CN108414869A

CN108414869A - A kind of test system suitable for plurality of specifications crystal oscillator

Info

Publication number: CN108414869A
Application number: CN201810595080.8A
Authority: CN
Inventors: 张北江; 赵陆文; 徐萍
Original assignee: Nanjing Younitai Mdt Infotech Ltd
Current assignee: Nanjing Younitai Mdt Infotech Ltd
Priority date: 2018-06-11
Filing date: 2018-06-11
Publication date: 2018-08-17
Anticipated expiration: 2038-06-11
Also published as: CN108414869B

Abstract

The invention discloses a kind of test systems suitable for plurality of specifications crystal oscillator, including a transparent openable closed enclosure, there are one test substrate and the test plates that can be plugged on test substrate for fixed setting in box, when needing to test crystal oscillator to be measured, the corresponding test plate is selected according to the supply voltage of the crystal oscillator to be measured, and it is plugged on the test plate according to the dimensions of the crystal oscillator to be measured adaptation, it is possible thereby to crystal oscillator to be measured in box body power-on test, and crystal oscillator to be measured and test plate lid can also be entered wherein with transparent housing.The present invention tests the means of testing that system provides portable use for the crystal oscillator test of plurality of specifications, and the crystal oscillator specification type with adaptation is more, uses the advantages such as simple, at low cost, test environment stabilization.

Description

A kind of test system suitable for plurality of specifications crystal oscillator

Technical field

The invention belongs to crystal oscillator detection technique fields, more particularly to a kind of test system suitable for plurality of specifications crystal oscillator System.

Background technology

Crystal oscillator is the abbreviation of crystal oscillator, refers to cutting thin slice (referred to as by certain azimuth from one piece of quartz crystal For chip), the crystal element of IC composition oscillating circuits is added inside encapsulation, which generally uses packed by metal casing, also have It is encapsulated with glass shell, ceramics or plastics.Therefore, different crystal oscillators usually have different specifications, including volume size specification, Supply voltage specification etc..

When the crystal oscillator to plurality of specifications is tested, it is desirable to provide a unified test system, test in the prior art The crystal oscillator dimensions that system can be applicable in is limited, and the supply voltage that disclosure satisfy that is single, and volume is big, weight weight, carries With use equal inconvenience.

Invention content

The invention mainly solves the technical problem of providing a kind of test systems suitable for plurality of specifications crystal oscillator, solve existing There is the problems such as test device unicity, component are more, inconvenient for use in technology.

In order to solve the above technical problems, the technical solution adopted by the present invention be to provide it is a kind of suitable for plurality of specifications crystal oscillator Test system, including testing cassete, the testing cassete are transparent openable closed enclosure, including box body and lid conjunction in the box body On box cover, the test system further includes test substrate and test plate, and the test substrate is fixed at the box body It is interior, it is provided with shared test circuit and test jack on the test substrate, tests on plate to be provided with and be inserted with the test The corresponding test pin groups of seat are selected when needing to test crystal oscillator to be measured according to the supply voltage of the crystal oscillator to be measured The corresponding test plate is selected, and is plugged on the test plate according to the dimensions of the crystal oscillator to be measured adaptation, so The test plate is corresponded to by the test pin groups in the test jack being plugged on the test substrate afterwards, the test The signal of generation source signal is defeated after substrate further includes the power supply base powered to test circuit and powers to the crystal oscillator to be measured Go out socket, the side wall correspondence of the box body offers power supply base opening and signal accessory power outlet opening, also wrapped in the box body It includes when to crystal oscillator power-on test to be measured for the crystal oscillator to be measured and test plate lid to be entered transparent housing therein.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the test circuit includes electricity Source filter module, external dc voltage export two-way after the power filtering module, and the wherein first via is straight-through as high electricity Pressure passageway, switch power module and LC accumulator of second tunnel by concatenation are as low-voltage channel；The test jack packet Include the first test jack, the second test jack of double 10 jack and the third test of double 4 jack with double 12 jack Socket, it is described test plate correspond to include double 12 contact pin first test pin groups, double 10 contact pin second test contact pin Group and the third of double 4 contact pin test pin groups；First test jack includes and the output end in the high voltage channel is electric The high voltage input terminal of connection, the low-voltage input terminal being electrically connected with the output end in the low-voltage channel are linear electric with connecting The voltage common terminal of the input terminal electrical connection of source module；It will be described by corresponding first test pin groups on the test plate High voltage input terminal is electrically connected with the voltage common terminal, or the low-voltage input terminal is electrically connected with the voltage common terminal It connects；The linear power supply module carries out linear partial pressure to the voltage of input and obtains the crystal oscillator to be measured being plugged on the test plate Supply voltage；The external dc voltage is 15V, and the power filtering module includes power filter chip BNX025H01L, The power input of the power filter chip is connected by power switch with the anode of the external dc voltage, described outer Portion DC voltage both ends are additionally provided with limiter diode, are also serially connected between the power input and input grounding end luminous Diode and current-limiting resistance, after the power switch is closed, the light emitting diode is lighted, and indicates the external dc voltage It has been accessed that, to rear stage output by the DC voltage of voltage regulation filtering, three export the output end of the power filter chip Ground terminal is altogether.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the third test jack 4 jacks include Switching Power Supply control terminal and corresponding ground terminal, and low pressure selects end and corresponding ground terminal, passes through the test Corresponding third test pin groups are hanging by the Switching Power Supply control terminal on plate or are grounded, and low pressure selection end is hanging Or ground connection；The switch power module includes switching power source chip TPS54327, the ends VIN of the switching power source chip with it is described The output end of power filter chip BNX025H01L is electrically connected, on the one hand the ends EN connect the Switching Power Supply control terminal, another party Face is also electrically connected by the first enabled resistance with the ends VIN, and when Switching Power Supply control terminal is hanging, the ends EN pass through described First enabled resistance obtains enable signal and makes the switching power source chip TPS54327 work, when Switching Power Supply control terminal with When corresponding ground terminal electrical connection, then the switching power source chip TPS54327 does not work；The switching power source chip The ends VBST of TPS54327 are electrically connected by capacitance with the ends SW, and the ends SW concatenate the first outputting inductance, the first output electricity The other end output switch power source output voltage of sense；The switch power source output voltage is further by partial pressure RC network tune Control, the partial pressure RC network includes the first divider resistance for connecting the switch power source output voltage, first divider resistance The other end connect the ends VFB of the switching power source chip TPS54327, be also parallel at the both ends of first divider resistance First derided capacitors, second divider resistance, third divider resistance and fourth divider resistance of the ends VFB also by being sequentially connected in series And be grounded, it is also electrically connected with low pressure selection end between the third divider resistance and the 4th divider resistance, and in institute State power filter chip BNX025H01L output voltages be 15V when, when the low pressure selection end ground connection when, the Switching Power Supply is defeated It is 6.6V to go out voltage, and when low pressure selection end is hanging, the switch power source output voltage is 4.8V；The first output electricity The switch power source output voltage of sense output is input to the LC accumulators, and the LC accumulators include 4 in parallel Polarity free capacitor and the energy storage inductor being electrically connected with first outputting inductance, one end of the polarity free capacitor with it is described First outputting inductance and energy storage inductor electrical connection, the other end of the polarity free capacitor are grounded, the both ends of the energy storage inductor It is electrically connected respectively with the anode of 2 polar capacitors, the cathode of the polar capacitor is grounded.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the second test jack packet Include linear power supply Enable Pin and corresponding ground terminal, the first partial pressure control terminal and corresponding ground terminal, the second partial pressure control terminal and Corresponding ground terminal vacantly or is connect the linear power supply Enable Pin by the corresponding second test pin groups of the test plate Ground, described first is divided control terminal is hanging or ground connection, will described second to divide control terminal hanging or be grounded；The linear power supply Module includes linear power supply chip LM1085, the voltage at the ends IN of the linear power supply chip and first test jack Common end is electrically connected, and the ends ADJ connect the collector of a triode, the emitter ground connection of the triode, base stage connection first Enabled resistance, the other end of the first enabled resistance connect the second enabled resistance, and the other end of the second enabled resistance is also with described the The voltage common terminal of one test jack is electrically connected, between the described first enabled resistance and the second enabled resistance with the line Property power supply Enable Pin electrical connection；When the linear power supply Enable Pin is hanging, the triode ON, the chip LM1085's The ends ADJ are grounded, and corresponding OUT terminal is reference voltage output；When the linear power supply Enable Pin is grounded, the triode is cut Only, the ends ADJ of the chip LM1085 are earth-free, the partial pressure value of corresponding OUT terminal output controllable resistor network；The controllable electric Resistance network includes the first linear divider resistance and the ends ADJ and the ground terminal between the ends ADJ and the OUT terminal Between be in series with the second linear divider resistance, third linear divider resistance, the 4th linear divider resistance, the 5th linear partial pressure electricity Resistance, the 6th linear divider resistance, and with described the between the third linear divider resistance and the 4th linear divider resistance One partial pressure control terminal electrical connection, divides between the 5th linear divider resistance and the 6th linear divider resistance with described second Control terminal is electrically connected；When the IN of the linear power supply chip is terminated into 15V, the first partial pressure control terminal and the second partial pressure control End processed is hanging, and the OUT terminal exports 12V voltages；When the IN of the linear power supply chip is terminated into 6.6V, described first point Press control terminal hanging, the second partial pressure control terminal ground connection, the OUT terminal exports 5V voltages；When the ends IN of the linear power supply chip When accessing 4.8V, the first partial pressure control terminal ground connection, the second partial pressure control terminal is hanging, and the OUT terminal exports 3.3V voltages.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the second test jack packet Source signal incoming end and corresponding ground terminal are included, pin groups are tested by the source signal by the test plate corresponding second Incoming end is electrically connected or is grounded with the signal output pin for the crystal oscillator to be measured being plugged on the test plate；It is described for electrical measurement Examination circuit further includes the Buffer output module of the source signal that is exported to crystal oscillator to be measured into row buffering, and the Buffer output module includes Chip BUF602ID and voltage stabilizing chip 78L10, the input terminal of the voltage stabilizing 78L10 and the power filter chip BNX025H01L Output end electrical connection, the output end of the voltage stabilizing 78L10 inputs 10V direct currents to the power end of the chip BUF602ID Pressure, the negative power end ground connection of the chip BUF602ID, the source signal incoming end access crystal oscillator to be measured by partiting dc capacitor Signal output pin, and signal output end then by the resistance of concatenation and capacitance output Jing Guo buffered crystal oscillator output believe Number；Second test jack further includes being electrically connected with the OUT terminal of the linear power supply chip LM1085 and being supplied for crystal oscillator to be measured The crystal oscillator voltage end of electricity tests pin groups by the crystal oscillator voltage end and crystalline substance to be measured by the test plate corresponding second The feeder ear electrical connection shaken；First test jack further includes 12V voltage ends, 5V voltage ends and 3.3V voltage ends, and this three A voltage end is respectively grounded by the voltage indication light diode and current-limiting resistance of concatenation, by the test plate The 12V voltage ends, 5V voltage ends or 3.3V voltage ends and the crystal oscillator voltage end are electrically connected by corresponding first test pin groups It connects, then corresponding voltage indication light diode is lighted.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the test plate includes upper Two pieces of pcb boards that lower leaf fits together are located at the another of lower layer wherein one piece of pcb board positioned at upper layer is grafting indicator board One piece of pcb board is grafting circuit board, and the spring socket for being inserted into crystal oscillator pin is welded on the grafting circuit board, and grafting refers to Show on plate it is then corresponding with the spring socket offer grafting through-hole, the depth of the grafting through-hole is more than the spring socket and protrudes institute State the height of grafting circuit board；The test pin groups are arranged at the back side of the grafting circuit board, and the test plate passes through The pin groups are electrically connected with the test jack on test substrate；The crystal oscillator Dimension Types packet of the grafting through-hole adaptation It includes：4 needles, length × wide=12mm × 12mm；5 needles, length × wide=20mm × 12mm；5 needles, length × wide=20mm × 20mm；5 needles, Length × wide=25mm × 25mm；5 needles, length × wide=27mm × 36mm；5 needles, length × wide=51mm × 41mm；5 needles, long × wide= 51mm×51mm。

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the test plate is 12V The crystal oscillator of power supply tests plate, and the first test pin groups include high voltage input contact pin, low-voltage input contact pin, voltage public affairs Contact pin, 12V voltages indicate contact pin altogether, respectively corresponding high voltage input terminal with first test jack, low-voltage input terminal, Voltage common terminal, 12V voltage end grafting；Also, the high voltage input contact pin is electrically connected with the public contact pin of the voltage；It is described Second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator to be measured and the crystal oscillator to be measured The source signal output contact pin of signal output end electrical connection enables to insert to the linear power supply of the enabled controls of linear power supply chip LM1085 Needle, the first partial pressure control contact pin that partial pressure control is carried out to the linear power supply module on the test substrate and the second partial pressure control Contact pin, correspond to respectively the crystal oscillator voltage end of second test jack, source signal incoming end, linear power supply Enable Pin, first point Press control terminal, the second partial pressure control terminal grafting；Also, the voltage output contact pin is tested described in pin groups with described first 12V voltages indicate that contact pin electrical connection, the linear power supply enable contact pin ground connection, the first partial pressure control contact pin and the second partial pressure It is hanging to control contact pin；The third test pin groups include carrying out enabled control to the switch power module on the test substrate The Switching Power Supply of system controls contact pin, the Switching Power Supply control contact pin ground connection.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the test plate supplies for 5V The crystal oscillator of electricity tests plate, and it is public that the first test pin groups include high voltage input contact pin, low-voltage inputs contact pin, voltage Contact pin, 5V voltages indicate contact pin, respectively corresponding high voltage input terminal, low-voltage input terminal, electricity with first test jack Press common end, 5V voltage end grafting；Also, the low-voltage input contact pin is electrically connected with the public contact pin of the voltage；Described Two test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator to be measured, the letter with the crystal oscillator to be measured The source signal output contact pin of number output end electrical connection enabled to the linear power supply of the enabled controls of linear power supply chip LM1085 is inserted Needle, the first partial pressure control contact pin that partial pressure control is carried out to the linear power supply module on the test substrate and the second partial pressure control Contact pin, correspond to respectively the crystal oscillator voltage end of second test jack, source signal incoming end, linear power supply Enable Pin, first point Press control terminal, the second partial pressure control terminal grafting；Also, the voltage output contact pin is tested described in pin groups with described first 5V voltages indicate that contact pin electrical connection, the linear power supply enable contact pin ground connection, and the first partial pressure control contact pin is hanging, described the Two partial pressure control contact pin ground connection；Third test pin groups include to the switch power module on the test substrate into enforcement Switching Power Supply control contact pin, the low pressure selection contact pin to switch power module progress low pressure selection that can be controlled, it is described to open Powered-down source control contact pin ground connection, the low pressure selection contact pin ground connection.

In the present invention suitable for another embodiment of the test system of plurality of specifications crystal oscillator, the test plate is 3.3V The crystal oscillator of power supply tests plate, and the first test pin groups include high voltage input contact pin, low-voltage input contact pin, voltage public affairs Contact pin, 3.3V voltages indicate contact pin altogether, corresponding respectively to be inputted with the high voltage input terminal of first test jack, low-voltage End, voltage common terminal, 3.3V voltage end grafting；Also, the low-voltage input contact pin is electrically connected with the public contact pin of the voltage； The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator to be measured and the crystalline substance to be measured The source signal output contact pin for the signal output end electrical connection shaken makes the linear power supply of the enabled controls of linear power supply chip LM1085 Energy contact pin, the first partial pressure control contact pin and second that partial pressure control is carried out to the linear power supply module on the test substrate divide Contact pin is controlled, corresponds to the crystal oscillator voltage end of second test jack, source signal incoming end, linear power supply Enable Pin, the respectively One partial pressure control terminal, the second partial pressure control terminal grafting；Also, the voltage output contact pin is tested with described first in pin groups The 3.3V voltages instruction contact pin electrical connection, the linear power supply enable contact pin ground connection, and described first divides control contact pin ground connection, The second partial pressure control contact pin is hanging；The third test pin groups include to the switch power module on the test substrate The Switching Power Supply control contact pin for carrying out enabled control, the low pressure that low pressure selection is carried out to the switch power module select contact pin, The Switching Power Supply control contact pin ground connection, the low pressure selection contact pin are hanging.

The beneficial effects of the invention are as follows：The invention discloses a kind of test systems suitable for plurality of specifications crystal oscillator, including One transparent openable closed enclosure, the interior fixed setting of box is there are one test substrate and can be plugged on test substrate Plate is tested, it is corresponding described according to the selection of the supply voltage of the crystal oscillator to be measured when needing to test crystal oscillator to be measured Plate is tested, and is plugged on the test plate according to the dimensions of the crystal oscillator to be measured adaptation, it is possible thereby to to be measured Crystal oscillator power-on test in box body, and can also be entered crystal oscillator to be measured and test plate lid wherein with transparent housing.The present invention Test system provides the means of testing of portable use for the crystal oscillator test of plurality of specifications, has the crystal oscillator specification type adapted to It is more, use simple, at low cost, test environment the advantages such as to stablize.

Description of the drawings

Fig. 1 is the composition schematic diagram for one embodiment of test system that the present invention is suitable for plurality of specifications crystal oscillator；

Fig. 2 is the composition schematic diagram of the present invention another embodiment suitable for the test system of plurality of specifications crystal oscillator；

Fig. 3 is present invention test circuit schematic diagram suitable for another embodiment of test system of plurality of specifications crystal oscillator；

Fig. 4 is the test substrate composition signal for another embodiment of test system that the present invention is suitable for plurality of specifications crystal oscillator Figure；

Fig. 5 is the test plate composition signal for another embodiment of test system that the present invention is suitable for plurality of specifications crystal oscillator Figure；

Fig. 6 is that the present invention the first test jack composition suitable for another embodiment of test system of plurality of specifications crystal oscillator shows It is intended to；

Fig. 7 is that present invention power filtering module circuit suitable for another embodiment of test system of plurality of specifications crystal oscillator is former Reason figure；

Fig. 8 is that present invention third test jack composition suitable for another embodiment of test system of plurality of specifications crystal oscillator shows It is intended to；

Fig. 9 is switch power module and energy storage of the invention suitable for another embodiment of test system of plurality of specifications crystal oscillator Circuit diagram；

Figure 10 is that the present invention second test jack suitable for another embodiment of test system of plurality of specifications crystal oscillator forms Schematic diagram；

Figure 11 is the present invention linear power module circuitry suitable for another embodiment of test system of plurality of specifications crystal oscillator Schematic diagram；

Figure 12 is present invention Buffer output modular circuit suitable for another embodiment of test system of plurality of specifications crystal oscillator Schematic diagram；

Figure 13 is the test plate composition signal for another embodiment of test system that the present invention is suitable for plurality of specifications crystal oscillator Figure；

Figure 14 is the schematic cross-section of embodiment illustrated in fig. 13；

Figure 15 is the test plate composition signal for another embodiment of test system that the present invention is suitable for plurality of specifications crystal oscillator Figure.

Specific implementation mode

To facilitate the understanding of the present invention, in the following with reference to the drawings and specific embodiments, the present invention will be described in more detail. The preferred embodiment of the present invention is given in attached drawing.But the present invention can realize in many different forms, and it is unlimited In this specification described embodiment.Make to the disclosure on the contrary, purpose of providing these embodiments is Understand more thorough and comprehensive.

It should be noted that unless otherwise defined, all technical and scientific terms used in this specification with belong to The normally understood meaning of those skilled in the art of the present invention is identical.Used term in the description of the invention It is to be not intended to the limitation present invention to describe the purpose of specific embodiment.

Below in conjunction with the accompanying drawings, various embodiments of the present invention are described in detail.

Fig. 1 is the embodiment for the test system that a present invention is suitable for plurality of specifications crystal oscillator.The test system includes one A transparent openable testing cassete 1, the testing cassete 1 includes box body 12 and lid closes the box cover 11 on the box body, described Test system further includes test substrate 3 and test plate 4, and test substrate 3 is fixed in the box body 12, the test base It is provided with shared test circuit and test jack 31 on plate 3, is provided on test plate 4 corresponding with the test jack 31 Test pin groups 41, when needing to test crystal oscillator 5 to be measured, according to the supply voltage of the crystal oscillator 5 to be measured selection pair The test plate 4 answered, and be plugged on the test plate 4 according to the dimensions of the crystal oscillator 5 to be measured adaptation, then The test plate 4 is corresponded to by the test pin groups 41 in the test jack 31 being plugged on the test substrate 3.

The test plate 4 shown in Fig. 1 is not combined together with test substrate 3, primarily to illustrating that the two is By testing the combination corresponding with test jack 31 of pin groups 41, it is bound together both when actual use is tested.

In addition, it is described test substrate 3 further include the power supply base 33 and crystal oscillator to be measured powered to test circuit signal it is defeated Go out socket 34, the side wall correspondence of the box body offers power supply base opening and signal accessory power outlet opening.In addition, test substrate On also show power switch 318.It is possible thereby to directly by the testing cassete can be connect from outside electricity and by source signal it is defeated Go out, and the testing cassete may be at closing under box-like state and carry out during the test.

Further, further include when to 5 power-on test of crystal oscillator to be measured in box body 12 described in Fig. 2 for will be described to be measured Crystal oscillator 5 and test plate 4 are covered into transparent housing 6 therein.In test process, it is entered to crystal oscillator lid to be measured by transparent housing 6 In crystal oscillator 5 to be measured can be made to be in metastable environment, be conducive in this way keep measuring condition stabilization.Practical application In, if being not added with the housing, when have blow air over when crystal oscillator to be measured fluctuated and the change of temperature directly affects its measurement data. And the crystal oscillator to be measured can intuitively be observed by being designed to transparent housing.Preferably, include temperature sensor in test circuit, lead to Environment temperature residing for crystal oscillator to be measured can be inductively measured in real time by crossing the temperature sensor, can be obtained at different ambient temperatures Corresponding test data.

In addition, the through-hole 32 for accommodating and placing the transparent housing 6 is further opened on the test substrate 3, when end is tested Afterwards, which is removed and is inverted and be put into through-hole 32, in this way there is stability also to take full advantage of in box body simultaneously Space.

Test substrate and test plate are described in detail further below.To the test circuit on test substrate Speech, Fig. 3 show the theory of constitution figure of the test circuit on test substrate, this includes power filter for electrical test circuit 100 Module 101, external dc voltage export two-way after power filtering module 101, and the wherein first via is straight-through logical as high voltage Road, the second tunnel are low-voltage channel, are made of the switch power module 102 and LC accumulators that concatenate, the high voltage channel Output end and the output end in low-voltage channel be separately connected two input terminals of the test jack 31, the test jack 31 Public output connection linear power supply module 105 input terminal, the linear power supply module 105 is to the voltage of input into line Property divide to obtain crystal oscillator supply voltage and power for crystal oscillator 20 to be measured.

Here high-pressure channel is primarily referred to as the DC voltage channel higher than 10V, low-pressure channel be primarily referred to as 5V and 5V with Under (such as 3.3V) DC voltage channel.Since the usual voltage value of external dc voltage can be higher than the supply voltage of crystal oscillator, such as External dc voltage is 15V, then can be directly by linear power supply module 15 into line when the supply voltage of crystal oscillator is 12V Property partial pressure, in this case linear power supply module partial pressure loss it is smaller.But when crystal oscillator supply voltage be 5V or When 3.3V, if also linearly divided to 15V voltages by linear power supply module 15, generated by linear power supply module 15 Partial pressure loss is just very big, needs to first pass through the switch power module 12 in low-pressure channel thus and is depressured to 15V voltages, by This can reduce the partial pressure loss of rear end linear power supply module 105, this is also that the present invention can adapt to a variety of crystal oscillator supply voltages Demand, while also there is very high power supply efficiency, the useless power consumption that linear power supply module 105 will not be caused excessive.

Preferably, test circuit further includes Buffer output module 106, and external dc voltage is after power filtering module 101 It exports and powers to Buffer output module 106, the signal of crystal oscillator 20 to be measured generates end and is linked into the defeated of the Buffer output module 106 Enter end, the output end of the Buffer output module 106 exports the crystal oscillation signal to be measured by buffering.

Further, as shown in figure 4, the test jack 31 includes have the first test jack 311 of double 12 jack, The third test jack 313 of the second test jack 312 and double 4 jack of double 10 jack.In addition, also showing three in Fig. 4 A voltage indication light diode 320 corresponds to the crystal oscillator test of 12V electricity, 5V voltages or 3.3V power voltage supplies, when wherein one respectively When the crystal oscillator of kind supply voltage and test plate work, the corresponding light emitting diode of the voltage is just lighted.Related content can join It examines in embodiment illustrated in fig. 6 to 12V voltage ends 3114,5V voltage ends 3115 and 3.3V voltages in first test jack 311 The explanation at end 3116.

Fig. 5 shows the schematic diagram at the test plate back side, wherein being provided with three groups of test contact pins at the back side of test plate 4 Group includes the first test pin groups 1223, the second test pin groups 1221 and double of double 10 contact pin with double 12 contact pin The third test pin groups 1222 of 4 contact pins are arranged, three are tested pin groups layings triangular in shape on the grafting circuit board, and Respectively with three test jacks above-mentioned to corresponding grafting.This laying mode is conducive to that plate and test substrate progress will be tested Firm grafting.In addition, from Fig. 5 it can also be seen that spring socket 121 has different apertures, this is to adapt to the crystal oscillator pair of different size The different reason of the diameter of the pin answered, the aperture of the spring socket includes 0.5mm, 0.8mm, and/or 1.0mm.

In conjunction with Fig. 1 to Fig. 6, first test jack 311 includes being electrically connected with the output end in the high voltage channel High voltage input terminal 3111, the low-voltage input terminal 3112 being electrically connected with the output end in the low-voltage channel are linear with connecting The voltage common terminal 3113 of the input terminal electrical connection of power module；Pass through corresponding first test contact pin on the test plate 4 The high voltage input terminal 3,111 1223 is electrically connected by group with the voltage common terminal 3113, or by the low-voltage input terminal 3112 are electrically connected with the voltage common terminal 3113；The linear power supply module 105 linearly divides the voltage progress of input To the supply voltage for the crystal oscillator to be measured 5 being plugged on the test plate 4.

Further, in conjunction with shown in Fig. 6, first test jack 131 includes high voltage input terminal 3111 (including two Jack side by side), it is electrically connected with the output end in the high voltage channel；Low-voltage input terminal 3112 (including two side by side insert Hole), it is electrically connected with the output end in the low-voltage channel；Voltage common terminal 3113 (includes two jacks side by side), and connect The input terminal of linear power supply module is electrically connected.As seen from Figure 6, since voltage common terminal 3113 is between 3111 He of high voltage input terminal Between low-voltage input terminal 3112, also allowing for voltage common terminal 3113 in this way, even an input terminal is selected with this, such as is passed through Jumper cap is selected.Preferably, can also test pin groups by the test plate corresponding first will the high electricity Pressure input terminal is electrically connected with the voltage common terminal, or the low-voltage input terminal is electrically connected with the voltage common terminal； The linear power supply module carries out linear partial pressure to the voltage of input and obtains the crystal oscillator to be measured being plugged on the test plate Supply voltage.

For the power filtering module in test circuit, it is preferred that power filtering module is chip BNX025H01L. As shown in fig. 7, the power input B of the chip 101 by power switch SW1 (power switch 318 in corresponding diagram 1 to Fig. 3) with The anode of external dc voltage is connected, and is additionally provided with 11D1 limiter diodes at external dc voltage both ends, prevents external dc The polarity of voltage reversal connection of voltage.It is also serially connected with light emitting diode 11D2 and limit between power input B and input grounding end PSG Leakage resistance 11R1, after SW1 is closed, light emitting diode 11D2 is lighted, and indicates that external voltage has accessed.By the module filtered Output end CB afterwards is to rear stage output by the DC voltage of voltage regulation filtering.Three output ground terminal CG are altogether.

As shown in figure 8,4 jacks of the third test jack 313 include Switching Power Supply control terminal 3131 and corresponding Ground terminal 3133, low pressure select end 3132 and corresponding ground terminal 3133, by being tested described in Fig. 5 corresponding the on plate 4 Three test pin groups 1222 by the Switching Power Supply control terminal 3131 is hanging or ground connection, by low pressure selection end 3132 it is hanging or Ground connection.

Preferably, switch power module includes chip TPS54327.As shown in figure 9, the ends VIN of the chip 102 and Fig. 7 institutes The ends the HV electrical connection shown, also by polar capacitor 12E1 and polarity free capacitor 12C1 ground connection, the ends SS are connect by capacitance 12C2 at the end Ground, VREGS are grounded by capacitance 12C3, and the ends CG are directly grounded, and the ends VBST are electrically connected by capacitance 12C4 with the ends SW, the ends SW concatenation First outputting inductance 12L1, the other end output switch power source output voltage of the first outputting inductance 12L1, the Switching Power Supply Output voltage is the output voltage of the switch power module, it can be seen that the switch power source output voltage is also by partial pressure RC nets Network, i.e. the 4th divider resistance 12R2 to the first divider resistance 12R5 and the RC network of the first derided capacitors 12C5 compositions regulation and control.

In addition, on the one hand the ends EN of the chip 102 directly connect Switching Power Supply control terminal SWEN (the switch electricity in corresponding diagram 8 Source control terminal 3131), on the other hand also it is electrically connected with the ends VIN by the first enabled resistance 12R1.When Switching Power Supply control terminal When SWEN is hanging, the ends EN work by the first enabled resistance 12R1 can obtain enable signal, when Switching Power Supply control terminal When SWEN is grounded, then the chip 102 will no longer work.

Further, the partial pressure RC network includes the first divider resistance for connecting the switch power source output voltage The other end of 12R5, the first divider resistance 12R5 connect the ends VFB of the switching power source chip TPS54327, described The both ends of one divider resistance 12R5 are also parallel with the first derided capacitors 12C5, and the ends VFB are also by be sequentially connected in series second point Piezoresistance 12R4, third divider resistance 12R3 and the 4th divider resistance 12R2 and be grounded, in the third divider resistance 12R3 and Low pressure selection end SWVIG (the low pressure selection end 3132 in corresponding diagram 8) is further connected between 4th divider resistance 12R2, and in institute State power filter chip BNX025H01L output voltages be 15V when, when the low pressure selection end SWVIG ground connection when, the switch Electric power output voltage is 6.6V, and the computational methods of the switch power source output voltage are：Vout=0.765 × (1+12R5/ (12R3+ 12R4)).When low pressure selection end SWVIG is hanging, the switch power source output voltage is 4.8V.Also, the Switching Power Supply The computational methods of output voltage are：Vout=0.765 × (1+12R5/ (12R2+12R3+12R4)).

Preferably, divider resistance 12R5=143k Ω, 12R4=18k Ω, 12R3=510 Ω, 12R2=8.2k Ω.It is aobvious So, when SWVIG is grounded, Vout=0.765 × (1+143/ (18+0.51))=6.675V, approximate above-mentioned 6.6V and in error Within；When SWVIG is hanging, Vout=0.765 × (1+143/ (18+0.51+8.2))=4.86V, approximate above-mentioned 4.8V and Within error.

Therefore, it can be seen that the switch power module as low-pressure channel, on the one hand can pass through Switching Power Supply control terminal SWEN controls whether the module has voltage output, and end SWVIG on the other hand can be selected by low pressure to control module tool The output voltage values of body, suitable supply voltage to can targetedly be selected by being conducive to rear stage linear power supply module in this way On the other hand the crystal oscillator of different size has the problems such as saving energy consumption, reducing current supply loss and fever.

Further, the switch power source output voltage of the first outputting inductance 12L1 outputs described in Fig. 9 is input to institute State LC accumulators, the LC accumulators include 4 polarity free capacitor 13C1 in parallel to 13C4, and with it is described first defeated The one end for going out the energy storage inductor 13L1, the polarity free capacitor 13C1 to 13C4 of inductance 12L1 electrical connections is exported with described first Inductance 12L1 and energy storage inductor 13L1 electrical connections, the other end of the polarity free capacitor 13C1 to 13C4 are grounded, the energy storage The both ends of inductance 13L1 are electrically connected with the anode of 2 polar capacitors 13E1,13E2 respectively, described polar capacitor 13E1,13E2's Cathode is grounded.Accumulator 13 in energy storage LC accumulators corresponding diagram 1 mainly exports switch power module 12 Power supply signal is stored, and ensures that the power supply after powering off of stablizing and be unlikely to occur of rear stage supply voltage is interrupted suddenly, to rear Stage circuit is powered protection.

Output voltage can effectively be adjusted by the LC accumulators after switching power source chip TPS54327, mainly It is controlled by the switching tube of quick on-off in switching power source chip TPS54327 to adjust the break-make ratio (duty ratio) of output The average value of DC voltage is exported, such as after the switching tube in switching power source chip TPS54327 is connected, to the first output electricity 12L1 and energy storage inductor 13L1 is felt to rear stage load supplying, and is charged simultaneously to energy storage inductor 13L1, energy storage inductor 13L1 It is equivalent to constant-current source, plays the role of quickly transmitting energy, polar capacitor 13E2 is equivalent to constant pressure source, plays filtering in circuit and makees With, and after the switching tube in switching power source chip TPS54327 turns off, the energy of energy storage inductor 13L1 storages passes through polarity electricity Hold 13E1 forming circuits, rear stage load is continued to power, to ensure that load obtains continuous electric current.

Further, as shown in Figure 10, second test jack 312 includes linear power supply Enable Pin 3121 and corresponding Ground terminal 3124, the first partial pressure control terminal 3122 and corresponding ground terminal 3124 and corresponding connect second partial pressure control terminal 3123 Ground terminal 3124 tests pin groups 1221 by the linear power supply Enable Pin by testing plate 4 corresponding second described in Fig. 5 3121 hanging or ground connection divide control terminal 3121 vacantly by described first or are grounded, and dividing control terminal 3121 by described second hangs Empty or ground connection.

Preferably, linear power supply module 105 includes chip LM1085.As shown in figure 11, the IN of the linear power supply chip End is electrically connected with the voltage common terminal 3112 (being herein the ends MV) of the first test jack 311 described in Fig. 6.The ends MV are one defeated Entering end, after the end is electrically connected with the high voltage input terminal 3111 in Fig. 6, MV terminates the high voltage of the ends HV output shown in Fig. 7, Such as 15V；After the ends MV are electrically connected with the low-voltage input 3112 in Fig. 6, MV terminates the low electricity of the ends LV output shown in Fig. 9 Pressure, such as 6.6V or 4.8V.

The ends ADJ connect the collector of a triode 15Q1, the emitter ground connection of the triode 15Q1, base stage connection the The other end of one enabled resistance 15R2, the first enabled resistance 15R2 connect the second enabled resistance 15R1, the second enabled resistance 15R1 The other end be also electrically connected with the voltage common terminal 3112 of the first test jack 311 described in Fig. 6 (being herein the ends MV), in institute It states and is connected with linear power supply Enable Pin LVEN (the second tests described in corresponding diagram 10 between the first enabled resistance and the second enabled resistance The linear power supply Enable Pin 3121 of socket 312).

When the linear power supply Enable Pin LVEN is hanging, the triode 15Q1 conductings, the ADJ of the chip LM1085 End ground connection, corresponding OUT terminal are reference voltage output；When the linear power supply Enable Pin LVEN is grounded, the triode 15Q1 ends, and the ends ADJ of the chip LM1085 are earth-free, the partial pressure value of corresponding OUT terminal output controllable resistor network.

The controllable resistor network includes the first linear divider resistance 15R3 between the ends ADJ and the OUT terminal, and The second linear divider resistance 15R4, third linear divider resistance 15R5, the 4th are in series between the ends ADJ and the ground terminal Linear divider resistance 15R6, the 5th linear divider resistance 15R7, the 6th linear divider resistance 15R8, and in the third linear The first partial pressure control terminal LVO3 is provided between the linear divider resistance 15R6 of divider resistance 15R5 and the 4th (in corresponding and Figure 10 First partial pressure control terminal 3122 be electrically connected), the described 5th linear linear divider resistance 15R8 of divider resistance 15R7 and the 6th it Between be provided with the second partial pressure control terminal LVO5 (corresponding with Figure 10 second divide control terminal 3123 and be electrically connected)；

When the IN of the linear power supply chip is terminated into 15V, the first partial pressure control terminal LVO3 and the second partial pressure control End LVO5 processed is hanging, and the OUT terminal exports 12V voltages, and the method for calculating OUT terminal output voltage is：Vlout=1.25 × (1 +(15R4+15R5+15R6+15R7+15R8)/15R3)；When the IN of the linear power supply chip is terminated into 6.6V, described first It is hanging to divide control terminal LVO3, the second partial pressure control terminal LVO5 ground connection, the OUT terminal exports 5V voltages, calculates OUT terminal output electricity The method of pressure is：Vlout=1.25 × (1+ (15R4+15R5+15R6+15R7)/15R3)；As the IN of the linear power supply chip When terminating into 4.8V, the first partial pressure control terminal LVO3 ground connection, the second partial pressure control terminal LVO5 is hanging, the OUT terminal output 3.3V voltages, the method for calculating OUT terminal output voltage are：Vlout=1.25 × (1+ (15R4+15R5)/15R3).It needs exist for Illustrate, computational methods and the input voltage of the output voltage of OUT terminal seem to be not directly dependent upon, effectively as linear electricity It is exactly mainly to obtain output voltage by electric resistance partial pressure to input voltage to source chip, if output voltage is relative to input electricity When the partial pressure of pressure is smaller, there will be larger losses, such as 3.3V to be significantly less than 3.3V phases relative to the intrinsic standoff ratio of input 15V For inputting the intrinsic standoff ratio of 4.8V.In order to improve the power supply efficiency of power supply, 5V and 3.3V is respectively adopted first passes through out here Powered-down source module obtains corresponding 6.6V and 4.8V, then obtains corresponding 5V and 3.3V by linear power supply module again, switchs Power module has higher efficiency, and can also obtain higher intrinsic standoff ratio in linear power supply module, to have height on the whole Efficiency.In addition linear power supply module has more preferable ripple characteristics, therefore is to use linear power supply mould to the power supply that crystal oscillator is directly powered Block, rather than switch power module is directly used, this is obtained more accurate also for the stabilization for ensureing crystal oscillator supply voltage Measuring condition.

Further, 15R3=100 Ω, 15R4=82 Ω, 15R5=82 Ω, 15R6=100 Ω, 15R7=36 Ω, 15R8=560 Ω.It is 12V, 5V and 3.3V that above-mentioned OUT terminal output voltage, which can be respectively obtained,.

Further, as shown in Figure 10, second test jack 312 includes source signal incoming end 3125 and corresponding connects Ground terminal 3124, by described in Fig. 5 test plate 4 corresponding second test pin groups 1221 by the source signal incoming end 3125 with It is plugged on signal output pin electrical connection or the ground connection of the crystal oscillator to be measured on the test plate.

Preferably, it is described for electrical test circuit further include oscillator signal into row buffering that crystal oscillator to be measured is exported buffering it is defeated Go out module, Buffer output module 16 includes chip BUF602ID and voltage stabilizing chip 78L10.The input terminal of the voltage stabilizing 78L10 with The output end of the power filter chip BNX025H01L is electrically connected, and the output end of the voltage stabilizing 78L10 is to the chip The power end of BUF602ID inputs 10V DC voltages.As shown in figure 12, the power end VCC of chip BUF602ID meets 10V, the 10V Voltage is to be electrically connected to export stable 10V voltages after voltage stabilizing chip 78L10 by the ends HV of aforementioned power source filter module.Negative supply End-VCC is directly grounded, and signal input part IN accesses the source signal S20 from crystal oscillator to be measured by partiting dc capacitor C161, and defeated Outlet OUT then exports the crystal oscillator output signal S21 Jing Guo buffered by the resistance R161 of concatenation and capacitance C164.

It can be that rear stage carries out Interface Matching and isolation by Buffer output module, ensure that the reliability of test.Tool It is because crystal oscillator has the characteristic of load regulation, the load for exactly testing crystal oscillator output signal connects and do not connect can shadow for body It rings its output frequency and increase is equivalent to by the Buffer output module in order to ensure the stability or consistency of output frequency One matched load, and the matched load also characteristic with high resistance input and low resistance output, also allow for it is latter Grade connection.Also, after having the Buffer output module, no matter connecing load below does not still connect the output that load does not affect crystal oscillator Thus frequency avoids the risk of the variation for the crystal oscillator output frequency brought by the variation loaded.

As shown in Figure 10, second test jack 312 further includes and the OUT terminal of the linear power supply chip LM1085 is electric Connection and the crystal oscillator voltage end 3126 powered for crystal oscillator to be measured pass through and test corresponding second test contact pin on plate 4 described in Fig. 4 The crystal oscillator voltage end 3126 is electrically connected by group 1221 with the feeder ear of crystal oscillator to be measured；

As shown in fig. 6, first test jack 311 further includes 12V voltage ends 3114,5V voltage ends 3115 and 3.3V electricity Pressure side 3116, and these three voltage ends are respectively grounded by the voltage indication light diode and current-limiting resistance of concatenation, are led to Corresponding first test pin groups 1223 are crossed on the test plate by the 12V voltage ends, 5V voltage ends or 3.3V voltage ends It is electrically connected with the crystal oscillator voltage end, then corresponding voltage indication light diode is lighted.

The above-mentioned explanation mainly to test substrate embodiment, the test substrate provide for the crystal oscillator test of plurality of specifications Unified test circuit, below will be compatible with crystal oscillator dimensions and powered types to solve the problems, such as by testing plate.

As shown in figure 13, the test plate includes two pieces of pcb boards that upper lower leaf fits together, for the ease of saying Bright, Figure 13 separates this two pieces of pcb boards, welds or fits together both in actual use.Wherein it is located at the one of upper layer Block pcb board is grafting indicator board 211, and another piece of pcb board positioned at lower layer is grafting circuit board 212, in the grafting circuit board It is welded with the spring socket 2121 for being inserted into crystal oscillator pin to be measured on 212, it is then corresponding with the spring socket on grafting indicator board to open Equipped with grafting through-hole 2111.In conjunction with Figure 14, the depth H 2 of the grafting through-hole 2111 is protruded described more than the spring socket 2121 The height H1 of the plate face of grafting circuit board 212.Test pin groups 2122 are additionally provided at the back side of the grafting circuit board, it is described Test plate is electrically connected by the pin groups 2122 with test substrate.

It tests on the grafting circuit board 212 of plate and is provided with for accurately being inserted with the test substrate described in Figure 13 Connect at least two location holes 2123 of positioning.In practical applications, it is corresponding test substrate on be also equipped with respective numbers and The location hole of position, in this way when the location hole 2123 on grafting circuit board 212 is aligned with the location hole on test substrate, so that it may Standard is inserted to ensure that three groups of test pin groups at 212 back side of grafting circuit board are corresponding with the test jack on test substrate.Preferably, It is correspondingly arranged on positioning column with the location hole 2123 on the front of test substrate, in this way after location hole is put into positioning column It is more prone to assignment test plate to be inserted on test substrate.

By the way that the pcb board of two pieces of superpositions is arranged, and the depth of grafting through-hole is more than the spring socket and protrudes the grafting The height of the plate face of circuit board, after the female type pin of crystal oscillator can be made to be inserted into spring socket, the bottom surface of crystal oscillator will not be with spring Jack contact, due to spring socket conduction, and the bottom surface of crystal oscillator is encapsulated if it is metal material, then can be inserted into each of spring socket A pin connects short circuit by the metal material, and the upper surface of grafting indicator board is insulating layer, and this of the present embodiment is set The mode of setting can be to avoid short circuit problem.In addition, the pin of crystal oscillator, which is inserted into spring socket, certain depth, to ensure that abundant electricity connects It touches, grafting through-hole also has the function of that crystal oscillator pin is protected to be unlikely to excessive exposed.

Preferably, for constant-temperature crystal oscillator and temperature compensating crystal oscillator, principal shape is rectangle or square, contact pin type pin Quantity be generally 5 pins or 4 pins, such as when having 5 pins, wherein 3 pins are uniformly arranged on the crystal oscillator One side, in addition 2 pins are then corresponding is arranged in the both ends of another side of the crystal oscillator, the grafting indicator board On installation Warning Mark is provided with to the corresponding grafting through-hole of 3 pins of the crystal oscillator.As in Figure 15 in the centre of 3 pins It is 51 × 41 that pin, which is labeled with instruction crystal oscillator size, and corresponding length and width are 51mm and 41mm respectively, and the two of this 3 pins The pin at end is labeled with triangle respectively, and the appearance profile of the crystal oscillator is drawn with solid line and dotted line, these are all As the Warning Mark 2112 of instruction crystal oscillator grafting, it is possible thereby to indicate that crystal oscillator is correctly inserted into grafting through-hole by tester It is interior.In addition, it is 51 × 51 that also pin, which is labeled with instruction crystal oscillator size, corresponding length and width are 51mm and 51mm respectively, can be with The direction of the direction for finding out the setting of 5 pins of this specification crystal oscillator and the setting of 5 pins of previous specification crystal oscillator is not Together.And these grafting through-holes distribution being arranged on entire grafting indicator board is compacter than comparatively dense, can make have in this way in area The crystal oscillator of sizes specification is set on the grafting indicator board of limit.It is additionally shown on the quadrangle of grafting indicator board 211 and sets in Figure 15 It is equipped with mounting hole 2113, grafting indicator board and grafting circuit board group can be fitted together by mounting hole 2113.

Preferably, the crystal oscillator Dimension Types of the grafting through-hole adaptation include：4 needles, length × wide=12mm × 12mm；5 needles, Length × wide=20mm × 12mm；5 needles, length × wide=20mm × 20mm；5 needles, length × wide=25mm × 25mm；5 needles, long × wide= 27mm×36mm；5 needles, length × wide=51mm × 41mm；5 needles, length × wide=51mm × 51mm.

In addition, though can be with the crystal oscillator of grafting plurality of specifications size on grafting indicator board, but all types of crystal oscillators exist Corresponding feeder ear is electrically connected on the grafting circuit board, oscillator signal output end is electrically connected, and ground connection End is also electrically connected.Unified power supply easily thus is carried out to the crystal oscillator of different size on removal circuit plate and is drawn Go out oscillator signal.

Further, the explanation in conjunction with aforementioned to testing substrate, the present invention also provides the surveys of the crystal oscillator of three kinds of powered types Plate embodiment is tried, is described as follows.

The test plate is that the crystal oscillator of 12V power supplies tests plate, and the first test pin groups 1223 include height described in Fig. 5 Control source contact pin, low-voltage input contact pin, the public contact pin of voltage, 12V voltages indicate contact pin, respectively with it is shown in fig. 6 described High voltage input terminal 3111, low-voltage input terminal 3112, voltage common terminal 3113, the 12V voltage ends of first test jack 311 3114 grafting；Also, the high voltage input contact pin is electrically connected with the public contact pin of the voltage.So just by the test plate High voltage input terminal 3111 can be electrically connected with voltage common terminal 3113, and first tests pin groups 1223 by the 12V Voltage indicator is electrically connected with the second test pin groups voltage output contact pin for including, and voltage output contact pin with it is described to be measured The feeder ear of crystal oscillator is electrically connected, and thus can light corresponding electricity by the 12V voltage ends 3114 of the first test jack 311 again Press indication light diode.

Further, as shown in figure 5, the second test pin groups 1221 include and the feeder ear of the crystal oscillator to be measured electricity The voltage output contact pin of connection, the source signal being electrically connected with the signal output end of the crystal oscillator to be measured export contact pin, to linear electricity The linear power supply of the enabled controls of source chip LM1085 enables contact pin, is divided to the linear power supply module on the test substrate First partial pressure control contact pin of control and the second partial pressure control contact pin, respectively the crystalline substance of the second test jack 312 described in corresponding diagram 10 Voltage end 3126, source signal incoming end 3125, the linear power supply Enable Pin 3121, first of shaking divide control terminal 3122, second and divide 3123 grafting of control terminal；Also, the voltage output contact pin is inserted with the 12V voltages instruction that described first tests in pin groups Needle is electrically connected, and the linear power supply enables contact pin ground connection, and the first partial pressure control contact pin and the second partial pressure control contact pin are outstanding It is empty.With specific reference to the explanation to Figure 11 embodiments, details are not described herein again.

Third test pin groups 1222 in Fig. 5 include to the switch power module on the test substrate into enforcement The Switching Power Supply that can be controlled controls contact pin, the Switching Power Supply control contact pin ground connection, and thus Fig. 5 thirds test jack 313 corresponds to Switching Power Supply control terminal 3131 be also grounded, thus control switch power module do not work, i.e. low-voltage channel does not work.

Further, the test plate is that the crystal oscillator of 5V power supplies tests plate, the first test pin groups described in Fig. 5 1223 include high voltage input contact pin, low-voltage input contact pin, the public contact pin of voltage, 5V voltages indicate contact pin, respectively with Fig. 6 institutes High voltage input terminal 3111, low-voltage input terminal 3112, voltage common terminal 3113, the 5V voltages for first test jack shown Hold 3115 grafting；Also, the low-voltage input contact pin is electrically connected with the public contact pin of the voltage；Pass through the test plate in this way Low-voltage input terminal 3112 can be electrically connected with voltage common terminal 3113, and first tests pin groups 1223 by the 5V Voltage indicator is electrically connected with the second test pin groups voltage output contact pin for including, and voltage output contact pin with it is described to be measured The feeder ear of crystal oscillator is electrically connected, and thus can light corresponding electricity by the 5V voltage ends 3115 of the first test jack 311 again Press indication light diode.

Further, as shown in figure 5, the second test pin groups 1221 include and the feeder ear of the crystal oscillator to be measured electricity The voltage output contact pin of connection, the source signal being electrically connected with the signal output end of the crystal oscillator to be measured export contact pin, to linear electricity The linear power supply of the enabled controls of source chip LM1085 enables contact pin, is divided to the linear power supply module on the test substrate First partial pressure control contact pin of control and the second partial pressure control contact pin, respectively the crystalline substance of the second test jack 312 described in corresponding diagram 10 Voltage end 3126, source signal incoming end 3125, the linear power supply Enable Pin 3121, first of shaking divide control terminal 3122, second and divide 3123 grafting of control terminal；Also, the voltage output contact pin is inserted with the 12V voltages instruction that described first tests in pin groups Needle is electrically connected, and the linear power supply enables contact pin ground connection, and the first partial pressure control contact pin is hanging, and the second partial pressure control is inserted Needle is grounded.With specific reference to the explanation to Figure 11 embodiments, details are not described herein again.

Third test pin groups 1222 in Fig. 5 include to the switch power module on the test substrate into enforcement Switching Power Supply control contact pin 3131, the low pressure selection contact pin to switch power module progress low pressure selection that can be controlled 3132, the Switching Power Supply control contact pin 3131 is grounded, and the low pressure selection contact pin 3132 is grounded.Low-pressure channel works at this time, Specific partial pressure control is with reference to the explanation of 9 embodiment of figure, and details are not described herein again.

Further, the test plate is that the crystal oscillator of 3.3V power supplies tests plate, the first test pin groups described in Fig. 5 1223 include high voltage input contact pin, low-voltage input contact pin, the public contact pin of voltage, 3.3V voltages indicate contact pin, respectively with Fig. 6 Shown in first test jack high voltage input terminal 3111, low-voltage input terminal 3112, voltage common terminal 3113,3.3V 3116 grafting of voltage end；Also, the low-voltage input contact pin is electrically connected with the public contact pin of the voltage.Pass through the test in this way Plate can be electrically connected low-voltage input terminal 3112 with voltage common terminal 3113, and first tests pin groups 1223 by institute It states 3.3V voltages indicator and is electrically connected with the voltage output contact pin that the second test pin groups include, and voltage output contact pin and institute The feeder ear electrical connection for stating crystal oscillator to be measured, can thus be lighted by the 3.3V voltage ends 3116 of the first test jack 311 again Corresponding voltage indication light diode.

Further, as shown in figure 5, the second test pin groups 1221 include and the feeder ear of the crystal oscillator to be measured electricity The voltage output contact pin of connection, the source signal being electrically connected with the signal output end of the crystal oscillator to be measured export contact pin, to linear electricity The linear power supply of the enabled controls of source chip LM1085 enables contact pin, is divided to the linear power supply module on the test substrate First partial pressure control contact pin of control and the second partial pressure control contact pin, respectively the crystalline substance of the second test jack 312 described in corresponding diagram 10 Voltage end 3126, source signal incoming end 3125, the linear power supply Enable Pin 3121, first of shaking divide control terminal 3122, second and divide 3123 grafting of control terminal；Also, the 3.3V voltages that the voltage output contact pin is tested with described first in pin groups indicate Contact pin is electrically connected, and the linear power supply enables contact pin ground connection, the first partial pressure control contact pin ground connection, the second partial pressure control Contact pin is hanging, and with specific reference to the explanation to Figure 11 embodiments, details are not described herein again.

Third test pin groups 1222 in Fig. 5 include to the switch power module on the test substrate into enforcement Switching Power Supply control contact pin 3131, the low pressure selection contact pin to switch power module progress low pressure selection that can be controlled 3132, the Switching Power Supply control contact pin 3131 is grounded, and the low pressure selection contact pin 3132 is hanging.Low-pressure channel works at this time, Specific partial pressure control is with reference to the explanation of 9 embodiment of figure, and details are not described herein again.The invention discloses one kind being suitable for plurality of specifications The test system of crystal oscillator, including a transparent openable closed enclosure, there are one test substrates and can for fixed setting in box With the test plate being plugged on test substrate, when needing to test crystal oscillator to be measured, according to the confession of the crystal oscillator to be measured Piezoelectric voltage selects the corresponding test plate, and is plugged on the test according to the dimensions of the crystal oscillator to be measured adaptation and inserts On plate, it is possible thereby to crystal oscillator to be measured in box body power-on test, and can also be with transparent housing by crystal oscillator to be measured and test Plate lid enters wherein.The present invention tests the means of testing that system provides portable use for the crystal oscillator test of plurality of specifications, has The crystal oscillator specification type of adaptation is more, simple, at low cost, test environment is used the advantages such as to stablize.

Example the above is only the implementation of the present invention is not intended to limit the scope of the invention, every to utilize this hair Equivalent structure transformation made by bright specification and accompanying drawing content is applied directly or indirectly in other relevant technical fields, It is included within the scope of the present invention.

Claims

1. a kind of test system suitable for plurality of specifications crystal oscillator, including testing cassete, which is characterized in that the testing cassete is transparent Openable closed enclosure, include box body and lid closes box cover on the box body, the test system further includes test substrate With test plate, the test substrate is fixed in the box body, and shared test electricity is provided on the test substrate Road and test jack are tested on plate and are provided with test pin groups corresponding with the test jack, when needing to crystalline substance to be measured It shakes when being tested, the corresponding test plate is selected according to the supply voltage of the crystal oscillator to be measured, and according to described to be measured The dimensions adaptation of crystal oscillator is plugged on the test plate, and then the test plate is corresponded to by the test pin groups Be plugged in the test jack on the test substrate, the test substrate further include the power supply base powered to test circuit with And the signal accessory power outlet to generation source signal after the crystal oscillator power supply to be measured, the side wall correspondence of the box body are offered for electric mortiser Seat opening and signal accessory power outlet opening further include when to crystal oscillator power-on test to be measured in the box body for will be described to be measured Crystal oscillator and test plate lid enter transparent housing therein.

2. the test system according to claim 1 suitable for plurality of specifications crystal oscillator, which is characterized in that the test circuit Including power filtering module, external dc voltage exports two-way after the power filtering module, and wherein the first via is straight-through makees For high voltage channel, switch power module and LC accumulator of second tunnel by concatenation are as low-voltage channel；

The test jack includes first test jack with double 12 jack, the second test jack of double 10 jack and double Arrange the third test jack of 4 jacks, the test plate correspond to include double 12 contact pin the first test pin groups, double 10 slotting Second test pin groups of needle and the third of double 4 contact pin test pin groups；

First test jack includes the high voltage input terminal being electrically connected with the output end in the high voltage channel, and described low The low-voltage input terminal of the output end electrical connection of voltage channel, the voltage being electrically connected with the input terminal for connecting linear power supply module are public End altogether；Pin groups are tested by the high voltage input terminal and the voltage common terminal by the test plate corresponding first Electrical connection, or the low-voltage input terminal is electrically connected with the voltage common terminal；The linear power supply module is to input Voltage carries out linear voltage stabilization and obtains the supply voltage for the crystal oscillator to be measured being plugged on the test plate；

The external dc voltage is 15V, and the power filtering module includes power filter chip BNX025H01L, the power supply The power input of filtering chip is connected by power switch with the anode of the external dc voltage, in the external dc electricity Pressure both ends be additionally provided with limiter diode, be also serially connected between the power input and input grounding end light emitting diode and Current-limiting resistance, after the power switch is closed, the light emitting diode is lighted, and indicates that the external dc voltage has connect Enter, for the output end of the power filter chip to rear stage output by the DC voltage of voltage regulation filtering, three export ground terminals Altogether.

3. the test system according to claim 2 suitable for plurality of specifications crystal oscillator, which is characterized in that the third test 4 jacks of socket include Switching Power Supply control terminal and corresponding ground terminal, and low pressure selects end and corresponding ground terminal, passes through institute Corresponding third test pin groups are stated on test plate by the Switching Power Supply control terminal is hanging or ground connection, the low pressure is selected End is hanging or is grounded；

The switch power module includes switching power source chip TPS54327, the ends VIN and the electricity of the switching power source chip The output end of source filtering chip BNX025H01L is electrically connected, on the one hand the ends EN connect the Switching Power Supply control terminal, on the other hand It is also electrically connected with the ends VIN by the first enabled resistance, when Switching Power Supply control terminal is hanging, the ends EN pass through described One enabled resistance obtains enable signal and makes the switching power source chip TPS54327 work, when Switching Power Supply control terminal with it is right When the ground terminal electrical connection answered, then the switching power source chip TPS54327 does not work；

The ends VBST of the switching power source chip TPS54327 are electrically connected by capacitance with the ends SW, first output of the ends SW concatenation Inductance, the other end output switch power source output voltage of first outputting inductance；

For the switch power source output voltage further by partial pressure RC network regulation and control, the partial pressure RC network includes described in connection The other end of first divider resistance of switch power source output voltage, first divider resistance connects the switching power source chip The ends VFB of TPS54327 are also parallel with the first derided capacitors at the both ends of first divider resistance, and the ends VFB also pass through The second divider resistance, third divider resistance and the 4th divider resistance that are sequentially connected in series and be grounded, in the third divider resistance and It is also electrically connected with low pressure selection end between 4th divider resistance, and is exported in the power filter chip BNX025H01L When voltage is 15V, when low pressure selection end ground connection, the switch power source output voltage is 6.6V, when the low pressure selects When holding hanging, the switch power source output voltage is 4.8V；

The switch power source output voltage of the first outputting inductance output is input to the LC accumulators, the LC energy storage Circuit includes 4 polarity free capacitors in parallel and the energy storage inductor that is electrically connected with first outputting inductance, described nonpolarity One end of capacitance is electrically connected with first outputting inductance and energy storage inductor, and the other end of the polarity free capacitor is grounded, The both ends of the energy storage inductor are electrically connected with the anode of 2 polar capacitors respectively, and the cathode of the polar capacitor is grounded.

4. the test system according to claim 3 suitable for plurality of specifications crystal oscillator, which is characterized in that second test Socket includes linear power supply Enable Pin and corresponding ground terminal, and the first partial pressure control terminal and corresponding ground terminal, the second partial pressure are controlled End processed and corresponding ground terminal are hanged the linear power supply Enable Pin by the corresponding second test pin groups of the test plate Empty or ground connection described first will divide that control terminal is hanging or ground connection, described second will divide control terminal vacantly or be grounded；

The linear power supply module includes linear power supply chip LM1085, and the ends IN of the linear power supply chip are surveyed with described first The voltage common terminal electrical connection of socket is tried, the ends ADJ connect the collector of a triode, and the emitter of the triode connects Ground, base stage connect the first enabled resistance, and the other end of the first enabled resistance connects the second enabled resistance, the second enabled resistance it is another One end is also electrically connected with the voltage common terminal of first test jack, in the described first enabled resistance and the second enabled electricity It is electrically connected with the linear power supply Enable Pin between resistance；

When the linear power supply Enable Pin is hanging, the triode ON, the ends the ADJ ground connection of the chip LM1085 corresponds to OUT terminal be reference voltage output；When the linear power supply Enable Pin is grounded, the triode cut-off, the chip The ends ADJ of LM1085 are earth-free, the partial pressure value of corresponding OUT terminal output controllable resistor network；

The controllable resistor network includes the first linear divider resistance and the ADJ between the ends ADJ and the OUT terminal The second linear divider resistance, third linear divider resistance, the 4th linear divider resistance, the are in series between end and the ground terminal Five linear divider resistances, the 6th linear divider resistance, and in the third linear divider resistance and the 4th linear divider resistance Between with it is described first partial pressure control terminal be electrically connected, between the 5th linear divider resistance and the 6th linear divider resistance and The second partial pressure control terminal electrical connection；

When the IN of the linear power supply chip is terminated into 15V, the first partial pressure control terminal and the second partial pressure control terminal are outstanding Sky, the OUT terminal export 12V voltages；When the IN of the linear power supply chip is terminated into 6.6V, the first partial pressure control terminal Vacantly, the second partial pressure control terminal ground connection, the OUT terminal export 5V voltages；When the IN of the linear power supply chip is terminated into 4.8V When, the first partial pressure control terminal ground connection, the second partial pressure control terminal is hanging, and the OUT terminal exports 3.3V voltages.

5. the test system according to claim 4 suitable for plurality of specifications crystal oscillator, which is characterized in that second test Socket includes source signal incoming end and corresponding ground terminal, and testing pin groups by the test plate corresponding second will be described Source signal incoming end is electrically connected or is grounded with the signal output pin for the crystal oscillator to be measured being plugged on the test plate；

Described for electrical test circuit further includes the Buffer output module of the source signal that is exported to crystal oscillator to be measured into row buffering, described slow Rush the input terminal and the power filter that output module includes chip BUF602ID and voltage stabilizing chip 78L10, the voltage stabilizing 78L10 The output end of chip BNX025H01L is electrically connected, the power end of the output end of the voltage stabilizing 78L10 to the chip BUF602ID 10V DC voltages, the negative power end ground connection of the chip BUF602ID are inputted, the source signal incoming end passes through partiting dc capacitor The signal output pin of crystal oscillator to be measured is accessed, and signal output end then passes through buffered by the resistance of concatenation and capacitance output Crystal oscillator output signal；

Second test jack further includes being electrically connected with the OUT terminal of the linear power supply chip LM1085 and being supplied for crystal oscillator to be measured The crystal oscillator voltage end of electricity tests pin groups by the crystal oscillator voltage end and crystalline substance to be measured by the test plate corresponding second The feeder ear electrical connection shaken；

First test jack further includes 12V voltage ends, 5V voltage ends and 3.3V voltage ends, and these three voltage ends are respectively It is grounded by the voltage indication light diode and current-limiting resistance of concatenation, passes through corresponding first test on the test plate The 12V voltage ends, 5V voltage ends or 3.3V voltage ends are electrically connected by pin groups with the crystal oscillator voltage end, then corresponding voltage Indication light diode is lighted.

6. the test system according to claim 5 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate Including two pieces of pcb boards that upper lower leaf fits together, wherein one piece of pcb board positioned at upper layer is grafting indicator board, under being located at Another piece of pcb board of layer is grafting circuit board, and the spring socket for being inserted into crystal oscillator pin is welded on the grafting circuit board, Then corresponding with the spring socket on grafting indicator board to offer grafting through-hole, the depth of the grafting through-hole is more than the spring socket Protrude the height of the grafting circuit board；The test pin groups are arranged at the back side of the grafting circuit board, and the test is inserted Plate is electrically connected by the pin groups with the test jack on test substrate；

The crystal oscillator Dimension Types of grafting through-hole adaptation include：4 needles, length × wide=12mm × 12mm；5 needles, long × wide= 20mm×12mm；5 needles, length × wide=20mm × 20mm；5 needles, length × wide=25mm × 25mm；5 needles, length × wide=27mm × 36mm；5 needles, length × wide=51mm × 41mm；5 needles, length × wide=51mm × 51mm.

7. the test system according to claim 6 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate For 12V power supply crystal oscillator test plate, it is described first test pin groups include high voltage input contact pin, low-voltage input contact pin, The public contact pin of voltage, 12V voltages indicate contact pin, respectively corresponding and first test jack high voltage input terminal, low-voltage Input terminal, voltage common terminal, 12V voltage end grafting；Also, the high voltage input contact pin is electrically connected with the public contact pin of the voltage It connects；

The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator to be measured, are waited for described Survey the source signal output contact pin of the signal output end electrical connection of crystal oscillator, to the linear electricity of the enabled controls of linear power supply chip LM1085 The first partial pressure control contact pin and second that source enables contact pin, carries out partial pressure control to the linear power supply module on the test substrate Partial pressure control contact pin, the crystal oscillator voltage end, source signal incoming end, linear power supply for corresponding to second test jack respectively are enabled End, the first partial pressure control terminal, the second partial pressure control terminal grafting；Also, the voltage output contact pin tests contact pin with described first 12V voltages instruction contact pin electrical connection in group, the linear power supply enable contact pin ground connection, the first partial pressure control contact pin It is hanging with the second partial pressure control contact pin；

The third test pin groups include that the switch electricity of enabled control is carried out to the switch power module on the test substrate Source controls contact pin, the Switching Power Supply control contact pin ground connection.

8. the test system according to claim 6 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate Plate is tested for the crystal oscillator of 5V power supplies, the first test pin groups include high voltage input contact pin, low-voltage input contact pin, electricity Public contact pin, 5V voltages instruction contact pin are pressed, it is corresponding respectively to be inputted with the high voltage input terminal of first test jack, low-voltage End, voltage common terminal, 5V voltage end grafting；Also, the low-voltage input contact pin is electrically connected with the public contact pin of the voltage；

The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator to be measured, are waited for described Survey the source signal output contact pin of the signal output end electrical connection of crystal oscillator, to the linear electricity of the enabled controls of linear power supply chip LM1085 The first partial pressure control contact pin and second that source enables contact pin, carries out partial pressure control to the linear power supply module on the test substrate Partial pressure control contact pin, the crystal oscillator voltage end, source signal incoming end, linear power supply for corresponding to second test jack respectively are enabled End, the first partial pressure control terminal, the second partial pressure control terminal grafting；Also, the voltage output contact pin tests contact pin with described first 5V voltages instruction contact pin electrical connection in group, the linear power supply enable contact pin ground connection, the first partial pressure control contact pin Vacantly, the second partial pressure control contact pin ground connection；

The third test pin groups include that the switch electricity of enabled control is carried out to the switch power module on the test substrate The low pressure selection contact pin that source controls contact pin, carries out low pressure selection to the switch power module, the Switching Power Supply control contact pin Ground connection, the low pressure selection contact pin ground connection.

9. the test system according to claim 6 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate For 3.3V power supply crystal oscillator test plate, it is described first test pin groups include high voltage input contact pin, low-voltage input contact pin, The public contact pin of voltage, 3.3V voltages indicate contact pin, respectively corresponding and first test jack high voltage input terminal, low-voltage Input terminal, voltage common terminal, 3.3V voltage end grafting；Also, the low-voltage input contact pin and the public contact pin electricity of the voltage Connection；

The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator to be measured, are waited for described Survey the source signal output contact pin of the signal output end electrical connection of crystal oscillator, to the linear electricity of the enabled controls of linear power supply chip LM1085 The first partial pressure control contact pin and second that source enables contact pin, carries out partial pressure control to the linear power supply module on the test substrate Partial pressure control contact pin, the crystal oscillator voltage end, source signal incoming end, linear power supply for corresponding to second test jack respectively are enabled End, the first partial pressure control terminal, the second partial pressure control terminal grafting；Also, the voltage output contact pin tests contact pin with described first 3.3V voltages instruction contact pin electrical connection in group, the linear power supply enable contact pin ground connection, and the first partial pressure control is inserted Needle is grounded, and the second partial pressure control contact pin is hanging；

The third test pin groups include that the switch electricity of enabled control is carried out to the switch power module on the test substrate The low pressure selection contact pin that source controls contact pin, carries out low pressure selection to the switch power module, the Switching Power Supply control contact pin Ground connection, the low pressure selection contact pin are hanging.

10. the test system according to any one of claims 7 to 9 suitable for plurality of specifications crystal oscillator, which is characterized in that institute It states and is provided on the grafting circuit board of test plate for determining at least two of the accurate grafting positioning of the test substrate Position hole.