CN112649680B - Dynamic phase noise test fixture for crystal oscillator - Google Patents
Dynamic phase noise test fixture for crystal oscillator Download PDFInfo
- Publication number
- CN112649680B CN112649680B CN202011558279.7A CN202011558279A CN112649680B CN 112649680 B CN112649680 B CN 112649680B CN 202011558279 A CN202011558279 A CN 202011558279A CN 112649680 B CN112649680 B CN 112649680B
- Authority
- CN
- China
- Prior art keywords
- crystal oscillator
- test
- circuit board
- phase noise
- vibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention discloses a crystal oscillator dynamic phase noise test fixture, which comprises a shell and a vibration test circuit board arranged in the shell, wherein the shell is provided with a groove for mounting a tested crystal oscillator, the bottom of the groove is provided with a through hole communicated with a vibration measurement circuit board, the vibration test circuit board is fixedly provided with a jack for inserting pins on the tested crystal oscillator, the jack is internally provided with a contact pin fixedly connected with the pins on the tested crystal oscillator, and the vibration test circuit board is also connected with a power line and a test cable which extend out of the shell. According to the invention, the vibration test circuit board is added, the power line and the test cable are connected with the circuit board instead of being directly connected with the tested crystal oscillator, so that the connection is more stable and reliable, the noise interference caused by cable flexible connection is reduced, and the test reliability is improved.
Description
Technical Field
The invention belongs to the technical field of testing of crystal oscillators, and particularly relates to a dynamic phase noise testing clamp of a crystal oscillator.
Background
Because of its good frequency characteristics, crystal oscillators are often used as time frequency references and are widely used in systems such as communications, radars, navigation, guidance, and the like. In the processes of satellite launching, spacecraft in-orbit operation, missile air flight and the like, violent vibration often exists, the stability of the crystal oscillator is greatly reduced in a vibration environment, phase noise is seriously deteriorated, and the performance of a system is greatly influenced, so that more and more users put forward index requirements of dynamic phase noise of the crystal oscillator in a vibration state. In the ground simulation test, due to various influences such as environmental factors and other interferences, the real vibration phase noise performance index of the crystal oscillator cannot be obtained, so that how to more accurately and conveniently measure the vibration resistance of the crystal oscillator in the ground simulation test process becomes more important.
A block diagram of a dynamic phase noise performance test of a crystal oscillator under vibration conditions is shown in fig. 1. Because the phase noise of the crystal oscillator is extremely sensitive, the test is easy to generate large fluctuation due to the change of the installation and connection modes of the crystal oscillator and the movement of a power line, a test cable and the like, so that a large error exists in a dynamic phase noise test result.
The traditional test method mainly fixes the tested crystal oscillator through a test pressing bar and carries out index test through a test connecting line welded on a pin of the crystal oscillator. However, this method has a great limitation, and the influence of the product attached to the crystal oscillator itself, such as the test wiring, power line, etc., cannot be eliminated in the first test. Secondly, because the tested crystal oscillator may need to be debugged for many times, the tested product needs to be disassembled and assembled with the clamp every time, and the working efficiency is greatly influenced.
Disclosure of Invention
The invention aims to provide a dynamic phase noise test fixture of a crystal oscillator, which has small external interference and convenient and quick installation and can effectively monitor the phase noise index of the crystal oscillator in real time in a vibration environment, effectively improve the external interference resistance of the crystal oscillator during vibration, greatly improve the dynamic phase noise test accuracy of the crystal oscillator and avoid mechanical damage to a crystal oscillator shell without key points.
In order to achieve the purpose, the invention adopts the following technical scheme:
a crystal oscillator dynamic phase noise test fixture is characterized by comprising a shell and a vibration test circuit board arranged in the shell, wherein the shell is provided with a groove for mounting a tested crystal oscillator, the bottom of the groove is provided with a through hole communicated with the vibration measurement circuit board, the vibration test circuit board is fixedly provided with a jack for inserting pins on the tested crystal oscillator, the jack is internally provided with a contact pin fixedly connected with the pins on the tested crystal oscillator, and the vibration test circuit board is also connected with a power line and a test cable which extend out of the shell;
during testing, the tested crystal oscillator welded with the contact pin is installed in the groove of the shell, meanwhile, the contact pin is inserted into the jack of the test circuit board, the power line is connected with the power supply, the test cable is connected with the phase noise test instrument, and therefore phase noise performance testing of the crystal oscillator under the vibration condition is achieved.
Preferably, a pressing strip for fixing the tested crystal oscillator is arranged on the shell, and the pressing strip is arranged on the shell through a fastener.
Preferably, the grooves and the jacks are provided with a plurality of grooves and jacks which are arranged side by side, and the tested crystal oscillator in each row of grooves can be fixed in the grooves through a pressing strip.
Preferably, the casing comprises an upper cover and a base, the vibration test circuit board is clamped between the upper cover and the base, and the upper cover and the base are fastened through bolts.
Preferably, the groove is arranged on the upper cover, and the base is provided with a wire passing hole for a power line and a test cable to pass through.
Preferably, the bottom of the upper cover is provided with an upper cavity, the top of the base is provided with a lower cavity, the upper cavity and the lower cavity jointly form an accommodating cavity of the vibration test circuit board, and the area of the vibration test circuit board is larger than that of the accommodating cavity.
Preferably, the output SMA adapter is installed to test cable conductor one end, and the welding of output SMA adapter is in the relevant position of test circuit board, and the BNC who links to each other with phase noise test instrument is installed to the test cable conductor other end connects.
Preferably, a jig mounting hole is provided on the housing.
Compared with the existing vibration clamp, the invention has the following technical effects:
1. the invention provides a vibration clamp with strong anti-interference performance, which is characterized in that a vibration test circuit board is additionally arranged, a power line and a test cable are connected with the circuit board instead of being directly connected with a tested crystal oscillator, so that the connection is more stable and reliable, the noise interference caused by cable flexible connection is reduced, and the test reliability is improved.
2. According to the invention, the traditional vibration clamp is divided into the upper cover and the base, and the test circuit board is clamped between the vibration clamp, so that the crystal oscillator to be tested can still be directly and tightly connected with the vibration clamp instead of being connected with the circuit board without directly contacting the vibration clamp, the authenticity and the effectiveness of the vibration test are further improved, and meanwhile, the cable can be further fixed through the opening on the base of the vibration clamp, and the interference is reduced.
3. The tested crystal oscillator is not directly inserted into the crown spring jack, but is connected through the contact pin, so that the convenience of plugging and unplugging is ensured, and meanwhile, the abrasion to the plating of the pin of the crystal oscillator is effectively reduced.
Drawings
FIG. 1 is a front view of a crystal oscillator dynamic phase noise test fixture according to the present invention;
FIG. 2 is a top view of a crystal oscillator dynamic phase noise test fixture according to the present invention;
reference numerals:
1-a base, 2-a test circuit board, 3-an upper cover, 4-a threading hole of a power line, 5-a threading hole of a test cable, 6-a tested crystal oscillator, 7-a pressing strip, 8-a jack, 9-a contact pin of the tested crystal oscillator and 10-a fastener.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention.
Referring to fig. 1-2, a crystal oscillator dynamic phase noise test fixture comprises a shell and a vibration test circuit board 2 arranged in the shell, wherein a groove for mounting a tested crystal oscillator 6 is arranged on the shell, a through hole communicated with the vibration test circuit board 2 is arranged at the bottom of the groove, a jack 8 for inserting pins on the tested crystal oscillator is fixed on the vibration test circuit board, a contact pin fixedly connected with the pins on the tested crystal oscillator 6 is arranged in the jack 8, and a power line and a test cable extending out of the shell are also connected on the vibration test circuit board 2;
during testing, the tested crystal oscillator 6 welded with the contact pin is arranged in the groove of the shell, the contact pin is inserted into the jack of the test circuit board, the power line is connected with the power supply, the test cable is connected with the phase noise test instrument, so as to realize the phase noise performance test of the crystal oscillator under the vibration condition,
the shell is provided with a pressing strip 7 for fixing the tested crystal oscillator 6, the pressing strip 7 is installed on the shell through a fastener 10 such as a bolt, the grooves and the jacks 8 are provided with a plurality of grooves and jacks 8, the grooves and the jacks 8 are arranged side by side, the grooves and the jacks 8 are provided with two rows, and the tested crystal oscillator 6 in each row of grooves is fixed in the grooves through the pressing strip 7.
Output SMA adapter is installed to test cable conductor one end, and the welding of output SMA adapter is at the relevant position of test circuit board, and the BNC that links to each other with phase noise test instrument is installed to the test cable conductor other end connects.
The casing comprises upper cover 3 and base 1, is equipped with the upper chamber bottom the upper cover, and the base top is equipped with down the cavity, and the upper chamber has constituted the holding cavity of vibration test circuit board with cavity down jointly, and the area of vibration test circuit board is greater than the area of holding cavity, and vibration test circuit board 2 presss from both sides the dress between upper cover 3 and base 1, and upper cover 3 passes through the screw fastening with base 1, the recess is established on upper cover 3, is equipped with the line hole 4, 5 of crossing that supplies power cord and test cable conductor to pass on base 1.
The mounting mode of the test fixture is as follows:
placing the vibration test circuit board 2 between the base 1 and the upper cover 3, and fastening by screws; the tested crystal oscillator 6 is placed in the groove of the upper cover 3, and the upper part of the tested crystal oscillator is fixed through the pressing strip 7, so that the tested crystal oscillator 6 is tightly connected with the upper cover 3, and the effective transmission of vibration magnitude is ensured; a contact pin 9 is welded on a pin of the crystal oscillator 6 to be tested, and a crown spring jack 8 is arranged at a position, corresponding to the pin of the crystal oscillator, on the vibration test circuit board 2, so that the contact pin 9 can be completely inserted into the crown spring jack 8, and effective electrical connection is ensured; through wires hole 4, 5 on base 1 set up to circular trompil, and the power cord of being convenient for passes with the test cable conductor, can play certain fixed action, effectively reduces because the bending of cable, the test error of the dynamic phase noise that rocks etc. and bring. In addition, the test fixture is provided with a plurality of grooves and jacks, and can simultaneously complete the dynamic phase noise test work of a plurality of crystal oscillators.
According to the invention, the test circuit board 2 is additionally arranged above the vibration clamp, and the tested crystal oscillator 6 is arranged on the vibration test circuit board 2 through the crown spring jack 8, so that the vibration test circuit board is convenient to disassemble and assemble, and firm and stable in connection. Because the tested crystal oscillator 6 is not directly connected with the vibration clamp any more, but the vibration sensor is connected with the vibration clamp, the invention adopts the pressing strip 7 to ensure that the vibration magnitude transmitted to the tested crystal oscillator 6 is not changed because of introducing the vibration test circuit board 2. In addition, the pluggable connection mode easily damages the plating layer of the pin of the crystal oscillator, and the reliability is influenced.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (6)
1. The utility model provides a crystal oscillator developments phase noise test fixture which characterized in that: the test fixture comprises a shell and a vibration test circuit board arranged in the shell, wherein the shell is provided with a groove for mounting a tested crystal oscillator, the bottom of the groove is provided with a through hole communicated with the vibration measurement circuit board, the vibration test circuit board is fixedly provided with a jack for inserting pins on the tested crystal oscillator, the jack is internally provided with a contact pin fixedly connected with the pins on the tested crystal oscillator, and the vibration test circuit board is also connected with a power line and a test cable which extend out of the shell;
during testing, the tested crystal oscillator welded with the contact pin is arranged in the groove of the shell, meanwhile, the contact pin is inserted into the jack of the test circuit board, the power line is connected with the power supply, and the test cable is connected with the phase noise test instrument, so that the phase noise performance test of the crystal oscillator under the vibration condition is realized;
the shell consists of an upper cover and a base, and the vibration test circuit board is clamped between the upper cover and the base;
the groove is arranged on the upper cover, and the base is provided with a wire passing hole for a power wire and a test cable to pass through;
under the test state, the top surface of the tested crystal oscillator protrudes out of the notch of the groove.
2. The crystal oscillator dynamic phase noise test fixture of claim 1, wherein a bead for fixing the crystal oscillator to be tested is provided on the housing, and the bead is mounted on the housing by fasteners.
3. The crystal oscillator dynamic phase noise test fixture of claim 2, wherein the number of the grooves and the jacks are arranged, the number of the grooves and the jacks are arranged side by side, and the crystal oscillator to be tested in each row of the grooves is fixed in the grooves through the pressing strips.
4. The crystal oscillator dynamic phase noise test fixture of claim 1, wherein an output SMA adapter is mounted at one end of the test cable, the output SMA adapter is soldered at a corresponding position on the test circuit board, and a BNC connector connected to the phase noise test instrument is mounted at the other end of the test cable.
5. The clamp for testing dynamic phase noise of a crystal oscillator according to claim 1, wherein an upper cavity is formed at the bottom of the upper cover, a lower cavity is formed at the top of the base, the upper cavity and the lower cavity together form a receiving cavity for the vibration test circuit board, and the area of the vibration test circuit board is larger than that of the receiving cavity.
6. A crystal oscillator dynamic phase noise test fixture as claimed in claim 1, wherein fixture mounting holes are provided in said housing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011558279.7A CN112649680B (en) | 2020-12-25 | 2020-12-25 | Dynamic phase noise test fixture for crystal oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011558279.7A CN112649680B (en) | 2020-12-25 | 2020-12-25 | Dynamic phase noise test fixture for crystal oscillator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112649680A CN112649680A (en) | 2021-04-13 |
| CN112649680B true CN112649680B (en) | 2023-03-21 |
Family
ID=75363050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011558279.7A Active CN112649680B (en) | 2020-12-25 | 2020-12-25 | Dynamic phase noise test fixture for crystal oscillator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112649680B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113252264B (en) * | 2021-04-27 | 2023-09-29 | 广州市兴森电子有限公司 | Test fixture |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5786735A (en) * | 1997-02-27 | 1998-07-28 | The United States Of America As Represented By The Secretary Of The Army | Phase and magnitude compensated tuning for suppression of vibration induced phase noise of crystal oscillator with varying vibration frequencies |
| CN103594442A (en) * | 2012-08-16 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | Chip |
| CN203479844U (en) * | 2013-09-30 | 2014-03-12 | 贵州航天计量测试技术研究所 | High-frequency crystal oscillator phase noise test clamp |
| CN105572429A (en) * | 2015-12-22 | 2016-05-11 | 北京无线电计量测试研究所 | Crystal oscillator fixing device and monitoring system |
| CN107860463A (en) * | 2017-09-25 | 2018-03-30 | 北京无线电计量测试研究所 | A kind of crystal oscillator phase noise vibration monitoring device and method |
| CN109752640A (en) * | 2018-12-20 | 2019-05-14 | 成都世源频控技术股份有限公司 | The highly integrated test macro of crystal oscillator |
| CN110907712A (en) * | 2019-12-23 | 2020-03-24 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN110954757A (en) * | 2019-12-26 | 2020-04-03 | 北京无线电计量测试研究所 | Crystal oscillator testing device and testing method |
-
2020
- 2020-12-25 CN CN202011558279.7A patent/CN112649680B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5786735A (en) * | 1997-02-27 | 1998-07-28 | The United States Of America As Represented By The Secretary Of The Army | Phase and magnitude compensated tuning for suppression of vibration induced phase noise of crystal oscillator with varying vibration frequencies |
| CN103594442A (en) * | 2012-08-16 | 2014-02-19 | 鸿富锦精密工业（深圳）有限公司 | Chip |
| CN203479844U (en) * | 2013-09-30 | 2014-03-12 | 贵州航天计量测试技术研究所 | High-frequency crystal oscillator phase noise test clamp |
| CN105572429A (en) * | 2015-12-22 | 2016-05-11 | 北京无线电计量测试研究所 | Crystal oscillator fixing device and monitoring system |
| CN107860463A (en) * | 2017-09-25 | 2018-03-30 | 北京无线电计量测试研究所 | A kind of crystal oscillator phase noise vibration monitoring device and method |
| CN109752640A (en) * | 2018-12-20 | 2019-05-14 | 成都世源频控技术股份有限公司 | The highly integrated test macro of crystal oscillator |
| CN110907712A (en) * | 2019-12-23 | 2020-03-24 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN110954757A (en) * | 2019-12-26 | 2020-04-03 | 北京无线电计量测试研究所 | Crystal oscillator testing device and testing method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112649680A (en) | 2021-04-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7714569B2 (en) | Adaptor for electrical connector | |
| CN112649680B (en) | Dynamic phase noise test fixture for crystal oscillator | |
| CN104422863A (en) | Semiconductor test device | |
| CN212083558U (en) | Crystal oscillator testing device | |
| US6420885B1 (en) | System and apparatus for low-temperature semiconductor device testing | |
| CN206945746U (en) | Integrated chip test bench and integrated chip test module | |
| CN110954757A (en) | Crystal oscillator testing device and testing method | |
| TWI495885B (en) | Semiconductor test device | |
| US20100194419A1 (en) | Multi-contact probe assembly | |
| CN113252264A (en) | Test tool | |
| CN209803283U (en) | Vertical probe card with high simultaneous measurement number | |
| CN111426860A (en) | Multi-type T/R component micro-strip plate batch test interconnection device | |
| CN216485297U (en) | Portable quality testing device for wire detection | |
| CN218975982U (en) | LCD display screen debugging rotating plate | |
| CN219978412U (en) | Antenna detection jig and antenna detection equipment | |
| CN220855089U (en) | Jig tool | |
| CN216310279U (en) | Anti-loss device for carrying marine equipment | |
| CN217543198U (en) | Probe assembly | |
| CN216595198U (en) | FPC data transmission line test positioning jig | |
| CN219087095U (en) | Low noise type crystal oscillator damping device | |
| CN219036550U (en) | Lamp panel | |
| CN220455375U (en) | Spring plate test seat | |
| CN217181175U (en) | Withstand voltage test tool for microwave radio frequency ferrite device | |
| CN218216012U (en) | Floating high low frequency of multicore loads in mixture integrated form rectangle electric connector | |
| CN211627629U (en) | Extension type input seat |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |