CN107992310A - A kind of method and apparatus realized BQ managing electric quantity chips and quickly tested - Google Patents

A kind of method and apparatus realized BQ managing electric quantity chips and quickly tested Download PDF

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Publication number
CN107992310A
CN107992310A CN201711132236.0A CN201711132236A CN107992310A CN 107992310 A CN107992310 A CN 107992310A CN 201711132236 A CN201711132236 A CN 201711132236A CN 107992310 A CN107992310 A CN 107992310A
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CN
China
Prior art keywords
srec
updater
electric quantity
test
chips
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CN201711132236.0A
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Chinese (zh)
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CN107992310B (en
Inventor
王李成
张伟
朱立湘
尹志明
林军
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Huizhou Blueway Electronic Co Ltd
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Huizhou Blueway Electronic Co Ltd
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Priority to CN201711132236.0A priority Critical patent/CN107992310B/en
Publication of CN107992310A publication Critical patent/CN107992310A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/60—Software deployment
    • G06F8/61—Installation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/60—Software deployment
    • G06F8/65—Updates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/70—Software maintenance or management
    • G06F8/71—Version control; Configuration management

Abstract

The invention discloses a kind of method realized BQ managing electric quantity chips and quickly tested, include the following steps：The first step, match BQstudio softwares with corresponding Firmware, and sets test parameter, exports srec formatted files；The srec formatted files of the updater software configurations of power management chip, replaced with derived srec files in step S1 by second step；3rd step, open using notepad pcfg formatted files in the updater softwares of power management chip, and changes the version number of Firmware；4th step, open using notepad bqUpdater.ini files in the updater softwares of power management chip, and changes srec files cited therein；5th step, in amended updater software installations to test main frame.Invention additionally discloses a kind of test equipment realized BQ managing electric quantity chips and quickly tested.The present invention is used for realization the quick test of battery capacity managing chip.

Description

A kind of method and apparatus realized BQ managing electric quantity chips and quickly tested
Technical field
The present invention relates to battery capacity technical field of measurement and test, and in particular to one kind realizes that BQ managing electric quantity chips are quickly tested Method and apparatus.
Background technology
As requirement of the market for battery capacity display precision is higher and higher, terminal often adds one at battery core end High-precision managing electric quantity chip is (such as:The managing electric quantity chip of TI), to meet the needs of market.But often for different ends End has different chip types, or even in order to meet the requirement of all kinds of clients, chip manufacturer is directed to same type of chip The Firmware of different editions can be customized, and when chip dispatches from the factory can't change；Need us with device upgrade into different Firmware。
For managing electric quantity chip, all kinds of parameters of burning are generally required to meet the needs of different battery cores and terminal.At present Dedicated recording device is mainly developed for different types of chip and same type (different Firmware) burning mode (only Energy programming parameters are entered, and can not change the Firmware of bottom)；Or special upgrade equipment is used, after upgrading Firmware again Programming parameters.The burning of this kind of mode is various because of chip type species at present, and exploitation new equipment, equipment are required for per a Put into larger and expensive.Still by verifying summary accordingly, improving out one kind can be in existing multichannel updating apparatus Meet the method for programming parameters while upgrading Firmware versions on (EV2300 is extended to 12 passages).
The content of the invention
Present invention solves the technical problem that it is the test for how realizing that different chips are general.
To achieve the above object, the present invention provides a kind of method realized BQ managing electric quantity chips and quickly tested, including such as Lower step：
S1, match BQstudio softwares with corresponding Firmware, and sets test parameter, export srec form texts Part；
The srec formatted files of the updater software configurations of power management chip, replaced with derived srec in step S1 by S2 File；
S3, open using notepad pcfg formatted files in the updater softwares of power management chip, and changes Firmware Version number；
S4, open using notepad bqUpdater.ini files in the updater softwares of power management chip, and changes it The srec files of middle reference；
S5, in amended updater software installations to test main frame.
Further, the updater softwares described in step S5 can be connected with multiple communication tools.
A kind of equipment realized BQ managing electric quantity chips and quickly tested, including test main frame and be connected with test main frame logical News instrument, the communication tool are used for the signal conversion between PCM to be tested and test main frame.
Further, the test main frame is computer.
Further, the communication tool is multiple.
Further, the communication tool is 12 passages.
Further, the communication tool is provided with the port being connected with PCM to be tested.
Further, the port is SMBus interfaces or HDQ interfaces.
The beneficial effect that the present invention realizes mainly have it is following some：Big improvement is not required, it is only necessary to it is soft to improve updater Multi-functional power supply chip test can be achieved in part, then communication tool of arranging in pairs or groups；Test step is few, by described herein general The mode of logical upgrading can programming parameters, the mode without single upgrading+programming parameters.
Brief description of the drawings
Fig. 1 is the schematic diagram for realizing BQ managing electric quantity chip rapid test devices in the embodiment of the present invention two.
Fig. 2 is the schematic diagram that BQ managing electric quantity chip method for rapidly testing steps S1 is realized in the embodiment of the present invention one.
Fig. 3 is the schematic diagram that BQ managing electric quantity chip method for rapidly testing steps S2 is realized in the embodiment of the present invention one.
Fig. 4 is the schematic diagram that BQ managing electric quantity chip method for rapidly testing steps S3 is realized in the embodiment of the present invention one.
Fig. 5 is the schematic diagram that BQ managing electric quantity chip method for rapidly testing steps S4 is realized in the embodiment of the present invention one.
Fig. 6 is the interface realized in the embodiment of the present invention one after BQ managing electric quantity chip method for rapidly testing steps S5 installations Schematic diagram.
Attached drawing is only for illustration, it is impossible to is interpreted as the limitation to this patent；It is attached in order to more preferably illustrate the present embodiment Scheme some components to have omission, zoom in or out, do not represent the size of actual product；To those skilled in the art, Some known features and its explanation may be omitted and will be understood by attached drawing；The same or similar label corresponds to same or similar Component；The terms describing the positional relationship in the drawings are only for illustration, it is impossible to is interpreted as the limitation to this patent.
Embodiment
In order to facilitate the understanding of those skilled in the art, the present invention is carried out below in conjunction with attached drawing and embodiment further It is described in detail.
Embodiment one
Fig. 2 ~ Fig. 5 is referred to, kind is realized the method that BQ managing electric quantity chips are quickly tested, included the following steps：
S1, match BQstudio softwares with corresponding Firmware, and sets test parameter, export srec form texts Part；Be the corresponding test parameter of BQstudio software design patterns i.e. according to the Firmware of corresponding version, after the completion of from BQstudio Software exports srec formatted files, and this document contains the test parameter information of setting；
The srec formatted files of the updater software configurations of power management chip, replaced with derived srec in step S1 by S2 File；
S3, open using notepad pcfg formatted files in the updater softwares of power management chip, and changes Firmware Version number；0106 version for being such as Firmware by the Firmware version number modifications for being 0205；
S4, open using notepad bqUpdater.ini files in the updater softwares of power management chip, and changes it The srec files of middle reference, the srec file modifications that will be quoted are the srec files that oneself is needed；
S5, in amended updater software installations to test main frame, the updater softwares can be with multiple communications Instrument connects, and realizes that a software connects multiple communication tools, so as to improve work efficiency.
Embodiment two
Referring to Fig. 1, realize the equipment that BQ managing electric quantity chips are quickly tested, including test main frame and it is connected with test main frame Communication tool, the communication tool are used for the signal conversion between PCM to be tested and test main frame.The test main frame is preferred For computer, the communication tool is multiple, and the communication tool is 12 passages, the communication tool be provided with it is to be tested The port of PCM connections, the port are SMBus interfaces or HDQ interfaces, and the communication tool is preferably EV2300.
The present embodiment realizes that equipment that BQ managing electric quantity chips are quickly tested can be widely used in the TI of Texas Instrument Managing electric quantity chip, after completing modification according to the method in embodiment one using the equipment, passes through the port of communication tool setting It can be tested after being connected with PCM to be tested.
It is the wherein specific implementation of the present invention above, its description is more specific and detailed, but can not therefore manage Solve as the limitation to the scope of the claims of the present invention.It should be pointed out that for those of ordinary skill in the art, do not departing from On the premise of present inventive concept, various modifications and improvements can be made, these obvious alternative forms belong to this hair Bright protection domain.

Claims (8)

  1. A kind of 1. method realized BQ managing electric quantity chips and quickly tested, it is characterised in that include the following steps：
    S1, match BQstudio softwares with corresponding Firmware, and sets test parameter, export srec form texts Part；
    The srec formatted files of the updater software configurations of power management chip, replaced with derived srec in step S1 by S2 File；
    S3, open using notepad pcfg formatted files in the updater softwares of power management chip, and changes Firmware Version number；
    S4, open using notepad bqUpdater.ini files in the updater softwares of power management chip, and changes it The srec files of middle reference；
    S5, in amended updater software installations to test main frame.
  2. 2. the method according to claim 1 realized BQ managing electric quantity chips and quickly tested, it is characterised in that：In step S5 The updater softwares can be connected with multiple communication tools.
  3. 3. a kind of method testing equipment for realizing that BQ managing electric quantity chips are quickly tested in claim 1 and 2, its feature exist In：The communication tool being connected including test main frame and with test main frame, the communication tool are used for PCM to be tested and test main frame Between signal conversion.
  4. 4. test equipment according to claim 3, it is characterised in that：The test main frame is computer.
  5. 5. test equipment according to claim 4, it is characterised in that：The communication tool is multiple.
  6. 6. the method according to claim 5 realized BQ managing electric quantity chips and quickly tested, it is characterised in that：Described is logical News instrument is 12 passages.
  7. 7. test equipment according to claim 6, it is characterised in that：The communication tool is provided with to be connected with PCM to be tested The port connect.
  8. 8. test equipment according to claim 7, it is characterised in that：The port is SMBus interfaces or HDQ interfaces.
CN201711132236.0A 2017-11-15 2017-11-15 Method and equipment for realizing rapid test of BQ electric quantity management chip Active CN107992310B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711132236.0A CN107992310B (en) 2017-11-15 2017-11-15 Method and equipment for realizing rapid test of BQ electric quantity management chip

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Application Number Priority Date Filing Date Title
CN201711132236.0A CN107992310B (en) 2017-11-15 2017-11-15 Method and equipment for realizing rapid test of BQ electric quantity management chip

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CN107992310B CN107992310B (en) 2021-07-13

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040205779A1 (en) * 2003-04-10 2004-10-14 International Business Machines Corporation Firmware update mechanism in a multi-node data processing system
CN101384997A (en) * 2006-03-01 2009-03-11 安讯士有限公司 Method and system for upgrading a plurality of devices
CN102830987A (en) * 2011-06-14 2012-12-19 英业达股份有限公司 Burning method
CN203084156U (en) * 2012-12-19 2013-07-24 天津渤海易安泰电子半导体测试有限公司 Cell management chip test equipment
CN105632557A (en) * 2016-02-24 2016-06-01 惠州市蓝微电子有限公司 Electricity amount management IC burn upgrading method, device and system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040205779A1 (en) * 2003-04-10 2004-10-14 International Business Machines Corporation Firmware update mechanism in a multi-node data processing system
CN101384997A (en) * 2006-03-01 2009-03-11 安讯士有限公司 Method and system for upgrading a plurality of devices
CN102830987A (en) * 2011-06-14 2012-12-19 英业达股份有限公司 Burning method
CN203084156U (en) * 2012-12-19 2013-07-24 天津渤海易安泰电子半导体测试有限公司 Cell management chip test equipment
CN105632557A (en) * 2016-02-24 2016-06-01 惠州市蓝微电子有限公司 Electricity amount management IC burn upgrading method, device and system

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