CN110058143B - Baud chart jig and using method thereof - Google Patents
Baud chart jig and using method thereof Download PDFInfo
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- CN110058143B CN110058143B CN201910307896.0A CN201910307896A CN110058143B CN 110058143 B CN110058143 B CN 110058143B CN 201910307896 A CN201910307896 A CN 201910307896A CN 110058143 B CN110058143 B CN 110058143B
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- 238000000034 method Methods 0.000 title claims abstract description 19
- 238000012360 testing method Methods 0.000 claims abstract description 177
- 238000006243 chemical reaction Methods 0.000 claims abstract description 27
- 230000004044 response Effects 0.000 claims abstract description 17
- 238000010586 diagram Methods 0.000 claims abstract description 15
- 230000000087 stabilizing effect Effects 0.000 claims abstract description 10
- 241000270728 Alligator Species 0.000 claims description 7
- 238000005070 sampling Methods 0.000 claims 1
- 230000008569 process Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 241000270722 Crocodylidae Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- LNNWVNGFPYWNQE-GMIGKAJZSA-N desomorphine Chemical compound C1C2=CC=C(O)C3=C2[C@]24CCN(C)[C@H]1[C@@H]2CCC[C@@H]4O3 LNNWVNGFPYWNQE-GMIGKAJZSA-N 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
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- Mathematical Physics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention belongs to the technical field of server testing, and relates to a server board card baud diagram testing jig and a using method thereof, wherein the testing jig comprises a voltage stabilizing module, a control module and a voltage conversion module, the voltage stabilizing module is used for enabling an external power supply to provide stable voltage for the voltage conversion module, the control module is used for providing an enabling signal for the voltage conversion module so as to enable the voltage conversion module to normally work, and the voltage conversion module is used for outputting 3V3 voltage and verifying a testing environment; and a connecting unit is arranged on a feedback loop of the voltage conversion module and used for connecting the server board card to be tested and the frequency response analyzer. The Baud chart test fixture does not need to be connected with a resistor in series in a feedback loop of a server board card to be tested during test, and only needs to be connected with a flying wire, so that the operation difficulty is reduced, and the working efficiency is improved.
Description
Technical Field
The invention belongs to the technical field of server testing, and relates to a baud chart jig and a using method thereof.
Background
In the rapidly developing current society, along with the development of cloud computing applications, informatization gradually covers all fields of the society. People's daily life and daily life are more and more communicated through the network, and the network data volume is also increasing continuously. In order to meet the increasing demand of information services, the functions of the server are more and more abundant, and in order to support more and more functions, the circuit design of the server board card is more and more complex.
The circuit is more complicated and more stable, a baud graph is required to be tested for testing the stability of the circuit loop, the magnitude and the phase of the system gain under different frequencies can be seen by using the baud graph, and the trend that the magnitude and the phase change along with the frequency can be seen.
The traditional test method of the baud chart is to use a frequency response analyzer Venable 6305 to measure, but the traditional baud chart test has a plurality of defects due to the fact that the operation is too simple and easy: firstly, if no test resistor is reserved in a circuit in the process of testing the Baud chart, a new resistor needs to be reworked every time of testing, and the resource can not be reused completely; secondly, if a 0ohn resistor is not reserved in the circuit in the baud diagram test, the trace needs to be isolated, and then a 20ohm resistor is connected in series, so that the operation difficulty is greatly increased, and the working efficiency is greatly reduced; thirdly, each time the baud chart is tested, the resistance of the rework needs to be welded on the frequency response analyzer, the action is repeated, and the working efficiency is greatly reduced; finally, because of the error of the frequency response analyzer itself, the test welding technique is required to be very precise. Many test fail may be due to the environment itself, and the influence of these environmental factors is excluded during the test process, which greatly increases the workload of the engineer.
Disclosure of Invention
The invention provides a server board card baud chart test fixture and a use method thereof, and the baud chart test fixture does not need to be connected with a resistor in a feedback loop of a server board card to be tested in a test process, only needs to be connected with a flying wire, reduces the operation difficulty and improves the working efficiency.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a server board card baud diagram test fixture comprises a voltage stabilizing module, a control module and a voltage conversion module, wherein the voltage stabilizing module is used for enabling an external power supply to provide stable voltage for the voltage conversion module, the control module is used for providing an enabling signal for the voltage conversion module so as to enable the voltage conversion module to normally work, and the voltage conversion module is used for outputting 3V3 voltage and verifying a test environment;
and a connecting unit is arranged on a feedback loop of the voltage conversion module and used for connecting the server board card to be tested and the frequency response analyzer.
Preferably, the voltage stabilizing module is composed of an MP5023GV-0000-Z chip.
Preferably, the control module is composed of an LCMXO2-2000HC-4FTG256I chip.
Preferably, the voltage conversion module is composed of a TPS53319DQPR chip.
Preferably, the connection unit is a loop feedback end arranged on the TPS53319DQPR chip, and the connection unit includes a first test point, a second test point, a third test point, and a fourth test point, where the first test point and the third test point are used to connect to a server to be tested, and the second test point and the fourth test point are used to connect to a frequency response analyzer.
Preferably, the first test point, the second test point, the third test point and the fourth test point are respectively provided with a pin header of 2.54 mm.
Preferably, the first test point and the second test point are arranged at a near VFB end of the TPS53319DQPR chip, and the third test point and the fourth test point are arranged at a near output end of the TPS53319DQPR chip.
The invention also provides a use method of the server board card baud chart test fixture, which comprises the following steps:
connecting the frequency response analyzer with a connecting unit of the test fixture, operating the test system and testing the waveform;
checking the test waveform to determine that the test environment has no problem;
if a reserved resistor is arranged on a feedback loop of the server board card to be tested, the resistor is removed, two flying wires are arranged at two ends of the resistor and connected to the connecting unit, and then the test is carried out;
and if no reserved resistor is arranged on the feedback loop of the server board card to be tested, the trace of the feedback loop is cut off, two flying wires are arranged at two ends of the trace and connected to the connecting unit, and then the test is carried out.
Preferably, the use method of the server board baud chart test fixture comprises the following steps:
connecting CH1 and CH2 ends of the frequency response analyzer with a second test point and a fourth test point of the test fixture respectively, operating the test system and testing the waveform;
checking the test waveform to determine that the test environment has no problem;
checking whether a resistor is reserved on a feedback loop of the server board card to be tested;
if a reserved resistor is arranged on a feedback loop of the server board card to be tested, the resistor is removed, two flying wires are arranged at two ends of the resistor and connected to the first test point and the third test point, and then the test is carried out;
and if no reserved resistor is arranged on a feedback loop of the server board card to be tested, the trace of the feedback loop is cut off, two flying leads are arranged at two ends of the trace and connected to the first test point and the third test point, and then the test is carried out.
Preferably, the flying lead is connected to the pins of the first test site and the third test site through alligator clips.
The invention has the beneficial effects that:
when the baud chart is tested, the test fixture is arranged between the server board card to be tested and the frequency response analyzer, the test fixture is provided with the test points, before testing, the test fixture is used for calibrating the test environment, so that no problem exists in the test environment, the test accuracy is improved, and then the server board card to be tested is connected. The test point on the feedback loop to be tested of the board card can be directly connected with the pin header of the test fixture through the flying wire and the alligator clip, and a resistor does not need to be connected in series in a loop of the board card, so that the difficulty of operation is greatly reduced, the working efficiency is greatly improved, the reuse of the test resistor can be realized, and the resources are saved.
Drawings
Fig. 1 is a schematic structural diagram of a server board baud chart test fixture according to the present invention.
Fig. 2 is a schematic structural diagram of a server board baud diagram test fixture according to an embodiment of the present invention.
Fig. 3 is a schematic flow chart of a method for using the server board baud chart test fixture according to the embodiment of the present invention.
Fig. 4 is a schematic diagram of a test environment connection according to an embodiment of the present invention.
Detailed Description
In order to clearly explain the technical features of the present invention, the following detailed description of the present invention is provided with reference to the accompanying drawings. The invention will be better understood from the following examples. However, it is easily understood by those skilled in the art that the following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
The server board baud chart test fixture and the use method thereof provided by the embodiment of the invention are described in detail below with reference to the accompanying drawings.
As shown in fig. 1, the embodiment of the invention discloses a server board baud diagram test fixture, which comprises a voltage stabilizing module, a control module and a voltage conversion module, wherein the voltage stabilizing module is used for enabling an external power supply to provide stable voltage for the voltage conversion module, the control module is used for providing an enabling signal for the voltage conversion module so as to enable the voltage conversion module to normally work, and the voltage conversion module is used for outputting 3V3 voltage to verify a test environment;
and a connecting unit is arranged on a feedback loop of the voltage conversion module and used for connecting the server board card to be tested and the frequency response analyzer.
As shown in FIG. 2, in this embodiment, the voltage regulation module is composed of a MP5023GV-0000-Z chip, the control module is composed of a LCMXO2-2000HC-4FTG256I chip, and the voltage conversion module is composed of a TPS53319DQPR chip. The connecting unit is a loop feedback end arranged on a TPS53319DQPR chip, and comprises a first test point, a second test point, a third test point and a fourth test point, wherein the first test point, the second test point, the third test point and the fourth test point are respectively provided with a pin header of 2.54mm, the four test points are respectively arranged at positions 1, 2, 3 and 4 shown in figure 2, the first test point and the third test point (such as 1 and 3 in figure 2) are used for connecting a server to be tested, and the second test point and the fourth test point (such as 2 and 4 in figure 2) are used for connecting a frequency response analyzer.
As shown in fig. 2, the first test point and the second test point are disposed at a near VFB end of the TPS53319DQPR chip, and the third test point and the fourth test point are disposed at a near output end of the TPS53319DQPR chip.
The invention also provides a use method of the server board card baud chart test fixture, which comprises the following steps of:
connecting the frequency response analyzer with a connecting unit of the test fixture, operating the test system and testing the waveform;
checking the test waveform to determine that the test environment has no problem;
if a reserved resistor is arranged on a feedback loop of the server board card to be tested, the resistor is removed, two flying wires are arranged at two ends of the resistor and connected to the connecting unit, and then the test is carried out;
and if no reserved resistor is arranged on the feedback loop of the server board card to be tested, the trace of the feedback loop is cut off, two flying wires are arranged at two ends of the trace and connected to the connecting unit, and then the test is carried out.
As shown in fig. 4, as a preferred embodiment, the method for using the server board baud diagram test fixture includes the following steps:
connecting the CH1 and CH2 ends of the frequency response analyzer with the second test point and the fourth test point of the test fixture respectively, operating the test system, and testing the waveform:
wherein, the CH1 end is connected with a second test point on a TPS53319DQPR chip feedback loop, the CH2 end is connected with a fourth test point on the TPS53319DQPR chip feedback loop, the crocodile clips at the CH1 and CH2 ends are directly connected with pins on the test points, and then the normal operation software Venable3120system tests waveforms;
checking the test waveform to determine that the test environment has no problem;
checking whether a resistor is reserved on a feedback loop of the server board card to be tested;
if a reserved resistor is arranged on a feedback loop of the server board card to be tested, the resistor is removed, two flying wires are arranged at two ends of the resistor and connected to the first test point and the third test point, and then the test is carried out:
the method comprises the following steps of directly welding a resistor by using an iron, connecting two flying wires at two ends of the resistor to alligator clips, respectively connecting the flying wires to pins of a first test point and a third test point through the alligator clips, paying attention to the fact that the CH1 ends and the CH2 ends are not connected reversely, and then normally operating software Venable3120system to test waveforms;
if no reserved resistor is arranged on a feedback loop of the server board card to be tested, a trace of the feedback loop is cut off, two flying wires are arranged at two ends of the trace and connected to the first test point and the third test point, and then the test is carried out:
when no reserved resistor exists, the trace on a feedback loop of the server board card to be tested is cut off, two flying wires are welded at two ends of the trace and connected to the alligator clip, the trace is connected to the pin headers of the first test point and the third test point through the alligator clip, the CH1 end and the CH2 end are noticed not to be connected reversely, and then the software Venable3120system is operated normally to test waveforms.
The above description is only for the specific embodiments of the present application, so that those skilled in the art can understand or implement the present application, and the protection scope of the present application is not limited thereby. All equivalent changes and modifications made according to the spirit of the present application should be covered in the protection scope of the present application.
Claims (10)
1. A server board card baud diagram test fixture is characterized by comprising a voltage stabilizing module, a control module and a voltage conversion module, wherein the voltage stabilizing module is used for enabling an external power supply to provide stable voltage for the voltage conversion module, the control module is used for providing an enabling signal for the voltage conversion module so as to enable the voltage conversion module to normally work, and the voltage conversion module is used for outputting 3V3 voltage and verifying a test environment;
and a connecting unit is arranged on a feedback loop of the voltage conversion module and used for connecting the server board card to be tested and the frequency response analyzer, and a sampling resistor is arranged on the feedback loop.
2. The tool for testing the baud diagram of the server board card as claimed in claim 1, wherein the voltage stabilizing module is composed of MP5023GV-0000-Z chip.
3. The server board baud diagram test fixture of claim 1, wherein the control module comprises an LCMXO2-2000HC-4FTG256I chip.
4. The server board baud diagram test fixture of claim 1, wherein the voltage conversion module is formed by a TPS53319DQPR chip.
5. The tool for testing the baud diagram of the server board card as claimed in claim 4, wherein the connection unit is a loop feedback terminal arranged on a TPS53319DQPR chip, the connection unit includes a first test point, a second test point, a third test point and a fourth test point, the first test point and the third test point are used for connecting with a server to be tested, and the second test point and the fourth test point are used for connecting with a frequency response analyzer.
6. The server board baud chart test fixture of claim 5, wherein the first test point, the second test point, the third test point and the fourth test point are respectively provided with 2.54mm pins.
7. The tool for testing the baud diagram of the server board card as claimed in claim 6, wherein the first test point and the second test point are disposed at the near VFB end of the TPS53319DQPR chip, and the third test point and the fourth test point are disposed at the near output end of the TPS53319DQPR chip.
8. The use method of the server board card baud pattern test fixture is characterized by comprising the following steps of:
connecting the frequency response analyzer with a connecting unit of the test fixture, operating the test system and testing the waveform;
checking the test waveform to determine that the test environment has no problem;
if a reserved resistor is arranged on a feedback loop of the server board card to be tested, the resistor is removed, two flying wires are arranged at two ends of the resistor and connected to the connecting unit, and then the test is carried out;
and if no reserved resistor is arranged on the feedback loop of the server board card to be tested, the trace of the feedback loop is cut off, two flying wires are arranged at two ends of the trace and connected to the connecting unit, and then the test is carried out.
9. The method for using the server board baud chart test fixture as claimed in claim 8, comprising the steps of:
connecting CH1 and CH2 ends of the frequency response analyzer with a second test point and a fourth test point of the test fixture respectively, operating the test system and testing the waveform;
checking the test waveform to determine that the test environment has no problem;
checking whether a resistor is reserved on a feedback loop of the server board card to be tested;
if a reserved resistor is arranged on a feedback loop of the server board card to be tested, the resistor is removed, two flying wires are arranged at two ends of the resistor and connected to the first test point and the third test point, and then the test is carried out;
and if no reserved resistor is arranged on a feedback loop of the server board card to be tested, the trace of the feedback loop is cut off, two flying leads are arranged at two ends of the trace and connected to the first test point and the third test point, and then the test is carried out.
10. The method of using a server board baud pattern test fixture of claim 9, wherein the flying lead is connected to the pins of the first test site and the third test site by an alligator clip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910307896.0A CN110058143B (en) | 2019-04-17 | 2019-04-17 | Baud chart jig and using method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910307896.0A CN110058143B (en) | 2019-04-17 | 2019-04-17 | Baud chart jig and using method thereof |
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| CN110058143A CN110058143A (en) | 2019-07-26 |
| CN110058143B true CN110058143B (en) | 2021-08-06 |
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| CN110988656B (en) * | 2019-12-22 | 2022-12-02 | 苏州浪潮智能科技有限公司 | Server board card FCT tool and automatic lifting sliding table device thereof |
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|---|---|---|---|---|
| US20080224690A1 (en) * | 2008-05-31 | 2008-09-18 | Agilent Technologies, Inc. | Embedded Directional Power Sensing |
| CN201993745U (en) * | 2011-03-01 | 2011-09-28 | 东莞市长田电子有限公司 | Card reader testing jig |
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| CN110058143A (en) | 2019-07-26 |
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