CN109240865A - A kind of AC test method, device, terminal and the storage medium of AEP memory - Google Patents
A kind of AC test method, device, terminal and the storage medium of AEP memory Download PDFInfo
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- CN109240865A CN109240865A CN201811038515.5A CN201811038515A CN109240865A CN 109240865 A CN109240865 A CN 109240865A CN 201811038515 A CN201811038515 A CN 201811038515A CN 109240865 A CN109240865 A CN 109240865A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Abstract
The embodiment of the present application provides AC test method, device, terminal and the storage medium of a kind of AEP memory, comprising: setting AEP memory standard parameter；AC test is carried out to the tested commissioning stage equipped with AEP memory using AC fatigue machine test smelting tool；The test parameter of the AEP memory is obtained using test script；Judge whether the test parameter is consistent with standard parameter: being, then determines that the AEP memory is normal；It is no, then determine the AEP memory abnormal and saves error log file.The present invention can carry out AC test to AEP memory automatically and improve testing efficiency and accuracy rate without human intervention, while also save the human resources in server exploitation.
Description
Technical field
The invention belongs to AEP internal memory performance the field of test technology, and in particular to a kind of AC test method of AEP memory, dress
It sets, terminal and storage medium.
Background technique
AEP memory abbreviation Apache Pass DIMMs supports lasting Memory or In-Memory to answer for substituting DRAM
With there are three types of mode Memory mode, APD mode, Mix mode, Memory mode to be equal to for the characteristic of AEP memory
Common test test；APD mode is the concept that data space is added on the basis of convential memory, that is, has storage function
Energy；Mix mode is exactly the above two mixed mode.And AC test is an important reliability test project, so-called AC is surveyed
Examination is exactly constantly to do power on/off to server to restart movement.I.e. according to user demand, power on/off reboot operation is carried out to server,
In continuous power on/off restarting process, whether the every testing result for verifying AEP memory is normal.Exist to verify in AEP
In server system using reliable and stable characteristic, need to do AEP memory 500 times or more time AC tests, to guarantee in AEP
There are in AC test process, fit characteristics are good for use, to guarantee the validity of server A EP memory applications.
In the AC test of existing AEP memory, most of manufacturer server lacks effective analogy method, often without this
Test, or even if having, it is also desirable to the artificial power on/off reboot operation for carrying out test machine, while needing to detect AEP memory
The very important information such as quantity, health, the variation of spatial data block, need in whole process tester ceaselessly to repeat to grasp
Make, causes cost of labor huge, and cannot be guaranteed for the accuracy of test result.
Summary of the invention
In view of the deficiencies of the prior art, the present invention provides AC test method, device, terminal and the storage of a kind of AEP memory
Medium, to solve the above technical problems.
In a first aspect, the embodiment of the present application provides a kind of AC test method of AEP memory, which comprises
AEP memory standard parameter is set；
AC test is carried out to the tested commissioning stage equipped with AEP memory using AC fatigue machine test smelting tool；
The test parameter of the AEP memory is obtained using test script；
Judge whether the test parameter is consistent with standard parameter:
It is then to determine that the AEP memory is normal；
It is no, then determine the AEP memory abnormal and saves error log file.
With reference to first aspect, described to utilize AC fatigue machine test smelting tool pair in the first embodiment of first aspect
Tested commissioning stage equipped with AEP memory carries out AC test
Scanning monitoring power supply potential signal；
Judge whether power supply status is shutdown circuit low-potential signal:
Be, then when power is off between be powered and start tested commissioning stage when reaching time threshold；
Test script is immediately performed after tested commissioning stage starting is set；
It obtains and closes tested commissioning stage after the AEP memory determines result and power off.
With reference to first aspect, described to obtain the AEP using test script in second of embodiment of first aspect
The test parameter of memory includes:
Ipmctl tool is called to obtain AEP memory number；
It calls ipmctl tool to obtain AEP memory socket ID, and AEP memory health is retrieved according to the socket ID
State；
Ndctl tool is called to obtain AEP internal storage data space block message.
With reference to first aspect, in the third embodiment of first aspect, the method also includes:
The AC testing time of the AEP memory is set；
Judge whether current execution times reach setting number:
It is then to terminate to test and output test result；
It is no, then recycle the AC test for executing the AEP memory.
Second aspect, the embodiment of the present application provide a kind of AC test device of AEP memory, and described device includes:
Standard setting unit is configured to setting AEP memory standard parameter；
AC test cell is configured to test smelting tool using AC fatigue machine to the tested commissioning stage progress equipped with AEP memory
AC test；
Parameter acquiring unit is configured to obtain the test parameter of the AEP memory using test script；
State judging unit is configured to judge whether the test parameter is consistent with standard parameter；
Normal judging unit is configured to determine that the AEP memory is normal；
Abnormality determination unit is configured to determine the AEP memory abnormal and saves error log file.
In conjunction with second aspect, in the first embodiment of second aspect, the AC test cell includes:
Signal scanning module is configured to scanning monitoring power supply potential signal；
Power supply judgment module is configured to judge whether power supply status is shutdown circuit low-potential signal；
Energization starting module is powered when reaching time threshold between being configured to when power is off and starts tested commissioning stage；
Script execution module is configured to be immediately performed test script after tested commissioning stage starting is arranged；
Shut down power-off modular, is configured to obtain and closes tested commissioning stage after the AEP memory determines result and power off.
In conjunction with second aspect, in second of embodiment of second aspect, the parameter acquiring unit includes:
Number obtains module, is configured to that ipmctl tool is called to obtain AEP memory number；
State acquisition module is configured to that ipmctl tool is called to obtain AEP memory socket ID, and according to described
Socket ID retrieves AEP memory health status；
Space block obtains module, is configured to that ndctl tool is called to obtain AEP internal storage data space block message.
In conjunction with second aspect, in the third embodiment of second aspect, described device further include:
Number setting unit is configured to that the AC testing time of the AEP memory is arranged；
Frequency judging unit is configured to judge whether current execution times reach setting number；
EOT end of test unit is configured to terminate and tests and output test result；
Execution unit is recycled, the AC test that circulation executes the AEP memory is configured to.
The third aspect provides a kind of terminal, comprising:
Processor, memory, wherein
The memory is used to store computer program,
The processor from memory for calling and running the computer program, so that terminal executes above-mentioned end
The method for holding terminal.
Fourth aspect provides a kind of computer storage medium, instruction is stored in the computer readable storage medium,
When run on a computer, so that computer executes method described in above-mentioned various aspects.
5th aspect, provides a kind of computer program product comprising instruction, when run on a computer, so that
Computer executes method described in above-mentioned various aspects.
The beneficial effects of the present invention are,
AC test method, device, terminal and the storage medium of AEP memory provided by the invention, by the way that AEP memory mark is arranged
Quasi- parameter obtains AEP after carrying out power-off restarting to the tested commissioning stage equipped with AEP memory using AC fatigue machine test smelting tool
The test parameter of memory passes through the contrast test parameter performance state for obtaining tested AEP memory whether consistent with standard parameter.
The present invention can carry out AC test to AEP memory automatically and improve testing efficiency and accuracy rate without human intervention, while
Save the human resources in server exploitation.
In addition, design principle of the present invention is reliable, structure is simple, has very extensive application prospect.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without creative efforts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the schematic flow chart of the method for the application one embodiment.
Fig. 2 is the schematic flow chart of the method for the application one embodiment.
Fig. 3 is the schematic block diagram of the device of the application one embodiment.
Fig. 4 is a kind of structural schematic diagram of terminal provided in an embodiment of the present invention.
Specific embodiment
Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.
The Key Term occurred in the application is explained below.
Fig. 1 is the schematic flow chart of the method for the application one embodiment.Wherein, Fig. 1 executing subject can be one kind
The AC test device of AEP memory.
As shown in Figure 1, this method 100 includes:
Step 110, AEP memory standard parameter is set；
Step 120, AC test is carried out to the tested commissioning stage equipped with AEP memory using AC fatigue machine test smelting tool；
Step 130, the test parameter of the AEP memory is obtained using test script；
Step 140, judge whether the test parameter is consistent with standard parameter:
It is then to determine that the AEP memory is normal；
It is no, then determine the AEP memory abnormal and saves error log file.
In order to facilitate the understanding of the present invention, below with the principle of the AC test method of AEP memory provided by the invention, knot
AEP memory in embodiment is closed to do further the AC test method of AEP memory provided by the invention the process for carrying out AC test
Description.
Optionally, described to have using the test smelting of AC fatigue machine to the quilt that AEP memory is housed as the application one embodiment
Tester table carries out AC test
Scanning monitoring power supply potential signal；
Judge whether power supply status is shutdown circuit low-potential signal:
Be, then when power is off between be powered and start tested commissioning stage when reaching time threshold；
Test script is immediately performed after tested commissioning stage starting is set；
It obtains and closes tested commissioning stage after the AEP memory determines result and power off.
Optionally, as the application one embodiment, the test parameter that the AEP memory is obtained using test script
Include:
Ipmctl tool is called to obtain AEP memory number；
It calls ipmctl tool to obtain AEP memory socket ID, and AEP memory health is retrieved according to the socket ID
State；
Ndctl tool is called to obtain AEP internal storage data space block message.
Optionally, as the application one embodiment, the method also includes:
The AC testing time of the AEP memory is set；
Judge whether current execution times reach setting number:
It is then to terminate to test and output test result；
It is no, then recycle the AC test for executing the AEP memory.
Referring to FIG. 2, specifically, the AC test method of the AEP memory includes:
S1, setting AEP memory standard parameter.
The quantity of collection standard AEP memory, spatial data block is established and health status.
S2, AC test is carried out to the tested commissioning stage equipped with AEP memory using AC fatigue machine test smelting tool.
Tested commissioning stage is connected by AC fatigue machine test fixture, uses the switch of AC fatigue machine test fixture monitoring power supply
Circuit signal, when AC fatigue machine jig receives the shutdown circuit low-potential signal of tested commissioning stage, after disconnecting power supply one minute,
It is powered on the function of making tested commissioning stage carry out energization booting again.
In tested commissioning stage, the automatic detection script of system is added, after server system booting enters system OS, from
Dynamic starting detection program, searches for AEP memory behavior information, if searching equipment, system automatically records gadget information, right
Status is automatically analyzed than SPEC file, record detection device information if abnormal and stores Log file, is shown if Pass
The output of Pass pattern screen.Shutdown powers off after obtaining analysis result.
S3, the test parameter that the AEP memory is obtained using test script.
Ipmctl tool is called to obtain AEP memory number:
ipmctl show-topology|awk'/DCPMEM/{print$1}'|wc-l|tee-a dimmnum
DCPMEM is the mark of AEP memory, by the first row of keyword DCPMEM search and output, is then calculated by wc
The number of AEP memory access server out generates SPEC file dimmnum.
It calls ipmctl tool to obtain AEP memory socket ID, and AEP memory health is retrieved according to the socket ID
State:
The ipmctl tool capture AEP memory socket ID list dimmidl for calling manufacturer to provide is as follows
Dimmidl=$ (ipmctl show-dimm | awk'/0x/ { print $ 1 } ')
By AEP memory one by one, that is to say, that analyzed and determined according to socket ID
Ndctl tool is called to obtain AEP internal storage data space block message:
S4, judge whether the test parameter is consistent with standard parameter: if consistent, determining the AEP memory just
Often；If inconsistent, determine the AEP memory abnormal and save error log file.
AEP memory information after each power-off restarting is compared with standard information, if unanimously, be judged as
Pass, if it is inconsistent, being judged as fail, either pass or fail will do it and keep records of.Specifically it is exactly,
The method first passed through in step S3 obtains dimmnum quantitative criteria file, and md5pmem spatial data block normative document will be above-mentioned
File is as comparison standard.All automatically scanning compares after each power-off restarting is restarted later
The AC testing time of S5, the setting AEP memory, the present embodiment are set as 500 times；Judging current execution times is
It is no to reach setting number: to be then to terminate to test and output test result；It is no, then recycle the AC test for executing the AEP memory.
If Fig. 3 shows, which includes:
Standard setting unit 310, the standard setting unit 210 is for being arranged AEP memory standard parameter；
AC test cell 320, the AC test cell 220 are used for using AC fatigue machine test smelting tool to equipped with AEP memory
Tested commissioning stage carry out AC test；
Parameter acquiring unit 330, the parameter acquiring unit 230 are used to obtain the AEP memory using test script
Test parameter；
State judging unit 340, the state judging unit 240 for judge the test parameter whether with standard parameter
It is consistent；
Normal judging unit 350, the normal judging unit 250 is for determining that the AEP memory is normal；
Abnormality determination unit 360, the abnormality determination unit 260 is for determining the AEP memory abnormal and saving mistake
Journal file.
Optionally, as the application one embodiment, the AC test cell includes:
Signal scanning module is configured to scanning monitoring power supply potential signal；
Power supply judgment module is configured to judge whether power supply status is shutdown circuit low-potential signal；
Energization starting module is powered when reaching time threshold between being configured to when power is off and starts tested commissioning stage；
Script execution module is configured to be immediately performed test script after tested commissioning stage starting is arranged；
Shut down power-off modular, is configured to obtain and closes tested commissioning stage after the AEP memory determines result and power off.
Optionally, as the application one embodiment, the parameter acquiring unit includes:
Number obtains module, is configured to that ipmctl tool is called to obtain AEP memory number；
State acquisition module is configured to that ipmctl tool is called to obtain AEP memory socket ID, and according to described
Socket ID retrieves AEP memory health status；
Space block obtains module, is configured to that ndctl tool is called to obtain AEP internal storage data space block message.
Optionally, as the application one embodiment, described device further include:
Number setting unit is configured to that the AC testing time of the AEP memory is arranged；
Frequency judging unit is configured to judge whether current execution times reach setting number；
EOT end of test unit is configured to terminate and tests and output test result；
Execution unit is recycled, the AC test that circulation executes the AEP memory is configured to.
Fig. 4 is a kind of structural schematic diagram of terminal installation 400 provided in an embodiment of the present invention, which can be with
For executing the method provided by the embodiments of the present application for updating heat dissipation policing parameter.
Wherein, which may include: processor 410, memory 420 and communication unit 430.These components
It is communicated by one or more bus, it will be understood by those skilled in the art that the structure of server shown in figure is not
The restriction to the application is constituted, it is also possible to hub-and-spoke configuration either busbar network, can also include more than illustrating
Or less component, perhaps combine certain components or different component layouts.
Wherein, which can be used for executing instruction for storage processor 410, and memory 420 can be by any class
The volatibility or non-volatile memories terminal or their combination of type are realized, such as static random access memory (SRAM), electricity
Erasable Programmable Read Only Memory EPROM (EEPROM), Erasable Programmable Read Only Memory EPROM (EPROM), programmable read only memory
(PROM), read-only memory (ROM), magnetic memory, flash memory, disk or CD.When executing instruction in memory 420
When being executed by processor 410, so that terminal 400 some or all of is able to carry out in following above method embodiment step.
Processor 410 is the control centre for storing terminal, utilizes each of various interfaces and the entire electric terminal of connection
A part by running or execute the software program and/or module that are stored in memory 420, and calls and is stored in storage
Data in device, to execute the various functions and/or processing data of electric terminal.The processor can be by integrated circuit
(Integrated Circuit, abbreviation IC) composition, such as the IC that can be encapsulated by single are formed, can also be by more of connection
The encapsulation IC of identical function or different function and form.For example, processor 410 can only include central processing unit
(Central Processing Unit, abbreviation CPU).In the application embodiment, CPU can be single operation core, can also
To include multioperation core.
Communication unit 430, for establishing communication channel, so that the storage terminal be allow to be led to other terminals
Letter.It receives the user data of other terminals transmission or sends user data to other terminals.
The application also provides a kind of computer storage medium, wherein the computer storage medium can be stored with program, the journey
Sequence may include step some or all of in each embodiment provided by the present application when executing.The storage medium can for magnetic disk,
CD, read-only memory (English: read-only memory, referred to as: ROM) or random access memory (English:
Random access memory, referred to as: RAM) etc..
Therefore, the application has using the test smelting of AC fatigue machine to equipped in AEP by setting AEP memory standard parameter
After the tested commissioning stage deposited carries out power-off restarting, the test parameter of AEP memory is obtained, contrast test parameter and standard parameter are passed through
Whether the performance state of tested AEP memory is unanimously obtained.The present invention can carry out AC test to AEP memory automatically, be not necessarily to people
Work operation, improves testing efficiency and accuracy rate, while also saving the human resources in server exploitation, the present embodiment institute energy
The technical effect reached may refer to described above, and details are not described herein again.
It is required that those skilled in the art can be understood that the technology in the embodiment of the present application can add by software
The mode of general hardware platform realize.Based on this understanding, the technical solution in the embodiment of the present application substantially or
Say that the part that contributes to existing technology can be embodied in the form of software products, which is stored in
Such as USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory in one storage medium
The various media that can store program code such as (RAM, Random Access Memory), magnetic or disk, including it is several
Instruction is used so that a terminal (can be personal computer, server or second terminal, the network terminal etc.) is held
Row all or part of the steps of the method according to each embodiment of the present invention.
Same and similar part may refer to each other between each embodiment in this specification.Implement especially for terminal
For example, since it is substantially similar to the method embodiment, so being described relatively simple, related place is referring in embodiment of the method
Explanation.
In several embodiments provided herein, it should be understood that disclosed systems, devices and methods, it can be with
It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the unit
It divides, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or components
It can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, it is shown or
The mutual coupling, direct-coupling or communication connection discussed can be through some interfaces, the indirect coupling of device or unit
It closes or communicates to connect, can be electrical property, mechanical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
In network unit.It can select some or all of unit therein according to the actual needs to realize the mesh of this embodiment scheme
's.
It, can also be in addition, the functional units in various embodiments of the present invention may be integrated into one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.
Although by reference to attached drawing and combining the mode of preferred embodiment to the present invention have been described in detail, the present invention
It is not limited to this.Without departing from the spirit and substance of the premise in the present invention, those of ordinary skill in the art can be to the present invention
Embodiment carry out various equivalent modifications or substitutions, and these modifications or substitutions all should in covering scope of the invention/appoint
What those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, answer
It is included within the scope of the present invention.Therefore, protection scope of the present invention is answered described is with scope of protection of the claims
It is quasi-.
Claims (10)
1. a kind of AC test method of AEP memory, which is characterized in that the described method includes:
AEP memory standard parameter is set；
AC test is carried out to the tested commissioning stage equipped with AEP memory using AC fatigue machine test smelting tool；
The test parameter of the AEP memory is obtained using test script；
Judge whether the test parameter is consistent with standard parameter:
It is then to determine that the AEP memory is normal；
It is no, then determine the AEP memory abnormal and saves error log file.
2. the method according to claim 1, wherein described have using the test smelting of AC fatigue machine to equipped in AEP
The tested commissioning stage deposited carries out AC test
Scanning monitoring power supply potential signal；
Judge whether power supply status is shutdown circuit low-potential signal:
Be, then when power is off between be powered and start tested commissioning stage when reaching time threshold；
Test script is immediately performed after tested commissioning stage starting is set；
It obtains and closes tested commissioning stage after the AEP memory determines result and power off.
3. the method according to claim 1, wherein the survey for obtaining the AEP memory using test script
Trying parameter includes:
Ipmctl tool is called to obtain AEP memory number；
It calls ipmctl tool to obtain AEP memory socket ID, and AEP memory health shape is retrieved according to the socket ID
State；
Ndctl tool is called to obtain AEP internal storage data space block message.
4. the method according to claim 1, wherein the method also includes:
The AC testing time of the AEP memory is set；
Judge whether current execution times reach setting number:
It is then to terminate to test and output test result；
It is no, then recycle the AC test for executing the AEP memory.
5. a kind of AC test device of AEP memory, which is characterized in that described device includes:
Standard setting unit is configured to setting AEP memory standard parameter；
AC test cell is configured to test smelting tool using AC fatigue machine to the tested commissioning stage progress AC survey equipped with AEP memory
Examination；
Parameter acquiring unit is configured to obtain the test parameter of the AEP memory using test script；
State judging unit is configured to judge whether the test parameter is consistent with standard parameter；
Normal judging unit is configured to determine that the AEP memory is normal；
Abnormality determination unit is configured to determine the AEP memory abnormal and saves error log file.
6. device according to claim 5, which is characterized in that the AC test cell includes:
Signal scanning module is configured to scanning monitoring power supply potential signal；
Power supply judgment module is configured to judge whether power supply status is shutdown circuit low-potential signal；
Energization starting module is powered when reaching time threshold between being configured to when power is off and starts tested commissioning stage；
Script execution module is configured to be immediately performed test script after tested commissioning stage starting is arranged；
Shut down power-off modular, is configured to obtain and closes tested commissioning stage after the AEP memory determines result and power off.
7. device according to claim 5, which is characterized in that the parameter acquiring unit includes:
Number obtains module, is configured to that ipmctl tool is called to obtain AEP memory number；
State acquisition module is configured to that ipmctl tool is called to obtain AEP memory socket ID, and according to the socket
ID retrieves AEP memory health status；
Space block obtains module, is configured to that ndctl tool is called to obtain AEP internal storage data space block message.
8. device according to claim 5, which is characterized in that described device further include:
Number setting unit is configured to that the AC testing time of the AEP memory is arranged；
Frequency judging unit is configured to judge whether current execution times reach setting number；
EOT end of test unit is configured to terminate and tests and output test result；
Execution unit is recycled, the AC test that circulation executes the AEP memory is configured to.
9. a kind of terminal characterized by comprising
Processor；
The memory executed instruction for storage processor；
Wherein, the processor is configured to perform claim requires the described in any item methods of 1-4.
10. a kind of computer readable storage medium for being stored with computer program, which is characterized in that the program is executed by processor
Shi Shixian method for example of any of claims 1-4.
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| CN109783293A (en) * | 2019-01-23 | 2019-05-21 | 郑州云海信息技术有限公司 | A kind of alternating blend pressure test method based on AEP memory |
| CN109783238A (en) * | 2019-01-25 | 2019-05-21 | 郑州云海信息技术有限公司 | The method and system of mirror image AEP memory configurations strategy between a kind of server |
| CN109815091A (en) * | 2019-01-23 | 2019-05-28 | 郑州云海信息技术有限公司 | A kind of AEP high temperature alarm sensitivity test method, device, terminal and storage medium |
| CN109901959A (en) * | 2019-02-27 | 2019-06-18 | 苏州浪潮智能科技有限公司 | The pressure of AEP memory surveys method, system, terminal and storage medium under a kind of mix mode |
| CN110008070A (en) * | 2019-03-11 | 2019-07-12 | 苏州浪潮智能科技有限公司 | A kind of AEP memory AC test method powered off at random based on power supervisor |
| CN111679943A (en) * | 2020-06-10 | 2020-09-18 | 浪潮商用机器有限公司 | Server test system |
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| CN109815091A (en) * | 2019-01-23 | 2019-05-28 | 郑州云海信息技术有限公司 | A kind of AEP high temperature alarm sensitivity test method, device, terminal and storage medium |
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| CN109815091B (en) * | 2019-01-23 | 2022-02-18 | 郑州云海信息技术有限公司 | AEP high-temperature alarm sensitivity testing method, device, terminal and storage medium |
| CN109783238A (en) * | 2019-01-25 | 2019-05-21 | 郑州云海信息技术有限公司 | The method and system of mirror image AEP memory configurations strategy between a kind of server |
| CN109901959A (en) * | 2019-02-27 | 2019-06-18 | 苏州浪潮智能科技有限公司 | The pressure of AEP memory surveys method, system, terminal and storage medium under a kind of mix mode |
| CN109901959B (en) * | 2019-02-27 | 2023-01-10 | 苏州浪潮智能科技有限公司 | Pressure measurement method, system, terminal and storage medium for AEP memory under mix mode |
| CN110008070A (en) * | 2019-03-11 | 2019-07-12 | 苏州浪潮智能科技有限公司 | A kind of AEP memory AC test method powered off at random based on power supervisor |
| CN111679943A (en) * | 2020-06-10 | 2020-09-18 | 浪潮商用机器有限公司 | Server test system |
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