CN109815091B - AEP high-temperature alarm sensitivity testing method, device, terminal and storage medium - Google Patents
AEP high-temperature alarm sensitivity testing method, device, terminal and storage medium Download PDFInfo
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Abstract
The invention provides a method, a device, a terminal and a storage medium for testing AEP high-temperature alarm sensitivity, wherein the method comprises the following steps: injecting AEP memory high-temperature false information and recording injection time; high-temperature false information of an AEP memory is cancelled and cancellation time is recorded; collecting alarm appearance time and alarm disappearance time of AEP high-temperature alarm items of a BMC log; and characterizing the sensitivity of AEP high-temperature alarm according to the consistency of the alarm appearance time and the injection time and the consistency of the alarm disappearance time and the cancellation time. The invention can automatically test the AEP high-temperature alarm sensitivity, has accurate test result and simple method, saves human resources and improves the test efficiency.
Description
Technical Field
The invention belongs to the technical field of server testing, and particularly relates to an AEP high-temperature alarm sensitivity testing method, device, terminal and storage medium.
Background
The AEP (Apache pass) memory is positioned between the hard disk and the ordinary memory, but integrates the advantages of the hard disk and the ordinary memory. It has two main characteristics: (1) the transmission speed is extremely high; (2) has non-volatility. Compared with a hard disk, the transmission speed of the AEP memory is 1000 times faster than that of the hard disk and 8-10 times higher than that of a common memory. Compared with the prior common memory, the memory has the advantage that data cannot be lost after power failure.
The AEP memory is installed in the same way as the common memory and also installed in the memory slot position. AEP memory, however, can be changed to memory mode (memory mode), hard disk mode (APD mode), or hybrid mode (mix mode) by adjusting the allocation setup policy. In the use process of the AEP internal memory, according to an actual application scene, three working modes of an internal memory mode (memory mode), a hard disk mode (APD mode) and a mixed mode (mix mode) exist. In the normal use process, if the temperature of the AEP memory is too high, a high-temperature alarm prompt appears in the BMC log, which is an important AEP memory working mechanism. If the AEP temperature is too high and the BMC log does not give an alarm in time, the problems of AEP damage and data loss are likely to occur. Because three AEP modes are relatively independent in the working process, the problem that an alarm mechanism can alarm in time in one mode and cannot alarm in time after the modes are switched probably exists.
At present, no method for effectively testing AEP memory high-temperature alarm sensitivity exists.
Disclosure of Invention
Aiming at the problem that the AEP memory high-temperature alarm sensitivity cannot be effectively tested in the prior art, the invention provides an AEP high-temperature alarm sensitivity testing method, device, terminal and storage medium, so as to solve the technical problems.
In a first aspect, the present invention provides an AEP high temperature alarm sensitivity testing method, including:
and injecting AEP memory high-temperature false information and recording injection time, wherein the steps comprise: setting AEP as a memory mode and injecting high-Temperature false information by using a set-bim Temperature (100) instruction; setting AEP as a hard disk mode and injecting high-Temperature false information by using a set-bim Temperature (100) instruction; the AEP is set to the hybrid mode and high Temperature dummy information is injected using a "set-bim Temperature 100" instruction.
Canceling AEP memory high-temperature false information and recording canceling time, wherein the method comprises the following steps: setting AEP as a memory mode and canceling high-Temperature false information by using a set-dimm Clear-1 Temperature-1 instruction; setting AEP as a hard disk mode and canceling high-Temperature false information by using a set-dimm Clear-1 Temperature-1 instruction; the AEP is set to the blend mode and the high Temperature ghost is undone using the "set-dimm Clear 1Temperature 1" instruction.
And collecting the alarm appearance time and the alarm disappearance time of the AEP high-temperature alarm items of the BMC log.
According to the consistency of the alarm appearance time and the injection time and the consistency of the alarm disappearance time and the cancellation time, the AEP high-temperature alarm sensitivity is characterized, and the method comprises the following steps: setting a time deviation threshold value; calculating the alarm time deviation between the alarm appearance time and the injection time and the disappearance time deviation between the alarm disappearance time and the cancellation time; judging whether the alarm time deviation and the disappearance time deviation are both within the time deviation threshold range: if yes, judging that the AEP high-temperature alarm sensitivity is qualified; and if not, judging that the AEP high-temperature alarm sensitivity is unqualified and outputting a BMC error log.
In a second aspect, the present invention provides an AEP high temperature alarm sensitivity testing apparatus, including:
a dummy injection unit comprising: the first injection module is configured to set the AEP to be a memory mode and inject high-Temperature false information by using a set-bim Temperature (100) instruction; the second injection module is configured to set the AEP to be in a hard disk mode and inject high-Temperature false information by using a set-bim Temperature (100) instruction; and the third injection module is configured to set the AEP to a mixed mode and inject the high-Temperature false information by using a set-bim Temperature (100) instruction.
A false revocation unit comprising: the first revocation module is configured to set the AEP to be in a memory mode and revoke the high-Temperature false information by using a set-dimm-1-Temperature instruction; the second revocation module is configured to set the AEP to be in a hard disk mode and revoke the high-Temperature false information by using a set-dimm-1-Temperature instruction; and the third cancelling module is configured to set the AEP to a mixed mode and cancel the high-Temperature false information by using a set-dimm Clear-1 Temperature-1 instruction.
And the alarm monitoring unit is configured for acquiring the alarm appearance time and the alarm disappearance time of AEP high-temperature alarm items of the BMC log.
A performance characterization unit comprising: a threshold setting module configured to set a time deviation threshold; the deviation calculation module is configured for calculating the alarm time deviation between the alarm appearance time and the injection time and the disappearance time deviation between the alarm disappearance time and the cancellation time; the deviation judging module is configured for judging whether the alarm time deviation and the disappearance time deviation are both within the time deviation threshold range; the qualification judgment module is configured for judging that the AEP high-temperature alarm sensitivity is qualified; and the error output module is configured for judging that the AEP high-temperature alarm sensitivity is unqualified and outputting a BMC error log.
In a third aspect, a terminal is provided, including:
a processor, a memory, wherein,
the memory is used for storing a computer program which,
the processor is used for calling and running the computer program from the memory so as to make the terminal execute the method of the terminal.
In a fourth aspect, a computer storage medium is provided having stored therein instructions that, when executed on a computer, cause the computer to perform the method of the above aspects.
The beneficial effect of the invention is that,
according to the method, the device, the terminal and the storage medium for testing the AEP high-temperature alarm sensitivity, the AEP memory high-temperature false information is injected, the injection time is recorded, the AEP memory high-temperature false information is cancelled, the cancellation time is recorded, then the AEP inner side high-temperature alarm information in a BMC log is collected, the alarm appearance time and the alarm disappearance time are extracted, the alarm appearance time and the injection time and the alarm disappearance time and the cancellation time are respectively compared, and the AEP memory high-temperature alarm sensitivity can be represented by comparing the consistency of the two groups of time. The invention can automatically test the AEP high-temperature alarm sensitivity, has accurate test result and simple method, saves human resources and improves the test efficiency.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
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In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention.
Fig. 2 is a schematic block diagram of an apparatus of one embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The following explains key terms appearing in the present invention.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention. Wherein, the execution subject in fig. 1 may be an AEP high temperature alarm sensitivity testing device.
As shown in fig. 1, the method 100 includes:
140, representing AEP high-temperature alarm sensitivity according to the consistency of alarm appearance time and injection time and the consistency of alarm disappearance time and cancellation time;
optionally, as an embodiment of the present invention, the injecting AEP memory high-temperature dummy information and recording the injection time includes: setting AEP as a memory mode and injecting high-Temperature false information by using a set-bim Temperature (100) instruction; setting AEP as a hard disk mode and injecting high-Temperature false information by using a set-bim Temperature (100) instruction; the AEP is set to the hybrid mode and high Temperature dummy information is injected using a "set-bim Temperature 100" instruction.
Optionally, as an embodiment of the present invention, the revoking the AEP memory high-temperature false information and recording the revoking time includes: setting AEP as a memory mode and canceling high-Temperature false information by using a set-dimm Clear-1 Temperature-1 instruction; setting AEP as a hard disk mode and canceling high-Temperature false information by using a set-dimm Clear-1 Temperature-1 instruction; the AEP is set to the blend mode and the high Temperature ghost is undone using the "set-dimm Clear 1Temperature 1" instruction.
Optionally, as an embodiment of the present invention, characterizing the AEP high-temperature alarm sensitivity according to the consistency between the alarm appearance time and the injection time and the consistency between the alarm disappearance time and the revocation time includes: setting a time deviation threshold value; calculating the alarm time deviation between the alarm appearance time and the injection time and the disappearance time deviation between the alarm disappearance time and the cancellation time; judging whether the alarm time deviation and the disappearance time deviation are both within the time deviation threshold range: if yes, judging that the AEP high-temperature alarm sensitivity is qualified; and if not, judging that the AEP high-temperature alarm sensitivity is unqualified and outputting a BMC error log.
In order to facilitate understanding of the present invention, the method for testing the sensitivity of the AEP high temperature alarm provided by the present invention is further described below by using the principle of the method for testing the sensitivity of the AEP high temperature alarm of the present invention and combining the process of testing the sensitivity of the AEP high temperature alarm in the embodiment.
Specifically, the method for testing the sensitivity of the AEP high-temperature alarm comprises the following steps:
and S1, injecting high-temperature false information into the AEP memory and recording the injection time.
Firstly, an AEP memory driver is installed, and after the installation is finished, a test is executed. During testing, the AEP memory configuration strategy is automatically set to be APD mode (hard disk mode), and memory high-Temperature alarm false information (instruction for example: set-mm Temperature 100) is injected into the AEP memory configuration strategy. And recording the execution time of the injection instruction as the injection time.
And S2, canceling the AEP memory high-temperature false information and recording the canceling time.
Inputting and executing a 'set-bimm Clear ═ 1Temperature ═ 1' instruction to cancel the high-Temperature false information. And recording the undo instruction execution time as the undo time.
And S3, acquiring the alarm appearance time and the alarm disappearance time of the AEP high-temperature alarm item of the BMC log.
And collecting a BMC log, retrieving an AEP high-temperature alarm item from the BMC log, and if the AEP high-temperature alarm item cannot be retrieved, quitting the test and displaying that the AEP high-temperature alarm sensitivity test fails (the sensitivity is unqualified). If so, step S4 is executed.
And S4, characterizing the AEP high-temperature alarm sensitivity according to the consistency of the alarm appearance time and the injection time and the consistency of the alarm disappearance time and the cancellation time.
If the AEP high-temperature alarm item is retrieved, the alarm appearance time and the alarm disappearance time are extracted from the AEP high-temperature alarm item. First, a time deviation threshold value T is set, and the time deviation threshold value range is (0-T). Then, an alarm time deviation t1 of the alarm appearance time from the injection time and a disappearance time deviation t2 of the alarm disappearance time from the withdrawal time are calculated. Judging whether t1 and t2 are within a deviation threshold range, and if t1 and t2 are both within the range, judging that the AEP high-temperature alarm sensitivity is qualified; if either t1 or t2 exceeds the range or both t1 and t2 exceed the range, the AEP high temperature alarm sensitivity is judged to be unqualified, and the comparison result and the BMC error log are output.
As shown in fig. 2, the apparatus 200 includes:
a dummy injection unit 210, wherein the dummy injection unit 210 is used for injecting AEP memory high-temperature dummy information and recording injection time;
a false revocation unit 220, wherein the false revocation unit 220 is used for revoking AEP memory high-temperature false information and recording revocation time;
the alarm monitoring unit 230, the alarm monitoring unit 230 is configured to collect alarm occurrence time and alarm disappearance time of BMC log AEP high temperature alarm items;
and the performance characterization unit 240 is used for characterizing the AEP high-temperature alarm sensitivity according to the consistency of the alarm appearance time and the injection time and the consistency of the alarm disappearance time and the cancellation time.
Optionally, as an embodiment of the present invention, the dummy injection unit includes:
the first injection module is configured to set the AEP to be a memory mode and inject high-Temperature false information by using a set-bim Temperature (100) instruction;
the second injection module is configured to set the AEP to be in a hard disk mode and inject high-Temperature false information by using a set-bim Temperature (100) instruction;
and the third injection module is configured to set the AEP to a mixed mode and inject the high-Temperature false information by using a set-bim Temperature (100) instruction.
Optionally, as an embodiment of the present invention, the false revocation unit includes:
the first revocation module is configured to set the AEP to be in a memory mode and revoke the high-Temperature false information by using a set-dimm-1-Temperature instruction;
the second revocation module is configured to set the AEP to be in a hard disk mode and revoke the high-Temperature false information by using a set-dimm-1-Temperature instruction;
and the third cancelling module is configured to set the AEP to a mixed mode and cancel the high-Temperature false information by using a set-dimm Clear-1 Temperature-1 instruction.
Optionally, as an embodiment of the present invention, the performance characterization unit includes:
a threshold setting module configured to set a time deviation threshold;
the deviation calculation module is configured for calculating the alarm time deviation between the alarm appearance time and the injection time and the disappearance time deviation between the alarm disappearance time and the cancellation time;
the deviation judging module is configured for judging whether the alarm time deviation and the disappearance time deviation are both within the time deviation threshold range;
the qualification judgment module is configured for judging that the AEP high-temperature alarm sensitivity is qualified;
and the error output module is configured for judging that the AEP high-temperature alarm sensitivity is unqualified and outputting a BMC error log.
Fig. 3 is a schematic structural diagram of a terminal device 300 according to an embodiment of the present invention, where the terminal device 300 may be used to execute the method for testing the sensitivity of AEP high-temperature alarm according to the embodiment of the present invention.
Among them, the terminal apparatus 300 may include: a processor 310, a memory 320, and a communication unit 330. The components communicate via one or more buses, and those skilled in the art will appreciate that the architecture of the servers shown in the figures is not intended to be limiting, and may be a bus architecture, a star architecture, a combination of more or less components than those shown, or a different arrangement of components.
The memory 320 may be used for storing instructions executed by the processor 310, and the memory 320 may be implemented by any type of volatile or non-volatile storage terminal or combination thereof, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The executable instructions in memory 320, when executed by processor 310, enable terminal 300 to perform some or all of the steps in the method embodiments described below.
The processor 310 is a control center of the storage terminal, connects various parts of the entire electronic terminal using various interfaces and lines, and performs various functions of the electronic terminal and/or processes data by operating or executing software programs and/or modules stored in the memory 320 and calling data stored in the memory. The processor may be composed of an Integrated Circuit (IC), for example, a single packaged IC, or a plurality of packaged ICs connected with the same or different functions. For example, the processor 310 may include only a Central Processing Unit (CPU). In the embodiment of the present invention, the CPU may be a single operation core, or may include multiple operation cores.
A communication unit 330, configured to establish a communication channel so that the storage terminal can communicate with other terminals. And receiving user data sent by other terminals or sending the user data to other terminals.
The present invention also provides a computer storage medium, wherein the computer storage medium may store a program, and the program may include some or all of the steps in the embodiments provided by the present invention when executed. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM) or a Random Access Memory (RAM).
Therefore, the AEP memory high-temperature false information is injected and the injection time is recorded, then the AEP memory high-temperature false information is cancelled and the cancellation time is recorded, then the AEP inner side high-temperature alarm information in the BMC log is collected, the alarm occurrence time and the alarm disappearance time are extracted, the alarm occurrence time, the injection time, the alarm disappearance time and the cancellation time are respectively compared, and the AEP memory high-temperature alarm sensitivity can be represented by comparing the consistency of the two groups of time. The method can automatically test the AEP high-temperature alarm sensitivity, has accurate test result and simple method, saves human resources and improves the test efficiency, and the technical effect achieved by the embodiment can be referred to the description above and is not repeated herein.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented as software plus a required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be embodied in the form of a software product, where the computer software product is stored in a storage medium, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, and the storage medium can store program codes, and includes instructions for enabling a computer terminal (which may be a personal computer, a server, or a second terminal, a network terminal, and the like) to perform all or part of the steps of the method in the embodiments of the present invention.
The same and similar parts in the various embodiments in this specification may be referred to each other. Especially, for the terminal embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant points can be referred to the description in the method embodiment.
In the embodiments provided in the present invention, it should be understood that the disclosed system, apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
Although the present invention has been described in detail by referring to the drawings in connection with the preferred embodiments, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. An AEP high-temperature alarm sensitivity test method is characterized by comprising the following steps:
injecting AEP memory high-temperature false information and recording injection time;
high-temperature false information of an AEP memory is cancelled and cancellation time is recorded;
collecting alarm appearance time and alarm disappearance time of AEP high-temperature alarm items of a BMC log;
characterizing AEP high-temperature alarm sensitivity according to the consistency of alarm appearance time and injection time and the consistency of alarm disappearance time and cancellation time;
the characterizing the AEP high-temperature alarm sensitivity according to the consistency of the alarm appearance time and the injection time and the consistency of the alarm disappearance time and the cancellation time comprises the following steps:
setting a time deviation threshold value;
calculating the alarm time deviation between the alarm appearance time and the injection time and the disappearance time deviation between the alarm disappearance time and the cancellation time;
judging whether the alarm time deviation and the disappearance time deviation are both within the time deviation threshold range:
if yes, judging that the AEP high-temperature alarm sensitivity is qualified;
and if not, judging that the AEP high-temperature alarm sensitivity is unqualified and outputting a BMC error log.
2. The AEP high temperature alarm sensitivity test method of claim 1, wherein said injecting AEP memory high temperature false information and recording injection time comprises:
setting AEP as a memory mode and injecting high-Temperature false information by using a set-bim Temperature =100 instruction;
setting AEP to be in a hard disk mode and injecting high-Temperature false information by using a set-bim Temperature =100 instruction;
the AEP is set to the hybrid mode and high Temperature dummy information is injected with a "set-bim Temperature = 100" instruction.
3. The AEP high temperature alarm sensitivity test method of claim 1, wherein said removing AEP memory high temperature false information and recording the time of the removal comprises:
setting AEP as a memory mode and utilizing a set-bimm Clear = 1Temperature =1 instruction to cancel high-Temperature false information;
setting AEP to be in a hard disk mode and utilizing a set-bimm Clear = 1Temperature =1 instruction to cancel high-Temperature false information;
the AEP is set to the blend mode and the high Temperature ghost is undone using the "set-dimm Clear = 1Temperature = 1" instruction.
4. An AEP high temperature alarm sensitivity testing device, comprising:
the device comprises a false injection unit, a memory unit and a control unit, wherein the false injection unit is configured and used for injecting AEP memory high-temperature false information and recording injection time;
the device comprises a false revocation unit, a memory access unit and a memory access unit, wherein the false revocation unit is configured to revoke AEP memory high-temperature false information and record revocation time;
the alarm monitoring unit is configured for acquiring the alarm appearance time and the alarm disappearance time of AEP high-temperature alarm items of the BMC log;
the performance characterization unit is configured for characterizing AEP high-temperature alarm sensitivity according to the consistency of alarm appearance time and injection time and the consistency of alarm disappearance time and cancellation time;
the performance characterization unit includes:
a threshold setting module configured to set a time deviation threshold;
the deviation calculation module is configured for calculating the alarm time deviation between the alarm appearance time and the injection time and the disappearance time deviation between the alarm disappearance time and the cancellation time;
the deviation judging module is configured for judging whether the alarm time deviation and the disappearance time deviation are both within the time deviation threshold range;
the qualification judgment module is configured for judging that the AEP high-temperature alarm sensitivity is qualified;
and the error output module is configured for judging that the AEP high-temperature alarm sensitivity is unqualified and outputting a BMC error log.
5. The AEP high temperature alarm sensitivity testing device of claim 4, wherein said false injection unit comprises:
the first injection module is configured to set the AEP to be a memory mode and inject high-Temperature false information by using a set-bim Temperature =100 instruction;
the second injection module is configured to set the AEP to be in a hard disk mode and inject high-Temperature false information by using a set-bim Temperature =100 instruction;
and a third injection module configured to set the AEP to a hybrid mode and inject the high-Temperature dummy information using a "set-bim Temperature = 100" instruction.
6. The AEP high temperature alarm sensitivity testing device of claim 4, wherein said false override unit comprises:
the first revocation module is configured to set the AEP to be a memory mode and revoke the high-Temperature false information by using a set-dimm Clear = 1Temperature =1 instruction;
the second revocation module is configured to set the AEP to be in a hard disk mode and revoke the high-Temperature false information by using a set-bim Clear = 1Temperature =1 instruction;
and the third canceling module is configured to set the AEP to a mixed mode and cancel the high-Temperature false information by using a set-bimm Clear = 1Temperature =1 instruction.
7. A terminal, comprising:
a processor;
a memory for storing instructions for execution by the processor;
wherein the processor is configured to perform the method of any one of claims 1-3.
8. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-3.
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|---|---|
| CN109815091A (en) | 2019-05-28 |
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