CN109901959B - Pressure measurement method, system, terminal and storage medium for AEP memory under mix mode - Google Patents
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Abstract
The invention provides a method, a system, a terminal and a storage medium for pressure measurement of an AEP memory under a mix mode, wherein the method comprises the following steps: presetting a group of AEP memory adjustment strategies, wherein each AEP memory adjustment strategy is used for adjusting the mode of an AEP memory to be tested to be a mix mode; circularly traversing each AEP memory adjustment strategy, and circularly adjusting the ratio of the hard disk module and the memory module of the AEP memory to be detected according to each traversed AEP memory adjustment strategy until the total frequency of the current circular traversal of each AEP memory adjustment strategy reaches the preset cycle frequency; after the ratio of the hard disk module and the memory module of the AEP memory to be tested is adjusted every time, the hardware module and the memory module of the AEP memory to be tested in the current mixed mode are respectively subjected to pressure testing. The method is used for testing the stability of the AEP memory.
Description
Technical Field
The invention relates to the field of memory testing, in particular to a method, a system, a terminal and a storage medium for testing the pressure of an AEP memory under a mix mode, which are used for testing the stability of the AEP memory.
Background
The AEP (Apache Pass) memory adopts a 3D XPoint technology, is arranged between a hard disk and a common memory, has the same installation mode as the common memory, has the characteristics of high transmission speed (the transmission speed of the AEP memory is 100-1000 times that of the hard disk and 8-10 times that of the common memory) and non-volatility.
There are three types of AEP memory modes, namely, a memory mode (memory mode), a hard disk mode (APD mode), and a hybrid mode (mix mode). When the memory allocation method is used, the mode of the AEP memory can be set to any one of the memory mode (memory mode), the hard disk mode (APD mode) and the mixed mode (mix mode) according to actual needs.
When the mode of the AEP memory is set to a 100% hard disk mode (APD mode) by the AEP memory allocation policy, the AEP memory can be used as a hard disk, has a storage function, but has a higher read-write speed than a normal hard disk. When the mode of the AEP memory is set to a mixed mode (mix mode) by the AEP memory allocation strategy, the AEP memory is virtually decomposed into a hard disk module with a corresponding size and a memory module with a corresponding size, and the hard disk module has a memory function and a hard disk function, wherein the hard disk module has a hard disk function, and the memory module has a memory function; wherein, the concrete size of hard disk module and the concrete size of memory module, satisfying under the prerequisite that the size sum of hard disk module and memory module equals the size of AEP memory, can be adjusted according to actual demand by technical staff, for example: a128 GB AEP memory is arranged in a computer, and the 128GB AEP memory can be divided into a 64GB hard disk module and a 64GB memory module through strategy setting, and can also be divided into a 30GB hard disk module and a 98GB memory module through strategies.
The AEP memory is a relatively new memory, and at present, most of the commonly used AEP memory pressure test schemes in the prior art are that the AEP memory is set to be in a hard disk mode, the hard disk fio pressure test is carried out after the AEP memory is set to be in the hard disk mode, then the AEP memory is set to be in the memory mode, and the memory pressure test is carried out after the AEP memory is set to be in the memory mode; or vice versa, namely the AEP memory is set to be in a memory mode for memory pressure test, and then the AEP memory is set to be in a hard disk mode for hard disk fio pressure test. In addition, for the pressure test of the AEP memory under the mix mode, the hard disk module and the memory module in the AEP memory are usually sequentially pressurized in the prior art.
It can be seen that in the prior art, there are relatively few AEP memory test strategies available to those skilled in the art. In addition, the existing pressure test strategy of the AEP memory cannot cope with relatively complex application scene tests, and the reliability of verification results of the stability and reliability of the AEP memory is restricted to a certain extent.
Therefore, the invention provides a method, a system, a terminal and a storage medium for pressure measurement of an AEP memory under a mix mode, so as to solve the technical problems.
Disclosure of Invention
Aiming at the technical problems in the prior art, the invention provides a method, a system, a terminal and a storage medium for testing the pressure of an AEP memory under a mix mode, which are used for testing the stability of the AEP memory.
In a first aspect, the present invention provides a method for pressure measurement of an AEP memory under a mix mode, where the method for pressure measurement of an AEP memory under a mix mode includes:
presetting a group of AEP memory adjustment strategies, wherein each AEP memory adjustment strategy is used for adjusting the mode of an AEP memory to be detected to be a mix mode;
circularly traversing each AEP memory adjustment strategy, and circularly adjusting the proportion of a hard disk module and a memory module of the AEP memory to be detected according to each traversed AEP memory adjustment strategy until the total frequency of the current circular traversal of each AEP memory adjustment strategy reaches the preset cycle frequency;
after the occupation ratios of the hard disk module and the memory module of the AEP memory to be tested are adjusted every time, the hardware module and the memory module of the AEP memory to be tested under the current mixed mode are respectively subjected to pressure test.
Further, the pressure test is carried out to hardware module and the memory module in AEP to be tested under the current mixed mode, including:
performing hardware pressure test on a hardware module in the AEP to be tested under the current mixed mode;
and testing the memory pressure of the memory module in the current mixing mode in the AEP to be tested.
Further, the hardware pressure test and the memory pressure test are performed synchronously.
Further, the preset AEP memory adjustment strategies are different.
In a second aspect, the present invention provides a pressure measurement system for an AEP memory in a mix mode, where the pressure measurement system for an AEP memory in a mix mode includes:
the memory adjustment strategy unit comprises a group of preset AEP memory adjustment strategies, and each AEP memory adjustment strategy is used for adjusting the mode of the AEP memory to be detected to be a mix mode;
the AEP memory module proportion adjusting unit is used for circularly traversing each AEP memory adjusting strategy contained in the memory adjusting strategy unit based on the preset cycle times; the memory module is used for circularly adjusting the ratio of the hard disk module and the memory module of the AEP memory to be tested according to each traversed AEP memory adjusting strategy;
and the pressure measurement unit is used for respectively performing pressure measurement on the hardware module and the memory module of the AEP memory to be tested in the current mixed mode after the AEP memory module ratio adjustment unit adjusts the ratio of the hard disk module and the memory module of the AEP memory to be tested each time.
Further, the pressure measuring unit includes:
the first pressure testing module is used for performing hardware pressure testing on the hardware module of the AEP memory to be tested;
and the second pressure testing module is used for testing the memory pressure of the memory module of the AEP memory to be tested.
Further, the hardware pressure test and the memory pressure test are performed synchronously.
Further, the preset AEP memory adjustment strategies are different.
In a third aspect, the present invention provides a terminal, including:
a processor;
a memory for storing instructions for execution by the processor;
wherein the processor is configured to execute the method of pressure measurement of AEP memory under mix mode as described above.
In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored therein, which, when run on a computer, causes the computer to perform the above-mentioned aspects of the method for pressure measurement of AEP memory in mix mode.
In a third aspect, a terminal is provided, including:
a processor, a memory, wherein,
the memory is used for storing a computer program which,
the processor is configured to call and run the computer program from the memory, so that the terminal performs the method of the terminal described above.
In a fourth aspect, a computer storage medium is provided, which when run on a computer causes the computer to perform the method of the above aspects.
The invention has the beneficial effects that:
(1) According to the method, the system, the terminal and the storage medium for testing the AEP memory under the mix mode, the occupation ratio of the hardware module and the memory module of the AEP memory to be tested in the mixed mode is adjusted in a circulating mode based on the preset AEP memory adjustment strategy, and after the occupation ratio of the hardware module and the memory module of the AEP memory to be tested in the mixed mode is adjusted each time, the hardware module and the memory module of the AEP memory to be tested in the current mixed mode are respectively tested in a pressure mode, so that the purpose of testing the rolling pressure of the AEP memory to be tested in the mixed mode in a circulating mode is achieved, and the reliability and stability of the AEP memory are tested.
(2) According to the method, the system, the terminal and the storage medium for testing the AEP memory under the mix mode, which are provided by the invention, the preset AEP memory adjustment strategies are different, namely different AEP memory adjustment strategies, the occupation ratios of the hardware modules under the corresponding AEP memory mixed mode are different, and the occupation ratios of the memory modules under the corresponding AEP memory mixed mode are also different.
Drawings
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the present invention.
FIG. 2 is a schematic block diagram of a system of one embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, shall fall within the protection scope of the present invention.
The following explains key terms appearing in the present invention.
FIG. 1 is a schematic flow chart of an embodiment of a method for pressure measurement of an AEP memory under mix mode according to the present invention. The execution entity of FIG. 1 may be a pressure measurement system for AEP memory in mix mode.
As shown in fig. 1, the method 100 for pressure measurement of an AEP memory in mix mode includes:
Optionally, as an embodiment of the present invention, the pressure testing of the hardware module and the memory module in the current mixed mode in the AEP to be tested includes:
performing hardware pressure test on a hardware module in the AEP to be tested under the current mixed mode;
and carrying out memory pressure test on the memory module in the AEP to be tested under the current mixed mode.
Optionally, as an embodiment of the present invention, the hardware stress test and the memory stress test are performed synchronously.
Optionally, as an embodiment of the present invention, each of the preset AEP memory adjustment policies in step 110 is different.
In order to facilitate understanding of the present invention, the pressure measurement method of the AEP memory under mix mode provided by the present invention is further described below by using the principle of the pressure measurement method of the AEP memory under mix mode of the present invention and combining the process of performing pressure measurement on the AEP memory under mix mode in the embodiment.
Specifically, the method for pressure measurement of the AEP memory under the mix mode includes:
(1) Preparing a pressure measurement environment: the method comprises the steps of installing an AEP memory to be tested into a testing machine, installing a Linux system in the testing machine, installing an AEP memory drive for the testing machine, and then installing an ipmctl tool and an ndctl tool in the Linux system of the testing machine.
The ipmctl tool is a software tool provided by Intel corporation for the AEP memory, and can be used for inquiring parameter information, setting configuration strategies and analyzing debug problems of the AEP memory.
The ndctl tool is a tool software package and has functions of activating, closing, partitioning and the like of a hard disk part in an AEP memory.
(2) Presetting a group of AEP memory adjustment strategies, wherein each AEP memory adjustment strategy is used for adjusting the mode of an AEP memory to be detected to be a mix mode, and specifically:
nine AEP memory adjustment strategies are set, and as shown in table 1 below, each AEP memory adjustment strategy is used to adjust the mode of the AEP memory to be tested to be mix mode. Referring to table 1, each AEP memory adjustment policy in the table includes a hard disk module ratio x and a memory module ratio y of the to-be-detected AEP memory in the mixed mode; in the same AEP memory adjustment strategy, the hard disk module ratio x and the memory module ratio y meet the conditions: 0-n x-n 1, 0-n y-n 1 and x + y =1.
TABLE 1 AEP memory adjustment policy Table
Referring to table 1, there are nine AEP memory adjustment policies, corresponding serial numbers are 1 to 9, where the percentage x of the nine hard disk modules in the AEP memory hybrid mode to be tested is 90%, 80%, 70%, 60%, 50%, 40%, 30%, 20%, and 10%, and the AEP memory adjustment policies are all different.
In the concrete implementation, referring to table 1, the hard disk module proportion x and the memory module proportion y in the same AEP memory adjustment strategy can be set according to the specific test condition on the basis of meeting the above conditions.
(3) Circularly traversing each AEP memory adjustment strategy in the table 1, and circularly adjusting the ratio of a hard disk module and a memory module of the AEP memory to be tested in the tester according to each traversed AEP memory adjustment strategy until the total frequency of the current circular traversal of each AEP memory adjustment strategy reaches the preset cycle frequency; after the proportion of the hard disk module and the memory module of the AEP memory to be tested is adjusted each time, the hardware module and the memory module of the AEP memory to be tested in the tester in the current mixed mode are respectively subjected to pressure testing.
And completing one cycle traversal each time the traversal of 1-9 AEP memory adjustment strategies in the table 1 is completed.
And each time the circulation traversal is completed, increasing the current total circulation times by 1.
Presetting the cycle number as n times, when the current total cycle number is less than n, continuously and circularly traversing each AEP memory adjustment strategy in the table 1, circularly adjusting the proportion of a hard disk module and a memory module of the AEP memory to be tested according to each traversed AEP memory adjustment strategy, respectively testing the hardware module and the memory module of the AEP memory to be tested in the current mixing mode after adjusting the proportion of the hard disk module and the memory module of the AEP memory to be tested each time until the current total cycle number is equal to n, stopping next cycle traversal of each AEP memory adjustment strategy in the table 1, and automatically ending the test at the moment, wherein the method can be specifically realized by adopting the following steps:
step s1, initializing a current total cycle number m, and enabling m =0; then step s2 is executed;
step s2, traversing the AEP memory adjustment strategy in the table 1, and configuring that the hard disk module proportion x and the memory module proportion y of the AEP memory to be detected in the current mixed mode are 90% and 10%, respectively; then step s3 is performed;
step s3, performing pressure test on the hardware module and the memory module in the current mixed mode in the AEP to be tested; then step s4 is executed;
step s4, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring that the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode are 80% and 20%, respectively; then step s5 is executed;
step s5, performing pressure test on the hardware module and the memory module in the current mixed mode in the AEP to be tested; then step s6 is performed;
step s6, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode to be 70% and 30%; then step s7 is performed;
step s7, performing pressure test on the hardware module and the memory module in the AEP to be tested under the current mixed mode; then step s8 is performed;
step s8, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode to be 60% and 40%; then step s9 is performed;
step s9, performing pressure test on the hardware module and the memory module in the AEP to be tested under the current mixed mode; then step s10 is performed;
step s10, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring that the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode are 50% and 50%, respectively; then step s11 is performed;
step s11, performing pressure test on the hardware module and the memory module in the current mixed mode in the AEP to be tested; then step s12 is performed;
step s12, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring that the hard disk module ratio x and the memory module ratio y of the AEP memory to be detected in the current mixed mode are 40% and 60%, respectively; then step s13 is performed;
step s13, performing pressure test on the hardware module and the memory module in the current mixed mode in the AEP to be tested; then step s14 is performed;
step s14, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode to be 30% and 70%; then step s15 is performed;
step s15, performing pressure test on the hardware module and the memory module in the AEP to be tested under the current mixed mode; then step s16 is performed;
step s16, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode to be 20% and 80%; then step s17 is performed;
step s17, performing pressure test on the hardware module and the memory module in the current mixed mode in the AEP to be tested; then step s18 is performed;
step s18, continuing to pass through the AEP memory adjustment strategy in the table 1, and configuring that the hard disk module percentage x and the memory module percentage y of the AEP memory to be detected in the current mixed mode are respectively 10% and 90%; then step s19 is performed;
step 19, increasing the value of the current total cycle number m by 1; then step s20 is performed;
step 20, judging whether the value of the current total cycle number m is smaller than a preset cycle number n, if so, continuing to execute the step s2; otherwise, continuing to execute step s21;
and step s21, stopping the next cycle traversal of each AEP memory adjustment strategy in the table 1, ending the test, and printing a test result.
In specific implementation, the value of the cycle number n may be set according to an actual situation, for example, 20, 30, or other relevant values as needed.
And after the test is finished, checking and analyzing the test result, and judging the stability and reliability of the AEP memory to be tested according to the test result.
It should be noted that, the ratio of the hard disk module and the memory module of the AEP memory to be measured is adjusted, the configuration may be adjusted by using an ipmctl tool, for example, the current AEP memory adjustment policy with sequence number 2 in table 1 is traversed, and the ratio of the hard disk module and the memory module of the AEP memory to be measured may be adjusted by using the ipmctl instruction as follows:
#ipmctl create-goal MemoryMode＝20PersistentMemoryType＝AppDirectNotInterleaved。
based on the ipmctl instruction "# ipmctl create-coarse memorylmode = 20persistentmemoryltype = appdirectnterleaved", the memory module occupation ratio of the to-be-tested AEP in the current hybrid mode can be set to be 20%, and correspondingly at this time, the hardware module occupation ratio of the to-be-tested AEP in the current hybrid mode becomes 80%.
In each cycle traversal process, after the occupation ratio of the hard disk module and the memory module of the AEP memory to be tested is adjusted each time, the hardware module and the memory module of the AEP memory to be tested in the current mixed mode can be synchronously tested, specifically, the hardware pressure test of the hardware module of the AEP memory to be tested in the current mixed mode and the memory pressure test of the memory module of the AEP memory to be tested in the current mixed mode are synchronously carried out.
Optionally, the hardware pressure test can adopt a fio pressure test, the memory pressure test can adopt a memester memory pressure test, and the synchronous pressure test can be realized by a & tool provided by Linux. During specific implementation, the hardware pressure test can adopt other related pressure tests in the prior art, the memory pressure test can also adopt other related pressure tests in the prior art, and the synchronous pressure test can also be implemented by adopting any other related tools in the prior art.
The memtest memory pressure test is a memory pressure test performed by a memtest tool. The memtest tool is a Linux memory test tool, mainly used for capturing memory errors and dead bits which are always high or low, the main items of the test of the memtest tool comprise random values, exclusive-or comparison, subtraction, multiplication, division, and OR operation and the like, and the existing memory of a system can be tested according to the size and the times of the test memory.
The & tool is a tool carried by the Linux system and is used for synchronously carrying out logic and functions of front and back processes of the tool. In this embodiment, the & & tool is used to implement the synchronous execution of the hardware pressure test and the memory pressure test.
Before the fio pressure test is carried out each time, the hard disk module in the AEP to be tested under the current mixed mode needs to be preprocessed, and the concrete mode is as follows:
# ndctl create-namespace-r region X-m fsdax-f # activation hard disk module
Hard disk module after formatted and activated # mkfs, ext4/dev/pmemX #
Before carrying out the memtest memory pressure test each time, the memory module of the AEP to be tested in the current mixed mode needs to be preprocessed, and the specific mode is as follows:
# calculation of memory Capacity of AEP to be tested:
memtotal＝$(cat/proc/meminfo|awk'/MemTotal/{print$2}')；
# setting AEP internal pressure ratio, 85% pressure:
memsize＝$(echo"$memtotal*0.85/1024/1024"|bc)。
based on the pretreatment of the hard disk module and the memory module in the current mixed mode of the AEP memory to be tested, the fio pressure test and the corresponding memtest memory pressure test are synchronously carried out each time, and the method can be realized by adopting the following modes:
nohup fio--filename＝/dev/pmemX--direct＝1--rw＝write--bs＝4k--size＝15G--numjobs＝8--runtime＝100000--group_reporting--name＝test-read&&hohup./memtester$memsize 100000。
the method comprises the steps of carrying out FIO pressure test and memtest of the memory module of the AEP memory to be tested, wherein each time of the FIO pressure test and the corresponding memtest of the FIO pressure test are carried out synchronously, and the simultaneous start and the simultaneous end of the pressure test of the hard disk module and the memory module of the AEP memory to be tested are respectively ensured under the configuration mode of the mix mode, namely on one hand, the condition that the AEP memory to be tested can enter the state that the hard disk module and the memory module are pressurized simultaneously from the non-pressurized state is ensured, and on the other hand, the condition that the AEP memory to be tested can directly enter the non-pressurized state from the state that the hard disk module and the memory module are pressurized simultaneously is also ensured.
It should be noted that the synchronous pressure test in the present invention may be replaced by any relevant pressure test method in the AEP memory hybrid mode in the prior art, for example, a hard disk module and a memory module in the AEP memory hybrid mode to be tested may be replaced by sequentially pressurizing to perform a test, for example, a hardware pressure test of the hard disk module in the AEP memory hybrid mode to be tested is started first, and then a memory pressure test of the memory module in the AEP memory hybrid mode to be tested is started.
In summary, according to the method for testing the AEP memory under mix mode provided by the invention, on one hand, the occupation ratios of the hardware module and the memory module in the mixed mode of the AEP memory to be tested are adjusted circularly based on the preset AEP memory adjustment strategy, and after the occupation ratios of the hardware module and the memory module in the mixed mode of the AEP memory to be tested are adjusted each time, the hardware module and the memory module in the current mixed mode of the AEP memory to be tested are respectively tested in a pressing manner, so that the purpose of testing the rolling pressure of the AEP memory to be tested in the mixed mode in a circulating manner is achieved, and the reliability and stability of the AEP memory are tested, therefore, the invention provides a new AEP memory testing technology, and the defect that the strategy for testing the stability and reliability of the AEP memory in the prior art is relatively few is made up to a certain extent; on the other hand, the preset AEP memory adjustment strategies are different from one another, so that the method and the device can test relatively complex application scenes, and further can improve the reliability and stability of the AEP memory test to a certain extent.
FIG. 2 is a schematic block diagram of an embodiment of a pressure measurement system of an AEP memory under mix mode according to the invention. The pressure measurement system 200 of the AEP memory under the mix mode comprises:
a memory adjustment policy unit 210, which includes a set of preset AEP memory adjustment policies, where each AEP memory adjustment policy is used to adjust the mode of the AEP memory to be tested to be mix mode;
an AEP memory module ratio adjusting unit 220, configured to cycle through each AEP memory adjustment policy included in the memory adjustment policy unit 210 based on a preset cycle number; the memory module is used for circularly adjusting the ratio of the hard disk module and the memory module of the AEP memory to be tested according to each traversed AEP memory adjusting strategy;
and a pressure measurement unit 230, configured to respectively perform pressure measurement on the hardware module and the memory module of the AEP memory to be tested in the current mixed mode after the AEP memory module ratio adjustment unit 220 adjusts the ratio of the hard disk module and the memory module of the AEP memory to be tested each time.
When in use, a group of AEP memory adjustment policies is preset in the memory adjustment policy unit 210; then, the AEP memory module proportion adjusting unit 220 cycles through each AEP memory adjustment strategy included in the memory adjustment strategy unit 210 based on the preset cycle times; the occupation ratio of the hard disk module and the memory module of the AEP memory to be tested is adjusted circularly through the AEP memory module occupation ratio adjusting unit 220 according to each traversed AEP memory adjusting strategy; after the AEP memory module occupation ratio adjusting unit 220 adjusts the occupation ratio of the hard disk module and the memory module of the AEP memory to be tested each time, the pressure measuring unit 230 is used to respectively perform pressure measurement on the hardware module and the memory module of the AEP memory to be tested in the current mixed mode.
Optionally, as an embodiment of the present invention, the pressure measuring unit 230 includes:
the first pressure testing module is used for performing hardware pressure testing on the hardware module of the AEP memory to be tested;
and the second pressure testing module is used for testing the memory pressure of the memory module of the AEP memory to be tested.
Optionally, as an embodiment of the present invention, the hardware stress test and the memory stress test are performed simultaneously.
Optionally, as an embodiment of the present invention, the preset AEP memory adjustment policies are different.
In view of the fact that the system 200 for pressure measurement of an AEP memory in mix mode corresponds to the method 100 for pressure measurement of an AEP memory in mix mode, the components thereof are already described in the corresponding parts of the method 100 for pressure measurement of an AEP memory in mix mode, and are not described herein again.
Fig. 3 is a schematic structural diagram of a terminal 300 according to an embodiment of the present invention, where the terminal 300 may be used to execute the method for testing the AEP memory in the mix mode according to the embodiment of the present invention.
Among them, this terminal 300 includes: a processor 310 and a memory 320. The components communicate via one or more buses, and those skilled in the art will appreciate that the configuration of the terminal shown in fig. 3 is not a limitation of the present invention and may include more or less components than those shown.
Wherein the memory 320 may be used for storing instructions executed by the processor 310, the memory 320 may be implemented by any type of volatile or non-volatile storage terminal or combination thereof, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The executable instructions in memory 320, when executed by processor 310, enable terminal 300 to perform some or all of the steps in the above-described method embodiments.
The processor 310 serves as a control center of the terminal 300, connects various parts of the entire electronic terminal using various interfaces and lines, and performs various functions of the terminal 300 and/or processes data by operating or executing software programs and/or modules stored in the memory 320 and calling data stored in the memory 320. The processor 310 may be composed of an Integrated Circuit (IC), for example, a single packaged IC, or a plurality of packaged ICs with the same or different functions. For example, the processor 310 may include only a Central Processing Unit (CPU). In the embodiment of the present invention, the CPU may be a single operation core, or may include multiple operation cores.
In addition, the present invention also provides a computer storage medium, wherein the computer storage medium stores a program, and the program can include some or all of the steps in the method embodiments provided by the present invention when executed. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM) or a Random Access Memory (RAM).
Therefore, the method and the device circularly adjust the occupation ratio of the hardware module and the memory module in the AEP to be tested in the mixed mode based on a set of preset different AEP memory adjustment strategies, and respectively perform pressure test on the hardware module and the memory module in the current mixed mode after adjusting the occupation ratio of the hardware module and the memory module in the mixed mode in the AEP to be tested each time.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented as software plus a required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be embodied in the form of a software product, where the computer software product is stored in a storage medium, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, and the storage medium can store program codes, and includes instructions for enabling a computer terminal (which may be a personal computer, a server, or a network terminal) to perform all or part of the steps of the method in the embodiments of the present invention.
The same and similar parts in the various embodiments in this specification may be referred to each other. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and the relevant points can be referred to the description in the method embodiment.
In the several embodiments provided in the present invention, it should be understood that the disclosed system, terminal and method may be implemented in other manners. For example, the above-described system embodiments are merely illustrative, and for example, the division of the units is only one logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
Although the present invention has been described in detail by referring to the drawings in connection with the preferred embodiments, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions should be within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present disclosure and the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (4)
1. A pressure measurement method of an AEP memory under a mix mode is characterized by comprising the following steps:
presetting a group of AEP memory adjustment strategies, wherein each AEP memory adjustment strategy is used for adjusting the mode of an AEP memory to be detected to be a mix mode, and the preset AEP memory adjustment strategies are different;
circularly traversing each AEP memory adjustment strategy, and circularly adjusting the ratio of the hard disk module and the memory module of the AEP memory to be detected according to each traversed AEP memory adjustment strategy until the total frequency of the current circular traversal of each AEP memory adjustment strategy reaches the preset cycle frequency;
after the occupation ratio of a hard disk module and a memory module of the AEP memory to be tested is adjusted each time, respectively carrying out pressure test on the hardware module and the memory module of the AEP memory to be tested under the current mixed mode;
the test is pressed to hardware module and memory module in the AEP to be tested under the current mixed mode, including:
performing hardware pressure test on a hardware module in the AEP to be tested under the current mixed mode;
performing memory pressure test on a memory module of the AEP to be tested under the current mixed mode;
and the hardware pressure test and the memory pressure test are carried out synchronously.
2. A pressure measurement system of an AEP memory under a mix mode is characterized by comprising:
the memory adjustment strategy unit comprises a group of preset AEP memory adjustment strategies, each AEP memory adjustment strategy is used for adjusting the mode of the AEP memory to be detected to be a mix mode, and the preset AEP memory adjustment strategies are different;
the AEP memory module proportion adjusting unit is used for circularly traversing each AEP memory adjusting strategy contained in the memory adjusting strategy unit based on the preset cycle times; and the memory module is used for circularly adjusting the ratio of the hard disk module and the memory module of the AEP memory to be tested according to each traversed AEP memory adjustment strategy;
the voltage testing unit is used for respectively testing the hardware module and the memory module of the AEP memory to be tested in the current mixed mode after the proportion of the hard disk module and the memory module of the AEP memory to be tested is adjusted by the proportion adjusting unit each time;
the pressure measuring unit comprises:
the first pressure testing module is used for testing hardware pressure of the hardware module of the AEP memory to be tested;
the second pressure testing module is used for testing the memory pressure of the memory module of the AEP memory to be tested;
and the hardware pressure test and the memory pressure test are carried out synchronously.
3. A terminal, comprising:
a processor;
a memory for storing instructions for execution by the processor;
wherein the processor is configured to perform the method of pressure measurement of an AEP memory under mix mode of claim 1.
4. A computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the method of pressure measurement of AEP memory under mix mode of claim 1.
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