CN203479844U - High-frequency crystal oscillator phase noise test clamp - Google Patents
High-frequency crystal oscillator phase noise test clamp Download PDFInfo
- Publication number
- CN203479844U CN203479844U CN201320612545.9U CN201320612545U CN203479844U CN 203479844 U CN203479844 U CN 203479844U CN 201320612545 U CN201320612545 U CN 201320612545U CN 203479844 U CN203479844 U CN 203479844U
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- CN
- China
- Prior art keywords
- crystal oscillator
- circuit board
- phase noise
- printed circuit
- power input
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Oscillators With Electromechanical Resonators (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
The utility model discloses a high-frequency crystal oscillator phase noise test clamp which comprises a shielding chamber (2). A printed circuit board (5) is arranged in the shielding chamber (2). A shielding chamber cover board (1) covers the top of the shielding chamber (2). Pin insertion tubes (6) are fixed on the printed circuit board (5). Two random sides of the shielding chamber (2) are respectively provided with an output joint (3) and a power input terminal (4). The output joint (3) is electrically connected with the printed circuit board (5). The power input terminal (4) is connected with a power input port of the printed circuit board (5). The pin insertion tubes (6) are electrically connected with the printed circuit board (5). The high-frequency crystal oscillator phase noise test clamp settles the following problems in routine phase noise test method of the crystal oscillator: low interference resistance, large measurement error, low reliability of the test result, etc., wherein the problems are caused by direct connection between a power lead to the power input end of the crystal oscillator or test by a simply manufactured bared circuit board.
Description
Technical field
The utility model belongs to electronic devices and components technical field of measurement and test, relates in particular to a kind of high frequency crystal oscillator phase noise test fixture.
Background technology
Highly stable crystal oscillator phase noise test process is completed jointly by tested highly stable crystal oscillator, test fixture, high-precision phase noise measuring system and power supply, in the test of highly stable crystal oscillator phase noise, use test fixture is parts in test process, its Main Function is to provide required power input interface and signal output test interface to highly stable crystal oscillator, also has its fixation simultaneously.The quality of test fixture design has very large impact to highly stable crystal oscillator phase noise test result; Development along with electronic devices and components, instrument and equipment measuring technology, accuracy requirement to test parameter result is more and more higher, thereby not only to consider that test fixture provides the effect of interface and fixed position, and it is also more and more higher whether test fixture is affected to the true and reliable requirement of test result, test fixture should have effect convenient to use simultaneously, could meet the job requirement of high production capacity now; Direct power input or the easy exposed circuit board of making from power supply lead wire to crystal oscillator of phase noise test of conventional crystal oscillator tested.The today improving constantly in the phase noise index of crystal oscillator, test in the past must bring larger error, and the reliability of test result is reduced.
Summary of the invention
The technical problems to be solved in the utility model: a kind of high frequency crystal oscillator phase noise test fixture is provided, and is the direct power input from power supply lead wire to crystal oscillator or make that easy exposed circuit board tests that the anti-interference existing is poor, measuring error is large and the problem such as test result reliability is low to solve the phase noise test conventional method of crystal oscillator.
Technical solutions of the utility model:
A kind of high frequency crystal oscillator phase noise test fixture, it comprises shielding cavity, printed circuit board (PCB) is arranged in shielding cavity, shielding cavity cover plate covers at shielding cavity top, on printed circuit board (PCB), be fixed with stitch intubate, there are respectively out splice going splice and power input terminal in any both sides of shielding cavity, out splice going splice and printed circuit board (PCB) electrical connection, power input terminal is connected with printed circuit board power input port, stitch intubate and printed circuit board (PCB) electrical connection.
Out splice going splice and power input terminal lay respectively at left and right sides or the front and back side of shielding cavity.
Out splice going splice is radio frequency connector.
Power input terminal is the input adapter with feedthrough capacitor pin.
Stitch intubate is the stitch intubate with spring auto lock type.
Shielding cavity and shielding cavity cover plate are metal aluminium.
The beneficial effects of the utility model:
The utility model is reasonable in design, can help to complete smoothly the test of highly stable crystal oscillator phase noise, by the sealing processing of shield shell, can eliminate spacing wave disturbs, power input connects by feedthrough capacitor, utilize the filter action of feedthrough capacitor, the ripple that has reduced out-put supply disturbs, adopt power supply input installation separated with signal output part, avoided signal input and output mixed disturbing mutually, simultaneously owing to adopting band spring auto lock type stitch intubate not only to plug convenient and swift, protected the stitch safety of tested highly stable crystal oscillator, and the stitch of tested highly stable crystal oscillator and the electrical connection of circuit board abundant, guarantee that test result approaches test parameter true value more, the phase noise test conventional method that has solved crystal oscillator is the direct power input from power supply lead wire to crystal oscillator or make that the anti-interference that easy exposed circuit board test existence is poor, measuring error is large and the problem such as test result reliability is low.
accompanying drawing explanation:
Fig. 1 is the utility model structural representation.
embodiment:
A kind of high frequency crystal oscillator phase noise test fixture, it comprises (see figure 1) shielding cavity 2, printed circuit board (PCB) 5 is arranged in shielding cavity 2, shielding cavity cover plate 1 covers at shielding cavity 2 tops, pass through screw fastening, on printed circuit board (PCB) 5, be fixed with stitch intubate 6, there are respectively out splice going splice 3 and power input terminal 4 in any both sides of shielding cavity 2, out splice going splice 3 and printed circuit board (PCB) 5 electrical connections, power input terminal 4 is connected with printed circuit board (PCB) 5 power supply input ports, stitch intubate 6 and printed circuit board (PCB) 5 electrical connections, printed circuit board (PCB) 5 is made according to the test specification of high frequency crystal oscillator, by the test circuit that conventional terminal is connected, be printed on and on circuit board, play integrated effect, play the effect reliably input/output terminal of high frequency crystal oscillator being connected with power input terminal 4 with out splice going splice 3 by stitch intubate 6.
Out splice going splice 3 and power input terminal 4 lay respectively at left and right sides or the front and back side of shielding cavity 2.
Out splice going splice 3 is radio frequency connector.
Power input terminal 4 is the input adapter with feedthrough capacitor pin, by feedthrough capacitor is installed on mounting hole, is connected with the power supply input port of printed circuit board (PCB) 5.
Stitch intubate 6 is the stitch intubate with spring auto lock type, reliable to realize the electrical connection of high frequency crystal oscillator and printed circuit board (PCB).
Shielding cavity 2 and shielding cavity cover plate 1 are metal aluminium, play the effect that isolation is disturbed completely.
Claims (6)
1. a high frequency crystal oscillator phase noise test fixture, it is characterized in that: it comprises shielding cavity (2), printed circuit board (PCB) (5) is arranged in shielding cavity (2), shielding cavity cover plate (1) covers at shielding cavity (2) top, on printed circuit board (PCB) (5), be fixed with stitch intubate (6), there are respectively out splice going splice (3) and power input terminal (4) in any both sides of shielding cavity (2), out splice going splice (3) and printed circuit board (PCB) (5) electrical connection, power input terminal (4) is connected with printed circuit board (PCB) (5) power supply input port, stitch intubate (6) and printed circuit board (PCB) (5) electrical connection.
2. a kind of high frequency crystal oscillator phase noise test fixture according to claim 1, is characterized in that: out splice going splice (3) and power input terminal (4) lay respectively at left and right sides or the front and back side of shielding cavity (2).
3. a kind of high frequency crystal oscillator phase noise test fixture according to claim 1, is characterized in that: out splice going splice (3) is radio frequency connector.
4. a kind of high frequency crystal oscillator phase noise test fixture according to claim 1, is characterized in that: power input terminal (4) is the input adapter with feedthrough capacitor pin.
5. a kind of high frequency crystal oscillator phase noise test fixture according to claim 1, is characterized in that: stitch intubate (6) is the stitch intubate with spring auto lock type.
6. a kind of high frequency crystal oscillator phase noise test fixture according to claim 1, is characterized in that: shielding cavity (2) and shielding cavity cover plate (1) are metal aluminium.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320612545.9U CN203479844U (en) | 2013-09-30 | 2013-09-30 | High-frequency crystal oscillator phase noise test clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320612545.9U CN203479844U (en) | 2013-09-30 | 2013-09-30 | High-frequency crystal oscillator phase noise test clamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203479844U true CN203479844U (en) | 2014-03-12 |
Family
ID=50228153
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320612545.9U Expired - Lifetime CN203479844U (en) | 2013-09-30 | 2013-09-30 | High-frequency crystal oscillator phase noise test clamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203479844U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107121608A (en) * | 2017-05-05 | 2017-09-01 | 航天恒星科技有限公司 | Crystal oscillator testing device |
| CN107860463A (en) * | 2017-09-25 | 2018-03-30 | 北京无线电计量测试研究所 | A kind of crystal oscillator phase noise vibration monitoring device and method |
| CN108414869A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test system suitable for plurality of specifications crystal oscillator |
| CN109490586A (en) * | 2018-11-01 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of π network fixture and test method for quartz crystal parameter test system |
| CN110907712A (en) * | 2019-12-23 | 2020-03-24 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN112578215A (en) * | 2020-12-30 | 2021-03-30 | 北京无线电计量测试研究所 | Novel crystal oscillator frequency temperature stability test device |
| CN112649680A (en) * | 2020-12-25 | 2021-04-13 | 北京无线电计量测试研究所 | Dynamic phase noise test fixture for crystal oscillator |
-
2013
- 2013-09-30 CN CN201320612545.9U patent/CN203479844U/en not_active Expired - Lifetime
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107121608A (en) * | 2017-05-05 | 2017-09-01 | 航天恒星科技有限公司 | Crystal oscillator testing device |
| CN107860463A (en) * | 2017-09-25 | 2018-03-30 | 北京无线电计量测试研究所 | A kind of crystal oscillator phase noise vibration monitoring device and method |
| CN108414869A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test system suitable for plurality of specifications crystal oscillator |
| CN108414869B (en) * | 2018-06-11 | 2023-09-29 | 南京尤尼泰信息科技有限公司 | Test system suitable for multiple specification crystal oscillator |
| CN109490586A (en) * | 2018-11-01 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of π network fixture and test method for quartz crystal parameter test system |
| CN110907712A (en) * | 2019-12-23 | 2020-03-24 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN112649680A (en) * | 2020-12-25 | 2021-04-13 | 北京无线电计量测试研究所 | Dynamic phase noise test fixture for crystal oscillator |
| CN112649680B (en) * | 2020-12-25 | 2023-03-21 | 北京无线电计量测试研究所 | Dynamic phase noise test fixture for crystal oscillator |
| CN112578215A (en) * | 2020-12-30 | 2021-03-30 | 北京无线电计量测试研究所 | Novel crystal oscillator frequency temperature stability test device |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140312 |