JPH075195A - Electric test board for electronic component - Google Patents
Electric test board for electronic componentInfo
- Publication number
- JPH075195A JPH075195A JP5678591A JP5678591A JPH075195A JP H075195 A JPH075195 A JP H075195A JP 5678591 A JP5678591 A JP 5678591A JP 5678591 A JP5678591 A JP 5678591A JP H075195 A JPH075195 A JP H075195A
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- test board
- terminals
- electrical test
- short
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、電子部品の電気的試験
用ボード、特に外見上の端子の配列が同じであれば、信
号端子と電源端子をどの位置に配列した電子部品にも簡
単な配線替えにより対応できる電子部品の電気的試験用
ボードに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a board for electrical testing of electronic parts, and particularly to an electronic part in which signal terminals and power supply terminals are arranged at any position if the appearance of terminals is the same. The present invention relates to an electrical test board for electronic components that can be handled by changing wiring.
【0002】[0002]
【従来の技術】次に、従来の電子部品の電気的試験用ボ
ードについて、図2を参照して説明する。図2は、従来
の電子部品の電気的試験用ボードを説明するための図
で、同図(a) は電子部品の電気的試験用ボードの模式的
な平面図、同図(b) は電子部品の電気的試験用ボードの
模式的な側断面図である。なお、本明細書においては、
同一部品、同一材料等に対しては全図をとおして同じ符
号を付与してある。2. Description of the Related Art Next, a conventional electrical test board for electronic components will be described with reference to FIG. 2A and 2B are views for explaining a conventional electrical test board for electronic components. FIG. 2A is a schematic plan view of the electrical test board for electronic components, and FIG. FIG. 3 is a schematic side sectional view of an electrical test board for a component. In the present specification,
The same parts and the same materials are given the same reference numerals throughout the drawings.
【0003】同図(a) 及び同図(b) に示すように従来の
電子部品の電気的試験用ボードは、平板状の絶縁基板、
例えばガラスエポキシ板で形成した絶縁基板15の平らな
表面に、試験すべき電子部品10の端子11、すなわち端子
11の中の電気信号の通路となる信号端子11a-1 〜11a-S
を1対1の対応で接触させる信号用配線パターン12a-1
〜12a-S 及び端子11の中の直流電源(図示せず)との接
続路となる電源端子11d-1 〜11d-d を接触させる電源用
配線パターン12d-1 〜12d-C とを設けて構成したもので
ある。As shown in FIGS. 1 (a) and 1 (b), a conventional electrical test board for electronic parts is a flat insulating substrate,
On the flat surface of the insulating substrate 15 formed of, for example, a glass epoxy plate, the terminal 11 of the electronic component 10 to be tested, that is, the terminal
Signal terminals 11a-1 to 11a-S, which are channels for electric signals in 11
Wiring pattern 12a-1 for contacting each other in a one-to-one correspondence
~ 12a-S and power supply wiring patterns 12d-1 to 12d-C for contacting the power supply terminals 11d-1 to 11d-d, which are the connection paths with the DC power supply (not shown) in the terminal 11. It is composed.
【0004】このように構成された従来の電子部品の電
気的試験用ボードを使用して電子部品10の電気的特性を
試験機(図示せず)により測定するには、まず、同図
(a) 及び同図(b) に示す如く電子部品10と試験機とを接
続するために信号用配線パターン12a-1 〜12a-S に測定
プローブ13-1〜13-Sを1対1の対応状態で接触させると
ともに、電源用配線パターン12d-1 〜12d-C をそれぞれ
所定電圧にセットした第1〜第Cの直流電源(図示せ
ず)に接続する。なお、電源用配線パターン12d-1〜12d
-C と第1〜第Cの直流電源との接続は、リード線14を
介してそれぞれ同番対応で行われる。In order to measure the electrical characteristics of the electronic component 10 by using a testing machine (not shown) using the conventional electrical test board for the electronic component constructed as described above, first, the same figure is used.
As shown in (a) and (b) of the figure, in order to connect the electronic component 10 and the tester, the measurement probes 13-1 to 13-S are connected to the signal wiring patterns 12a-1 to 12a-S in a one-to-one correspondence. The contact is made in a corresponding state, and the power supply wiring patterns 12d-1 to 12d-C are connected to first to Cth DC power supplies (not shown) set to respective predetermined voltages. In addition, power supply wiring pattern 12d-1 ~ 12d
The connection between -C and the first to Cth DC power supplies is made through the lead wires 14 in the same correspondence.
【0005】そして、かかる状態の電子部品の電気的試
験用ボードの信号用配線パターン12a-1 〜12a-S 及び電
源用配線パターン12d-1 〜12d-C に、電子部品10の端子
11、すなわち信号端子11a-1 〜11a-S 及び電源端子11d-
1 〜11d-d を接触させると、試験機は予め定めた手順に
したがって電子部品10の電気的特性を測定することとな
る。Then, the terminals of the electronic component 10 are connected to the signal wiring patterns 12a-1 to 12a-S and the power source wiring patterns 12d-1 to 12d-C of the electrical test board of the electronic component in such a state.
11, that is, the signal terminals 11a-1 to 11a-S and the power supply terminal 11d-
When 1 to 11d-d are brought into contact with each other, the tester measures the electrical characteristics of the electronic component 10 according to a predetermined procedure.
【0006】[0006]
【発明が解決しようとする課題】ところで、電子部品10
の外見上の端子11の配列は全く変わらないものの、その
信号端子11a-1 〜11a-S の一部と電源端子11d-1 〜11d-
d の一部とがそれぞれ入れ代わっただけの電子部品をユ
ーザ等の要求により新たに商品化することも少なくな
い。By the way, the electronic component 10
Although the external arrangement of the terminals 11 does not change at all, part of the signal terminals 11a-1 to 11a-S and the power terminals 11d-1 to 11d-
It is not uncommon to commercialize electronic components that have been replaced by a part of d according to user requests.
【0007】ところが、従来の電子部品の電気的試験用
ボードは、図2の(a) 図に示すように信号用配線パター
ン12a-1 〜12a-S は電気的に互いに絶縁された状態で形
成されて電子部品10の信号端子11a-1 〜11a-S と1対1
で対応するが、電源用配線パターン12d-1 〜12d-C の中
の電源用配線パターンには電子部品10の電源端子11d-1
〜11d-d の複数の電源端子を接触させるものも少なくな
い。However, in the conventional electrical test board for electronic parts, as shown in FIG. 2A, the signal wiring patterns 12a-1 to 12a-S are formed in a state where they are electrically insulated from each other. 1 to 1 with the signal terminals 11a-1 to 11a-S of the electronic component 10.
Power supply wiring patterns 12d-1 to 12d-C include the power supply wiring pattern 12d-1 to 12d-C.
There are quite a few that make contact with multiple power terminals of ~ 11d-d.
【0008】したがって、上記したように電子部品10の
外見上の端子11の配列は全く変わらないものの、信号端
子11a-1 〜11a-S の一部と電源端子11d-1 〜11d-d の一
部とがそれぞれ入れ代わっただけでも別の電気的試験用
ボードを新たに作らなければらない事態が間々発生して
いた。Therefore, as described above, although the external arrangement of the terminals 11 of the electronic component 10 does not change at all, part of the signal terminals 11a-1 to 11a-S and one of the power terminals 11d-1 to 11d-d. Occasionally, a new electrical test board had to be created even if the departments were replaced with each other.
【0009】このため、当然なことではあるがこの新し
い電子部品の電気的試験用ボードを製作するための費用
が追加的に発生することは勿論、新規開発の電子部品の
ターン・アラウンド・タイムが長くなると言う問題があ
った。Therefore, as a matter of course, the additional cost for manufacturing the electrical test board for the new electronic component is incurred, and the turn-around time of the newly developed electronic component is obviously increased. There was a problem that it would be long.
【0010】本発明は、このような問題を解消するため
になされたものであって、その目的は外見上の端子の配
列が同じであれば、信号端子と電源端子をどの位置に配
列した電子部品にも簡単な配線替えにより対応できる電
子部品の電気的試験用ボードの提供にある。The present invention has been made to solve such a problem, and its purpose is to arrange an electronic device in which a signal terminal and a power supply terminal are arranged at the same position if the appearance of the terminals is the same. The purpose is to provide an electrical test board for electronic components that can be handled by simply changing wiring.
【0011】[0011]
【課題を解決するための手段】図1に示す如く前記目的
は、端子11を接触させた電子部品10を試験機及び電源と
に電気的に接続する複数の中継手段21-1〜21-Nを絶縁基
板15に設けて構成した電子部品の電気的試験用ボードに
おいて、中継手段21-1〜21-Nが電気的に互いに絶縁され
ているとともに、それぞれの中継手段21-1〜21-Nが任意
の中継手段21-1〜21-N間を電気に短絡する短絡手段22を
自在に着脱できる複数の着脱部21a を具備していること
を特徴とする電子部品の電気的試験用ボードで達成され
る。As shown in FIG. 1, the purpose is to provide a plurality of relay means 21-1 to 21-N for electrically connecting an electronic component 10 with a terminal 11 in contact with a testing machine and a power source. In an electrical test board for an electronic component configured by providing an insulating substrate 15, the relay means 21-1 to 21-N are electrically insulated from each other, and each relay means 21-1 to 21-N. Is equipped with a plurality of attachment / detachment portions 21a capable of freely attaching / detaching the short-circuit means 22 for electrically short-circuiting between any of the relay means 21-1 to 21-N. To be achieved.
【0012】[0012]
【作用】図1に示すように本発明の電子部品の電気的試
験用ボードにおいては、中継手段21-1〜21-Nが電気的に
互いに絶縁されているとともに、それぞれの中継手段21
-1〜21-Nが任意の中継手段21-1〜21-N間を電気に短絡す
る短絡手段22を自在に着脱できる複数の着脱部21a を具
備している。As shown in FIG. 1, in the electrical test board for electronic parts of the present invention, the relay means 21-1 to 21-N are electrically insulated from each other, and the relay means 21 are provided.
-1 to 21-N is provided with a plurality of attachment / detachment portions 21a capable of freely attaching / detaching the short-circuiting means 22 for electrically short-circuiting any relay means 21-1 to 21-N.
【0013】したがって、任意の中継手段21-1〜21-N間
の電気的な短絡は、短絡しようとする一方の中継手段の
着脱部21a に短絡手段22の一端を取り付けるとともに、
他方の中継手段の着脱部21a に短絡手段22の他端を取り
付けることにより自在に行えることとなる。また、この
短絡手段22をそれぞれの着脱部21a から取り去れば中継
手段間の短絡は解除されて開放状態となる。Therefore, an electrical short circuit between any relay means 21-1 to 21-N is performed by attaching one end of the short-circuit means 22 to the attaching / detaching portion 21a of one relay means to be short-circuited,
By attaching the other end of the short-circuit means 22 to the attachment / detachment portion 21a of the other relay means, it can be freely performed. Further, if the short-circuiting means 22 is removed from the respective attachment / detachment portions 21a, the short-circuiting between the relay means is released and the open state is established.
【0014】かくして、本発明の電子部品の電気的試験
用ボードは、外見上の端子の配列が同じであれば、信号
端子と電源端子をどの位置に配列した電子部品にも上記
したような簡単な配線替えにより対応できることとな
る。Thus, the electrical test board for electronic parts according to the present invention can be applied to electronic parts in which signal terminals and power supply terminals are arranged at any position, as long as the appearance of terminals is the same. It can be handled by changing the wiring.
【0015】[0015]
【実施例】以下、本発明の一実施例の電子部品の電気的
試験用ボードについて、図1を参照しながら説明する。
図1は、本発明の一実施例の電子部品の電気的試験用ボ
ードの説明図であって、同図(a) は電子部品の電気的試
験用ボードの模式的な平面図、同図(b) は短絡手段の側
面図、同図(c) は電子部品の電気的試験用ボードの模式
的な側断面図である。なお、同図(a) は、図2における
(a) 図と全く同じ電気的な配線状態を示すものである。
また、電子部品10の電源端子11d-1,11d-2,・・・が接触
している配線パターン21-1,21-5,・・・には測定プロー
ブ13-1,13-5,・・・が接触しているが、電子部品10の電
源端子11d-1,11d-2,・・・と試験機とはブログラムによ
り試験機内で切り離された状態となっている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An electrical test board for electronic parts according to an embodiment of the present invention will be described below with reference to FIG.
FIG. 1 is an explanatory diagram of an electrical test board for an electronic component according to an embodiment of the present invention. FIG. 1 (a) is a schematic plan view of the electrical test board for an electronic component. b) is a side view of the short-circuit means, and FIG. 6 (c) is a schematic side sectional view of an electrical test board for electronic components. In addition, FIG.
(a) The figure shows the same electrical wiring as in the figure.
Further, in the wiring patterns 21-1, 21-5, ... with which the power supply terminals 11d-1, 11d-2, ... Of the electronic component 10 are in contact, the measurement probes 13-1, 13-5 ,. .. are in contact with each other, but the power supply terminals 11d-1, 11d-2, ... Of the electronic component 10 and the testing machine are separated in the testing machine by the program.
【0016】同図(a) 及び同図(c) に示すように本発明
の一実施例の電子部品の電気的試験用ボードは、図2に
より説明した電子部品の電気的試験用ボードをベースに
して構成したものである。As shown in FIGS. 2A and 2C, the electrical test board for electronic parts of one embodiment of the present invention is based on the electrical test board for electronic parts described with reference to FIG. It is configured as.
【0017】すなわち、本発明の一実施例の電子部品の
電気的試験用ボードは、従来の電子部品の電気的試験用
ボードにも使用していた絶縁基板15と、この絶縁基板15
の表面に形成されて電気的に互いに絶縁された複数の中
継手段、すなわち電子部品10の端子11を1対1の対応で
接触させる配線パターン21-1〜21-Nとを含んで構成した
ものである。That is, the electrical test board for an electronic component according to one embodiment of the present invention includes an insulating substrate 15 which is also used for a conventional electrical test board for an electronic component, and the insulating substrate 15.
A plurality of relay means formed on the surface of and electrically insulated from each other, that is, a wiring pattern 21-1 to 21-N for contacting the terminals 11 of the electronic component 10 in a one-to-one correspondence Is.
【0018】そして、それぞれの配線パターン21-1〜21
-Nには、複数の着脱部、例えば二つのスルーホール21a
( 合計2N個) が設けられている。ビニール被覆電線22b
の両端に銃弾型をした金属プラグ22a の尖ってない一端
をそれぞれ連結して構成した短絡手段22( 同図(b) 参
照) のこの二つの金属プラグ22a を、同図(c) に示すよ
うにそれぞれ別の配線パターンのスルーホール21a に嵌
着するとこの配線パターン間はこの短絡手段22により電
気に短絡されることとなる。Then, the respective wiring patterns 21-1 to 21
-N has multiple attachment / detachment parts, for example, two through holes 21a.
(2N in total) are provided. Vinyl coated wire 22b
The two metal plugs 22a of the short-circuiting means 22 (see FIG. 2 (b)), which are configured by connecting the blunt end of the bullet-shaped metal plug 22a to both ends of the metal plug 22a, are shown in FIG. When the wiring patterns are fitted into through holes 21a of different wiring patterns, the wiring patterns are electrically short-circuited by the short-circuiting means 22.
【0019】したがって、かかる短絡手段22を複数本用
意して置き、短絡手段22の金属プラグ22a をスルーホー
ル21a に嵌着することによりそれぞれの配線パターン21
-1〜21-N間はどの様にも短絡可能であるし、またこの短
絡手段22をこのスルーホール21a から取り外すことによ
りそれぞれの間の短絡は極めて簡単に解除できることと
なる。Therefore, a plurality of such short-circuiting means 22 are prepared and placed, and the metal plugs 22a of the short-circuiting means 22 are fitted into the through holes 21a so that the respective wiring patterns 21 are formed.
-1 to 21-N can be short-circuited in any way, and by removing the short-circuiting means 22 from the through hole 21a, the short-circuiting between them can be released very easily.
【0020】例えば、電子部品10の信号端子11a-2 が電
源端子11d-2 と同じ直流電源に接続する電源端子に、ま
た電源端子11d-2 が信号端子11a-2 と同じ機能をする信
号端子にした新たな電子部品に対しては、同図(a) にお
いて電源端子11d-2 と電源端子11d-3 との間を短絡して
いた短絡手段22の電源端子11d-2 のスルーホール21aに
嵌着されていた金属プラグ22a を信号端子11a-2 のスル
ーホール21a に嵌着し直すとともに、試験機内の信号の
経路を変えるプログラムにより今まで配線パターン21-3
を介して信号端子11a-2 に電気的に接続していた測定プ
ローブ13-3を試験機内でこの信号端子11a-2 と電気的に
切り離し、且つ今まで配線パターン21-5に接触していな
がら試験機内で電源端子11d-2 とは電気的に切り離され
ていた測定プローブ13-5を試験機内でこの電源端子11d-
2 と電気的に接続することにより、新しい電子部品の電
気的特性の測定は従来の電子部品10の電気的特性を測定
すると全く同様に測定できることとなる。For example, the signal terminal 11a-2 of the electronic component 10 is a power terminal connected to the same DC power source as the power terminal 11d-2, and the power terminal 11d-2 is a signal terminal having the same function as the signal terminal 11a-2. For the new electronic components, the power supply terminal 11d-2 and the power supply terminal 11d-3 are short-circuited in the through hole 21a of the power supply terminal 11d-2 of the short-circuiting means 22 in FIG. The metal plug 22a that had been attached is reattached to the through hole 21a of the signal terminal 11a-2, and the wiring pattern 21-3 has been changed by a program that changes the signal path inside the tester.
The measurement probe 13-3, which was electrically connected to the signal terminal 11a-2 via the, is electrically disconnected from the signal terminal 11a-2 in the tester, and while still in contact with the wiring pattern 21-5. In the tester, the measuring probe 13-5, which was electrically disconnected from the power supply terminal 11d-2 in the tester, was
By electrically connecting with 2, the electric characteristics of the new electronic component can be measured in exactly the same way as the electric characteristics of the conventional electronic component 10.
【0021】したがって、本発明の一実施例の電子部品
の電気的試験用ボードは、外見上の端子の配列が同じで
あれば、信号端子と電源端子をどの位置に配列した電子
部品にも上記したような簡単な配線替えにより対応でき
ることとなる。Therefore, the electrical test board for an electronic component according to one embodiment of the present invention can be used for any electronic component in which signal terminals and power supply terminals are arranged at any position as long as the appearance of the terminals is the same. It is possible to deal with such a simple wiring change.
【0022】なお、本発明の一実施例の電子部品の電気
的試験用ボードは、絶縁基板15の表面に設けた中継手
段、すなわち配線パターン21-1〜21-Nに直接電子部品10
の端子11を接触させるものもあるが、この配線パターン
21-1〜21-Nのそれぞれの一端、すなわち電子部品10の端
子11が接触する一端をコネクタ(図示せず)の端子に接
続し、電子部品10の端子11をコネクタを介して配線パタ
ーン21-1〜21-Nに接続するように構成することも可能で
あるし、更には、電子部品の端子数が多くなれば前述の
一実施例の電子部品の電気的試験用ボードを複数枚積層
し如く構成した多層基板にすることも当然可能である。The electrical test board for an electronic component according to an embodiment of the present invention is a relay means provided on the surface of the insulating substrate 15, that is, the electronic component 10 directly on the wiring patterns 21-1 to 21-N.
Some terminals make contact with the terminal 11, but this wiring pattern
One end of each of 21-1 to 21-N, that is, one end with which the terminal 11 of the electronic component 10 contacts is connected to a terminal of a connector (not shown), and the terminal 11 of the electronic component 10 is connected to the wiring pattern 21 via the connector. -1 to 21-N can be configured to be connected, and further, if the number of terminals of the electronic component increases, a plurality of electrical test boards for the electronic component of the above-described one embodiment are laminated. Naturally, it is also possible to use a multilayer substrate configured as described above.
【0023】[0023]
【発明の効果】前述したように本発明は、外見上の端子
の配列が同じであれば、信号端子と電源端子をどの位置
に配列した電子部品にも、簡単な配線替えにより対応で
きる電子部品の電気的試験用ボードの提供を可能にす
る。As described above, according to the present invention, if the appearance of the terminals is the same, the electronic parts in which the signal terminals and the power supply terminals are arranged at any position can be dealt with by a simple wiring change. It is possible to provide a board for electrical test of.
【図1】は、本発明の一実施例の電子部品の電気的試験
用ボードの説明図、FIG. 1 is an explanatory diagram of an electrical test board for an electronic component according to an embodiment of the present invention,
【図2】は、従来の電子部品の電気的試験用ボードを説
明するための図である。FIG. 2 is a diagram for explaining a conventional electrical test board for electronic components.
10は、電子部品、 11は、信号端子11a-1 〜11a-S と電源端子11d-1 〜11d-
d とからなる端子、 12a-1 〜12a-S は、信号用配線パターン、 12d-1 〜12d-C は、電源用配線パターン、 13-1〜13-Nは、測定プローブ、 14は、リード線、 15は、絶縁基板、 21-1〜21-Nは、中継手段 (配線パターン) 、 21a は、着脱部 (スルーホール) 、 22は、短絡手段をそれぞれ示す。10 is electronic parts, 11 is signal terminals 11a-1 to 11a-S and power terminals 11d-1 to 11d-
12a-1 to 12a-S are signal wiring patterns, 12d-1 to 12d-C are power wiring patterns, 13-1 to 13-N are measuring probes, and 14 is leads. A wire, 15 is an insulating substrate, 21-1 to 21-N are relay means (wiring patterns), 21a is an attaching / detaching part (through hole), and 22 is a short-circuit means.
Claims (1)
験機及び電源とに電気的に接続する複数の中継手段(21-
1 〜21-N) を絶縁基板(15)に設けて構成した電子部品の
電気的試験用ボードにおいて、 前記中継手段(21-1 〜21-N) が電気的に互いに絶縁され
ているとともに、それぞれの前記中継手段(21-1 〜21-
N) が任意の中継手段(21-1 〜21-N) 間を電気に短絡す
る短絡手段(22)を自在に着脱できる複数の着脱部(21a)
を具備していることを特徴とする電子部品の電気的試験
用ボード。1. A plurality of relay means (21-) for electrically connecting an electronic component (10) in contact with a terminal (11) to a testing machine and a power source.
1 ~ 21-N) in the electrical test board of the electronic component configured by providing the insulating substrate (15), the relay means (21-1 ~ 21-N) is electrically insulated from each other, Each of the relay means (21-1 to 21-
N) is a plurality of attachment / detachment parts (21a) that can freely attach / detach the short-circuit means (22) that electrically short-circuits between any relay means (21-1 to 21-N)
An electrical test board for electronic parts, characterized by comprising:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5678591A JPH075195A (en) | 1991-03-20 | 1991-03-20 | Electric test board for electronic component |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5678591A JPH075195A (en) | 1991-03-20 | 1991-03-20 | Electric test board for electronic component |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH075195A true JPH075195A (en) | 1995-01-10 |
Family
ID=13037074
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5678591A Withdrawn JPH075195A (en) | 1991-03-20 | 1991-03-20 | Electric test board for electronic component |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH075195A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110058143A (en) * | 2019-04-17 | 2019-07-26 | 苏州浪潮智能科技有限公司 | A kind of novel server board Bode diagram test fixture and its application method |
-
1991
- 1991-03-20 JP JP5678591A patent/JPH075195A/en not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110058143A (en) * | 2019-04-17 | 2019-07-26 | 苏州浪潮智能科技有限公司 | A kind of novel server board Bode diagram test fixture and its application method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19980514 |