CN109613035B - 一种用于电子显微镜的样品支撑体及样品杆 - Google Patents
一种用于电子显微镜的样品支撑体及样品杆 Download PDFInfo
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- CN109613035B CN109613035B CN201910131542.5A CN201910131542A CN109613035B CN 109613035 B CN109613035 B CN 109613035B CN 201910131542 A CN201910131542 A CN 201910131542A CN 109613035 B CN109613035 B CN 109613035B
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- sample
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- inner frame
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- 238000010894 electron beam technology Methods 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims 1
- 230000033001 locomotion Effects 0.000 description 8
- 230000005540 biological transmission Effects 0.000 description 3
- 230000006978 adaptation Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000806 elastomer Substances 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Description
Claims (11)
Priority Applications (1)
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CN201910131542.5A CN109613035B (zh) | 2019-02-22 | 2019-02-22 | 一种用于电子显微镜的样品支撑体及样品杆 |
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CN201910131542.5A CN109613035B (zh) | 2019-02-22 | 2019-02-22 | 一种用于电子显微镜的样品支撑体及样品杆 |
Publications (2)
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CN109613035A CN109613035A (zh) | 2019-04-12 |
CN109613035B true CN109613035B (zh) | 2021-03-26 |
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CN201910131542.5A Active CN109613035B (zh) | 2019-02-22 | 2019-02-22 | 一种用于电子显微镜的样品支撑体及样品杆 |
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Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN110441334B (zh) * | 2019-07-11 | 2022-08-02 | 安徽泽攸科技有限公司 | 一种多场原位透射电子显微镜样品杆 |
Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995008181A2 (en) * | 1993-09-13 | 1995-03-23 | Biotechnology Research And Development Corporation | A system for analyzing surfaces of samples |
US5698856A (en) * | 1996-08-05 | 1997-12-16 | Frasca; Peter | Specimen holder for electron microscope |
JP2005158288A (ja) * | 2003-11-20 | 2005-06-16 | Canon Inc | 電子顕微鏡用試料冷却ホルダ |
CN1797734A (zh) * | 2004-12-22 | 2006-07-05 | 中芯国际集成电路制造(上海)有限公司 | 扫描电子显微镜用的样品夹 |
EP1947675A1 (en) * | 2007-01-22 | 2008-07-23 | FEI Company | Manipulator for rotating and translating a sample holder |
US7952082B2 (en) * | 2006-10-26 | 2011-05-31 | Jeol Ltd. | Sample preparation system |
CN102262996A (zh) * | 2011-05-31 | 2011-11-30 | 北京工业大学 | 透射电镜用双轴倾转的原位力、电性能综合测试样品杆 |
US8440982B1 (en) * | 2011-12-19 | 2013-05-14 | Korea Basic Science Institute | Cryo transfer holder for transmission electron microscope |
WO2013111453A1 (ja) * | 2012-01-25 | 2013-08-01 | 株式会社 日立ハイテクノロジーズ | 電子顕微鏡用試料ホルダ |
CN104637765A (zh) * | 2015-02-15 | 2015-05-20 | 北京工业大学 | 一种透射电子显微镜用双轴倾转样品台 |
CN105758876A (zh) * | 2016-04-17 | 2016-07-13 | 北京工业大学 | 一种透射电子显微镜用双轴倾转样品杆 |
CN105990079A (zh) * | 2015-02-28 | 2016-10-05 | 浙江大学 | 透射电子显微镜用压电驱动式双轴倾转样品杆 |
CN105988020A (zh) * | 2015-02-28 | 2016-10-05 | 浙江大学 | 透射电子显微镜原位环境双倾样品杆 |
CN108155078A (zh) * | 2016-12-06 | 2018-06-12 | 浙江大学 | 能对样品进行360°旋转的透射电镜样品杆 |
-
2019
- 2019-02-22 CN CN201910131542.5A patent/CN109613035B/zh active Active
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995008181A2 (en) * | 1993-09-13 | 1995-03-23 | Biotechnology Research And Development Corporation | A system for analyzing surfaces of samples |
US5698856A (en) * | 1996-08-05 | 1997-12-16 | Frasca; Peter | Specimen holder for electron microscope |
JP2005158288A (ja) * | 2003-11-20 | 2005-06-16 | Canon Inc | 電子顕微鏡用試料冷却ホルダ |
CN1797734A (zh) * | 2004-12-22 | 2006-07-05 | 中芯国际集成电路制造(上海)有限公司 | 扫描电子显微镜用的样品夹 |
US7952082B2 (en) * | 2006-10-26 | 2011-05-31 | Jeol Ltd. | Sample preparation system |
EP1947675A1 (en) * | 2007-01-22 | 2008-07-23 | FEI Company | Manipulator for rotating and translating a sample holder |
CN102262996A (zh) * | 2011-05-31 | 2011-11-30 | 北京工业大学 | 透射电镜用双轴倾转的原位力、电性能综合测试样品杆 |
US8440982B1 (en) * | 2011-12-19 | 2013-05-14 | Korea Basic Science Institute | Cryo transfer holder for transmission electron microscope |
WO2013111453A1 (ja) * | 2012-01-25 | 2013-08-01 | 株式会社 日立ハイテクノロジーズ | 電子顕微鏡用試料ホルダ |
CN104637765A (zh) * | 2015-02-15 | 2015-05-20 | 北京工业大学 | 一种透射电子显微镜用双轴倾转样品台 |
CN105990079A (zh) * | 2015-02-28 | 2016-10-05 | 浙江大学 | 透射电子显微镜用压电驱动式双轴倾转样品杆 |
CN105988020A (zh) * | 2015-02-28 | 2016-10-05 | 浙江大学 | 透射电子显微镜原位环境双倾样品杆 |
CN105758876A (zh) * | 2016-04-17 | 2016-07-13 | 北京工业大学 | 一种透射电子显微镜用双轴倾转样品杆 |
CN108155078A (zh) * | 2016-12-06 | 2018-06-12 | 浙江大学 | 能对样品进行360°旋转的透射电镜样品杆 |
Non-Patent Citations (4)
Title |
---|
Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscope;T. Uhlig;《Ultramicroscopy》;20031231(第94期);第193-196页 * |
Three-dimensional STEM for observing nanostructures;Masanari Koguchi;《Journal of Electron Microscopy》;20011231;第50卷(第03期);第235-241页 * |
透射电子显微镜原位双倾样品杆的研制;姚 湲;《电子显微学报》;20130630;第32卷(第03期);第271-275页 * |
透射电子显微镜原位磁场双倾样品杆的研制;杨新安;《电子显微学报》;20131031;第32卷(第05期);第416-419页 * |
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CN109613035A (zh) | 2019-04-12 |
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Effective date of registration: 20230802 Address after: Room 302, Building 9, No.1 Xuefu Road, Songshan Lake Park, Dongguan City, Guangdong Province, 523000 Patentee after: Dongguan zhuoju Technology Co.,Ltd. Patentee after: ANHUI ZEYOU TECHNOLOGY CO.,LTD. Address before: 244000 No. 101, building D, high tech entrepreneurship service center, Tongling Economic and Technological Development Zone, Anhui Province Patentee before: ANHUI ZEYOU TECHNOLOGY CO.,LTD. |
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Inventor after: Xu Jinjing Inventor after: Liu Xudong Inventor after: Zhang Xiaolong Inventor before: Xu Jinjing Inventor before: Liu Xudong Inventor before: Zhang Xiaolong Inventor before: Xu Zhi |