CN208224400U - A kind of high/low temperature automation batch testing system of crystal oscillator - Google Patents
A kind of high/low temperature automation batch testing system of crystal oscillator Download PDFInfo
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- CN208224400U CN208224400U CN201820955581.8U CN201820955581U CN208224400U CN 208224400 U CN208224400 U CN 208224400U CN 201820955581 U CN201820955581 U CN 201820955581U CN 208224400 U CN208224400 U CN 208224400U
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- low temperature
- crystal oscillator
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Abstract
The utility model discloses a kind of high/low temperatures of crystal oscillator to automate batch testing system, belongs to microwave radio circuit field field.A kind of high/low temperature automation batch testing system of crystal oscillator, including high-low temperature test chamber, test board, power meter, frequency meter, spectrum analyzer and computer, the test board is placed in high-low temperature test chamber, computer controls the operating temperature of high-low temperature test chamber by temperature control line, the RF switch on test board is controlled by thread switching control, the resultant signal output line of test board output is connected to frequency meter, power meter, spectrum analyzer, computer result as measured by each instrument and equipments such as gpib interface reading frequency meter, power meter and frequency spectrograph.
Description
Technical field
The utility model relates to microwave radio circuit field more particularly to a kind of automations batch of the high/low temperature of crystal oscillator
Measure test system.
Background technique
Crystal oscillator usually requires to carry out high temperature performance index test.During the high and low temperature test, need not
The technical parameters such as same frequency, output power, the harmonics restraint of temperature spot test crystal oscillator.It is produced when single manual testing
Inefficiency, and the Systematic Analysis of test result is poor.It can be in high-low temperature chamber using the automated testing method of mass
In once place multiple crystal oscillators while carrying out high/low temperature experiment, when test, passes through computer control and extracts multiple crystal vibrations
The parameters such as frequency, output power, the harmonics restraint of device are swung, and the result of extraction can be made into analysis as needed.Automation
Test macro can greatly save manpower and time, and improve testing efficiency.
Utility model content
The utility model is directed to the automatic test of crystal oscillator, and the high/low temperature for providing a kind of crystal oscillator is automatic
Change batch testing system.
In order to solve the above technical problems, technical solution adopted in the utility model is:
A kind of high/low temperature automation batch testing system of crystal oscillator, including high-low temperature test chamber, test board, power
Meter, frequency meter, spectrum analyzer and computer, the test board are placed in high-low temperature test chamber, and computer passes through temperature control
Line traffic control processed sets the operating temperature of high-low temperature test chamber, controls the RF switch on test board by thread switching control, test board is defeated
Resultant signal output line out is connected to frequency meter, power meter, spectrum analyzer, and computer passes through gpib interface reading frequency meter, function
Result measured by each instrument and equipment such as rate meter and frequency spectrograph.
The beneficial effects of adopting the technical scheme are that
A kind of high/low temperature automation batch testing system of crystal oscillator of the utility model is to realize crystal oscillator
Automation the high and low temperature test, improve production efficiency, test result directly stores analysis, realizes that systematization is analyzed.
Detailed description of the invention
Utility model will be further described in detail below with reference to the attached drawings and specific embodiments.
Fig. 1 is the utility model monolithic test plate structure figure
Fig. 2 is structure chart after the extension of the utility model muti-piece test board
Fig. 3 is the utility model crystal oscillator high/low temperature automatization test system block diagram
Fig. 4 is the utility model test flow chart
Specific embodiment
Below with reference to the attached drawing in the utility model embodiment, the technical scheme in the embodiment of the utility model is carried out clear
Chu is fully described by, it is clear that and described embodiment is only a part of the embodiment of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
Many details are explained in the following description in order to fully understand the utility model, but this is practical new
Type can also be implemented using other than the one described here other way, and those skilled in the art can be without prejudice to this reality
With doing similar popularization in the case where novel intension, therefore the utility model is not limited by the specific embodiments disclosed below.
A kind of high/low temperature automation batch testing system of crystal oscillator of the utility model, including high-low temperature test chamber,
Test board, power meter, frequency meter, spectrum analyzer and computer, test board are placed in high-low temperature test chamber, are pacified on test board
The crystal oscillator tested needed for being inserted with, power supply line provide power supply for the crystal oscillator of required test, each crystal oscillation
The output end of device is connected with RF switch.There are five four road RF switches on test board, computer passes through switch control line traffic control
The open and close state of RF switch, switch control line options crystal oscillator to be tested, test board 1 and other three pieces of test boards
RF switch 6 is accessed, the crystal oscillator tested on which block test board is selected by RF switch 6.Radio frequency on test board
Crystal oscillator in switch selection slot position.Only RF switch is closed all the way when test, and tests this crystal oscillator
Technical parameter.If what No. 1 slot position was connected closes the switch, the crystal oscillator in the slot position is tested, computer reading frequency meter,
Crystal oscillator in No. 1 slot position is completed in the parameters such as frequency, power, the harmonics restraint that power meter, spectrum analyzer measure, test
The performance indicator of the crystal oscillator of next slot position is carried out after all properties index.
Fig. 3 is crystal oscillator high/low temperature automatization test system block diagram.Power supply line provides power supply for crystal oscillator.Meter
The operating temperature of high-low temperature test chamber is arranged by temperature control line for calculation machine, needs crystal to be tested by thread switching control setting
Oscillator number.The resultant signal output line of test board output is connected to the test equipments such as frequency meter, power meter, spectrum analyzer.It is brilliant
The technical parameter of oscillation body device has frequency, power, harmonics restraint etc., can be respectively by frequency meter, power meter, spectrum analyzer etc.
Test equipment is tested.Computer passes through each instrument and equipment institutes such as gpib interface reading frequency meter, power meter and spectrum analyzer
The result of measurement and preservation.
Fig. 4 is specific testing process.All crystal are mounted in the slot position with number, high-low temperature test chamber is put into, arrives
When up to certain temperature, temperature starts to test after stablizing 20min.Switch control selects the crystal oscillator output of No. 1 slot position, calculates
Machine-readable output power, output frequency, the harmonics restraint etc. for taking each instrument such as power meter, frequency meter, spectrum analyzer to measure respectively
Performance indicator.After the completion of No. 1 slot position crystal oscillator testing performance index, the output of No. 1 slot position crystal oscillator is switched and is broken,
The output of No. 2 slot positions is switched and is opened, retest process, until having surveyed the parameter of all crystal oscillators.Each parameter is surveyed
Result after the completion of examination is all stored in computer.
Claims (1)
1. a kind of high/low temperature of crystal oscillator automates batch testing system, it is characterised in that: including high-low temperature test chamber, survey
Test plate (panel), power meter, frequency meter, spectrum analyzer and computer, the test board are placed in high-low temperature test chamber, and computer is logical
Excess temperature control line controls the operating temperature of high-low temperature test chamber, controls the RF switch on test board by thread switching control,
The resultant signal output line of test board output is connected to frequency meter, power meter, spectrum analyzer, and computer reads frequency by gpib interface
Result measured by each instrument and equipment such as rate meter, power meter and frequency spectrograph.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820955581.8U CN208224400U (en) | 2018-06-20 | 2018-06-20 | A kind of high/low temperature automation batch testing system of crystal oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820955581.8U CN208224400U (en) | 2018-06-20 | 2018-06-20 | A kind of high/low temperature automation batch testing system of crystal oscillator |
Publications (1)
| Publication Number | Publication Date |
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| CN208224400U true CN208224400U (en) | 2018-12-11 |
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| CN201820955581.8U Active CN208224400U (en) | 2018-06-20 | 2018-06-20 | A kind of high/low temperature automation batch testing system of crystal oscillator |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109752640A (en) * | 2018-12-20 | 2019-05-14 | 成都世源频控技术股份有限公司 | The highly integrated test macro of crystal oscillator |
| CN110376459A (en) * | 2019-07-05 | 2019-10-25 | 武汉海创电子股份有限公司 | Multichannel crystal oscillator frequency-temperature characterisitic high speed acquisition system and method |
| CN116298647A (en) * | 2023-05-11 | 2023-06-23 | 中国电子科技集团公司第十研究所 | Workstation and method for module environment experiment |
-
2018
- 2018-06-20 CN CN201820955581.8U patent/CN208224400U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109752640A (en) * | 2018-12-20 | 2019-05-14 | 成都世源频控技术股份有限公司 | The highly integrated test macro of crystal oscillator |
| CN110376459A (en) * | 2019-07-05 | 2019-10-25 | 武汉海创电子股份有限公司 | Multichannel crystal oscillator frequency-temperature characterisitic high speed acquisition system and method |
| CN116298647A (en) * | 2023-05-11 | 2023-06-23 | 中国电子科技集团公司第十研究所 | Workstation and method for module environment experiment |
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