CN109642916B - Function test fixture - Google Patents

Function test fixture Download PDF

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Publication number
CN109642916B
CN109642916B CN201880002181.8A CN201880002181A CN109642916B CN 109642916 B CN109642916 B CN 109642916B CN 201880002181 A CN201880002181 A CN 201880002181A CN 109642916 B CN109642916 B CN 109642916B
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China
Prior art keywords
plate
probe
camera
test fixture
functional test
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CN201880002181.8A
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CN109642916A (en
Inventor
康龙泉
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Fujian Landi Commercial Equipment Co Ltd
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Fujian Landi Commercial Equipment Co Ltd
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Publication of CN109642916A publication Critical patent/CN109642916A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention relates to a functional test fixture, wherein a PCB is arranged on a base, the PCB can build peripheral equipment of a module to be tested, the intelligent communication module to be tested can be driven to operate through the PCB by the existing test equipment only by electrically connecting the intelligent communication module to be tested with the PCB, a camera is electrically connected with the PCB, an image fixing unit and the camera are arranged oppositely, the testing of a face recognition function in the intelligent communication module can be realized, the intelligent communication module is not required to be assembled into an electronic equipment finished product, the operation is convenient and fast, meanwhile, a testing result can be judged by comparing the consistency of a face image fixed by the image fixing unit and a face image analyzed by the intelligent communication module, and the accuracy is high.

Description

Function test fixture
Technical Field
The invention relates to a testing device of an intelligent communication module, in particular to a function testing clamp.
Background
The function test fixture is a mechanical auxiliary device used for testing a semi-finished product or a finished product of a certain procedure in a production link so as to judge whether a tested object achieves the purpose of an initial designer, can detect a large number of actual important function paths and structure verification, and determines that no hardware error exists so as to make up for the part omitted in the previous test process.
The current functional test anchor clamps can't test face identification module, at present to face identification module's among the intelligent communication module test, generally need assemble into electronic equipment finished product with intelligent communication module and just can carry out face identification module's test, whether further judge face identification module can normal operating through artifical face image display in to the electronic equipment finished product is unusual, the testing process needs to assemble intelligent communication module, waste time and energy, and artifical judgement is difficult to guarantee the accuracy of test result.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the functional test fixture is convenient for testing the face recognition module.
In order to solve the technical problems, the invention adopts the technical scheme that:
the utility model provides a function test fixture, includes the base and locates PCB board, camera and the image support on the base respectively, the camera is connected with PCB board electricity, the image support includes the image fixing unit, just the image fixing unit sets up with the camera relatively.
The invention has the beneficial effects that: be equipped with the PCB board on the base, the peripheral equipment of quilt survey module can be built to the PCB board, only need be connected with the intelligent communication module that awaits measuring with the PCB board electricity, just can pass through the intelligent communication module operation that the PCB board drive awaited measuring through current test equipment, the camera is connected with the PCB board electricity, image fixing unit sets up with the camera relatively, can realize the test to face recognition function in the intelligent communication module, need not to assemble into the electronic equipment finished product with intelligent communication module, the simple operation, the simultaneous testing result can be judged through the face image that contrast image fixing unit fixed and the analytic face image's of intelligent communication module uniformity, the accuracy is high.
Drawings
FIG. 1 is a schematic structural view of a functional test fixture according to the present invention;
FIG. 2 is a side view of a functional test fixture of the present invention;
FIG. 3 is a rear view of a functional test fixture of the present invention;
FIG. 4 is a cross-sectional view of a Socket test Socket of the present invention;
FIG. 5 is a schematic structural diagram of a Socket test Socket according to the present invention;
description of reference numerals:
1. a base; 2. a PCB board; 3. a first camera; 4. a second camera; 5. a display screen outer frame; 6. a touch display screen; 7. a backlight plate; 8. a transparent plate; 9. a support plate; 10. connecting blocks; 11. a first side plate; 12. a second side plate; 13. a third side plate; 14. socket test Socket; 15. an upper cover; 16. a lower cover; 17. clamping a plate; 18. a clamping block; 19. an upper body; 20. a threaded post; 21. briquetting; 22. a knob; 23. a copper bush; 24. a guide post; 25. a limiting stud; 26. a needle bearing; 27. a connecting plate; 28. a lower body; 29. a probe fixing plate; 30. a carrier plate; 31. a second spring.
Detailed Description
In order to explain technical contents, achieved objects, and effects of the present invention in detail, the following description is made with reference to the accompanying drawings in combination with the embodiments.
The most key concept of the invention is as follows: the camera is connected with PCB board 2 electricity, and the image support includes the image fixing unit, and the image fixing unit sets up with the camera relatively.
Referring to fig. 1 to 5, the functional test fixture provided by the present invention includes a base 1, and a PCB 2, a camera and an image support respectively disposed on the base 1, wherein the camera is electrically connected to the PCB 2, the image support includes an image fixing unit, and the image fixing unit and the camera are disposed opposite to each other.
From the above description, be equipped with PCB board 2 on the base 1, PCB board 2 can build the peripheral equipment of being surveyed the module, only need to be connected the intelligent communication module that awaits measuring with PCB board 2 electricity, just can pass through the operation of the intelligent communication module that PCB board 2 drive awaits measuring through current test equipment, the camera is connected with PCB board 2 electricity, image fixing unit sets up with the camera relatively, can realize the test to face recognition function in the intelligent communication module, need not to assemble into the electronic equipment finished product with intelligent communication module, the high durability and convenient operation, simultaneously the test result can be judged through the uniformity of the facial image that contrast image fixing unit fixed and the analytic facial image of intelligent communication module, the accuracy is high.
Further, the image fixing unit comprises a backlight plate 7, a face image is arranged on the surface of the backlight plate 7, and the face image and the camera are arranged oppositely.
As can be seen from the above description, the backlight plate 7 can adjust the brightness of the face image, and test the adaptability of the face recognition module to the brightness change.
Further, the image fixing unit further comprises a transparent plate 8, a clamping plate is arranged on the edge of the surface of the transparent plate 8, and the backlight plate 7 is detachably connected with the transparent plate 8 through the clamping plate.
As can be seen from the above description, the face image is fixed between the splint and the transparent plate 8, which facilitates the detachment and installation.
Further, the image support further comprises a supporting plate 9 and a connecting block 10, and the image fixing unit is detachably connected with the base 1 sequentially through the supporting plate 9 and the connecting block 10.
Further, the camera includes first camera 3 and second camera 4, first camera 3 and second camera 4 are connected with PCB board 2 electricity respectively.
As can be seen from the above description, the first camera 3 and the second camera 4 can respectively test the front and rear camera functions of the intelligent communication module.
Further, still include display screen frame 5 and touch display screen 6, be equipped with first recess on the base 1, display screen frame 5 is fixed in first recess, touch display screen 6 is located in display screen frame 5, and touch display screen 6 is connected with PCB board 2 electricity.
From the above description, the touch screen can test the touch function of the intelligent communication module, and the touch display screen 6 is arranged in the display screen outer frame 5, and the display screen outer frame 5 is fixed in the first groove, so that the structure is stable.
Furthermore, the camera is arranged on the frame of the display screen outer frame 5.
Further, the base 1 is a square box.
Further, camera and image support all are fixed in the first curb plate 11 of square box body, and camera and image support all are located the outside of square box body.
Further, the PCB board 2 is fixed to the first side board 11 of the square box, and the PCB board 2 is located inside the square box.
Further, the PCB board 2 includes an SD card socket and an SIM card socket, and both the SD card socket and the SIM card socket are exposed on the second side board 12 adjacent to the first side board 11 on the square box body.
As can be seen from the above description, both the SD card socket and the SIM card socket are exposed on the second side plate 12 adjacent to the first side plate 11 on the square box body, so as to facilitate the insertion of the SD card and the SIM card.
Further, the PCB board 2 further includes a USB interface, an SMA interface, a ground jack and a power jack, and the USB interface, the SMA interface, the ground jack and the power jack are all exposed on the third side board 13 adjacent to the first side board 11 on the square box body.
From the above description, it can be known that the USB interface, the SMA interface, the ground jack and the power jack are all exposed on the third side plate 13 adjacent to the first side plate 11 on the square box body, so that the operation is very convenient.
Further, the Socket testing seat 14 is further included, the Socket testing seat 14 is arranged on the base 1, and the testing probe of the Socket testing seat 14 is electrically connected with the testing point of the PCB 2.
It can be known from the above description that Socket test Socket 14 improves the installation convenience of the intelligent communication module, and the test probes of Socket test Socket 14 are electrically connected with the test points of PCB board 2, so that the intelligent communication module can be electrically connected with PCB board 2 only by installing the intelligent communication module in Socket test Socket 14.
Further, still include Socket test Socket 14, the surface of the part relative with PCB board 2 on the first curb plate 11 is equipped with the second recess, Socket test Socket 14 is located in the second recess, Socket test Socket 14's test probe wears to locate the bottom of second recess and Socket test Socket 14's test probe and PCB board 2's test point contact each other.
As can be seen from the above description, the Socket test Socket 14 is disposed in the second groove, the test probe of the Socket test Socket 14 penetrates the bottom of the second groove, and the test probe of the Socket test Socket 14 contacts with the test point of the PCB 2, so that the structure is compact and stable.
Further, Socket test seat 14 includes upper cover 15 and lower cover 16, the one end of upper cover 15 and the one end of lower cover 16 are articulated each other, the other end of upper cover 15 and the other end of lower cover 16 can be dismantled and be connected, test probe wears to locate lower cover 16.
As can be seen from the above description, one end of the upper cover 15 and one end of the lower cover 16 are hinged to each other, and the other end of the upper cover 15 is detachably connected to the other end of the lower cover 16, so as to facilitate the opening and closing of the upper cover 15 and the lower cover 16.
Furthermore, the other end of the upper cover 15 is provided with a clamping plate 17, the middle of the clamping plate 17 is rotatably connected with the other end of the upper cover 15, one end of the clamping plate 17, which is far away from the lower cover 16, is connected with the upper cover 15 through a first spring, one end of the clamping plate 17, which is close to the lower cover 16, is provided with a clamping groove, and the other end of the lower cover 16 is provided with a clamping block 18 matched with the clamping groove.
As can be seen from the above description, the opening and closing of the latch 18 and the latch slot can be controlled by pressing the first spring, and the operation is very convenient.
Further, the upper cover 15 includes an upper main body 19, a threaded column 20 and a pressing block 21, the upper main body 19 has a threaded hole, the threaded column 20 is screwed with the threaded hole, the pressing block 21 is disposed opposite to the end face of the threaded column 20, and the pressing block 21 is fixed on one side of the upper main body 19 close to the lower cover 16 through a second spring 31.
It can be known from the above description that screw post 20 and screw hole spiro union, briquetting 21 and the relative setting of the terminal surface of screw post 20, can control briquetting 21 downstream through rotatory screw post 20 and make intelligent communication module and test probe in close contact with, briquetting 21 is fixed in the one side that main part 19 is close to lower cover 16 through second spring 31, when screw post 20 unscrewed and kept away from lower cover 16 motion, receives the effect of second spring 31, briquetting 21 can self return.
Further, the upper cover 15 further comprises a knob 22, and the knob 22 is connected with one end of the threaded column 20 far away from the pressing block 21.
As can be appreciated from the above description, the knob 22 facilitates the rotational manipulation of the threaded post 20.
Further, the upper cover 15 further comprises a copper shaft sleeve 23 and a guide post 24, the copper shaft sleeve 23 sequentially penetrates through the upper main body 19 and the pressing block 21, and the guide post 24 penetrates through the copper shaft sleeve 23 and is slidably connected with the copper shaft sleeve 23.
As can be seen from the above description, the guide column 24 can limit the moving direction of the pressing block 21, and improve the smoothness of the movement of the pressing block 21.
Further, the upper cover 15 further comprises a limit stud 25, the limit stud 25 sequentially penetrates through the upper main body 19 and the pressing block 21, the limit stud 25 penetrates through the second spring 31, and nuts are arranged at two ends of the limit stud 25.
From the above description, the limit stud 25 sequentially penetrates through the upper main body 19 and the pressing block 21, and the two ends of the limit stud 25 are provided with nuts, so that the maximum displacement of the pressing block 21 can be limited, and the intelligent communication module is prevented from being damaged due to the overlarge stroke of the pressing block 21.
Further, the upper cover 15 further includes a needle bearing 26 located between the pressing block 21 and the threaded column 20.
As can be seen from the above description, when the threaded stud 20 rotates, the pressing block 21 may rub against the threaded stud 20, and the needle bearing 26 located between the pressing block 21 and the threaded stud 20 can convert sliding friction into rolling friction, thereby improving the smoothness of the rotation of the threaded stud 20.
Further, the upper cover 15 further includes a connecting plate 27 located between the needle bearing 26 and the pressing block 21, and the connecting plate 27 is sleeved on the second spring 31 and slidably connected with the second spring 31.
Further, lower cover 16 includes lower main part 28, probe fixed plate 29 and support plate 30, lower main part 28 is a fixed frame, be equipped with the probe fixed orifices on the probe fixed plate 29, be equipped with the probe via hole on the support plate 30, a face of probe fixed plate 29 is fixed mutually with one side of fixed frame, test probe wears to locate the both ends of probe fixed orifices and test probe all expose in the probe fixed orifices, support plate 30 inlays to be located in the frame of lower main part 28 with main part 28 sliding connection down, and support plate 30 is connected through third spring and probe fixed plate 29 one side that is close to lower main part 28, the probe via hole on the support plate 30 with the probe fixed orifices sets up relatively.
As can be seen from the above description, the carrier plate 30 is connected to one side of the probe fixing plate 29 close to the lower main body 28 through the third spring, and the probe through holes on the carrier plate 30 are disposed opposite to the probe fixing holes, so that the intelligent communication module is placed on the carrier plate 30, and the upper cover 15 is pressed, so that the upper cover 15 sequentially drives the intelligent communication module and the carrier plate 30 to move close to the test probes until the intelligent communication module and the test probes contact each other.
Further, the probe fixing plate 29 comprises a probe fixing upper plate and a probe fixing lower plate, the probe fixing upper plate and the probe fixing lower plate are detachably connected through a positioning pin hole and a positioning pin, a probe fixing upper hole is formed in the probe fixing upper plate, a probe fixing lower hole is formed in the probe fixing lower plate, and the probe fixing hole is formed by splicing the probe fixing upper hole and the probe fixing lower hole which are opposite.
As can be seen from the above description, the probe fixing holes are formed by splicing the upper probe fixing holes and the lower probe fixing holes, which are opposite to each other, so as to facilitate the installation of the test probes.
Furthermore, the diameter of the openings at the two ends of the probe fixing hole is smaller than the diameter of the hole cavity of the probe fixing hole, and the outline size of the test probe is matched with the outline size of the probe fixing hole.
From the above description, the diameter of the openings at the two ends of the probe fixing hole is smaller than the diameter of the hole cavity of the probe fixing hole, so that the test probe can be prevented from sliding, and the stability of the test probe can be improved.
Please refer to fig. 1 to 5:
the first embodiment of the invention is as follows:
a functional test fixture comprises a base 1, and a PCB 2, a camera, an image support, a display screen outer frame 5 and a touch display screen 6 which are respectively arranged on the base 1, wherein an intelligent communication module to be tested is electrically connected with the PCB 2, the intelligent communication module to be tested is driven to operate by the existing test equipment through the PCB 2, the camera is electrically connected with the PCB 2, the image support comprises an image fixing unit, a supporting plate 9 and a connecting block 10, the image fixing unit is detachably connected with the base 1 through the supporting plate 9 and the connecting block 10 in sequence, the image fixing unit comprises a backlight plate 7 and a transparent plate 8, a clamping plate is arranged on the edge of the surface of the transparent plate 8, the backlight plate 7 is detachably connected with the transparent plate 8 through the clamping plate, a face image is arranged on the surface of the backlight plate 7, and the camera comprises a first camera 3 and a second camera 4, first camera 3 and second camera 4 are connected with 2 electricity of PCB board respectively, the people's face image sets up with first camera 3 and second camera 4 respectively relatively, be equipped with first recess on the base 1, display screen frame 5 is fixed in first recess, touch display screen 6 is located in display screen frame 5, and touch display screen 6 is connected with 2 electricity of PCB board, first camera 3 and second camera 4 are located respectively on the frame of display screen frame 5.
The second embodiment of the invention is as follows:
a functional test fixture is further provided with the following characteristics on the basis of the first embodiment: the base 1 is a square box body, the camera and the image support are fixed on a first side plate 11 of the square box body, the camera and the image support are located outside the square box body, the PCB 2 is fixed on the first side plate 11 of the square box body, the PCB 2 is located inside the square box body, the PCB 2 comprises an SD card seat, an SIM card seat, a USB interface, an SMA interface, a grounding socket and a power socket, the SD card seat and the SIM card seat are exposed on a second side plate 12 adjacent to the first side plate 11 on the square box body, the USB interface, the SMA interface, the grounding socket and the power socket are exposed on a third side plate 13 adjacent to the first side plate 11 on the square box body, wherein the power socket is used for providing power for the PCB 2, and the grounding interface is used for ESD electrostatic protection of the intelligent communication module.
The third embodiment of the invention is as follows:
a functional test fixture is further provided with the following characteristics on the basis of the first embodiment: the functional test fixture further comprises a Socket test seat 14, the Socket test seat 14 is arranged on the base 1, a test probe of the Socket test seat 14 is electrically connected with a test point of the PCB 2, the Socket test seat 14 comprises an upper cover 15 and a lower cover 16, one end of the upper cover 15 and one end of the lower cover 16 are hinged with each other, a clamping plate 17 is arranged at the other end of the upper cover 15, the middle part of the clamping plate 17 is rotatably connected with the other end of the upper cover 15, one end, far away from the lower cover 16, of the clamping plate 17 is connected with the upper cover 15 through a first spring, a clamping groove is arranged at one end, close to the lower cover 16, of the clamping plate 17, a clamping block 18 matched with the clamping groove is arranged at the other end of the lower cover 16, the upper cover 15 comprises an upper main body 19, a threaded column 20, a pressing block 21, a knob 22, a copper shaft sleeve 23, a guide column 24, a limit stud 25, a needle bearing 26 and a connecting plate 27, the upper main body 19 is provided with a threaded hole, the threaded column 20 is screwed with the threaded hole, the pressing block 21 is arranged opposite to the end face of the threaded column 20, the pressing block 21 is fixed on one side of the upper main body 19 close to the lower cover 16 through a second spring 31, the knob 22 is connected with one end of the threaded column 20 far away from the pressing block 21, the copper shaft sleeve 23 is sequentially arranged through the upper main body 19 and the pressing block 21, the guide column 24 penetrates through the copper shaft sleeve 23 and is slidably connected with the copper shaft sleeve 23, the limit stud 25 is sequentially arranged through the upper main body 19 and the pressing block 21, the limit stud 25 penetrates through the second spring 31, nuts are arranged at two ends of the limit stud 25, the needle bearing 26 is positioned between the pressing block 21 and the threaded column 20, the connecting plate 27 is positioned between the needle bearing 26 and the pressing block 21, the connecting plate 27 is sleeved on the second spring 31 and is slidably connected with the second spring 31, the lower cover 16 comprises a lower main body 28, a probe fixing plate 29 and a support plate 30, the probe fixing plate 29 comprises a probe fixing upper plate and a probe fixing lower plate, the lower main body 28 is a fixing frame, the probe fixing plate 29 is provided with probe fixing holes, the support plate 30 is provided with probe through holes, one surface of the probe fixing plate 29 is fixed with one side of the fixing frame, the test probes penetrate through the probe fixing holes, the two ends of the test probes are exposed out of the probe fixing holes, the support plate 30 is embedded in the frame of the lower main body 28 and is slidably connected with the lower main body 28, the support plate 30 is connected with one side, close to the lower main body 28, of the probe fixing plate 29 through a third spring, the probe through holes in the support plate 30 are opposite to the probe fixing holes, the probe fixing upper plate and the probe fixing lower plate are detachably connected through positioning pin holes and positioning pins, the probe fixing upper plate is provided with a probe fixing upper hole, and the probe fixing lower hole is arranged on the probe fixing lower plate, the probe fixing hole is formed by splicing an upper probe fixing hole and a lower probe fixing hole which are opposite, the diameters of openings at two ends of the probe fixing hole are smaller than the diameter of the hole cavity of the probe fixing hole, and the outline size of the test probe is matched with the outline size of the probe fixing hole.
In summary, according to the functional test fixture provided by the invention, the PCB 2 is arranged on the base 1, the PCB 2 can build peripheral equipment of the module to be tested, the intelligent communication module to be tested can be driven to operate through the PCB 2 by the existing test equipment only by electrically connecting the intelligent communication module to be tested with the PCB 2, the camera is electrically connected with the PCB 2, and the image fixing unit and the camera are arranged oppositely, so that the face recognition function in the intelligent communication module can be tested, the intelligent communication module does not need to be assembled into an electronic equipment finished product, the operation is convenient and fast, meanwhile, the test result can be judged by comparing the consistency of the face image fixed by the image fixing unit and the face image analyzed by the intelligent communication module, and the accuracy is high.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all equivalent changes made by using the contents of the present specification and the drawings, or applied directly or indirectly to the related technical fields, are included in the scope of the present invention.

Claims (21)

1. The utility model provides a function test anchor clamps which characterized in that: the camera comprises a base, and a PCB, a camera and an image support which are respectively arranged on the base, wherein the camera is electrically connected with the PCB, the image support comprises an image fixing unit, and the image fixing unit and the camera are oppositely arranged;
the Socket test seat is arranged on the base, and a test probe of the Socket test seat is electrically connected with a test point of the PCB;
the Socket test seat comprises an upper cover and a lower cover, one end of the upper cover and one end of the lower cover are hinged with each other, the other end of the upper cover is detachably connected with the other end of the lower cover, and the test probe penetrates through the lower cover;
the clamping plate is arranged at the other end of the upper cover, the middle of the clamping plate is rotatably connected with the other end of the upper cover, one end, far away from the lower cover, of the clamping plate is connected with the upper cover through a first spring, a clamping groove is formed in one end, close to the lower cover, of the clamping plate, and a clamping block matched with the clamping groove is arranged at the other end of the lower cover;
the upper cover comprises an upper main body, a threaded column and a pressing block, the upper main body is provided with a threaded hole, the threaded column is in threaded connection with the threaded hole, the pressing block is arranged opposite to the end face of the threaded column, and the pressing block is fixed on one side, close to the lower cover, of the upper main body through a second spring.
2. The functional test fixture of claim 1, wherein: the image fixing unit comprises a backlight plate, a face image is arranged on the surface of the backlight plate, and the face image and the camera are arranged oppositely.
3. The functional test fixture of claim 2, wherein: the image fixing unit further comprises a transparent plate, a clamping plate is arranged on the edge of the surface of the transparent plate, and the backlight plate is detachably connected with the transparent plate through the clamping plate.
4. The functional test fixture of claim 1, wherein: the image support further comprises a supporting plate and a connecting block, and the image fixing unit is detachably connected with the base through the supporting plate and the connecting block in sequence.
5. The functional test fixture of claim 1, wherein: the camera comprises a first camera and a second camera, and the first camera and the second camera are respectively electrically connected with the PCB.
6. The functional test fixture of claim 1, wherein: the PCB is characterized by further comprising a display screen outer frame and a touch display screen, wherein a first groove is formed in the base, the display screen outer frame is fixed in the first groove, the touch display screen is arranged in the display screen outer frame, and the touch display screen is electrically connected with the PCB.
7. The functional test fixture of claim 6, wherein: the camera is arranged on the frame of the display screen outer frame.
8. The functional test fixture of claim 1, wherein: the base is a square box body.
9. The functional test fixture of claim 8, wherein: the camera and the image support are fixed on the first side plate of the square box body, and the camera and the image support are located outside the square box body.
10. The functional test fixture of claim 8, wherein: the PCB board is fixed in the first curb plate of square box body, and the PCB board is located the inside of square box body.
11. The functional test fixture of claim 10, wherein: the PCB board comprises an SD card seat and an SIM card seat, and the SD card seat and the SIM card seat are both exposed on a second side plate adjacent to the first side plate on the square box body.
12. The functional test fixture of claim 10, wherein: the PCB board still includes USB interface, SMA interface, ground connection socket and power socket, just USB interface, SMA interface, ground connection socket and power socket all expose on square box body with the adjacent third curb plate of first curb plate.
13. The functional test fixture of claim 10, wherein: the PCB board testing device is characterized by further comprising a Socket testing seat, a second groove is formed in the outer surface of the portion, opposite to the PCB board, of the first side board, the Socket testing seat is arranged in the second groove, a testing probe of the Socket testing seat penetrates through the bottom of the second groove, and the testing probe of the Socket testing seat is in contact with a testing point of the PCB board.
14. The functional test fixture of claim 1, wherein: the upper cover further comprises a knob, and the knob is connected with one end, far away from the pressing block, of the threaded column.
15. The functional test fixture of claim 1, wherein: the upper cover further comprises a copper shaft sleeve and a guide post, the copper shaft sleeve sequentially penetrates through the upper main body and the pressing block, and the guide post penetrates through the copper shaft sleeve and is slidably connected with the copper shaft sleeve.
16. The functional test fixture of claim 1, wherein: the upper cover further comprises a limiting stud, the limiting stud sequentially penetrates through the upper main body and the pressing block and penetrates through the second spring, and nuts are arranged at two ends of the limiting stud.
17. The functional test fixture of claim 1, wherein: the upper cover further comprises a needle bearing positioned between the pressing block and the threaded column.
18. The functional test fixture of claim 17, wherein: the upper cover further comprises a connecting block positioned between the needle bearing and the pressing block, and the second spring is sleeved with the connecting block and slidably connected with the second spring.
19. The functional test fixture of claim 1 or 13, wherein: the lower cover includes lower main part, probe fixed plate and support plate, the main part is a fixed frame down, be equipped with the probe fixed orifices on the probe fixed plate, be equipped with the probe via hole on the support plate, a face of probe fixed plate is fixed mutually with one side of fixed frame, the test probe wears to locate the both ends of probe fixed orifices and test probe all expose in the probe fixed orifices, the support plate inlay locate down in the frame of main part with main part sliding connection down, and the support plate is connected through one side that third spring and probe fixed plate are close to lower main part, the probe via hole on the support plate with the probe fixed orifices sets up relatively.
20. The functional test fixture of claim 19, wherein: the probe fixing plate comprises a probe fixing upper plate and a probe fixing lower plate, the probe fixing upper plate and the probe fixing lower plate are detachably connected through a positioning pin hole and a positioning pin, a probe fixing upper hole is formed in the probe fixing upper plate, a probe fixing lower hole is formed in the probe fixing lower plate, and the probe fixing hole is formed by splicing the probe fixing upper hole and the probe fixing lower hole which are opposite.
21. The functional test fixture of claim 20, wherein: the diameter of the openings at the two ends of the probe fixing hole is smaller than the diameter of the hole cavity of the probe fixing hole, and the outline size of the test probe is matched with the outline size of the probe fixing hole.
CN201880002181.8A 2018-11-23 2018-11-23 Function test fixture Active CN109642916B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2018/117130 WO2020103121A1 (en) 2018-11-23 2018-11-23 Function test fixture

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CN109642916A CN109642916A (en) 2019-04-16
CN109642916B true CN109642916B (en) 2022-03-15

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CN110488050A (en) * 2019-08-26 2019-11-22 福州汇思博信息技术有限公司 A kind of test fixture of the Socket structure with shield effectiveness
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