CN108512207A - Electrostatic discharge protective circuit - Google Patents

Electrostatic discharge protective circuit Download PDF

Info

Publication number
CN108512207A
CN108512207A CN201810346902.9A CN201810346902A CN108512207A CN 108512207 A CN108512207 A CN 108512207A CN 201810346902 A CN201810346902 A CN 201810346902A CN 108512207 A CN108512207 A CN 108512207A
Authority
CN
China
Prior art keywords
transistor
trigger
electrostatic discharge
discharge protective
protective circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810346902.9A
Other languages
Chinese (zh)
Other versions
CN108512207B (en
Inventor
廖家玮
唐新伟
张国彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing Sili Microelectronics Technology Co., Ltd
Original Assignee
Hangzhou Silergy Semiconductor Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hangzhou Silergy Semiconductor Technology Ltd filed Critical Hangzhou Silergy Semiconductor Technology Ltd
Priority to CN201810346902.9A priority Critical patent/CN108512207B/en
Publication of CN108512207A publication Critical patent/CN108512207A/en
Priority to TW108106307A priority patent/TWI696258B/en
Application granted granted Critical
Publication of CN108512207B publication Critical patent/CN108512207B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02HEMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/04Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
    • H02H9/041Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage using a short-circuiting device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0248Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0259Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using bipolar transistors as protective elements
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02HEMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/04Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
    • H02H9/045Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
    • H02H9/046Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere responsive to excess voltage appearing at terminals of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

A kind of electrostatic discharge protective circuit is disclosed, including:Vent unit is connected with signal end, and vent unit carries out energy to signal end according to trigger signal and releases;Trigger element, for providing the trigger signal;Wherein, the trigger element includes the first transistor, conducting is to provide starting current under parasitic capacitance coupling of the first transistor between its first end and control terminal, the first end of the first transistor is connected with the signal end, when the first transistor is connected, the trigger element provides the trigger signal according to the starting current.The mask layer being arranged for high-voltage capacitance can be omitted when carrying out device design, to reduce mask quantity, the design cost of circuit is created a further reduction, improves the design efficiency of circuit.

Description

Electrostatic discharge protective circuit
Technical field
The present invention relates to integrated circuit fields, relate more specifically to a kind of electrostatic discharge protective circuit.
Background technology
Static discharge (Electro-Static Discharge, ESD) phenomenon refers to the electricity between chip and exterior object Lotus discharges and transfer phenomena.ESD event can discharge a large amount of charges when occurring in the short time, be born far above chip to generate The energy of ability, it is thus possible to lead to the function temporarily failure even permanent damages of chip.In chip manufacturing proces, it can adopt Reduce the damage of ESD event with anti-electrostatic wrist ring or antistatic clothing.After chip manufacturing completion, due to the use environment of chip Difference is big, is easy to that ESD event occurs between chip and exterior object so that chip is influenced by static discharge.Therefore, lead to Electrostatic discharge protective circuit is often set in the chips to provide Electro-static Driven Comb path so that chip itself has the function of electrostatic protection, To improve the reliability and service life of chip.
Modern electronic product (such as smart mobile phone, laptop, tablet computer and light-emitting diode display etc.) usually wraps Containing the high-speed data port on printed circuit board (Printed Circuit Board, PCB), such as HDMI, USB, DVI etc., these high-speed data ports widely use electrostatic discharge protective circuit to realize protection.Electrostatic discharge protective circuit can be designed as point Vertical device, can also be directly integrated in chip interior.Fig. 1 shows the schematic diagram of the electrostatic discharge protective circuit of the prior art, when ESD arteries and veins When being flushed to next, transistor N1 is triggered using resistance R1 and capacitance C1, after transistor N1 is connected, current flowing resistance R2 is then touched Send out transistor N2, most ESD energy of finally releasing using transistor N2.In order to esd pulse of effectively releasing, lead to Often need RC time constants being designed as 10ns-10ms, therefore capacitance C1 needs to be set as high-voltage capacitance, that is to say, that into When row device designs, need with individual mask layer formation capacitance C1, to substantially increase the cost of design, reduce chip and set Count efficiency.
Invention content
In view of this, the purpose of the present invention is to provide a kind of electrostatic discharge protective circuit, setting for circuit is created a further reduction Meter cost, the design efficiency for improving circuit.
According to a kind of electrostatic discharge protective circuit provided by the invention, including:Vent unit is connected with signal end, described to release Unit carries out energy to the signal end according to trigger signal and releases;Trigger element, for providing the trigger signal;Wherein, The trigger element includes the first transistor, parasitic capacitance coupling of the first transistor between its first end and control terminal To provide starting current, the first end of the first transistor is connected the lower conducting of effect with the signal end, when first crystalline substance When body pipe is connected, the trigger element provides the trigger signal according to the starting current.
Preferably, the trigger element further includes first resistor, and the first resistor is connected to the first transistor Between second end and control terminal.
Preferably, the trigger element further includes:1st to N grade of trigger circuit, the 1st grade of trigger circuit is according to the startup Electric current generates the 1st grade of output current, and the 2nd to the N grade of trigger circuit is respectively according to the 1st to N-1 grade of the output current The the 2nd to N grade of the output current is generated, N is non-zero natural number;And conversion circuit, according to N grades of the output current Generate the trigger signal.
Preferably, at least output of the trigger circuit described in level-one for amplifying the starting current or upper level trigger circuit Electric current.
Preferably, every grade of trigger circuit includes:Input terminal receives the starting current or the corresponding output electricity Stream;Output end provides the output current of this grade;Second transistor, control terminal are connected with the input terminal, first end and institute It states signal end to be connected, second end is connected with the output end;And second resistance, it is connected to the input terminal and the output end Between.
Preferably, the conversion circuit includes 3rd resistor, the first end of the 3rd resistor and described N grades triggering electricity The output end on road is connected to provide the trigger signal, and second end, which receives, refers to ground voltage.
Preferably, the vent unit includes third transistor, the first end of the third transistor and the signal end It is connected, second end receives described with reference to ground voltage, the control terminal reception trigger signal.
Preferably, the electrostatic discharge protective circuit further includes diode, the anode of the diode and the third crystal The control terminal of pipe is connected, and the cathode of the diode is connected with the first end of the third transistor.
Preferably, the first transistor is triode and/or field-effect tube.
Preferably, the second transistor is triode and/or field-effect tube.
Preferably, the signal end is for receiving high level voltage.
The advantageous effect of electrostatic discharge protective circuit provided by the invention is:Utilize the collector and base stage of triode or field Coupled capacitor between the drain and gate of effect pipe generates starting current instead of high-voltage capacitance, and trigger element is according to the startup Electric current generates trigger signal, and when trigger signal is effective, vent unit is opened is released path with the energy for forming signal end to ground, It is released with carrying out ESD energy.Electrostatic discharge protective circuit provided by the invention can be realized quickly when esd pulse occurs in signal end It opens, prevents chip internal circuits from damaging.Meanwhile because utilizing the collector and base stage of triode or the drain electrode of field-effect tube Coupled capacitor between grid replaces high-voltage capacitance, and the mask being arranged for high-voltage capacitance can be omitted when carrying out device design Layer, to reduce mask quantity, creates a further reduction the design cost of circuit, improves the design efficiency of circuit.
Description of the drawings
By referring to the drawings to the description of the embodiment of the present invention, above-mentioned and other purposes of the invention, feature and Advantage will be apparent from.
Fig. 1 shows the circuit diagram of the electrostatic discharge protective circuit of the prior art.
Fig. 2 shows the structural schematic diagrams of the electrostatic discharge protective circuit of the embodiment of the present invention.
Fig. 3 shows the circuit diagram of the electrostatic discharge protective circuit of first embodiment of the invention.
Fig. 4 shows the circuit diagram of the electrostatic discharge protective circuit of second embodiment of the invention.
Fig. 5 shows the circuit diagram of the electrostatic discharge protective circuit of third embodiment of the invention.
Specific implementation mode
Hereinafter reference will be made to the drawings is more fully described the present invention.In various figures, identical element is using similar attached Icon is remembered to indicate.For the sake of clarity, the various pieces in attached drawing are not necessarily to scale.In addition, may not show in figure Go out certain well known parts.
It should be appreciated that in the following description, " circuit " refers to passing through electrical connection by least one element or sub-circuit Or the galvanic circle that electromagnetism connects and composes.As element or another element of circuit " being connected to " or element/circuit " being connected to " When between two nodes, it can be directly coupled or connected in another element or may exist intermediary element, between element Connection can be physically, in logic or its combination.On the contrary, when claiming element " being directly coupled to " or " being directly connected to To " another element when, it is meant that between the two be not present intermediary element.
Fig. 2 shows the structural schematic diagrams of the electrostatic discharge protective circuit of the embodiment of the present invention.As shown in Fig. 2, electrostatic discharge protective circuit 200 include trigger element 230 and the vent unit 220 being connected between signal end 210 and ground.
Specifically, trigger element 230 includes at least trigger circuit 231 of level-one, conversion circuit 232 and the first transistor 233.As shown in Fig. 2, the first end of the first transistor 233 is connect with signal end 210, second end and the trigger circuit being attached thereto 231 input terminal is connected.Parasitic capacitance of the first transistor 233 between its first end and control terminal is connected under the action of coupling To provide starting current to trigger circuit 231.Trigger element 230 further includes first resistor R1, and first resistor R1 is connected to first Between the second end and control terminal of transistor 233.
In addition, trigger element 230 includes the 1st grade of trigger circuit 231 to N grades of trigger circuits 231, N is non-zero natural number. All include input terminal and output end per level-one trigger circuit 231, input terminal is used for receiving the triggering of starting current or upper level The output current of circuit 231, output end provide the output current of this grade.For example, the input terminal of the 1st grade of trigger circuit 231 receives Starting current generates the 1st grade of output current according to starting current, and the 2nd to N grade of trigger circuit 231 is respectively according to the 1st to N-1 The output current of grade trigger circuit 231 generates the 2nd to N grade of output current.Conversion circuit 232 and N grades of trigger circuits 231 connect It connects, generates trigger signal according to N grades of output currents, vent unit 220 carries out energy according to trigger signal to signal end 210 It releases.
In addition, in embodiments of the present invention, the specific series N for the trigger circuit 231 that trigger element 230 is included is according to institute The cut-in voltage of the starting current and vent unit needs of stating the first transistor output determines that, when N is higher, circuit is also more multiple It is miscellaneous, cause chip area to increase, cost improves, therefore those skilled in the art can select to trigger according to physical circuit situation The series N for the trigger circuit 231 for including in unit 230.In some practical applications, series N is preferably 1 or 2.
In embodiment below, the principle of electrostatic discharge protective circuit provided by the invention is illustrated so that N is equal to 1 as an example.
Fig. 3 shows the circuit diagram of the electrostatic discharge protective circuit of first embodiment of the invention.As shown in figure 3, first crystal Pipe 233 can realize that the collector of triode NPN1 is connect with signal end 210, base stage and first resistor by triode NPN1 The first end of R1 connects, and emitter is connect with the second end of first resistor R1, in addition, the emitter of triode NPN1 and the first electricity The node of resistance R1 is used for providing starting current.
Trigger circuit 231 includes triode NPN2 and second resistance R2, and collector and the signal end 210 of triode NPN2 connect It connects, base stage is connect with the node of the emitter of triode NPN1 and first resistor R1 to receive starting current, and emitter is for carrying For the output current of this grade.Second resistance R2 is connected between the base stage and emitter of triode NPN2.
In addition, the conversion circuit 232 in Fig. 1 can be realized by 3rd resistor R3, the first end of 3rd resistor R3 with The emitter of triode NPN2 is connected with the node of second resistance R2, second end ground connection.
As shown in figure 3, vent unit 220 includes third transistor N3, first end and the signal end 210 of third transistor N3 Connection, second end ground connection, control terminal are connected with the first end of 3rd resistor to receive trigger signal.
When esd pulse occurs in signal end 210, due to the parasitic capacitance coupling between the collector and base stage of triode NPN1 Cooperation is used, and the voltage between the base stage and emitter of triode NPN1 is raised by first resistor R1 so that triode NPN1 conductings And provide starting current.Starting current flows through the second resistance R2 in trigger circuit 231 so that the base stage and hair of triode NPN2 Voltage between emitter-base bandgap grading is higher than the conducting voltage of triode NPN2, to which triode NPN2 turns on and generates the output electricity of this grade Stream.The output current provided by triode NPN2 flows through 3rd resistor R3, to generate triggering in the first end of 3rd resistor R3 Signal, the trigger signal have raised the voltage of the control terminal of third transistor N3 so that third transistor N3 conductings are to form letter The energy on number end 210 to ground is released path, to the ESD energy for signal end 210 of releasing.
In addition, can also include diode D1, the sun of diode D1 between the control terminal and first end of third transistor N3 Pole is connect with the control terminal of third transistor N3, and cathode is connect with the first end of third transistor N3, to prevent third transistor It is over-pressed between the first end and ground of N1.
Specifically, third transistor N3 can be realized by N-type metal-oxide-semiconductor, and the control terminal of third transistor N3 is metal-oxide-semiconductor Grid, first end be metal-oxide-semiconductor drain electrode, second end be metal-oxide-semiconductor source electrode.
Fig. 4 shows the circuit diagram of the electrostatic discharge protective circuit of second embodiment of the invention, the first implementation as shown in figure 3 Example compare, second embodiment of the invention provide electrostatic discharge protective circuit the difference is that:The first transistor 233 is N-type field The drain electrode of effect pipe N1, field-effect tube N1 are connect with signal end 210, and grid is connect with the first end of first resistor R1, source electrode with The second end of first resistor R1 is connected to provide starting current.
In addition, structure and the connection pass of trigger circuit 231, conversion circuit 232, diode D1 and vent unit 220 The first embodiment of system as shown in figure 3 is identical, and details are not described herein.
In second embodiment as shown in Figure 4, when esd pulse occurs in signal end 210, due to field-effect tube N1 Drain and gate between parasitic capacitance coupling, the voltage between the grid and source electrode of field-effect tube N1 is by first resistor R1 is raised so that field-effect tube N1 is connected and provides starting current.Later, starting current flows through second resistance R2 so that three poles Voltage between the base stage and emitter of pipe NPN2 is higher than the conducting voltage of triode NPN2, to which triode NPN2 is connected and carries For the output current of this grade.The output current provided by triode NPN2 flows through 3rd resistor R3, to 3rd resistor R3's First end generates trigger signal, which has raised the voltage of the grid of third transistor N3 so that third transistor N3 Conducting is released path with the energy for forming signal end 210 to ground, to the ESD energy for signal end 210 of releasing.
Fig. 5 shows the circuit diagram of the electrostatic discharge protective circuit of third embodiment of the invention, and as shown in fig. 4 second implements Example compare, third embodiment of the invention provide electrostatic discharge protective circuit the difference is that, trigger circuit 231 include N-type field The first end and second end of effect pipe N2 and second resistance R2, second resistance R2 respectively with the grid of field-effect tube N2 and source electrode phase Even, the drain electrode of field-effect tube N2 is connect with signal end 210, and the first end of second resistance R2 is connected with the second end of first resistor R1 To receive starting current, to which second resistance R2 can provide the gate source voltage of field-effect tube N2 with controlling filed according to starting current The source electrode of the turn-on and turn-off of effect pipe N2, field-effect tube N2 provides the output current of this grade.
In addition, the knot of the first transistor 233, first resistor R1, conversion circuit 232, diode D1 and vent unit 220 Structure and connection relation second embodiment as shown in fig. 4 are identical, and details are not described herein.
In 3rd embodiment as shown in Figure 5, when esd pulse occurs in signal end 210, due to field-effect tube N1 Drain and gate between parasitic capacitance coupling, the gate source voltage of field-effect tube N1 raised by first resistor R1 so that Field-effect tube N1 turns on and generates starting current.Starting current flows through second resistance R2 so that the gate source voltage of field-effect tube N2 It is raised to the conducting voltage of field-effect tube N2, to which field-effect tube N2 turns on and generates the output current of this grade.By field-effect The output current that pipe N2 is provided flows through 3rd resistor R3, to generate trigger signal, the triggering in the first end of 3rd resistor R3 Signal has raised the grid voltage of third transistor N3 so that third transistor N3 conductings are to form the energy that signal end 210 arrives ground Path of releasing is measured, to the ESD energy for signal end 210 of releasing.
In conclusion collector and base stage or field-effect tube of the electrostatic discharge protective circuit provided by the invention using triode Drain and gate between coupled capacitor generate starting current instead of high-voltage capacitance, trigger element is produced according to the starting current Raw trigger signal, when trigger signal is effective, vent unit is opened is released path with the energy for forming signal end to ground, with progress ESD energy is released.Electrostatic discharge protective circuit provided by the invention can realize quick unlatching when esd pulse occurs in signal end, Prevent chip internal circuits from damaging.Meanwhile because utilizing the collector and base stage of triode or drain electrode and the grid of field-effect tube Coupled capacitor between pole replaces high-voltage capacitance, and the mask layer being arranged for high-voltage capacitance can be omitted when carrying out device design, To reduce mask quantity, creates a further reduction the design cost of circuit, improves the design efficiency of circuit.
It should be noted that herein, relational terms such as first and second and the like are used merely to a reality Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those Element, but also include other elements that are not explicitly listed, or further include for this process, method, article or equipment Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that There is also other identical elements in process, method, article or equipment including the element.
As described above according to the embodiment of the present invention, there is no all details of detailed descriptionthe for these embodiments, also not Limit the specific embodiment that the invention is only described.Obviously, as described above, can make many modifications and variations.This explanation These embodiments are chosen and specifically described to book, is in order to preferably explain the principle of the present invention and practical application, belonging to making Technical field technical staff can utilize modification of the invention and on the basis of the present invention to use well.The present invention is only by right The limitation of claim and its full scope and equivalent.

Claims (11)

1. a kind of electrostatic discharge protective circuit, which is characterized in that including:
Vent unit is connected with signal end, and the vent unit carries out energy to the signal end according to trigger signal and releases;
Trigger element, for providing the trigger signal;
Wherein, the trigger element includes the first transistor, the first transistor posting between its first end and control terminal To provide starting current, the first end of the first transistor is connected with the signal end for the raw lower conducting of capacitive coupling effect, when When the first transistor conducting, the trigger element provides the trigger signal according to the starting current.
2. electrostatic discharge protective circuit according to claim 1, which is characterized in that the trigger element further includes first resistor, The first resistor is connected between the second end and control terminal of the first transistor.
3. electrostatic discharge protective circuit according to claim 1, which is characterized in that the trigger element further includes:
1st to N grade of trigger circuit, the 1st grade of trigger circuit generate the 1st grade of output current according to the starting current, and the 2nd to N The grade trigger circuit generates the 2nd to N grade of the output current according to the 1st to N-1 grade of the output current respectively, and N is Non-zero natural number;And
Conversion circuit generates the trigger signal according to N grades of the output currents.
4. electrostatic discharge protective circuit according to claim 3, which is characterized in that at least trigger circuit described in level-one is for amplifying The output current of the starting current or upper level trigger circuit.
5. electrostatic discharge protective circuit according to claim 3, which is characterized in that every grade of trigger circuit includes:
Input terminal receives the starting current or the corresponding output current;
Output end provides the output current of this grade;
Second transistor, control terminal are connected with the input terminal, and first end is connected with the signal end, second end and the output End is connected;And
Second resistance is connected between the input terminal and the output end.
6. electrostatic discharge protective circuit according to claim 5, which is characterized in that the conversion circuit includes 3rd resistor, institute The first end for stating 3rd resistor is connected with the output end of the N grades of trigger circuits to provide the trigger signal, the second termination It receives and refers to ground voltage.
7. electrostatic discharge protective circuit according to claim 1, which is characterized in that the vent unit includes third transistor, The first end of the third transistor is connected with the signal end, and second end receives described with reference to ground voltage, control terminal reception institute State trigger signal.
8. electrostatic discharge protective circuit according to claim 7, which is characterized in that further include diode, the sun of the diode Pole is connected with the control terminal of the third transistor, and the cathode of the diode is connected with the first end of the third transistor.
9. electrostatic discharge protective circuit according to claim 1, which is characterized in that the first transistor be triode and/or Field-effect tube.
10. electrostatic discharge protective circuit according to claim 5, which is characterized in that the second transistor be triode and/or Field-effect tube.
11. electrostatic discharge protective circuit according to claim 1, which is characterized in that the signal end is for receiving high level electricity Pressure.
CN201810346902.9A 2018-04-18 2018-04-18 Electrostatic protection circuit Active CN108512207B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201810346902.9A CN108512207B (en) 2018-04-18 2018-04-18 Electrostatic protection circuit
TW108106307A TWI696258B (en) 2018-04-18 2019-02-25 Electrostatic protection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810346902.9A CN108512207B (en) 2018-04-18 2018-04-18 Electrostatic protection circuit

Publications (2)

Publication Number Publication Date
CN108512207A true CN108512207A (en) 2018-09-07
CN108512207B CN108512207B (en) 2020-01-24

Family

ID=63382714

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810346902.9A Active CN108512207B (en) 2018-04-18 2018-04-18 Electrostatic protection circuit

Country Status (2)

Country Link
CN (1) CN108512207B (en)
TW (1) TWI696258B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112865058A (en) * 2021-04-12 2021-05-28 上海传泰电子科技有限公司 High-voltage peak bleeder circuit
CN112968437A (en) * 2021-04-01 2021-06-15 长鑫存储技术有限公司 Electrostatic protection circuit and electrostatic protection network of chip
CN118630710A (en) * 2024-08-09 2024-09-10 博瑞集信(西安)电子科技股份有限公司 ESD protection circuit

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1658388A (en) * 2004-02-18 2005-08-24 富士通株式会社 Electrostatic discharge protection circuit
CN201332098Y (en) * 2008-12-08 2009-10-21 惠州市正源微电子有限公司 ESD protecting circuit of depletion type pHEMT chips
CN102025135A (en) * 2009-09-17 2011-04-20 上海宏力半导体制造有限公司 ESD protective device
CN104054174A (en) * 2012-01-17 2014-09-17 德克萨斯仪器股份有限公司 Electrostatic discharge protection circuit having buffer stage fet with thicker gate oxide than common-source fet
CN107565537A (en) * 2017-09-29 2018-01-09 广州慧智微电子有限公司 A kind of esd protection circuit and method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1658388A (en) * 2004-02-18 2005-08-24 富士通株式会社 Electrostatic discharge protection circuit
CN201332098Y (en) * 2008-12-08 2009-10-21 惠州市正源微电子有限公司 ESD protecting circuit of depletion type pHEMT chips
CN102025135A (en) * 2009-09-17 2011-04-20 上海宏力半导体制造有限公司 ESD protective device
CN104054174A (en) * 2012-01-17 2014-09-17 德克萨斯仪器股份有限公司 Electrostatic discharge protection circuit having buffer stage fet with thicker gate oxide than common-source fet
CN107565537A (en) * 2017-09-29 2018-01-09 广州慧智微电子有限公司 A kind of esd protection circuit and method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112968437A (en) * 2021-04-01 2021-06-15 长鑫存储技术有限公司 Electrostatic protection circuit and electrostatic protection network of chip
CN112968437B (en) * 2021-04-01 2022-07-08 长鑫存储技术有限公司 Electrostatic protection circuit and electrostatic protection network of chip
CN112865058A (en) * 2021-04-12 2021-05-28 上海传泰电子科技有限公司 High-voltage peak bleeder circuit
CN118630710A (en) * 2024-08-09 2024-09-10 博瑞集信(西安)电子科技股份有限公司 ESD protection circuit

Also Published As

Publication number Publication date
TWI696258B (en) 2020-06-11
TW201944572A (en) 2019-11-16
CN108512207B (en) 2020-01-24

Similar Documents

Publication Publication Date Title
CN101783343B (en) Electro-static discharge protective circuit and integrated circuit
CN100468724C (en) Electrostatic discharge protective circuit and semiconductor integrated circuit using the same
CN108512207A (en) Electrostatic discharge protective circuit
CN103412216B (en) Electrostatic discharge testing circuit and disposal system
CN102025135B (en) ESD protective device
CN102290417B (en) Transient voltage suppressor based on DTSCR (Dual Triggered Silicon Controlled Rectifier)
CN104867910A (en) Electrostatic discharge protection circuit and semiconductor device
CN103646945A (en) Integrated circuit power supply esd protection circuit
CN105470938A (en) Power supply clamping circuit for prolonging electrostatic discharge time
CN110994574B (en) High-voltage-resistant power supply clamping circuit
CN103036552A (en) Static electricity detection circuit
CN104269399A (en) Antistatic protection circuit
CN102280872B (en) Electrostatic-proof protection circuit
CN203396864U (en) Electrostatic discharge detection circuit and processing system
CN101566658B (en) Transient detection circuit
CN101442046A (en) Dynamic detection electrostatic protection circuit structure
CN102651046A (en) Verifying method and verifying device for electrostatic protection of chip
CN102693979B (en) Whole-chip electrostatic discharge (ESD) protection circuit
CN102214915A (en) Electrostatic discharge protection circuit
CN101859766A (en) Novel NMOS (N-channel Metal Oxide Semiconductor) clamping between power VDD (Voltage Drain Drain) and IO (Input/Output) pin and application method thereof
CN103051325A (en) Pull-up resistance circuit for preventing reverse current filling
CN115275954A (en) Anti-backflow GPI circuit
CN102222669A (en) Silicon controlled rectifier used for ESD protection
CN104578034A (en) Electrostatic protection circuit
CN110311667B (en) Port circuit with port voltage protection circuit

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20200305

Address after: 210042 302, Xuanwu Road, 7, Xuanwu Road, Xuanwu District, Nanjing, Jiangsu, China, 7

Patentee after: Silergy Semiconductor Technology (Hangzhou) Ltd.

Address before: 310012 Wensanlu Road, Hangzhou Province, No. 90 East Software Park, science and technology building A1501

Patentee before: Silergy Semiconductor Technology (Hangzhou) Ltd.

TR01 Transfer of patent right
CP01 Change in the name or title of a patent holder

Address after: 210042 302, Xuanwu Road, 7, Xuanwu Road, Xuanwu District, Nanjing, Jiangsu, China, 7

Patentee after: Nanjing Sili Microelectronics Technology Co., Ltd

Address before: 210042 302, Xuanwu Road, 7, Xuanwu Road, Xuanwu District, Nanjing, Jiangsu, China, 7

Patentee before: Silergy Semiconductor Technology (Hangzhou) Ltd.

CP01 Change in the name or title of a patent holder