CN217521290U - Optical module test system - Google Patents

Abstract

The application provides an optical module test system, includes: the test board comprises a first test board, a second test board and a third test board, wherein one side of the first test board is provided with a notch, a connecting socket is arranged at the edge close to the notch, and the other side of the first test board is used for connecting a test wire; the second test board is arranged in the gap, one end of the second test board is provided with a connecting joint, the connecting joint is electrically connected with the connecting socket, and the top of the second test board is provided with an optical module connecting seat which is used for electrically connecting an optical module to be tested; the limiting mechanism is arranged above the second test board and used for mounting and limiting the optical module to be tested; the grounding mechanism is arranged on the limiting mechanism and contacts the shell of the optical module to be tested; and the supporting mechanism is arranged at the other end of the second test board and used for supporting the optical module to be tested. According to the optical module testing system, the second testing board corresponding to the optical module to be tested is replaced, so that the optical module testing system is suitable for testing optical modules of different specifications, and further, the optical modules of different specifications can be conveniently tested.

Description

Optical module test system

Technical Field

The application relates to the technical field of optical module testing, in particular to an optical module testing system.

Background

With the development of new services and application modes such as cloud computing, mobile internet, video and the like, the development and progress of the optical communication technology become increasingly important. In the optical communication technology, an optical module is a tool for realizing the interconversion of optical signals and is one of the key devices in optical communication equipment.

In the optical module generating process, testing is an important link of optical module production. Generally, tests to be performed on different optical modules such as models and packages are different, and therefore, the test board needs to be replaced when different optical modules such as models and packages are tested. When the test board is replaced, the high-frequency cable, the power line, the communication line and the like connected to the original test board need to be removed, and the high-frequency cable, the power line, the communication line and the like are connected to a new test board, so that the optical module test is complicated.

SUMMERY OF THE UTILITY MODEL

The embodiment of the application provides an optical module testing system which is convenient for testing optical modules with different specifications.

The application provides an optical module test system, includes:

a first test board, one side of which is provided with a notch, the edge close to the notch is provided with a connecting socket, and the other side of which is used for connecting a test wire;

the second test board is arranged in the gap, one end of the second test board is provided with a connecting joint, the connecting joint is electrically connected with the connecting socket, and the top of the second test board is provided with an optical module connecting seat which is used for electrically connecting an optical module to be tested;

the limiting mechanism is arranged above the second test board and used for limiting the installation of the optical module to be tested;

the grounding mechanism is arranged on the limiting mechanism and contacts the shell of the optical module to be tested;

and the supporting mechanism is arranged at the other end of the second test board and used for supporting the optical module to be tested.

In the optical module test system provided by the application, one side of a first test board is provided with a notch, the edge of the notch is provided with a connecting socket, and the other side of the notch is used for connecting a test wire; the second test board is arranged in the gap, one end of the second test board is provided with a connecting joint, and the second test board is connected with a connecting socket on the first test board through the connecting joint; the top of the second test board is provided with a connecting seat which is used for electrically connecting the optical module to be tested. According to the optical module testing system, different second testing boards correspond to optical modules to be tested with different specifications, the second testing board corresponding to the optical modules to be tested is replaced to enable the optical module testing system to be suitable for testing the optical modules with different specifications, and the second testing board is electrically connected with the connecting socket on the first testing board through the connecting joint, so that the second testing board can be replaced conveniently. Therefore, the optical module testing system provided by the application can conveniently test optical modules with different specifications.

Drawings

In order to more clearly illustrate the technical solutions of the present disclosure, the drawings required to be used in some embodiments of the present disclosure will be briefly described below, and it is apparent that the drawings in the following description are only drawings of some embodiments of the present disclosure, and other drawings can be obtained by those skilled in the art according to these drawings. Furthermore, the drawings in the following description may be regarded as schematic diagrams, and do not limit the actual size of products, the actual flow of methods, the actual timing of signals, and the like, involved in the embodiments of the present disclosure.

Fig. 1 is a first perspective view of a light module testing system according to some embodiments;

FIG. 2 is a second perspective view of a light module testing system according to some embodiments;

FIG. 3 is an exploded schematic view of a light module testing system according to some embodiments;

FIG. 4 is a schematic diagram of a first test board according to some embodiments;

FIG. 5 is a schematic diagram of a second test board according to some embodiments;

FIG. 6 is a schematic view of a first test board and a second test board according to some embodiments after assembly;

FIG. 7 is a schematic view of a first test plate and support mechanism assembled on a support base according to some embodiments;

FIG. 8 is a schematic view of an assembly of a first test plate, a second test plate and a supporting mechanism on a supporting base according to some embodiments;

FIG. 9 is a schematic view of an assembly structure of a positioning mechanism and a grounding mechanism according to some embodiments;

FIG. 10 is a schematic view of a positioning block according to some embodiments;

fig. 11 is a first exploded view of a spacing mechanism according to some embodiments;

fig. 12 is a second exploded view of a spacing mechanism according to some embodiments;

FIG. 13 is a schematic view of an assembly structure of a position-limiting mechanism and a second test board according to some embodiments;

FIG. 14 is a schematic view of another positioning block provided in accordance with some embodiments;

fig. 15 is a state diagram of another positioning block according to some embodiments.

Detailed Description

Technical solutions in some embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are only a part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided by the present disclosure belong to the protection scope of the present disclosure.

Fig. 1 is a first perspective view of an optical module testing system according to some embodiments, fig. 2 is a second perspective view of an optical module testing system according to some embodiments, and fig. 3 is an exploded schematic view of an optical module testing system according to some embodiments. As shown in fig. 1 to 3, an optical module testing system provided in the embodiment of the present application includes: the supporting base 100, the first testing board 200, the second testing board 300, the mechanism 400, the grounding mechanism 500 and the supporting mechanism 600.

The supporting base 100 is used for supporting the first testing board 200, the second testing board 300, the limiting mechanism 400, the grounding mechanism 500 and the supporting mechanism 600, so as to facilitate the assembly of the optical module testing system. In some embodiments of the present application, the supporting base 100 is made of aluminum alloy, stainless steel, or the like, so as to ensure the supporting stability of the supporting base 100, reduce the deformation in the later use process, and effectively prevent static electricity, so as to ensure the testing stability of the optical module testing system. Illustratively, the supporting base 100 is provided with a plurality of supporting columns for supporting the first testing board 200, the second testing board 300, etc., for example, the supporting columns of the first testing board support and connect with the first testing board 200, the supporting columns of the second testing board support and connect with the second testing board 300, the supporting columns of the supporting mechanism support and connect with the supporting mechanism 600, etc.

The first test board 200 is a base and a core of the optical module test system, and the outer edge of the first test board is connected with a test line and connected with corresponding test equipment through the test line. In the embodiment of the present application, the first test board 200 mainly includes a circuit board, traces disposed on the circuit board, and connectors connected to the traces, such as SMA connectors, for facilitating the connection of the first test board 200 to the test wires. As shown in FIG. 3, a notch 210 is formed on one side of the first test board 200, and a connection socket 220 is formed on the edge of the notch 210. A notch 210 for mounting a second test board 300, the notch 210 being configured to mount the second test board 300; the connection socket 220 is used for connecting the second test board 300, and the connection socket 220 is further connected to the trace on the first test board 200, so as to facilitate the connection between the second test board 300 and the connection line. In the embodiment of the present application, the first test board 200 integrates all signals required by the optical modules to be tested with various specifications, and distributes corresponding signals through a coordinated design, so that the test cables on the first test board 200 do not need to be changed when the test cables are applied to the optical modules to be tested with various specifications.

The second test board 300 is another core component of the optical module test system, and is used for corresponding to an optical module to be tested of a certain specification; when the optical module testing system is used for testing optical module testing systems with different specifications, the second testing board 300 can be replaced quickly. Specifically, the method comprises the following steps: the second test board 300 is provided with a connection plug 310 and an optical module connection socket 320, the connection plug 310 is used for connecting the connection socket 220, and the optical module connection socket 320 is used for electrically connecting an optical module to be tested. In the embodiment of the present application, gold fingers are disposed on the surface of the connection terminal 310, and the connection terminal 310 is inserted into the connection socket 220, and the connection socket 220 is electrically connected through the gold fingers on the connection terminal 310. The connection terminals 310 are connected to the first test board 200 by inserting the connection sockets 220, so that the second test board 300 can be easily connected to and disconnected from the first test board 200.

The limiting mechanism 400 is disposed above the second test board 300 and used for limiting the installation of the optical module to be tested, so that the optical module to be tested can be conveniently assembled on the second test board 300. In an embodiment of the present application, the position-limiting mechanism 400 can be disposed on the second testing board 300, or can be fixedly connected to the supporting posts on the supporting base 100 through the second testing board 300.

The grounding mechanism 500 is disposed on the limiting mechanism 400 and is used for contacting a housing of the optical module to be tested to perform grounding processing on the housing of the optical module to be tested, so as to ensure testing stability of the optical module to be tested. In some embodiments, the grounding mechanism 500 includes a grounding probe 510, the grounding probe 510 is used for contacting a housing of the optical module to be tested, and the grounding probe 510 is electrically connected to the ground terminal of the first testing board 200 to realize grounding of the grounding probe 510.

The supporting mechanism 600 is disposed at the other end of the second testing board 300 for assisting the second testing board 300 to support the optical module to be tested. In some embodiments, the support base 100 supports the edge of the connection support mechanism 600 through the support column, so as to effectively avoid the support base 100 supporting the connection support mechanism 600 from interfering with the support mechanism 600 supporting the optical module to be tested.

In the embodiment of the present application, different second test boards 300 are used for corresponding to different specifications of optical modules to be tested, and when the optical module testing system is used for testing optical modules of different specifications, the second test board 300 can be directly replaced to correspond to a corresponding optical module to be tested, so that the optical module testing system does not need to be integrally replaced, and time consumed for replacing the optical module testing system to reconnect a test line is saved. In the optical module testing system provided by the application, the second testing board 300 is connected with the connecting socket 220 on the first testing board 200 through the connecting joint 310, so that the second testing board 300 and the first testing board 200 can be conveniently connected and plugged, and further the second testing board 300 can be conveniently replaced, so that the optical module testing system is more suitable for testing optical modules to be tested with different specifications.

For example, as shown in fig. 3, the support base 100 is a square support base, but is not limited to a square, and may be selected according to the arrangement position thereof. A plurality of supporting columns are disposed on the top surface of the supporting base 100, such as a first testing board supporting column 110, a second testing board supporting column 120, a supporting mechanism supporting column 130, etc., wherein the first testing board supporting column 110 is used for fixedly supporting the first testing board 200, the second testing board supporting column 120 is used for fixedly supporting the second testing board 300, and the supporting mechanism supporting column 130 is used for fixedly supporting the supporting mechanism 600. The positions, heights, and number of the first test board support columns 110, the second test board support columns 120, the support mechanism support columns 130, and the like may be selectively arranged in combination with the shapes, area sizes, and the like of the first test board 200, the second test board 300, and the support mechanism 600. The first test plate 200, the second test plate 300, the support mechanism 600, and the like may be connected to the corresponding support posts by screws or the like. In some embodiments of the present application, the area of the first test board 200 is relatively large, and a relatively large number of support posts are generally used.

Fig. 4 is a schematic structural view of a first test board according to some embodiments, and fig. 5 is a schematic structural view of a second test board according to some embodiments. As shown in FIG. 4, in some embodiments, a notch 210 is formed on one side of the first test board 200 to form a concave structure, and a connection socket 220 is formed on the edge of the notch 210. As shown in fig. 5, in some embodiments, the second test board 300 has a "convex" structure, and the connection joints 310 are located at the tips of the "convex" structure of the second test board 300, so as to facilitate the insertion of the connection joints 310 into the sockets 220, thereby facilitating the assembly and disassembly of the second test board 300 and the first test board 200.

As shown in fig. 4, a plurality of through holes 230 are disposed on the first test board 200, the positions of the through holes 230 on the first test board 200 correspond to the positions of the first test board support pillars 110 disposed on the support base 100, and screws pass through the through holes 230 to connect the first test board support pillars 110, so as to fix the first test board 200 on the support base 100. In some embodiments, the peripheral edge of the first test board 200 is provided with a plurality of SMA joints, one end of each SMA joint is connected to the connection socket 220 through a circuit trace arranged on the first test board 200, and the other end of each SMA joint is used for connecting a test line. The silk screen printing that is used for sign SMA to connect is set up on the surface of first test panel 200, and the staff of being convenient for discerns SMA and connects the line for SMA and conveniently, and then makes things convenient for the optical module to test. In some embodiments, a memory chip or the like is disposed on the second test board 300; the memory chip is used for recording the board number of the second test board 300, the model of the corresponding optical module to be tested, the service life of the optical module connecting seat, the qualified date of the second test board 300 and the like.

As shown in fig. 5, the second test board 300 is provided with an optical module connecting socket 320, and the optical module connecting socket 320 is used for inserting an optical module to be tested, so as to connect the optical module circuit board with the optical module connecting socket 320, and further electrically connect the optical module to be tested with the second test board 300.

Fig. 6 is a schematic structural diagram of an assembled first test board and second test board according to some embodiments. As shown in FIG. 6, in some embodiments of the present invention, the second test board 300 is disposed in the notch 210 of the first test board 200, and the connection terminals 310 of the male end of the second test board 300 are inserted into the connection sockets 220. The first test board 200 having the concave structure and the second test board 300 having the convex structure are matched to control the overall dimension of the first test board 200 and the second test board 300 after assembly, as shown in fig. 5, the outer edges of the first test board 200 and the second test board 300 are formed into a regular rectangular structure after assembly. In some embodiments of the present application, the mounting height of the second testing board 300 is higher than that of the first testing board 200, that is, the distance from the top surface of the second testing board 300 to the top surface of the supporting base 100 is greater than the distance from the top surface of the first testing board 200 to the top surface of the supporting base 100, so as to facilitate the insertion of the connecting plug 310 into the connecting socket 220, thereby facilitating the assembly and disassembly of the second testing board 300 and the first testing board 200.

FIG. 7 is a schematic view of a first test board and a supporting mechanism assembled on a supporting base according to some embodiments. As shown in fig. 7, the first test board support column 110 is used to fixedly support the first test board 200, and the support mechanism support column 130 is used to fixedly support the support mechanism 600. The supporting mechanism 600 is located outside the notch 210 of the first testing board 200 to assist the second testing board 300 in supporting the optical module to be tested, so as to ensure the stability of the optical module to be tested during testing.

In some embodiments of the present application, the supporting mechanism 600 includes a supporting plate 610, the supporting plate 610 is used to support an optical module to be tested, and an edge of the supporting plate 610 is connected to the supporting mechanism supporting column 130. Illustratively, the edge of the support plate 610 is provided with a through hole corresponding to the support mechanism support column 130, and the corresponding support mechanism support column 130 is connected by a screw passing through the through hole. In some examples, a plurality of supporting planes 620 are disposed on the top of the supporting plate 610, the supporting planes 620 are located at different heights of the top of the supporting plate 610, and then the supporting planes 620 form a plurality of steps on the top of the supporting plate 610, so as to conveniently support optical modules to be tested with different specifications, and effectively save replacement of the supporting plate 610 when testing the optical modules to be tested with different specifications.

FIG. 8 is a schematic view of a first test board, a second test board and a supporting mechanism assembled on a supporting base according to some embodiments. As shown in fig. 8, a plurality of second fixing holes 330 are disposed on the second test board 300, the positions of the second fixing holes 330 on the second test board 300 correspond to the positions of the second test board support columns 120 disposed on the support base 100, and screws pass through the second fixing holes 330 and connect the second test board support columns 120 to fix the second test board 300 on the support base 100.

As shown in fig. 8, in some embodiments, the height of the support plane 620 at the end of the support plate 610 is lower than the height of the support plane 620 away from the end of the support plate 610. Therefore, the supporting plate 610 can support optical modules to be tested with different specifications through different supporting planes.

In some embodiments, one end of the supporting plate 610 is aligned with the other end of the second testing plate 300, and the supporting plane 620 with the lowest position on the top of the supporting plate 610 is at the same height as the top surface of the second testing plate 300, i.e., the distance from the supporting plane 620 with the lowest position on the top of the supporting plate 610 to the top surface of the supporting base 100 is equal to the distance from the top surface of the second testing plate 300 to the top surface of the supporting base 100.

Fig. 9 is a schematic view of an assembly structure of a positioning mechanism and a grounding mechanism according to some embodiments. In some embodiments, as shown in fig. 9, the spacing mechanism 400 includes a spacing block 410 and a spacing beam 430, the spacing beam 430 being disposed above the spacing block 410. The limiting block 410 is provided with an accommodating notch 420, one end of the accommodating notch 420 extends to the edge of the limiting block 410 close to the supporting mechanism 600, if the other end of the accommodating notch 420 extends to the edge of the limiting block 410 close to the supporting plate 610, the accommodating notch 420 is used for accommodating and setting an optical module to be tested, and then the optical module to be tested is limited in the left-right direction, so that the optical module to be tested is in butt joint with the optical module connecting base 320. The limiting beam 430 spans above the accommodating gap 420, and the limiting beam 430 is used for combining with the second test board 300 to position the optical module to be tested in the up-down direction, so that the optical module to be tested is further conveniently butted with the optical module connecting seat 320.

One end of the limiting block 410 is provided with a positioning groove 450, and the positioning groove 450 is communicated with the accommodating notch 420; the grounding probe 510 is disposed in the positioning groove 450 in a penetrating manner, and the other end of the grounding probe extends into the receiving notch 420 for contacting with a housing of an optical module to be tested. In some embodiments, the ground probe 510 has one end electrically connected to the ground terminal of the first test board 200 and the other end for contacting the housing of the optical module to be tested. In some embodiments, the overall diameter of the ground probe 510 is not uniform, such that the width of the positioning groove 450 is not uniform throughout to fit the ground probe 510 and facilitate the fixing of the ground probe 510.

In some embodiments, the limiting mechanism 400 further includes a fixing block 440, the fixing block 440 is disposed at one end of the limiting block 410 and covers the positioning groove 450, and the fixing block 440 can facilitate the fixing of the grounding probe 510 in the positioning groove 450, so as to ensure the fixing firmness of the positioning groove 450 in the positioning groove 450. In some embodiments, the fixing block 440 is coupled to the limiting block 410 by screws such as quick screws.

Fig. 10 is a schematic structural diagram of a positioning block according to some embodiments. As shown in fig. 10, in some embodiments, the limiting block 410 includes a first limiting portion 411 and a second limiting portion 412, an accommodating gap 420 is formed between the first limiting portion 411 and the second limiting portion 412, the first limiting portion 411 is located at one side of the accommodating gap 420, and the second limiting portion 412 is located at the other side of the accommodating gap 420. In some embodiments, one end of the first position-limiting portion 411 is connected to one end of the second position-limiting portion 412, a first guiding surface 4111 is disposed on one side of the other end of the first position-limiting portion 411, which is close to the accommodating notch 420, and the first guiding surface 4111 extends toward a direction in which the first position-limiting portion 411 is away from the second position-limiting portion 412; a second guiding surface 4121 is disposed at the other end of the second limiting portion 412 near the receiving notch 420, and the second guiding surface 4121 extends toward the direction in which the second limiting portion 412 is far away from the first limiting portion 411. In this way, the first lead-in surface 4111 and the second lead-in surface 4121 can widen the receiving notch 420 at the other end of the stopper 410, so that the optical module to be tested can be fitted into the receiving notch 420.

In some embodiments of the present application, the first lead-in surface 4111 is connected to the end surface of the other end of the first limiting portion 411 through an arc chamfer, and the second lead-in surface 4121 is connected to the end surface of the other end of the second limiting portion 412 through an arc chamfer, so that the occurrence of scratch and rubbing on the optical module to be tested when the optical module to be tested is installed in the accommodating notch 420 can be reduced, and the optical module to be tested is effectively protected.

In some embodiments of the present application, the limiting block 410 is provided with a plurality of first fixing holes 413, and the limiting block 410 is connected to the second testing board 300 or the supporting posts on the supporting base 100 through the holes 413. Illustratively, the first and second position-limiting portions 411 and 412 are respectively provided with a plurality of first fixing through holes 413.

Fig. 11 is a first exploded view of a position limiting mechanism according to some embodiments, and fig. 12 is a second exploded view of a position limiting mechanism according to some embodiments. As shown in fig. 11 and 12, one end of the limiting beam 430 is connected to the first limiting portion 411 through the first fixing through hole 413 by a screw, and the other end is connected to the second limiting portion 412 through the first fixing through hole 413 by a screw, so that the limiting beam 430 spans over the accommodating notch 420.

The fixing block 440 is disposed on the top of one end of the stopper 410, and may be coupled to the stopper 410 by a plurality of screws to fix the ground probe 510 in the positioning groove 450. In some embodiments, one end of the limiting block 410 is also provided with a plurality of first fixing through holes 413 and a plurality of first fixing holes 414, the fixing block 440 is provided with a plurality of third fixing through holes 441, and the fixing block 440 and the limiting block 410 are connected by passing screws through the third fixing through holes 441 and the corresponding first fixing through holes 413 or through the third fixing through holes 441 and the corresponding first fixing holes 414. Illustratively, the fixing block 440 is of a U-shaped structure disposed in an inclined manner, so that the fixing block 440 can be held conveniently during assembly; the first fastening hole 414 is a blind hole, and a relatively short screw may be used to connect the fastening block 440 and the limiting block 410.

In some embodiments, the first fixing through hole 413 of the limiting block 410 is coaxial with the second fixing through hole 330 at the corresponding position on the second testing board 300, and the screw sequentially passes through the coaxial first fixing through hole 413 and the second fixing through hole 330 to connect with the second testing board supporting column 120, thereby fixing the limiting block 410 and the second testing board 300 on the supporting base 100. Fig. 13 is a schematic view illustrating an assembly structure of a position-limiting mechanism and a second test board according to some embodiments. As shown in fig. 13, the optical module connecting socket 320 is located in the accommodating notch 420, and the quick-screwing screw 140 sequentially passes through the first fixing through hole 413 and the second fixing through hole 330 to connect with the second testing board supporting pillar 120. The quick-screwing screws 140 facilitate the mounting and dismounting of the second test board 300; such as: when the second test board 300 needs to be replaced, the second test board 300 mounted on the optical module test system can be detached by unscrewing the quick-screwing screw 140 and pulling out the connecting joint 310 from the connecting socket 220; the connection plug 310 is inserted into the connection socket 220, and the second test board 300 is assembled in the optical module test system by screwing the quick-screwing screw 140.

Fig. 14 is a schematic structural diagram of another positioning block according to some embodiments. Compared to the positioning block shown in fig. 10, the lengths of the first limiting portion 411 and the second limiting portion 412 in the limiting block 410 shown in fig. 14 are slightly longer, and the lengths of the first guiding surface 4111 and the second guiding surface 4121 are relatively longer.

Fig. 15 is a state diagram of another positioning block according to some embodiments. As shown in fig. 15, the other ends of the first position-limiting portion 411 and the second position-limiting portion 412 are located above the supporting plate 610 and extend to the end of the other end of the supporting plate 610, so as to more effectively limit the optical module to be tested when the optical module to be tested is inserted into the optical module connecting base 320.

As shown in fig. 15, the fixing block 440 in this embodiment is long, a plurality of third fixing through holes 441 are disposed on the fixing block 440 side by side, a plurality of first fixing holes 414 are disposed at one end of the corresponding limiting block 410 side by side, and the fixing block 440 is fixed on the limiting block 410 by passing screws through the third fixing through holes 441 to connect the first fixing holes 414.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.

Claims (10)

1. An optical module testing system, comprising:

the test board comprises a first test board, a second test board and a third test board, wherein one side of the first test board is provided with a notch, a connecting socket is arranged at the edge close to the notch, and the other side of the first test board is used for connecting a test wire;

the second test board is arranged in the gap, one end of the second test board is provided with a connecting joint, the connecting joint is electrically connected with the connecting socket, and the top of the second test board is provided with an optical module connecting seat which is used for electrically connecting an optical module to be tested;

the limiting mechanism is arranged above the second test board and used for mounting and limiting the optical module to be tested;

the grounding mechanism is arranged on the limiting mechanism and contacts the shell of the optical module to be tested;

and the supporting mechanism is arranged at the other end of the second test board and used for supporting the optical module to be tested.

2. The optical module testing system of claim 1, wherein the limiting mechanism comprises a limiting block and a limiting beam, an accommodating notch is formed in the limiting block, one end of the accommodating notch extends to the edge of the limiting block close to the supporting mechanism, and the limiting beam is located above the accommodating notch; the limiting block is connected with the second test board, and the optical module connecting seat is located in the accommodating notch.

3. The optical module testing system of claim 2, wherein a positioning groove is formed at one end of the limiting block, and the positioning groove communicates with an edge of the limiting block away from the supporting mechanism and the accommodating notch;

the grounding mechanism comprises a grounding probe, the grounding probe penetrates through the positioning groove, one end of the grounding probe is electrically connected with the grounding end of the first test board, and the other end of the grounding probe is used for contacting a shell of an optical module to be tested.

4. The optical module testing system according to claim 2, wherein the stopper includes a first stopper portion and a second stopper portion, the first stopper portion is disposed on one side of the accommodating notch, the second stopper portion is disposed on the other side of the accommodating notch, and one end of the first stopper portion is connected to one end of the second stopper portion;

a first leading-in surface is arranged on one side, close to the accommodating notch, of the other end of the first limiting part, and the first leading-in surface is connected with the other end of the first limiting part through an arc chamfer; and a second leading-in surface is arranged on one side, close to the accommodating notch, of the other end of the second limiting part, and the second leading-in surface is connected with the other end of the second limiting part through an arc chamfer.

5. The optical module testing system of claim 1, further comprising a support base supporting and connecting the first testing board, the second testing board and a support mechanism;

the second is surveyed the board and is "protruding" style of calligraphy, connector is located the second is surveyed board "protruding" style of calligraphy structure point end, connector's surface sets up the golden finger, connector inserts connect socket, pass through the golden finger electricity is connected connect socket.

6. The optical module testing system of claim 1, wherein the supporting mechanism comprises a supporting plate, a plurality of supporting planes are disposed on the top of the supporting plate, the supporting planes are located at different heights on the top of the supporting plate, and the supporting planes are used for supporting the optical module to be tested.

7. The optical module testing system of claim 3, wherein the limiting mechanism further comprises a fixing block, and the fixing block is connected to one end of the limiting block and covers the positioning groove.

8. The optical module testing system of claim 5, wherein a second testing board supporting column is disposed above the supporting base, a first fixing through hole is disposed on the limiting mechanism, a second fixing through hole coaxial with the first fixing through hole is disposed on the second testing board, and a quick-screwing screw sequentially penetrates through the first fixing through hole and the second fixing through hole to connect with the second testing board supporting column.

9. The optical module testing system of claim 5, wherein a first test board support column and a support mechanism support column are disposed above the support base; the first test board support column is connected with the first test board support column through a screw, and the edge of the support mechanism is connected with the support mechanism support column through a screw;

and/or the supporting base is an aluminum alloy supporting base.

10. The optical module testing system according to claim 1, wherein a plurality of SMA connectors are disposed on a peripheral edge of the first testing board, one end of each SMA connector is connected to the connection socket through a circuit trace disposed on the first testing board, and the other end of each SMA connector is used for connecting a testing line; a silk screen used for marking the SMA connector is arranged on the surface of the first test plate;

and the second test board is provided with a memory chip, and the memory chip is used for recording the board number of the second test board, the model of the corresponding to-be-tested optical module and the service life of the optical module connecting seat.

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