CN109815091A - A kind of AEP high temperature alarm sensitivity test method, device, terminal and storage medium - Google Patents
A kind of AEP high temperature alarm sensitivity test method, device, terminal and storage medium Download PDFInfo
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- CN109815091A CN109815091A CN201910063019.3A CN201910063019A CN109815091A CN 109815091 A CN109815091 A CN 109815091A CN 201910063019 A CN201910063019 A CN 201910063019A CN 109815091 A CN109815091 A CN 109815091A
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Abstract
The present invention provides a kind of AEP high temperature alarm sensitivity test method, device, terminal and storage medium, comprising: injection AEP memory high temperature deceptive information simultaneously records injection length；Revocation AEP memory high temperature deceptive information simultaneously records the revocation time；Acquire the alarm time of occurrence and alarm extinction time of BMC log AEP high temperature alarm item；The sensitivity of AEP high temperature alarm is characterized according to the consistency and alarm extinction time of alarm time of occurrence and injection length and the consistency of revocation time.The present invention, which can be realized, automatically tests AEP high temperature alarm sensitivity, and test result is accurate, and method is simple, improves testing efficiency again while saving human resources.
Description
Technical field
The invention belongs to server the field of test technology, and in particular to a kind of AEP high temperature alarm sensitivity test method, dress
It sets, terminal and storage medium.
Background technique
AEP (Apache Pass) memory is between hard disk and common memory, the advantages of both being but integrated with.Its feature
There are two main: (1) transmission speed is exceedingly fast；(2) have non-volatile.Compared with hard disk, the transmission speed of AEP memory compares hard disk
It is 100-1000 times fast, 8-10 times is also higher by than common memory.Compared with previous common memory, it will not be lost with data after power down
Another big advantage lost.
The mounting means of AEP memory is the same with common memory, is also mounted on memory slot position.But AEP memory can lead to
Adjustment distribution Provisioning Policy is crossed, memorymodel (memory mode), hard disk mode (APD mode) or mixed mode (mix are become
mode).In use, according to practical application scene, there are memorymodels (memory mode), hard disk mode for AEP memory
(APD mode) and three kinds of operating modes of mixed mode (mix mode).In normal use process, AEP memory temperature is excessively high
Words high temperature alarm prompting can occur in BMC log, this is a critically important AEP memory working mechanism.If AEP temperature mistake
High and BMC log without and alarm, it is likely that there is the problem of AEP damage, loss of data.Since tri- modes of AEP are in work
It is relatively independent during work, it is likely that there are alarm mechanism wherein mode can and alarm, and after switch mode
Can not and the problem of alarm.
There is presently no the methods of validity test AEP memory high temperature alarm sensitivity.
Summary of the invention
For the prior art can not validity test AEP memory high temperature alarm sensitivity, the present invention provides a kind of AEP high temperature and accuses
Alert sensitivity test method, device, terminal and storage medium, to solve the above technical problems.
In a first aspect, the present invention provides a kind of AEP high temperature alarm sensitivity test method, comprising:
Injection AEP memory high temperature deceptive information simultaneously records injection length, comprising: sets memorymodel for AEP and utilizes
" set-dimm Temperature=100 " instruction injection high temperature deceptive information；Hard disk mode is set by AEP and is utilized
" set-dimm Temperature=100 " instruction injection high temperature deceptive information；Mixed mode is set by AEP and is utilized
" set-dimm Temperature=100 " instruction injection high temperature deceptive information.
Revocation AEP memory high temperature deceptive information simultaneously records the revocation time, comprising: sets memorymodel for AEP and utilizes
" set-dimm Clear=1 Temperature=1 " instruction revocation high temperature deceptive information；Hard disk mode is set simultaneously for AEP
Utilize " set-dimm Clear=1 Temperature=1 " instruction revocation high temperature deceptive information；Hybrid guided mode is set by AEP
Formula simultaneously utilizes " set-dimm Clear=1 Temperature=1 " instruction revocation high temperature deceptive information.
Acquire the alarm time of occurrence and alarm extinction time of BMC log AEP high temperature alarm item.
According to the consistency and alarm extinction time of alarm time of occurrence and injection length and the consistency table for cancelling the time
Levy the sensitivity of AEP high temperature alarm, comprising: setting time deviation threshold value；When calculating the alarm for alerting time of occurrence and injection length
Between deviation and alarm extinction time with revocation the time extinction time deviation；Judge alarm time deviation and extinction time deviation is
It is no in time deviation threshold range: be then to determine that AEP high temperature alarm sensitivity is qualified；It is no, then determine AEP high temperature alarm
Sensitivity is unqualified and exports BMC error log.
Second aspect, the present invention provide a kind of AEP high temperature alarm sensibility testing arrangement, comprising:
False injection unit, comprising: the first injection module is configured to set memorymodel for AEP and utilizes " set-
Dimm Temperature=100 " instruction injection high temperature deceptive information；Second injection module is configured to set hard for AEP
Disk mode simultaneously utilizes " set-dimm Temperature=100 " instruction injection high temperature deceptive information；Third injection module, configuration
For setting mixed mode for AEP and utilizing " set-dimm Temperature=100 " instruction injection high temperature deceptive information.
False revocation unit, comprising: the first revocation module is configured to set memorymodel for AEP and utilizes " set-
Dimm Clear=1 Temperature=1 " instruction revocation high temperature deceptive information；Second revocation module, is configured to AEP
It is set as hard disk mode and utilizes " set-dimm Clear=1 Temperature=1 " instruction revocation high temperature deceptive information；The
Three revocation modules, are configured to set AEP to mixed mode and utilize " set-dimm Clear=1 Temperature=
1 " instruction revocation high temperature deceptive information.
Alarm monitoring unit, the alarm time of occurrence and alarm for being configured to acquisition BMC log AEP high temperature alarm item disappear
Time.
Performance characterization unit, comprising: threshold setting module is configured to setting time deviation threshold value；Deviation computing module,
It is configured to calculate the alarm time deviation of alarm time of occurrence and injection length and alarm extinction time and cancels disappearing for time
Lose time deviation；Deviation judgment module is configured to judge whether alarm time deviation and extinction time deviation are inclined in the time
In poor threshold range；Qualification determination module is configured to determine that the sensitivity of AEP high temperature alarm is qualified；Mistake output module, configuration
For determining that AEP high temperature alarm sensitivity is unqualified and exports BMC error log.
The third aspect provides a kind of terminal, comprising:
Processor, memory, wherein
The memory is used to store computer program,
The processor from memory for calling and running the computer program, so that terminal executes above-mentioned terminal
Method.
Fourth aspect provides a kind of computer storage medium, instruction is stored in the computer readable storage medium,
When run on a computer, so that computer executes method described in above-mentioned various aspects.
The beneficial effects of the present invention are,
AEP high temperature alarm sensitivity test method, device, terminal and storage medium provided by the invention, by injecting AEP
Memory high temperature deceptive information simultaneously records injection length, then cancels AEP memory high temperature deceptive information and record the revocation time, then adopts
Collect high temperature alarm information on the inside of the AEP in BMC log, extracts alarm time of occurrence and alarm extinction time, respectively comparison alarm
It time of occurrence and injection length and alarm extinction time and revocation time, is compared by the consistency to two groups of time, Ji Kebiao
Levy the high temperature alarm sensitivity of AEP memory.The present invention, which can be realized, automatically tests AEP high temperature alarm sensitivity, test knot
Fruit is accurate, and method is simple, improves testing efficiency again while saving human resources.
In addition, design principle of the present invention is reliable, structure is simple, has very extensive application prospect.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without creative efforts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the schematic flow chart of the method for one embodiment of the invention.
Fig. 2 is the schematic block diagram of the device of one embodiment of the invention.
Fig. 3 is a kind of structural schematic diagram of terminal provided in an embodiment of the present invention.
Specific embodiment
Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.
The Key Term occurred in the present invention is explained below.
Fig. 1 is the schematic flow chart of the method for one embodiment of the invention.Wherein, Fig. 1 executing subject can be one kind
AEP high temperature alarm sensibility testing arrangement.
As shown in Figure 1, this method 100 includes:
Step 110, it injects AEP memory high temperature deceptive information and records injection length；
Step 120, it cancels AEP memory high temperature deceptive information and records the revocation time；
Step 130, the alarm time of occurrence and alarm extinction time of BMC log AEP high temperature alarm item are acquired；
Step 140, according to the consistency and alarm extinction time of alarm time of occurrence and injection length and revocation time
Consistency characterizes the sensitivity of AEP high temperature alarm；
Optionally, it as one embodiment of the invention, injects AEP memory high temperature deceptive information and records injection length packet
It includes: setting memorymodel for AEP and utilize " set-dimm Temperature=100 " instruction injection high temperature deceptive information；
Hard disk mode is set by AEP and utilizes " set-dimm Temperature=100 " instruction injection high temperature deceptive information；It will
AEP is set as mixed mode and utilizes " set-dimm Temperature=100 " instruction injection high temperature deceptive information.
Optionally, it as one embodiment of the invention, cancels AEP memory high temperature deceptive information and records revocation time packet
It includes: setting memorymodel for AEP and utilize " set-dimm Clear=1 Temperature=1 " instruction revocation high temperature empty
False information；Hard disk mode is set by AEP and utilizes " set-dimm Clear=1Temperature=1 " instruction revocation high temperature
Deceptive information；Mixed mode is set by AEP and utilizes " set-dimm Clear=1 Temperature=1 " instruction revocation
High temperature deceptive information.
Optionally, as one embodiment of the invention, according to the consistency and alarm of alarm time of occurrence and injection length
The characterization AEP high temperature alarm sensitivity of the consistency of extinction time and revocation time includes: setting time deviation threshold value；Calculate alarm
The alarm time deviation and alarm extinction time of time of occurrence and injection length and the extinction time deviation for cancelling the time；Judgement is accused
Whether alert time deviation and extinction time deviation are in time deviation threshold range: being then to determine AEP high temperature alarm sensitivity
It is qualified；It is no, then determine that AEP high temperature alarm sensitivity is unqualified and exports BMC error log.
In order to facilitate the understanding of the present invention, below with the principle of AEP high temperature alarm sensitivity test method of the present invention, knot
The process tested in embodiment AEP high temperature alarm sensitivity is closed, AEP high temperature alarm sensitivity provided by the invention is surveyed
Method for testing is further described.
Specifically, the AEP high temperature alarm sensitivity test method includes:
S1, injection AEP memory high temperature deceptive information simultaneously record injection length.
Installation AEP memory driving first, executes test after the installation is completed.AEP memory configurations strategy is set automatically when test
For APD mode (hard disk mode), and (the instruction citing: set-dimm of memory high temperature alarm deceptive information is injected to it
Temperature=100).Record injection time for each instruction is as injection length.
S2, revocation AEP memory high temperature deceptive information simultaneously record the revocation time.
Input and carry out " set-dimm Clear=1 Temperature=1 " instruction revocation high temperature deceptive information.Record
Cancel an order executes the time as the revocation time.
S3, the alarm time of occurrence for acquiring BMC log AEP high temperature alarm item and alarm extinction time.
BMC log is acquired, AEP high temperature alarm item is retrieved from BMC log, if retrieval is less than exiting test and show
AEP high temperature alarm sensitivity test does not pass through (sensitivity is unqualified).If can retrieve, S4 is thened follow the steps.
S4, consistency and alarm extinction time according to alarm time of occurrence and injection length and the consistency for cancelling the time
Characterize the sensitivity of AEP high temperature alarm.
If retrieving AEP high temperature alarm item, alarm time of occurrence and alarm extinction time are therefrom extracted.One is arranged first
Time deviation threshold value T, then time deviation threshold range is (0-T).Then the alarm of alarm time of occurrence and injection length is calculated
Time deviation t1 and alarm extinction time and the extinction time deviation t2 for cancelling the time.Judge t1 and t2 whether in deviation threshold model
In enclosing, if t1 and t2 in the range, can be determined that the sensitivity of AEP high temperature alarm is qualified；If t1 or t2 some beyond should
Range or t1 and t2 exceed the range, then determine that AEP high temperature alarm sensitivity is unqualified, and export comparing result and BMC
Error log.
If Fig. 2 shows, which includes:
False injection unit 210, the falseness injection unit 210 is for injecting AEP memory high temperature deceptive information and recording
Injection length；
False revocation unit 220, the falseness revocation unit 220 is for cancelling AEP memory high temperature deceptive information and recording
Cancel the time；
Alarm monitoring unit 230, the alarm monitoring unit 230 are used to acquire the alarm of BMC log AEP high temperature alarm item
Time of occurrence and alarm extinction time；
Performance characterization unit 240, the performance characterization unit 240 are used for one according to alarm time of occurrence and injection length
Cause property and alarm extinction time and the consistency for cancelling the time characterize the sensitivity of AEP high temperature alarm.
Optionally, as one embodiment of the invention, false injection unit includes:
First injection module is configured to set AEP to memorymodel and utilizes " set-dimm Temperature=
100 " instruction injection high temperature deceptive information；
Second injection module is configured to set AEP to hard disk mode and utilizes " set-dimm Temperature=
100 " instruction injection high temperature deceptive information；
Third injection module is configured to set AEP to mixed mode and utilizes " set-dimm Temperature=
100 " instruction injection high temperature deceptive information.
Optionally, as one embodiment of the invention, false revocation unit includes:
First revocation module, is configured to set AEP to memorymodel and utilizes " set-dimm Clear=1
Temperature=1 " instruction revocation high temperature deceptive information；
Second revocation module, is configured to set AEP to hard disk mode and utilizes " set-dimm Clear=1
Temperature=1 " instruction revocation high temperature deceptive information；
Third cancels module, is configured to set AEP to mixed mode and utilizes " set-dimm Clear=1
Temperature=1 " instruction revocation high temperature deceptive information.
Optionally, as one embodiment of the invention, performance characterization unit includes:
Threshold setting module is configured to setting time deviation threshold value；
Deviation computing module, is configured to the alarm time deviation for calculating alarm time of occurrence and injection length and alarm disappears
It loses the time and cancels the extinction time deviation of time；
Whether deviation judgment module is configured to judge alarm time deviation and extinction time deviation in time deviation threshold
It is worth in range；
Qualification determination module is configured to determine that the sensitivity of AEP high temperature alarm is qualified；
Mistake output module is configured to determine that the sensitivity of AEP high temperature alarm is unqualified and exports BMC error log.
Fig. 3 is a kind of structural schematic diagram of terminal installation 300 provided in an embodiment of the present invention, which can be with
For executing AEP high temperature alarm sensitivity test method provided in an embodiment of the present invention.
Wherein, which may include: processor 310, memory 320 and communication unit 330.These components
It is communicated by one or more bus, it will be understood by those skilled in the art that the structure of server shown in figure is not
Limitation of the invention is constituted, it is also possible to hub-and-spoke configuration either busbar network, can also include more than illustrating
Or less component, perhaps combine certain components or different component layouts.
Wherein, which can be used for executing instruction for storage processor 310, and memory 320 can be by any class
The volatibility or non-volatile memories terminal or their combination of type are realized, such as static random access memory (SRAM), electricity
Erasable Programmable Read Only Memory EPROM (EEPROM), Erasable Programmable Read Only Memory EPROM (EPROM), programmable read only memory
(PROM), read-only memory (ROM), magnetic memory, flash memory, disk or CD.When executing instruction in memory 320
When being executed by processor 310, so that terminal 300 some or all of is able to carry out in following above method embodiment step.
Processor 310 is the control centre for storing terminal, utilizes each of various interfaces and the entire electric terminal of connection
A part by running or execute the software program and/or module that are stored in memory 320, and calls and is stored in storage
Data in device, to execute the various functions and/or processing data of electric terminal.The processor can be by integrated circuit
(Integrated Circuit, abbreviation IC) composition, such as the IC that can be encapsulated by single are formed, can also be by more of connection
The encapsulation IC of identical function or different function and form.For example, processor 310 can only include central processing unit
(Central Processing Unit, abbreviation CPU).In embodiments of the present invention, CPU can be single operation core, can also
To include multioperation core.
Communication unit 330, for establishing communication channel, so that the storage terminal be allow to be led to other terminals
Letter.It receives the user data of other terminals transmission or sends user data to other terminals.
The present invention also provides a kind of computer storage mediums, wherein the computer storage medium can be stored with program, the journey
Sequence may include step some or all of in each embodiment provided by the invention when executing.The storage medium can for magnetic disk,
CD, read-only memory (English: read-only memory, referred to as: ROM) or random access memory (English:
Random access memory, referred to as: RAM) etc..
Therefore, the present invention by injection AEP memory high temperature deceptive information and records injection length, then cancels AEP memory height
Warm deceptive information simultaneously records the revocation time, then acquires high temperature alarm information on the inside of the AEP in BMC log, extracts alarm and occurs
Time and alarm extinction time, respectively comparison alarm time of occurrence and injection length and alarm extinction time and revocation time, lead to
The consistency comparison to two groups of time is crossed, AEP memory high temperature alarm sensitivity can be characterized.The present invention can be realized automatic right
AEP high temperature alarm sensitivity is tested, and test result is accurate, and method is simple, is improved again while saving human resources
Testing efficiency, the attainable technical effect of the present embodiment institute may refer to described above, and details are not described herein again.
It is required that those skilled in the art can be understood that the technology in the embodiment of the present invention can add by software
The mode of general hardware platform realize.Based on this understanding, the technical solution in the embodiment of the present invention substantially or
Say that the part that contributes to existing technology can be embodied in the form of software products, which is stored in
Such as USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory in one storage medium
The various media that can store program code such as (RAM, Random Access Memory), magnetic or disk, including it is several
Instruction is used so that a terminal (can be personal computer, server or second terminal, the network terminal etc.) is held
Row all or part of the steps of the method according to each embodiment of the present invention.
Same and similar part may refer to each other between each embodiment in this specification.Implement especially for terminal
For example, since it is substantially similar to the method embodiment, so being described relatively simple, related place is referring in embodiment of the method
Explanation.
In several embodiments provided by the present invention, it should be understood that disclosed systems, devices and methods, it can be with
It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the unit
It divides, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or components
It can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, it is shown or
The mutual coupling, direct-coupling or communication connection discussed can be through some interfaces, the indirect coupling of device or unit
It closes or communicates to connect, can be electrical property, mechanical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
In network unit.It can select some or all of unit therein according to the actual needs to realize the mesh of this embodiment scheme
's.
It, can also be in addition, the functional units in various embodiments of the present invention may be integrated into one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.
Although by reference to attached drawing and combining the mode of preferred embodiment to the present invention have been described in detail, the present invention
It is not limited to this.Without departing from the spirit and substance of the premise in the present invention, those of ordinary skill in the art can be to the present invention
Embodiment carry out various equivalent modifications or substitutions, and these modifications or substitutions all should in covering scope of the invention/appoint
What those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, answer
It is included within the scope of the present invention.Therefore, protection scope of the present invention is answered described is with scope of protection of the claims
It is quasi-.
Claims (10)
1. a kind of AEP high temperature alarm sensitivity test method characterized by comprising
Injection AEP memory high temperature deceptive information simultaneously records injection length；
Revocation AEP memory high temperature deceptive information simultaneously records the revocation time；
Acquire the alarm time of occurrence and alarm extinction time of BMC log AEP high temperature alarm item；
AEP is characterized according to the consistency and alarm extinction time of alarm time of occurrence and injection length and the consistency of revocation time
High temperature alarm sensitivity.
2. according to claim 1 AEP high temperature alarm sensitivity test method, which is characterized in that the injection AEP memory is high
Warm deceptive information simultaneously records injection length and includes:
Memorymodel is set by AEP and utilizes " set-dimm Temperature=100 " instruction injection high temperature deceptive information；
Hard disk mode is set by AEP and utilizes " set-dimm Temperature=100 " instruction injection high temperature deceptive information；
Mixed mode is set by AEP and utilizes " set-dimm Temperature=100 " instruction injection high temperature deceptive information.
3. AEP high temperature alarm sensitivity test method according to claim 1, which is characterized in that the revocation AEP memory
High temperature deceptive information and record revocation the time include:
Memorymodel is set by AEP and utilizes " set-dimm Clear=1Temperature=1 " instruction revocation high temperature empty
False information；
Hard disk mode is set by AEP and utilizes " set-dimm Clear=1Temperature=1 " instruction revocation high temperature empty
False information；
Mixed mode is set by AEP and utilizes " set-dimm Clear=1Temperature=1 " instruction revocation high temperature empty
False information.
4. AEP high temperature alarm sensitivity test method according to claim 1, which is characterized in that described according to alerting out
The sensitivity of AEP high temperature alarm is characterized with the consistency of injection length and alarm extinction time and the consistency of revocation time between current
Include:
Time deviation threshold value is set；
When calculating the alarm time deviation and the disappearance of alarm extinction time and revocation time of alarm time of occurrence and injection length
Between deviation；
Judge alarm time deviation and extinction time deviation whether in time deviation threshold range:
It is then to determine that the sensitivity of AEP high temperature alarm is qualified；
It is no, then determine that AEP high temperature alarm sensitivity is unqualified and exports BMC error log.
5. a kind of AEP high temperature alarm sensibility testing arrangement characterized by comprising
False injection unit is configured to injection AEP memory high temperature deceptive information and records injection length；
False revocation unit is configured to revocation AEP memory high temperature deceptive information and records the revocation time；
Alarm monitoring unit, when the alarm time of occurrence and alarm for being configured to acquisition BMC log AEP high temperature alarm item disappear
Between；
Performance characterization unit is configured to the consistency according to alarm time of occurrence and injection length and alerts extinction time and remove
The consistency for selling the time characterizes the sensitivity of AEP high temperature alarm.
6. AEP high temperature alarm sensibility testing arrangement according to claim 5, which is characterized in that the false injection is single
Member includes:
First injection module is configured to set AEP to memorymodel and utilizes " set-dimm Temperature=100 "
Instruction injection high temperature deceptive information；
Second injection module is configured to set AEP to hard disk mode and utilizes " set-dimm Temperature=100 "
Instruction injection high temperature deceptive information；
Third injection module is configured to set AEP to mixed mode and utilizes " set-dimm Temperature=100 "
Instruction injection high temperature deceptive information.
7. AEP high temperature alarm sensibility testing arrangement according to claim 5, which is characterized in that the false revocation is single
Member includes:
First revocation module, is configured to set AEP to memorymodel and utilizes " set-dimm Clear=
1Temperature=1 " instruction revocation high temperature deceptive information；
Second revocation module, is configured to set AEP to hard disk mode and utilizes " set-dimm Clear=
1Temperature=1 " instruction revocation high temperature deceptive information；
Third cancels module, is configured to set AEP to mixed mode and utilizes " set-dimm Clear=
1Temperature=1 " instruction revocation high temperature deceptive information.
8. AEP high temperature alarm sensibility testing arrangement according to claim 5, which is characterized in that the performance characterization list
Member includes:
Threshold setting module is configured to setting time deviation threshold value；
Deviation computing module, when being configured to calculate the alarm time deviation of alarm time of occurrence and injection length and alarm disappearance
Between and revocation the time extinction time deviation；
Whether deviation judgment module is configured to judge alarm time deviation and extinction time deviation in time deviation threshold value model
In enclosing；
Qualification determination module is configured to determine that the sensitivity of AEP high temperature alarm is qualified；
Mistake output module is configured to determine that the sensitivity of AEP high temperature alarm is unqualified and exports BMC error log.
9. a kind of terminal characterized by comprising
Processor；
The memory executed instruction for storage processor；
Wherein, the processor is configured to perform claim requires the described in any item methods of 1-4.
10. a kind of computer readable storage medium for being stored with computer program, which is characterized in that the program is executed by processor
Shi Shixian method for example of any of claims 1-4.
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| CN114490200A (en) * | 2021-12-17 | 2022-05-13 | 宁畅信息产业(北京)有限公司 | Memory test method and device, computer equipment and storage medium |
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| CN109815091B (en) | 2022-02-18 |
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