CN111880086A - Flat cable testing device - Google Patents

Flat cable testing device Download PDF

Info

Publication number
CN111880086A
CN111880086A CN202010916447.9A CN202010916447A CN111880086A CN 111880086 A CN111880086 A CN 111880086A CN 202010916447 A CN202010916447 A CN 202010916447A CN 111880086 A CN111880086 A CN 111880086A
Authority
CN
China
Prior art keywords
probe
seat
flat cable
testing device
fool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010916447.9A
Other languages
Chinese (zh)
Inventor
刘月敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangdong Jinlong Dongchuang Intelligent Equipment Co ltd
Original Assignee
Guangdong Jinlong Dongchuang Intelligent Equipment Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangdong Jinlong Dongchuang Intelligent Equipment Co ltd filed Critical Guangdong Jinlong Dongchuang Intelligent Equipment Co ltd
Priority to CN202010916447.9A priority Critical patent/CN111880086A/en
Publication of CN111880086A publication Critical patent/CN111880086A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a flat cable testing device, which consists of a testing base and a turnover cover hinged to the testing base; the test base comprises a fixed base, a probe base and a probe; the probe seat can be embedded on the fixed seat in a vertically movable manner; one end of the probe is fixedly arranged on the fixed seat, and the other end of the probe penetrates through the probe seat; the fixed seat is provided with a fool-proof limiting mechanism, and the fool-proof limiting mechanism consists of a fixed block, a movable block and a first elastic piece arranged between the fixed block and the movable block; one side of the movable block close to the probe seat is provided with a limiting part which is contacted with the probe seat and limits the downward movement of the probe seat; the flip cover is provided with a fool-proof pressing block matched with the fool-proof limiting mechanism for use. According to the invention, the fool-proof limiting mechanism is additionally arranged between the fixed seat and the probe seat, so that the probe is hidden in the probe seat when not tested and cannot be exposed outside, the situation that a person or an object mistakenly touches the probe to damage the probe is avoided, the service life of the probe is prolonged, and the fool-proof limiting mechanism is suitable for large-scale popularization and application.

Description

Flat cable testing device
Technical Field
The embodiment of the invention relates to the technical field of detection jigs, in particular to a flat cable testing device.
Background
With the continuous development of electronic technology and the increasing demand of people on the lightness and thinness of electronic products. Electronic products such as electronic watches are gradually developing towards more integration and precision, and the layout of components inside the products is also more and more compact and the manufacturing process is more and more strict.
The flat cable in the electronic watch, also called a Flexible Printed Circuit (FPC), has the advantages of small occupied space, flexible appearance change and the like, can conveniently electrically connect the mainboard with a plurality of functional modules, such as a distance sensing module, a camera module, a screen display module and the like, and realizes the function control of the functional modules. Because the performance of the flat cable has a great influence on the use performance of the electronic watch, in order to ensure the product quality, the performance of the flat cable needs to be tested after the flat cable is produced or before the flat cable is assembled, so that the flat cable with poor quality can be prevented from being applied to a formed product.
At present, the electronic test of the fine flat cable in the electronic watch is generally applied to a micron-sized probe. However, in practical use, the service life of the micron-sized probe is not high, and the micron-sized probe needs to be replaced more frequently, which results in higher test cost. The reason is that the micro-level probe is always exposed when the flat cable testing module using the micro-level probe is not tested, which is very easy to pollute or damage the probe due to the error touch or collision of people or objects.
Therefore, how to increase the service life of the micron-sized probe in the flat cable testing module becomes a technical problem to be solved in the field.
Disclosure of Invention
The invention provides a flat cable testing device, which is used for solving the defects of the prior art.
In order to achieve the above purpose, the present invention provides the following technical solutions:
a flat cable testing device is composed of a testing base and a turnover cover hinged to the testing base;
the test base comprises a fixed base, a probe base and a probe; the probe seat can be movably embedded on the fixed seat up and down; one end of the probe is fixedly arranged on the fixed seat, and the other end of the probe penetrates through the probe seat;
the fixed seat is provided with a fool-proof limiting mechanism, and the fool-proof limiting mechanism consists of a fixed block, a movable block and a first elastic piece arranged between the fixed block and the movable block;
a limiting part which is contacted with the probe seat and limits the downward movement of the probe seat is arranged on one side of the movable block close to the probe seat;
a foolproof pressing block matched with the foolproof limiting mechanism for use is arranged on the flip cover;
when the flip cover is turned and pressed downwards, the fool-proof pressing block is pressed downwards along with the flip cover, so that the movable block is pushed towards the direction far away from the probe seat until the limiting part is disconnected from the probe seat, the probe seat can move downwards along with the downward pressing of the flip cover, and the probe can extend out of the probe seat.
Furthermore, in the flat cable testing device, a first inclined plane is arranged at one end of the fool-proof pressing block, which is in contact with the movable block;
and a second inclined plane matched with the first inclined plane is arranged on the movable block.
Furthermore, in the flat cable testing device, the probe seat comprises an inner template and a carrier plate;
the inner template is embedded on the fixed seat, and a second elastic piece is connected between the inner template and the fixed seat;
the support plate is embedded in the inner template and is fixedly connected with the inner template;
and probe holes are formed in the positions, corresponding to the probes, on the carrier plate.
Further, in the flat cable testing device, the number of the probe holes is the same as the number of the probes.
Furthermore, in the flat cable testing device, the first elastic part and the second elastic part are both springs or elastic plastics.
Furthermore, in the flat cable testing device, the testing base further comprises a prepressing plate;
the prepressing plate is hinged on the inner template and used for pressing and limiting the flat cable to be tested on the support plate.
Further, in the flat cable testing device, the fixing seat comprises a fixing seat main body and a bottom plate;
the fixing seat main body is provided with a through hole penetrating through the upper wall and the lower wall of the fixing seat main body;
the bottom plate is arranged in the through hole and is fixedly connected with the fixing seat main body to form a groove which takes the bottom plate as a groove bottom and can be used for the inner template to be embedded.
Furthermore, in the flat cable testing device, a guide post capable of playing a guiding role is arranged on the bottom plate;
and a guide groove matched with the guide column for use is formed in the position, corresponding to the guide column, on the inner template.
Further, in the flat cable testing device, the fixing block and the fixing base main body are integrally formed or fastened and connected.
Furthermore, in the flat cable testing device, a buckle assembly is arranged on the fixing seat main body;
and a clamping hook component matched with the clamping buckle component for use is arranged at the position, corresponding to the clamping buckle component, on the flip cover.
According to the flat cable testing device provided by the embodiment of the invention, the foolproof limiting mechanism is additionally arranged between the fixed seat and the probe seat, and the foolproof pressing block on the flip cover is matched to enable the probe to be hidden in the probe seat in a non-testing stage and not to be exposed outside, so that the purposes of foolproof limiting when not testing and canceling the foolproof limiting when testing are achieved, the flat cable testing device is very stable and convenient, the situation that a person or an object mistakenly touches the probe to damage the probe is avoided, the requirements of prolonging the service life of the probe and reducing the use cost of the probe are met, and the flat cable testing device is suitable for.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a schematic structural view of a flat cable testing device according to an embodiment of the present invention when the flat cable testing device is not covered;
fig. 2 is a schematic structural view of the flat cable testing device according to the embodiment of the present invention when the flat cable testing device is not covered;
fig. 3 is a schematic structural diagram of a flat cable testing device according to an embodiment of the present invention when being covered;
FIG. 4 is a schematic structural diagram of a fool-proof mechanism according to an embodiment of the present invention;
FIG. 5 is a schematic structural view of the fool-proof stop mechanism and the fool-proof press block provided in the embodiment of the present invention when they are engaged;
FIG. 6 is a schematic structural diagram of a probe not extending out when the flip cover is not pressed down according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of the probe extending after the flip cover is pressed down according to the embodiment of the present invention.
Reference numerals:
the device comprises a test base 1, a flip cover 2, a foolproof press block 3, a prepressing plate 4, a buckle component 5 and a clamping hook component 6;
the device comprises a fixed seat 11, a probe seat 12, a probe 13 and a foolproof limiting mechanism 14;
a holder body 111, a bottom plate 112;
an inner template 121, a support plate 122 and a probe hole 123;
a fixed block 141, a movable block 142, a first elastic element 143, and a limiting part 144.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the embodiments described below are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present.
Furthermore, the terms "long", "short", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of describing the present invention, but do not indicate or imply that the referred devices or elements must have the specific orientations, be configured to operate in the specific orientations, and thus are not to be construed as limitations of the present invention.
The technical scheme of the invention is further explained by the specific implementation mode in combination with the attached drawings.
Example one
Referring to fig. 1 to 7, an embodiment of the invention provides a flat cable testing device, which includes a testing base 1 and a flip 2 hinged to the testing base 1;
the test base 1 comprises a fixed base 11, a probe base 12 and a probe 13; the probe seat 12 is movably embedded on the fixed seat 11 up and down; one end of the probe 13 is fixedly arranged on the fixed seat 11, and the other end of the probe is arranged in the probe seat 12 in a penetrating manner;
the fixed seat 11 is provided with a fool-proof limiting mechanism 14, and the fool-proof limiting mechanism 14 is composed of a fixed block 141, a movable block 142 and a first elastic part 143 arranged between the fixed block 141 and the movable block 142;
a limiting part 144 which is contacted with the probe seat 12 and limits the downward movement of the probe seat 12 is arranged on one side of the movable block 142 close to the probe seat 12; the limiting portion 144 and the movable block 142 are integrally formed or fastened.
The flip cover 2 is provided with a foolproof pressing block 3 matched with the foolproof limiting mechanism 14 for use;
when the flip cover 2 is turned over and pressed down, the fool-proof press block 3 is pressed down to push the movable block 142 in a direction away from the probe base 12 until the limiting part 144 is disconnected from the probe base 12, so that the probe base 12 can move down along with the pressing of the flip cover 2, and the probe 13 can extend out of the probe base 12 and then is connected with a metal sheet of a flat cable for testing.
The first elastic element 143 is a spring or an elastic plastic, preferably a spring.
In this embodiment, a first inclined plane is disposed at one end of the foolproof press block 3, which is in contact with the movable block 142;
the movable block 142 is provided with a second inclined surface adapted to the first inclined surface.
It should be noted that the inclination angles of the first inclined plane and the second inclined plane are complementary, and the reason for this is that when the fool-proof press block 3 is pressed down, the fool-proof press block can smoothly continue to be pressed down along the second inclined plane by the first inclined plane, so as to push the movable block 142 in a direction away from the probe base 12.
In this embodiment, the probe socket 12 includes an inner mold plate 121 and a carrier plate 122;
the inner template 121 is embedded in the fixed seat 11, and a second elastic part is connected between the inner template and the fixed seat 11;
the carrier plate 122 is embedded on the inner template 121 and is fixedly connected with the inner template 121;
a probe hole 123 is formed in the position of the carrier plate 122 corresponding to the probe 13.
Wherein the number of the probe holes 123 is the same as that of the probes 13; the second elastic member may be a spring or an elastic plastic like the first elastic member 143.
It should be noted that, since the carrier plate 122 is fixedly connected to the inner mold plate 121, when the inner mold plate 121 is pressed to move downward, the carrier plate 122 also moves downward (actually, the carrier plate 122 is also pressed by the downward force of the flip 2), that is, the inner mold plate 121 and the carrier plate 122 move synchronously, and similarly, when the inner mold plate 121 is not pressed (that is, the flip 2 is opened), the inner mold plate 121 moves upward due to the acting force of the spring (that is, the elastic force provided when the spring returns to deform), and at this time, the carrier plate 122 also moves upward under the driving of the inner mold plate 121. In view of saving parts, the embodiment only exemplifies that a spring is disposed between the inner mold plate 121 and the fixing seat 11, but a spring may be disposed between the carrier plate 122 and the fixing seat 11, or springs may be disposed between the inner mold plate 121 and the carrier plate 122 and the fixing seat 11 as required.
In this embodiment, the testing base 1 further includes a pre-pressing plate 4;
the pre-pressing plate 4 is hinged to the inner mold plate 121 and is used for pressing and limiting the flat cable to be tested on the carrier plate 122.
It should be noted that the pre-pressing plate 4 can ensure that the flat cable to be tested placed on the carrier plate 122 does not move or shift, so that the probes 13 extending from the probe holes 123 can be accurately inserted onto the metal sheets of the flat cable during testing.
In this embodiment, the fixing base 11 includes a fixing base main body 111 and a bottom plate 112;
the fixing seat main body 111 is provided with a through hole penetrating through the upper wall and the lower wall of the fixing seat main body 111;
the bottom plate 112 is disposed in the through hole and is fixedly connected to the fixing base main body 111 to form a groove with the bottom plate 112 as a groove bottom for the inner mold plate 121 to be embedded.
In this embodiment, the bottom plate 112 is provided with a guiding post for guiding;
the inner mold plate 121 is provided with a guide groove corresponding to the guide post.
Preferably, the fixing block 141 and the fixing base main body 111 are integrally formed or fastened.
In this embodiment, the fixing seat main body 111 is provided with a fastening component 5;
and a clamping hook component 6 matched with the clamping component 5 for use is arranged at the position, corresponding to the clamping component 5, on the flip cover 2.
The fool-proof principle of the fool-proof limiting mechanism 14 is explained as follows:
when the test is not performed (when the flip cover 2 is opened), the movable block 142 is subjected to a spring pressure in the direction of the probe base 12, so that the movable block 142 can be pushed to the lower side of the probe base 12 to abut against the probe base 12, and as long as the probe base 12 is not subjected to a force enough to damage the movable block 142, the probe 13 cannot be exposed no matter how to press, and the contact of external pollutants or the accidental touch of a human hand is avoided;
when a test is performed (when the flip cover 2 is closed), along with the downward pressing of the flip cover 2, the fool-proof press block 3 pushes the movable block 142 along the second inclined plane towards a direction away from the probe base 12 through the first inclined plane until the movable block 142 is separated from the bottom of the probe base 12, at this time, the limiting effect of the movable block 142 on the probe base 12 disappears, the probe base 12 is pressed downward, and the probe 13 is relatively lifted upward to perform a wire arrangement test.
According to the flat cable testing device provided by the embodiment of the invention, the foolproof limiting mechanism is additionally arranged between the fixed seat and the probe seat, and the foolproof pressing block on the flip cover is matched to enable the probe to be hidden in the probe seat in a non-testing stage and not to be exposed outside, so that the purposes of foolproof limiting when not testing and canceling the foolproof limiting when testing are achieved, the flat cable testing device is very stable and convenient, the situation that a person or an object mistakenly touches the probe to damage the probe is avoided, the requirements of prolonging the service life of the probe and reducing the use cost of the probe are met, and the flat cable testing device is suitable for.
The foregoing description of the embodiments has been presented for the purposes of illustration and description. It is not intended to be exhaustive or to limit the disclosure. Individual elements or features of a particular embodiment are generally not limited to that particular embodiment, but, where applicable, are interchangeable and can be used in a selected embodiment, even if not specifically shown or described. The same elements or features may also vary in many respects. Such variations are not to be regarded as a departure from the disclosure, and all such modifications are intended to be included within the scope of the disclosure.
Example embodiments are provided so that this disclosure will be thorough and will fully convey the scope to those skilled in the art. Numerous details are set forth, such as examples of specific parts, devices, and methods, in order to provide a thorough understanding of embodiments of the present disclosure. It will be apparent to those skilled in the art that specific details need not be employed, that example embodiments may be embodied in many different forms and that neither should be construed to limit the scope of the disclosure. In certain example embodiments, well-known processes, well-known device structures, and well-known technologies are not described in detail.
The terminology used herein is for the purpose of describing particular example embodiments only and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. The terms "comprises" and "comprising" are intended to be inclusive and therefore specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. The method steps, processes, and operations described herein are not to be construed as necessarily requiring their performance in the particular order discussed and illustrated, unless explicitly indicated as an order of performance. It should also be understood that additional or alternative steps may be employed.
When an element or layer is referred to as being "on" … … "," engaged with "… …", "connected to" or "coupled to" another element or layer, it can be directly on, engaged with, connected to or coupled to the other element or layer, or intervening elements or layers may also be present. In contrast, when an element or layer is referred to as being "directly on … …," "directly engaged with … …," "directly connected to" or "directly coupled to" another element or layer, there may be no intervening elements or layers present. Other words used to describe the relationship of elements should be interpreted in a similar manner (e.g., "between … …" and "directly between … …", "adjacent" and "directly adjacent", etc.). As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items. Although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms may be only used to distinguish one element, component, region or section from another element, component, region or section. Unless clearly indicated by the context, use of terms such as the terms "first," "second," and other numerical values herein does not imply a sequence or order. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the example embodiments.
Spatially relative terms, such as "inner," "outer," "below," "… …," "lower," "above," "upper," and the like, may be used herein for ease of description to describe a relationship between one element or feature and one or more other elements or features as illustrated in the figures. Spatially relative terms may be intended to encompass different orientations of the device in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the example term "below … …" can encompass both an orientation of facing upward and downward. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted.

Claims (10)

1. A flat cable testing device is characterized by comprising a testing base and a turnover cover hinged to the testing base;
the test base comprises a fixed base, a probe base and a probe; the probe seat can be movably embedded on the fixed seat up and down; one end of the probe is fixedly arranged on the fixed seat, and the other end of the probe penetrates through the probe seat;
the fixed seat is provided with a fool-proof limiting mechanism, and the fool-proof limiting mechanism consists of a fixed block, a movable block and a first elastic piece arranged between the fixed block and the movable block;
a limiting part which is contacted with the probe seat and limits the downward movement of the probe seat is arranged on one side of the movable block close to the probe seat;
a foolproof pressing block matched with the foolproof limiting mechanism for use is arranged on the flip cover;
when the flip cover is turned and pressed downwards, the fool-proof pressing block is pressed downwards along with the flip cover, so that the movable block is pushed towards the direction far away from the probe seat until the limiting part is disconnected from the probe seat, the probe seat can move downwards along with the downward pressing of the flip cover, and the probe can extend out of the probe seat.
2. The flat cable testing device according to claim 1, wherein a first inclined surface is provided on an end of the fool-proof press block contacting the movable block;
and a second inclined plane matched with the first inclined plane is arranged on the movable block.
3. The flat cable testing device of claim 1, wherein the probe seat comprises an inner template and a carrier plate;
the inner template is embedded on the fixed seat, and a second elastic piece is connected between the inner template and the fixed seat;
the support plate is embedded in the inner template and is fixedly connected with the inner template;
and probe holes are formed in the positions, corresponding to the probes, on the carrier plate.
4. The flat cable testing device according to claim 3, wherein the number of the probe holes is the same as the number of the probes.
5. The flat cable testing device according to claim 3, wherein the first and second elastic members are both a spring or an elastic plastic.
6. The flat cable testing device of claim 3, wherein the testing base further comprises a pre-press plate;
the prepressing plate is hinged on the inner template and used for pressing and limiting the flat cable to be tested on the support plate.
7. The flat cable testing device according to claim 3, wherein the holder comprises a holder body and a bottom plate;
the fixing seat main body is provided with a through hole penetrating through the upper wall and the lower wall of the fixing seat main body;
the bottom plate is arranged in the through hole and is fixedly connected with the fixing seat main body to form a groove which takes the bottom plate as a groove bottom and can be used for the inner template to be embedded.
8. The flat cable testing device according to claim 7, wherein the bottom plate is provided with a guiding post for guiding;
and a guide groove matched with the guide column for use is formed in the position, corresponding to the guide column, on the inner template.
9. The flat cable testing device according to claim 7, wherein the fixing block is integrally formed or fastened with the fixing base body.
10. The flat cable testing device according to claim 3, wherein the fixing base body is provided with a snap assembly;
and a clamping hook component matched with the clamping buckle component for use is arranged at the position, corresponding to the clamping buckle component, on the flip cover.
CN202010916447.9A 2020-09-03 2020-09-03 Flat cable testing device Pending CN111880086A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010916447.9A CN111880086A (en) 2020-09-03 2020-09-03 Flat cable testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010916447.9A CN111880086A (en) 2020-09-03 2020-09-03 Flat cable testing device

Publications (1)

Publication Number Publication Date
CN111880086A true CN111880086A (en) 2020-11-03

Family

ID=73199630

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010916447.9A Pending CN111880086A (en) 2020-09-03 2020-09-03 Flat cable testing device

Country Status (1)

Country Link
CN (1) CN111880086A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113253158A (en) * 2021-05-12 2021-08-13 苏州市运泰利自动化设备有限公司 Double-layer turnover vertical pressing module
KR20220169838A (en) * 2021-06-21 2022-12-28 주식회사 쎄믹스 Prober having electric equipment maintenance door

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113253158A (en) * 2021-05-12 2021-08-13 苏州市运泰利自动化设备有限公司 Double-layer turnover vertical pressing module
KR20220169838A (en) * 2021-06-21 2022-12-28 주식회사 쎄믹스 Prober having electric equipment maintenance door
KR102548389B1 (en) 2021-06-21 2023-06-27 주식회사 쎄믹스 Prober having electric equipment maintenance door

Similar Documents

Publication Publication Date Title
CN111880086A (en) Flat cable testing device
CN102365608B (en) Message input device and the pressure sensing cell used in message input device
US7923653B2 (en) Key switch sheet and key switch module
US5926027A (en) Apparatus and method for testing a device
KR101442035B1 (en) Apparatus for testing camera module
TW200600790A (en) Double acting spring probe
US20060279317A1 (en) Test apparatus capable of accurately connecting a test object to a substrate
WO2008038573A1 (en) Anisotropic conductive connector and method for inspecting article inspected using this anisotropic conductive connector
TW201140956A (en) Board mounting device, test head, and electronic component testing device
CN213091816U (en) Flat cable testing device
US8981801B2 (en) Positioning device for testing resistance of camera module
KR102139584B1 (en) Socket for testing semiconductor device
KR20110102812A (en) Switch unit, manipulating switch and portable electronic device
KR100721587B1 (en) Contactor for testing of electronic part
CN116008780A (en) Folding and testing integrated device
JP3346936B2 (en) Display panel inspection socket
JP2010040473A (en) Membrane switch
JP3971079B2 (en) Input device and detection device
CN111351638A (en) Compatible optical ultra-thin screen lower fingerprint module function testing device
CN211293209U (en) Conduction performance test connection jig
CN110953968A (en) Detection jig assembly and using method thereof
WO1997043652A1 (en) Probe needle
JP2003157939A (en) Contactor for semiconductor testing and contact method
JP2010097708A (en) Key switch and switch sheet
JPH08254567A (en) Lead press part mechanism of handler for ic tester

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination