CN108055031A - A kind of triplication redundancy structure of self- recoverage anti-single particle soft error accumulation - Google Patents
A kind of triplication redundancy structure of self- recoverage anti-single particle soft error accumulation Download PDFInfo
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- CN108055031A CN108055031A CN201711341286.XA CN201711341286A CN108055031A CN 108055031 A CN108055031 A CN 108055031A CN 201711341286 A CN201711341286 A CN 201711341286A CN 108055031 A CN108055031 A CN 108055031A
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
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Abstract
The invention discloses a kind of triplication redundancy structures of self- recoverage anti-single particle soft error accumulation, circuit is optimized by increasing single-particle soft error detection circuit and data selection circuit, design based on this structure can voluntarily recover in triplication redundancy structure after one-channel signal overturning, can effectively solve the problem that the problem of triplication redundancy structure may be caused single-particle to reinforce failure by error accumulation.
Description
Technical field
The invention belongs to semiconductor integrated circuit technology field more particularly to self- recoverage anti-single particle soft error are accumulated three
Mould redundancy structure.
Background technology
Single particle effect is Space Particle, and especially high energy particle hits semiconductor devices, generates the photoelectric current of moment
It is caused.Single particle effect can cause device voltage to disturb, and when single-particle attacks storage circuit, can cause turning over for storage circuit
Turn, be referred to as single-particle inversion；When single-particle hits combinational logic, the transient pulse that can be propagated along combinational logic can be generated,
That is single-ion transient state, single-ion transient state will also result in single-particle soft error after storage unit such as trigger capture.
The common structure for solving the problems, such as single particle effect is triplication redundancy structure.As shown in Fig. 2, by objective cross logic
Circuit and flip-flop circuit replicate three parts and obtain the first combinational logic circuit 201, the first trigger 202, the second combinational logic electricity
Road 203, the second trigger 204, the 3rd combinational logic circuit 205, the 3rd trigger 206, three tunnel redundancies pass through voting circuit 207
It is exported after voting.When the mould in triplication redundancy causes trigger that single-particle soft error occurs by single-particle attack,
His two moulds are unaffected and pass through voting circuit 207 and can ensure the correctness of circuit output result.
Although the structure of above-mentioned tradition triplication redundancy can resist single-particle soft error caused by single particle attack,
If circuit, for a long time without refreshing, after mould generation soft error wherein, a remaining wherein mould is also attacked by single-particle and sent out
Raw single-particle soft error, the soft error of two moulds will cause the final output mistake of voting circuit 207, thus limit its use.
The content of the invention
The technology of the present invention solves the problems, such as：It is soft to overcome the deficiencies of the prior art and provide a kind of self- recoverage anti-single particle
The triplication redundancy structure of error accumulation solves the problems, such as to be caused by soft error accumulation in long-range mission with smaller expense.
The object of the invention is achieved by the following technical programs：A kind of three moulds of self-healing anti-single particle error accumulation
Redundancy structure, including：Triplication redundancy circuit and self-repairing circuit；Wherein, triplication redundancy circuit is connected with self-repairing circuit, from
Restoring circuit is detected differentiation detection single-particle soft error according to the output of triplication redundancy circuit, when detecting single-particle soft error
It mistakes, self-repairing circuit carries out set/reset operation to triplication redundancy circuit.
In the triplication redundancy structure of above-mentioned self-healing anti-single particle error accumulation, the triplication redundancy circuit includes first
Combinational logic circuit, the first trigger, the second combinational logic circuit, the second trigger, the 3rd combinational logic circuit, the 3rd triggering
Device and voting circuit；Wherein, the input signal INPUT of triplication redundancy circuit is patrolled by the first combinational logic circuit, the second combination
Circuit, the 3rd combinational logic circuit are collected respectively by three identical first triggers, the second trigger, the 3rd trigger locks
It deposits, the respective output of three triggers obtains final output signal OUTPUT after putting to the vote by voting machine.
In the triplication redundancy structure of above-mentioned self-healing anti-single particle error accumulation, the self-repairing circuit includes single-particle
Soft error detection circuit, set data selection circuit, reseting data selection circuit and phase inverter；Wherein, three triggers are each
Output input as single-particle soft error detection circuit simultaneously, the output of single-particle soft error detection circuit is connected to set number
According to the control terminal of selector and reseting data selector, external reset signal CDN and output signal OUTPUT are as reseting data
The input of selector, the output of reseting data selector terminate to the reset terminal of three triggers to the progress of corresponding trigger
Reset operation；The signal of externally input set signal SDN and output signal OUTPUT after a phase inverter is as set
The input of data selector, the output of set data selector terminate to the set end of three triggers to corresponding trigger
Carry out set operation；Single-particle soft error detection circuit according to the first trigger, the second trigger, the 3rd trigger output into
Row detection differentiates detection single-particle soft error, when detecting single-particle soft error, by set data selector and resets number
According to selector output signal OUTPUT is selected to carry out set/reset operation to each trigger.
In the triplication redundancy structure of above-mentioned self-healing anti-single particle error accumulation, further include：When voting circuit is by simple grain
During son attack, single-particle soft error occurs for output signal OUTPUT, and single-particle soft error detection circuit does not detect list
Particle soft error, will not reset each trigger or set operation.
In the triplication redundancy structure of above-mentioned self-healing anti-single particle error accumulation, when any one in three triggers
When generating soft error under single-particle effect, utilized through single-particle soft error detection circuit and data selection circuit and export signal
OUTPUT carries out set/reset operation to circuit, and soft error is recovered；When single-particle soft error detection circuit is by single-particle
During attack, it can mistakenly trigger set data selector and reseting data selector and select output signal OUTPUT to each
Trigger carries out set/reset operation, and since output signal OUTPUT is correct, set/reset operation will not cause each
The mistake of trigger.
In the triplication redundancy structure of above-mentioned self-healing anti-single particle error accumulation, single-particle soft error detection circuit output
Soft error detection signal and output signal OUTPUT independently generate so that single particle will not influence soft error flase drop simultaneously
It surveys signal and output signal and causes maloperation.
The present invention has the advantages that compared with prior art：
(1) present invention is carried out from extensive triplication redundancy by adding single-particle soft error detection circuit and data selection circuit
Multiple design, solving triplication redundancy circuit may be due to reinforcing failure in long-range mission caused by error accumulation.
(2) present invention exports signal by the single-particle soft error detection signal behavior independently generated and circuit is put
Position/reset operates, when single-particle attacks voting machine or single-particle soft error detection circuit generates single-ion transient state, voting machine production
The single-ion transient state that raw single-ion transient state or single-ion transient state detection circuit generate will not cause the wrong set of circuit/multiple
Position；When single-particle influences single-ion transient state detection circuit and voting machine circuit simultaneously, the maloperation of circuit can be caused.
Be incorporated in layout design when the separation of this two parts can be ensured single ion difference influence single-ion transient state detection circuit and
Voting machine circuit.
Description of the drawings
By reading the detailed description of hereafter preferred embodiment, it is various other the advantages of and benefit it is common for this field
Technical staff will be apparent understanding.Attached drawing is only used for showing the purpose of preferred embodiment, and is not considered as to the present invention
Limitation.And throughout the drawings, the same reference numbers will be used to refer to the same parts.In the accompanying drawings：
Fig. 1 is the triplication redundancy structure diagram of self- recoverage anti-single particle soft error provided in an embodiment of the present invention accumulation；
Fig. 2 is traditional triplication redundancy structure diagram of the prior art.
Specific embodiment
The exemplary embodiment of the disclosure is more fully described below with reference to accompanying drawings.Although the disclosure is shown in attached drawing
Exemplary embodiment, it being understood, however, that may be realized in various forms the disclosure without should be by embodiments set forth here
It is limited.On the contrary, these embodiments are provided to facilitate a more thoroughly understanding of the present invention, and can be by the scope of the present disclosure
Completely it is communicated to those skilled in the art.It should be noted that in the case where there is no conflict, embodiment in the present invention and
Feature in embodiment can be mutually combined.The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
Fig. 1 is the triplication redundancy structural representation that self- recoverage anti-single particle soft error provided in an embodiment of the present invention is accumulated
Figure.As shown in Figure 1, the triplication redundancy structure of self- recoverage anti-single particle soft error accumulation is by triplication redundancy circuit and self-repairing circuit
Composition, triplication redundancy circuit is by the first combinational logic circuit 101, the first trigger 102, the second combinational logic circuit 103, second
Trigger 104, the 3rd combinational logic circuit 105, the 3rd trigger 106 and voting circuit 107 form, and self-repairing circuit is by simple grain
Sub- soft error detection circuit 108, set data selection circuit 109, reseting data selection circuit 110, phase inverter 111 form.Three
The input INPUT of mould redundant circuit is by the first combinational logic circuit 101, the second combinational logic circuit 103, the 3rd combinational logic
Circuit 105 is latched respectively by three identical first triggers 102, the second trigger 104, the 3rd trigger 106, three
The output of trigger obtains final output signal OUTPUT after putting to the vote by voting machine 107.The output of three triggers
The input as single-particle soft error detection circuit 108, the output of single-particle soft error detection circuit 108 are connected to set number simultaneously
According to the control terminal of selector 109 and reseting data selector 110, external reset signal CDN and output signal OUTPUT are as multiple
The input of position data selector, the reset terminal that the output of reseting data selector terminates to three triggers answer trigger
Bit manipulation；The signal of externally input set signal SDN and output signal OUTPUT after a phase inverter is as set number
According to the input of selector, the output of set data selector terminates to the set end of three triggers to trigger progress set behaviour
Make.Single-particle soft error detection circuit 108 is according to the output of the first trigger 102, the second trigger 104, the 3rd trigger 106
Differentiation detection single-particle soft error is detected, when detecting single-particle soft error, passes through set data selector and reset
Data selector selection output signal OUTPUT carries out set/reset operation to trigger, and soft error, which occurs, to trigger touches
Hair device is recovered.
As long as there are one different in three of single-particle soft error detection circuit inputs, then single-particle soft error detection circuit
Output is effective.When any one in three triggers generates soft error under single-particle effect, through single-particle soft error flase drop
Slowdown monitoring circuit 108 and data selection circuit carry out set/reset operation using signal OUTPUT is exported to circuit, and soft error is carried out
Recover, prevent in not refreshing for a long time for task, the triggers of three moulds due to soft error accumulate and caused by single-particle reinforce and lose
Effect.
When voting circuit 107 is attacked by single-particle, single-particle soft error occurs for output signal OUTPUT, and single-particle is soft
Error detection circuit 108 does not detect single-particle soft error, each trigger will not be resetted or set operation.
When single-particle soft error detection circuit 108 is attacked by single-particle, soft error is generated, due to exporting signal OUTPUT
It is correct, the set/reset operation that trigger carries out will not introduce mistake.
The soft error detection signal and output signal OUTPUT that single-particle soft error detection circuit 108 exports are independent generations
, it is ensured that single particle will not influence soft error detection signal and output signal and cause maloperation simultaneously.Single-particle soft error
Flase drop slowdown monitoring circuit and refresh circuit can be applied to different triplication redundancy structures as needed, be not only applicable to three combinations
The identical triplication redundancy structure of logic can equally be well applied to three road combinational logics and be used for single-ion transient state for different delayed time
The triplication redundancy structure of reinforcing.The triplication redundancy structure of self- recoverage anti-single particle soft error accumulation is only by increasing external inspection
Slowdown monitoring circuit and data selection circuit have no effect on the function of triplication redundancy structural circuit.To the set/reset signal of three moding circuits
It is to be generated by output signal by selection, and is generated without additional, reduces redundant circuit configuration.
The single-particle soft error detection signal behavior output signal independently generated carries out set/reset operation to circuit, only
Single-ion transient state or single-ion transient state only in the output signal on detection signal will not cause the wrong set of circuit/
It resets.
Single-particle soft error detection signal and to circuit carry out set/reset operation signal independently generate.Ensure
Single particle will not influence soft error detection signal and set/reset signal simultaneously, by the set of soft error detection signal behavior/
Reset signal recovers circuit, ensure that the single-ion transient state of the single-ion transient state on detection signal and output and will not cause
The set/reset of circuit error.
The present embodiment is carried out from extensive triplication redundancy by adding single-particle soft error detection circuit and data selection circuit
Multiple design, solving triplication redundancy circuit may be due to reinforcing failure in long-range mission caused by error accumulation.
The present embodiment by the single-particle soft error detection signal behavior that independently generates export signal circuit is carried out set/
Operation is resetted, when single-particle attacks voting machine or single-particle soft error detection circuit generates single-ion transient state, voting machine generates
Single-ion transient state or the single-ion transient state that generates of single-ion transient state detection circuit will not cause the wrong set/reset of circuit；
When single-particle influences single-ion transient state detection circuit and voting machine circuit simultaneously, the maloperation of circuit can be caused.Knot
It closes to separate this two parts in layout design and influences single-ion transient state detection circuit and table when can ensure single ion difference
Certainly device circuit.
Embodiment described above is the present invention more preferably specific embodiment, and those skilled in the art is in this hair
The usual variations and alternatives carried out in the range of bright technical solution should all include within the scope of the present invention.
Claims (6)
1. a kind of triplication redundancy structure of self-healing anti-single particle error accumulation, it is characterised in that including：Triplication redundancy circuit
With self-repairing circuit；Wherein,
Triplication redundancy circuit is connected with self-repairing circuit, and self-repairing circuit is detected according to the output of triplication redundancy circuit to be sentenced
Not Jian Ce single-particle soft error, when detecting single-particle soft error, self-repairing circuit carries out triplication redundancy circuit set/multiple
Bit manipulation.
2. the triplication redundancy structure of self-healing anti-single particle error accumulation according to claim 1, which is characterized in that institute
Stating triplication redundancy circuit includes the first combinational logic circuit (101), the first trigger (102), the second combinational logic circuit
(103), the second trigger (104), the 3rd combinational logic circuit (105), the 3rd trigger (106) and voting circuit (107)；Its
In,
The input signal INPUT of triplication redundancy circuit is by the first combinational logic circuit (101), the second combinational logic circuit
(103), the 3rd combinational logic circuit (105) is respectively by three identical first triggers (102), the second triggers
(104), the 3rd trigger (106) latches, and the respective output of three triggers obtains after being put to the vote by voting machine (107)
Final output signal OUTPUT.
3. the triplication redundancy structure of self-healing anti-single particle error accumulation according to claim 2, which is characterized in that institute
Stating self-repairing circuit includes single-particle soft error detection circuit (108), set data selection circuit (109), reseting data selection
Circuit (110) and phase inverter (111)；Wherein,
The respective output of the three triggers input as single-particle soft error detection circuit (108) simultaneously, single-particle soft error
The output of detection circuit (108) is connected to the control terminal of set data selector (109) and reseting data selector (110), external
The input of reset signal CDN and output signal OUTPUT as reseting data selector (110), reseting data selector (110)
Output terminate to the reset terminals of three triggers reset operation carried out to corresponding trigger；
The signal of externally input set signal SDN and output signal OUTPUT after a phase inverter (111) is as set
The input of data selector (109), the output of set data selector (109) terminate to the set end of three triggers to opposite
The trigger answered carries out set operation；
Single-particle soft error detection circuit (108) is according to the first trigger (102), the second trigger (104), the 3rd trigger
(106) output is detected differentiation detection single-particle soft error, when detecting single-particle soft error, is selected by set data
It selects device (109) and reseting data selector (110) selection output signal OUTPUT carries out set/reset behaviour to each trigger
Make.
4. the triplication redundancy structure of self-healing anti-single particle error accumulation according to claim 2, it is characterised in that also
Including：When voting circuit (107) is attacked by single-particle, single-particle soft error occurs for output signal OUTPUT, and single-particle is soft
Error detection circuit (108) does not detect single-particle soft error, and each trigger will not be resetted or set is grasped
Make.
5. the triplication redundancy structure of self-healing anti-single particle error accumulation according to claim 3, which is characterized in that when
Any one in three triggers under single-particle acts on when generating soft error, through single-particle soft error detection circuit (108)
Set/reset operation is carried out to circuit using signal OUTPUT is exported with data selection circuit, soft error is recovered；Work as list
When particle soft error detection circuit (108) is attacked by single-particle, it can mistakenly trigger set data selector (109) and reset number
According to selector (110) and output signal OUTPUT is selected to carry out set/reset operation to each trigger, due to exporting signal
OUTPUT is correct, and set/reset operates the mistake that will not cause each trigger.
6. the triplication redundancy structure of self-healing anti-single particle error accumulation according to claim 3, which is characterized in that single
The soft error detection signal and output signal OUTPUT of particle soft error detection circuit (108) output independently generate so that
Single particle will not influence soft error detection signal and output signal and cause maloperation simultaneously.
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| CN108847842A (en) * | 2018-06-05 | 2018-11-20 | 西安微电子技术研究所 | A kind of anti-single particle overturning asynchronous frequency dividing circuit of effect with self-refresh function |
| CN109271282A (en) * | 2018-09-06 | 2019-01-25 | 北京时代民芯科技有限公司 | A kind of single-particle multidigit is wrong independently to repair triple redundance assembly line and design method |
| CN109714025A (en) * | 2018-12-26 | 2019-05-03 | 中国科学技术大学 | The d type flip flop structure of the anti-single particle overturning and temporary disturbance of self- recoverage mechanism |
| CN111525919A (en) * | 2020-05-27 | 2020-08-11 | 上海微阱电子科技有限公司 | Redundancy structure with feedback correction |
| CN112838857A (en) * | 2021-01-27 | 2021-05-25 | 复旦大学 | Soft error reinforcement method applied to combinational logic circuit |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108766491A (en) * | 2018-06-01 | 2018-11-06 | 北京理工大学 | A kind of track loop single-particle inversion errors repair method in SRAM type FPGA pieces |
| CN108847842A (en) * | 2018-06-05 | 2018-11-20 | 西安微电子技术研究所 | A kind of anti-single particle overturning asynchronous frequency dividing circuit of effect with self-refresh function |
| CN108847842B (en) * | 2018-06-05 | 2022-02-11 | 西安微电子技术研究所 | Asynchronous frequency division circuit with self-refreshing function and capable of resisting single event upset effect |
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| CN111525919B (en) * | 2020-05-27 | 2023-09-26 | 上海微阱电子科技有限公司 | Redundant structure with feedback correction |
| CN112838857A (en) * | 2021-01-27 | 2021-05-25 | 复旦大学 | Soft error reinforcement method applied to combinational logic circuit |
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