CN104090199B - Device for simulating poor power source contact phenomenon in use process of electric appliance - Google Patents
Device for simulating poor power source contact phenomenon in use process of electric appliance Download PDFInfo
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- CN104090199B CN104090199B CN201410321341.9A CN201410321341A CN104090199B CN 104090199 B CN104090199 B CN 104090199B CN 201410321341 A CN201410321341 A CN 201410321341A CN 104090199 B CN104090199 B CN 104090199B
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- circuit
- relay
- described relay
- electrical power
- single chip
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Abstract
The invention discloses a device for simulating a poor power source contact phenomenon in the use process of an electric appliance. The device comprises a single chip microcomputer circuit, a relay driving circuit, a relay, a key circuit, a display circuit and a power circuit, the control end of the relay is connected with the single chip microcomputer circuit through the relay driving circuit, the controlled end of the relay is connected with a live wire of a testing model computer, the key circuit and the display circuit are connected with the single chip microcomputer circuit, and the power circuit is connected with the single chip microcomputer circuit, the relay driving circuit and the display circuit. The device for simulating the poor power source contact phenomenon in the use process of the electric appliance achieves the aim of simulating the poor power source contact phenomenon under the high safety assurance condition; moreover, operating time and the frequency time can be regulated through the key circuit, power sources of currents with different peak values can be obtained, and the high precision of the test result is ensured. In addition, the device is simple in structure, low in cost and convenient to operate.
Description
Technical field
The present invention relates to assay device, electrical power contacts bad phenomenon during more particularly to a kind of analog electronics use
Device.
Background technology
The electrical equipment such as air-conditioning frequently occur the bad phenomenon of electrical power contacts during actually used (operation), and electrical power contacts are not
Good moment can produce peak point current, easily leads to the controller of electrical equipment to break down, and leads to product repair rate high.For simulating sky
The bad this phenomenon of electrical power contacts that the electrical equipment such as tune occur in use, and this phenomenon is attached in test, checking is empty
Electrical equipment reliabilities of operation in the case that electrical power contacts are bad such as tune, to reach the purpose improving the electric properties such as air-conditioning, have
Necessity carries out the test of the bad related fields of electrical power contacts, but test in this respect at present is blank.
Content of the invention
For above-mentioned state of the art, the technical problem to be solved is, provides a kind of analog electronics to make
With during electrical power contacts bad phenomenon device, by this device high security, accurately analog electronics use during
Electrical power contacts bad phenomenon.
In order to solve above-mentioned technical problem, during a kind of analog electronics provided by the present invention use, electrical power contacts are bad
The device of phenomenon, comprising: single chip circuit, relay drive circuit, relay, key circuit, display circuit and power circuit,
The control end of described relay is connected with described single chip circuit through described relay drive circuit, being controlled of described relay
End is connected with the live wire of test prototype, and described key circuit and described display circuit are connected with described single chip circuit, described electricity
Source circuit is connected with described single chip circuit, described relay drive circuit and described display circuit.
Wherein in an embodiment, described relay drive circuit includes relay driving chip, and described relay drives
The signal input interface of dynamic chip is connected with the signal output interface of described single chip circuit, the letter of described relay driving chip
Number output interface is connected with the control end of described relay.
Wherein in an embodiment, described relay drive circuit also includes diode, and described diode is continued with described
The control end of electrical equipment is in parallel.
Wherein in an embodiment, described relay drive circuit also includes filter capacitor, described filter circuit and institute
The control end stating relay is in parallel.
Wherein in an embodiment, described relay drive circuit also includes light emitting diode and dropping resistor, described
In parallel with the control end of described relay after light emitting diode and the series connection of described dropping resistor.
Wherein in an embodiment, described relay be more than two, all described relays respectively with described relay
The signal output interface of device driving chip connects.
Wherein in an embodiment, the action response time of described relay is 0.01～0.99 second.
Wherein in an embodiment, the rated current >=30a of described relay.
Wherein in an embodiment, during described analog electronics use, the device of electrical power contacts bad phenomenon also wraps
Include:
Communicating circuit, described communicating circuit is connected with described single chip circuit.
Wherein in an embodiment, described display circuit includes display driver circuit and digital display tube, described number
Display tube is connected with described single chip circuit through described display driver circuit.
The device of electrical power contacts bad phenomenon during the analog electronics use that the present invention provides, by single chip circuit control
Relay processed carries out moment and leads to → disconnected → logical switching, makes test prototype live wire synchronously complete logical → disconnected → logical switching, circuit
Obtain crest voltage and electric current in the handoff procedure of moment, it is achieved thereby that in the case that high safety ensures, analog power
Loose contact phenomenon；And, run time, frequency number of times can be adjusted by key circuit, different peaks can be obtained
The power supply of value electric current is it is ensured that the high accuracy of test result；Additionally, this apparatus structure is simple, with low cost, easy to operate.
Additional technical feature of the present invention is had the advantage that will be said in this specification specific embodiment part
Bright.
Brief description
Fig. 1 is the device of electrical power contacts bad phenomenon during the analog electronics use in the one of embodiment of the present invention
Circuit block diagram；
Fig. 2 is the circuit diagram of the single chip circuit in the embodiment of the present invention；
Fig. 3 is the circuit diagram of the relay drive circuit in the embodiment of the present invention；
Fig. 4 is the circuit diagram of the display circuit in the embodiment of the present invention；
Fig. 5 is the circuit diagram of the key circuit in the embodiment of the present invention；
Fig. 6 is the circuit diagram of the communicating circuit in the embodiment of the present invention；
Fig. 7 is the circuit diagram of the power circuit in the embodiment of the present invention.
Specific embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments the present invention is described in detail.It should be noted that not conflicting
In the case of, the feature in following embodiment and embodiment can be mutually combined.
As shown in figure 1, analog electronics in the one of embodiment of the present invention use during electrical power contacts bad phenomenon
Device include: single chip circuit 10, relay drive circuit 20, some relays 30, key circuit 50, display circuit 40 and
Power circuit 70, wherein, the control end of described relay 30 is through described relay drive circuit 20 and described single chip circuit 10
Connect, the controlled terminal of described relay 30 is connected with the live wire of testing air conditioner model machine, and described single chip circuit 10 brings into operation
When, carry out corresponding actions by judging set time, frequency number of times, by the 30 moment switching of action control relay；Institute
State key circuit 50 and described display circuit 40 to be connected with described single chip circuit 10, when described key circuit 50 is used for running
Between, the adjustment of frequency number of times, described display circuit 40 is used for showing run time, frequency number of times；Described power circuit 70 with described
Single chip circuit 10, described relay drive circuit 20 and described display circuit 40 connect, and are that whole device is powered.
Fig. 2 show the circuit diagram of the single chip circuit 10 in the present embodiment, and single chip circuit 10 adopts atwl16l monolithic
Machine.
Fig. 3 show the circuit diagram of the relay drive circuit 20 in the present embodiment.Relay drive circuit 20 includes continuing
Electrical equipment drive chip, signal input interface pd4, pd5, pd6, pd7 letter with single-chip microcomputer respectively of described relay driving chip
Number output interface pd4, pd5, pd6, pd7 connect, the signal output interface 15,16 of described relay driving chip respectively with two
The control end of relay connects.Preferably, described relay drive circuit 20 also includes diode d15, d17, described diode
D15, d17 are in parallel with the control end of described relay 30.The electronic of relay coil generation is absorbed by diode d15, d17
Gesture, prevents electromotive force from damaging relay driving chip.Preferably, described relay drive circuit 20 also include filter capacitor c8,
C9, described filter circuit is in parallel with the control end of described relay.Absorb relay quick on-off by filter capacitor c8, c9 to produce
Raw peak point current, prevents peak point current from causing relay misoperation to make.Preferably, described relay drive circuit 20 also includes sending out
After optical diode d16, d18 and dropping resistor r8, r9, described light emitting diode d16, d18 and described dropping resistor r8, r9 series connection
In parallel with the control end of described relay 30.Whether work from external observation relay by light emitting diode d16, d18 are convenient.
For high precision analog power loose contact phenomenon, the action response time of described relay 30 is 0.01～0.99 second.In order to
Relay is prevented to be burned, the rated current >=30a of described relay 30.Preferably, the quantity of described relay 30 is two
More than, so can test multiple stage testing air conditioner model machine, efficiency high simultaneously.
Fig. 4 show the circuit diagram of the display circuit 40 in the present embodiment.Described display circuit 40 includes display and drives electricity
Road and digital display tube, described digital display tube is connected with described single chip circuit 10 through described display driver circuit.Display electricity
Road 40 adopts digital display tube, can reduce installation cost.
Fig. 5 show the circuit diagram of the key circuit 50 in the present embodiment.By key circuit 50 adjustment run time, frequently
Rate number of times.
Preferably, also include communicating circuit 60, described communicating circuit 60 is connected with described single chip circuit 10.By communication
Circuit 60 is by the data transfer of process of the test to computer record.Fig. 6 show the circuit diagram of the communicating circuit 60 in the present embodiment.
Power circuit 70 provides power supply for whole device.Fig. 7 show the circuit diagram of the power circuit 70 in the present embodiment.
To sum up, the device of electrical power contacts bad phenomenon during the analog electronics of the embodiment of the present invention use, by monolithic
Dynamo-electric road 10 control relay carries out moment and leads to → disconnected → logical switching, so that test prototype live wire is synchronously completed logical → disconnected → logical
Switching, circuit obtains crest voltage and electric current in the handoff procedure of moment, it is achieved thereby that in the case that high safety ensures,
Analog power loose contact phenomenon；And, run time, frequency number of times can be adjusted by key circuit 50, permissible
Obtain the power supply of different peak point currents it is ensured that the high accuracy of test result；Additionally, this apparatus structure is simple, with low cost, behaviour
Facilitate.
Embodiment described above only have expressed the several embodiments of the present invention, and its description is more concrete and detailed, but simultaneously
Therefore the restriction to the scope of the claims of the present invention can not be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, without departing from the inventive concept of the premise, some deformation can also be made and improve, these broadly fall into the guarantor of the present invention
Shield scope.
Claims (10)
1. during a kind of analog electronics use, the device of electrical power contacts bad phenomenon is it is characterised in that include: monolithic is dynamo-electric
Road, relay drive circuit, relay, key circuit, display circuit and power circuit, the control end of described relay is through described
Relay drive circuit is connected with described single chip circuit, and the controlled terminal of described relay is connected with the live wire of test prototype,
Described key circuit and described display circuit are connected with described single chip circuit, described power circuit and described single chip circuit,
Described relay drive circuit and described display circuit connect；Described relay is controlled to carry out moment by described single chip circuit
Logical → disconnected → logical switching, makes test prototype live wire synchronously complete logical → disconnected → logical switching, circuit is in the handoff procedure of moment
Middle acquisition crest voltage and electric current.
2. during analog electronics according to claim 1 use electrical power contacts bad phenomenon device it is characterised in that
Described relay drive circuit includes relay driving chip, the signal input interface of described relay driving chip and described list
Signal output interface connection, the signal output interface of described relay driving chip and the control of described relay on piece electromechanics road
End connects.
3. during analog electronics according to claim 2 use electrical power contacts bad phenomenon device it is characterised in that
Described relay drive circuit also includes diode, and described diode is in parallel with the control end of described relay.
4. during analog electronics according to claim 2 use electrical power contacts bad phenomenon device it is characterised in that
Described relay drive circuit also includes filter capacitor, and described filter circuit is in parallel with the control end of described relay.
5. during analog electronics according to claim 2 use electrical power contacts bad phenomenon device it is characterised in that
Described relay drive circuit also includes light emitting diode and dropping resistor, described light emitting diode and the series connection of described dropping resistor
In parallel with the control end of described relay afterwards.
6. during analog electronics according to claim 2 use electrical power contacts bad phenomenon device it is characterised in that
Described relay is more than two, and all described relays are connected with the signal output interface of described relay driving chip respectively
Connect.
7. the dress of electrical power contacts bad phenomenon during analog electronics as claimed in any of claims 1 to 6 use
Put it is characterised in that the action response time of described relay is 0.01～0.99 second.
8. the dress of electrical power contacts bad phenomenon during analog electronics as claimed in any of claims 1 to 6 use
Put the rated current >=30a it is characterised in that described relay.
9. during analog electronics according to claim 1 use electrical power contacts bad phenomenon device it is characterised in that
Also include:
Communicating circuit, described communicating circuit is connected with described single chip circuit.
10. the device of electrical power contacts bad phenomenon during analog electronics according to claim 1 use, its feature exists
In described display circuit includes display driver circuit and digital display tube, and described digital display tube is through described display driver circuit
It is connected with described single chip circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410321341.9A CN104090199B (en) | 2014-07-07 | 2014-07-07 | Device for simulating poor power source contact phenomenon in use process of electric appliance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410321341.9A CN104090199B (en) | 2014-07-07 | 2014-07-07 | Device for simulating poor power source contact phenomenon in use process of electric appliance |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104090199A CN104090199A (en) | 2014-10-08 |
| CN104090199B true CN104090199B (en) | 2017-01-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410321341.9A Expired - Fee Related CN104090199B (en) | 2014-07-07 | 2014-07-07 | Device for simulating poor power source contact phenomenon in use process of electric appliance |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104345240B (en) * | 2014-12-01 | 2017-03-15 | 合肥市航嘉电子技术有限公司 | A kind of analog power plug and the tester of electric capacity impact test |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11337609A (en) * | 1998-05-26 | 1999-12-10 | Aisin Seiki Co Ltd | Detector for detecting disconnection of electric wire connector |
| CN101029917A (en) * | 2007-03-21 | 2007-09-05 | 华为技术有限公司 | Circuit-state analog device and system for testing apparatus functions |
| CN201191475Y (en) * | 2008-04-16 | 2009-02-04 | 深圳市风向标科技有限公司 | Intelligent fault setting kit |
| CN202190052U (en) * | 2011-08-17 | 2012-04-11 | 佛山市中格威电子有限公司 | Testing circuit for leakage current protection |
| DE102011077449A1 (en) * | 2011-06-14 | 2012-12-20 | Robert Bosch Gmbh | Apparatus for simulating electrical loose contact, has control unit that drives parallel switching of different groups of resistors in different operating states |
| CN204044272U (en) * | 2014-07-07 | 2014-12-24 | 珠海格力电器股份有限公司 | The device of electrical power contacts bad phenomenon in analog electronics use procedure |
-
2014
- 2014-07-07 CN CN201410321341.9A patent/CN104090199B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11337609A (en) * | 1998-05-26 | 1999-12-10 | Aisin Seiki Co Ltd | Detector for detecting disconnection of electric wire connector |
| CN101029917A (en) * | 2007-03-21 | 2007-09-05 | 华为技术有限公司 | Circuit-state analog device and system for testing apparatus functions |
| CN201191475Y (en) * | 2008-04-16 | 2009-02-04 | 深圳市风向标科技有限公司 | Intelligent fault setting kit |
| DE102011077449A1 (en) * | 2011-06-14 | 2012-12-20 | Robert Bosch Gmbh | Apparatus for simulating electrical loose contact, has control unit that drives parallel switching of different groups of resistors in different operating states |
| CN202190052U (en) * | 2011-08-17 | 2012-04-11 | 佛山市中格威电子有限公司 | Testing circuit for leakage current protection |
| CN204044272U (en) * | 2014-07-07 | 2014-12-24 | 珠海格力电器股份有限公司 | The device of electrical power contacts bad phenomenon in analog electronics use procedure |
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| Publication number | Publication date |
|---|---|
| CN104090199A (en) | 2014-10-08 |
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