CN107680951A - A kind of encapsulating structure and its method for packing of multi-chip lamination - Google Patents

A kind of encapsulating structure and its method for packing of multi-chip lamination Download PDF

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Publication number
CN107680951A
CN107680951A CN201710852287.4A CN201710852287A CN107680951A CN 107680951 A CN107680951 A CN 107680951A CN 201710852287 A CN201710852287 A CN 201710852287A CN 107680951 A CN107680951 A CN 107680951A
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China
Prior art keywords
chip
connection sheet
slide holder
chips
top surface
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Granted
Application number
CN201710852287.4A
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Chinese (zh)
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CN107680951B (en
Inventor
张晓天
潘华
鲁明朕
鲁军
哈姆扎·依玛兹
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Alpha and Omega Semiconductor Cayman Ltd
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Alpha and Omega Semiconductor Inc
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Priority to CN201710852287.4A priority Critical patent/CN107680951B/en
Publication of CN107680951A publication Critical patent/CN107680951A/en
Application granted granted Critical
Publication of CN107680951B publication Critical patent/CN107680951B/en
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Abstract

The present invention relates to a kind of encapsulating structure and its method for packing of multi-chip lamination, its electric connection is realized in the drain electrode of source electrode and LS chips that HS chips are arranged at using only a connection sheet, conduction loss and switching loss reduce, and heat dissipation efficiency is then strengthened.IC chip is insulated to be connected on connection sheet, so as to be stacked to the top of HS chips and LS chips place plane, with effective device size reduced after encapsulating.Can be by the bottom surface of first, second slide holder outside plastic-sealed body in the present invention;Also a variety of methods, a part of surface of IC chip will be further not connected on connection sheet outside plastic-sealed body;Or the further connection heat sink, and make a part of surface of the heat sink outside plastic-sealed body on connection sheet;Or heat sink is inserted into the reserved breach of plastic-sealed body and helps to radiate with contact and connection piece.

Description

A kind of encapsulating structure and its method for packing of multi-chip lamination
This case is divisional application
Original bill denomination of invention:A kind of encapsulating structure and its method for packing of multi-chip lamination
Original bill application number:201310617032.1
The original bill applying date:On November 27th, 2013
Technical field
The present invention relates to semiconductor applications, the more particularly to a kind of encapsulating structure and its method for packing of multi-chip lamination.
Background technology
In DC-DC (DC-to-dc) converter, two MOSFET (metal oxide semiconductor field-effects are typically provided with Pipe) as switching switch, one is high-end MOSFET (abbreviation HS), and another is low side MOSFET (abbreviation LS).Wherein, HS Grid G 1 and LS grid G 2 are connected with a controller (abbreviation IC);HS drain D 1 connects Vin ends, and source S 1 connects LS's Drain D 2, and LS source S 2 connection Gnd ends, to form described dc-dc.
For the chip-packaging structure in dc-dc, it is desirable to high-end MOSFET chips and low side MOSFET cores Piece and controller chip are encapsulated in same plastic-sealed body, to reduce peripheral components quantity, while improve the utilization of power supply etc. Efficiency.However, for specific encapsulating structure, above-mentioned high-end MOSFET chips and low side MOSFET chips and controller Chip can only be arranged in parallel in the approximately the same plane of lead frame, therefore the volume after encapsulation is big;Moreover, only by lead To connect the respective pins of chip (being, for example, between HS source S 1 and LS drain D 2), resistance and thermal resistance increase will be caused, Influence device end properties.
The content of the invention
It is an object of the invention to provide the multiple embodiments of a kind of encapsulating structure of multi-chip lamination and its method for packing, On plane where controller chip being overlayed to high-end and MOSFET chips of low side by setting plate, and The circuit for realizing respective chip pin by the plate connects, and is partly led multiple semiconductor die packages same with realizing In body encapsulation, so as to reduce the quantity of element when DC-to-dc converter assembles, reduce the size of whole semiconductor packages, and It is effectively improved the electric property and radiating effect of device.
In order to achieve the above object, a technical scheme of the invention is to provide a kind of encapsulating structure of multi-chip lamination, its Comprising:
Lead frame, it is provided with the first slide holder spaced apart from each other, the second slide holder and some pins, second slide glass Platform is further provided with Part I and Part II spaced apart from each other;
First chip, its backplate are arranged downwards and are conductively connected on the first slide holder;
Second chip, its front electrode is arranged downwards by upset and be conductively connected the Part I in the second slide holder And on Part II, some of front electrodes of second chip are connected to the Part I, wherein other fronts are electric Pole is connected to the Part II;
Connection sheet, its bottom surface are conductively connected to some of front electrodes that the first chip is arranged upwards, and second simultaneously In the backplate that chip is arranged upwards;
3rd chip, its back side arrangement and insulated are connected on the top surface of the connection sheet downwards;
Plastic-sealed body, it encapsulates the 3rd chip, connection sheet, the first chip and the second core stacked successively as sandwich construction Piece, lead frame, and the lead between chip electrode and chip electrode or between chip electrode and pin is correspondingly connected to, and And it is exposed to part that pin is connected with external devices and at least a portion at the first slide holder and the second slide holder back side Beyond the plastic-sealed body.
In one specific application example, first chip is a HS chip as high-end MOSFET chips, its The Drain Electrodes Conductive that the back side is set is connected on the first slide holder;
Second chip is a LS chip as low side MOSFET chips and Jing Guo wafer-level package, and its front is set The source conductive put is connected on the Part I of the second slide holder, and the Gate Electrode Conductive that front is set is connected to the second slide holder On Part II;
The back side of the connection sheet is conductively connected the drain electrode in the source electrode and the LS chip backs of the HS chip front sides On, to realize the electric connection between the two electrodes;
3rd chip is an IC chip as controller, the insulated top surface for being connected to connection sheet in its bottom surface On, and in the respective electrode or lead frame that some electrodes of its top surface are correspondingly connected on other chips by lead respectively Respective pins;
Some electrodes of piece masking are not coupled in the HS chip front sides or LS chip backs, pass through lead pair respectively yet The respective pins in respective electrode or lead frame that should be connected on other chips.
In one embodiment, the encapsulating structure is also provided with heat sink, the heat sink and institute before plastic-sealed body is formed State the 3rd chip to be connected on the top surface of connection sheet, so that the heat sink forms thermal conductive contact, Jin Ertong with connection sheet Cross surface of the heat sink outside plastic-sealed body top surface and realize radiating.
In another embodiment, the encapsulating structure is also provided with heat sink after plastic-sealed body is formed;The plastic-sealed body Breach is formed further with top surface, the bottom of the heat sink is inserted into the breach to be connected to the top surface of connection sheet, and shape Into the heat sink and the thermal conductive contact of connection sheet, and then the top stayed in by the heat sink outside plastic-sealed body top surface is realized and dissipated Heat.
The connection sheet is provided with the high-end coupling part being connected on the first chip, and the low side being connected on the second chip Coupling part;The high-end coupling part and low side coupling part of the connection sheet have identical or different thickness;
In one embodiment, the high-end coupling part, the first chip, the first slide holder thickness and value, it is and described low Hold coupling part, the second chip, the second slide holder thickness and value it is equal so that connection after connection sheet top surface level with steady Admittedly place the 3rd chip.
In another embodiment, the 3rd chip is connected in the high-end coupling part or low side coupling part of connection sheet On the less part of thickness, the top surface of a larger part of thickness is sudden and violent in high-end coupling part or low side coupling part It is exposed at outside the plastic-sealed body and realizes radiating.
Preferably, the contact formed with several local directed complete set connection sheet thickness on the connection sheet, the contact is The connection sheet top surface is set to be recessed downwards to form the blind hole not penetrated and make the downward projection of structure in connection sheet bottom surface simultaneously.
The connection sheet is further provided with wire connections point, and it is conductively connected to the interconnection pin set by lead frame On;Wire connections point, high-end coupling part and low side coupling part, be by be integrally formed or by assembly and connection come Form the connection sheet;
Preferably, the wire connections point are prevented in assembling and encapsulation process with being correspondingly arranged on the interconnection pin The locking mechanism that connection sheet position changes.
Preferably, it is described between second chip and the second slide holder between first chip and the first slide holder Being conductively connected between connection sheet and first chip and the second chip, it is by being set between the surface of interconnection Scolding tin or the epoxide-resin glue of conduction are realized;
Insulated connection between 3rd chip and the connection sheet, do not led by what is set in the 3rd chip back Electric adhesive glue is realized.
The preferable connection sheet is copper sheet.
Another technical scheme of the present invention is to provide a kind of method for packing of multi-chip lamination, comprising:
Lead frame is set, it is provided with the first slide holder spaced apart from each other, the second slide holder and some pins, and described second Slide holder is further provided with Part I and Part II spaced apart from each other;
The backplate of first chip is arranged downwards and is conductively connected on the first slide holder;
Second chip is overturn so that its front electrode is arranged downwards and is conductively connected the Part I in the second slide holder And on Part II, some of front electrodes of second chip are connected to the Part I, wherein other fronts are electric Pole is connected to the Part II;
Connection sheet bottom surface is conductively connected to some of front electrodes that the first chip is arranged upwards, and the second core simultaneously In the backplate that piece is arranged upwards;
The back side of 3rd chip arrangement and insulated is connected on the top surface of the connection sheet downwards;
The 3rd chip, connection sheet, the first chip and the second chip for sandwich construction will be stacked successively, draws by forming plastic-sealed body Wire frame, and the lead being correspondingly connected between chip electrode and chip electrode or between chip electrode and pin are packaged Afterwards, cut the plastic-sealed body and form an independent device;Also, make the part and the first load that pin is connected with external devices At least a portion at piece platform and the second slide holder back side is exposed to beyond the plastic-sealed body.
In one embodiment, a heat sink of setting is also connected to the connection by the method for packing also before plastic packaging On the top surface of piece, so that the heat sink forms thermal conductive contact with connection sheet, and then plastic-sealed body top is exposed to by the heat sink Realize radiating in surface outside face.
In another embodiment, the method for packing encapsulation formed plastic-sealed body top surface on formed it is jagged, and will The bottom of a heat sink set is inserted into the breach to be connected to the top surface of connection sheet, and forms the heat sink and connection sheet Thermal conductive contact, and then radiating is realized at the top stayed in by the heat sink outside plastic-sealed body top surface.
The connection sheet is provided with the high-end coupling part being connected on the first chip, and the low side being connected on the second chip Coupling part;The high-end coupling part and low side coupling part of the connection sheet have identical or different thickness;
During both thickness differences, the 3rd chip is connected in the high-end coupling part or low side coupling part of connection sheet On the less part of thickness, the top surface of a larger part of thickness is sudden and violent in high-end coupling part or low side coupling part It is exposed at outside the plastic-sealed body and realizes radiating.
Preferably, it is described between second chip and the second slide holder between first chip and the first slide holder Being conductively connected between connection sheet and first chip and the second chip, it is by being set between the surface of interconnection Scolding tin or the epoxide-resin glue of conduction are realized;
Insulated connection between 3rd chip and the connection sheet, do not led by what is set in the 3rd chip back Electric adhesive glue is realized.
In preferred embodiment, the contact formed with several local directed complete set connection sheet thickness on the connection sheet, institute It is to make the connection sheet top surface be recessed downwards to form the blind hole not penetrated and make the connection sheet bottom simultaneously by hole knockout to state contact Prominent structure downwards.
In any one above-mentioned embodiment, first chip is formed by procedure below:To even on silicon chip The surface for connecing other devices forms coating respectively;Carry out chip testing;Chip back is ground and back face metalization is to control first The thickness of chip simultaneously forms corresponding backplate;Cutting forms each the first independent chip;And then by first core The piece back side is connected to downwards the first slide holder.
Second chip is formed by procedure below:On silicon chip plating is formed to connect the surface of other devices Layer;Carry out chip testing and circuitous pattern mapping;Ball is planted in front side of silicon wafer correspondence position to form corresponding front electrode;Chip Level encapsulation forms packaging body;Ground in chip front side, so as to plant the top of ball outside the top surface of packaging body;Chip front side is pre- Cutting, form scribe line;Chip back is ground and back face metalization is to control the thickness of the second chip and form the corresponding back side Electrode;Cutting forms each the second independent chip;Afterwards, it will be made to face down after second chip upset and is connected to the Two slide holders.
3rd chip is formed by procedure below:Chip back is ground;The backside coating of IC chip is non-conductive Adhesive glue;Cutting forms each the 3rd independent chip;Afterwards, the 3rd chip is bonded in and is already attached to the first core The top surface of piece, connection sheet on the second chip;
Stacked in the 3rd chip, connection sheet, the first chip and the second chip after forming sandwich construction, also with following mistake Journey:Adhesive tape of paste, solidified;Between corresponding chip electrode and chip electrode, and between chip electrode and pin respectively Bonded formation lead;Form plastic-sealed body;Coating is formed in the position outside plastic-sealed body;It is finally cut to create each independent Packaging.
Compared with prior art, the encapsulating structure and its method for packing of multi-chip lamination of the present invention, the advantage is that:
Compared to the knot that the drain electrode of the source electrode of HS chips and LS chips was originally connected using multiple pasters or bonded lead Structure, is used only the welding simultaneously of a connection sheet in of the invention or conduction is pasted to the drain electrode of the source electrode of HS chips and LS chips, Can is electrically connected with the two electrodes, and technique is simply easily achieved, and conduction loss and switching loss reduce, and heat dissipation efficiency Then strengthened, device end properties is more preferable.
Compared to originally by three chips and being emitted on the structure of approximately the same plane, the insulated connection of IC chip in the present invention On connection sheet, so as to be stacked to the top of HS chips and LS chips place plane, with effective device reduced after encapsulating Size, save encapsulating material.
It can be easy to connect circuit board and reality by the bottom surface of first, second slide holder outside plastic-sealed body in the present invention Now radiate.There are three kinds of methods in the present invention, the surface of heat transmission is further also formed in plastic-sealed body top surface, i.e. by connection sheet On be not connected to a part of surface of IC chip outside plastic-sealed body;Or the further connection heat sink, and making on connection sheet Some surface of the heat sink is outside plastic-sealed body;Or heat sink is inserted into the reserved breach of plastic-sealed body with contact Connection sheet is radiated.
The laminated construction of the present invention can't be influenceed between IC chip and other chips, and HS chips or LS chips are with drawing The bonded lead for forming connection between pin.Can be by setting the different connection sheet of each several part thickness or by connection sheet The heat sink of connection adjusts the thickness of diverse location in encapsulating structure, so that the IC chip of encapsulating structure side, below Connection sheet part, HS chips, the general thickness of the first slide holder and corresponding lead, with the connection sheet of encapsulating structure opposite side The combination of thicker portion or heat sink and connection sheet, LS chips, the general thickness of the second slide holder match.
It can also be formed in the present invention by being punched on connection sheet in the downward projection of multiple contacts in bottom surface, this is for example In the case of after bonded lead, it can quickly and easily realize and the local thickness of connection sheet is adjusted.
Locking mechanism is correspondingly arranged on connection sheet and the lead frame pin being attached thereto in the present invention, to ensure group In dress and encapsulation process, the position of connection sheet will not change.In addition, fin can also be consolidated by setting locking mechanism Its fixed position.
Brief description of the drawings
Figure 1A is the stereogram of present invention chip-packaging structure described in the first embodiment;
Figure 1B is the front perspective view of present invention chip-packaging structure described in the first embodiment;
Fig. 1 C are the side diagrammatic cross-sections of present invention chip-packaging structure described in the first embodiment;
Fig. 1 D and Fig. 1 E are a kind of structural representations of preferably plate positive and negative in chip-packaging structure of the present invention;
Fig. 2A~Fig. 2 G are the present invention structures corresponding with each step of the chip packaging method in the first embodiment Schematic diagram;
Fig. 3 is the flow chart of present invention chip packaging method described in the first embodiment;
Fig. 4 A~Fig. 4 G are present invention structures corresponding with each step of the chip packaging method in a second embodiment Schematic diagram;
Fig. 5 is the flow chart of present invention chip packaging method described in a second embodiment;
Fig. 6 A~Fig. 6 H are the present invention structures corresponding with each step of the chip packaging method in the third embodiment Schematic diagram;
Fig. 7 is the flow chart of present invention chip packaging method described in the third embodiment;
Fig. 8 A~Fig. 8 F are the present invention structures corresponding with each step of the chip packaging method in the fourth embodiment Schematic diagram;
Fig. 9 is the flow chart of present invention chip packaging method described in the third embodiment.
Embodiment
Below with reference to accompanying drawing, illustrate multiple preferred embodiments of the invention.
Embodiment 1
Coordinate referring to shown in Figure 1A~Fig. 1 C, by MOSFET chips (2 N-types or 2 of 2 same types in the present invention P-type), respectively as high-end MOSFET (referred to as HS chips 20) and low side MOSFET chips (referred to as LS chips 30).Pass through One connection sheet 40 overlays a controller chip (referred to as IC chip 50) same where the two MOSFET chips In individual plane, also, IC chip 50 is connected post package same with the respective electrode and pin 14 of LS chips 30 and HS chips 20 In one plastic-sealed body 100, to form a DC-to-dc converter.
Described HS chips 20 and LS chips 30, each comfortable chip front side is provided with source electrode and grid, and is set in chip back There is drain electrode;Wherein, the grid G 1 of HS chips 20 and the grid G 2 of LS chips 30 are connected with the control pole in IC chip 50;HS The drain D 1 of chip 20 connects Vin ends, and source S 1 connects the drain D 2 of LS chips 30, and the source S 2 of LS chips 30 connects Gnd End, forms the DC-to-dc converter.Can also be set between the Vin-Gnd both ends of DC-to-dc converter electric capacity, Other components such as inductance.
In the encapsulating structure that the present embodiment provides, provided with lead frame 10 (referring to shown in Fig. 2A), the lead frame 10 exists The first slide holder 11 and the second slide holder being separated from each other are provided with same plane, wherein, the second slide holder is additionally provided with phase The Part I 12 and Part II 13 mutually separated.The lead frame 10 is additionally provided with multiple pins 14 being separated from each other, its In include:Low side source lead, low side gate pin, high-end source lead, high side gate pin, and interconnection pin 15 etc..
These pins 14 in the present embodiment are distributed in the periphery of the first slide holder 11 and the second slide holder, wherein, it is high-end Drain lead is extended from the first slide holder 11, and low side source lead is from the Part I 12 of the second slide holder Extended, low side gate pin is extended from the Part II 13 of the second slide holder;Some other pins 14 All it is then spaced apart from each other with the first slide holder 11 or the second slide holder.
The HS chips 20 are placed on the first slide holder 11, at the back side of the HS chips 20 and the top of the first slide holder 11 The epoxy resin adhesive glue 91 of scolding tin or conduction or other conductive connecting materials are provided between face, so that the back side of HS chips 20 Drain electrode S1 is electrically connected with the first slide holder 11, and can be connected by high-end drain lead with external devices.
The LS chips 30 of wafer-level package, are positioned over after upset on the second slide holder, downward just in the LS chips 30 Epoxy resin adhesive glue 91 of scolding tin or conduction etc. is provided between face and the Part I 12 and Part II 13 of the second slide holder, So that the Part I 12 of 30 positive source electrode of LS chips and the second slide holder is electrically connected with, and low side source lead can be passed through Connected with external devices;Meanwhile the positive grid G 2 of LS chips 30 and the Part II 13 of the second slide holder are electrically connected with, and It can be connected by low side gate pin with external devices.
The connection sheet 40 especially set in the encapsulating structure that the present embodiment provides is to be made of an electrically conducting material, and is, for example, one kind Copper sheet.The connection sheet 40 is provided with high-end coupling part 41 and low side coupling part 42, passes through scolding tin or the asphalt mixtures modified by epoxy resin of conduction respectively Fat adhesive glue 91 etc., bonding is arranged on HS chips 20 and the upward surface of LS chips 30, so that HS chips 20 are positive Source S 1 and the drain D 2 at the back side of LS chips 30 (both are upward arrangement) are electric with the relevant position of the bottom surface of connection sheet 40 respectively Property connection, and realize the electric connection between the source S 1 of HS chips 20 and the drain D 2 of LS chips 30.
The thickness design of the connection sheet 40, the high-end coupling part 41 and HS below for making connection sheet 40 should be met The thickness of the grade addition of chip 20, equal to low side coupling part 42 and the thickness that the grade of LS chips 30 is added below of connection sheet 40, To ensure that the top surface of whole connection sheet 40 after being bonded is the plane parallel with HS chips 20 and the place of LS chips 30, so as to In follow-up firm placement IC chip 50.For example, it is preferable to embodiment in be the thickness for making the first slide holder 11 and the second slide holder Unanimously;HS chips 20 and the consistency of thickness of LS chips 30, it is connected to the top surface level of latter two chip of lead frame 10;Also, make The consistency of thickness of the position of corresponding connection HS chips 20 and LS chips 30 on connection sheet 40, so as to ensure that it overlays two chips Top surface after upper is also horizontal.
Coordinate referring to shown in Fig. 1 D~Fig. 1 E, for example, can be formed respectively in the bottom of connection sheet 40, can to adjust its high Hold the protruding block 411,421 of the thickness of coupling part 41 and low side coupling part 42.Also, in a preferred embodiment, Can also be each further to adjust connection sheet 40 formed with multiple downward projection of contacts 45 in the position of protruding block 411,421 Partial thickness.The formation of these contacts 45, it is by being punched on connection sheet 40, so as to be formed not in the top surface of connection sheet 40 The pit penetrated, and described contact 45 is formed in the bottom of connection sheet 40.On one connection sheet 40, diverse location contact 45 Punching depth can be adjusted situation according to specific thickness and determined with identical or differ.
Meanwhile the connection sheet 40 is additionally provided with pin connection points 43, for the interconnection positioned at the periphery of lead frame 10 Pin 15 is electrically connected with, so that the source S 1 of HS chips 20 and the drain D 2 of LS chips 30 and connection sheet 40 can enter one Step is connected by the interconnection pin 15 with external devices.The pin connection of the connection sheet 40 point 43, its downward projecting portion 431 thickness add be connected with the ledge 431 interconnect pin 15 thickness, it should also meet it is above-mentioned make bonding after be coupled The top surface of piece 40 purpose of design parallel with two MOSFET chips.
In a preferred embodiment, lead frame 10 interconnection pin 15 on and the connection sheet 40 pin Coupling part 43 is also correspondingly arranged on locking mechanism.In Figure 1A exemplary construction, the locking mechanism interconnected on pin 15 is out If several positioning holes 81, and the locking mechanism of connection sheet 40 is then the keeper 82 in the correspondence position of its bottom, it is illustrated that Keeper 82 equivalent to a kind of structure for extending downwardly or bending from the bottom surface of connection sheet 40, can correspond to that to be inserted into these fixed To realize the fixation of the position of connection sheet 40 in the hole 81 of position, to ensure to be moved in assembling and encapsulation process connection sheet 40. Also, when being provided with above-mentioned locking mechanism, the thickness of keeper 82 on connection sheet 40, it is greater than the thickness that pin connection divides 43 Degree, it is inserted into ensuring that the keeper 82 can correspond in the positioning hole 81 of interconnection pin 15.The present invention is not limited in other Implementation structure in exchange the position of positioning hole 81 and keeper 82 or the locking mechanism using other structures.
In Figure 1A exemplary construction, the surface configuration and its size design of connection sheet 40 so that the height of the connection sheet 40 End coupling part 41 substantially covers the most areas at the top of LS chips 30 below, but low side coupling part 42 does not have then The top of HS chips 20 is completely covered.Thus, the front of HS chips 20 is not coupled the source S 1 and grid of the masking of piece 40 G1, respectively by several bonded leads 60, can be connected directly to lead frame 10 pin 14 or other chips (such as IC chip 50) electrode on;Or using the pin 14 of lead frame 10 as transfer, multistage is set to distinguish bonded lead 60, with the respective electrode being indirectly connected on other chips (being, for example, IC chip 50).The present invention is also not limited in other real Apply in example, using the connection sheet 40 of other structures, for example, being the structure of endless all standing LS chips 30;Or connection sheet 40 is not It is integrally formed, but is connected with each other by multiple small coupling components or assembling is formed etc..
IC chip 50 of the present invention, by nonconducting adhesive glue 92 or other insulation be fixedly connected with mode, glue Connect and be arranged on the top surface of the connection sheet 40, so that IC chip 50, connection sheet 40, HS chips 20 and LS chips 30 are formed as One sandwich construction stacked from top to bottom, while will not between the IC chips 50 and the electrode of HS chips 20 and LS chips 30 Realized and be electrically connected with by connection sheet 40.
In Figure 1A exemplary construction, on the high-end coupling part 41 of connection sheet 40, i.e., the IC chip 50 is The position of the corresponding top of HS chips 20;And in other examples not shown, IC chip 50 can be pushed up positioned at connection sheet 40 The other positions in face.Some electrodes in the IC chip 50, lead can be electrically connected to respectively by bonded lead 60 In the respective pins 14 on the periphery of framework 10 or in the respective electrode of other chips (being, for example, HS chips 20).
In the encapsulating structure of the present embodiment, also comprising plastic-sealed body 100, by the above-mentioned folded IC chip 50 set, connection sheet 40, HS The lead 60 connected on chip 20 and LS chips 30 and counter electrode is all encapsulated to form a device, and by each pin 14 The part being connected with external devices is exposed, and make the first slide holder 11 and the second slide holder on lead frame 10 (such as Its Part I 12) bottom surface be exposed to plastic-sealed body 100 outside, to connect circuit board or help radiate.
Below please refer to Fig. 2A~Fig. 2 G shown in structure, and the flow shown in Fig. 3 introduces core described in the present embodiment The method for packing of piece:
That is, see Fig. 2A, a lead frame 10 is set, comprising the first slide holder 11 spaced apart from each other, provided with Part I 12 and the second slide holder of Part II 13, and multiple pins 14.
See Fig. 2 B, it is HS chips 20 to set a MOSFET chip, is fixed and is connected on the first slide holder 11 and makes The drain D 1 at the back side of HS chips 20 is electrically connected with the first slide holder 11.
See Fig. 2 C, the MOSFET chips for setting another wafer-level package are LS chips 30, are fixedly connected after being overturn On the second slide holder and it is electrically connected the positive source S 1 of LS chips 30 and the Part I 12 of the second slide holder, and The positive grid G 2 of LS chips 30 and the Part II 13 of the second slide holder are electrically connected.
See Fig. 2 D, a connection sheet 40 is set, at its back side respectively by setting scolding tin or the epoxy resin of conduction to bond The similar fashions such as glue 91, the high-end coupling part 41 of the connection sheet 40 is connected to the top surface of HS chips 20, low side coupling part 42 The top surface of LS chips 30 is connected to, pin connection point 43 is connected on the interconnection pin 15 of lead frame 10 so that HS chips 20 Electric connection is mutually formed between the upward back-side drain D2 of positive source S 1, LS chips 30 and interconnection pin 15.
See Fig. 2 E, by IC chip 50 by nonconducting adhesive glue 92, be fixedly installed on the top surface of connection sheet 40, shape The sandwich construction stacked into IC chip 50, connection sheet 40, HS chips 20 with LS chips 30.Also, the front of HS chips 20 not by The grid G 1 and source S 1 that connection sheet 40 covers, some electrodes of IC chip 50, and between some pins 14 of lead frame 10 Connected each other by bonded lead 60 is corresponding.
As shown in Fig. 2 F and Fig. 2 G tow sides, set plastic-sealed body 100 by IC chip 50, connection sheet 40, HS chips 20 with The sandwich construction and the grade of lead 60 that LS chips 30 stack all are encapsulated, and make each pin 14 to connect the position of external devices Put and the back side of the first slide holder 11 and the second slide holder is exposed.
Referring back to shown in Fig. 3, when setting a LS chip 30, realized by following steps:It is used on LS chips 30 The surface that follow-up manifold card is fixed is formed with coating, e.g. Ni/Au coating;Chip testing and circuitous pattern mapping;In chip Front correspondence position carries out planting ball to form corresponding electrode.Wafer-level package;Ground in chip front side, so as to plant the top of ball Outside the top surface of packaging body;For example, the top surface that expose after grinding plant ball flushes with the top surface of packaging body, etc. Deng.Chip front side is precut, and forms scribe line.Chip back is ground and back face metalization forms respective electrode;A such as tool Thickness in body example after grinding back surface and back face metalization is 6mil, and the wherein thickness of silicon chip is 3mil, above silicon chip Encapsulation body thickness be 3mil.Afterwards, cutting forms each independent LS chips 30, then overturns and make it with face down and the back of the body Face-up mode is conductively connected on the second slide holder.
And when setting a HS chip 20, realized by following steps:Fixed on HS chips 20 for follow-up manifold card Surface formed with coating, e.g. Ni/Pd/Au coating;Chip testing;Chip back is ground and back face metalization, such as Illustrated with above-mentioned instantiation, make the consistency of thickness of HS chips 20 and LS chips 30 after grinding back surface and back face metalization, be 6mil.Cutting forms each independent HS chips 20, makes it face-up, the back side is connected to the first slide holder 11 down.
And when setting an IC chip 50, realized by following steps:The grinding back surface of IC chip 50, for example, 6mil. In the nonconducting adhesive glue 92 of the backside coating of IC chip 50.Cutting forms each independent IC chip 50, after being placed in cleaning The top surface of connection sheet 40 on.
Then IC chip 50, connection sheet 40, HS chips 20 stack with LS chips 30 be connected after, specifically provided with adhesive tape of paste, Solidified;The bonded lead 60 for forming connection between the electrode and pin 14 of respective chip;Form plastic-sealed body 100;Sudden and violent The position of dew forms coating;By similar fashions such as sawing or punching presses, cutting forms some steps of each independent packaging Suddenly.
Embodiment 2
Fig. 4 A~Fig. 4 G show that the present embodiment chips encapsulate the structural representation in each step, and Fig. 5 shows this reality Apply the flow of method for packing in example.Wherein, the structure description of the present embodiment is as follows, i.e. a lead frame 10 (Fig. 4 A) is set, Comprising the first slide holder 11, for being fixedly connected with HS chips 20 and being electrically connected (Fig. 4 B) with its back-side drain D1;Also wrap Containing the second slide holder, provided with Part I 12 and Part II 13, for being fixedly connected with the encapsulation LS chips 30 and difference of upset It is electrically connected (Fig. 4 C) with its positive source S 2 and grid G 2.One connection sheet 40 is conductively connected in HS chips 20 and On LS chips 30, so that the high-end coupling part 41 of the connection sheet 40 is electrically connected to the positive source S 1 of HS chips 20, and it is somebody's turn to do The low side coupling part 42 of connection sheet 40 is electrically connected to the upward back-side drain D2 of LS chip 30LS chips 30, and and then passes through The pin connection of the connection sheet 40 point 43 is electrically connected to the interconnection pin 15 (Fig. 4 D) of lead frame 10;
It is with the difference in embodiment 1, is on connection sheet 40 in the present embodiment while is provided with IC chip 50 With a heat sink 71, the heat sink 71 is made in the e.g. good copper coin of heat conductivility or similar material.For example, it is by this Heat sink 71, which is arranged on the top surface of the low side coupling part 42 of connection sheet 40, forms good thermal conductive contact (Fig. 4 E), and incite somebody to action The insulated high-end coupling part 41 (Fig. 4 F) for being bonded in connection sheet 40 of IC chip 50.Then, IC chip 50 and heat sink 71 are formed, The sandwich construction that connection sheet 40, HS chips 20 and LS chips 30 stack, also, the thickness design of heat sink 71, should be with IC cores The thickness connected between piece 50 and HS chips 20 or pin 14 after some leads 60 is roughly the same.Above-mentioned sandwich construction is encapsulated in In plastic-sealed body 100, and make the part connected outside each pin 14, most of bottom surface difference of the first slide holder 11 and the second slide holder Outside the bottom surface of plastic-sealed body 100;The top surface of heat sink 71 is set to enter one outside the top surface of plastic-sealed body 100 simultaneously Step help is radiated.
Coordinate shown in Figure 5, setting lead frame 10, HS chips 20, LS chips 30 and IC chip 50 in the present embodiment Process with basically identical in embodiment 1, difference mainly needs to set heat sink 71, and is bonded in HS cores in connection sheet 40 After on piece 20 and LS chips 30, heat sink 71 is connected, it is necessary to increase before IC chip 50 with setting to cleaning connection sheet 40 The step of to 40 top surface of connection sheet.
Embodiment 3
Fig. 6 A~Fig. 6 G show that the present embodiment chips encapsulate the structural representation in each step, and Fig. 7 shows this reality Apply the flow of method for packing in example.Wherein, the structure description of the present embodiment is as follows, i.e. a lead frame 10 (Fig. 6 A) is set, Comprising the first slide holder 11, for being fixedly connected with HS chips 20 and being electrically connected (Fig. 6 B) with its back-side drain D1;Also wrap Containing the second slide holder, provided with Part I 12 and Part II 13, for being fixedly connected with the encapsulation LS chips 30 and difference of upset It is electrically connected (Fig. 6 C) with its positive source S 2 and grid G 2.One connection sheet 40 is conductively connected in HS chips 20 and On LS chips 30, so that the high-end coupling part 41 of the connection sheet 40 is electrically connected to the positive source S 1 of HS chips 20, and it is somebody's turn to do The low side coupling part 42 of connection sheet 40 is electrically connected to the upward back-side drain D2 of LS chip 30LS chips 30, and and then passes through The pin connection of the connection sheet 40 point 43 is electrically connected to the interconnection pin 15 (Fig. 6 D) of lead frame 10.By an IC core Piece 50 is insulated to be bonded in the high-end coupling part 41 of connection sheet 40, and is formed between IC chip 50, HS chips 20 and pin 14 Mutual lead 60 connects (Fig. 6 E);
It is with the difference in embodiment 1, is to use plastic-sealed body 100 by IC chips 50, connection in the present embodiment When the sandwich construction that piece 40, HS chips 20 and LS chips 30 stack encapsulates together, the structure of the bottom surface of plastic-sealed body 100 exposure is constant, But a breach 101 is formed on the top surface of the plastic-sealed body 100 so that the low side coupling part 42 on connection sheet 40 has one Facet product is exposed (Fig. 6 F) from the breach 101.Set a heat sink 72, e.g. the good copper coin of heat conductivility or Similar material is made, and the bottom of the heat sink 72 is vertically provided with a protrusion (Fig. 6 G), and the protrusion is inserted into plastic packaging The breach 101 of body 100, and form thermal conductive contact with enough thickness so as to be connected to connection sheet 40.The top of the heat sink 72 Portion is stayed on the top surface of plastic-sealed body 100 (Fig. 6 H), therefore can be set in the case of no more than the area of plastic-sealed body 100 as far as possible big Area of dissipation, with improving radiating effect.
Coordinate shown in Figure 7, setting lead frame 10, HS chips 20, LS chips 30 and IC chip 50 in the present embodiment Process with basically identical in embodiment 1, difference mainly need set heat sink 72, and encapsulation sandwich construction formed band The protrusion of heat sink 72 is inserted into breach 101 and connection sheet therein, it is necessary to increase after the plastic-sealed body 100 of breach 101 40 top surfaces realize the step of connection and thermal conductive contact.
Embodiment 4
Fig. 8 A~Fig. 8 F show that the present embodiment chips encapsulate the structural representation in each step, and Fig. 9 shows this reality Apply the flow of method for packing in example.Wherein, the structure description of the present embodiment is as follows, i.e. a lead frame 10 (Fig. 8 A) is set, Comprising the first slide holder 11, for being fixedly connected with HS chips 20 and being electrically connected (Fig. 8 B) with its back-side drain D1;Also wrap Containing the second slide holder, provided with Part I 12 and Part II 13, for being fixedly connected with the encapsulation LS chips 30 and difference of upset It is electrically connected (Fig. 8 C) with its positive source S 2 and grid G 2.One connection sheet 40 is conductively connected in HS chips 20 and On LS chips 30, so that the high-end coupling part 41 of the connection sheet 40 is electrically connected to the positive source S 1 of HS chips 20, and it is somebody's turn to do The low side coupling part 42 of connection sheet 40 is electrically connected to the upward back-side drain D2 of LS chip 30LS chips 30, and and then passes through The pin connection of the connection sheet 40 point 43 is electrically connected to the interconnection pin 15 (Fig. 8 D) of lead frame 10;
It is with the difference in embodiment 1, the structure of connection sheet 40 in the present embodiment is different, wherein, high-end connection The thickness of part 41 (and pin connection point 43) is less than the thickness (Fig. 8 D) of low side coupling part 42.And the low side connecting portion Points 42 thickness design, it should meet to be bonded in IC chip 50 is insulated on the high-end coupling part 41 of connection sheet 40, and It is roughly the same (Fig. 8 E) that the thickness after some leads 60 is connected between IC chip 50 and HS chips 20 or pin 14.Then, plastic-sealed body After the 100 sandwich construction encapsulation for stacking above-mentioned IC chip 50, connection sheet 40, HS chips 20 and LS chips 30, except plastic-sealed body 100 Outside the part of bottom surface exposure is constant, while the top surface of the low side coupling part 42 of the connection sheet 40 is also set to be exposed to plastic-sealed body Radiated outside 100 top surface with further help.Three parts of connection sheet 40 can be integrally formed in the present embodiment, Can be by being formed after assembling or connection.
Coordinate shown in Figure 9, setting lead frame 10, HS chips 20, LS chips 30 and IC chip 50 in the present embodiment And the process being encapsulated, with basically identical in embodiment 1, difference mainly needs with coverings such as adhesive tapes to be coupled before packaging The top surface of the high-end coupling part 41 of piece 40, in order to which after encapsulating its exposure can be set.
The Making programme of each chip in itself can be realized according to the conventional meanses of this area in the present invention.And in the present invention The encapsulating structure and method for packing that multi-chip is stacked and connected by connection sheet 40, two are used except above-described Beyond MOSFET chips and an IC chip 50, it can also apply in the encapsulation of other devices, e.g. encapsulate high pressure IGBT Chip (insulated gate bipolar transistor), dual pressure controller, or the chip for encapsulating greater number of chip or more are folded Layer, etc..
Although present disclosure is discussed in detail by above preferred embodiment, but it should be appreciated that above-mentioned Description is not considered as limitation of the present invention.After those skilled in the art have read the above, for the present invention's A variety of modifications and substitutions all will be apparent.Therefore, protection scope of the present invention should be limited to the appended claims.

Claims (17)

1. a kind of encapsulating structure of multi-chip lamination, it is characterised in that include:
Lead frame, it is provided with the first slide holder spaced apart from each other, the second slide holder and some pins, and second slide holder enters One step is provided with Part I spaced apart from each other and Part II;
First chip, its backplate are arranged downwards and are conductively connected on the first slide holder;
Second chip, its front electrode is arranged downwards by upset and be conductively connected in the Part I of the second slide holder and the On two parts, some of front electrodes of second chip are connected to the Part I, and wherein other front electrodes connect It is connected to the Part II;
Connection sheet, its bottom surface are conductively connected to some of front electrodes that the first chip is arranged upwards, and the second chip simultaneously In the backplate arranged upwards;
3rd chip, its back side arrangement and insulated are connected on the top surface of the connection sheet downwards;
Plastic-sealed body, it is encapsulated stacks the 3rd chip, connection sheet, the first chip and the second chip for sandwich construction, draws successively Wire frame, and the lead between chip electrode and chip electrode or between chip electrode and pin is correspondingly connected to, also, make The part and at least a portion at the first slide holder and the second slide holder back side that pin is connected with external devices are exposed to the modeling Seal beyond body;
Contact formed with several local directed complete set connection sheet thickness on the connection sheet, the contact are to make the connection sheet top Depression forms the blind hole not penetrated and makes the downward projection of structure in connection sheet bottom surface simultaneously downwards.
2. the encapsulating structure of multi-chip lamination as claimed in claim 1, it is characterised in that
First chip is a HS chip as high-end MOSFET chips, and the Drain Electrodes Conductive that its back side is set is connected to the On one slide holder;
Second chip is a LS chip as low side MOSFET chips and Jing Guo wafer-level package, what its front was set Source conductive is connected on the Part I of the second slide holder, and the Gate Electrode Conductive that front is set is connected to the second of the second slide holder On part;
The back side of the connection sheet is conductively connected in the drain electrode of the source electrode and the LS chip backs of the HS chip front sides, is used To realize the electric connection between the two electrodes;
3rd chip is an IC chip as controller, and its bottom surface is insulated to be connected on the top surface of connection sheet, and It is corresponding in the respective electrode or lead frame that some electrodes of its top surface are correspondingly connected on other chips by lead respectively Pin;
Some electrodes of piece masking are not coupled in the HS chip front sides or LS chip backs, are correspondingly connected by lead respectively yet The respective pins in respective electrode or lead frame being connected on other chips.
3. the encapsulating structure of multi-chip lamination as claimed in claim 1, it is characterised in that
The encapsulating structure is also provided with heat sink before plastic-sealed body is formed, and the heat sink is connected respectively with the 3rd chip On the top surface of connection sheet, so that the heat sink forms thermal conductive contact with connection sheet, and then by the heat sink exposed to modeling Realize radiating in the surface sealed outside body top surface.
4. the encapsulating structure of multi-chip lamination as claimed in claim 1, it is characterised in that
The encapsulating structure is also provided with heat sink after plastic-sealed body is formed;It is formed further with lacking on the top surface of the plastic-sealed body Mouthful, the bottom of the heat sink is inserted into the breach to be connected to the top surface of connection sheet, and forms the heat sink and connection sheet Thermal conductive contact, and then radiating is realized at the top stayed in by the heat sink outside plastic-sealed body top surface.
5. the encapsulating structure of multi-chip lamination as described in any one in Claims 1 to 4, it is characterised in that
The connection sheet is provided with the high-end coupling part being connected on the first chip, is connected with the low side being connected on the second chip Part;The high-end coupling part and low side coupling part of the connection sheet have identical or different thickness;
The high-end coupling part, the first chip, the first slide holder thickness and value, with the low side coupling part, the second core Piece, the second slide holder thickness and value it is equal so that the top surface level of connection sheet places the 3rd chip with firm after connection.
6. the encapsulating structure of multi-chip lamination as claimed in claim 5, it is characterised in that
3rd chip is connected to the less part of thickness in the high-end coupling part or low side coupling part of connection sheet On, the top surface of a larger part of thickness is exposed to outside the plastic-sealed body in high-end coupling part or low side coupling part Realize radiating.
7. the encapsulating structure of multi-chip lamination as claimed in claim 5, it is characterised in that
The connection sheet is further provided with wire connections point, and it is conductively connected on the interconnection pin set by lead frame; The wire connections point, high-end coupling part and low side coupling part, are by being integrally formed or by assembly and connection come shape Into the connection sheet;
The wire connections point prevent connection sheet position in assembling and encapsulation process with being correspondingly arranged on the interconnection pin The locking mechanism of change.
8. the encapsulating structure of multi-chip lamination as claimed in claim 1, it is characterised in that
Between first chip and the first slide holder, between second chip and the second slide holder, the connection sheet and institute Being conductively connected between the first chip and the second chip is stated, is scolding tin or conduction by being set between the surface of interconnection Epoxide-resin glue realize;
Insulated connection between 3rd chip and the connection sheet, it is non-conductive viscous by being set in the 3rd chip back Gum deposit is realized.
9. the encapsulating structure of multi-chip lamination as claimed in claim 1, it is characterised in that
The connection sheet is copper sheet.
A kind of 10. method for packing of multi-chip lamination, it is characterised in that
Lead frame is set, and it is provided with the first slide holder spaced apart from each other, the second slide holder and some pins, second slide glass Platform is further provided with Part I and Part II spaced apart from each other;
The backplate of first chip is arranged downwards and is conductively connected on the first slide holder;
Second chip is overturn so that its front electrode is arranged downwards and is conductively connected in the Part I of the second slide holder and the On two parts, some of front electrodes of second chip are connected to the Part I, and wherein other front electrodes connect It is connected to the Part II;
Connection sheet bottom surface is conductively connected to some of front electrodes that the first chip arranges upwards simultaneously, and the second chip to In the backplate of upper arrangement;
The back side of 3rd chip arrangement and insulated is connected on the top surface of the connection sheet downwards;
The 3rd chip for sandwich construction, connection sheet, the first chip and the second chip, lead frame will be stacked successively by forming plastic-sealed body Frame, and be correspondingly connected to after the lead between chip electrode and chip electrode or between chip electrode and pin is packaged, Cut the plastic-sealed body and form an independent device;Also, make the part and the first slide glass that pin is connected with external devices At least a portion at platform and the second slide holder back side is exposed to beyond the plastic-sealed body;
Contact formed with several local directed complete set connection sheet thickness on the connection sheet, the contact is to pass through hole knockout The connection sheet top surface is set to be recessed downwards to form the blind hole not penetrated and make the downward projection of structure in connection sheet bottom surface simultaneously.
11. the method for packing of multi-chip lamination as claimed in claim 10, it is characterised in that
One heat sink of setting is also connected on the top surface of the connection sheet by the method for packing also before plastic packaging, so that The heat sink forms thermal conductive contact with connection sheet, and then the surface being exposed to by the heat sink outside plastic-sealed body top surface is realized and dissipated Heat.
12. the method for packing of multi-chip lamination as claimed in claim 10, it is characterised in that
Formed on the top surface for the plastic-sealed body that the method for packing is formed in encapsulation it is jagged, and by the bottom of a heat sink of setting The breach is inserted into be connected to the top surface of connection sheet, and forms the thermal conductive contact of the heat sink and connection sheet, and then passes through institute State the top that heat sink is stayed in outside plastic-sealed body top surface and realize radiating.
13. the method for packing of multi-chip lamination as claimed in claim 10, it is characterised in that
The connection sheet is provided with the high-end coupling part being connected on the first chip, is connected with the low side being connected on the second chip Part;The high-end coupling part and low side coupling part of the connection sheet have identical or different thickness;
During both thickness differences, the 3rd chip is connected to thickness in the high-end coupling part or low side coupling part of connection sheet On a less part, the top surface of a larger part of thickness is exposed in high-end coupling part or low side coupling part Radiating is realized outside the plastic-sealed body.
14. the method for packing of multi-chip lamination as claimed in claim 10, it is characterised in that
Between first chip and the first slide holder, between second chip and the second slide holder, the connection sheet and institute Being conductively connected between the first chip and the second chip is stated, is scolding tin or conduction by being set between the surface of interconnection Epoxide-resin glue realize;
Insulated connection between 3rd chip and the connection sheet, it is non-conductive viscous by being set in the 3rd chip back Gum deposit is realized.
15. the method for packing of multi-chip lamination as described in any one in claim 11~14, it is characterised in that
First chip is formed by procedure below:Plating is formed respectively to connect the surface of other devices on silicon chip Layer;Carry out chip testing;Chip back is ground and back face metalization is to control the thickness of the first chip and form the corresponding back side Electrode;Cutting forms each the first independent chip;And then first chip back is connected to downwards the first slide glass Platform.
16. the method for packing of multi-chip lamination as claimed in claim 15, it is characterised in that
Second chip is formed by procedure below:On silicon chip coating is formed to connect the surface of other devices; Carry out chip testing and circuitous pattern mapping;Ball is planted in front side of silicon wafer correspondence position to form corresponding front electrode;Chip-scale Encapsulation forms packaging body;Ground in chip front side, so as to plant the top of ball outside the top surface of packaging body;Chip front side pre-cut Cut, form scribe line;Chip back is ground and back face metalization is to control the thickness of the second chip and form corresponding back side electricity Pole;Cutting forms each the second independent chip;Afterwards, it is faced down after second chip is overturn and be connected to second Slide holder.
17. the method for packing of multi-chip lamination as claimed in claim 16, it is characterised in that
3rd chip is formed by procedure below:Chip back is ground;The backside coating of IC chip is nonconducting viscous Gum deposit;Cutting forms each the 3rd independent chip;Afterwards, the 3rd chip is bonded in be already attached to the first chip, The top surface of connection sheet on second chip;
Stacked in the 3rd chip, connection sheet, the first chip and the second chip after forming sandwich construction, also with procedure below:It is glutinous Tape, solidified;Between corresponding chip electrode and chip electrode, and bonded shape is distinguished between chip electrode and pin Into lead;Form plastic-sealed body;Coating is formed in the position outside plastic-sealed body;It is finally cut to create each independent wrapper Part.
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