CN107807193B - 电介质阻挡放电离子化检测器 - Google Patents
电介质阻挡放电离子化检测器 Download PDFInfo
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- CN107807193B CN107807193B CN201710798472.XA CN201710798472A CN107807193B CN 107807193 B CN107807193 B CN 107807193B CN 201710798472 A CN201710798472 A CN 201710798472A CN 107807193 B CN107807193 B CN 107807193B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/64—Electrical detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
- G01N27/66—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/0006—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/0006—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
- H05H1/0081—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature by electric means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N2030/022—Column chromatography characterised by the kind of separation mechanism
- G01N2030/025—Gas chromatography
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/64—Electrical detectors
- G01N2030/647—Electrical detectors surface ionisation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
- H05H1/2443—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Plasma & Fusion (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Toxicology (AREA)
- Fluid Mechanics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016-175504 | 2016-09-08 | ||
| JP2016175504A JP6675709B2 (ja) | 2016-09-08 | 2016-09-08 | 誘電体バリア放電イオン化検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107807193A CN107807193A (zh) | 2018-03-16 |
| CN107807193B true CN107807193B (zh) | 2020-01-31 |
Family
ID=61282059
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710798472.XA Active CN107807193B (zh) | 2016-09-08 | 2017-09-07 | 电介质阻挡放电离子化检测器 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10436750B2 (https=) |
| JP (1) | JP6675709B2 (https=) |
| CN (1) | CN107807193B (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6743599B2 (ja) | 2016-09-08 | 2020-08-19 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP6747197B2 (ja) | 2016-09-08 | 2020-08-26 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP6775141B2 (ja) | 2016-09-08 | 2020-10-28 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP6747198B2 (ja) | 2016-09-08 | 2020-08-26 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP7133123B2 (ja) * | 2019-01-23 | 2022-09-08 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP7318608B2 (ja) | 2020-07-31 | 2023-08-01 | 株式会社島津製作所 | 放電イオン化検出器 |
| CN112004304B (zh) * | 2020-08-13 | 2023-06-13 | 中国科学院合肥物质科学研究院 | 一种电晕复合介质阻挡放电等离子体射流发生装置 |
| JP7408097B2 (ja) | 2020-09-29 | 2024-01-05 | 株式会社島津製作所 | 放電イオン化検出器およびガスクロマトグラフ分析装置 |
| CN115066079B (zh) * | 2021-05-27 | 2025-05-16 | 长江师范学院 | 一种能够产生辉光放电效果的等离子放电电极结构 |
| CN113692100B (zh) * | 2021-08-09 | 2023-03-24 | 江苏容正医药科技有限公司 | 应用于内窥镜内壁消毒的多段电极等离子体射流触发方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4789783A (en) * | 1987-04-02 | 1988-12-06 | Cook Robert D | Discharge ionization detector |
| CN103163256A (zh) * | 2011-12-16 | 2013-06-19 | 株式会社岛津制作所 | 放电离子化电流检测器 |
| CN104897825A (zh) * | 2014-03-04 | 2015-09-09 | 株式会社岛津制作所 | 介质阻挡放电离子化检测器和及其调谐方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4282521A (en) | 1979-11-13 | 1981-08-04 | Tif Instruments, Inc. | Regulating circuit for gaseous impurity detector |
| JPH10307123A (ja) * | 1997-05-07 | 1998-11-17 | Hitachi Ltd | 光イオン化検出方法及び光イオン化検出器 |
| EP1073091A3 (en) | 1999-07-27 | 2004-10-06 | Matsushita Electric Works, Ltd. | Electrode for plasma generation, plasma treatment apparatus using the electrode, and plasma treatment with the apparatus |
| US6333632B1 (en) * | 1999-09-16 | 2001-12-25 | Rae Systems, Inc. | Alternating current discharge ionization detector |
| US7922979B2 (en) | 2005-03-28 | 2011-04-12 | Mitsubishi Denki Kabushiki Kaisha | Silent discharge plasma apparatus |
| DE112009000131T5 (de) | 2008-01-18 | 2010-12-09 | Kyocera Corporation | Plasma-Generator und Entladungsvorrichtung und Reaktor, der einen Plasma-Generator verwendet |
| JP5136300B2 (ja) | 2008-09-02 | 2013-02-06 | 株式会社島津製作所 | 放電イオン化電流検出器 |
| WO2010037238A1 (en) | 2008-10-03 | 2010-04-08 | National Research Council Of Canada | Plasma-based direct sampling of molecules for mass spectrometric analysis |
| JP5470543B2 (ja) * | 2010-04-26 | 2014-04-16 | 株式会社島津製作所 | 放電イオン化電流検出器 |
| JP5445353B2 (ja) | 2010-06-28 | 2014-03-19 | 株式会社島津製作所 | 放電イオン化電流検出器 |
| JP5470544B2 (ja) * | 2010-06-28 | 2014-04-16 | 株式会社島津製作所 | 放電イオン化電流検出器 |
| CN105651855B (zh) * | 2011-06-07 | 2018-08-14 | 株式会社岛津制作所 | 放电电离电流检测器 |
| CN102866224B (zh) | 2012-09-17 | 2014-10-01 | 四川大学 | 一种基于碳原子发射光谱测定含碳化合物的气相色谱检测方法 |
| WO2014125610A1 (ja) * | 2013-02-15 | 2014-08-21 | 株式会社島津製作所 | 放電イオン化電流検出器及びその調整方法 |
| US9897529B2 (en) | 2015-09-23 | 2018-02-20 | China University Of Petroleum (East China) | Test system and test method for a simulation experiment of gas hydrate in a porous medium |
| JP6743599B2 (ja) | 2016-09-08 | 2020-08-19 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP6747197B2 (ja) | 2016-09-08 | 2020-08-26 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP6775141B2 (ja) | 2016-09-08 | 2020-10-28 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
| JP6747198B2 (ja) | 2016-09-08 | 2020-08-26 | 株式会社島津製作所 | 誘電体バリア放電イオン化検出器 |
-
2016
- 2016-09-08 JP JP2016175504A patent/JP6675709B2/ja active Active
-
2017
- 2017-09-07 CN CN201710798472.XA patent/CN107807193B/zh active Active
- 2017-09-07 US US15/698,312 patent/US10436750B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4789783A (en) * | 1987-04-02 | 1988-12-06 | Cook Robert D | Discharge ionization detector |
| CN103163256A (zh) * | 2011-12-16 | 2013-06-19 | 株式会社岛津制作所 | 放电离子化电流检测器 |
| CN104897825A (zh) * | 2014-03-04 | 2015-09-09 | 株式会社岛津制作所 | 介质阻挡放电离子化检测器和及其调谐方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107807193A (zh) | 2018-03-16 |
| US10436750B2 (en) | 2019-10-08 |
| JP6675709B2 (ja) | 2020-04-01 |
| US20180067079A1 (en) | 2018-03-08 |
| JP2018040721A (ja) | 2018-03-15 |
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