CN1797734A - 扫描电子显微镜用的样品夹 - Google Patents
扫描电子显微镜用的样品夹 Download PDFInfo
- Publication number
- CN1797734A CN1797734A CN 200410093465 CN200410093465A CN1797734A CN 1797734 A CN1797734 A CN 1797734A CN 200410093465 CN200410093465 CN 200410093465 CN 200410093465 A CN200410093465 A CN 200410093465A CN 1797734 A CN1797734 A CN 1797734A
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Abstract
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Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB2004100934652A CN100359662C (zh) | 2004-12-22 | 2004-12-22 | 扫描电子显微镜用的样品夹 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB2004100934652A CN100359662C (zh) | 2004-12-22 | 2004-12-22 | 扫描电子显微镜用的样品夹 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1797734A true CN1797734A (zh) | 2006-07-05 |
CN100359662C CN100359662C (zh) | 2008-01-02 |
Family
ID=36818657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100934652A Expired - Fee Related CN100359662C (zh) | 2004-12-22 | 2004-12-22 | 扫描电子显微镜用的样品夹 |
Country Status (1)
Country | Link |
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CN (1) | CN100359662C (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105527307A (zh) * | 2015-12-31 | 2016-04-27 | 大冶特殊钢股份有限公司 | 一种适用于金属质量分析仪试样的样品架 |
CN109613035A (zh) * | 2019-02-22 | 2019-04-12 | 安徽泽攸科技有限公司 | 一种用于电子显微镜的样品支撑体及样品杆 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2105485B (en) * | 1981-09-03 | 1985-05-22 | Univ Leicester | Preparation of specimens for analysis in a scanning electron microscope |
JPH11149896A (ja) * | 1997-11-17 | 1999-06-02 | Hitachi Ltd | 走査電子顕微鏡用試料台 |
TW419699B (en) * | 1999-07-15 | 2001-01-21 | Ind Tech Res Inst | Device for clamping the testing piece of a scanning electron microscope |
-
2004
- 2004-12-22 CN CNB2004100934652A patent/CN100359662C/zh not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105527307A (zh) * | 2015-12-31 | 2016-04-27 | 大冶特殊钢股份有限公司 | 一种适用于金属质量分析仪试样的样品架 |
CN105527307B (zh) * | 2015-12-31 | 2018-09-25 | 大冶特殊钢股份有限公司 | 一种适用于金属质量分析仪试样的样品架 |
CN109613035A (zh) * | 2019-02-22 | 2019-04-12 | 安徽泽攸科技有限公司 | 一种用于电子显微镜的样品支撑体及样品杆 |
CN109613035B (zh) * | 2019-02-22 | 2021-03-26 | 安徽泽攸科技有限公司 | 一种用于电子显微镜的样品支撑体及样品杆 |
Also Published As
Publication number | Publication date |
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CN100359662C (zh) | 2008-01-02 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Effective date: 20111130 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20111130 Address after: 201203 Shanghai Zhangjiang Road, Zhangjiang High Tech Park of Pudong New Area No. 18 Co-patentee after: Semiconductor Manufacturing International (Beijing) Corporation Patentee after: Semiconductor Manufacturing International (Shanghai) Corporation Address before: 201203 Shanghai Zhangjiang Road, Zhangjiang High Tech Park of Pudong New Area No. 18 Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080102 Termination date: 20181222 |