CN207636631U - Device debugs test system and microwave device debugs test system - Google Patents
Device debugs test system and microwave device debugs test system Download PDFInfo
- Publication number
- CN207636631U CN207636631U CN201721678137.8U CN201721678137U CN207636631U CN 207636631 U CN207636631 U CN 207636631U CN 201721678137 U CN201721678137 U CN 201721678137U CN 207636631 U CN207636631 U CN 207636631U
- Authority
- CN
- China
- Prior art keywords
- test system
- switch arrays
- circuit
- debugs
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model provides a kind of device debugging test system and microwave device debugging test system, is related to automatization testing technique field, including：Terminal is connect with tester, control circuit, commissioning device respectively；Control circuit is connect with switch arrays circuit；Commissioning device is used for linking objective device；Switch arrays circuit on one side is connect with several testers, and the other end with target devices for connecting；Terminal control commissioning device debugs target devices；Control circuit is according to the information of terminal transmission, by the conducting and shutdown that control several switch ways in switch arrays circuit, the port of tester test target device is selected, it solves the detection existing in the prior art to microwave passive multiport device and needs frequent thread-changing, and different interface is used to connect device under test, the technical issues of correctness and stability time-consuming and that influence test.
Description
Technical field
The utility model is related to automatization testing technique field, test system and micro- is debugged more particularly, to a kind of device
Wave device debugs test system.
Background technology
Microwave device refers to the device for being operated in microwave band, referred to as microwave device.Microwave device can be divided by its function
Microwave oscillator, power amplifier, frequency mixer, wave detector, microwave antenna, microwave transmission line etc..
By circuit design, these combination of devices there can be the microwave circuit of specific function at various, for example, utilizing these
Device is assembled into transmitter, receiver, antenna system, display etc., for electronics such as radar, electronic warfare system and communication systems
Equipment.Currently, electric-examination measurement is the significant process during the Microwave Component Productions such as filter, duplexer.
Currently, the detection to microwave passive multiport device, needs to arrange for a large amount of manpower and network comes together to examine production
The qualification of product, up to more than ten of some multiport device interfaces, electric-examination person wants frequent thread-changing when examining, and to use
Different interfaces connects device under test, correctness and stability time-consuming and that influence test.
Utility model content
In view of this, the purpose of this utility model is to provide a kind of device debugging test system and microwave device debugging
Test system needs to arrange for a large amount of manpower to solve the detection existing in the prior art to microwave passive multiport device
With network come together examine product qualification, up to more than ten of some multiport device interfaces, examine when frequently to change
The technical issues of line, and different interface to be used to connect device under test, correctness and stability time-consuming and that influence test.
In a first aspect, the utility model embodiment provides a kind of device debugging test system, including：Terminal, debugging are set
Standby, control circuit, switch arrays circuit and several testers；
The terminal is connect with the tester, the control circuit, the commissioning device respectively；
The control circuit is connect with the switch arrays circuit；
The commissioning device is used for linking objective device；
The switch arrays circuit on one side is connect with tester described in several, and the other end with target devices for connecting；
Commissioning device debugs target devices described in the terminal control；
The control circuit is opened according to the information of the terminal transmission by controlling several in the switch arrays circuit
The conducting and shutdown for closing access, select the port of the tester test target device.
With reference to first aspect, the utility model embodiment provides the first possible embodiment of first aspect,
In,
The control circuit is connected with each switch ways in the switch arrays circuit；
The switch arrays circuit with each port of target devices for being connected.
With reference to first aspect, the utility model embodiment provides second of possible embodiment of first aspect,
In,
Test data is transmitted to the terminal by the tester；
The terminal transmits test port information according to the test data, to the control circuit.
With reference to first aspect, the utility model embodiment provides the third possible embodiment of first aspect,
In, the control circuit is microcontroller.
With reference to first aspect, the utility model embodiment provides the 4th kind of possible embodiment of first aspect,
In, the tester is vector network analyzer.
With reference to first aspect, the utility model embodiment provides the 5th kind of possible embodiment of first aspect,
In, the terminal is PC.
With reference to first aspect, the utility model embodiment provides the 6th kind of possible embodiment of first aspect,
In, the switch arrays circuit is coaxial radio-frequency switch arrays.
With reference to first aspect, the utility model embodiment provides the 7th kind of possible embodiment of first aspect,
In, further include：Intermodulation testing equipment, the power test equipment being connect with the switch arrays circuit.
Second aspect, the utility model embodiment also provide a kind of microwave device debugging test system, including：Microwave device
And device as described in relation to the first aspect debugs test system；
Commissioning device, the switch arrays circuit that the microwave device is debugged respectively with the device in test system are connect.
In conjunction with second aspect, the utility model embodiment provides the first possible embodiment of second aspect,
In, commissioning device described in the terminal control debugs the microwave device；
The control circuit is opened according to the signal of the terminal transmission by controlling several in the switch arrays circuit
The connection and shutdown of access are closed, and the port that the microwave device is tested the tester selects.
The technical solution that the utility model embodiment provides brings following advantageous effect：The utility model embodiment provides
Device debug test system, including：Commissioning device, control circuit, terminal, switch arrays circuit and several testers,
Terminal is connect with tester, control circuit, commissioning device respectively, and control circuit is connect with switch arrays circuit, and commissioning device is used
In linking objective device, switch arrays circuit on one side is connect with several testers, and the other end with target devices for connecting, eventually
End control commissioning device debugs target devices, and control circuit passes through control switch arrays according to the information of terminal transmission
The conducting and shutdown of several switch ways in circuit, select the port of tester test target device, pass through switch
Connection function of the array circuit between target devices and tester and by controlling conducting with each circuit of shutdown to control
Each port of target devices and the connection type and connection line of tester so that the multiplexer channel of target devices can be simultaneously
Debugging, test, therefore reduce the products such as microwave device and debug and test in process of production the time it takes, to solve
Detection existing in the prior art to microwave passive multiport device, needs to arrange for a large amount of manpower and network comes together to examine
The qualification of product is tested, up to more than ten of some multiport device interfaces are wanted frequent thread-changing when examining, and to be used not
The technical issues of same interface connection device under test, correctness and stability time-consuming and that influence test.
Other feature and advantage of the utility model will illustrate in the following description, also, partly from specification
In become apparent, or understood by implementing the utility model.The purpose of this utility model and other advantages are illustrating
Specifically noted structure is realized and is obtained in book, claims and attached drawing.
To enable the above objects, features, and advantages of the utility model to be clearer and more comprehensible, preferred embodiment cited below particularly, and
The appended attached drawing of cooperation, is described in detail below.
Description of the drawings
It, below will be right in order to illustrate more clearly of specific embodiment of the present invention or technical solution in the prior art
Specific implementation mode or attached drawing needed to be used in the description of the prior art are briefly described, it should be apparent that, it is described below
In attached drawing be that some embodiments of the utility model are not paying creativeness for those of ordinary skill in the art
Under the premise of labour, other drawings may also be obtained based on these drawings.
Fig. 1 is the structural schematic diagram that the device that the utility model embodiment provides debugs test system；
Fig. 2 is another structural schematic diagram that the device that the utility model embodiment provides debugs test system；
Fig. 3 shows that the device that the utility model embodiment is provided is debugged in test system, the tool of switch arrays circuit
Body structural schematic diagram；
Fig. 4 shows that the device that the utility model embodiment is provided is debugged in test system, the tool of switch arrays circuit
Body structural schematic diagram；
Fig. 5 is the structural schematic diagram that the microwave device that the utility model embodiment provides debugs test system.
Icon：1- devices are debugged and test system；11- terminals；12- commissioning devices；13- control circuits；14- switch arrays
Circuit；15- testers；16- target devices；17- intermodulation testing equipment；18- power test equipment；111-PC；131- microcontrollers；
151- vector network analyzers；131- microcontrollers；131- microcontrollers；2- microwave devices debug test system；21- microwave devices.
Specific implementation mode
To keep the purpose, technical scheme and advantage of the utility model embodiment clearer, below in conjunction with attached drawing to this
The technical solution of utility model is clearly and completely described, it is clear that described embodiment is that the utility model part is real
Example is applied, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making
The every other embodiment obtained under the premise of creative work, shall fall within the protection scope of the present invention.
At present to the detection of microwave passive multiport device, needs to arrange for a large amount of manpower and network comes together to examine product
Qualification, up to more than ten of some multiport device interfaces want frequent thread-changing when examining, and to use different connect
Mouth connection device under test, correctness and stability time-consuming and that influence test, is based on this, and the one of the utility model embodiment offer
Kind device debugging test system and microwave device debug test system, can solve existing in the prior art to microwave passive
The detection of multiport device, needs to arrange for a large amount of manpower and network comes together to examine the qualification of product, some multiterminal mouthparts
Frequent thread-changing is wanted in up to more than ten of part port when examining, and different interfaces to be used to connect device under test, it is time-consuming and
The technical issues of influencing the correctness and stability of test.
For ease of understanding the present embodiment, a kind of device disclosed in the utility model embodiment is debugged survey first
Test system and microwave device debugging test system describe in detail.
Embodiment one：
A kind of device that the utility model embodiment provides debugs test system, can also be a kind of device automatically debugging and
Test system, as shown in Figure 1, device debugging and test system 1 include：Terminal 11, commissioning device 12, control circuit 13, switch
Array circuit 14 and several testers 15.
Specifically, terminal 11 is connect with tester 15, control circuit 13, commissioning device 12 respectively.Control circuit 13 with open
Array circuit 14 is closed to connect.Commissioning device 12 is used for linking objective device 16.14 one end of switch arrays circuit and several tests
Instrument 15 connects, and the other end with target devices 16 for connecting.
As the preferred embodiment of the present embodiment, terminal 11 controls commissioning device 12 and is debugged to target devices 16.
The information that control circuit 13 is transmitted according to terminal 11, by control switch arrays circuit 14 in several switch ways conducting with
Shutdown, selects the port of 15 test target device 16 of tester.
It should be noted that control circuit 13 is connected with each switch ways in switch arrays circuit 14.Switch arrays
Circuit 14 with each port of target devices 16 for being connected.
As the another embodiment of the present embodiment, test data is transmitted to terminal 11 by tester 15.11, terminal
According to test data, test port information is transmitted to control circuit 13.
As shown in Fig. 2, control circuit 13 is microcontroller 131.Tester 15 is vector network analyzer 151.Terminal 11 is
PC111.Switch arrays circuit 14 with each port of target devices 16 for being connected.Microcontroller 131 and switch arrays circuit 14
In each switch ways be connected.Wherein, PC111 may be the ends PC, microcontroller 131 or single chip machine controlling circuit.
As shown in Fig. 2, device debugging test system can also include：The intermodulation testing being connect with switch arrays circuit 14 is set
Standby 17, power test equipment 18.It can also include other Microwave Test Equipments, various cables, number that device, which debugs test system,
According to line etc..
Further, the cable of 151 groups of vector network analyzer and matrix switch are connected, vector network analyzer 151
Data line be connected with the ends PC, each port of target devices 16 is connected by cable with matrix switch.
In addition, commissioning device 12 can be made of holder, screwdriver group, Debug control circuitry etc., commissioning device 12 can be with
Equipment to adjust the microwave devices such as filter, duplexer, each corresponding tune of debugging screw rod of target devices 16 to be measured
A screwdriver in equipment 12 is tried, the ends PC control the fortune of screwdriver group by the Debug control circuitry on commissioning device 12
It is dynamic, and then the debugging screw rod on control targe device 16, achieve the purpose that debug target devices 16.
As a preferred embodiment, switch arrays circuit 14 can be coaxial radio-frequency switch arrays.Coaxial radio-frequency switch arrays
It is classified as N × N-port device, wherein N is the positive integer not less than 2, coaxial radio-frequency switch arrays are switched by 1 × 2,1 × 4 switchs,
The compositions such as 2 × 2 switches, wherein each switch has data line to be connected with single chip machine controlling circuit, microcontroller 131 can be time control
Each switch ways in switch arrays processed.
As shown in figure 3, with 2 × 16 ports for example, switch arrays circuit 14 be 2 × 16 switch arrays, it be by
The main road port that the branch port of two 1 × 2 switches is switched with 41 × 4 is connected, and the branch port of 1 × 4 switch is opened with 2 × 2
The main road port of pass is connected, you can by the control to cut-offfing road, to realize vector network analyzer 151 to object to be measured
The debugging and test of wherein certain two port of device 16.When object to be measured device 16 is other port numbers, can pass through
Change the quantity switched in switch matrix and arrangement to realize the extension or reduction of test port.As shown in figure 4, switch arrays are electric
The switch arrays that road 14 is 4 × 16 change 1 × 2 switch into switch arrays that 2 × 2 switches can be achieved with 4 × 16.
In the present embodiment, pass through the control connection function of switch arrays so that the multiplexer channel of target devices 16 can be same
When debug or test, debug and test in process of production the time it takes to reduce the products such as microwave device.
Therefore, the device debugging test system provided through this embodiment can be simultaneously to 16 model machine of target devices
Multiple ports carry out while debugging, and multi-channel test can be carried out when debugging finishes, and are distinguished each road port with reducing
Carry out the time needed for debugging test.Moreover, be automatically brought into operation instead of manual operation with machine, to not only reduce production cost,
And the reliability and stability of debugging test are improved while improving debugging test rate.
Embodiment two：
A kind of microwave device that the utility model embodiment provides debugs test system, can also be a kind of microwave device from
Dynamic debugging and test system, as shown in figure 5, microwave device debugging test system 2 includes：Microwave device 21 and above-described embodiment
One device provided debugs test system.Wherein, microwave device 21 or microwave device to be measured.
Preferably, each port of the microwave devices such as duplexer 21 is connected by cable with matrix switch.Microwave device
Commissioning device 12, the switch arrays circuit 14 that part 21 is debugged respectively with device in test system are connect.
Wherein, terminal 11 controls commissioning device 12 and is debugged to microwave device 21.Control circuit 13 is passed according to terminal 11
Defeated signal is tested tester 15 micro- by controlling the connection and shutdown of several switch ways in switch arrays circuit 14
The port of wave device 21 is selected.
In practical applications, building so that microwave device to be measured first passes through debugging step for system is first passed through, debugging is completed
It carries out testing procedure again afterwards, since many filters, duplexer are multiplexer channel, does not also influence between each other, so can
Be carried out at the same time multichannel debugging test, by taking a N paths microwave device as an example, can building by switch arrays, make
The each paths for obtaining microwave device to be measured both correspond to a vector network analyzer 151 or multiplexer channel corresponds to one
Vector network analyzer 151, you can multiplexer channel is made to be carried out at the same time debugging test.
Since each adjusting screw rod of microwave device to be measured both corresponds to a screwdriver, so different channels are each other
It does not influence, each adjusting screw knife can be controlled respectively, you can realize that multichannel is adjusted simultaneously.
As the another embodiment of the present embodiment, when testing duplexer using microwave device debugging test system 2,
Single chip machine controlling circuit is outputed signal to by the ends PC, the test of device under test should be included in the digital signal of the ends PC output at this time
Port, such as port1 (interface 1), port2 (interface 2) etc., after single chip machine controlling circuit receives the signal at the ends PC, microcontroller
Can realize compiling by the circuit of its own, final output " 01 " binary code to the switch in switch arrays, wherein 1 ×
2 switches are controlled with 1 digit, and 1 × 4 switch is controlled with 2 digits, and 2 × 2 switches are controlled with 4 digits, and single chip circuit passes through to the ends PC
The address information of output is compiled, you can is made two ports such as port1, port2 to be measured, is passed through switch arrays and vector net
Two ports of network analyzer 151 are connected, and other ports are off, and can test the survey of device under test at this time
The performance datas such as Insertion Loss, the inhibition of port such as port1, port2 are tried, then institute's measured data is passed by the data line of Network Analyzer
It is defeated by the ends PC.
After PC terminations harvest the data tested needed for port1, port2 of Network Analyzer transmission, sent by the ends PC
Signal goes control matrix switch to make the road port3, port4 and the vector network analyzer of device under test to single chip machine controlling circuit
151 are connected, you can the performance data on the roads test device under test port3, port4, and so on, you can test device under test is all
The data of access.
Therefore, the above operation of test system 2 is debugged by microwave device, you can realize to nothings such as filter, duplexers
The automatic debugging and test of source multiport microwave device.
In all examples being illustrated and described herein, any occurrence should be construed as merely illustrative, without
It is as limitation, therefore, other examples of exemplary embodiment can have different values.
Similar label and letter indicate similar terms in following attached drawing, therefore, once in a certain Xiang Yi attached drawing
It is defined, then it further need not be defined and explained in subsequent attached drawing.
The microwave device that the utility model embodiment provides debugs test system, is debugged with the device that above-described embodiment provides
Test system technical characteristic having the same reaches identical technique effect so can also solve identical technical problem.
Further, microcontroller 131 may be a kind of IC chip, the processing capacity with signal.It is realizing
In the process, above-mentioned function can be completed by the instruction of the integrated logic circuit of the hardware in microcontroller 131.Above-mentioned microcontroller
131 can be general processor, including central processing unit (Central Processing Unit, abbreviation CPU), network processes
Device (Network Processor, abbreviation NP) etc.；It can also be digital signal processor (Digital Signal
Processing, abbreviation DSP), application-specific integrated circuit (Application Specific Integrated Circuit, referred to as
ASIC), ready-made programmable gate array (Field-Programmable Gate Array, abbreviation FPGA) or other are programmable
Logical device, discrete gate or transistor logic, discrete hardware components.It may be implemented or execute the utility model implementation
Disclosed each function in example.Function in conjunction with disclosed in the utility model embodiment can be embodied directly in hardware decoding processing
Device executes completion, or executes completion with the hardware in decoding processor.
In addition, in the description of the utility model embodiment unless specifically defined or limited otherwise, term " installation ",
" connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally connect
It connects；It can be mechanical connection, can also be electrical connection；It can be directly connected, can also indirectly connected through an intermediary, it can
To be the connection inside two elements.For the ordinary skill in the art, it can understand above-mentioned term with concrete condition
Concrete meaning in the present invention.
It is in the description of the present invention, it should be noted that term "center", "upper", "lower", "left", "right", " perpendicular
Directly ", the orientation or positional relationship of the instructions such as "horizontal", "inner", "outside" is to be based on the orientation or positional relationship shown in the drawings, and is only
The utility model and simplifying describes for ease of description, do not indicate or imply the indicated device or element must have it is specific
Orientation, with specific azimuth configuration and operation, therefore should not be understood as limiting the present invention.
In several embodiments provided herein, it should be understood that disclosed systems, devices and methods, it can be with
It realizes by another way.The apparatus embodiments described above are merely exemplary, for example, the division of the unit,
Only a kind of division of logic function, formula that in actual implementation, there may be another division manner, in another example, multiple units or component can
To combine or be desirably integrated into another system, or some features can be ignored or not executed.Another point, it is shown or beg for
The mutual coupling, direct-coupling or communication connection of opinion can be by some communication interfaces, device or unit it is indirect
Coupling or communication connection can be electrical, machinery or other forms.
Finally it should be noted that：Embodiment described above, only specific embodiment of the present utility model, to illustrate this
The technical solution of utility model, rather than its limitations, the scope of protection of the utility model is not limited thereto, although with reference to aforementioned
The utility model is described in detail in embodiment, it will be understood by those of ordinary skill in the art that：It is any to be familiar with this skill
The technical staff in art field within the technical scope disclosed by the utility model, still can be to the skill recorded in previous embodiment
Art scheme modify or can readily occur in variation or equivalent replacement of some of the technical features；And these modifications,
Variation is replaced, the spirit and model of the utility model embodiment technical solution that it does not separate the essence of the corresponding technical solution
It encloses, should be covered within the scope of the utility model.Therefore, the scope of protection of the utility model is answered described is wanted with right
Subject to the protection domain asked.
Claims (10)
1. a kind of device debugs test system, which is characterized in that including：Terminal, commissioning device, control circuit, switch arrays electricity
Road and several testers；
The terminal is connect with the tester, the control circuit, the commissioning device respectively；
The control circuit is connect with the switch arrays circuit；
The commissioning device is used for linking objective device；
The switch arrays circuit on one side is connect with tester described in several, and the other end with target devices for connecting；
Commissioning device debugs target devices described in the terminal control；
The control circuit is led to according to the information of the terminal transmission by controlling several switches in the switch arrays circuit
The conducting and shutdown on road select the port of the tester test target device.
2. device according to claim 1 debugs test system, which is characterized in that the control circuit and the switch arrays
Each switch ways in column circuits are connected；
The switch arrays circuit with each port of target devices for being connected.
3. device according to claim 1 debugs test system, which is characterized in that the tester transmits test data
To the terminal；
The terminal transmits test port information according to the test data, to the control circuit.
4. device according to claim 1 debugs test system, which is characterized in that the control circuit is microcontroller.
5. device according to claim 1 debugs test system, which is characterized in that the tester is vector network analysis
Instrument.
6. device according to claim 1 debugs test system, which is characterized in that the terminal is PC.
7. device according to claim 1 debugs test system, which is characterized in that the switch arrays circuit is coaxially to penetrate
Frequency switch arrays.
8. device according to claim 1 debugs test system, which is characterized in that further include：With switch arrays electricity
Intermodulation testing equipment, the power test equipment of road connection.
9. a kind of microwave device debugs test system, which is characterized in that including：Microwave device and such as claim 1-8 are any
Device described in debugs test system；
Commissioning device, the switch arrays circuit that the microwave device is debugged respectively with the device in test system are connect.
10. microwave device according to claim 9 debugs test system, which is characterized in that adjusted described in the terminal control
Examination equipment debugs the microwave device；
The control circuit is led to according to the signal of the terminal transmission by controlling several switches in the switch arrays circuit
The connection and shutdown on road, the port for testing the tester microwave device select.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721678137.8U CN207636631U (en) | 2017-12-04 | 2017-12-04 | Device debugs test system and microwave device debugs test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721678137.8U CN207636631U (en) | 2017-12-04 | 2017-12-04 | Device debugs test system and microwave device debugs test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207636631U true CN207636631U (en) | 2018-07-20 |
Family
ID=62855568
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721678137.8U Active CN207636631U (en) | 2017-12-04 | 2017-12-04 | Device debugs test system and microwave device debugs test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207636631U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2715406C1 (en) * | 2019-04-22 | 2020-02-27 | Павел Васильевич Куприянов | Input linear module of broadband receiving microwave device with extended dynamic range |
| CN112540359A (en) * | 2020-12-17 | 2021-03-23 | 航天恒星科技有限公司 | General test system suitable for microwave radar |
| CN118033386A (en) * | 2024-04-15 | 2024-05-14 | 上海知白智能科技有限公司 | Chip testing device |
-
2017
- 2017-12-04 CN CN201721678137.8U patent/CN207636631U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2715406C1 (en) * | 2019-04-22 | 2020-02-27 | Павел Васильевич Куприянов | Input linear module of broadband receiving microwave device with extended dynamic range |
| CN112540359A (en) * | 2020-12-17 | 2021-03-23 | 航天恒星科技有限公司 | General test system suitable for microwave radar |
| CN112540359B (en) * | 2020-12-17 | 2024-03-15 | 航天恒星科技有限公司 | Universal test system suitable for microwave radar |
| CN118033386A (en) * | 2024-04-15 | 2024-05-14 | 上海知白智能科技有限公司 | Chip testing device |
| CN118033386B (en) * | 2024-04-15 | 2024-06-07 | 上海知白智能科技有限公司 | Chip testing device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107817368B (en) | Multi-channel S parameter measuring device and measuring method | |
| CN207636631U (en) | Device debugs test system and microwave device debugs test system | |
| CN108319562B (en) | High-precision broadband millimeter wave 8x8 matrix switch and microwave parameter evaluation and calibration method | |
| CN109302713A (en) | Height covering RF index automatic test device | |
| CN105162535B (en) | Isolation degree test device and test method | |
| CN105929279B (en) | Index testing device and method are isolated between a kind of Multi-channel microwave receiving unit road | |
| CN210112015U (en) | Radio frequency switch chip test system | |
| CN110609183A (en) | IVI technology-based identification module and automatic test system of complete machine | |
| CN105190324A (en) | Vector network power meter | |
| CN105681127B (en) | Complete multiport for multiport RF component swears net measuring device and method | |
| CN108489510B (en) | Extensible platform circuit box automatic test system based on PXI bus | |
| CN207283563U (en) | Bluetooth equipment radio frequency test system | |
| CN106771554A (en) | Multiport microwave device test system and method | |
| CN102437885A (en) | Communication equipment test device | |
| CN108919105A (en) | A kind of microwave mechanical switch reperformance test device and method | |
| CN105873108A (en) | Test system for radio frequency conformance of LTE (long term evolution) terminal | |
| CN205786886U (en) | Detect the detecting system of multiple combiner simultaneously | |
| CN206292301U (en) | Multiport microwave device test system and multiport microwave device | |
| CN203352554U (en) | Alternatively connected multichannel radio frequency switch | |
| CN108627696A (en) | A kind of measuring device and its measurement method of vector network | |
| CN107359944A (en) | Bluetooth equipment radio frequency test system | |
| CN204349995U (en) | The full-automatic regulating and measuring system of a kind of GSM digital high-frequency amplification station | |
| CN104780002A (en) | Miniaturized OTA testing system with multiple probes | |
| CN217935623U (en) | Radio frequency chip testing device with multiple sending and multiple receiving functions | |
| CN204578541U (en) | A kind of miniaturized OTA test macro with multiple probe |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: 518000, Guangdong, Shenzhen, Baoan District, Xixiang Street Fuhua community forward two road exhibition Feng Industrial Park B1, B2 Patentee after: SHENZHEN WAVETOWN TECHNOLOGIES Co.,Ltd. Address before: 518000 Guangdong city of Shenzhen province Baoan District Xixiang Street Phoenix Gang community ICT Company No. 2 building two or three, five floor Patentee before: SHENZHEN WAVETOWN TECHNOLOGIES Co.,Ltd. |