CN109752640A - The highly integrated test macro of crystal oscillator - Google Patents
The highly integrated test macro of crystal oscillator Download PDFInfo
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- CN109752640A CN109752640A CN201811563550.9A CN201811563550A CN109752640A CN 109752640 A CN109752640 A CN 109752640A CN 201811563550 A CN201811563550 A CN 201811563550A CN 109752640 A CN109752640 A CN 109752640A
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- crystal oscillator
- host computer
- control panel
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Abstract
The invention discloses a kind of highly integrated test macros of crystal oscillator, including controller, control panel, host computer, multichannel programmable power supply, bar code scanner and the RF switch being connected with controller, the measured piece fixture and digital spc avometer being all connected with control panel, short stabilization tester, spectrum measurement instrument, frequency test meter and the noise-measuring instrument of host computer and RF switch are connected simultaneously, the man-machine interactive system communicated with host computer, and place the low-and high-temp test facility of control panel and measured piece fixture；Wherein, host computer is also connected with multichannel programmable power supply, and digital spc avometer is also connected with multichannel programmable power supply and host computer.The present invention solves the problems, such as to need replacing test equipment when existing test macro can not carry out crystal oscillator comprehensive index test and crystal oscillator test have the advantages that Highgrade integration, intelligence, entry high efficiency concurrent testing, the transmission of anti-distorted signals, good Electro Magnetic Compatibility etc. are multiple.It is consequently adapted to promote and apply.
Description
Technical field
The present invention relates to electronic component the field of test technology, specifically, being that be related to a kind of crystal oscillator highly integrated
Test macro.
Background technique
Crystal oscillator, which refers to, cuts thin slice, referred to as quartz crystal or crystalline substance by certain azimuth from one piece of quartz crystal
Body, crystal oscillator, and the crystal element that IC composition oscillating circuit is added inside encapsulation is known as crystal oscillator, product generally uses gold
Belong to shell encapsulation, also useful glass shell, ceramics or plastics encapsulation.General crystal oscillator, for generating oscillation in various circuits
Frequency.
Crystal oscillator is one of the key component of systems such as radar and communication, and output signal is (such as phase noise, short-term steady
Fixed degree, frequency accuracy etc.) determine the overall performance of system.For not homologous ray, the key index of crystal oscillator is different.For
The versatility for guaranteeing crystal oscillator, in process of production must test the key index of crystal oscillator.
The testability index of crystal oscillator is more, and traditional test method is that crystal oscillator is carried out every independent index test one by one
Or batch carries out an individual index test.There is presently no test macros to carry out comprehensive index test to crystal oscillator.
Designing and having manufactured in the present invention a set of can carry out comprehensive electrical property to crystal oscillator within the scope of -60 DEG C~+125 DEG C
Index testing system.
Summary of the invention
The purpose of the present invention is to provide a kind of highly integrated test macros of crystal oscillator, mainly solve existing test macro
The problems such as needing replacing test equipment when comprehensive index test and crystal oscillator test can not be carried out to crystal oscillator.
To achieve the above object, The technical solution adopted by the invention is as follows:
A kind of highly integrated test macro of crystal oscillator, including controller, it is the control panel being connected with controller, upper
Machine, multichannel programmable power supply, bar code scanner and RF switch, the measured piece fixture being all connected with control panel and digital spc three are used
Table, while short stabilization tester, spectrum measurement instrument, frequency test meter and the noise-measuring instrument of host computer and RF switch are connected, with
The man-machine interactive system that host computer is communicated, and place the low-and high-temp test facility of control panel and measured piece fixture；Wherein,
Host computer is also connected with multichannel programmable power supply, and digital spc avometer is also connected with multichannel programmable power supply and host computer.
Further, the man-machine interactive system is mainly by man-machine interactive interface and measuring and calculation system interconnected
System composition, wherein man-machine interactive interface realizes the operation control communicated with host computer.
Further, the quantity of the control panel is 6 pieces, and every piece of control panel is equipped with 8 general load measured piece fixtures
Position.
Specifically, the measured piece fixture is equipped with the standard draw pin hole location docked with control panel and for encapsulating crystal oscillation
The jack position of device.
Preferably, the RF switch uses relay-set.
Preferably, being transmitted when the system detection using low frequency signal and square-wave signal, the crystalline substance of non-test state
The output of oscillation body device radiofrequency signal connects 50 Ω load.
Compared with prior art, the invention has the following advantages:
(1) system of the invention is used by integrated signal analyzer, spectrum analyzer, short steady analyzer, frequency meter, three
Table, DCPS digitally controlled power source, host computer, control cabinet are interconnected instrument and equipment and host computer using RJ45 cable in major and minor cabinet,
Simultaneity factor can also control low-and high-temp test facility by serial ports, save the system connecting time, improve system working efficiency.
(2) present invention is by integrating bar code scanner in systems, and it is exclusive on each crystal oscillator to stick its
Bar-code label can be improved working efficiency using bar code scan when loading measured piece test, while can be to avoid artificial record
Enter error message, guarantees the accuracy of test data and measured piece information.
(3) present invention passes through radio frequency by the way that control panel to be placed in low-and high-temp test facility together with measured piece fixture
System can complete measured piece by controlling low-and high-temp test facility after cable and control cable interconnect control panel and controller
Electrical performance indexes test under the conditions of various temperature.
(4) the low noise DC control formula relay that the present invention uses, will not draw while capable of reducing radiofrequency signal Insertion Loss
Enter additional clutter and noise signal, can effectively guarantee that high quality radiofrequency signal is undistorted.
(5) present invention is trembled in test output power, harmonics restraint, clutter recognition, frequency reproducibility, phase noise, integral
It when dynamic index, is only powered to a measured piece on each control panel, the power-off of other measured pieces can prevent between radiofrequency signal mutually
String.
(6) present invention connects 50 Ω payloads by exporting to the crystal oscillator radio frequency for being in non-test state in real time,
Load can consume the output energy of crystal oscillator, and the interference source in space is greatly reduced.
Detailed description of the invention
Fig. 1 is present system structure chart.
Fig. 2 is invention software mount structure frame figure.
Fig. 3 is control panel of the present invention and general load position schematic diagram.
Fig. 4 is the high and low temperature test block diagram in present system.
Specific embodiment
The invention will be further described with embodiment for explanation with reference to the accompanying drawing, and mode of the invention includes but not only limits
In following embodiment.
Embodiment
As shown in Figs 1-4, the highly integrated test macro of a kind of crystal oscillator disclosed by the invention, including controller, with
Controller connected control panel, host computer, multichannel programmable power supply, bar code scanner and RF switch, are all connected with control panel
Measured piece fixture and digital spc avometer, while connecting the short stabilization tester of host computer and RF switch, spectrum measurement instrument, frequency
Rate tester and noise-measuring instrument, the man-machine interactive system communicated with host computer, and place control panel and measured piece folder
The low-and high-temp test facility of tool；Wherein, host computer is also connected with multichannel programmable power supply, and digital spc avometer is also program-controlled with multichannel
Power supply is connected with host computer.
Further, the man-machine interactive system is mainly by man-machine interactive interface and measuring and calculation system interconnected
System composition, wherein man-machine interactive interface realizes the operation control communicated with host computer.
Power consumption, output power, harmonic wave suppression after the index that this system can test crystal oscillator includes: booting power consumption, stablizes
System, clutter recognition, power on characteristic, frequency accuracy, frequency reproducibility, short-term stability, phase noise, integral shake, aging
Rate, frequency-voltage regulation limits, frequency-temperature stability and reference voltage output.
In the measured piece fixture of this system design, it can once add 48, the tooling of measured piece mainly has two parts group
At: 6 pieces of control panels and 48 measured piece fixtures, powering on for control panel control measured piece are drawn with unit for electrical property parameters；Measured piece folder
Tool loads specific measured piece, and is installed on control panel.There are many encapsulation for crystal oscillator, and the pin spacing of every kind of encapsulation is all
It can be variant.For the versatility for improving control panel, there are 8 general load measured piece chucking positions on every piece of control panel, Fig. 3 is to control
General loading position schematic diagram in making sheet, general loading position are made of 4 hole DIP, can effectively be prevented using the trapezoidal layout in 4 holes
It is wrong.There are two types of installation sites on measured piece fixture: one is the standard draw pins docked with control panel；Another kind is the different envelopes of installation
The jack position for filling crystal oscillator, can make the crystal oscillator that a variety of encapsulation can be loaded on control panel in this way, ensure that and be
Unite it is highly integrated after flexibility.
This test macro every batch of can add 48 crystal oscillators, because integrated various instrument and equipments are more, for up to
To instrument highest utilization rate, is synchronized and tested using multinomial Wheel-type, it can 5 crystal oscillators of real-time testing.5 crystal vibrations
The project for swinging device synchronism detection is respectively power on characteristic, spectrum analysis, short-term stability, frequency characteristic, phase noise, Yi Jidan
The real-time testing quantity of item test item is only 1 crystal oscillator, realizes the test of timesharing high efficiency.
This system can also be automatically performed crystal oscillator every electrical performance indexes test under high/low temperature, by control panel and quilt
It surveys part fixture to be placed in low-and high-temp test facility together, is interconnected control panel and controller by radio-frequency cable and control cable
System can complete electrical performance indexes test of measured piece under the conditions of various temperature by controlling low-and high-temp test facility afterwards.
This system had both supported each measured piece to establish independent test content, also supported to establish batch testing content；?
The Index Content flexible choice test item composition that can be tested as needed when establishing a completely new test content；It is automatic in system
In the completely new test content established, it can delete the corresponding test item of index to be tested is not required to, while can also add test
?；Each test content can be adjusted every testing sequence by actual demand；The test content of first product, which is established, to be completed
Afterwards, continue to establish the test content as first product behind automatically when the product for the same model added and test suitable
Sequence.In test frequency stability characteristic, crystal oscillator needs work long hours, interior in a limited space to make more crystalline substances simultaneously
There are mutual crosstalk between multi-signal when oscillation body device works, passed simultaneously using low frequency signal transmission, square-wave signal in this system
It is defeated, connect the schemes such as 50 Ω load in the crystal oscillator radiofrequency signal output of non-test state and evade crosstalk between signal.All
System can carry out determining that items refer to automatically according to the criterion inputted when establishing test item after the completion of the test item test of addition
Whether mark is qualified, and automatically generates report.
For the selection aspect of TCH test channel, RF switch described in this system is replaced using relay-set.
System initially enters measured piece relevant information and imports interface after program starting, will be brilliant by the bar code on scanning crystal oscillator
The position number of vibration sequence number and part fixture to be measured corresponds；Step has two selections herein for data input:
1. importing specified product manual；
2. being manually entered product index information.
All relevant informations of (being manually entered) measured piece are imported, include: supply voltage, test content, requirement (judgement)
Index etc., system automatic collection imports or the data of typing.
System enters test item setting after the completion of data import, and there are three selections for this step:
1. booting default test option: reading the information on the product manual of importing, automatically generate test item, each test
Testing sequence between；
2. manual setting test item and testing sequence: the index self testing paid close attention to according to the application platform of crystal oscillator
Project, testing sequence.In this step, test macro had both supported each measured piece to establish independent test content, supported simultaneously
Establish batch testing content；The Index Content flexible choice that can be tested as needed when establishing a completely new test content is surveyed
Try Xiang Zucheng；In the completely new test content established automatically, it can delete the corresponding test item of index to be tested is not required to, together
Shi Yike adds test item；Each test content can be adjusted every testing sequence by actual demand；All test items
Mesh can be freely combined with testing sequence by actual requirement.
3. selecting test pattern: routine test or three warm (low temperature, room temperature, high temperature) tests.
Host computer and test special instrument carrying out shake communication, can be started by preset testing sequence item after completion two step of front
Test.It is integrated with the test subfunction of each test item in a test system, function after specifically having booting power consumption test subfunction, stablizing
Consumption test subfunction, output power test subfunction, harmonics restraint test subfunction, clutter recognition test subfunction, booting are special
Property test subfunction, frequency accuracy test subfunction, frequency reproducibility test subfunction, short-term stability test subfunction,
Phase noise tests subfunction, integral jitter test subfunction, ageing rate test subfunction, frequency-voltage regulation limits test
Subfunction, frequency-temperature stability test subfunction and reference voltage output test subfunction.In each single item test, directly
Connecing the corresponding test subfunction of calling can be completed this test.Survey after each pacing examination in the real-time collecting test instrument of system
Try data.
The data of acquisition are carried out classification analysis by system after all index tests are complete:
1. part index number directly can be compared simply and provide judgement conclusion；
2. part index number is needed by providing judgement conclusion after preset formula calculated result；
3. ageing rate test index is fitted expected index according to default calculation method (least square method) and provides judgement
Conclusion.
Above step all after the completion can be according to template generation test report.
By above-mentioned design, this system has Highgrade integration, intelligence, entry high efficiency concurrent testing, anti-signal
It is distorted the multiple advantages such as transmission, good Electro Magnetic Compatibility.In test, no replacement is required, and that test equipment can be achieved with is each to crystal oscillator
Comprehensive test of performance indicator.Therefore, compared with prior art, the present invention have substantive distinguishing features outstanding and significantly into
Step.
Above-described embodiment is only one of the preferred embodiment of the present invention, should not be taken to limit protection model of the invention
It encloses, as long as that in body design thought of the invention and mentally makes has no the change of essential meaning or polishing, is solved
The technical issues of it is still consistent with the present invention, should all be included within protection scope of the present invention.
Claims (6)
1. a kind of highly integrated test macro of crystal oscillator, which is characterized in that including controller, the control that is connected with controller
Plate, host computer, multichannel programmable power supply, bar code scanner and RF switch, the measured piece fixture being all connected with control panel and program-controlled
Digital avometer, while the short stabilization tester, spectrum measurement instrument, frequency test meter and the noise that connect host computer and RF switch are surveyed
Instrument, the man-machine interactive system communicated with host computer, and the thermocycling of placement control panel and measured piece fixture is tried to set
It is standby；Wherein, host computer is also connected with multichannel programmable power supply, digital spc avometer also with multichannel programmable power supply and host computer phase
Even.
2. the highly integrated test macro of crystal oscillator according to claim 1, which is characterized in that the man-machine interactive system
It is mainly made of man-machine interactive interface and measuring and calculation system interconnected, wherein man-machine interactive interface is realized
The operation control communicated with host computer.
3. the highly integrated test macro of crystal oscillator according to claim 2, which is characterized in that the quantity of the control panel
It is 6 pieces, every piece of control panel is equipped with the position of 8 general load measured piece fixtures.
4. the highly integrated test macro of crystal oscillator according to claim 3, which is characterized in that the measured piece fixture is set
There are the standard draw pin hole location docked with control panel and the jack position for encapsulating crystal oscillator.
5. the highly integrated test macro of crystal oscillator according to claim 4, which is characterized in that the RF switch uses
Relay-set.
6. the highly integrated test macro of crystal oscillator according to claim 5, which is characterized in that adopted when the system detection
It is transmitted with low frequency signal and square-wave signal, the crystal oscillator radiofrequency signal output of non-test state connects 50 Ω load.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201811563550.9A CN109752640A (en) | 2018-12-20 | 2018-12-20 | The highly integrated test macro of crystal oscillator |
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| CN201811563550.9A CN109752640A (en) | 2018-12-20 | 2018-12-20 | The highly integrated test macro of crystal oscillator |
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Family
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| CN201811563550.9A Pending CN109752640A (en) | 2018-12-20 | 2018-12-20 | The highly integrated test macro of crystal oscillator |
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Cited By (4)
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|---|---|---|---|---|
| CN111487500A (en) * | 2020-06-08 | 2020-08-04 | 上海航天测控通信研究所 | System and method for testing high-stability crystal oscillator of satellite-borne atomic clock |
| CN112649680A (en) * | 2020-12-25 | 2021-04-13 | 北京无线电计量测试研究所 | Dynamic phase noise test fixture for crystal oscillator |
| CN113904626A (en) * | 2021-11-24 | 2022-01-07 | 成都世源频控技术股份有限公司 | High-stability crystal oscillator circuit and implementation method |
| CN113899756A (en) * | 2021-09-09 | 2022-01-07 | 东风柳州汽车有限公司 | High-voltage wire harness grouping test method, device, equipment and storage medium |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111487500A (en) * | 2020-06-08 | 2020-08-04 | 上海航天测控通信研究所 | System and method for testing high-stability crystal oscillator of satellite-borne atomic clock |
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| CN113899756A (en) * | 2021-09-09 | 2022-01-07 | 东风柳州汽车有限公司 | High-voltage wire harness grouping test method, device, equipment and storage medium |
| CN113899756B (en) * | 2021-09-09 | 2024-03-22 | 东风柳州汽车有限公司 | High-voltage wire harness grouping test method, device, equipment and storage medium |
| CN113904626A (en) * | 2021-11-24 | 2022-01-07 | 成都世源频控技术股份有限公司 | High-stability crystal oscillator circuit and implementation method |
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Application publication date: 20190514 |