Improve the method for testing and the system of wireless comprehensive test instrument calibration operation efficient
Technical field
The present invention relates generally to comprehensive test instrument and method of testing thereof, relate more specifically to a kind of method of testing that improves wireless comprehensive test instrument calibration operation efficient.
Background technology
In the automatic testing process of comprehensive tester (abbreviation comprehensive test instrument); usually can run into the very big situation of tested instrument amount; for example in the factory of some communication enterprises; often there are hundreds of platform even thousands of comprehensive testers to need metering; in this time, common method of testing can not well satisfy the needs of extensive metering on the production line.
Therefore, in view of the foregoing,, need the rational method of testing of a cover badly, so that improve testing efficiency through long-term on-the-spot test is summarized the experience.
Summary of the invention
In view of this, fundamental purpose of the present invention is to provide a kind of method that improves wireless comprehensive test instrument calibration operation efficient, in the wireless comprehensive test instrument calibration system, under the prerequisite of the standard meter that uses equal number, by the syndeton of change instrument and the cooperation of autotest program, thereby shorten the metering time of test wireless comprehensive test instrument, improve the work efficiency of large scale test, it is characterized in that:
Testing standard is divided into two parts;
A part is a comprehensive test instrument transmitter section calibration subsystem, is used for being tested by the transmitter section of school comprehensive test instrument;
Another part is that the comprehensive test instrument analyser is partly calibrated subsystem, is used for partly being tested by the analyser of school comprehensive test instrument;
Described comprehensive test instrument transmitter section calibration subsystem and comprehensive test instrument analyser are partly calibrated subsystem and are controlled with PC respectively, carry out the work simultaneously;
Simultaneously, use PSU radio-frequency (RF) switch matrix in described wireless comprehensive test instrument calibration system, PSU radio-frequency (RF) switch matrix is incorporated into respectively in two parts subsystem, by the programmed control individual channel, avoiding the people is the switching of carrying out connecting line.
According to a preferred embodiment of the invention, wherein calibrate between subsystem and the tested comprehensive test instrument, and partly calibrate between subsystem and the tested comprehensive test instrument, incorporate PSU radio-frequency (RF) switch matrix respectively at the comprehensive test instrument analyser at the comprehensive test instrument transmitter section.
According to a preferred embodiment of the invention, wherein said wireless comprehensive test instrument calibration system control PSU radio-frequency (RF) switch matrix carries out path and switches, avoid line repeatedly, the process of manual switch test port, thus the wireless comprehensive test instrument calibration system is carried out the respective via switching according to different calibration item gauge tap matrixes automatically.
According to the present invention, a kind of wireless comprehensive test instrument calibration system that improves comprehensive test instrument calibration operation efficient also is provided, comprising:
Two PCs that gpib interface control card and system test software are housed are as master control;
The comprehensive test instrument analyser is partly calibrated subsystem, is made of signal source, and described comprehensive test instrument transmitter section calibration subsystem and tested comprehensive test instrument are connected to a PC by gpib interface separately;
Comprehensive test instrument transmitter section calibration subsystem, by spectrum analyzer, frequency meter, power meter, voltage table constitutes, and described comprehensive test instrument analyser is partly calibrated subsystem and another the tested comprehensive test instrument gpib interface by separately and is connected to another PC.
According to a preferred embodiment of the invention, wherein said signal source is a digital signal generator.
According to a preferred embodiment of the invention, in test process, partly calibrate at comprehensive test instrument transmitter section calibration subsystem and comprehensive test instrument analyser and to incorporate PSU radio-frequency (RF) switch matrix between subsystem and the tested comprehensive test instrument respectively into, for different calibration items, system finishes the selection of test access by the switching of radio-frequency (RF) switch matrix.
According to a preferred embodiment of the invention, wherein
Described signal source is used to calibrate the analyser part of comprehensive test instrument;
Described spectrum analyzer has the numerical analysis option, is used to calibrate the signal source major parameter partly of comprehensive test instrument;
Described frequency meter is used to calibrate the frequency accuracy of accuracy of comprehensive test instrument reference frequency and signal source, simultaneously also and voltage table calibrate the audio-frequency unit of comprehensive test instrument together;
Described power meter is used for partly carrying out the power transmission in calibration comprehensive test instrument signal source, guarantees the precision level of systematic survey.
Checkout equipment according to equal number in method of testing utilization of the present invention and the classic method, make test speed significantly improve, program control PSU radio-frequency (RF) switch matrix in system simultaneously, further improved work efficiency, make test macro more perfect, testing process is science more, is in the class testing top standard, is bringing into play positive effect in large scale test.
Though will describe the present invention in conjunction with some exemplary enforcements and using method hereinafter, and it will be appreciated by those skilled in the art that to not being intended to the present invention is limited to these embodiment.Otherwise, be intended to cover all substitutes, correction and the equivalent that are included in defined spirit of the present invention of appending claims and the scope.
Other advantages of the present invention, target, to set forth in the following description to a certain extent with feature, and to a certain extent,, perhaps can obtain instruction from the practice of the present invention based on being conspicuous to those skilled in the art to investigating hereinafter.Target of the present invention and other advantages can be passed through following instructions, claims, and the specifically noted structure realizes and obtains in the accompanying drawing.
Description of drawings
In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention is described in further detail below in conjunction with accompanying drawing, wherein:
Fig. 1 is the comprehensive test instrument system principle diagram of prior art;
Fig. 2 is the schematic diagram according to comprehensive test instrument method of testing of the present invention; And
Fig. 3 is the concrete pie graph of system of the present invention.
Embodiment
Below in conjunction with accompanying drawing the specific embodiment of the present invention is described in further detail.It should be noted that embodiment according to the method for testing of raising tester calibration operation efficient of the present invention as just example, but the invention is not restricted to this embodiment.
Referring to Fig. 1, show the theory diagram of tester system in the prior art.Traditional comprehensive test instrument autotest program is to link together with the GPIB line test macro with by the school comprehensive test instrument.Auto-Test System by a PC that gpib interface control card and system test software are housed as master control, frequency spectrograph, signal source, frequency meter, power meter, voltage table and tested comprehensive test instrument are connected to PC (computer by gpib interface separately, be also referred to as personal computer), finish calibration process.Generally, using this metering method, is example with CMU200, and when the part of test comprehensive test instrument source, the analyser part instrument of standard is idle, needs 50 to 60 minutes to survey one.
Fig. 2 shows the schematic diagram according to comprehensive test instrument method of testing of the present invention.According to a preferred embodiment of the invention, the testing standard of its method of testing is divided into two parts, and part test is by school comprehensive test instrument transmitter section, and another part is tested by school comprehensive test instrument analyser part.Thus, under the identical situation of checkout equipment quantity, made full use of standard device, thereby this method of testing just can be reduced the closely time of half.
More specifically, in the wireless comprehensive test instrument calibration system, under the prerequisite of the standard meter that uses equal number, by the syndeton of change instrument and the cooperation of autotest program, thereby shorten the metering time of test wireless comprehensive test instrument, improve the work efficiency of large scale test.
Testing standard is divided into two parts, and a part is a comprehensive test instrument transmitter section calibration subsystem, is used for being tested by the transmitter section of school comprehensive test instrument; Another part is that the comprehensive test instrument analyser is partly calibrated subsystem, is used for partly being tested by the analyser of school comprehensive test instrument.
Wherein comprehensive test instrument transmitter section calibration subsystem and comprehensive test instrument analyser are partly calibrated subsystem and are controlled with PC respectively, carry out the work simultaneously.Simultaneously, use PSU radio-frequency (RF) switch matrix in described wireless comprehensive test instrument calibration system, PSU radio-frequency (RF) switch matrix is incorporated into respectively in two parts subsystem, by the programmed control individual channel, avoiding the people is the switching of carrying out connecting line.
According to another preferred embodiment of the present invention, calibrate between subsystem and the tested comprehensive test instrument at the comprehensive test instrument transmitter section, and partly calibrate between subsystem and the tested comprehensive test instrument at the comprehensive test instrument analyser, incorporate PSU radio-frequency (RF) switch matrix respectively into.Wireless comprehensive test instrument calibration system control PSU radio-frequency (RF) switch matrix carries out path and switches, avoid line repeatedly, the process of manual switch test port, thus the wireless comprehensive test instrument calibration system is carried out the respective via switching according to different calibration item gauge tap matrixes automatically.
Referring now to Fig. 3,, as master control, signal source (being digital signal generator in this embodiment) and a tested instrument are connected to a PC by gpib interface to total system by two PCs that gpib interface control card and system test software are housed; Spectrum analyzer (is a VSA in this embodiment, have the numerical analysis option), frequency meter, power meter, voltage table and another tested instrument are connected to another PC by gpib interface separately, in test process, add the radio-frequency (RF) switch matrix, switch matrix is incorporated into respectively in two parts standard, and for different calibration items, system can finish the selection of test access by the switching of radio-frequency (RF) switch matrix.
In Fig. 3, the comprehensive test instrument calibration system mainly is divided into two subsystems.Be respectively the comprehensive test instrument analyser and partly calibrate subsystem and comprehensive test instrument transmitter section calibration subsystem.
The comprehensive test instrument analyser is partly calibrated subsystem, is made of signal source, and described comprehensive test instrument transmitter section calibration subsystem and tested comprehensive test instrument are connected to a PC by gpib interface separately;
Comprehensive test instrument transmitter section calibration subsystem, by spectrum analyzer, frequency meter, power meter, voltage table constitutes, and described comprehensive test instrument analyser is partly calibrated subsystem and another the tested comprehensive test instrument gpib interface by separately and is connected to another PC.
According to another preferred embodiment of the present invention, in test process, partly calibrate at comprehensive test instrument transmitter section calibration subsystem and comprehensive test instrument analyser and to add PSU radio-frequency (RF) switch matrix between subsystem and the tested comprehensive test instrument respectively, for different calibration items, system finishes the selection of test access by the switching of radio-frequency (RF) switch matrix.
In system shown in Figure 3, the analyser part of using derived digital signal (digital signal generator) to be used to calibrate comprehensive test instrument.The spectrum analyzer that has the numerical analysis option is used to calibrate the signal source major parameter partly of comprehensive test instrument.Frequency meter is used to calibrate the frequency accuracy of accuracy of comprehensive test instrument reference frequency and signal source, simultaneously also and voltage table calibrate the audio-frequency unit of comprehensive test instrument together.Power meter is used for partly carrying out the power transmission in calibration comprehensive test instrument signal source, has guaranteed the precision level of systematic survey.
In automated calibration system design, the technology of three keys is arranged, the one, utilized the function of instrument fully, as far as possible the design scale of simplified system; The 2nd, by selecting high-precision measurement instrument for use, use more rational method of testing, improve the measuring accuracy level of total system, to satisfy higher alignment requirements as far as possible; The 3rd, layout the method for testing of science, improved the service efficiency of instrument, a large amount of reductions the test duration, thereby better increase work efficiency.
System's control PSU radio-frequency (RF) switch matrix carries out the path switching in testing automatically, avoided line repeatedly, the process of manual switch test port, system can carry out respective via according to different calibration item gauge tap matrixes automatically and switch, make test speed and accuracy further be improved, saved manpower and test duration effectively.Still be that example makes in this way the calibration process to comprehensive test instrument improve with CMU200, made full use of standard device, average like this 20 to 30 minutes one.
When the comprehensive test instrument of communications equipment vendor is calibrated, the comprehensive test instrument of supposing producer adds up to 200, use traditional method test to need 16 working days at least, only need to finish 7 working days and use method of the present invention to detect, work efficiency is enhanced about more than once, when accurate metering service fast is provided for the client, can shorten measuring cost greatly.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and obviously, those skilled in the art can carry out various changes and modification and not break away from the spirit and scope of the present invention the present invention.Like this, if of the present invention these are revised and modification belongs within the scope of claim of the present invention and equivalent technologies thereof, then the present invention also is intended to comprise these changes and modification interior.