CN108051729A - Fpga布线覆盖率测试方法 - Google Patents
Fpga布线覆盖率测试方法 Download PDFInfo
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- CN108051729A CN108051729A CN201711278984.XA CN201711278984A CN108051729A CN 108051729 A CN108051729 A CN 108051729A CN 201711278984 A CN201711278984 A CN 201711278984A CN 108051729 A CN108051729 A CN 108051729A
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- basic logic
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- fpga
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
- G01R31/318519—Test of field programmable gate arrays [FPGA]
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
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CN201711278984.XA CN108051729B (zh) | 2017-12-06 | 2017-12-06 | Fpga布线覆盖率测试方法 |
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CN201711278984.XA CN108051729B (zh) | 2017-12-06 | 2017-12-06 | Fpga布线覆盖率测试方法 |
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CN108051729A true CN108051729A (zh) | 2018-05-18 |
CN108051729B CN108051729B (zh) | 2020-03-24 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109444630A (zh) * | 2018-11-05 | 2019-03-08 | 西安智多晶微电子有限公司 | Fpga布线单元测试结构及方法 |
CN109800534A (zh) * | 2019-02-14 | 2019-05-24 | 广东高云半导体科技股份有限公司 | Fpga设计电路图生成方法、装置、计算机设备及存储介质 |
CN113295990A (zh) * | 2021-07-26 | 2021-08-24 | 中科亿海微电子科技(苏州)有限公司 | 一种生成fpga可行性测试路径的方法、系统、介质及设备 |
CN117783841A (zh) * | 2023-12-27 | 2024-03-29 | 苏州异格技术有限公司 | 一种fpga布线覆盖率测试方法、装置、设备及介质 |
Citations (7)
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US6651238B1 (en) * | 2001-04-17 | 2003-11-18 | Xilinx, Inc. | Providing fault coverage of interconnect in an FPGA |
CN101881811A (zh) * | 2009-05-08 | 2010-11-10 | 复旦大学 | 一种可编程逻辑器件互连资源的故障测试方法 |
CN102768692A (zh) * | 2011-05-06 | 2012-11-07 | 中国科学院微电子研究所 | 应用于fpga测试的导航布局布线方法 |
CN104281508A (zh) * | 2013-07-11 | 2015-01-14 | 京微雅格(北京)科技有限公司 | 现场可编程逻辑门阵列互连线固定故障的测试方法 |
CN105866665A (zh) * | 2016-03-31 | 2016-08-17 | 复旦大学 | 面向高性能SoC FPGA的功能遍历测试方法 |
CN106841894A (zh) * | 2016-12-23 | 2017-06-13 | 深圳市国微电子有限公司 | Fpga互连线测试方法及装置 |
CN106909728A (zh) * | 2017-02-21 | 2017-06-30 | 电子科技大学 | 一种基于增强学习的fpga互联资源配置生成方法 |
-
2017
- 2017-12-06 CN CN201711278984.XA patent/CN108051729B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6651238B1 (en) * | 2001-04-17 | 2003-11-18 | Xilinx, Inc. | Providing fault coverage of interconnect in an FPGA |
CN101881811A (zh) * | 2009-05-08 | 2010-11-10 | 复旦大学 | 一种可编程逻辑器件互连资源的故障测试方法 |
CN102768692A (zh) * | 2011-05-06 | 2012-11-07 | 中国科学院微电子研究所 | 应用于fpga测试的导航布局布线方法 |
CN104281508A (zh) * | 2013-07-11 | 2015-01-14 | 京微雅格(北京)科技有限公司 | 现场可编程逻辑门阵列互连线固定故障的测试方法 |
CN105866665A (zh) * | 2016-03-31 | 2016-08-17 | 复旦大学 | 面向高性能SoC FPGA的功能遍历测试方法 |
CN106841894A (zh) * | 2016-12-23 | 2017-06-13 | 深圳市国微电子有限公司 | Fpga互连线测试方法及装置 |
CN106909728A (zh) * | 2017-02-21 | 2017-06-30 | 电子科技大学 | 一种基于增强学习的fpga互联资源配置生成方法 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109444630A (zh) * | 2018-11-05 | 2019-03-08 | 西安智多晶微电子有限公司 | Fpga布线单元测试结构及方法 |
CN109444630B (zh) * | 2018-11-05 | 2020-12-01 | 西安智多晶微电子有限公司 | Fpga布线单元测试结构及方法 |
CN109800534A (zh) * | 2019-02-14 | 2019-05-24 | 广东高云半导体科技股份有限公司 | Fpga设计电路图生成方法、装置、计算机设备及存储介质 |
CN109800534B (zh) * | 2019-02-14 | 2020-03-10 | 广东高云半导体科技股份有限公司 | Fpga设计电路图生成方法、装置、计算机设备及存储介质 |
CN113295990A (zh) * | 2021-07-26 | 2021-08-24 | 中科亿海微电子科技(苏州)有限公司 | 一种生成fpga可行性测试路径的方法、系统、介质及设备 |
CN117783841A (zh) * | 2023-12-27 | 2024-03-29 | 苏州异格技术有限公司 | 一种fpga布线覆盖率测试方法、装置、设备及介质 |
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CN108051729B (zh) | 2020-03-24 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: FPGA wiring coverage test method Effective date of registration: 20220329 Granted publication date: 20200324 Pledgee: Pudong Development Bank of Shanghai Limited by Share Ltd. Xi'an branch Pledgor: XI'AN INTELLIGENCE SILICON TECHNOLOGY, Inc. Registration number: Y2022610000115 |
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Date of cancellation: 20230328 Granted publication date: 20200324 Pledgee: Pudong Development Bank of Shanghai Limited by Share Ltd. Xi'an branch Pledgor: XI'AN INTELLIGENCE SILICON TECHNOLOGY, Inc. Registration number: Y2022610000115 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Testing method for FPGA wiring coverage Effective date of registration: 20230331 Granted publication date: 20200324 Pledgee: Pudong Development Bank of Shanghai Limited by Share Ltd. Xi'an branch Pledgor: XI'AN INTELLIGENCE SILICON TECHNOLOGY, Inc. Registration number: Y2023610000233 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right |