CN109388564B - Test method and device and electronic equipment - Google Patents
Test method and device and electronic equipment Download PDFInfo
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- CN109388564B CN109388564B CN201811123148.9A CN201811123148A CN109388564B CN 109388564 B CN109388564 B CN 109388564B CN 201811123148 A CN201811123148 A CN 201811123148A CN 109388564 B CN109388564 B CN 109388564B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
Abstract
The application discloses a testing method, a testing device and electronic equipment thereof, which are used for solving the problem that the testing efficiency is difficult to improve by using the testing method in the prior art. The method comprises the following steps: acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence; determining equipment to be tested matched with the test task according to the test task; determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps; and distributing the testing steps to the associated testing nodes for testing based on the testing flow.
Description
Technical Field
The present application relates to the field of computer technologies, and in particular, to a test method and apparatus, and an electronic device.
Background
At present, when an application installed in a terminal device is automatically tested, an automatic test script is often designed and recorded under an existing automatic test framework based on a test flow and a test scene, and then the test script is operated in series or in parallel on different terminal devices, so that the application installed in the terminal device is tested.
In the related art, because different functional modules in the terminal device are often involved in the test flow, a tester needs to test all the functional modules in the terminal device according to the test flow, and the test efficiency is low.
Therefore, a testing method is needed to improve the testing efficiency.
Disclosure of Invention
The embodiment of the application provides a testing method, a testing device and electronic equipment, and aims to solve the problem that in the prior art, testing efficiency is difficult to improve under the conditions that testing tasks are more and more heavy and personnel cost control is more and more strict.
In order to solve the above technical problem, the embodiment of the present application is implemented as follows:
in a first aspect, a testing method is provided, including:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
and distributing the testing steps to the associated testing nodes for testing based on the testing flow.
In a second aspect, a testing apparatus is provided, comprising:
the device comprises an acquisition unit, a processing unit and a processing unit, wherein the acquisition unit is used for acquiring a test task and a test flow corresponding to the test task, and the test flow comprises a plurality of test steps which are sequentially arranged;
the first determining unit is used for determining the equipment to be tested matched with the testing task according to the testing task;
the second determining unit is used for determining the incidence relation between the testing nodes corresponding to the functional modules in the device to be tested and the testing steps;
and the test unit is used for distributing the test steps to the associated test nodes for testing based on the test flow.
In a third aspect, an electronic device is provided, which includes:
a processor; and
a memory arranged to store computer executable instructions that, when executed, cause the processor to:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
and distributing the testing steps to the associated testing nodes for testing based on the testing flow.
In a fourth aspect, a computer-readable storage medium is presented, the computer-readable storage medium storing one or more programs that, when executed by an electronic device that includes a plurality of application programs, cause the electronic device to:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
and distributing the testing steps to the associated testing nodes for testing based on the testing flow.
The embodiment of the application can at least achieve the following technical effects by adopting the technical scheme:
when a test task is executed, the test task and a test flow corresponding to the test task can be obtained firstly, the test flow comprises a plurality of test steps which are arranged in sequence, equipment to be tested matched with the test task can be determined according to the test task, then the incidence relation between the test nodes corresponding to the functional modules in the equipment to be tested and the test steps is determined, and finally the test steps are distributed to the associated test nodes for testing based on the test flow.
The test flow corresponding to the test task is divided into a plurality of test steps, each test step has an association relation with a test node corresponding to a certain functional module in the device to be tested, and each test node can be responsible for different testers. When the test task is executed, the test node associated with one test step can be switched to the test node associated with the next test step according to the sequence of each test step in the test flow, so that the pipeline test is realized, and the testers corresponding to the test nodes only need to assist in executing the test steps associated with the test nodes in charge of the testers, so that the operation accuracy of each tester can be improved, and the test efficiency is improved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
fig. 1 is a schematic flow chart of an implementation of a testing method provided in an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of an actual scenario of an application of a test method provided in an embodiment of the present specification;
fig. 3 is a schematic flow chart of a testing method applied in an actual scenario according to an embodiment of the present disclosure;
FIG. 4 is a schematic structural diagram of a testing apparatus according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
In order to solve the problem that the testing efficiency is difficult to improve by using the testing method in the prior art, the embodiment of the specification provides a testing method. The execution subject of the test method provided by the embodiment of the present specification may be, but is not limited to, a test terminal or the like capable of being configured to execute at least one of the test apparatuses of the method provided by the embodiment of the present invention.
For convenience of description, the following description will be made of an embodiment of the method, taking the main implementation of the method as an example of a test apparatus capable of implementing the method. It is to be understood that the subject matter of the method is a test apparatus, which is exemplary only, and should not be construed as limiting the method.
Specifically, an implementation flow diagram of a testing method provided by one or more embodiments of the present specification is shown in fig. 1, and includes:
101, acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
because the existing test flow often includes requirement analysis, writing of test cases, recording and executing of test scripts (and the test scripts include a plurality of test steps), and generation of test reports, it is often necessary for a tester to start from the requirement analysis until the test report is generated, which meets the basic requirements of testing, but the energy of a tester is often limited, and the test tasks that can be completed within a preset time are also limited, so that more testers are required to execute more test tasks.
In order to solve the problem, in one or more embodiments of the present disclosure, the testing steps corresponding to the testing process are further refined, that is, each testing step in the testing process is associated with a testing node corresponding to a functional module in the device to be tested, and each testing node is responsible for different testers, so that the testers only need to perform corresponding operations on the testing steps corresponding to the testing nodes responsible for the testing steps in the implementation process of the whole testing task, thereby being capable of performing more testing tasks.
It should be noted that, the test task in one or more embodiments of the present specification is often implemented for a target application on a terminal device, and then when a test node is divided, the test node may be divided based on a logic function module of the target application, for example, a test node may correspond to one or several function modules of the target application, and then a tester corresponding to the test node only needs to be familiar with exceptions that may be encountered by the several function modules of the target application in a test process and is familiar with a corresponding coping strategy, and does not need to fully understand and be familiar with all function modules of the target application involved in a whole test flow, so that the tester has a clear division of labor in the whole test flow and can implement a pipeline test.
optionally, because the device to be tested may often only execute one test task in the same time period, in order to obtain the device to be tested that can execute the test task in the current time period, the device to be tested is matched with the test task, specifically, the device to be tested that is matched with the test task is determined according to the test task, specifically, an idle device may be first obtained from the candidate devices, and then the idle device is determined as the device to be tested that is matched with the test task. The candidate devices are all devices to be tested to execute the test task, and the idle devices are devices which do not execute other test tasks currently in the devices to be tested.
Optionally, if the device to be tested currently executes other test tasks, the test task may be added to a task waiting queue corresponding to the device to be tested; and executing the test task on the device to be tested after the task corresponding to the device to be tested waits for the execution of other test tasks before the test task in the corresponding device to be tested to be completed.
103, determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
optionally, determining an association relationship between the test node corresponding to each functional module in the device to be tested and the test step may specifically include:
firstly, acquiring a functional module corresponding to a testing step;
and then, determining the incidence relation between the test node and the test step based on the preset corresponding relation between the functional module and the test node.
Supposing that the device to be tested includes the devices 1 to 100, the test flow corresponding to the obtained test task a includes 6 test steps, i.e., test step 1 to test step 6, where the test node corresponding to the function module associated in test step 1 is test node a, the test nodes corresponding to the function modules associated in test step 2 are test nodes b and … …, and the test node corresponding to the function module associated in test step 6 is test node f. When the test task a is executed, firstly, the test node a corresponding to the test step 1 is obtained, and then the test step 1 is distributed to the test node a, so that a tester corresponding to the test node a can assist the test step 1 to be executed on the equipment 1 to 100.
And 104, distributing the testing steps to the associated testing nodes for testing based on the testing flow.
Optionally, assuming that the test flow includes a first test step and a second test step that are sequentially executed, distributing the test steps to the associated test nodes for testing based on the test flow, specifically including:
firstly, distributing a first test step to a first test node for testing;
and then, after the first testing step is executed, distributing the second testing step to a second testing node for testing.
Wherein the first test node is associated with the first testing step and the second test node is associated with the second testing step.
Continuing to take the example that the to-be-tested devices include the device 1 to the device 100, and the test task a is taken as an example, after the test step 1 is executed on the device 1 to the device 15, because the test step 1 is followed by the test steps 2 to 5, in order to complete the test task a, first, the test node b associated with the test step 2 may be obtained, and then the test step 2 is distributed to the associated test node b, so that the tester in charge of the test node b can assist the test step 2 to be executed on the device 1 to the device 100, in this process, if the tester needs to perform manual intervention, such as clicking operation or reporting a problem, the tester in charge of the test node b only needs to perform intervention assistance in the process of executing the test step 2.
……
And repeating the steps until the test steps 1 to 6 included in the test flow corresponding to the test task A are executed.
Optionally, because the test fields corresponding to different device attributes are different, for example, the test fields corresponding to different device models are often different, after the device to be tested is matched for the test task, the test fields may be specifically matched for the device to be tested based on the device attributes of the device to be tested; then, a test task is executed on the device to be tested based on the matched test field for the device to be tested. Wherein the device attributes include at least one of: the device model; a system version; a screen resolution; the size of the memory; a network type; the CPU model.
As shown in fig. 2, a schematic diagram of the test method provided in this specification applied to an actual scenario is shown, and in fig. 2, an executed test task is "use case 1: and entering a home page after logging in, wherein the device models of the devices to be tested comprise 10 device models such as Galaxy, Letv3, Honor and the like, the devices to be tested capable of performing the testing task comprise Galaxy, Letv3 and OPPO R9, and the steps requiring manual intervention of testers are' step 3: clicking the blank head portrait at the upper right corner, when executing the test step "step 3", first determining the test node corresponding to the test step "step 3", and when executing "step 3", then flowing the test step to the test node corresponding to the test step, so that the tester corresponding to the test node can assist in completing the test step.
Optionally, in the process of executing the test task on the device to be tested, the device to be tested may also have an exception, that is, a test interrupt, and the following takes the execution of the first test step as an example, and details a processing flow after the exception occurs when the first test step is executed.
If the abnormality occurs in the previous test process, in order to improve the efficiency of processing the abnormality, the first test step is distributed to the first test node for testing, and if the device to be tested is interrupted during the execution of the first test step, the abnormal information occurring in the device to be tested can be acquired; if the historical exception handling record includes the handling process corresponding to the exception information, the exception in the device to be tested can be handled based on the handling process corresponding to the exception information in the historical exception type handling record.
It should be understood that, in the process of executing the first test step by the device to be tested, if an abnormality occurs, the execution of the first test step is interrupted, abnormal information is often returned, and information such as the abnormal test step, the reason of the abnormality, the abnormal system log, and the screen capture when the abnormality occurs in the abnormal information is often present. Because the processing flow for processing the exception is often determined based on the testing step with the exception and the reason of the exception, after the exception information of the device to be tested is obtained, if the historical exception type processing record includes the processing flow corresponding to the exception information, the exception in the device to be tested can be processed based on the processing flow corresponding to the exception information in the historical exception type processing record.
Optionally, in an actual exception handling process, an exception occurring in the terminal to be tested may also occur for the first time, that is, the handling process of the exception is not recorded in the historical exception handling record, in this case, in order to facilitate the next occurrence of the exception, automatic handling may be implemented, that is, manual participation of a tester is not required, and if the historical exception type handling record does not include a handling process corresponding to the exception information, an exception handling interface may be displayed for the tester in charge of the first test node to handle the exception information; then, receiving and recording the processing flow of the abnormal information; and finally, updating the historical abnormal type processing record based on the processing flow of the abnormal information.
If the historical exception type processing record is updated based on the processing flow of the target exception, the processing flow of the exception information can be added to the historical exception type processing record, so that when the exception still occurs next time, the exception can be processed based on the processing flow of the exception recorded in the historical exception type processing record.
As shown in fig. 3, a schematic flow chart of a testing method applied in an actual scenario provided for one or more embodiments of the present specification includes the following main steps:
based on the test requirements, a test task is created, which generally corresponds to a test flow, the test flow includes at least one test step, and each test step corresponds to a functional module.
test fields are set for each test step in the test task, and different device attributes correspond to different test fields.
and acquiring idle equipment from the equipment to be tested, and adding the test task into a task waiting queue of the non-idle equipment if the idle equipment does not exist currently or the non-idle equipment except the idle equipment exists in the equipment to be tested.
matching test fields for each idle device based on the device attribute of each idle device;
specifically, the test nodes associated with each test step may be obtained first, and then the test steps are distributed to the test nodes associated with the test steps in sequence according to the execution sequence of the test steps, so that the tester in charge of the test nodes can assist the corresponding test steps to be executed on the idle device.
if the problem does not need to be reported, step 310 is executed.
after manual intervention by the tester, the continuation of the test task is confirmed by the tester.
that is, it is determined whether there are other testing steps after the currently executed testing step, if it is determined that there are other testing steps after the currently executed testing step, step 35 is continuously executed, and if it is determined that there are no other testing steps after the currently executed testing step, step 312 is executed;
and step 312, finishing the execution and uploading the test report.
When a test task is executed, the test task and a test flow corresponding to the test task can be obtained firstly, the test flow comprises a plurality of test steps which are arranged in sequence, then, equipment to be tested which is matched with the test task can be determined according to the test task, then, the incidence relation between the test node corresponding to each functional module in the equipment to be tested and the test step is determined, and finally, the test step is distributed to the relevant test node for testing based on the test flow.
The test flow corresponding to the test task is divided into a plurality of test steps, each test step has an association relation with a test node corresponding to a certain functional module in the device to be tested, and each test node can be responsible for different testers. When the test task is executed, the test node associated with one test step can be switched to the test node associated with the next test step according to the sequence of each test step in the test flow, so that the pipeline test is realized, and the testers corresponding to the test nodes only need to assist in executing the test steps associated with the test nodes in charge of the testers, so that the operation accuracy of each tester can be improved, and the test efficiency is improved.
Fig. 4 is a schematic structural diagram of a testing apparatus 400 according to an embodiment of the present invention. Referring to fig. 4, in a software implementation, the testing apparatus 400 may include a task obtaining unit 401, a first determining unit 402, a second determining unit 403, and a testing unit 404, wherein:
an obtaining unit 401, configured to obtain a test task and a test flow corresponding to the test task, where the test flow includes multiple test steps arranged in sequence;
a first determining unit 402, configured to determine, according to the test task, a device to be tested that matches the test task;
a second determining unit 403, configured to determine an association relationship between a test node corresponding to each functional module in the device to be tested and the test step;
a testing unit 404, configured to distribute the testing steps to the associated testing nodes for testing based on the testing process.
When a test task is executed, the obtaining unit 401 can first obtain the test task and a test flow corresponding to the test task, and the test flow includes a plurality of test steps arranged in sequence, the first determining unit 402 can determine, according to the test task, a device to be tested that matches the test task, the second determining unit 403 can determine an association relationship between a test node corresponding to each functional module in the device to be tested and the test step, and finally, the test unit 404 distributes the test step to the associated test node for testing based on the test flow.
The test flow corresponding to the test task is divided into a plurality of test steps, each test step has an association relation with a test node corresponding to a certain functional module in the device to be tested, and each test node can be responsible for different testers. When the test task is executed, the test node associated with one test step can be switched to the test node associated with the next test step according to the sequence of each test step in the test flow, so that the pipeline test is realized, and the testers corresponding to the test nodes only need to assist in executing the test steps associated with the test nodes in charge of the testers, so that the operation accuracy of each tester can be improved, and the test efficiency is improved
Optionally, in an embodiment, the first determining unit 402 is configured to:
acquiring idle equipment from the candidate equipment;
and determining the idle device as a device to be tested matched with the test task.
Optionally, in an embodiment, the second determining unit 403 is configured to:
acquiring a functional module corresponding to the testing step;
and determining the incidence relation between the test node and the test step based on the preset corresponding relation between the functional module and the test node.
Optionally, in an embodiment, the test procedure includes a first test step and a second test step that are sequentially performed, and then the test unit 404 is configured to:
distributing the first test step to a first test node for testing;
after the first testing step is executed, distributing the second testing step to a second testing node for testing;
wherein the first test node is associated with the first testing step and the second test node is associated with the second testing step.
Optionally, in an embodiment, after the testing unit 404 distributes the first testing step to the first testing node for testing, the apparatus further includes:
an exception obtaining unit, configured to obtain exception information occurring in the device to be tested if the device to be tested interrupts when the first testing step is executed;
and the exception handling unit is used for handling the exception in the equipment to be tested based on the processing flow corresponding to the exception information in the historical exception type processing record if the historical exception processing record comprises the processing flow corresponding to the exception information.
Optionally, in an embodiment, the apparatus further includes:
the interface providing unit is used for displaying an exception handling interface if the historical exception type handling record does not include the handling process corresponding to the exception information;
the recording unit is used for receiving and recording the processing flow of the abnormal information;
and the updating unit is used for updating the historical abnormal type processing record based on the processing flow of the abnormal information.
Optionally, in an embodiment, the device attribute includes at least one of:
the device model; a system version; a screen resolution; the size of the memory; a network type; the CPU model of the central processing unit.
The testing apparatus 400 can implement the testing method of the embodiment of the method shown in fig. 1 to 3, and reference may be made to the testing method of the embodiment shown in fig. 1 to 3 for details, which are not described again.
Fig. 5 is a schematic structural diagram of an electronic device provided in an embodiment of the present specification. Referring to fig. 5, at a hardware level, the electronic device includes a processor, and optionally further includes an internal bus, a network interface, and a memory. The Memory may include a Memory, such as a Random-Access Memory (RAM), and may further include a non-volatile Memory, such as at least 1 disk Memory. Of course, the electronic device may also include hardware required for other services.
The processor, the network interface, and the memory may be connected to each other via an internal bus, which may be an ISA (Industry Standard Architecture) bus, a PCI (Peripheral Component Interconnect) bus, an EISA (Extended Industry Standard Architecture) bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one double-headed arrow is shown in FIG. 5, but this does not indicate only one bus or one type of bus.
And the memory is used for storing programs. In particular, the program may include program code comprising computer operating instructions. The memory may include both memory and non-volatile storage and provides instructions and data to the processor.
The processor reads the corresponding computer program from the nonvolatile memory into the memory and then runs the computer program to form the test device on the logic level. The processor is used for executing the program stored in the memory and is specifically used for executing the following operations:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
and distributing the testing steps to the associated testing nodes for testing based on the testing flow.
The test method disclosed in the embodiments of fig. 1 to 3 of the present specification can be applied to a processor, or can be implemented by a processor. The processor may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in a processor or instructions in the form of software. The Processor may be a general-purpose Processor, including a Central Processing Unit (CPU), a Network Processor (NP), and the like; but also Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components. The various methods, steps and logic blocks disclosed in one or more embodiments of the present specification may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in connection with one or more embodiments of the present disclosure may be embodied directly in hardware, in a software module executed by a hardware decoding processor, or in a combination of the hardware and software modules executed by a hardware decoding processor. The software module may be located in ram, flash memory, rom, prom, or eprom, registers, etc. storage media as is well known in the art. The storage medium is located in a memory, and a processor reads information in the memory and completes the steps of the method in combination with hardware of the processor.
The electronic device may also perform the testing method of fig. 1 to 3, which is not described herein again.
Of course, besides the software implementation, the electronic device in this specification does not exclude other implementations, such as logic devices or a combination of software and hardware, and the like, that is, the execution subject of the following processing flow is not limited to each logic unit, and may also be hardware or logic devices.
In short, the above description is only a preferred embodiment of the present disclosure, and is not intended to limit the scope of the present disclosure. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of one or more embodiments of the present disclosure should be included in the scope of protection of one or more embodiments of the present disclosure.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions. One typical implementation device is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
Claims (7)
1. A method of testing, comprising:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
distributing the testing steps to the associated testing nodes for testing based on the testing process;
if the test flow includes a first test step and a second test step which are executed in sequence, distributing the test steps to the associated test nodes for testing based on the test flow, including:
distributing the first testing step to a first testing node for testing;
after the first testing step is executed, distributing the second testing step to a second testing node for testing;
wherein the first test node is associated with the first testing step and the second test node is associated with the second testing step;
after distributing the first testing step to a first testing node for testing, the method further comprises:
if the equipment to be tested is abnormal when the first testing step is executed, acquiring abnormal information appearing in the equipment to be tested;
if the historical exception type processing record comprises the processing flow corresponding to the exception information, processing the exception in the device to be tested based on the processing flow corresponding to the exception information in the historical exception type processing record;
after matching the devices to be tested for the test task, firstly, matching test fields for the devices to be tested based on the device attributes of the devices to be tested; then, based on the matched test field of the device to be tested, executing a test task on the device to be tested;
the method further comprises the following steps:
if the historical exception type processing record does not include the processing flow corresponding to the exception information, displaying an exception processing interface;
receiving and recording the processing flow of the abnormal information;
and updating the historical exception type processing record based on the exception information processing flow.
2. The method of claim 1, wherein determining, based on the test task, devices under test that match the test task comprises:
acquiring idle equipment from the candidate equipment;
and determining the idle device as a device to be tested matched with the test task.
3. The method of claim 1, wherein determining the association relationship between the test node corresponding to each functional module in the device under test and the test step comprises:
acquiring a functional module corresponding to the testing step;
and determining the incidence relation between the test node and the test step based on the preset corresponding relation between the functional module and the test node.
4. The method of claim 2, wherein the device attributes comprise at least one of:
the device model; a system version; a screen resolution; the size of the memory; a network type; the CPU model of the central processing unit.
5. A test apparatus, comprising:
the device comprises an acquisition unit, a processing unit and a processing unit, wherein the acquisition unit is used for acquiring a test task and a test flow corresponding to the test task, and the test flow comprises a plurality of test steps which are sequentially arranged;
the first determining unit is used for determining the equipment to be tested matched with the testing task according to the testing task;
the second determining unit is used for determining the incidence relation between the testing nodes corresponding to the functional modules in the device to be tested and the testing steps;
the test unit is used for distributing the test steps to the associated test nodes for testing based on the test flow;
wherein, the test flow includes a first test step and a second test step which are executed in sequence, and then the test unit is used for:
distributing the first testing step to a first testing node for testing;
after the first testing step is executed, distributing the second testing step to a second testing node for testing;
wherein the first test node is associated with the first testing step and the second test node is associated with the second testing step;
after the testing unit distributes the first testing step to the first testing node for testing, the apparatus further includes:
an exception obtaining unit, configured to obtain exception information occurring in the device to be tested if the device to be tested interrupts when the first testing step is executed;
the exception handling unit is used for handling the exception in the equipment to be tested based on the processing flow corresponding to the exception information in the historical exception type processing record if the historical exception type processing record comprises the processing flow corresponding to the exception information;
after matching the devices to be tested for the test task, firstly, matching test fields for the devices to be tested based on the device attributes of the devices to be tested; then, based on the matched test field of the device to be tested, executing a test task on the device to be tested;
the device further comprises:
the interface providing unit is used for displaying an exception handling interface if the historical exception type handling record does not include the handling process corresponding to the exception information;
the recording unit is used for receiving and recording the processing flow of the abnormal information;
and the updating unit is used for updating the historical abnormal type processing record based on the processing flow of the abnormal information.
6. An electronic device, comprising:
a processor; and
a memory arranged to store computer executable instructions that, when executed, cause the processor to:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
distributing the testing steps to the associated testing nodes for testing based on the testing process;
if the test flow includes a first test step and a second test step which are executed in sequence, distributing the test steps to the associated test nodes for testing based on the test flow, including:
distributing the first testing step to a first testing node for testing;
after the first testing step is executed, distributing the second testing step to a second testing node for testing;
wherein the first test node is associated with the first testing step and the second test node is associated with the second testing step;
after distributing the first testing step to a first testing node for testing, the operations further comprise:
if the equipment to be tested is abnormal when the first testing step is executed, acquiring abnormal information appearing in the equipment to be tested;
if the historical exception type processing record comprises the processing flow corresponding to the exception information, processing the exception in the device to be tested based on the processing flow corresponding to the exception information in the historical exception type processing record;
after matching the devices to be tested for the test task, firstly, matching test fields for the devices to be tested based on the device attributes of the devices to be tested; then, based on the matched test field of the device to be tested, executing a test task on the device to be tested;
the operations further include:
if the historical exception type processing record does not include the processing flow corresponding to the exception information, displaying an exception processing interface;
receiving and recording the processing flow of the abnormal information;
and updating the historical exception type processing record based on the exception information processing flow.
7. A computer-readable storage medium storing one or more programs which, when executed by an electronic device including a plurality of application programs, cause the electronic device to:
acquiring a test task and a test flow corresponding to the test task, wherein the test flow comprises a plurality of test steps which are arranged in sequence;
determining equipment to be tested matched with the test task according to the test task;
determining the incidence relation between the test nodes corresponding to the functional modules in the device to be tested and the test steps;
distributing the testing steps to the associated testing nodes for testing based on the testing process; if the test flow includes a first test step and a second test step which are executed in sequence, distributing the test steps to the associated test nodes for testing based on the test flow, including:
distributing the first testing step to a first testing node for testing;
after the first testing step is executed, distributing the second testing step to a second testing node for testing;
wherein the first test node is associated with the first testing step and the second test node is associated with the second testing step;
after distributing the first testing step to a first testing node for testing, the operations further comprise:
if the equipment to be tested is abnormal when the first testing step is executed, acquiring abnormal information appearing in the equipment to be tested;
if the historical exception type processing record comprises the processing flow corresponding to the exception information, processing the exception in the device to be tested based on the processing flow corresponding to the exception information in the historical exception type processing record;
after matching the devices to be tested for the test task, firstly, matching test fields for the devices to be tested based on the device attributes of the devices to be tested; then, based on the matched test field of the device to be tested, executing a test task on the device to be tested;
the operations further include:
if the historical exception type processing record does not include the processing flow corresponding to the exception information, displaying an exception processing interface;
receiving and recording the processing flow of the abnormal information;
and updating the historical exception type processing record based on the exception information processing flow.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101697144A (en) * | 2009-10-28 | 2010-04-21 | 中兴通讯股份有限公司 | Software test method and software test device |
| CN102156673A (en) * | 2011-04-20 | 2011-08-17 | 北京航空航天大学 | Test case description oriented GUI (Graphical User Interface) automatic test system and test method thereof |
| CN105426278A (en) * | 2015-11-20 | 2016-03-23 | 北京畅游天下网络技术有限公司 | Client equipment performance test method and system |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101697144A (en) * | 2009-10-28 | 2010-04-21 | 中兴通讯股份有限公司 | Software test method and software test device |
| CN102156673A (en) * | 2011-04-20 | 2011-08-17 | 北京航空航天大学 | Test case description oriented GUI (Graphical User Interface) automatic test system and test method thereof |
| CN105426278A (en) * | 2015-11-20 | 2016-03-23 | 北京畅游天下网络技术有限公司 | Client equipment performance test method and system |
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