CN109783293B - AEP memory-based alternating mixed pressure testing method - Google Patents
AEP memory-based alternating mixed pressure testing method Download PDFInfo
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- CN109783293B CN109783293B CN201910063978.5A CN201910063978A CN109783293B CN 109783293 B CN109783293 B CN 109783293B CN 201910063978 A CN201910063978 A CN 201910063978A CN 109783293 B CN109783293 B CN 109783293B
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Abstract
The AEP memory-based alternative mixed pressure testing method provided by the invention comprises the steps of firstly carrying out AEP memory drive installation on a server, and then carrying out AEP memory mixed mode distribution strategy setting after the installation is finished. After the mixed mode is set, a pressure tool is used for carrying out pressure test on the hard disk module in the AEP memory, wherein the specific time is set according to the requirement, and the pressure test of the memory module is carried out after the pressure test of the hard disk module is finished. And after the hard disk module and the memory module are tested once, the AEP memory alternate voltage test is completed. And when the total pressure measurement times are less than or equal to the prediction times, the AEP memory alternate pressure measurement is repeatedly carried out. When the total alternate pressure testing times are larger than the preset times, the test is automatically ended. After the test is finished, the test result log can be checked and analyzed, and whether the AEP memory can meet the complex application scene or not is judged according to the test result.
Description
Technical Field
The invention relates to the technical field of computers, in particular to an AEP memory-based alternating mixing pressure testing method.
Background
The AEP (Apache pass) memory is positioned between the hard disk and the ordinary memory, but integrates the advantages of the hard disk and the ordinary memory. It has two main characteristics: (1) the transmission speed is extremely high; (2) has non-volatility. Compared with a hard disk, the transmission speed of the AEP memory is 1000 times faster than that of the hard disk and 8-10 times higher than that of a common memory. Compared with the prior common memory, the memory has the advantage that data cannot be lost after power failure.
The AEP memory is installed in the same way as the common memory and also installed in the memory slot position. AEP memory, however, can be changed to memory mode (memory mode), hard disk mode (APD mode), or hybrid mode (mix mode) by adjusting the allocation setup policy. When the AEP memory allocation policy is set to a 100% memory mode, the memory allocation policy has a memory function similar to that of a normal memory and can be used as a memory. When the AEP memory allocation strategy is set to be a 100% hard disk mode (APD mode), the memory allocation strategy can be used as a hard disk and has a storage function, but the read-write speed of the memory allocation strategy is far higher than that of a common hard disk. In addition, the AEP memory allocation strategy can be set to be a mixed mode (mix mode), so that the same memory is virtually decomposed into a hard disk functional area and a memory functional area, and the memory function and the hard disk function are realized.
After the AEP memory is set to a hybrid mode (mix mode), in an actual use process, due to a change of an application scene, the memory functional area may be mainly used in a certain time period, and the hard disk functional area may be mainly used in other time periods. There may also be an alternate use of the two functional regions. How to better simulate the AEP memory application scenario and perform pertinence testing is a problem to be solved.
Disclosure of Invention
In view of the above problems, an object of the present invention is to provide an alternating mixed pressure testing method based on an AEP memory, which can determine whether the AEP memory can satisfy a complex application scenario according to a test result.
In order to achieve the purpose, the invention is realized by the following technical scheme: an AEP memory-based alternating mixing pressure test method comprises the following steps:
step 1: mounting an AEP memory driver;
step 2: setting the AEP memory into a hybrid mode;
and step 3: configuring an AEP memory mixed mode distribution strategy;
and 4, step 4: presetting the first pressure test time as M seconds, the second pressure test time as M seconds and the alternate pressure test times as n times;
and 5: performing M second pressure test on a hard disk module in the AEP memory;
step 6: carrying out m-second pressure test on a memory module in the AEP memory;
and 7: judging whether the currently finished alternate pressure measurement times of the AEP memory are less than n, if so, turning to the step 5; if not, the test ends.
Further, the step 3 specifically comprises: the space occupation proportion of the memory module and the hard disk module in the AEP memory is set to be 50% by using an ipmctl tool.
Further, the specific instruction of step 3 is:
ipmctl create -goal
MemoryMode=50 PersistentMemoryType=AppDirectNotInterleaved 。
further, the step 5 comprises:
step 51: using mount instruction to mount the hard disk module of AEP memory into the preset folder in the current system;
step 52: the hard disk module in the AEP memory was subjected to an M second stress test using the fio tool.
Further, the step 6 specifically includes: the memory module in the AEP memory is subjected to an m second stress test using the memtester tool.
Further, the step 6 further includes: and checking the memory allowance of the current system by using a free instruction.
Further, M = M.
Further, the step 4 further comprises: presetting the current alternate pressure measurement times x, and setting x as 0.
Further, the step 7 specifically includes: adding 1 to the current alternate pressure measurement times x, judging whether x is smaller than n, and if so, turning to the step 5; if not, the test ends.
Compared with the prior art, the invention has the beneficial effects that: the invention provides an AEP memory-based alternative mixed pressure testing method. After the mixed mode is set, a pressure tool is used for carrying out pressure test on the hard disk module in the AEP memory, wherein the specific time is set according to the requirement, and the pressure test of the memory module is carried out after the pressure test of the hard disk module is finished. And after the hard disk module and the memory module are tested once, the AEP memory alternate voltage test is completed. And when the total pressure measurement times are less than or equal to the prediction times, the AEP memory alternate pressure measurement is repeatedly carried out. When the total alternate pressure testing times are larger than the preset times, the test is automatically ended. After the test is finished, the test result log can be checked and analyzed, and whether the AEP memory can meet the complex application scene or not is judged according to the test result.
The application of the invention greatly improves the reliability and stability of AEP memory test, and is beneficial to improving the product quality.
Therefore, compared with the prior art, the invention has prominent substantive features and remarkable progress, and the beneficial effects of the implementation are also obvious.
Drawings
FIG. 1 is a flow chart of a method according to a first embodiment of the present invention.
FIG. 2 is a flow chart of a method according to a second embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made with reference to the accompanying drawings.
The first embodiment is as follows:
fig. 1 shows an alternating mixing pressure testing method based on AEP memory, which includes the following steps:
step 1: and installing the AEP memory driver.
Step 2: the AEP memory is set to the hybrid mode.
And step 3: and configuring an AEP memory mixed mode distribution strategy.
And 4, step 4: presetting the first pressure test time as M seconds, the second pressure test time as M seconds and the number of times of alternate pressure test as n times.
And 5: and carrying out M-second pressure test on the hard disk module in the AEP memory.
Step 6: the memory module in the AEP memory is subjected to an m-second stress test.
And 7: judging whether the currently finished alternate pressure measurement times of the AEP memory are less than n, if so, turning to the step 5; if not, the test ends.
Example two:
fig. 2 shows an alternative mixing pressure testing method based on AEP memory, which includes the following steps:
step 1: and installing the AEP memory driver.
Step 2: the AEP memory is set to the hybrid mode.
And step 3: the space occupation proportion of the memory module and the hard disk module in the AEP memory is set to be 50% by using an ipmctl tool.
The specific instruction of step 3 is:
ipmctl create -goal
MemoryMode=50 PersistentMemoryType=AppDirectNotInterleaved
wherein, the MemoryMode represents the proportion of the memory module, if the MemoryMode is modified =30, the memory module is set to be 30% of the AEP memory, and the hard disk module accounts for 70%.
And 4, step 4: presetting the first pressure test time as M seconds, the second pressure test time as M seconds and the number of times of alternate pressure test as n times, presetting the current number of times of alternate pressure test as x, and setting x as 0.
And 5: and mounting the hard disk module of the AEP memory into a preset folder in the current system by using a mount instruction.
The specific instruction is as follows: mount-o dax/dev/pem 5/mnt/pmem 5.
Step 6: the hard disk module in the AEP memory was subjected to an M second stress test using the fio tool.
For example, M =60, the 60 second press test command is as follows: fio-filename =/mnt/pmem 5-direct = 1-rw = randwrite-bs =4 k-size = 15G-numjob = 4-runtime = 300-group _ reporting-name = test-AEP.
And 7: and checking the memory allowance of the current system by using a free instruction.
And 8: the memory module in the AEP memory is subjected to an m second stress test using the memtester tool.
In step 8, a pressurization test is performed according to the memory margin checked in step 7, wherein the pressurization test is performed on more than 90% of the memory margin. For example, the margin is 100G, and the pressurizing operation is performed for 60 seconds. Generally, the pressurization is more than 90%, and the specific instructions are as follows: nohup./memtester 90G 60 &.
And step 9: and adding 1 to the current alternating pressure measurement times x.
Step 10: judging whether x is smaller than n, if so, turning to step 6; if not, the test ends.
In addition, the present embodiment may also implement alternate cycles of the pressure test by a for or while cycle tool. The first pressure test time M and the second pressure test time M can be preset to be the same value, all the test results are stored in a test result log file in real time, and after the test is finished, the test result log can be checked and analyzed.
The invention is further described with reference to the accompanying drawings and specific embodiments. It should be understood that these examples are for illustrative purposes only and are not intended to limit the scope of the present invention. Further, it should be understood that various changes or modifications of the present invention may be made by those skilled in the art after reading the teaching of the present invention, and these equivalents also fall within the scope of the present application.
Claims (7)
1. An AEP memory-based alternating mixing pressure test method is characterized by comprising the following steps:
step 1: mounting an AEP memory driver;
step 2: setting the AEP memory into a hybrid mode;
and step 3: configuring an AEP memory mixed mode distribution strategy;
and 4, step 4: presetting the first pressure test time as M seconds, the second pressure test time as M seconds and the alternate pressure test times as n times;
and 5: performing M second pressure test on a hard disk module in the AEP memory;
step 6: carrying out m-second pressure test on a memory module in the AEP memory;
and 7: judging whether the currently finished alternate pressure measurement times of the AEP memory are less than n, if so, turning to the step 5; if not, the test is finished;
the step 3 specifically comprises the following steps: the space occupation proportion of a memory module and a hard disk module in the AEP memory is set to be 50% by using an ipmctl tool;
the step 5 comprises the following steps:
step 51: using mount instruction to mount the hard disk module of AEP memory into the preset folder in the current system;
step 52: the hard disk module in the AEP memory was subjected to an M second stress test using the fio tool.
2. The AEP memory-based alternating mixture pressure testing method of claim 1, wherein the specific instructions of step 3 are:
ipmctl create -goal
MemoryMode=50 PersistentMemoryType=AppDirectNotInterleaved 。
3. the AEP memory-based alternating mixing pressure testing method of claim 1, wherein said step 6 specifically comprises: the memory module in the AEP memory is subjected to an m second stress test using the memtester tool.
4. The AEP memory based alternating mixture pressure test method of claim 3, wherein said step 6 further comprises: and checking the memory allowance of the current system by using a free instruction.
5. The AEP memory based alternating mixing pressure test method of claim 1, wherein: the M = M.
6. The AEP memory based alternating mixing pressure test method of claim 1, wherein said step 4 further comprises: presetting the current alternate pressure measurement times x, and setting x as 0.
7. The AEP memory-based alternating mixing pressure testing method of claim 6, wherein said step 7 is specifically: adding 1 to the current alternate pressure measurement times x, judging whether x is smaller than n, and if so, turning to the step 5; if not, the test ends.
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| CN108089965A (en) * | 2017-12-08 | 2018-05-29 | 郑州云海信息技术有限公司 | A kind of computer parallel type method for testing pressure |
| CN108228406A (en) * | 2018-01-09 | 2018-06-29 | 郑州云海信息技术有限公司 | A kind of QAT pressure testing systems and method |
| CN109240865A (en) * | 2018-09-06 | 2019-01-18 | 郑州云海信息技术有限公司 | A kind of AC test method, device, terminal and the storage medium of AEP memory |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US7596778B2 (en) * | 2003-07-03 | 2009-09-29 | Parasoft Corporation | Method and system for automatic error prevention for computer software |
| US20070061625A1 (en) * | 2005-09-15 | 2007-03-15 | Acosta Juan Jr | Automation structure for software verification testing |
| US7730358B2 (en) * | 2007-10-24 | 2010-06-01 | Inventec Corporation | Stress testing method of file system |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105760262A (en) * | 2015-11-30 | 2016-07-13 | 浪潮电子信息产业股份有限公司 | Method for cross-verifying hard disk stability based on dc and rebot under linux |
| CN108089965A (en) * | 2017-12-08 | 2018-05-29 | 郑州云海信息技术有限公司 | A kind of computer parallel type method for testing pressure |
| CN108228406A (en) * | 2018-01-09 | 2018-06-29 | 郑州云海信息技术有限公司 | A kind of QAT pressure testing systems and method |
| CN109240865A (en) * | 2018-09-06 | 2019-01-18 | 郑州云海信息技术有限公司 | A kind of AC test method, device, terminal and the storage medium of AEP memory |
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