CN107992310B - Method and equipment for realizing rapid test of BQ electric quantity management chip - Google Patents
Method and equipment for realizing rapid test of BQ electric quantity management chip Download PDFInfo
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- CN107992310B CN107992310B CN201711132236.0A CN201711132236A CN107992310B CN 107992310 B CN107992310 B CN 107992310B CN 201711132236 A CN201711132236 A CN 201711132236A CN 107992310 B CN107992310 B CN 107992310B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/60—Software deployment
- G06F8/61—Installation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/60—Software deployment
- G06F8/65—Updates
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/70—Software maintenance or management
- G06F8/71—Version control; Configuration management
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Abstract
The invention discloses a method for realizing rapid test of a BQ electric quantity management chip, which comprises the following steps: matching the BQstudios software with corresponding Firmware, setting test parameters and exporting an srec format file; step two, replacing the srec format file configured by the updater software of the power management chip with the srec file exported in the step S1; thirdly, opening a pcfg format file in the updater software of the power management chip by using the notepad, and modifying the version number of Firmware; fourthly, opening a bqUpdater. ini file in the update software of the power management chip by using the notepad, and modifying the srec file quoted in the bqUpdater. ini file; and fifthly, installing the modified update software on the test host. The invention also discloses a test device for realizing the rapid test of the BQ electric quantity management chip. The invention is used for realizing the rapid test of the battery power management chip.
Description
Technical Field
The invention relates to the technical field of battery power testing, in particular to a method and equipment for realizing rapid testing of a BQ power management chip.
Background
With the market demand for the display accuracy of the battery power being higher and higher, the terminal usually adds a high-accuracy power management chip (such as a TI power management chip) to the electric core end to meet the market demand. However, different chip types are often available for different terminals, even in order to meet the requirements of various customers, a chip manufacturer can also customize Firmware of different versions for the same type of chip, and the chip is not changed when leaving a factory; we need to upgrade our equipment to different Firmware.
For a power management chip, various parameters are required to be burned to meet the requirements of different battery cores and terminals. At present, for different types of chips and the same type (different Firmware) burning mode, special burning equipment (only parameters can be burned, and the Firmware of the bottom layer cannot be changed) is mainly developed; or using special upgrading equipment to update Firmware and then recording the parameters. At present, due to the variety of chip types, new equipment needs to be developed for each type, so that the equipment investment is large and the price is high. Therefore, through corresponding verification summary, a method capable of meeting requirements of upgrading the Firmware version and simultaneously burning parameters on the existing multi-channel upgrading equipment (EV2300 is expanded into 12 channels) is perfected.
Disclosure of Invention
The invention solves the technical problem of how to realize universal test of different chips.
In order to achieve the above object, the present invention provides a method for realizing a rapid test of a BQ power management chip, comprising the following steps:
s1, matching the BQstudios software with corresponding Firmware, setting test parameters, and exporting an srec format file;
s2, replacing the srec format file configured by the updater software of the power management chip with the srec file exported in the step S1;
s3, opening a pcfg format file in the updater software of the power management chip by using the notepad, and modifying the version number of Firmware;
s4, opening a bqUpdater. ini file in the updater software of the power management chip by using the notepad, and modifying the srec file quoted in the bqUpdater. ini file;
and S5, installing the modified updater software on the test host.
Further, the updater software described in step S5 may be connected to a plurality of communication tools.
The device for realizing the rapid test of the BQ power management chip comprises a test host and a communication tool connected with the test host, wherein the communication tool is used for signal conversion between a PCM to be tested and the test host.
Furthermore, the test host is a computer.
Further, the communication tools are multiple.
Further, all the communication tools are 12 channels.
Further, the communication tool is provided with a port connected with the PCM to be tested.
Further, the port is an SMBus interface or an HDQ interface.
The beneficial effects realized by the invention mainly comprise the following points: the multifunctional power supply chip test can be realized only by improving the updater software and matching with a communication tool without great improvement; the test procedures are few, parameters can be burned through the common upgrading mode in the application, and an independent upgrading and parameter burning mode is not needed.
Drawings
Fig. 1 is a schematic diagram of a device for implementing rapid test of a BQ power management chip according to a second embodiment of the present invention.
Fig. 2 is a schematic diagram of step S1 of the method for implementing rapid test of a BQ power management chip according to an embodiment of the present invention.
Fig. 3 is a schematic diagram of step S2 of the method for implementing rapid test of a BQ power management chip according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of step S3 of the method for implementing rapid test of a BQ power management chip according to an embodiment of the present invention.
Fig. 5 is a schematic diagram of step S4 of the method for implementing rapid test of a BQ power management chip according to the first embodiment of the invention.
Fig. 6 is a schematic diagram of an interface after step S5 of the method for implementing rapid test of a BQ power management chip according to the first embodiment of the present invention is installed.
The drawings are for illustrative purposes only and are not to be construed as limiting the patent; for the purpose of better illustrating the embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product; it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted; the same or similar reference numerals correspond to the same or similar parts; the terms describing positional relationships in the drawings are for illustrative purposes only and are not to be construed as limiting the patent.
Detailed Description
In order to facilitate understanding for those skilled in the art, the present invention will be described in further detail with reference to the accompanying drawings and examples.
Example one
Referring to fig. 2 to 5, a method for implementing a quick test of a BQ power management chip includes the following steps:
s1, matching the BQstudios software with corresponding Firmware, setting test parameters, and exporting an srec format file; setting corresponding test parameters for the BQstudios software according to the Firmware of a corresponding version, and exporting an srec format file from the BQstudios software after the setting is finished, wherein the file contains the set test parameter information;
s2, replacing the srec format file configured by the updater software of the power management chip with the srec file exported in the step S1;
s3, opening a pcfg format file in the updater software of the power management chip by using the notepad, and modifying the version number of Firmware; for example, the version number of 0205 of Firmware is modified into 0106 of Firmware;
s4, opening a bqUpdater. ini file in the updater software of the power management chip by using the notepad, and modifying the quoted srec file, namely modifying the quoted srec file into a required srec file;
s5, installing the modified updater software on the test host, wherein the updater software can be connected with a plurality of communication tools, so that one software is connected with a plurality of communication tools, and the working efficiency is improved.
Example two
Referring to fig. 1, the apparatus for implementing a rapid test of a BQ power management chip includes a test host and a communication tool connected to the test host, where the communication tool is used for signal conversion between a PCM to be tested and the test host. The test host is preferably a computer, the number of the communication tools is multiple, the communication tools are all 12 channels, each communication tool is provided with a port connected with the PCM to be tested, the port is an SMBus interface or an HDQ interface, and the communication tools are preferably EVs 2300.
The device for realizing the rapid test of the BQ power management chip can be widely used for TI power management chips of Texas instruments, and can be used for testing after being modified according to the method in the first embodiment and connected with the PCM to be tested through the port arranged on the communication tool.
The foregoing is a detailed description of the invention, which is described in greater detail and not intended to limit the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications are possible without departing from the inventive concept, and such obvious alternatives fall within the scope of the invention.
Claims (5)
1. A method for realizing rapid test of a BQ power management chip is characterized by comprising the following steps:
s1, matching the BQstudios software with corresponding Firmware, setting test parameters, and exporting an srec format file;
s2, replacing the srec format file configured by the updater software of the power management chip with the srec file exported in the step S1;
s3, opening a pcfg format file in the updater software of the power management chip by using the notepad, and modifying the version number of Firmware;
s4, opening a bqUpdater. ini file in the updater software of the power management chip by using the notepad, and modifying the srec file quoted in the bqUpdater. ini file;
s5, installing the modified updater software on a test host;
the updater software in the step S5 is connected to a plurality of communication tools, so that one software is connected to a plurality of communication tools, thereby improving the working efficiency.
2. A test apparatus for implementing the method for rapidly testing the BQ power management chip of claim 1, wherein the test apparatus comprises: the system comprises a test host and a communication tool connected with the test host, wherein the communication tool is used for signal conversion between the PCM to be tested and the test host; the test host is a computer, and the communication tools are multiple.
3. The test equipment for implementing the method for rapidly testing the BQ power management chip as claimed in claim 2, wherein: the communication tools are all 12 channels.
4. The test equipment for implementing the method for rapidly testing the BQ power management chip as claimed in claim 3, wherein: the communication tool is provided with a port for connecting with the PCM to be tested.
5. The test equipment for implementing the method for rapidly testing the BQ power management chip as claimed in claim 4, wherein: the port is an SMBus interface or an HDQ interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711132236.0A CN107992310B (en) | 2017-11-15 | 2017-11-15 | Method and equipment for realizing rapid test of BQ electric quantity management chip |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711132236.0A CN107992310B (en) | 2017-11-15 | 2017-11-15 | Method and equipment for realizing rapid test of BQ electric quantity management chip |
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| Publication Number | Publication Date |
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| CN107992310A CN107992310A (en) | 2018-05-04 |
| CN107992310B true CN107992310B (en) | 2021-07-13 |
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| CN201711132236.0A Active CN107992310B (en) | 2017-11-15 | 2017-11-15 | Method and equipment for realizing rapid test of BQ electric quantity management chip |
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Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7219343B2 (en) * | 2003-04-10 | 2007-05-15 | International Business Machines Corporation | Firmware update mechanism in a multi-node data processing system |
| WO2007100288A1 (en) * | 2006-03-01 | 2007-09-07 | Axis Ab | Method and system for upgrading a plurality of devices |
| CN102830987B (en) * | 2011-06-14 | 2015-07-01 | 英业达股份有限公司 | Burning method |
| CN203084156U (en) * | 2012-12-19 | 2013-07-24 | 天津渤海易安泰电子半导体测试有限公司 | Cell management chip test equipment |
| CN105632557B (en) * | 2016-02-24 | 2020-03-17 | 惠州市蓝微电子有限公司 | Burning upgrading method, device and system for electric quantity management IC |
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