CN107728434B - 液浸构件及曝光装置 - Google Patents

液浸构件及曝光装置 Download PDF

Info

Publication number
CN107728434B
CN107728434B CN201711011972.0A CN201711011972A CN107728434B CN 107728434 B CN107728434 B CN 107728434B CN 201711011972 A CN201711011972 A CN 201711011972A CN 107728434 B CN107728434 B CN 107728434B
Authority
CN
China
Prior art keywords
liquid immersion
substrate
liquid
optical
disposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201711011972.0A
Other languages
English (en)
Chinese (zh)
Other versions
CN107728434A (zh
Inventor
柴崎祐一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of CN107728434A publication Critical patent/CN107728434A/zh
Application granted granted Critical
Publication of CN107728434B publication Critical patent/CN107728434B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Microscoopes, Condenser (AREA)
CN201711011972.0A 2012-04-10 2013-03-15 液浸构件及曝光装置 Active CN107728434B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261622235P 2012-04-10 2012-04-10
US61/622,235 2012-04-10
US13/793,667 US9323160B2 (en) 2012-04-10 2013-03-11 Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US13/793,667 2013-03-11
CN201380029835.3A CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201380029835.3A Division CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

Publications (2)

Publication Number Publication Date
CN107728434A CN107728434A (zh) 2018-02-23
CN107728434B true CN107728434B (zh) 2020-04-03

Family

ID=49292050

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201711011972.0A Active CN107728434B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置
CN201380029835.3A Active CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201380029835.3A Active CN104350425B (zh) 2012-04-10 2013-03-15 液浸构件及曝光装置

Country Status (8)

Country Link
US (4) US9323160B2 (enExample)
EP (1) EP2836875B1 (enExample)
JP (3) JP6245179B2 (enExample)
KR (1) KR102158968B1 (enExample)
CN (2) CN107728434B (enExample)
HK (2) HK1204682A1 (enExample)
TW (3) TWI658335B (enExample)
WO (1) WO2013153939A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2009692A (en) 2011-12-07 2013-06-10 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9823580B2 (en) * 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
JP6369472B2 (ja) 2013-10-08 2018-08-08 株式会社ニコン 液浸部材、露光装置及び露光方法、並びにデバイス製造方法
KR102206979B1 (ko) * 2016-09-12 2021-01-25 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치를 위한 유체 처리 구조물
CN110268334B (zh) 2017-02-03 2024-10-29 Asml荷兰有限公司 曝光设备
CN109856922B (zh) * 2017-11-30 2020-11-13 上海微电子装备(集团)股份有限公司 浸没流体控制装置、浸没式光刻系统与回收控制方法
CN111480118B (zh) 2017-12-15 2024-06-25 Asml荷兰有限公司 流体处置结构、光刻设备、以及使用流体处置结构的方法
JP6575629B2 (ja) * 2018-04-04 2019-09-18 株式会社ニコン 露光装置及び露光方法、並びにデバイス製造方法
CN112650028B (zh) * 2020-12-25 2024-02-09 浙江启尔机电技术有限公司 一种改善浸没流场压力特性的浸液供给回收装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1612292A (zh) * 2003-10-31 2005-05-04 株式会社尼康 定盘、载物台装置及曝光装置以及曝光方法
EP1780786A1 (en) * 2004-06-07 2007-05-02 Nikon Corporation Stage apparatus, exposure apparatus, and exposure method
CN101171668A (zh) * 2005-03-31 2008-04-30 株式会社尼康 曝光装置、曝光方法及元件制造方法
WO2009119898A1 (en) * 2008-03-27 2009-10-01 Nikon Corporation Immersion system, exposure apparatus, exposing method and device fabricating method

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69738910D1 (de) 1996-11-28 2008-09-25 Nikon Corp Ausrichtvorrichtung und belichtungsverfahren
DE69829614T2 (de) 1997-03-10 2006-03-09 Asml Netherlands B.V. Lithographiegerät mit einer positioniervorrichtung mit zwei objekthaltern
US6897963B1 (en) 1997-12-18 2005-05-24 Nikon Corporation Stage device and exposure apparatus
US6208407B1 (en) 1997-12-22 2001-03-27 Asm Lithography B.V. Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
WO2001035168A1 (en) 1999-11-10 2001-05-17 Massachusetts Institute Of Technology Interference lithography utilizing phase-locked scanning beams
US6452292B1 (en) 2000-06-26 2002-09-17 Nikon Corporation Planar motor with linear coil arrays
JP4714403B2 (ja) 2001-02-27 2011-06-29 エーエスエムエル ユーエス,インコーポレイテッド デュアルレチクルイメージを露光する方法および装置
TW529172B (en) 2001-07-24 2003-04-21 Asml Netherlands Bv Imaging apparatus
CN100462844C (zh) 2002-08-23 2009-02-18 株式会社尼康 投影光学系统、微影方法、曝光装置及使用此装置的方法
KR20110104084A (ko) * 2003-04-09 2011-09-21 가부시키가이샤 니콘 액침 리소그래피 유체 제어 시스템
WO2005024517A2 (en) 2003-09-03 2005-03-17 Nikon Corporation Apparatus and method for providing fluid for immersion lithography
US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
WO2005119742A1 (ja) * 2004-06-04 2005-12-15 Nikon Corporation 露光装置、露光方法及びデバイス製造方法
KR101511876B1 (ko) 2004-06-09 2015-04-13 가부시키가이샤 니콘 기판 유지 장치 및 그것을 구비하는 노광 장치, 노광 방법, 디바이스 제조 방법, 그리고 발액 플레이트
US7423720B2 (en) 2004-11-12 2008-09-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP2506289A3 (en) * 2005-01-31 2013-05-22 Nikon Corporation Exposure apparatus and method for manufacturing device
JP5005226B2 (ja) * 2005-01-31 2012-08-22 株式会社ニコン 露光装置及びデバイス製造方法、液体保持方法
JP4844186B2 (ja) 2005-03-18 2011-12-28 株式会社ニコン プレート部材、基板保持装置、露光装置及び露光方法、並びにデバイス製造方法
JP2007005571A (ja) * 2005-06-24 2007-01-11 Nikon Corp 露光装置及びデバイス製造方法
US7804577B2 (en) * 2005-11-16 2010-09-28 Asml Netherlands B.V. Lithographic apparatus
US7656501B2 (en) 2005-11-16 2010-02-02 Asml Netherlands B.V. Lithographic apparatus
US7864292B2 (en) 2005-11-16 2011-01-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7839485B2 (en) 2006-01-19 2010-11-23 Nikon Corporation Movable body drive method, movable body drive system, pattern formation method, pattern forming apparatus, exposure method, exposure apparatus, and device manufacturing method
JP2007335662A (ja) * 2006-06-15 2007-12-27 Canon Inc 露光装置
US8004651B2 (en) 2007-01-23 2011-08-23 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US8068209B2 (en) 2007-03-23 2011-11-29 Nikon Corporation Nozzle to help reduce the escape of immersion liquid from an immersion lithography tool
US8134685B2 (en) 2007-03-23 2012-03-13 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8300207B2 (en) * 2007-05-17 2012-10-30 Nikon Corporation Exposure apparatus, immersion system, exposing method, and device fabricating method
JP2009088037A (ja) * 2007-09-28 2009-04-23 Nikon Corp 露光方法及びデバイス製造方法、並びに露光装置
US8451425B2 (en) * 2007-12-28 2013-05-28 Nikon Corporation Exposure apparatus, exposure method, cleaning apparatus, and device manufacturing method
US8610873B2 (en) 2008-03-17 2013-12-17 Nikon Corporation Immersion lithography apparatus and method having movable liquid diverter between immersion liquid confinement member and substrate
US8289497B2 (en) 2008-03-18 2012-10-16 Nikon Corporation Apparatus and methods for recovering fluid in immersion lithography
JP2011086804A (ja) * 2009-10-16 2011-04-28 Nikon Corp 液浸部材、露光装置、露光方法、及びデバイス製造方法
JP5232901B2 (ja) * 2011-07-22 2013-07-10 株式会社ニコン 露光装置及びデバイス製造方法
NL2009271A (en) 2011-09-15 2013-03-18 Asml Netherlands Bv A fluid handling structure, a lithographic apparatus and a device manufacturing method.
US9323160B2 (en) * 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1612292A (zh) * 2003-10-31 2005-05-04 株式会社尼康 定盘、载物台装置及曝光装置以及曝光方法
EP1780786A1 (en) * 2004-06-07 2007-05-02 Nikon Corporation Stage apparatus, exposure apparatus, and exposure method
CN101171668A (zh) * 2005-03-31 2008-04-30 株式会社尼康 曝光装置、曝光方法及元件制造方法
WO2009119898A1 (en) * 2008-03-27 2009-10-01 Nikon Corporation Immersion system, exposure apparatus, exposing method and device fabricating method

Also Published As

Publication number Publication date
JP2015515738A (ja) 2015-05-28
HK1204090A1 (en) 2015-11-06
JP2019191613A (ja) 2019-10-31
HK1204682A1 (en) 2015-11-27
US20180039186A1 (en) 2018-02-08
TW201804261A (zh) 2018-02-01
EP2836875B1 (en) 2020-11-18
US20190056672A1 (en) 2019-02-21
EP2836875A1 (en) 2015-02-18
HK1245901A1 (zh) 2018-08-31
US9810999B2 (en) 2017-11-07
TWI658335B (zh) 2019-05-01
TWI611270B (zh) 2018-01-11
JP6245179B2 (ja) 2017-12-13
WO2013153939A1 (en) 2013-10-17
KR102158968B1 (ko) 2020-09-23
US9323160B2 (en) 2016-04-26
TW201344376A (zh) 2013-11-01
CN107728434A (zh) 2018-02-23
JP6569717B2 (ja) 2019-09-04
TW201928530A (zh) 2019-07-16
US10139736B2 (en) 2018-11-27
KR20150005603A (ko) 2015-01-14
TWI698720B (zh) 2020-07-11
JP2018022198A (ja) 2018-02-08
CN104350425A (zh) 2015-02-11
US20130265555A1 (en) 2013-10-10
CN104350425B (zh) 2017-11-28
US20160223915A1 (en) 2016-08-04
US10520828B2 (en) 2019-12-31

Similar Documents

Publication Publication Date Title
CN107728434B (zh) 液浸构件及曝光装置
JP6601527B2 (ja) 露光装置、露光方法、及びデバイス製造方法
CN107422612B (zh) 液浸构件、曝光装置、液浸曝光装置、液浸曝光方法及元件制造方法
HK1204090B (en) Liquid immersion member and exposure apparatus
JP2013219351A (ja) 液浸部材、露光装置、露光方法、デバイス製造方法、プログラム、及び記録媒体
HK1242789A1 (en) Liquid immersion member and exposure apparatus
HK1206435B (en) Liquid immersion member and exposure apparatus
HK40000602A (en) Liquid-immersion member and exposure device
HK1207908A1 (en) Liquid immersion member and exposure apparatus
HK1207908B (en) Liquid immersion member and exposure apparatus

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
REG Reference to a national code

Ref country code: HK

Ref legal event code: DE

Ref document number: 1245901

Country of ref document: HK

GR01 Patent grant
GR01 Patent grant
REG Reference to a national code

Ref country code: HK

Ref legal event code: WD

Ref document number: 1245901

Country of ref document: HK