CN108055031B - Self-recovery triple modular redundancy structure for resisting single-particle soft error accumulation - Google Patents
Self-recovery triple modular redundancy structure for resisting single-particle soft error accumulation Download PDFInfo
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- CN108055031B CN108055031B CN201711341286.XA CN201711341286A CN108055031B CN 108055031 B CN108055031 B CN 108055031B CN 201711341286 A CN201711341286 A CN 201711341286A CN 108055031 B CN108055031 B CN 108055031B
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- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
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Abstract
The invention discloses a self-recovery triple-modular redundancy structure resisting single-particle soft error accumulation, which is characterized in that a single-particle soft error detection circuit and a data selection circuit are added to optimize and design a circuit, the design based on the structure can realize self-recovery after single-path signals in the triple-modular redundancy structure are overturned, and the problem that single-particle reinforcement failure possibly caused by error accumulation of the triple-modular redundancy structure can be effectively solved.
Description
Technical Field
The invention belongs to the technical field of semiconductor integrated circuits, and particularly relates to a self-recovery triple modular redundancy structure for resisting single event soft error accumulation.
Background
The single event effect is caused by the fact that space particles, especially high energy particles, strike the semiconductor device, producing a transient photocurrent. The single event effect can cause voltage disturbance of a device, and when a single event attacks a storage circuit, the storage circuit can be overturned, which is called as single event upset; when a single event impacts the combinational logic, transient pulses which can be propagated along the combinational logic, namely single event transients, can be generated, and single event soft errors can also be caused after the single event transients are captured by storage units such as triggers and the like.
The common structure for solving the single event effect problem is a triple modular redundancy structure. As shown in fig. 2, the target combinational logic circuit and the flip-flop circuit are duplicated to obtain a first combinational logic circuit 201, a first flip-flop 202, a second combinational logic circuit 203, a second flip-flop 204, a third combinational logic circuit 205, and a third flip-flop 206, and the three-way redundancy is voted by a voting circuit 207 and then output. When one module in the triple modular redundancy is attacked by a single particle to cause a single-particle soft error of the trigger, the other two modules are not influenced, and the correctness of the circuit output result can be ensured through the voting circuit 207.
Although the conventional triple-modular redundancy structure can resist single-particle soft errors caused by single-particle attack, if the circuit is not refreshed for a long time, after one of the modes generates soft errors, the remaining one of the modes also generates single-particle soft errors caused by single-particle attack, and the soft errors of the two modes cause final output errors of the voting circuit 207, so that the use of the voting circuit is limited.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: in order to overcome the defects of the prior art, a self-recovery triple-modular redundancy structure for resisting single-event soft error accumulation is provided, and the problem caused by soft error accumulation in a long-term task is solved with lower cost.
The purpose of the invention is realized by the following technical scheme: a self-healing single event error accumulation resistant triple modular redundancy structure comprising: a triple modular redundancy circuit and a self-recovery circuit; the triple-modular redundancy circuit is connected with the self-recovery circuit, the self-recovery circuit detects, discriminates and detects the single-event soft error according to the output of the triple-modular redundancy circuit, and when the single-event soft error is detected, the self-recovery circuit carries out setting/resetting operation on the triple-modular redundancy circuit.
In the self-recovery single event error accumulation resistant triple modular redundancy structure, the triple modular redundancy circuit comprises a first combinational logic circuit, a first trigger, a second combinational logic circuit, a second trigger, a third combinational logic circuit, a third trigger and a voting circuit; the INPUT signal INPUT of the triple modular redundancy circuit is latched by three identical first triggers, second triggers and third triggers respectively through a first combinational logic circuit, a second combinational logic circuit and a third combinational logic circuit, and the respective OUTPUTs of the three triggers are voted through a voter to obtain a final OUTPUT signal OUTPUT.
In the self-recovery triple modular redundancy structure resisting single event error accumulation, the self-recovery circuit comprises a single event soft error detection circuit, a set data selection circuit, a reset data selection circuit and a phase inverter; the OUTPUT of each of the three triggers is simultaneously used as the input of the single-event soft error detection circuit, the OUTPUT of the single-event soft error detection circuit is connected to the control ends of the set data selector and the reset data selector, an external reset signal CDN and an OUTPUT signal OUTPUT are used as the input of the reset data selector, and the OUTPUT end of the reset data selector is connected to the reset ends of the three triggers to reset the corresponding triggers; signals of an externally input setting signal SDN and an OUTPUT signal OUTPUT after passing through an inverter are used as the input of a setting data selector, and the OUTPUT end of the setting data selector is connected to setting ends of three triggers to set the corresponding triggers; the single-event soft error detection circuit detects, discriminates and detects single-event soft errors according to the OUTPUTs of the first trigger, the second trigger and the third trigger, and sets/resets each trigger through the set data selector and the reset data selector to select the OUTPUT signal OUTPUT when the single-event soft errors are detected.
The triple modular redundancy structure capable of resisting single event error accumulation and self-recovery further comprises: when the voting circuit is attacked by a single particle, the OUTPUT signal OUTPUT generates a single-particle soft error, and the single-particle soft error detection circuit does not detect the single-particle soft error, so that the reset or setting operation cannot be performed on each trigger.
In the self-recovery single-event-error-accumulation-resistant triple-modular redundancy structure, when any one of three triggers generates a soft error under the action of a single event, the single-event soft error detection circuit and the data selection circuit carry out set/reset operation on the circuit by using the OUTPUT signal OUTPUT so as to recover the soft error; when the single-particle soft error detection circuit is attacked by a single particle, the set data selector and the reset data selector are triggered wrongly, the OUTPUT signal OUTPUT is selected to carry out set/reset operation on each trigger, and because the OUTPUT signal OUTPUT is correct, the set/reset operation cannot cause the error of each trigger.
In the self-recovery triple-modular redundancy structure resisting single-particle error accumulation, the soft error detection signal and the OUTPUT signal OUTPUT by the single-particle soft error detection circuit are independently generated, so that single particles cannot simultaneously influence the soft error detection signal and the OUTPUT signal to cause misoperation.
Compared with the prior art, the invention has the following beneficial effects:
(1) the invention carries out self-recovery design on the triple modular redundancy by adding the single-event soft error detection circuit and the data selection circuit, thereby solving the problem of reinforcement failure of the triple modular redundancy circuit possibly caused by error accumulation in long-term tasks.
(2) According to the invention, the circuit is set/reset by selecting the output signal through the independently generated single-event soft error detection signal, and when the single-event attack voter or the single-event soft error detection circuit generates a single-event transient, the single-event transient generated by the voter or the single-event transient generated by the single-event transient detection circuit cannot cause the erroneous setting/resetting of the circuit; if and only if the single event affects the single event transient detection circuit and the voter circuit at the same time, the misoperation of the circuit can be caused. The two parts are separated in layout design, so that the single-particle transient detection circuit and the voter circuit can be guaranteed to be influenced by a single ion at different times.
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Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a schematic diagram of a triple modular redundancy architecture for self-recovery and anti-single event soft error accumulation according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a conventional triple modular redundancy structure in the prior art.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
FIG. 1 is a schematic diagram of a triple modular redundancy structure for self-recovery and anti-single-event soft error accumulation according to an embodiment of the present invention. As shown in fig. 1, the self-recovery triple modular redundancy structure for resisting single event soft error accumulation is composed of a triple modular redundancy circuit and a self-recovery circuit, the triple modular redundancy circuit is composed of a first combinational logic circuit 101, a first trigger 102, a second combinational logic circuit 103, a second trigger 104, a third combinational logic circuit 105, a third trigger 106 and a voting circuit 107, and the self-recovery circuit is composed of a single event soft error detection circuit 108, a set data selection circuit 109, a reset data selection circuit 110 and an inverter 111. The INPUT of the triple modular redundancy circuit is latched by a first trigger 102, a second trigger 104 and a third trigger 106 which are completely the same through a first combinational logic circuit 101, a second combinational logic circuit 103 and a third combinational logic circuit 105 respectively, and the OUTPUT of the three triggers is voted through a voter 107 to obtain a final OUTPUT signal OUTPUT. The OUTPUTs of the three triggers are simultaneously used as the input of the single-event soft error detection circuit 108, the OUTPUT of the single-event soft error detection circuit 108 is connected to the control ends of the set data selector 109 and the reset data selector 110, the external reset signal CDN and the OUTPUT signal OUTPUT are used as the input of the reset data selector, and the OUTPUT end of the reset data selector is connected to the reset ends of the three triggers to reset the triggers; signals of an externally input setting signal SDN and an OUTPUT signal OUTPUT after passing through an inverter are used as the input of a setting data selector, and the OUTPUT end of the setting data selector is connected to the setting ends of the three triggers to set the triggers. The single-event soft error detection circuit 108 detects, discriminates and detects a single-event soft error according to the OUTPUTs of the first flip-flop 102, the second flip-flop 104 and the third flip-flop 106, and when the single-event soft error is detected, sets/resets the flip-flops by selecting the OUTPUT signal OUTPUT by the set data selector and the reset data selector, and restores the flip-flops in which the soft error occurs.
If only one of the three inputs of the single-particle soft error detection circuit is different, the output of the single-particle soft error detection circuit is effective. When any one of the three triggers generates soft errors under the action of single particles, the single-particle soft error detection circuit 108 and the data selection circuit carry out setting/resetting operation on the circuit by using the OUTPUT signal OUTPUT, the soft errors are recovered, and single-particle reinforcing failure of the three-mode triggers caused by soft error accumulation in a long-term non-refreshing task is prevented.
When the voting circuit 107 is attacked by a single particle, the OUTPUT signal OUTPUT has a single-event soft error, and the single-event soft error detection circuit 108 does not detect the single-event soft error, and does not perform resetting or setting operation on each trigger.
When the single-event soft error detection circuit 108 is attacked by a single-event, a soft error is generated, and since the OUTPUT signal OUTPUT is correct, no error is introduced by the set/reset operation performed by the flip-flop.
The soft error detection signal and the OUTPUT signal OUTPUT from the single-particle soft error detection circuit 108 are generated independently, so that it can be ensured that the single particle does not affect the soft error detection signal and the OUTPUT signal at the same time to cause misoperation. The single-event soft error detection circuit and the refreshing circuit can be applied to different triple modular redundancy structures according to requirements, are not only suitable for triple modular redundancy structures with completely the same combinational logic, but also suitable for triple modular redundancy structures with three combinational logics of different time delays and used for single-event transient state reinforcement. The self-recovery triple-modular redundancy structure resisting the accumulation of the single-event soft errors is realized by only adding an external detection circuit and a data selection circuit, and the function of a triple-modular redundancy structure circuit is not influenced. The setting/resetting signal of the three-mode circuit is generated by selecting the output signal without additional generation, thereby reducing the redundant circuit structure.
The independently generated single-particle soft error detection signal selects the output signal to carry out setting/resetting operation on the circuit, and the error setting/resetting of the circuit can not be caused only by the single-particle transient on the detection signal or only by the single-particle transient on the output signal.
The single-event soft error detection signal and the signal for setting/resetting the circuit are generated independently. The soft error detection signal and the set/reset signal are not influenced by a single particle at the same time, the circuit is recovered by selecting the set/reset signal through the soft error detection signal, and the setting/reset of the circuit error caused by the single-particle transient on the detection signal and the output single-particle transient is not ensured.
In the embodiment, the self-recovery design is carried out on the triple-modular redundancy by adding the single-event soft error detection circuit and the data selection circuit, so that the problem that the triple-modular redundancy circuit is possibly reinforced and failed due to error accumulation in a long-term task is solved.
In the embodiment, the output signal is selected to carry out setting/resetting operation on the circuit through the independently generated single-particle soft error detection signal, and when the single-particle attack voter or the single-particle soft error detection circuit generates a single-particle transient, the single-particle transient generated by the voter or the single-particle transient generated by the single-particle transient detection circuit cannot cause the erroneous setting/resetting of the circuit; if and only if the single event affects the single event transient detection circuit and the voter circuit at the same time, the misoperation of the circuit can be caused. The two parts are separated in layout design, so that the single-particle transient detection circuit and the voter circuit can be guaranteed to be influenced by a single ion at different times.
The above-described embodiments are merely preferred embodiments of the present invention, and general changes and substitutions by those skilled in the art within the technical scope of the present invention are included in the protection scope of the present invention.
Claims (4)
1. A self-healing, single event error accumulation resistant triple modular redundancy structure, comprising: a triple modular redundancy circuit and a self-recovery circuit; wherein the content of the first and second substances,
the triple-modular redundancy circuit is connected with the self-recovery circuit, the self-recovery circuit detects, discriminates and detects the single-event soft error according to the output of the triple-modular redundancy circuit, and when the single-event soft error is detected, the self-recovery circuit carries out setting/resetting operation on the triple-modular redundancy circuit;
the triple modular redundancy circuit comprises a first combinational logic circuit (101), a first trigger (102), a second combinational logic circuit (103), a second trigger (104), a third combinational logic circuit (105), a third trigger (106) and a voting circuit (107); wherein the content of the first and second substances,
an INPUT signal INPUT of the triple-modular redundancy circuit is respectively latched by a first trigger (102), a second trigger (104) and a third trigger (106) which are all the same through a first combinational logic circuit (101), a second combinational logic circuit (103) and a third combinational logic circuit (105), and the respective OUTPUTs of the three triggers are voted through a voter (107) to obtain a final OUTPUT signal OUTPUT;
the self-recovery circuit comprises a single-particle soft error detection circuit (108), a set data selection circuit (109), a reset data selection circuit (110) and an inverter (111); wherein the content of the first and second substances,
the OUTPUT of each of the three triggers is simultaneously used as the input of a single-event soft error detection circuit (108), the OUTPUT of the single-event soft error detection circuit (108) is connected to the control ends of a set data selector (109) and a reset data selector (110), an external reset signal CDN and an OUTPUT signal OUTPUT are used as the input of the reset data selector (110), and the OUTPUT end of the reset data selector (110) is connected to the reset ends of the three triggers to reset the corresponding triggers;
a signal of an OUTPUT signal OUTPUT after passing through an inverter (111) and an externally input setting signal SDN are used as the input of a setting data selector (109), and the OUTPUT end of the setting data selector (109) is connected to setting ends of three triggers to set the corresponding triggers;
the single-event soft error detection circuit (108) detects, discriminates and detects a single-event soft error according to the OUTPUTs of the first flip-flop (102), the second flip-flop (104) and the third flip-flop (106), and when the single-event soft error is detected, the set data selector (109) and the reset data selector (110) select the OUTPUT signal OUTPUT to set/reset each flip-flop.
2. The self-healing single event error accumulation resistant triple modular redundancy structure according to claim 1, further comprising: when the voting circuit (107) is attacked by a single particle, the OUTPUT signal OUTPUT generates a single-particle soft error, and the single-particle soft error detection circuit (108) does not detect the single-particle soft error and does not reset or set each trigger.
3. The self-recovering triple modular redundancy structure resisting single event error accumulation according to claim 1, characterized in that when any one of three flip-flops generates a soft error under the action of a single event, the circuit is set/reset by an OUTPUT signal OUTPUT through a single event soft error detection circuit (108) and a data selection circuit, so as to recover the soft error; when the single-particle soft error detection circuit (108) is attacked by a single particle, the set data selector (109) and the reset data selection device (110) can be triggered wrongly, the OUTPUT signal OUTPUT is selected to carry out set/reset operation on each trigger, and the set/reset operation can not cause the error of each trigger because the OUTPUT signal OUTPUT is correct.
4. The self-recovering triple-modular redundancy structure resisting single event error accumulation according to claim 1, wherein the soft error detection signal and the OUTPUT signal OUTPUT outputted by the single event soft error detection circuit (108) are independently generated, so that the single event does not affect the soft error detection signal and the OUTPUT signal at the same time to cause misoperation.
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| CN108766491B (en) * | 2018-06-01 | 2019-05-31 | 北京理工大学 | A kind of track loop single-particle inversion errors repair method in SRAM type FPGA piece |
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| CN109271282B (en) * | 2018-09-06 | 2022-01-11 | 北京时代民芯科技有限公司 | Single-particle multi-dislocation autonomous repair triple-redundancy assembly line and design method |
| CN109714025A (en) * | 2018-12-26 | 2019-05-03 | 中国科学技术大学 | The d type flip flop structure of the anti-single particle overturning and temporary disturbance of self- recoverage mechanism |
| CN111525919B (en) * | 2020-05-27 | 2023-09-26 | 上海微阱电子科技有限公司 | Redundant structure with feedback correction |
| CN112838857B (en) * | 2021-01-27 | 2022-07-22 | 复旦大学 | Soft error reinforcement method applied to combinational logic circuit |
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