CN109060672A - Systems for optical inspection - Google Patents
Systems for optical inspection Download PDFInfo
- Publication number
- CN109060672A CN109060672A CN201810960876.9A CN201810960876A CN109060672A CN 109060672 A CN109060672 A CN 109060672A CN 201810960876 A CN201810960876 A CN 201810960876A CN 109060672 A CN109060672 A CN 109060672A
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- Prior art keywords
- light
- detection
- detection light
- systems
- turntable
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
Abstract
The present invention relates to a kind of Systems for optical inspection, for being detected to multi-joint card, including Kato, laying drive, detection light source, turntable and the first photosensitive detector；Kato is equipped with multiple detection holes for placing multi-joint card, Kato；Detection light source has detection light that is multiple and being respectively used to transmitting different wave length, and on turntable, turntable can be rotated to drive different detection light sources to turn to check bit multiple detection distribution of light sources；Or, detection light source is white light source, and detection light source is located at check bit, and Systems for optical inspection further includes multiple optical filters being distributed on turntable, turntable can rotate corresponding with check bit to drive different optical filters to turn to, and multiple optical filters are respectively used to selection and pass through the detection light of different wave length；Laying drive is for driving Kato or detection light source so that detection light passes sequentially through multiple detection holes；First photosensitive detector, which is used to detect, to be detected light and arrives at transmitted light or reflected light after multi-joint card.
Description
Technical field
The present invention relates to technical field of optical detection, more particularly to a kind of Systems for optical inspection.
Background technique
With the development of optical detective technology, the more and more test items of field of medicaments pass through absorbance detection, fluorescence
The optical technologies such as detection are detected.The Detection wavelength as used in the different detection projects of sample is different, in order to mention
High efficiency, reduces sample size acquisition, and a variety of Testing index (are concentrated on a card, while carried out to sample by multi-joint card
Many index detection testing product) using more and more extensive.
Mostly position arrangement is fixed by using the LED of different emission wavelengths in traditional multi-joint card detecting instrument, corresponding
The each detection hole location of multi-joint card only has a kind of Detection wavelength, and a kind of instrument can only often detect a kind of the multi-joint of fixed projects combo
Card, narrow application range.
Summary of the invention
Based on this, it is necessary to provide a kind of optical detection system of multi-joint card that can be suitable for the combination of a variety of detection projects
System.
A kind of Systems for optical inspection, for detecting to multi-joint card, the Systems for optical inspection includes Kato, detection light
Source, turntable, laying drive and the first photosensitive detector；
The Kato is equipped with multiple detection holes, multiple detection hole difference for placing the multi-joint card, the Kato
Multiple detection zones of the corresponding multi-joint card；
The detection light source has detection light that is multiple and being respectively used to transmitting different wave length, multiple detection light sources point
On the turntable, the turntable can be rotated to drive the different detection light sources to turn to check bit cloth；Alternatively, described
Detection light source is white light source, and the detection light source is located at check bit, and the Systems for optical inspection further includes multiple optical filters, more
A optical filter is distributed on the turntable, and the turntable can be rotated to drive the different optical filters to turn to and institute
It states check bit to correspond to, multiple optical filters are respectively used to be filtered the white light of the detection light source transmitting and select to pass through
The detection light of different wave length；
The laying drive is for driving the Kato or the detection light source so that the detection light passes sequentially through
Multiple detection holes；
First photosensitive detector is used to detect the detection light and arrives at transmitted light or anti-after the multi-joint card
Penetrate light.
Multiple detection light sources are distributed on the turntable in round in one of the embodiments, and along clockwise
Direction or counter clockwise direction, the wavelength for the detection light that multiple detection light sources are emitted are corresponding in turn to suitable on the multi-joint card
Wavelength needed for multiple detection zones of secondary arrangement；Alternatively, multiple optical filters are distributed on the turntable in round,
And clockwise or counterclockwise, multiple optical filters allow by detection light wavelength be corresponding in turn to it is described
Wavelength needed for the multiple detection zones being sequentially arranged on multi-joint card.
The Systems for optical inspection further includes the first Amici prism and the second photosensitive detection in one of the embodiments,
Device, first Amici prism are arranged between the detection light source and the Kato, first Amici prism and the inspection
Location is corresponding to separate light splitting light from the detection light, and second photosensitive detector is for detecting the light splitting light.
The light splitting light is vertical with the detection light in one of the embodiments,.
The Systems for optical inspection further includes the second Amici prism in one of the embodiments, the second light splitting rib
Mirror is used to separate the light in the same direction with the detection light from the light splitting light.
Second Amici prism has multiple in one of the embodiments, and multiple Amici prisms are along the light splitting
Light arrangement.
The Systems for optical inspection further includes light barrier in one of the embodiments, and the light barrier is arranged described
Between turntable and the Kato, the light barrier is equipped with the first light hole, and first light hole is corresponding with the check bit.
The detection hole aperture can be passed through when the detection light passes through the detection hole in one of the embodiments,
It is imaged on the multi-joint card and forms hot spot.
First photosensitive detector has multiple in one of the embodiments, and multiple first photosensitive detectors are used
Reflected light after detecting the detection light and arriving at the multi-joint card, multiple first photosensitive detectors are with the detection
Light is centrosymmetric distribution.
The Systems for optical inspection further includes detector pallet in one of the embodiments, and multiple described first is photosensitive
Detector is arranged on the detector pallet, and the detector pallet is equipped with the second light hole, second light hole and institute
It is corresponding to state check bit.
First photosensitive detector is semi-integral ball in one of the embodiments, on first photosensitive detector
Equipped with third light hole, the third light hole is corresponding with the check bit, and first photosensitive detector is arranged in the card
Depend on the side of the nearly detection light source.
Compared with existing scheme, the invention has the following advantages:
Above-mentioned Systems for optical inspection can be driven Kato or detection light source by laying drive so that detection light passes sequentially through
Multiple detection holes select the detection light of different wave length to carry out light respectively to the different detection zones of multi-joint card by rotation turntable
Detection is learned, so as to be suitable for the multi-joint card of a variety of detection projects combination.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the Systems for optical inspection of an embodiment；
Fig. 2 is the partial structural diagram of the Systems for optical inspection of another embodiment；
Fig. 3 is the partial structural diagram of the Systems for optical inspection of another embodiment；
Fig. 4 is the structural schematic diagram of the first photosensitive detector of an embodiment.
Specific embodiment
To facilitate the understanding of the present invention, a more comprehensive description of the invention is given in the following sections with reference to the relevant attached drawings.In attached drawing
Give presently preferred embodiments of the present invention.But the invention can be realized in many different forms, however it is not limited to this paper institute
The embodiment of description.On the contrary, purpose of providing these embodiments is keeps the understanding to the disclosure more thorough
Comprehensively.
It should be noted that it can directly on the other element when element is referred to as " being fixed on " another element
Or there may also be elements placed in the middle.When an element is considered as " connection " another element, it, which can be, is directly connected to
To another element or it may be simultaneously present centering elements.
Unless otherwise defined, all technical and scientific terms used herein and belong to technical field of the invention
The normally understood meaning of technical staff is identical.Term as used herein in the specification of the present invention is intended merely to description tool
The purpose of the embodiment of body, it is not intended that in the limitation present invention.Term as used herein "and/or" includes one or more phases
Any and all combinations of the listed item of pass.
As shown in Figure 1, the Systems for optical inspection 10 of one embodiment of the invention, for being detected to multi-joint card 20, including
Kato 100, detection light source 200, turntable 300, laying drive (not shown) and the first photosensitive detector 400.
Kato 100 is equipped with multiple detection holes 120 for placing multi-joint card 20, Kato 100, and multiple correspondences of detection hole 120 are more
Multiple detection zones of connection card 20.
Referring to Figure 1, detection light source 200 has multiple, and multiple detection light sources 200 are respectively used to the detection of transmitting different wave length
Light, multiple detection light sources 200 are distributed on turntable 300, and turntable 300 can be rotated to drive 200 turns of different detection light sources
Move to check bit can be switched different detection light sources 200 and examines along check bit towards multi-joint 20 transmitting of card that is, by rotation turntable 300
Survey light；Alternatively, detection light source 200 is located at check bit, optical detection system referring to Fig. 2, detection light source 200 is white light source
System 10 further includes multiple optical filters 500, and multiple optical filters 500 are distributed on turntable 300, and turntable 300 can be rotated to drive not
With optical filter 500 turn to it is corresponding with check bit, multiple optical filters 500 be respectively used to detection light source 200 transmitting white light
It is filtered and selects the detection light by different wave length.
Laying drive is for driving Kato 100 or detection light source 200 so that detection light passes sequentially through multiple detection holes
120。
First photosensitive detector 400 is used to detect detection light and arrives at the multi-joint transmitted light or reflected light blocked after 20, will
Optical signal is converted into electric signal output.
In a wherein example, laying drive is connect to drive the movement of Kato 100 so that multiple detections with Kato 100
Hole 120 is successively corresponding with check bit position.
Wherein, detection light source 200 may be selected but be not limited to LED light source.
In a wherein example, Systems for optical inspection 10 should include rotary driver (not shown), and rotary driver is used
It is rotated in driving turntable 300.
In the set-up mode of detection light that multiple detection light sources 200 are respectively used to transmitting different wave length, it can examine
It surveys on light source 200 and is arranged light source sleeve 600, avoid the interference between the detection light of different wave length and influence detection accuracy.
In a wherein example, Systems for optical inspection 10 further includes light barrier 700, and light barrier 700 is arranged in turntable 300
Between Kato 100, light barrier 700 is equipped with the first light hole 620, and the first light hole 620 is corresponding with check bit.It is arranged light-blocking
Plate 700, so that only detection light corresponding with check bit passes through.
In a wherein example, multiple detection light sources 200 are distributed on turntable 300 in round, and along clockwise direction
Or counterclockwise, wave needed for the wavelength of multiple detection light sources is corresponding in turn to the multiple detection zones being sequentially arranged on multi-joint card
It is long；Alternatively, multiple optical filters are distributed on turntable in round, and clockwise or counterclockwise, multiple optical filters are permitted
Perhaps wavelength needed for the wavelength of the detection light passed through is corresponding in turn to the multiple detection zones being sequentially arranged on multi-joint card.Originally showing
In example, when laying drive driving Kato travel forward a step make next detection hole reach check bit when, turntable rotation one
It walks so that detection light corresponding with detection zone arrives at detection zone, when can reduce software design difficulty, and save detection
Between, and avoid the operating time too long and influence the accuracy of postorder detection zone measurement result.
In a wherein example, Systems for optical inspection 10 further includes the first Amici prism 700 and the second photosensitive detector
800, for the setting of the first Amici prism 700 between detection light source 200 and Kato 100, the first Amici prism 700 is corresponding with check bit
To separate light splitting light from detection light, the second photosensitive detector 800 is for detecting light splitting light.Pass through the second photosensitive detector
The luminous intensity of 800 monitoring LED, can guarantee the consistency of luminous intensity by correcting, improve measuring stability.
Further, in a wherein example, light splitting light is vertical with detection light.
Further, incorporated by reference to Fig. 3, in a wherein example, Systems for optical inspection 10 further includes the second Amici prism
900, the second Amici prism 900 is used to separate the light in the same direction with detection light from light splitting light, to can realize that multichannel is examined
It surveys.Further, the second Amici prism 900 has multiple, and multiple Amici prisms are along light splitting light arrangement.
In a wherein example, design detection hole 120 size, enable detection light after testing hole 120 when
Hot spot is formed on multi-joint card 20 by pinhole imaging system.
Further, in a wherein example, the first photosensitive detector 400 has multiple, multiple first photosensitive detectors 400
For detecting the reflected light after detection light arrives at multi-joint card 20, multiple first photosensitive detectors 400 are to detect during light is in
The heart is symmetrical.It is detected by multiple the first symmetrical photosensitive detectors 400, detection error can be reduced, improve inspection
The accuracy of survey.In the present embodiment, Systems for optical inspection 10 further includes detector pallet 1000, multiple first photosensitive detectors
400 are arranged on detector pallet 1000, and detector pallet 1000 is equipped with the second light hole 1020, the second light hole 1020 and inspection
Location is corresponding.
As shown in figure 4, in another embodiment, the first photosensitive detector 400 is semi-integral ball, the first photosensitive detector
400 are equipped with third light hole (not shown), and third light hole is corresponding with check bit, and the first photosensitive detector 400 is arranged in card
Support 100 is close to the side of detection light source 200.
In a wherein example, Systems for optical inspection 10 further includes fixed bracket 1100, turntable 300,700 and of light barrier
Detector pallet 1000 is arranged on fixed bracket 1100.In this example, laying drive can be with fixed bracket 1100
Connection is to drive fixed bracket 1100 to move, so that detection light be made to pass sequentially through multiple detection holes 120.
Above-mentioned Systems for optical inspection 10 can be driven Kato or detection light source by laying drive so that detection light successively leads to
Multiple detection holes are crossed, select the detection light of different wave length to the different detection zones point of multi-joint card 20 by rotation turntable 300
Not carry out optical detection, so as to be suitable for a variety of detection projects combination multi-joint card.
Currently used multi-wavelength instrument mostly uses the mode of rotating shutter to select different wave length, but the side of rotating shutter
Formula is high for the required precision of structure, so that grating and cost of light source are high, and big using light source power consumption, need to design heat dissipation knot
Structure.Above-mentioned Systems for optical inspection 10, structure is simple, size is small, structure precision requirement is low, at low cost, and device power consumption is low, is not necessarily to
Additional heat structure.
Above-mentioned Systems for optical inspection 10 can flexibly realize that fast moving for more detection holes is converted with optical source wavelength, save inspection
The time is surveyed, and avoids the operating time too long and influences the accuracy of postorder detection zone measurement result.
Above-mentioned Systems for optical inspection 10, is applicable to the detection schemes such as absorbance, fluorescence and light-induced chemiluminescent.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (10)
1. a kind of Systems for optical inspection, for being detected to multi-joint card, which is characterized in that including Kato, detection light source, turn
Disk, laying drive and the first photosensitive detector；
The Kato is equipped with multiple detection holes for placing the multi-joint card, the Kato, and multiple detection holes respectively correspond
Multiple detection zones of the multi-joint card；
The detection light source has detection light that is multiple and being respectively used to transmitting different wave length, and multiple detection distribution of light sources exist
On the turntable, the turntable can be rotated to drive the different detection light sources to turn to check bit；Alternatively, the detection
Light source is white light source, and the detection light source is located at check bit, and the Systems for optical inspection further includes multiple optical filters, Duo Gesuo
It states optical filter to be distributed on the turntable, the turntable can be rotated to drive the different optical filters to turn to and the inspection
Location is corresponding, and multiple optical filters are respectively used to be filtered the white light of the detection light source transmitting and select to pass through difference
The detection light of wavelength；
The laying drive for drive the Kato or the detection light source so that the detection light pass sequentially through it is multiple
The detection hole；
First photosensitive detector is used to detect the detection light and arrives at transmitted light or reflected light after the multi-joint card.
2. Systems for optical inspection as described in claim 1, which is characterized in that multiple detection light sources are on the turntable
Round distribution, and clockwise or counterclockwise, the wavelength of the detection light that multiple detection light sources are emitted according to
Wavelength needed for the multiple detection zones being sequentially arranged on the secondary correspondence multi-joint card；Alternatively, multiple optical filters exist
Be distributed on the turntable in round, and clockwise or counterclockwise, multiple optical filters allow by detection
Wavelength needed for the wavelength of light is corresponding in turn to the multiple detection zones being sequentially arranged on the multi-joint card.
3. Systems for optical inspection as described in claim 1, which is characterized in that further include the first Amici prism and the second photosensitive inspection
Survey device, first Amici prism is arranged between the detection light source and the Kato, first Amici prism with it is described
Check bit is corresponding to separate light splitting light from the detection light, and second photosensitive detector is for detecting the light splitting light
Line.
4. Systems for optical inspection as claimed in claim 3, which is characterized in that the light splitting light and the detection light hang down
Directly.
5. Systems for optical inspection as claimed in claim 4, which is characterized in that it further include the second Amici prism, described second point
Light prism is used to separate the light in the same direction with the detection light from the light splitting light.
6. Systems for optical inspection as claimed in claim 5, which is characterized in that second Amici prism has multiple, Duo Gesuo
Amici prism is stated to arrange along the light splitting light.
7. Systems for optical inspection as described in claim 1, which is characterized in that the Systems for optical inspection further includes light barrier,
The light barrier is arranged between the turntable and the Kato, and the light barrier is equipped with the first light hole, and described first is logical
Unthreaded hole is corresponding with the check bit.
8. Systems for optical inspection as described in any one of claims 1 to 7, which is characterized in that described in the detection light passes through
When detection hole hot spot can be formed on the multi-joint card by the detection hole pinhole imaging system.
9. Systems for optical inspection as claimed in claim 8, which is characterized in that first photosensitive detector have it is multiple, it is multiple
First photosensitive detector is used to detect the detection light and arrives at reflected light after the multi-joint card, and multiple described first
Photosensitive detector is centrosymmetric distribution with the detection light.
10. Systems for optical inspection as claimed in claim 9, which is characterized in that it further include detector pallet, multiple described first
Photosensitive detector is arranged on the detector pallet, and the detector pallet is equipped with the second light hole, second light hole
It is corresponding with the check bit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810960876.9A CN109060672A (en) | 2018-08-22 | 2018-08-22 | Systems for optical inspection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810960876.9A CN109060672A (en) | 2018-08-22 | 2018-08-22 | Systems for optical inspection |
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| Publication Number | Publication Date |
|---|---|
| CN109060672A true CN109060672A (en) | 2018-12-21 |
Family
ID=64686814
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| CN201810960876.9A Pending CN109060672A (en) | 2018-08-22 | 2018-08-22 | Systems for optical inspection |
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Cited By (2)
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| CN110108449A (en) * | 2019-06-26 | 2019-08-09 | 深圳市楠轩光电科技有限公司 | A kind of optics module test macro and method |
| WO2021169822A1 (en) * | 2020-02-25 | 2021-09-02 | 上海交通大学 | Imaging system suitable for multi-detection of biomolecule |
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