CN110233964A - A kind of anti-shaking method applied to TDI cmos image sensor - Google Patents
A kind of anti-shaking method applied to TDI cmos image sensor Download PDFInfo
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- CN110233964A CN110233964A CN201910454957.6A CN201910454957A CN110233964A CN 110233964 A CN110233964 A CN 110233964A CN 201910454957 A CN201910454957 A CN 201910454957A CN 110233964 A CN110233964 A CN 110233964A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/68—Control of cameras or camera modules for stable pick-up of the scene, e.g. compensating for camera body vibrations
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
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- Multimedia (AREA)
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- Transforming Light Signals Into Electric Signals (AREA)
Abstract
The present invention discloses a kind of anti-shaking method applied to TDI cmos image sensor, comprising: the single-stage optical signal that single-stage reservoir reads single-stage reservoir is stored in compensating electric capacity, while tradition TDI accumulation is carried out in TDI accumulator；TDI accumulator calculates single-stage optical signal difference and optical signal difference is added in cumulative capacitor, obtains optical signal total variances, and obtain resultant signal using the optical signal total variances and export.The present invention can effectively remove influence of the residual motion to imaging effect, so as to obtain the optical signal of a relative ideal, to greatly improve image quality.
Description
Technical field
The present invention relates to cmos image sensor technical fields, more particularly to applied to TDI cmos image sensor
Anti-shaking method.
Background technique
As CMO technology continues to develop, time delays integral TDI (Time Delay Integration, TDI) is applied
In cmos image sensor.Fig. 1 is the imaging mode of traditional TDI cmos image sensor.By taking level Four TDI as an example, four pictures
Plain stage direction along ng a path arrangement, t1, t2, t3 and t4 respectively indicate different location of the imaging sensor in continuous time.Four
The TDI imaging sensor of grade is successively imaged object A.In t1, object A is incident upon at first pixel in column, generates light
Signal A1.As camera is mobile, in t2, object A generates an optical signal in second pixel.A2 indicates the first two pixel
The optical signal summation of middle acquisition.In t3, third optical signal is produced in third pixel, therefore A3 is indicated from first three
The optical signal summation of pixel.In t4, the 4th pixel generates another optical signal, and A4 is that four pixels generate the total of optical signal
With.From the point of view of whole process, is not exported directly from the optical signal of each pixel collection, but be transferred to the pixel of next stage
In, it is clear that n grades of TDI imaging sensor can extend n times of effective integral time, to improve signal-to-noise ratio.This technical feasibility
It establishes on the case where sensor scanning direction and orbiting direction are consistent, but due to the factors shadow such as external environment
It rings, is especially applied in remote imaging systems (such as satellite) in TDI cmos image sensor, the satellite on track is sometimes
It is influenced by random perturbation, flexible internal component or external module environment keep camera motion no longer stable, flight stability
It will receive the influence of shake, random perturbation includes a large amount of harmonic vibration (sine wave).As shown in Fig. 2, harmonic vibration can introduce
Residual motion across orbital direction, scanning motion produce across track movement, cause image fuzzy and distortion.
Summary of the invention
The object of the present invention is to provide a kind of anti-shaking methods applied to TDI cmos image sensor, to solve tradition
TDI only the optical signal of pixel is simply accumulated in together, in the presence of residual motion, shake can make cumulative
The optical signal arrived is incessantly from an object, so that the technical issues of image blur.
The technical solution adopted to achieve the purpose of the present invention is:
A kind of anti-shaking method applied to TDI cmos image sensor, comprising:
The single-stage optical signal that single-stage reservoir reads single-stage reservoir is stored in compensating electric capacity, while in TDI accumulator
Middle progress tradition TDI accumulation；
TDI accumulator calculates single-stage optical signal difference and optical signal difference is added in cumulative capacitor, obtains optical signal
Total variances, and obtain resultant signal using the optical signal total variances and export；
Wherein, n grades of TDI optical signal total variances are as follows:
Resultant signal
Wherein, YA is single-stage optical signal, i=n.
Wherein, the single-stage reservoir is arranged between TDI accumulator and multiple pixels, includes:
Compensating electric capacity module, the compensating electric capacity comprising multiple parallel arrangements, for the single-stage optical signal that CDS is read, each
Compensating electric capacity connects a compensating electric capacity switch；
Condenser type trans-impedance amplifier, be located between the compensating electric capacity module and multiple pixels between, output and compensation
The input of capacitance module connects, and is used for charge integration, including gain amplifier and a capacitor, a compensating switch；Compensation
Work when closing the switch, by and compensating electric capacity switch be closed in the corresponding TDI stage, by integral result to compensating electric capacity, make phase
The compensating electric capacity answered obtains the accumulation of charge.
Wherein, one capacitor, a compensating switch are arranged in parallel with gain amplifier respectively.
Wherein, the output of the compensating electric capacity module is believed by the light of first switch and the gain amplifier of TDI accumulator
The connection of number input terminal, the signal input part of the gain amplifier of TDI accumulator and the light signal output end of pixel are opened by second
Pass is connected.
Wherein, the TDI accumulator includes the accumulation capacitor of multiple parallel arrangements, samples holding capacitor, each described tired
Product capacitor and an accumulation switch are connected in series, and the sampling holding capacitor passes through the increasing of sample-hold switch and TDI accumulator
The signal output end of beneficial amplifier connects, multiple accumulation capacitors, accumulation switch respectively with the gain amplifier of TDI accumulator simultaneously
Connection.
Compared with prior art, the beneficial effects of the present invention are:
By the method for the invention, the difference of different phase is found, and then finds the resultant signal from a kind of object, to reach
To deblurring, the effect of raising image quality.
Detailed description of the invention
Fig. 1 is the imaging mode schematic diagram of traditional TDI cmos image sensor；
Fig. 2 is TDI imaging mode schematic diagram affected by jitter；
Fig. 3 is the TDI path circuit schematic diagram of one embodiment of the invention.
Specific embodiment
The present invention is described in further detail below in conjunction with the drawings and specific embodiments.It should be appreciated that described herein
Specific embodiment be only used to explain the present invention, be not intended to limit the present invention.
As shown in Fig. 2, carrying out principle of specification by taking level Four TDI as an example, tri- objects of A, B and C are positionable adjacent one another, it is assumed that each
The optical signal density of a object is uniform, at the same assume pixel center away from the effective photosensitive area of pixel direction along ng a path length
It spends equal.Residual motion will lead to image and be displaced.The displacement of adjacent phases is r respectively1、r2And r3。
YA1=a (1)
YA2=YA1+r1(-a+b) (2)
YA3=YA2+r2(-a+b) (3)
YA4=YA3+r3(-a+b) (4)
Wherein, YA1-YA4 represents the optical signal size of four-stage pixel capture, and a indicates that the optical signal of object A, b indicate
The optical signal of object B.If following the cumulative mode of traditional TDI, four pixel optical signals are accumulated in together, optical signal is finally obtained
Neither from object A nor object B is come from, but the mixed signal of two articles, since signal mixing leads to image blur.
It can be handled by finding the difference in two neighboring stage, wherein the difference in two neighboring stage can be from YA1 to YA4
In find, the difference of mixed signal and clear signal may be expressed as:
Δ Y=3r1(a-b)+2r2(a-b)+r3(a-b) (5)
Δ Y=3 (YA1-YA2)+2 (YA1-YA3)+YA3-YA4 (6)
A clearly resultant signal Y is obtained by Δ Y, resultant signal Y is indicated are as follows:
It can be seen that, by level Four TDI imaging sensor, resultant signal Y is obtained from above formula, while in resultant signal Y only
Signal from object A.It can be obtained by a clearly resultant signal in this way, to achieve the effect that deblurring.This method can
To be generalized to the clear signal for seeking n rank TDI, formula 8 are as follows:
It is illustrated in figure 3 the TDI path circuit of one embodiment of the invention, left side one is classified as n pixel, serves as n TDI
Stage arranges parallel TDI circuit and two modules --- and TDI accumulator and single-stage reservoir-are integrated.Due to active using standard 4T
Dot structure selects gain amplifier for basic structure, removes reset noise by correlated-double-sampling (CDS).
Wherein, gain amplifier (GA2) and compensating switch SC, capacitor CDA condenser type trans-impedance amplifier is formed, electricity is used as
Lotus integral, capacitor CICFor eliminating the offset voltage of gain amplifier (GA2), compensating switch SCIt works when closure, integral knot
Fruit passes to compensating electric capacity (CC1-CCn-1), compensating electric capacity switchs (SC1-SCn-1) be closed in the corresponding TDI stage, make corresponding
Compensating electric capacity obtains the accumulation of charge.
In TDI accumulator, gain amplifier GA1 and capacitor (CA1-CAn) play identical effect, capacitor CIAFor disappearing
Except the offset voltage of gain amplifier GA1, with capacitor (CA1-CAn) in parallel accumulation switch SAWhen closure, condenser type amplifies across resistance
Device work, accumulates capacitance switch (SA1-SAn) be closed in the corresponding TDI stage, so that stored charge is stored in corresponding capacitor (CA1-
CAn) the inside, final integral result is in sample-hold switch SSHSampling holding capacitor C is passed to when closureSH。
TDI accumulator, the accumulation for conventional TDI accumulation and neighbouring stage signal difference.Single-stage reservoir reads defeated from CDS
Single-stage optical signal out, (CC1-CCn-1) it is compensating electric capacity, different capacitances generate the coefficient of formula (8), while storing light
Signal.Store the calculating that charge is used as subsequent optical signal difference.
The specific works of circuit shown in Fig. 3 are divided into two steps:
Firstly, two switch SMClosure, CDS read single-stage optical signal, single-stage optical signal are stored in compensating electric capacity.Together
When in TDI accumulator carry out tradition TDI accumulation (CIAFor input capacitance, the accumulation capacitance of respective stage is as feedback capacity).
By n-th order segment signal YAnIt is stored in CAnIn, the (n-1)th stage is by signal YAn-1It is stored in CAn-1In, the 1st stage is by signal YA1Storage
There are CA1In, then add up together.So n grades of TDI tradition accumulation results are as follows:
Second step, two switch SMShutdown, TDI accumulator calculate optical signal difference and are added to corresponding cumulative electricity
In appearance (for the compensating electric capacity of adjacent phases as input, the accumulation capacitor of respective stage is as feedback).
N-th order section, with being stored in CCn-1Charge PAn-1It subtracts and is stored in CAnSignal PAn, PAn-1-PAnIt is stored in CAn
In, the (n-1)th stage, with being stored in CCn-2Charge PAn-2It subtracts and is stored in CAn-1In charge, due to the capacitor of compensating electric capacity
Value difference causes the coefficient in formula (8) different, so being stored in CAn-1In charge difference be 2 (PAn-2-PAn-1)。
2nd stage, with being stored in CC1In charge PA1It subtracts and is stored in CA2In charge PA2, by charge differences (n-1)
(PA1-PA2) it is stored in CA2In, the 1st stage calculated without charge differences, the charge differences of n rank was accumulated in together, then n grades
TDI optical signal total variances are as follows:
By above-mentioned two step, available final resultant signal
As can be seen that influence of the residual motion to imaging effect can be effectively removed, through the invention so as to obtain one
The optical signal of a relative ideal, to greatly improve image quality.
The above is only a preferred embodiment of the present invention, it is noted that for the common skill of the art
For art personnel, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications
Also it should be regarded as protection scope of the present invention.
Claims (5)
1. a kind of anti-shaking method applied to TDI cmos image sensor, which is characterized in that comprising steps of
Single-stage reservoir read single-stage reservoir single-stage optical signal be stored in compensating electric capacity, while in TDI accumulator into
Row tradition TDI accumulation；
TDI accumulator calculates single-stage optical signal difference and optical signal difference is added in cumulative capacitor, and it is always poor to obtain optical signal
It is different, and obtain resultant signal using the optical signal total variances and export；
Wherein, n grades of TDI optical signal total variances are as follows:
Resultant signal
Wherein, YA is single-stage optical signal, i=n.
2. being applied to the anti-shaking method of TDI cmos image sensor as described in claim 1, which is characterized in that the single-stage
Reservoir is arranged between TDI accumulator and multiple pixels, includes:
Compensating electric capacity module, the compensating electric capacity comprising multiple parallel arrangements, for the single-stage optical signal that CDS is read, each compensation
One compensating electric capacity switch of capacitance connection；
Condenser type trans-impedance amplifier, be located between the compensating electric capacity module and multiple pixels between, output and compensating electric capacity
The input of module connects, and is used for charge integration, including gain amplifier and a capacitor, a compensating switch；Compensating switch
Work when closure, by and compensating electric capacity switch be closed in the corresponding TDI stage, by integral result to compensating electric capacity, make accordingly
Compensating electric capacity obtains the accumulation of charge.
3. being applied to the anti-shaking method of TDI cmos image sensor as claimed in claim 2, which is characterized in that one
Capacitor, a compensating switch are arranged in parallel with gain amplifier respectively.
4. being applied to the anti-shaking method of TDI cmos image sensor as described in claim 1, which is characterized in that the compensation
The output of capacitance module is connect by first switch with the optical signal input of the gain amplifier of TDI accumulator, TDI accumulator
The signal input part of gain amplifier be connected with the light signal output end of pixel by second switch.
5. being applied to the anti-shaking method of TDI cmos image sensor as claimed in claim 4, which is characterized in that the TDI
Accumulator includes the accumulation capacitor of multiple parallel arrangements, samples holding capacitor, and each accumulation capacitor and an accumulation switch
It is connected in series, the signal output end that the sampling holding capacitor passes through sample-hold switch and the gain amplifier of TDI accumulator
Connection, multiple accumulation capacitors, accumulation switch are in parallel with the gain amplifier of TDI accumulator respectively.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113422916A (en) * | 2021-06-08 | 2021-09-21 | 天津大学 | Digital accumulator for eliminating jitter and jitter eliminating method |
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