial control computer (1), a parallel data acquisition unit (2), a frequency measurement control unit (3), a temperature control unit (4), a test station (5) and an external voltage stabilizing source (6);
a plurality of test stations (5) are arranged in the temperature control unit (4); the temperature control unit (4) comprises at least an ambient temperature test chamber (4.1);
the frequency measurement control unit (3) is correspondingly connected with the test station (5) through a test station connecting wire (9);
the frequency measurement control unit (3) is integrated on the parallel data acquisition unit (2) through a network cable (8); the frequency measurement control unit (3) comprises at least a frequency counter (3.1);
the test station (5) is connected with an external voltage stabilizing source (6) through a flexible power line (10);
the temperature control unit (4) is connected with the industrial control computer (1);
the industrial control computer (1) is connected with the parallel data acquisition unit (2) through a network cable (8);
the high-speed acquisition method of the real-time frequency-temperature characteristic of the multi-channel crystal oscillator comprises the following steps,
the method comprises the following steps: setting a testing station (5);
in the first step, a plurality of parallel frequency counters are started for a parallel data acquisition unit (2) and a multi-channel frequency measurement control unit (3) according to the number of configured test stations, so that the parallel real-time acquisition of multi-channel data is realized, and the method specifically comprises the following steps:
the industrial control computer (1) sends an initialization command to the frequency counter (3.1);
a trigger communication mode is entered between the parallel data acquisition unit (2) and the frequency measurement control unit (3);
a plurality of frequency counters (3.1) are executed concurrently;
step two: setting a temperature curve;
calling a set standby standard temperature curve by selecting a program number;
or a temperature curve is arranged on the industrial control computer (1),
setting parameters of the temperature curve comprise limit low temperature and constant temperature time, limit high temperature and constant temperature time, heating rate between the limit low temperature and the limit high temperature, cooling rate and temperature cycle times;
establishing a test system interface on an industrial control computer (1); establishing a database storage area to realize real-time data archiving; bringing each hardware interface into a background control program to realize control of each unit; establishing a relation between data and a data acquisition time point by adopting an industrial control computer system clock;
testing system interface and system control to send an initialization command;
in the second step, the test system interface and the system control sending initialization command are specifically as follows: clearing the communication error content of the frequency counter (3.1);
enabling a frequency counter (3.1) to feed back the level of the measured frequency signal to a parallel data acquisition unit (2);
setting a frequency counter (3.1) trigger level;
setting a frequency counter (3.1) to immediately send measurement data to a parallel data acquisition unit (2) when frequency measurement is completed once;
setting the frequency counter (3.1) in a continuous measurement mode;
the triggering communication mode is specifically as follows: the parallel data acquisition unit (2) is in a data sending state of a waiting frequency counter (3.1);
when the frequency measurement data sent by the frequency counter (3.1) reaches the parallel data acquisition unit (2), the parallel data acquisition unit (2) immediately feeds back the frequency measurement data to the test system;
then the frequency measurement control unit (3) enters the state of waiting for frequency measurement data again;
step three: detecting the normal temperature frequency;
when the frequency test on the industrial control computer (1) is normal, entering the next step; when the test is abnormal, carrying out manual inspection and correction, and then carrying out normal temperature frequency detection;
step four: starting a full-automatic test;
the parallel data acquisition unit (2) and the temperature control unit (4) operate;
in the fourth step, the operation of the parallel data acquisition unit is specifically as follows:
each channel of the parallel data acquisition unit (2) is in different working processes, and when frequency measurement data are received, the frequency data are immediately reported to a test system, and measurement results are displayed and filed;
the operation of the temperature control unit (4) is specifically as follows:
when the system starts, the temperature control unit (4) sends an initialization command to the ambient temperature test chamber (4.1):
clearing the communication error content of the environmental temperature test box (4.1);
setting the environmental temperature control content of an environmental temperature test box (4.1);
setting an environment temperature test chamber (4.1) as a continuous temperature measurement mode;
sending measurement data to the temperature control unit (4) immediately each time temperature measurement is completed;
the temperature measurement control unit immediately reports the temperature data to the test system;
step five: after the test is finished, stopping frequency acquisition, and recovering the environmental temperature test box to be standby at 25 ℃;
step six: automatically storing test data; realizing real-time data archiving;
in the sixth step, the real-time data archiving specifically comprises:
when a temperature control unit (4) of the system feeds back temperature measurement data, the temperature measurement data and the data arrival time point are immediately filed;
when a parallel data acquisition unit (2) of the system feeds back frequency measurement data, inquiring the test environment temperature according to the arrival time point of the frequency measurement data, and archiving the frequency measurement data, the temperature and the time point;
step seven: manually copying the test data or storing the test data;
step eight: and (4) analyzing series of data.
2. The method for high-speed acquisition of real-time frequency-temperature characteristics of a multi-channel crystal oscillator according to claim 1, wherein: the industrial personal computer (1) is provided with a network card interface connected with the parallel data acquisition unit (2);
the environment temperature test box (4.1) and the industrial control computer (1) are both provided with RS-485 interfaces;
the industrial control computer (1) is provided with a high-speed CPU with a main frequency of more than or equal to 3.2GHz and an operating memory of more than or equal to 8G and a storage hard disk with a capacity of more than or equal to 500G.
3. The method for acquiring the real-time frequency-temperature characteristic of the multi-channel crystal oscillator at high speed according to claim 1 or 2, wherein the method comprises the following steps: the frequency counter (3.1) is configured with a network cable interface and supports a TCP/IP protocol;
the temperature control unit (4) is provided with a communication signal line (11), and the temperature control unit (4) is connected with the industrial personal computer (1) through the communication signal line (11) and an RS-485 interface.
4. The method for high-speed acquisition of real-time frequency-temperature characteristics of a multi-channel crystal oscillator according to claim 3, wherein: a pin jack is arranged on the test station (5);
the output end of each test station (5) is correspondingly connected with the frequency counter (3.1) through a test station connecting wire (9);
the test station connecting wire (9) is a frequency signal wire.
5. The method for high-speed acquisition of real-time frequency-temperature characteristics of a multi-channel crystal oscillator according to claim 4, wherein: the environment temperature test box (4.1) provides a temperature field environment of-55 ℃ to +125 ℃; a temperature sensor is arranged in the environment temperature test box (4.1), and an interactive interface matched with a temperature curve is configured outside the environment temperature test box;
the external voltage-stabilizing source (6) provides a multi-channel voltage-stabilizing power supply of 0V-48V.
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| CN115032513B (en) * | 2022-04-15 | 2023-07-04 | 上海柯锐芯微电子有限公司 | Quartz crystal oscillator frequency micro-jump detection method based on piecewise polynomial modeling error |
| CN116879628B (en) * | 2023-09-08 | 2023-11-14 | 河北远东通信系统工程有限公司 | Quick measuring device of voltage-controlled crystal oscillator frequency jump point |
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