CN207742298U - A kind of chip ageing test device - Google Patents
A kind of chip ageing test device Download PDFInfo
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- CN207742298U CN207742298U CN201721922058.7U CN201721922058U CN207742298U CN 207742298 U CN207742298 U CN 207742298U CN 201721922058 U CN201721922058 U CN 201721922058U CN 207742298 U CN207742298 U CN 207742298U
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Abstract
The utility model proposes a kind of chip ageing test devices, including power module, power conversion module, test module, control module and display module；Test module is connected to power module by power conversion module；Control module is separately connected power module, display module and test module；Power conversion module acquires voltage signal in power module and current signal and converts increase voltage and current in real time, transformed voltage and current is exported to test module, the ageing properties of test module test chip sample, control module controls switch testing module and the parameter of test module is arranged, and display module is used for the parameter of display control module setting.Chip ageing test device provided by the utility model can safely promote the upper limit of board power supply stream under conditions of not reequiping original device by the way that power conversion module is arranged in a manner of power invariability, to realize the burn-in test to different test condition chips, its is simple in structure, applied widely.
Description
Technical field
The utility model is related to chip testing technology fields, especially chip ageing test device.
Background technology
Existing chip aging board is powered by the way of direct external power supply currently on the market, power supply mode
It is single, and the often pattern of high voltage low current.It is low with the development of electronics manufacturing process technology and the progress of IC calculation functions
The product of voltage high current is gradually coming into vogue on the market, these aging boards are not suitable for the survey of these advanced electronic products
Examination, and it is often at high price to buy a new test machine suitable for low voltage and high current so that testing cost carries significantly
Height, and these aging boards are equally all single-mode power supplies, limit its use.
Utility model content
To solve the above-mentioned problems, the utility model proposes a kind of chip ageing test device, can not reequip it is original-pack
The upper limit of board power supply stream is safely promoted under conditions of setting in a manner of power invariability.
What the utility model was achieved through the following technical solutions：A kind of chip ageing test device, including power module, work(
Rate conversion module, test module, control module and display module；The test module is connected by the power conversion module
To the power module；The control module is separately connected the power module, the display module and the test module；
The power module provides power supply for the chip ageing test device；The power conversion module acquires the power supply mould in real time
Voltage signal and current signal in the block simultaneously convert increase voltage and current, and transformed voltage and current is exported to the test
Module, the ageing properties of the test module test chip sample, the control module control switch the test module and set
The parameter of the test module is set, the display module is used to show the parameter of the control module setting.
Further, the chip ageing test device further includes plugboard, and the plugboard is electrically connected the power supply mould
Block and the test module, the power conversion module are plugged on the plugboard, and the power conversion module can be from described
It is removed on plugboard.
Further, the power conversion module includes input terminal and output end, and the input terminal connects the power supply mould
Block, the output end connect the test module and provide power supply to the test module.
Further, the display module includes LED display, and the LED display is for showing the chip aging
The test parameter of test device.
The beneficial effects of the utility model：The utility model provides a kind of chip ageing test device, by power supply
One power conversion module is set between module and test module, output current source function can be improved, be not only suitable for high pressure system
System, is also applied for low-pressure system, and use scope is wider, and its is simple in structure, dismounting need not be carried out to machine, increasing can be realized
Big output current, significantly reduces testing cost.
Description of the drawings
Fig. 1 is the structural schematic diagram of the chip ageing test device of the utility model；
Fig. 2 is the circuit diagram of the power conversion module of the chip ageing test device of the utility model；
Fig. 3 is the circuit diagram of another power conversion module of the chip ageing test device of the utility model.
Specific implementation mode
In order to it is clearer, completely illustrate the technical solution of the utility model, below in conjunction with the accompanying drawings to the utility model
It is described further.
~Fig. 3 is please referred to Fig.1, includes power module 20, power turn the utility model proposes chip ageing test device 10
Change the mold block 30, test module 40, control module 50 and display module 60；The test module 40 passes through the power modulus of conversion
Block 30 is connected to the power module 20；The control module 50 is separately connected the power module 20, the display module 60
And the test module 40；The power module 20 is that the chip ageing test device 10 provides power supply；The power turns
Mold changing block 30 acquires voltage signal in the power module 20 and current signal and converts increase voltage and current in real time, converts
Voltage and current afterwards is exported to the test module 40, the ageing properties of 40 test chip sample of the test module, described
The control of control module 50 switchs the test module 40 and the parameter of the test module 40 is arranged, and the display module 60 is used for
Show the parameter that the control module 50 is arranged.Chip ageing test device 10 provided by the utility model is equipped with power modulus of conversion
Block 30, main function is the way of output that the output of the high voltage low current of power supply is converted to low voltage and high current, steady
Determine to have the function that increasing output current can be not required to by power conversion module 30 as setting on the basis of power
The test realized on the basis of chip ageing test device 10 to the chip of different running environment is reequiped, meanwhile, this practicality is newly
The preferably dismountable power conversion module 30 of the chip ageing test device 10 of type, can need to tear open at any time according to actual test
Fill power conversion module 30, it is more convenient to use to change the input voltage of test module 40 and the size of electric current, and it is this can
30 assembling mode of power conversion module of dismounting is simple, easy to operate, can effectively increase chip ageing tester 10
The scope of application reduces the cost of chip testing.Fig. 2 and Fig. 3 is respectively that the circuit of the power conversion module 30 of the utility model shows
It is intended to, circuit composition includes becoming electric appliance, capacitance and resistor, and different conversion circuits can be used according to the demand of actual use
To realize the conversion to supply voltage and electric current.
Preferably, the chip ageing test device 10 further includes plugboard 70, and the plugboard 70 is electrically connected the electricity
Source module 20 and the test module 40, the power conversion module 30 are plugged on the plugboard 70, the power conversion
Module 30 can be removed from the plugboard 70.The preferably dismountable power conversion module 30 of the utility model, by by power
Conversion module 30 is mounted on plugboard 70, and power module 20 can directly pass through plugboard 70 and chip ageing test device 10
Connection is to realize power supply, or power conversion module 30 is plugged on plugboard 70, by power conversion module 30 by power supply mould
The voltage and current of block 20 realizes and powers to chip ageing test device 10 that the setting of plugboard 70 can facilitate after being converted
Preferably plugboard 70 is arranged in chip ageing test device 10 for the installation and removal of power conversion module 30, the use of the new type
Outside, the power cord inside grafting position connection plugboard 70 on plugboard 70, passes through internal power cord connection power module 20
With test module 40, when not installing power conversion module 30, plugboard 70 is equivalent to the effect of power cord, continuity test module
40 are powered with realizing to test module 40 with power module 20, when needing to test the chip under low-voltage, high current environment,
Power conversion module 30 is mounted on plugboard 70, power module 20 is supplied by power conversion module 30 to test module 40
Electricity.The setting of plugboard 70 realizes the simple-mounting-dismounting of power conversion module 30, convenient at any time to chip ageing test device 10
Power supply converted.
Preferably, the power conversion module 30 includes input terminal 31 and output end 32, and the input terminal 31 connects described
Power module 20, the output end 32 connect the test module 40 and provide power supply to the test module 40.Power is converted
Module 30 can be fast by the way that input terminal 31 and output end 32 to be plugged on plugboard 70 including input terminal 31 and output end 32
Fast installation power conversion equipment, it is easy to operate convenient for repacking.
Preferably, the display module 60 includes LED display 61, and the LED display 61 is for showing the chip
The test parameter of ageing tester 10.The chip ageing test device 10 of the utility model preferably uses LED display 61 to make
It, to show the test parameter being arranged by control module 50, is gone back simultaneously for display module 60 by being connect with control module 50
It can be convenient for the setting of parameter with the test result of real-time display chip, while be conducive to tester and observing test case at any time
And test result.
Certainly, the utility model can also have other numerous embodiments, be based on present embodiment, the ordinary skill of this field
Personnel's obtained other embodiment under the premise of not making any creative work, belongs to the utility model and is protected
Range.
Claims (4)
1. a kind of chip ageing test device, which is characterized in that the chip ageing test device includes power module, power turn
Change the mold block, test module, control module and display module；The test module is connected to institute by the power conversion module
State power module；The control module is separately connected the power module, the display module and the test module；It is described
Power module provides power supply for the chip ageing test device；The power conversion module is acquired in real time in the power module
Voltage signal and current signal and convert increase voltage and current, transformed voltage and current is exported to the test mould
Block, the ageing properties of the test module test chip sample, the control module control switch the test module and are arranged
The parameter of the test module, the display module are used to show the parameter of the control module setting.
2. chip ageing test device according to claim 1, which is characterized in that the chip ageing test device also wraps
Plugboard is included, the plugboard is electrically connected the power module and the test module, and the power conversion module is plugged on institute
It states on plugboard, the power conversion module can be removed from the plugboard.
3. chip ageing test device according to claim 1, which is characterized in that the power conversion module includes input
End and output end, the input terminal connect the power module, and the output end connects the test module and to the test
Module provides power supply.
4. chip ageing test device according to claim 1, which is characterized in that the display module includes that LED is shown
Screen, the LED display are used to show the test parameter of the chip ageing test device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721922058.7U CN207742298U (en) | 2017-12-29 | 2017-12-29 | A kind of chip ageing test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721922058.7U CN207742298U (en) | 2017-12-29 | 2017-12-29 | A kind of chip ageing test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207742298U true CN207742298U (en) | 2018-08-17 |
Family
ID=63121106
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721922058.7U Active CN207742298U (en) | 2017-12-29 | 2017-12-29 | A kind of chip ageing test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207742298U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109799451A (en) * | 2019-04-16 | 2019-05-24 | 长沙丰灼通讯科技有限公司 | A kind of current testing device on production line |
| CN113064052A (en) * | 2021-03-24 | 2021-07-02 | 深圳佰维存储科技股份有限公司 | Chip aging test circuit and chip aging test system |
-
2017
- 2017-12-29 CN CN201721922058.7U patent/CN207742298U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109799451A (en) * | 2019-04-16 | 2019-05-24 | 长沙丰灼通讯科技有限公司 | A kind of current testing device on production line |
| CN109799451B (en) * | 2019-04-16 | 2019-07-12 | 长沙丰灼通讯科技有限公司 | A kind of current testing device on production line |
| CN113064052A (en) * | 2021-03-24 | 2021-07-02 | 深圳佰维存储科技股份有限公司 | Chip aging test circuit and chip aging test system |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518000 Guangdong Shenzhen Nanshan District Nanshan District High Street Industrial Park R2 factory building Patentee after: Suzhou Yite (Shenzhen) Testing Technology Co., Ltd Address before: 518000 Guangdong Shenzhen Nanshan District Nanshan District High Street Industrial Park R2 factory building Patentee before: SHENZHEN YITE DETECTION TECHNOLOGY Co.,Ltd. |