CN1355433A - Tester for measuring frequency of quartz oscillator - Google Patents
Tester for measuring frequency of quartz oscillator Download PDFInfo
- Publication number
- CN1355433A CN1355433A CN 00132579 CN00132579A CN1355433A CN 1355433 A CN1355433 A CN 1355433A CN 00132579 CN00132579 CN 00132579 CN 00132579 A CN00132579 A CN 00132579A CN 1355433 A CN1355433 A CN 1355433A
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- Prior art keywords
- tester
- frequency
- detect
- quartz oscillator
- housing
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000010453 quartz Substances 0.000 title claims abstract description 37
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 37
- 238000012360 testing method Methods 0.000 claims abstract description 25
- 230000000694 effects Effects 0.000 claims description 2
- 238000003780 insertion Methods 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims description 2
- 238000004806 packaging method and process Methods 0.000 claims description 2
- 230000010355 oscillation Effects 0.000 abstract description 6
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 235000014347 soups Nutrition 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- Tests Of Electronic Circuits (AREA)
- Oscillators With Electromechanical Resonators (AREA)
Abstract
A tester for detecting the frequency of quartz oscillator has at least two test windows and a metherboard on which there are a SMT element socket and a DIL package socket for testing different package types. After the element is inserted in the said socket, its oscillation frequency can be shown on its display.
Description
The present invention relates to a kind of in order to detect the tester of frequency of quartz oscillator, its need are put into detected quartz (controlled) oscillator on the set test runners of this tester, the tester can read the correct oscillation frequency of this quartz (controlled) oscillator in the display on this tester.
General in electronic installation sometimes because of the needs of its function, and being set in the electronic component within it, a quartz (controlled) oscillator (Oscillator) uses as sequential (clock), for the frequency of guaranteeing this quartz (controlled) oscillator can reach certain degree of accuracy, usually there are the place of using this type of quartz (controlled) oscillator in designer, maintenance personal, QC testing staff and other part manufacturers, generally all can detect at the frequency of this quartz (controlled) oscillator.
The tester shook the soup device when detecting to this quartz in the past, all need employ several equipment, as: power supply unit, measurement jig, counter and numerous connecting line, prod (line), just can detect.
From the above mentioned as can be known, under the traditional detection practice need cooperatively interact by several equipment, can detect this frequency of quartz oscillator, and the combination of these equipment not only complicated operation, take and detect the space, simultaneously poor mobility, can't need carry arbitrarily according to actual detected more, the field of employment of limiting to these Equipment Inspections so, greatly.In addition, because these checkout equipments are to be cooperatively interacted by individual equipment respectively to form, so when a cooperating equipment generation problem wherein, certainly will cause these checkout equipments in detection, to break down, and these checkout equipments also will cause many cost burdens on maintenance cost.
Therefore, if can design a kind of convenience and practical tester, only need a quartz (controlled) oscillator to be measured is put into this tester, and need not to connect various complex apparatus, can read the correct oscillation frequency of this quartz (controlled) oscillator fast, then not only can reduce traditional inconvenience that on trace routine, is caused and time, pecuniary waste, also can significantly save the manpower and the time of the required cost of trace routine simultaneously.
It is a kind of in order to detect the tester of frequency of quartz oscillator that fundamental purpose of the present invention is to provide, it is by its single equipment of tester, and it can reach the purpose that detects this frequency of quartz oscillator under needing cooperatively interact by several equipment can effectively to replace traditional test equipment.
Another object of the present invention is to provide a kind of in order to detect the tester of frequency of quartz oscillator, wherein the surface mounted component of this tester test runners and dual-in-line package are tested runners plugging by the mobilizable electronics runners of a tool respectively, two kinds of differences that convert 8 pins (PIN) and 14 pins (PIN) to plug specification, and the different pins (PIN) that can satisfy tested side electronic component plug.
Of the present invention in order to detect the tester of frequency of quartz oscillator, comprising: a hollow housing, this housing is provided with at least two instrument connections; One motherboard is provided in a side of in this housing, is respectively equipped with surface mounted component test runners and the direct insertion packaging and testing runners of a biserial on this motherboard, and these two test runners are corresponding with two instrument connections of this housing respectively; One voltage changeover switch is to be connected with this motherboard, and exposes on this housing; One power switch is to be connected with this motherboard, and exposes on this housing; One display is to be connected with this motherboard, and exposes on this housing.
This tester also is provided with a Power Supply Unit, it is by the control of this power switch, supply with required electric power in this tester, and detected frequency of quartz oscillator is by the accumulative total of the counter in this tester, the coding of the scrambler in this tester, converting the receivable signal of this display to, and be presented on this display.
Effect of the present invention is: only need detected quartz (controlled) oscillator is put on the set test runners of this tester, the tester can be in the display on this tester, read the correct oscillation frequency of this quartz (controlled) oscillator, because the single equipment by this tester can replace traditional test equipment, so do not exist and to connect complicated operation that various device caused, take and detect space and poor mobility, and can't shortcoming such as need carry arbitrarily according to actual inspection side.
Simple declaration to accompanying drawing:
Fig. 1 is device appearance synoptic diagram of the present invention;
Fig. 2 is cut-away section synoptic diagram of the present invention;
Fig. 3 is hardware blocks arrangement plan of the present invention.
The present invention is described in detail below in conjunction with accompanying drawing.
The present invention is a kind of in order to detect the tester of frequency of quartz oscillator, see also Fig. 1 and Fig. 2, it mainly is quartz (controlled) oscillator (oscillator) frequency that is used to detect in the electronic component, and the single equipment by this tester 1 can effectively replace traditional test equipment, and it can reach the purpose that detects the quartz (controlled) oscillator rate under needing cooperatively interact by several equipment.
Tester 1 of the present invention, mainly be to have a hollow housing 10, this housing 10 is provided with at least two instrument connections 101, these two instrument connections 101 respectively with this housing 10 in a set surface mounted component (surface mount device, hereinafter to be referred as SMD) test runners 21, and a dual-in-line package (dual inline package is hereinafter to be referred as DIP) test runners 22 is corresponding, and these two test runners the 21, the 22nd are connected with housing 10 interior set motherboards 20 respectively.
In the present invention, this motherboard 20 is laid with an associated electronic components and the circuit (not shown) that can examine this frequency of quartz oscillator of side, again, be respectively equipped with voltage changeover switch 30, a power switch 31 and a display 40 that exposes on this housing 10 on this housing 10, it is connected with this motherboard 20 respectively, and two kinds of different voltages by this voltage changeover switch 30 changeable one-tenth 5V and 3.3V, the power supply of this tester 1 can be opened and close by this power switch 31, the correct frequency of this quartz (controlled) oscillator can be shown by this display 40.
In the present invention, this power switch 31 is to provide its required power supply by this tester 1 a built-in battery 32 or external AC and DC power supply 33, and as shown in Figure 3, and this display 40 can be LCD or light emitting diode indicator.
In the present invention, this SMD test runners 21 and DIP test runners 22, two kinds of differences that can be respectively convert 8 pins (PIN) and 14 pins (PIN) to by plugging of a mobilizable electronics runners 23 plug specification, and the different pins (PIN) that can satisfy this detected electronic component 2 plug.
See also shown in Figure 3, it is a hardware blocks arrangement plan of the present invention, wherein be provided with a Power Supply Unit 34 in this tester 1, this Power Supply Unit 34 is the control by this power switch 31, this battery 32 maybe should be handed over, the power supply of direct supply 33, successfully supply with the element of required electric power in this tester 1, the tester then can be according to the operating voltage of detected electronic component 2, switch the correct voltage specification of this voltage changeover switch 30 for 5V or 3.3V, at this moment, be located at this SMD test runners 21, or the quartz (controlled) oscillator oscillation frequency within the detected electronic component on this DIP test runners 22, will be by the accumulative total of the counter 35 in this tester 1, the coding of the scrambler 36 in this tester 1, converting this display 40 receivable signals to, and be presented on this display 40.
So, can pass through this tester 1 its single equipment of the present invention, detect the correct oscillation frequency of the quartz (controlled) oscillator in this detected electronic component, need combination by several equipment could detect to cause complicated operation, take the detection space thereby can effectively solve traditional test equipment, while poor mobility and can't shortcoming such as need carry arbitrarily according to actual detected.
Claims (8)
1, a kind of in order to detect the tester of frequency of quartz oscillator, it is characterized in that comprising: a hollow housing, this housing is provided with at least two instrument connections; One motherboard is provided in a side of in this housing, is respectively equipped with surface mounted component test runners and the direct insertion packaging and testing runners of a biserial on this motherboard, and these two test runners are corresponding with two instrument connections of this housing respectively; One voltage changeover switch is to be connected with this motherboard, and exposes on this housing; One power switch is to be connected with this motherboard, and exposes on this housing; One display is to be connected with this motherboard, and exposes on this housing.
2, as claimed in claim 1 in order to detect the tester of frequency of quartz oscillator, it is characterized in that being provided with in this tester its control of a Power Supply Unit by this power switch, supply with required electric power in this tester, and detected frequency of quartz oscillator is by the accumulative total of the counter in this tester, the coding of the scrambler in this tester, converting the signal that this display receives to, and be presented on this display.
3, as claimed in claim 2 in order to detect the tester of frequency of quartz oscillator, it is characterized in that this power switch controls the built-in battery supply of this tester and supply with this Power Supply Unit.
4, as claimed in claim 2 in order to detect the tester of frequency of quartz oscillator, it is characterized in that this power switch controls external one the exchanging or this Power Supply Unit of direct-current power supply of this tester.
5, as claimed in claim 1 in order to detect the tester of frequency of quartz oscillator, it is characterized in that this surface mounted component test runners and dual-in-line package test runners plugging of the electronics runners by an activity respectively, two kinds of differences that convert 8 pins and 14 pins to plug specification.
6, as claimed in claim 1 in order to detect the tester of frequency of quartz oscillator, it is characterized in that switching to 5V and two kinds of voltages of 3.3V by this voltage changeover switch.
7, as claimed in claim 1 in order to detect the tester of frequency of quartz oscillator, it is characterized in that this display is a LCD.
8, as claimed in claim 1 in order to detect the tester of frequency of quartz oscillator, it is characterized in that this display is a light emitting diode indicator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB001325795A CN1192238C (en) | 2000-11-29 | 2000-11-29 | Tester for measuring frequency of quartz oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB001325795A CN1192238C (en) | 2000-11-29 | 2000-11-29 | Tester for measuring frequency of quartz oscillator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1355433A true CN1355433A (en) | 2002-06-26 |
| CN1192238C CN1192238C (en) | 2005-03-09 |
Family
ID=4595251
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB001325795A Expired - Fee Related CN1192238C (en) | 2000-11-29 | 2000-11-29 | Tester for measuring frequency of quartz oscillator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1192238C (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103308785A (en) * | 2012-03-06 | 2013-09-18 | 海洋王（东莞）照明科技有限公司 | Crystal oscillation detection circuit and crystal oscillation detection device |
| CN103884418A (en) * | 2014-04-17 | 2014-06-25 | 山西大学 | Tuning fork type quartz crystal oscillator resonant frequency measurement method based on sound excitation and device |
| CN108414869A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test system suitable for plurality of specifications crystal oscillator |
| CN108414922A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test device suitable for plurality of specifications crystal oscillator |
| CN108710025A (en) * | 2016-01-22 | 2018-10-26 | 浙江大学台州研究院 | Quartz wafer grinding control based on Waveform Matching and frequency measuring method |
| CN111624419A (en) * | 2020-04-23 | 2020-09-04 | 航天科工防御技术研究试验中心 | Test adapter and test system of crystal oscillator |
-
2000
- 2000-11-29 CN CNB001325795A patent/CN1192238C/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103308785A (en) * | 2012-03-06 | 2013-09-18 | 海洋王（东莞）照明科技有限公司 | Crystal oscillation detection circuit and crystal oscillation detection device |
| CN103884418A (en) * | 2014-04-17 | 2014-06-25 | 山西大学 | Tuning fork type quartz crystal oscillator resonant frequency measurement method based on sound excitation and device |
| CN103884418B (en) * | 2014-04-17 | 2015-12-09 | 山西大学 | Based on measuring method and the device of the tuning-fork type quartz crystal oscillator resonance frequency of acoustically-driven |
| CN108710025A (en) * | 2016-01-22 | 2018-10-26 | 浙江大学台州研究院 | Quartz wafer grinding control based on Waveform Matching and frequency measuring method |
| CN108710025B (en) * | 2016-01-22 | 2020-06-09 | 浙江大学台州研究院 | Quartz wafer grinding control and frequency measurement method based on waveform matching |
| CN108414869A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test system suitable for plurality of specifications crystal oscillator |
| CN108414922A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test device suitable for plurality of specifications crystal oscillator |
| CN108414869B (en) * | 2018-06-11 | 2023-09-29 | 南京尤尼泰信息科技有限公司 | Test system suitable for multiple specification crystal oscillator |
| CN111624419A (en) * | 2020-04-23 | 2020-09-04 | 航天科工防御技术研究试验中心 | Test adapter and test system of crystal oscillator |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1192238C (en) | 2005-03-09 |
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