CN108954025B - Light source structure and equipment using same - Google Patents

Light source structure and equipment using same Download PDF

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Publication number
CN108954025B
CN108954025B CN201810976732.2A CN201810976732A CN108954025B CN 108954025 B CN108954025 B CN 108954025B CN 201810976732 A CN201810976732 A CN 201810976732A CN 108954025 B CN108954025 B CN 108954025B
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light
emitting
semiconductor substrate
source structure
light source
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CN108954025A (en
Inventor
王小明
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Shenzhen Fushi Technology Co Ltd
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Shenzhen Fushi Technology Co Ltd
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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0927Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00Scenes; Scene-specific elements
    • G06V20/60Type of objects
    • G06V20/64Three-dimensional objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21KNON-ELECTRIC LIGHT SOURCES USING LUMINESCENCE; LIGHT SOURCES USING ELECTROCHEMILUMINESCENCE; LIGHT SOURCES USING CHARGES OF COMBUSTIBLE MATERIAL; LIGHT SOURCES USING SEMICONDUCTOR DEVICES AS LIGHT-GENERATING ELEMENTS; LIGHT SOURCES NOT OTHERWISE PROVIDED FOR
    • F21K9/00Light sources using semiconductor devices as light-generating elements, e.g. using light-emitting diodes [LED] or lasers
    • F21K9/20Light sources comprising attachment means
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00Projectors or projection-type viewers; Accessories therefor
    • G03B21/14Details
    • G03B21/20Lamp housings
    • G03B21/2006Lamp housings characterised by the light source
    • G03B21/2013Plural light sources
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B15/00Special procedures for taking photographs; Apparatus therefor
    • G03B15/02Illuminating scene
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21VFUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V19/00Fastening of light sources or lamp holders
    • F21V19/001Fastening of light sources or lamp holders the light sources being semiconductors devices, e.g. LEDs
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21VFUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V23/00Arrangement of electric circuit elements in or on lighting devices
    • F21V23/04Arrangement of electric circuit elements in or on lighting devices the elements being switches
    • F21V23/0442Arrangement of electric circuit elements in or on lighting devices the elements being switches activated by means of a sensor, e.g. motion or photodetectors
    • F21V23/0471Arrangement of electric circuit elements in or on lighting devices the elements being switches activated by means of a sensor, e.g. motion or photodetectors the sensor detecting the proximity, the presence or the movement of an object or a person
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21VFUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V5/00Refractors for light sources
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254Projection of a pattern, viewing through a pattern, e.g. moiré
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0938Using specific optical elements
    • G02B27/0944Diffractive optical elements, e.g. gratings, holograms
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0938Using specific optical elements
    • G02B27/095Refractive optical elements
    • G02B27/0955Lenses
    • G02B27/0961Lens arrays
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00Projectors or projection-type viewers; Accessories therefor
    • G03B21/14Details
    • G03B21/20Lamp housings
    • G03B21/2006Lamp housings characterised by the light source
    • G03B21/2033LED or laser light sources
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00Projectors or projection-type viewers; Accessories therefor
    • G03B21/14Details
    • G03B21/20Lamp housings
    • G03B21/206Control of light source other than position or intensity
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B21/00Projectors or projection-type viewers; Accessories therefor
    • G03B21/14Details
    • G03B21/20Lamp housings
    • G03B21/208Homogenising, shaping of the illumination light
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/10Image acquisition
    • G06V10/12Details of acquisition arrangements; Constructional details thereof
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/16Human faces, e.g. facial parts, sketches or expressions
    • G06V40/161Detection; Localisation; Normalisation
    • G06V40/166Detection; Localisation; Normalisation using acquisition arrangements
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/16Human faces, e.g. facial parts, sketches or expressions
    • G06V40/174Facial expression recognition
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21YINDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
    • F21Y2115/00Light-generating elements of semiconductor light sources
    • F21Y2115/30Semiconductor lasers

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Oral & Maxillofacial Surgery (AREA)
  • Human Computer Interaction (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)

Abstract

The application is applicable to the technical field of optics and electronics, and provides a light source structure which is used for emitting light beams to a detected object for sensing and identifying. The light source structure comprises a first emitting part for emitting a first light beam and a second emitting part for emitting a second light beam. The first light beam is used for forming a floodlight beam with uniform light intensity distribution. The second light beam is used for forming a pattern light beam capable of projecting a preset pattern on the measured object. The first and second emitting portions are formed on the same semiconductor substrate or connected to each other to be integrated into a unitary structure. The application also provides a device using the light source structure.

Description

Light source structure and equipment using same
Technical Field
The application belongs to the technical field of optics, and particularly relates to a light source structure and equipment using the same.
Background
Existing three-dimensional (Three Dimensional, 3D) sensing modules typically require separate placement of flood emitters and light pattern emitters to cooperate to achieve 3D sensing. However, the separately provided floodlight emitters and light pattern emitters not only increase costs, but also occupy a large volume, which affects the miniaturized design using the 3D sensing module device.
Disclosure of Invention
The technical problem to be solved in the application is to provide a light source structure and equipment using the light source structure, which can integrate floodlight and light pattern projection functions to achieve the beneficial effects of miniaturization and cost reduction.
The embodiment of the application provides a light source structure which is used for emitting a light beam to a detected object for sensing. The light source structure comprises a first emitting part for emitting a first light beam and a second emitting part for emitting a second light beam. The first light beam is used for forming a floodlight beam with uniform light intensity distribution. The second light beam is used for forming a pattern light beam capable of projecting a preset pattern on the measured object. The first and second emitting portions are formed on the same semiconductor substrate or connected to each other to be integrated into a unitary structure.
In some embodiments, the first emitting portion includes a plurality of first light emitters for emitting a first light beam. The second emitting part includes a plurality of second luminous bodies for emitting a second light beam. The first and second light emitters are formed on the same semiconductor substrate and can be controlled to emit light independently, respectively. The semiconductor substrate is defined with a first light-emitting area positioned in the middle of the semiconductor substrate and a second light-emitting area arranged around the first light-emitting area.
In some embodiments, the first light emitters are uniformly distributed on the semiconductor substrate at predetermined uniform intervals. The second light emitters are irregularly distributed on the semiconductor substrate or uniformly distributed at preset same intervals.
In some embodiments, the first light emitter is formed within a first light emitting region of the semiconductor substrate. The second light emitter is formed in a second light emitting region of the semiconductor substrate.
In some embodiments, the first light emitter is formed within the second light emitting region of the semiconductor substrate. The second light emitter is formed in the first light emitting region of the semiconductor substrate.
In certain embodiments, the first light emitting region is rectangular. The second light-emitting areas are correspondingly arranged at four corners of the first light-emitting area.
In some embodiments, the second light emitting region is a frame-shaped region surrounding the first light emitting region one turn outside the first light emitting region. The minimum distance D between the first light-emitting area and the second light-emitting area meets the conditionWherein H is the distance between the light emitting surface of the light source structure and the first optical element arranged above the light source structure in sequence, and θ is the maximum divergence angle of the light beam emitted from the first light emitting region and the second light emitting region.
In some embodiments, the first light emitting region is rectangular in shape at the middle of the semiconductor substrate. The second light emitting region is a region other than the first light emitting region on the surface of the semiconductor substrate on which the light emitter is formed.
In some embodiments, the first emitting portion includes a first light emitter and a light guide plate formed on a first semiconductor substrate. The light guide plate comprises a light incident surface and a light emergent surface. The first illuminant is arranged corresponding to the light incident surface of the light guide plate. The second emission part is arranged in the middle of the light emitting surface of the light guide plate. The second emitting part comprises one or more second light emitters formed on a second semiconductor substrate.
In certain embodiments, the plurality of second emitters is irregularly distributed on the second semiconductor substrate.
In some embodiments, the plurality of second light emitters are uniformly arranged at the same intervals on the second semiconductor substrate.
In some embodiments, the second emission part includes a second light emitter formed in a middle of the semiconductor substrate. The first emitting part comprises a plurality of first luminous bodies symmetrically distributed around the first luminous body. The first light emitter and the second light emitter are formed on the same semiconductor substrate and are controlled to emit light independently. The first illuminant and the second illuminant are both single-hole broad-face type vertical cavity surface emitting lasers.
In some embodiments, the second emission part includes a plurality of second light emitters irregularly distributed in a central portion of the semiconductor substrate. The first emitting part comprises a plurality of first light emitters which are symmetrically distributed around the area where the plurality of second light emitters are located. The first light emitter and the second light emitter are formed on the same semiconductor substrate and are controlled to emit light independently. The first illuminant is a single-hole broad-face type vertical cavity surface emitting laser. The second illuminant is an illuminant array composed of a plurality of vertical cavity surface emitting lasers.
In some embodiments, the light emitting surface of the single-hole broad-surface type vertical cavity surface emitting laser of the first light emitter may be rectangular or rectangular frame-shaped.
The embodiment of the application also provides equipment which comprises a sensing device for sensing the three-dimensional information of the detected object. The sensing device comprises an optical projection module and a sensing module. The optical projection module comprises a light beam modulating element and the light source structure according to any one of the embodiments. The sensing module senses three-dimensional information of the detected object by analyzing the change condition of the preset pattern projected on the detected object along with the three-dimensional shape of the detected object. The device executes corresponding functions according to the three-dimensional information of the detected object sensed by the sensing device.
In some embodiments, the corresponding functions include any one or more of unlocking after identifying the identity of the user, paying, starting a preset application program, avoiding an obstacle, and judging the emotion and health condition of the user by using a deep learning technology after identifying the facial expression of the user.
The light source structure provided by the embodiment of the application integrates the emitter for projecting the floodlight beam and the pattern beam, so that the size is smaller, the appearance design of the device is facilitated, and the cost of the device is further reduced.
Additional aspects and advantages of embodiments of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of embodiments of the application.
Drawings
Fig. 1 is a top view of a light source structure provided in a first embodiment of the present application.
Fig. 2 is a top view of a light source structure provided in a second embodiment of the present application.
Fig. 3 is a top view of a light source structure provided in a third embodiment of the present application.
Fig. 4 is a cross-sectional view of the light source structure of fig. 3 taken along line IV-IV and a schematic view of the light source structure in positional relationship with a first optical element arranged in sequence above.
Fig. 5 is a top view of a light source structure provided in a fourth embodiment of the present application.
Fig. 6 is a top view of a light source structure provided in a fifth embodiment of the present application.
Fig. 7 is a top view of a light source structure provided in a sixth embodiment of the present application.
Fig. 8 is a cross-sectional view of the light source structure of fig. 7 taken along line VIII-VIII.
Fig. 9 is a top view of a light source structure provided in a seventh embodiment of the present application.
Fig. 10 is a top view of a light source structure provided in an eighth embodiment of the present application.
Fig. 11 is a schematic structural diagram of an optical projection module according to a ninth embodiment of the present disclosure.
FIG. 12 is a schematic diagram showing the light beam modulating element structure of the optical projection module shown in FIG. 11 according to the light source structure.
Fig. 13 is a schematic diagram of a detection circuit on a transparent substrate of a beam modulating element of the optical projection module of fig. 11.
Fig. 14 is a schematic structural diagram of an optical projection module according to a tenth embodiment of the present application.
Fig. 15 is a schematic structural diagram of an optical projection module according to an eleventh embodiment of the present application.
Fig. 16 is a schematic structural diagram of a sensing device according to a twelfth embodiment of the present application.
Fig. 17 is a functional block diagram of the sensing device shown in fig. 16.
Fig. 18 is a schematic structural view of an apparatus provided in a thirteenth embodiment of the present application.
Detailed Description
The present patent application claims domestic priority from the prior application having application date 2018, 7, 30, 201810854491.4, entitled "light source structure, optical projection module, biometric device, and apparatus", the entire contents of which are incorporated herein by reference.
Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application. In the description of the present application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and are not to be interpreted as indicating or implying a relative importance or order of such features. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more of the described feature. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the description of the present application, it should be noted that, unless explicitly specified or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically connected, electrically connected or communicated with each other; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements or interaction relationship between the two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
The following disclosure provides many different embodiments or examples for implementing different structures of the application. In order to simplify the disclosure of this application, only the components and settings of a particular example are described below. Of course, they are merely examples and are not intended to limit the present application. Furthermore, the use of reference numerals and/or letters in the various examples is repeated herein for the purpose of simplicity and clarity of presentation and is not in itself an indication of a particular relationship between the various embodiments and/or settings discussed. In addition, the various specific processes and materials provided in the following description of the present application are merely examples of implementing the technical solutions of the present application, but one of ordinary skill in the art should recognize that the technical solutions of the present application may also be implemented by other processes and/or other materials not described below.
Further, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to provide a thorough understanding of embodiments of the present application. It will be appreciated, however, by one skilled in the art that the subject matter of the present application may be practiced without one or more of the specific details, or with other structures, components, etc. In other instances, well-known structures or operations are not shown or described in detail to avoid obscuring aspects of the application.
It should be understood that the embodiments and/or methods described herein are exemplary in nature and should not be construed as limiting the application's solution. The embodiments or methods described herein are only one or more of numerous technical solutions covered by the technical ideas related to the present application, and thus, the steps of the described method technical solutions may be performed in the order indicated, may be performed in other orders, may be performed simultaneously, or may be omitted in some cases, and all the above modifications should be considered as being covered by the technical solutions claimed in the present application.
As shown in fig. 1, a first embodiment of the present application provides a light source structure 1 for emitting a light beam onto a target object to be measured for sensing. The light beam may be a light beam having a specific wavelength according to a sensing principle and an application scene. In this embodiment, the light beam is used to sense three-dimensional information of the measured object, and may be an infrared or near-infrared wavelength light beam with a wavelength ranging from 750 nanometers (nm) to 1650nm.
The light source structure 1 includes a first emission portion 10 and a second emission portion 12. The first emitting part 10 emits a first light beam for forming a floodlight beam having a uniform light intensity distribution. The floodlight beam is projected onto the detected object and used for sensing a floodlight image of the detected object. For example, the floodlight beam can be used to sense whether the detected object is a human face. The second light beam emitted by the second emitting part 12 is used for forming a pattern light beam capable of projecting a preset pattern on the measured object. The preset pattern may be used to sense three-dimensional information of the measured object.
The first and second transmitting parts 10 and 12 are formed on the same substrate 14 or connected to each other to be integrated into a unitary structure. The semiconductor substrate 14 defines a first light emitting region 122 in the middle of the semiconductor substrate 14 and a second light emitting region 102 disposed around the first light emitting region 122.
The integration of the first transmitting part 10 and the second transmitting part 12 includes direct connection, indirect connection, or respectively formed on the same substrate 14, etc. In this embodiment, the first light beam and the second light beam are near infrared light beams having the same wavelength.
In this embodiment, the first emitting part 10 includes a plurality of first light emitters 100 for emitting a first light beam. The second emitting part 12 includes a plurality of second luminous bodies 120 for emitting a second light beam. The first light emitter 100 and the second light emitter 120 are formed on the same semiconductor substrate 14. The first light emitters 100 are uniformly distributed at predetermined uniform intervals in the second light emitting region 102 of the semiconductor substrate 14. The second light emitters 120 are irregularly distributed within the first light emitting region 122 of the semiconductor substrate 14.
The first light emitter 100 and the second light emitter 120 may be semiconductor lasers. Preferably, in the present embodiment, the first light emitter 100 and the second light emitter 120 are vertical cavity surface emitting lasers (Vertical Cavity Surface Emitting Laser, VCSELs) fabricated on the semiconductor substrate 14 by photolithography and etching processes. The floodlight beam emitted by the first illuminant 100 and the pattern light beam emitted by the second illuminant 120 are infrared or near infrared light with the same wavelength, and the wavelength range is 750nm to 1650nm.
In this embodiment, the first light emitting region 122 located in the middle of the semiconductor substrate 14 is rectangular. The second light emitting areas 102 are correspondingly arranged at four corners of the first light emitting area 122. The first light-emitting body 100 is uniformly arranged in multiple layers at the same interval along two sides of each corner of the second light-emitting area 102 at four corners of the second light-emitting area 102, and the first light-emitting area 122 is a strip-shaped area of four right-angle frames surrounding each right angle of the first light-emitting area 102 and surrounded by the dotted line in fig. 1. The second light emitters 102 are irregularly arranged in the first light emitting region 122 for emitting a second light beam having an irregularly distributed pattern.
The semiconductor substrate 14 is provided with a first pad 104 connected to an external circuit for controlling light emission of the light emitting body in the first light emitting region 122. The semiconductor substrate 14 is provided with a second pad 124 connected to an external circuit for controlling light emission of the light emitting body in the second light emitting region 102. Therefore, in the present embodiment, the second light emitting body 120 located in the first light emitting region 122 and the first light emitting body 100 located in the second light emitting region 102 can be independently operated by different control signals.
As shown in fig. 2, the second embodiment of the present application provides a light source structure 2, which is substantially the same as the light source structure 1 of the first embodiment, except that the first light emitters 200 are uniformly distributed in the first light emitting region 222 at preset same intervals. The second light emitters 220 are irregularly distributed in the second light emitting region 202.
Referring to fig. 3 and 4 together, a third embodiment of the present application provides a light source structure 3, which is substantially the same as the light source structure 1 in the first embodiment, and is different in that the second light emitting region 302 is a frame-shaped region surrounding the first light emitting region 322 around the first light emitting region 322. The minimum distance D between the second light emitting area 302 and the first light emitting area 322 should be such that the light beam emitted from the first light emitting area 322 and the light beam emitted from the second light emitting area 302 do not intersect each other before reaching the first optical element 31 arranged in sequence above the light source structure 3.
Due to a certain degree of error in the manufacturing process, the first illuminant300 cannot be exactly the same as the divergence angle of the light beam emitted by the second illuminant 320, but is within a predetermined divergence angle range. Since the larger the divergence angle of the light beams emitted from the first light emitter 300 and the second light emitter 320, the larger the distance D between the first light emitting area 322 and the second light emitting area 302 is required to be in order to meet the requirement that the light beams emitted from the first light emitting area 322 and the second light emitting area 302 do not meet, on the premise that the distance between the light source structure 3 and the first optical element 31 arranged above in sequence is kept unchanged. Assuming that the maximum divergence angle of the light beams emitted from the first light emitting region 322 and the second light emitting region 302 is θ, the distance between the light emitting surface of the light source structure 3 and the first optical element 31 disposed above the light emitting surface in sequence is H, and the minimum distance D between the first light emitting region 322 and the second light emitting region 302 satisfies the formula under the critical condition that the light beams emitted from the first light emitting region 322 and the second light emitting region 302 just intersect according to the trigonometric function relationshipSo in order to ensure that the light beams emitted from the first light emitting region 322 and the light beams emitted from the second light emitting region 302 do not meet each other before reaching the first optical element 31 arranged in sequence above the light source structure 3, the minimum distance D between the first light emitting region 322 and the second light emitting region 302 should be satisfied ∈>When the above conditions are satisfied, the light fluxes emitted from the first light emitting region 322 and the second light emitting region 302 do not intersect with each other before reaching the first optical element 31 disposed above the light source structure 3, and therefore, it is not necessary to provide another element for adjusting the light flux direction on the light emitting side of the first light emitting region 322 or the second light emitting region 302.
In the present embodiment, the second light emitters 320 are irregularly distributed in the first light emitting region 322 of the semiconductor substrate 34. The first light emitters 300 are uniformly arranged in the second light emitting region 302 at the same preset interval.
As shown in fig. 5, the fourth embodiment of the present application provides a light source structure 4, which is substantially the same as the light source structure 3 of the third embodiment, except that the first light emitters 400 are uniformly distributed in the first light emitting region 422 at preset same intervals. The second light emitters 420 are irregularly distributed in the second light emitting region 402.
As shown in fig. 6, the fifth embodiment of the present application provides a light source structure 5, which is substantially the same as the light source structure 1 in the first embodiment, except that the second light emitting region 502 is a region other than the first light emitting region 522 on the surface of the semiconductor substrate 54 on which the light emitters are formed. The first light emitter 500 is arranged in the second light emitting region 502. The second light emitter 520 is disposed within the first light emitting region 522. The first and second light emitters 500 and 520 are uniformly arranged at a predetermined same interval.
In this embodiment, the second light beam emitted by the second light emitter 520 of the first light emitting area 522 is matched with the optical element disposed above the light source structure 5 to form a pattern light beam capable of projecting an irregularly distributed light spot pattern, a regularly arranged stripe pattern, or a regular grid pattern intersecting each other along different directions on the measured object.
It will be appreciated that in other embodiments not shown in the figures, the second light emitters 520 disposed within the first light emitting region 522 may also be irregularly distributed.
It will be appreciated that in other embodiments not shown, the first light emitters 500 may be uniformly distributed in the first light emitting region 522 at predetermined uniform intervals. The second light emitters 520 are irregularly distributed in the second light emitting region 502.
Referring to fig. 7 and 8 together, a sixth embodiment of the present application provides a light source structure 6 for emitting a light beam onto a target object to be detected for sensing. The light beam may be a light beam having a specific wavelength according to a sensing principle and an application scene. In this embodiment, the light beam is used for face recognition, and may be an infrared or near infrared wavelength light beam, and the wavelength range is 750 nanometers (nm) to 1650nm.
The light source structure 6 includes a first emitting portion 60 and a second emitting portion 62. The first emitting part 60 emits a first light beam for forming a floodlight beam having a uniform light intensity distribution. The floodlight beam is projected onto the detected object and used for sensing a floodlight image of the detected object. For example, the floodlight beam can be used to sense whether the detected object is a human face. The second emitting part 62 emits a second light beam for forming a pattern light beam capable of projecting a predetermined pattern on the object to be measured. The preset pattern may be used to sense three-dimensional information of the measured object. In this embodiment, the first light beam and the second light beam are near infrared light beams having the same wavelength.
The first emitting part 60 includes a first light emitting body 600 and a light guide plate 602 formed on a first semiconductor substrate 601. The light guide plate 602 includes a light incident surface 6020 and a light emergent surface 6022. In this embodiment, the light guide plate 602 has a substantially rectangular parallelepiped shape, and the light incident surface 6020 is perpendicular to the light exit surface 6022. The first light emitter 600 is disposed corresponding to the light incident surface 6020 of the light guide plate 602, so that the first light beam emitted from the first light emitter 600 is emitted from the light incident surface 6020 into the light guide plate 602, and is uniformly mixed and then is emitted from the light emergent surface 6022.
The second emitting portion 62 is disposed at a middle position of the light emitting surface 6022 of the light guide plate 602. The second emitting part 62 includes one or more second light emitters 620 formed on a second semiconductor substrate 621. In this embodiment, the plurality of second light emitters 620 are irregularly distributed on the second semiconductor substrate 621, and are configured to project an irregularly distributed light spot pattern on the object under test in cooperation with the optical element disposed above the light source structure 6. It will be appreciated that, in other embodiments, the plurality of second light emitters 620 may be uniformly arranged at predetermined identical intervals, and may be used to project pattern beams of a stripe pattern arranged regularly or a regular grid pattern intersecting each other in different directions on the object to be measured in cooperation with the optical elements disposed above the light source structure 6.
In this embodiment, the first light emitter 600 and the second light emitter 620 may be semiconductor lasers, for example: a VCSEL. In other words, the first light emitting body 600 and the second light emitting body 620 are formed on the first semiconductor substrate 601 and the second semiconductor substrate 621, respectively. The first semiconductor substrate 601 has a shape corresponding to the shape of the light incident surface 6020.
Referring to fig. 1 and 9 together, a seventh embodiment of the present application provides a light source structure 7, which is substantially the same as the light source structure 1 in the first embodiment, and is different in that the first light emitting portion 70 includes a single first light emitting body 700 disposed in each of the second light emitting regions 702, where the first light emitting body 700 is a single-hole broad-surface VCSEL, instead of the plurality of first light emitting bodies 100 in the second light emitting regions 102 in the first embodiment, which are uniformly arranged at preset identical intervals. The Shan Kongkuan-sided VCSEL has only one emission aperture, but the emission aperture is large, several tens times as large as one of the VCSELs as the first light emitting body 100 in the first embodiment. The Shan Kongkuan surface-type VCSEL has the same light-emitting effect as a surface light source with uniform light-emitting intensity. The light emitting surface shape of the Shan Kongkuan surface-type VCSEL can be a regular shape, such as a rectangle; the light emitting surface of the Shan Kongkuan surface VCSEL may be irregularly shaped, for example, in the present embodiment, the light emitting surface of the Shan Kongkuan surface VCSEL is rectangular frame-bar-shaped in the second light emitting region 702.
Referring to fig. 1 and 10 together, an eighth embodiment of the present application provides a light source structure 8, which is substantially the same as the light source structure 1 in the first embodiment, and is different in that the second emitting portion 82 includes a single second light emitter 820 disposed in the first light emitting region 822, and the second light emitter 820 is a Shan Kongkuan-type VCSEL, instead of the irregularly distributed second light emitters 120 in the first light emitting region 122 in the first embodiment. The first emitting portion 80 includes a single first light emitter 800 disposed in each first light emitting region 802, where the first light emitter 800 is a Shan Kongkuan plane VCSEL instead of the plurality of first light emitters 100 in the second light emitting region 102 in the first embodiment, which are uniformly arranged at preset identical intervals. The Shan Kongkuan-sided VCSEL has only one light emitting hole, but has a large light emitting aperture, several tens times as large as one of the first and second light emitters 100 and 120 in the first embodiment. The Shan Kongkuan surface-type VCSEL has a similar light emitting effect to a surface light source with uniform light emitting intensity. The light emitting surface shape of the Shan Kongkuan surface-type VCSEL can be a regular shape, such as rectangular; it may be an irregular shape, for example, a rectangular frame bar shape of the second light emitting region 802 in this embodiment.
As shown in fig. 11, a ninth embodiment of the present application provides an optical projection module 11 for projecting a specific light beam onto a target object to be detected for sensing. The optical projection module 11 includes the light beam modulating element 110 and the light source structure 1 in the first to eighth embodiments.
The beam modulating element 110 includes a diffusing portion 111 and a patterning portion 112. The diffusing portion 111 is disposed corresponding to the first emitting portion 10 of the light source structure 1, and is configured to diffuse the first light beam emitted by the first light emitting body 100 of the first emitting portion 10 to form a floodlight beam with a uniform light intensity distribution. The patterning unit 112 is disposed corresponding to the second emitting unit 12 of the light source structure 1, and is configured to form a second beam of light emitted by the second light emitting unit 120 of the second emitting unit 12 into a pattern beam capable of projecting a preset pattern on the measured object, so as to be used for sensing three-dimensional information of the measured object.
The patterning part 112 is disposed at an intermediate position of the beam modulating element 110 to correspond to the second light emitter 120 disposed in the first light emitting region 122, corresponding to a case where the second light emitter 120 is disposed in the first light emitting region 122 to emit the second light beam for forming the pattern light beam, and the first light emitter 100 is disposed in the second light emitting region 102 to emit the first light beam for forming the floodlight pattern. The diffusion part 111 surrounds the periphery of the patterning part 112 to correspond to the first light emitting body 100 disposed in the second light emitting region 102.
As shown in fig. 12, the first light emitter 100 is disposed in the first light emitting region 122 to emit the first light beam for forming the floodlight pattern, and the diffusion part 111 is disposed at an intermediate position of the beam modulating element 110 to correspond to the first light emitter 120 disposed in the first light emitting region 122, corresponding to the case where the second light emitter 220 is disposed in the second light emitting region 202 to emit the second light beam for forming the pattern light beam. The patterning part 112 surrounds the periphery of the diffusion part 111 to correspond to the second light emitting body 120 disposed in the second light emitting region 102.
The functions of the patterning part 112 and the diffusion part 111 are achieved by forming specific optical lines at corresponding positions of the transparent substrate 113. In the present embodiment, the patterning portion 112 and the diffusion portion 111 of the beam modulator 110 are provided on the same transparent substrate 113. That is, a patterned optical line 1120 for rearranging the light field is formed at the middle position of the transparent substrate 113 as the patterned portion 112, and a diffusing optical line 1100 serving as a light diffusing function is formed at the periphery of the patterned optical line 1120 at a position corresponding to the first light emitting region 102 of the light source structure 1 as the diffusing portion 111 in the transparent substrate 113. The patterned optical texture 1120 includes, but is not limited to, diffractive optical texture, optical microlens arrays, gratings, and combinations thereof.
As shown in fig. 13, a detection line 134 may also be formed on the surface of the transparent substrate 113. The sensing circuit may be made of a conductive material with a plurality of sensing points 135 disposed thereon. By inspecting any two of the inspection points 135, it is known whether the surface of the transparent substrate 113 through which the line passes between the two points has flaws that affect the integrity of the optical element, such as chipping.
As shown in fig. 14, a tenth embodiment of the present application provides an optical projection module 15, which is substantially the same as the optical projection module 11 of the ninth embodiment, except that the optical projection module 15 further includes an optical path guiding element 16.
The light path guiding element 16 is disposed between the light source structure 1 and the light beam modulating element 110, and at a position corresponding to the light exit surface of the first emitting portion 10 of the light source structure 1. The optical path guiding element 16 is configured to guide the first light beam emitted in a divergent shape from the first emitting unit 10 to the diffusing unit 111 of the light beam modulating element 110. The light path guiding element 16 is configured to avoid that, in the technical solution that the first emitting portion 10 and the second emitting portion 12 of the light source structure 1 are closer to each other, a portion of the first light beam emitted from the first emitting portion 10 for forming floodlight is projected out through the patterning portion 112 of the light beam modulating element 110 to form a pattern light beam with irregularly distributed light intensity, thereby affecting the uniformity of the floodlight beam. The light path directing elements 16 include, but are not limited to, prisms, microlenses, and gratings. The arrangement area of the light path guiding element 16 is consistent with the area where the first emitting part 10 of the light source structure 1 is located.
As shown in fig. 15, an eleventh embodiment of the present application provides an optical projection module 17, which is substantially the same as the optical projection module 11 in the ninth embodiment, except that the diffusing part 171 and the patterning part 172 of the beam modulating element 170 are formed on different transparent substrates, respectively.
The transparent substrate formed with the patterned portion 172 is defined as a patterned substrate 1721. A patterned optical line 1720 for rearranging the light field of the light beam is formed on the patterned substrate 1721 at a position corresponding to the second emitting portion 12 of the light source structure 1. In this embodiment, the patterned optical lines 1720 are formed at the middle position of the patterned substrate 1721 corresponding to the case where the second emitting portion 12 is disposed at the middle of the light source structure 1.
The transparent substrate formed with the diffusion portion 171 is defined as a diffusion substrate 1710. A diffusing optical line 1711 for diffusing light is formed on the diffusing substrate 1710 at a position corresponding to the first emitting part 10 of the light source structure 1. The area of the diffusion substrate 1710 corresponding to the patterned optical lines 1720 on the patterned substrate 1721 is transparent, and the area of the patterned substrate 1721 corresponding to the diffusion optical lines 1711 on the diffusion substrate 1710 is transparent, which is defined as a transparent area 1712. In the present embodiment, the diffusion substrate 1710 is formed with the diffusion optical lines 1711 at positions corresponding to the first emitting part 10 of the light source structure 1 on the periphery of the light transmission region 1712, corresponding to the light source structure 1 in which the first emitting part 10 is disposed around the second emitting part 12.
The patterned substrate 1721 and the diffusion substrate 1710 may be stacked on each other, or may be disposed at different positions along the projection path of the optical projection module 17. It is understood that the alignment of the positions of the diffusion substrate 1710 and the patterned substrate 1721 corresponding to the optical lines is only required, and the arrangement order of the diffusion substrate 1710 and the patterned substrate 1721 along the projection light path is not particularly required.
As shown in fig. 16 and 17, a twelfth embodiment of the present application provides a sensing device 18 for sensing spatial information of a measured object. The spatial information includes, but is not limited to, depth information of the surface of the measured object, position information of the measured object in the space, size information of the measured object, and other three-dimensional information related to the measured object. The sensed spatial information of the measured object may be used to identify the measured object or to construct a three-dimensional model of the measured object.
The sensing device 18 includes the optical projection module 11 and the sensing module 180 according to the ninth to eleventh embodiments. The optical projection module 11 is configured to project a specific light beam onto a target object. The sensing module 180 includes a lens 181, an image sensor 182, and an image analysis processor 183. The image sensor 182 senses an image formed on the object to be measured by the specific light beam through the lens 181. The image analysis processor 183 analyzes the sensed image projected on the object to be measured to acquire three-dimensional information of the object to be measured.
In this embodiment, the sensing device 18 is a 3D face recognition device that senses three-dimensional information of the surface of the measured object and recognizes the identity of the measured object accordingly.
The specific light beam comprises a floodlight beam with uniform intensity and a pattern light beam capable of projecting a preset pattern on a measured object. The sensing module 180 recognizes whether the detected object is a face or not according to the sensed image formed by the floodlight beam on the detected object. The sensing module 180 analyzes three-dimensional information of the surface of the measured object according to the shape change of the preset pattern projected on the measured object by the sensed pattern beam, and performs face recognition on the measured object according to the three-dimensional information.
As shown in fig. 18, a thirteenth embodiment of the present application provides a device 19, such as a cell phone, a notebook computer, a tablet computer, a touch interactive screen, a door, a vehicle, a robot, an automatic numerical control machine, or the like. The apparatus 19 comprises at least one sensing device 18 provided by the twelfth embodiment described above. The device 19 is configured to perform a corresponding function according to the sensing result of the sensing means 18. The corresponding functions include, but are not limited to, unlocking after identifying the identity of the user, paying, starting a preset application program, avoiding barriers, and judging any one or more of emotion and health conditions of the user by using a deep learning technology after identifying facial expressions of the user.
In this embodiment, the sensing device 18 is a 3D face recognition device that senses three-dimensional information of the surface of the measured object and recognizes the identity of the measured object accordingly. The device 19 is a device which is provided with the 3D face recognition device and relates to access rights, such as a mobile phone, a notebook computer, a tablet personal computer, a touch interactive screen and other electronic terminals, doors, vehicles, security inspection, entry and exit.
Compared with the existing light source structure for sensing three-dimensional information, which is required to be provided with the floodlight emitter and the light pattern emitter respectively, the light source structure 1 provided by the application integrates the emitter for projecting floodlight beams and pattern beams, is small in size, is beneficial to the appearance design of equipment, and further reduces the cost of devices.
In the description of the present specification, reference to the terms "one embodiment," "certain embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The foregoing description of the preferred embodiments of the present application is not intended to be limiting, but is intended to cover any and all modifications, equivalents, and alternatives falling within the spirit and principles of the present application.

Claims (13)

1. The light source structure is used for emitting light beams to a tested object for sensing, and comprises a first emitting part and a second emitting part, wherein the first emitting part emits first light beams and the second emitting part emits second light beams, the first light beams are used for forming floodlight beams with uniform light intensity distribution, the second light beams are used for forming pattern light beams capable of projecting a preset pattern on the tested object, and the first emitting part and the second emitting part are formed on the same semiconductor substrate or are mutually connected to be integrated into a whole structure;
the semiconductor substrate is defined with a first light-emitting area positioned in the middle of the semiconductor substrate and a second light-emitting area arranged around the first light-emitting area;
the first emitting part is formed in a second light emitting area of the semiconductor substrate, and the second emitting part is formed in a first light emitting area of the semiconductor substrate;
the first emitting part is configured to diffuse the first light beam by using a diffusion part of a light beam modulation element to form a floodlight beam with uniform light intensity distribution, and the second emitting part is configured to rearrange the light field of the second light beam by using a patterning part of the light beam modulation element to form a pattern light beam capable of projecting a preset pattern on a measured object for sensing three-dimensional information of the measured object.
2. A light source structure as recited in claim 1, wherein: the first emitting part includes a plurality of first light emitters for emitting a first light beam, the second emitting part includes a plurality of second light emitters for emitting a second light beam, and the first and second light emitters are formed on the same semiconductor substrate and can be controlled to emit light independently, respectively.
3. A light source structure as recited in claim 2, wherein: the first light emitters are uniformly distributed on the semiconductor substrate at preset same intervals, and the second light emitters are irregularly distributed on the semiconductor substrate or uniformly distributed at preset same intervals.
4. A light source structure as recited in claim 3, wherein:
the first light emitter is formed in a second light emitting region of the semiconductor substrate, and the second light emitter is formed in a first light emitting region of the semiconductor substrate.
5. A light source structure as recited in claim 4, wherein: the first light-emitting area is rectangular, and the second light-emitting area is correspondingly arranged at four corners of the first light-emitting area.
6. A light source structure as recited in claim 4, wherein: the second light-emitting area is a frame-shaped area surrounding the first light-emitting area outside the first light-emitting area, and the minimum distance D between the first light-emitting area and the second light-emitting area meets the conditionWherein H is the distance between the light-emitting surface of the light source structure and the first optical element arranged in sequence above the light source structure, +.>Is the maximum divergence angle of the light beam emitted from the first and second light emitting regions.
7. A light source structure as recited in claim 4, wherein: the first light-emitting area is rectangular and is positioned in the middle of the semiconductor substrate, and the second light-emitting area is other areas except the first light-emitting area on the surface of the semiconductor substrate on which the light-emitting body is formed.
8. A light source structure as recited in claim 1, wherein: the first emitting part comprises a first luminous body and a light guide plate, wherein the first luminous body and the light guide plate are formed on a first semiconductor substrate, the light guide plate comprises a light inlet surface and a light outlet surface, the first luminous body is arranged corresponding to the light inlet surface of the light guide plate, the second emitting part is arranged in the middle of the light outlet surface of the light guide plate, and the second emitting part comprises one or more second luminous bodies formed on a second semiconductor substrate.
9. A light source structure as recited in claim 8, wherein: the second light emitters are irregularly distributed on the second semiconductor substrate; or (b)
The second light emitters are uniformly distributed on the second semiconductor substrate at preset same intervals.
10. A light source structure as recited in claim 1, wherein: the second emitting part comprises a second light emitting body formed in the middle of the semiconductor substrate, the first emitting part comprises a plurality of first light emitting bodies symmetrically distributed around the second light emitting body, the first light emitting body and the second light emitting body are formed on the same semiconductor substrate and are respectively and independently controlled to emit light, and the first light emitting body and the second light emitting body are both single-hole wide-surface type vertical cavity surface emitting lasers; or (b)
The second emitting part comprises a plurality of second light emitting bodies irregularly distributed in the middle of the semiconductor substrate, the first emitting part comprises a plurality of first light emitting bodies symmetrically distributed around the area where the plurality of second light emitting bodies are located, the first light emitting bodies and the second light emitting bodies are formed on the same semiconductor substrate and are respectively and independently controlled to emit light, the first light emitting bodies are single-hole wide-surface type vertical cavity surface emitting lasers, and the second light emitting bodies are light emitting arrays formed by the plurality of vertical cavity surface emitting lasers.
11. A light source structure as recited in claim 10, wherein: the luminous surface of the single-hole wide-surface type vertical cavity surface emitting laser of the first luminous body can be rectangular or right-angle frame-shaped.
12. An apparatus comprising a sensing device for sensing three-dimensional information of a measured object, the sensing device comprising an optical projection module and a sensing module, the optical projection module comprising a beam modulating element and the light source structure according to any one of claims 1 to 11, the sensing module sensing three-dimensional information of the measured object by analyzing a change of the preset pattern projected on the measured object along with a three-dimensional shape of the measured object, the apparatus performing a corresponding function according to the three-dimensional information of the measured object sensed by the sensing device.
13. The apparatus as recited in claim 12, wherein: the corresponding functions comprise unlocking after identifying the identity of the user, paying, starting a preset application program, avoiding obstacles, and judging any one or more of emotion and health conditions of the user by using a deep learning technology after identifying the facial expression of the user.
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