CN102539986A - Method for improving production efficiency of compensation type crystal oscillator - Google Patents

Method for improving production efficiency of compensation type crystal oscillator Download PDF

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Publication number
CN102539986A
CN102539986A CN201210029964XA CN201210029964A CN102539986A CN 102539986 A CN102539986 A CN 102539986A CN 201210029964X A CN201210029964X A CN 201210029964XA CN 201210029964 A CN201210029964 A CN 201210029964A CN 102539986 A CN102539986 A CN 102539986A
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CN
China
Prior art keywords
production test
crystal oscillator
compensated
production
ebi
Prior art date
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CN201210029964XA
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Chinese (zh)
Inventor
倪锦成
唐道勇
苏秋卫
姚鑫荣
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广东中晶电子有限公司
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Application filed by 广东中晶电子有限公司 filed Critical 广东中晶电子有限公司
Priority to CN201210029964XA priority Critical patent/CN102539986A/en
Publication of CN102539986A publication Critical patent/CN102539986A/en

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Abstract

The invention relates to a method for improving the production efficiency of a compensation type crystal oscillator. A plurality of production test plates and a production test platform are adopted. The production test platform automatically builds a temperature environment required by production test, performs automatic on-line detection, data acquisition and automatic on-line compensation on various parameters one by one in the batch production process of crystal oscillators, automatically finishes production test management such as rating of products, and establishes a product parameter file in a computer database, and a computer automatically generates a unique product code. By adoption of the method, the yield of the compensation type crystal oscillator can be guaranteed, the quality of the compensation type crystal oscillator is effectively tracked, the production cycle of the compensation type crystal oscillator is greatly shortened, and the production efficiency of the compensation type crystal oscillator is effectively improved.

Description

A kind of method that improves offset-type crystal oscillator production efficiency
Technical field
The present invention relates to the crystal oscillator production technical field, specifically is a kind of method that improves offset-type crystal oscillator production efficiency.
Background technology
The offset-type crystal oscillator is widely used in communication system, satellite navigation system, radar control system etc. owing to have higher frequency stability as a kind of high precision frequency source.Usually; The offset-type crystal oscillator is made up of crystal oscillating circuit and digital compensation circuit two parts, in process of production need be repeatedly through testing, compensate, test, compensating this process again, to such an extent as to the performance of products requirement is high more in-50 ℃~125 ℃ temperature environment; The operation of producing is just loaded down with trivial details more; Production cycle is just long more, and the qualification rate of product is just low more, and the offset-type crystal oscillator production efficiency of producing in this way is lower.
Summary of the invention
The objective of the invention is to problem and shortage to above-mentioned existence; Provide a kind of in the batch production process of product, the compensation of automatic on-line measurement, automatic on-line, accomplish the method for raising offset-type crystal oscillator production efficiency of the grade separation of product automatically.
Above-mentioned purpose of the present invention is to be achieved through following technical scheme:
The present invention is a kind of method that improves offset-type crystal oscillator production efficiency, comprises some blocks of production test plates and production test platform, and concrete steps are following:
(1.1). embedded microprocessor, programmable logic device (CPLD) and string change and Output Shift Register is formed electronic switch, card extender, monitor data EBI, digital communication EBI, frequency signal EBI, power bus interface, offset supply EBI on the production test plate; Said production test plate is the carrying platform of crystal oscillator to be compensated in producing in batches, the unique channel that also to be crystal oscillator to be compensated transmit with production test Platform Implementation data communication and signal;
(1.2). the production test plate more than one or interconnects through digital communication EBI, frequency signal EBI, power bus interface, offset supply EBI; Put into program control constant temperature humidity chamber after connecting; Program control constant temperature humidity chamber provides the needed temperature of production test, humidity environment, and the setting of temperature, humidity is by computer controlled automatic;
(1.3). microprocessor selects electronic switch through programmable logic device (CPLD) and the sheet that string changes and Output Shift Register constitutes, and realizes that the production test platform carries out the production test management to each crystal oscillator to be compensated on the production test plate respectively;
(1.4). said production test platform comprises production test application software, computing machine, oscillograph, precision frequency meter, phase noise detector, precision digital voltage table, precision digital reometer, program control precision voltage source, program control constant temperature humidity chamber; Said production test platform has been constructed the needed temperature environment of production test, simultaneously each crystal oscillator to be compensated on the production test plate in the temperature environment is carried out automatically production test management such as input, data acquisition, parametric compensation;
(1.5). crystal oscillator to be compensated is fixed on the card extender through unit clamp, and unit clamp is installation or removal crystal oscillator to be compensated conveniently, and lets itself and card extender form reliably to be electrically connected; Card extender converts the input and output of the crystal oscillator to be compensated of different model, specification to define on the production test plate unified pin specification; Two or more crystal oscillators to be compensated are respectively through unit clamp and card extender, and arrangement one to one is fixed on the production test plate, and unique production item is arranged;
(1.6). use precision digital voltage table and precision digital reometer, through WV, working current and the bucking voltage of power bus and the collection of offset supply Bus Real Time crystal oscillator to be compensated; Its measured value; Upload Computer Database through the monitor data Bus Real Time; Computing machine is controlled program control precision voltage source by different testing requirements through the monitor data Bus Real Time, adjusts WV, working current and the bucking voltage of crystal oscillator to be compensated;
(1.7). use oscillograph, precision frequency meter and phase noise detector; Gather in real time the output waveform and the output frequency of crystal oscillator to be compensated through the frequency signal EBI, and the data of gathering are uploaded Computer Database through the monitor data Bus Real Time;
(1.8). use a computer according under the different temperatures in the database; The WV of crystal oscillator to be compensated, working current, bucking voltage with and output waveform, output frequency, phase noise; By certain algorithm; Generate compensating parameter, and compensating parameter is write in the crystal oscillator to be compensated by the microprocessor on the production test plate through the digital communication bus;
(1.9). after parametric compensation was accomplished, the production test platform can carry out quality testing automatically, and according to the parameter that detects product was carried out grade separation; In each production batch, each crystal oscillator to be compensated finally all can be set up the product parameters archives of oneself in Computer Database, and generates unique product coding automatically by computing machine.
The present invention includes some blocks of production test plates and production test platform two parts, the production test platform is constructed the needed temperature environment of production test automatically, in the batch production process of crystal oscillator; Various parameters are carried out automatic on-line detection, data acquisition and automatic on-line compensation one by one; Automatically the grade of the accomplishing product production test administrative class of grading, and in Computer Database, set up the product parameters archives, generate unique product coding automatically by computing machine; Can not only guarantee the qualification rate of offset-type crystal oscillator; Also follow the tracks of the quality of product effectively, shortened the production cycle of product greatly, effectively improved production efficiency.
Description of drawings
Fig. 1 is for producing the test platform schematic diagram;
Fig. 2 is for producing the test board schematic diagram.
[primary clustering symbol description]
1-computing machine, 2-oscillograph, 3-precision frequency meter,
4-phase noise detector, 5-precision digital voltage table, 6-precision digital reometer,
The program control precision voltage source of 7-, the program control constant temperature humidity chamber of 8-, 9-production test plate,
10-microprocessor (MCU), 11-PLD (CPLD), the 12-string changes and Output Shift Register, 13-electronic switch, 14-card extender, 15-monitor data bus,
16-digital communication EBI, 17-frequency signal EBI, 18-power bus interface,
19-offset supply EBI, 20-crystal oscillator to be compensated.
Below in conjunction with accompanying drawing the present invention is further described.
Embodiment
Like Fig. 1, shown in 2; A kind of method that improves offset-type crystal oscillator production efficiency of the present invention comprises some blocks of production test plates 9 and production test platform, and the production test platform is constructed the needed temperature environment of production test automatically; Like-50 ℃~125 ℃ temperature range, concrete steps are following:
(1.1). embedded microprocessor (MCU) 10, PLD (CPLD) 11 and string change and Output Shift Register 12 is formed electronic switch 13, card extender 14, monitor data EBI 15, digital communication EBI 16, frequency signal EBI 17, power bus interface 18, offset supply EBI 19 on the production test plate 9; Said production test plate 9 is carrying platforms of crystal oscillator to be compensated in producing in batches, the unique channel that also to be crystal oscillator to be compensated transmit with production test Platform Implementation data communication and signal;
(1.2). the production test plate 9 more than one or interconnects through digital communication EBI 16, frequency signal EBI 17, power bus interface 18, offset supply EBI 19; Put into program control constant temperature humidity chamber 8 after connecting; Program control constant temperature humidity chamber 8 provides the needed temperature of production test, humidity environment, and the setting of temperature, humidity is controlled by computing machine 1 automatically;
(1.3). microprocessor (MCU) 10 selects electronic switch 13 through the sheet that PLD (CPLD) 11 and string change and Output Shift Register 12 constitutes, and realizes that the production test platform carries out the production test management to each crystal oscillator to be compensated on the production test plate 9 respectively;
(1.4). the production test platform comprises production test application software, computing machine 1, oscillograph 2, precision frequency meter 3, phase noise detector 4, precision digital voltage table 5, precision digital reometer 6, program control precision voltage source 7, program control constant temperature humidity chamber 8; Said production test platform has been constructed the needed temperature environment of production test, simultaneously each crystal oscillator to be compensated on the production test plate 9 in the temperature environment is carried out automatically production test management such as input, data acquisition, parametric compensation;
(1.5). crystal oscillator to be compensated is fixed on the card extender 14 through unit clamp, and unit clamp is installation or removal crystal oscillator 20 to be compensated conveniently, and lets itself and card extender 14 formation be electrically connected reliably; Card extender 14 converts the input and output of the crystal oscillator to be compensated 20 of different model, specification to the unified pin specification of definition on the production test plate 9; Two or more crystal oscillators to be compensated 20 are respectively through unit clamp and card extender 14, and arrangement one to one is fixed on the production test plate 9, and unique production item is arranged;
(1.6). use precision digital voltage table 5 and precision digital reometer 6, through WV, working current and the bucking voltage of power bus and the collection of offset supply Bus Real Time crystal oscillator 20 to be compensated; Its measured value; Upload computing machine 1 database in real time through monitor data bus 15; Computing machine 1 is controlled program control precision voltage source by different testing requirements through the monitor data Bus Real Time, adjusts WV, working current and the bucking voltage of crystal oscillator 20 to be compensated;
(1.7). use oscillograph 2, precision frequency meter 3 and phase noise detector 4; Gather the output waveform and the output frequencies of crystal oscillator 20 to be compensated in real time through frequency signal EBI 17, and the data of gathering are uploaded computing machine 1 database in real time through monitor data bus 15;
(1.8). use a computer 1 according under the different temperatures in the database; The WV of crystal oscillator 20 to be compensated, working current, bucking voltage with and output waveform, output frequency, phase noise; By certain algorithm; Generate compensating parameter, and compensating parameter is write in the crystal oscillator to be compensated 20 by the microprocessor on the production test plate 9 through the digital communication bus;
(1.9). after parametric compensation was accomplished, the production test platform can carry out quality testing automatically, and according to the parameter that detects product was carried out grade separation; In each production batch, each crystal oscillator to be compensated 20 finally all can be set up the product parameters archives of oneself in Computer Database, and generates unique product coding automatically by computing machine.
The foregoing description is a preferred implementation of the present invention; But embodiment of the present invention is not restricted to the described embodiments; Other any do not deviate from change, the modification done under spirit of the present invention and the principle, substitutes, combination, simplify; All should be the substitute mode of equivalence, be included within protection scope of the present invention.

Claims (1)

1. method that improves offset-type crystal oscillator production efficiency, it is characterized in that: comprise some blocks of production test plates (9) and production test platform, concrete steps are following:
(1.1). having embedded microprocessor (10), programmable logic device (CPLD) (11) and string on the production test plate (9) changes also electronic switch (13), card extender (14), monitor data EBI (15), digital communication EBI (16), frequency signal EBI (17), power bus interface (18), the offset supply EBI (19) of Output Shift Register (12) composition; Said production test plate (9) is the carrying platform of crystal oscillator (20) to be compensated in producing in batches, the unique channel that also to be crystal oscillator (20) to be compensated transmit with production test Platform Implementation data communication and signal;
(1.2). the production test plate (9) more than one or interconnects through digital communication EBI (16), frequency signal EBI (17), power bus interface (18), offset supply EBI (19); Put into program control constant temperature humidity chamber (8) after connecting; Program control constant temperature humidity chamber (8) provides the needed temperature of production test, humidity environment, and the setting of temperature, humidity is by computing machine (1) control automatically;
(1.3). microprocessor (10) changes through programmable logic device (CPLD) (11) and string and the sheet of Output Shift Register (12) formation selects electronic switch (13), realizes that the production test platform carries out the production test management to each crystal oscillator to be compensated (20) on the production test plate (9) respectively;
(1.4). the production test platform comprises production test application software, computing machine (1), oscillograph (2), precision frequency meter (3), phase noise detector (4), precision digital voltage table (5), precision digital reometer (6), program control precision voltage source (7), program control constant temperature humidity chamber (8); Said production test platform has been constructed the needed temperature environment of production test, simultaneously each crystal oscillator to be compensated (20) on the production test plate in the temperature environment is carried out automatically production test management such as input, data acquisition, parametric compensation;
Crystal oscillator to be compensated (20) is fixed on the card extender (14) through unit clamp, and unit clamp is installation or removal crystal oscillator (20) to be compensated conveniently, and lets itself and card extender (14) formation be electrically connected reliably; Card extender (14) converts the input and output of the crystal oscillator to be compensated (20) of different model, specification to unified pin specification that production test plate (9) is gone up definition; Two or more crystal oscillators to be compensated (20) are respectively through unit clamp and card extender (14), and arrangement one to one is fixed on the production test plate (9), and unique production item is arranged;
(1.6). use precision digital voltage table (5) and precision digital reometer (6), through WV, working current and the bucking voltage of power bus and the collection of offset supply Bus Real Time crystal oscillator (20) to be compensated; Its measured value; Upload Computer Database in real time through monitor data bus (15); Computing machine (1) is controlled program control precision voltage source by different testing requirements through monitor data bus (15) in real time, adjusts WV, working current and the bucking voltage of crystal oscillator (20) to be compensated;
(1.7). use oscillograph (2), precision frequency meter (3) and phase noise detector (4); Gather the output waveform and the output frequency of crystal oscillator to be compensated (20) in real time through frequency signal EBI (17), and the data of gathering are uploaded Computer Database in real time through monitor data bus (15);
(1.8). use a computer (1) is according under the different temperatures in the database; The WV of crystal oscillator to be compensated (20), working current, bucking voltage with and output waveform, output frequency, phase noise; By certain algorithm; Generate compensating parameter, and compensating parameter is write in the crystal oscillator to be compensated (20) by the microprocessor (10) on the production test plate (9) through the digital communication bus;
(1.9). after parametric compensation was accomplished, the production test platform can carry out quality testing automatically, and according to the parameter that detects product was carried out grade separation; In each production batch, each crystal oscillator to be compensated (20) finally all can be set up the product parameters archives of oneself, and generate unique product coding automatically by computing machine (1) in Computer Database.
CN201210029964XA 2012-02-11 2012-02-11 Method for improving production efficiency of compensation type crystal oscillator CN102539986A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109752640A (en) * 2018-12-20 2019-05-14 成都世源频控技术股份有限公司 The highly integrated test macro of crystal oscillator
CN110376459A (en) * 2019-07-05 2019-10-25 武汉海创电子股份有限公司 Multichannel crystal oscillator frequency-temperature characterisitic high speed acquisition system and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101609126A (en) * 2009-07-16 2009-12-23 东莞市大普通信技术有限公司 The Auto-Test System of temperature compensating crystal oscillator
CN201429792Y (en) * 2009-07-02 2010-03-24 广州市天马电讯科技有限公司 Automatic production management system for digital temperature compensated crystal oscillator
CN101713811A (en) * 2009-10-29 2010-05-26 天津必利优科技发展有限公司 System for automatically testing parameters of quartz crystal oscillator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201429792Y (en) * 2009-07-02 2010-03-24 广州市天马电讯科技有限公司 Automatic production management system for digital temperature compensated crystal oscillator
CN101609126A (en) * 2009-07-16 2009-12-23 东莞市大普通信技术有限公司 The Auto-Test System of temperature compensating crystal oscillator
CN101713811A (en) * 2009-10-29 2010-05-26 天津必利优科技发展有限公司 System for automatically testing parameters of quartz crystal oscillator

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
陈伟锋: "MCXO及其生产测试系统的研究与设计", 《中国优秀硕士学位论文全文数据库》, 24 July 2008 (2008-07-24) *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109752640A (en) * 2018-12-20 2019-05-14 成都世源频控技术股份有限公司 The highly integrated test macro of crystal oscillator
CN110376459A (en) * 2019-07-05 2019-10-25 武汉海创电子股份有限公司 Multichannel crystal oscillator frequency-temperature characterisitic high speed acquisition system and method

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