CN203084156U - Cell management chip test equipment - Google Patents

Cell management chip test equipment Download PDF

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Publication number
CN203084156U
CN203084156U CN 201220721933 CN201220721933U CN203084156U CN 203084156 U CN203084156 U CN 203084156U CN 201220721933 CN201220721933 CN 201220721933 CN 201220721933 U CN201220721933 U CN 201220721933U CN 203084156 U CN203084156 U CN 203084156U
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CN
China
Prior art keywords
pxi
circuit board
integrated circuit
management chip
test machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN 201220721933
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Chinese (zh)
Inventor
黄瑞
赵春莲
朱里
周宪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tianjin Jinneng Yiantai Technology Co ltd
Original Assignee
TIANJIN EMPIRETEST Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to CN 201220721933 priority Critical patent/CN203084156U/en
Application granted granted Critical
Publication of CN203084156U publication Critical patent/CN203084156U/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

The utility model discloses c ell management chip test equipment, comprising a computer, a test machine and an interface circuit. The test machine comprises a PXI cabinet and PXI functional board cards fixedly arranged in the PXI slots of the PXI cabinet. The PXI functional board cards comprise a linear power board card, an electronic load board card, a digital universal meter board card, an oscilloscope, a digital I/O card board, an internal resistance test device board card and an industrial grade I/O board card. The test machine is connected with the computer through a serial port RS232 and a PCI Express interface; the interface circuit is respectively mutually electrically connected with the computer and the test machine; and the cell management chip to be measured is mutual electrically connected with the interface circuit. According to the cell management chip test equipment, the test precision is high, the performance is stable, operation is convenient, and time cost is saved.

Description

The battery management chip testing apparatus
Technical field
The utility model relates to a kind of testing apparatus, particularly a kind of battery management chip testing apparatus.
Background technology
Battery management chip is the gordian technique of power battery pack, it plays critical effect to aspects such as guaranteeing cell safety and use, give full play to the ability of battery reliably and increase the service life, and is also of crucial importance to guarantee its operate as normal to the detection of battery management chip simultaneously.For the high power battery group, if each monomer is in non-balanced state, then to a certain specific monomer battery, be tantamount to be in the abuse state especially, the dangerous of this cell may cause the dangerous of whole battery group.Therefore the safety research of battery system has been become the research emphasis of current field of batteries.
The utility model content
Technical problem to be solved in the utility model provides a kind of measuring accuracy height, stable performance, be convenient to the battery management chip testing apparatus of operating, saving time cost.
In order to solve the problems of the technologies described above, the technical solution adopted in the utility model is:
A kind of battery management chip testing apparatus comprises: computing machine, test machine and interface circuit;
Described test machine comprises: the PXI cabinet, be fixedly mounted on the PXI functional cards in the PXI slot of described PXI cabinet; Described PXI functional cards comprises linear power supply integrated circuit board, electronic load integrated circuit board, digital multimeter integrated circuit board, oscillograph and digital I/O integrated circuit board, internal resistance instrument integrated circuit board, technical grade I/O integrated circuit board;
Described test machine links to each other with described computing machine with PCI Express interface by serial ports RS232; Described interface circuit is electrically connected mutually with described computing machine and test machine respectively; The mesuring battary managing chip is electrically connected mutually with described interface circuit.
Preferably, the model of described digital multimeter integrated circuit board is NI PXI-4071, and the model of described oscillograph and digital I/O integrated circuit board is NI PXI-6250, and the model of described technical grade I/O integrated circuit board is NI PXI-6513.
The beneficial effects of the utility model are:
Adopt high independent instrument and the high power interface circuit of reliability to form a whole set of testing apparatus, but assurance equipment long-time steady operation also can effectively be avoided electromagnetic interference (EMI) between single instrument;
High-acruracy survey: the voltage measurement precision ± (0.1%+3mV), overcurrent protection testing current precision ± (0.2%+0.25%FS), conducting internal resistance precision ± (1%+1m Ω), Time delay measurement precision ± 1us;
Testing process, measuring accuracy and test duration can independently be selected according to the actual requirements, and the handled easily person rationalizes adjustment to reduce the test duration, and cost saves time.
Description of drawings
The structural representation of the battery management chip testing apparatus that Fig. 1 provides for the utility model.
Embodiment
Below in conjunction with the drawings and specific embodiments the utility model is described in further detail:
From the utility model embodiment shown in Figure 1 as can be known:
The utility model battery management chip testing apparatus comprises: computing machine 1, test machine 2 and interface circuit 3;
Test machine 2 comprises: PXI cabinet 21, be fixedly mounted on the PXI functional cards 22 in the PXI slot of PXI cabinet 21; PXI functional cards 22 comprises linear power supply integrated circuit board 221, electronic load integrated circuit board 222, digital multimeter integrated circuit board 223, oscillograph and digital I/O integrated circuit board 224, internal resistance instrument integrated circuit board 225, technical grade I/O integrated circuit board 226;
Test machine 2 links to each other with computing machine 1 with PCI Express interface by serial ports RS232; Interface circuit 3 is electrically connected mutually with computing machine 1 and test machine 2 respectively; The mesuring battary managing chip is electrically connected mutually with interface circuit 3.
The model of digital multimeter integrated circuit board 223 is NI PXI-4071, and the model of oscillograph and digital I/O integrated circuit board 224 is NI PXI-6250, and the model of technical grade I/O integrated circuit board 226 is NI PXI-6513.
Owing to need to carry out between different test points, to switch in interface conversion (RS485 RS 232) and the test machine 2 between computing machine 1 and the battery management chip, therefore need to add interface circuit 3.Interface circuit 3 is controlled by computing machine 1 and test machine 2 jointly, satisfies above two demands.
Interface circuit 3 is drawn test lead and is linked to each other with the mesuring battary managing chip.
Interface circuit 3 switches the link circuit of linear power panel card 221, electronic load integrated circuit board 222, digital multimeter integrated circuit board 223, oscillograph and digital I/O integrated circuit board 224, internal resistance instrument integrated circuit board 225, technical grade I/O integrated circuit board 226 according to the specific requirement of test event, to reach the purpose of test difference in functionality.
The electric parameter of linear power supply integrated circuit board 221, electronic load integrated circuit board 222 control test loops, the data that digital multimeter integrated circuit board 223, oscillograph and digital I/O integrated circuit board 224, internal resistance instrument integrated circuit board 225 collect transfer in the computing machine 1 via interface circuit 3, carry out data processing and draw test result.
In sum, content of the present utility model is not limited in the above-described embodiments, and those skilled in the art can propose other embodiment easily according to guiding theory of the present utility model, and these embodiments all are included within the scope of the present utility model.

Claims (2)

1. battery management chip testing apparatus, comprising: computing machine (1), test machine (2) and interface circuit (3) is characterized in that:
Described test machine (2) comprising: PXI cabinet (21), be fixedly mounted on the PXI functional cards (22) in the PXI slot of described PXI cabinet (21); Described PXI functional cards (22) comprises linear power supply integrated circuit board (221), electronic load integrated circuit board (222), digital multimeter integrated circuit board (223), oscillograph and digital I/O integrated circuit board (224), internal resistance instrument integrated circuit board (225), technical grade I/O integrated circuit board (226);
Described test machine (2) links to each other with described computing machine (1) with PCI Express interface by serial ports RS232; Described interface circuit (3) is electrically connected mutually with described computing machine (1) and test machine (2) respectively; The mesuring battary managing chip is electrically connected mutually with described interface circuit (3).
2. battery management chip testing apparatus according to claim 1, it is characterized in that: the model of described digital multimeter integrated circuit board (223) is NI PXI-4071, the model of described oscillograph and digital I/O integrated circuit board (224) is NI PXI-6250, and the model of described technical grade I/O integrated circuit board (226) is NIPXI-6513.
CN 201220721933 2012-12-19 2012-12-19 Cell management chip test equipment Expired - Lifetime CN203084156U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220721933 CN203084156U (en) 2012-12-19 2012-12-19 Cell management chip test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220721933 CN203084156U (en) 2012-12-19 2012-12-19 Cell management chip test equipment

Publications (1)

Publication Number Publication Date
CN203084156U true CN203084156U (en) 2013-07-24

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220721933 Expired - Lifetime CN203084156U (en) 2012-12-19 2012-12-19 Cell management chip test equipment

Country Status (1)

Country Link
CN (1) CN203084156U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106443283A (en) * 2016-11-21 2017-02-22 国网山东省电力公司电力科学研究院 Testing platform and testing method for power management system of inspection robot of transformer substation
CN107003363A (en) * 2015-02-26 2017-08-01 株式会社Lg 化学 Functional verification system for secondary cell managing device
CN107992310A (en) * 2017-11-15 2018-05-04 惠州市蓝微电子有限公司 A kind of method and apparatus realized BQ managing electric quantity chips and quickly tested

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107003363A (en) * 2015-02-26 2017-08-01 株式会社Lg 化学 Functional verification system for secondary cell managing device
CN106443283A (en) * 2016-11-21 2017-02-22 国网山东省电力公司电力科学研究院 Testing platform and testing method for power management system of inspection robot of transformer substation
CN107992310A (en) * 2017-11-15 2018-05-04 惠州市蓝微电子有限公司 A kind of method and apparatus realized BQ managing electric quantity chips and quickly tested

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Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: TIANJIN JINNENG YIANTAI TECHNOLOGY CO., LTD.

Free format text: FORMER NAME: TIANJIN EMPIRETEST CORPORATION

CP03 Change of name, title or address

Address after: 300384 Huayuan Industrial Zone Tianjin City Road No. 10

Patentee after: TIANJIN JINNENG YIANTAI TECHNOLOGY CO.,LTD.

Address before: Huayuan Science Park, Binhai hi tech Industrial Development Zone, Tanggu District, Tianjin city 300384 Haitai development road six No. 6 Haitai green industry base 3 door 301 seat M8

Patentee before: TIANJIN EMPIRETEST Corp.

CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20130724