CN107515341B - Test board - Google Patents
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- CN107515341B CN107515341B CN201710813361.1A CN201710813361A CN107515341B CN 107515341 B CN107515341 B CN 107515341B CN 201710813361 A CN201710813361 A CN 201710813361A CN 107515341 B CN107515341 B CN 107515341B
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- 238000012360 testing method Methods 0.000 title claims abstract description 127
- 238000006243 chemical reaction Methods 0.000 claims abstract description 68
- 238000013461 design Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
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- 230000037431 insertion Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a test board. The test board comprises a first Type-C connector, a second Type-C connector, a Micro USB connector and a signal conversion module, wherein the signal conversion module is connected between the Micro USB connector and the second Type-C connector; the test board provides a test channel for a product to be tested through the Micro USB connector, the signal conversion module and the second Type-C connector, and provides an update channel for a processor of the product to be tested through the first Type-C connector and the second Type-C connector; the signal conversion module is used for converting the USB signal from the test host into a UART signal and sending the UART signal to the product to be tested through the second Type-C connector, converting the UART signal from the product to be tested into a USB signal and sending the USB signal to the test host through the Micro USB connector, so that the electronic product based on the Type-C interface can be directly tested through the Type-C interface, the test can be carried out in the whole machine state, and meanwhile, the program update of the processor can be realized, and the operation is convenient and time-saving.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a test board.
Background
With the rapid development of electronic technology, the transmission interfaces of electronic products are various, and peripheral interfaces of various electronic products are also endless, such as SATA interfaces, PS/2 interfaces, USB Type-C interfaces, RJ45 interfaces, VGA interfaces, HDMI interfaces, and the like. However, as electronic products are being miniaturized, ultra-thin, and have multiple functions, the products themselves cannot be designed with excessive interfaces. Therefore, there is a need for an interface with high compatibility, high functionality and small structural size.
The Type-C interface has the advantages of high transmission speed (the theoretical transmission speed can reach 10 Gbps), no forward and backward insertion, thin body (8.3 x 2.5 cm), strong power supply capability, strong expandability (the Type-C interface can transmit video and audio signals and is expanded into various audio and video output interfaces, such as HDMI, VGA, DVI interfaces) and the like, and is applied to more and more electronic products.
The Type-C interface is internally provided with 12 pairs of pins, when the Type-C interface has a USB2.0 function, 6 pairs of pins are defined to be used for being compatible with the USB2.0 function, and the other 6 pairs of pins can be idle pins and can be used for being compatible with other protocol signals. When the Type-C interface is USB3.0 capable, the RX pin and TX pin may be used to accommodate other protocol signals.
Although the current electronic product based on the Type-C interface can meet the data transmission requirement of USB signals, when testing or updating the program, the electronic product can only be detached from the whole machine when testing or updating the program because the electronic product can only communicate based on UART signals, and can only be debugged through the reserved UART interface on the detached control main board. The debugging method is inconvenient to operate, wastes time and energy of engineers to a great extent, and reduces the working efficiency of test engineers.
Disclosure of Invention
The invention provides a test board for solving the problems of inconvenient operation and high time consumption of the conventional electronic product based on a Type-C interface in the test process.
The invention provides a test board, which comprises a first Type-C connector, a second Type-C connector, a Micro USB connector and a signal conversion module, wherein the first Type-C connector and the Micro USB connector are used for being connected with a test host, the second Type-C connector is used for being connected with a product to be tested, and pins of the second Type-C connector are correspondingly connected with pins of a Type-C interface of the product to be tested one by one; the signal conversion module is connected between the Micro USB connector and the second Type-C connector;
the test board provides a test channel for the product to be tested through the Micro USB connector, the signal conversion module and the second Type-C connector, and provides an update channel for a processor of the product to be tested through the first Type-C connector and the second Type-C connector;
the signal conversion module is configured to convert a USB signal from the test host into a UART signal, send the UART signal to the product to be tested through the second Type-C connector, convert the UART signal from the product to be tested into a USB signal, and send the USB signal to the test host through the Micro USB connector.
Preferably, the test board provides an input voltage for the product to be tested through the update channels provided by the first Type-C connector and the second Type-C connector, and sends an update program to the product to be tested.
Preferably, the test board further comprises a voltage conversion module, the voltage conversion module is connected with the Micro USB connector and each internal chip of the test board, and the test board obtains input voltage from the test host through the Micro USB connector;
the voltage conversion module is used for carrying out voltage conversion on the input voltage of the test host and providing working voltage for each internal chip of the test board.
Preferably, the test board further includes a state switching module, where the state switching module is connected to the voltage conversion module and the second Type-C connector, and is configured to output a high level or a low level to the second Type-C connector according to a toggle operation of a user, so as to control the product to be tested to enter a test state or an update state.
Preferably, the test board further comprises a voltage indicating module, wherein the voltage indicating module is composed of a plurality of light emitting diodes and corresponding matching resistors, each voltage corresponds to one light emitting diode, and when a certain light emitting diode emits light, the corresponding voltage is indicated to be powered on.
Preferably, the voltage conversion module comprises a first voltage conversion chip converting 5V to 3.3V and a second voltage conversion chip converting 3.3V to 1.8V.
Preferably, a jumper cap position is reserved in the voltage conversion module;
and the jumper cap is used for directly providing the 5V voltage from the test host as an external power supply for the product to be tested.
Preferably, the signal conversion module is a USB-to-UART bridge controller.
Preferably, the voltage of the input signal of the signal conversion module is adjustable within the range from 1.8V to the reference voltage value of the product to be tested.
Preferably, the state switching module employs SS-1290 switches.
The beneficial effects of the invention are as follows: according to the technical scheme, the test board is designed by using the pins of the Type-C interface which can be compatible with other protocols, and compared with the prior art, the electronic product based on the Type-C interface can be tested directly through the Type-C interface, so that the electronic product can be tested in a complete machine state without detaching a control main board, and meanwhile, the program update of a processor can be realized, the electronic product based on the Type-C interface is more convenient and time-saving to test, and the work efficiency of a test engineer is improved; meanwhile, UART test interfaces are not required to be reserved on the control main board, so that the design of the control circuit board of the electronic product is simplified to a certain extent, and the cost of the electronic product is saved.
Drawings
FIG. 1 is a schematic diagram of a test board according to one embodiment of the invention;
fig. 2 is a driving circuit diagram of a power indication module according to an embodiment of the present invention.
Detailed Description
The design concept of the invention is as follows: aiming at the problems that in the prior art, electronic products based on a Type-C interface are inconvenient to operate and consume more time in the testing process, the inventor thinks that a test board is designed by utilizing pins compatible with other protocols of the Type-C interface, and the test board comprises a first Type-C connector, a second Type-C connector, a Micro USB connector and a signal conversion module, wherein the first Type-C connector and the Micro USB connector are used for being connected with a test host, and the second Type-C connector is used for being connected with products to be tested; the signal conversion module is connected between the Micro USB connector and the second Type-C connector; the test board provides a test channel for a product to be tested through the Micro USB connector, the signal conversion module and the second Type-C connector, and provides an update channel for a processor of the product to be tested through the first Type-C connector and the second Type-C connector; the signal conversion module is used for converting the USB signal from the test host into a UART signal and sending the UART signal to the product to be tested through the second Type-C connector, converting the UART signal from the product to be tested into a USB signal and sending the USB signal to the test host through the Micro USB connector, so that the electronic product based on the Type-C interface can be tested directly through the Type-C interface, the electronic product can be tested in a complete machine state without detaching a control main board, and meanwhile, the program update of the processor can be realized, the electronic product based on the Type-C interface is more convenient and time-saving to test, and the work efficiency of a test engineer is improved; meanwhile, UART test interfaces are not required to be reserved on the control main board, so that the design of the control circuit board of the electronic product is simplified to a certain extent, and the cost of the electronic product is saved.
Example 1
Fig. 1 is a schematic structural view of a test board according to an embodiment of the present invention, as shown in fig. 1,
the test board 200 comprises a first Type-C connector 201, a second Type-C connector 202, a Micro USB connector 203 and a signal conversion module 204, wherein the first Type-C connector 201 and the Micro USB connector 203 are used for connecting a test host 100, the second Type-C connector 202 is used for connecting a product 300 to be tested, and pins of the second Type-C connector are connected with pins of a Type-C interface of the product to be tested in a one-to-one correspondence manner; the signal conversion module 204 is connected between the Micro USB connector 203 and the second Type-C connector 202;
the test board 200 provides a test channel for a product to be tested through the Micro USB connector 203, the signal conversion module 204 and the second Type-C connector 202, and provides an update channel for a processor of the product to be tested 300 through the first Type-C connector 201 and the second Type-C connector 202;
the signal conversion module 204 is configured to convert the USB signal from the test host 100 into a UART signal, send the UART signal to the product 300 under test via the second Type-C connector 202, convert the UART signal from the product 300 under test into a USB signal, and send the USB signal to the test host 100 via the Micro USB connector 203.
According to the test board shown in fig. 1, compared with the prior art, the electronic product based on the Type-C interface can be tested directly through the Type-C interface, so that the electronic product can be tested in a complete machine state without detaching a control main board, and meanwhile, the program update of a processor can be realized, the electronic product based on the Type-C interface can be tested more conveniently and quickly, the time is saved, and the work efficiency of a test engineer can be improved; meanwhile, UART test interfaces are not required to be reserved on the control main board, so that the design of the control circuit board of the electronic product is simplified to a certain extent, and the cost of the electronic product is saved.
In one embodiment of the present invention, the signal conversion module is a USB-to-UART bridge controller. The signal conversion module can adopt a USB-to-UART bridge controller of the CP2104 model manufactured by Silicon Labs company. The upgrade product of the USB-to-UART bridge controller with the model CP2102 is to be noted that the USB-to-UART bridge controller with the model CP2104 can convert UART signals into USB signals and can also convert USB signals into UART signals. The input signal voltage of the signal conversion module is 1.8V-VDD (the VDD is the reference voltage value of the product to be tested), so that the test board can be compatible with more processors of the product to be tested with different voltage values, and the application range of the test board is enlarged to a certain extent. At present, the reference voltage of the processor chip of the product to be tested has different voltages of 1.8V, 3.3V, 5V and the like, and the signal conversion module of the test board claimed by the application can be compatible with UART signal voltages with voltage values of 1.8V, 3.3V and 5V at the same time and convert the UART signal voltages into corresponding USB signals.
In one embodiment of the present invention, the test board 200 provides an input voltage to the product 300 under test through the update channels provided by the first Type-C connector 201 and the second Type-C connector 202, and sends a program to be updated to the product 300 under test. That is, the refresh channel has two functions, one is to directly transfer the voltage from the test host 100 to the product 300 to be tested, to supply power to the product 300 to be tested, and the other is to send the program to be refreshed from the test host 100 to the product 300 to be tested.
In one embodiment of the present invention, the test board 200 further includes a voltage conversion module 205, where the voltage conversion module 205 is connected to the Micro USB connector 203 and to each internal chip of the test board 200, and the test board 200 obtains an input voltage from the test host 100 through the Micro USB connector 203; the voltage conversion module 205 is configured to perform voltage conversion on an input voltage of the test host 100, and provide an operating voltage for each internal chip of the test board 200.
In one embodiment of the present invention, the voltage conversion module 205 includes a first voltage conversion chip that converts 5V to 3.3V and a second voltage conversion chip that converts 3.3V to 1.8V. In a specific implementation process, the first voltage conversion chip may be a TPS73233 chip, and the second voltage conversion chip may be a TLV70218 chip. The two chips have stable performance and simple peripheral circuits, and can well provide required voltage for the test board. It should be noted that, when the UART reference level in the main chip of the product to be tested outputted by the product to be tested 300 is changed into the voltage with other values, the first voltage conversion chip and the second voltage conversion chip in the voltage conversion module 205 are replaced by corresponding voltage conversion chips. Therefore, the technical scheme of the invention can be compatible with UART signals with various different voltages.
In one embodiment of the invention, a jumper cap position is reserved, and the jumper cap can be utilized to directly provide 5V voltage from the test host as an external power supply for the product to be tested.
In practical application, if the power consumption of the product 300 to be tested is large, once the 5V voltage supplied by the test host 100 cannot meet the requirement of the product 300 to be tested, an external USB power supply is required to supply power to the product 300 to be tested, and the external power supply voltage is usb_5v. However, when the product 300 to be tested is only to execute a simple test instruction, the power consumption is small, and the usb_5v and the 5VIN given by the test host can be directly shorted by a jumper cap (for example, a short-circuit cap). It follows that the meaning of setting the jumper cap position is: under the condition that the power consumption of the product to be tested is low, the product can be powered by one electric wire Cable, convenience is provided for a test engineer, and the work efficiency of the test engineer is improved.
In an embodiment of the present invention, the test board 200 further includes a status switching module 206, where the status switching module 206 is connected to the voltage conversion module 205 and the second Type-C connector 202, and is configured to output a high level or a low level to the second Type-C connector 202 according to a user toggle operation, so as to control the product 300 to be tested to enter a test state or an update state.
It should be noted that, the state switching module 206 is a high-low level switch, one end of the high-low level switch is connected to the voltage conversion module (for example, the low dropout linear voltage stabilizing module), the other end of the high-low level switch is directly connected to the pin of the processor chip in the product to be tested through the second Type-C connector, and when the high-low level switch is turned off, the pin of the processor chip in the product to be tested 300 is at a low level; when the high-low level switch is closed, the processor chip pin of the product 300 to be tested is high. When the program is updated or the instruction is normally input, the starting (Boot) position of the processor chip is different, and the starting (Boot) position of the processor chip is controlled through the high-low level switch. The high-low level switch consists of an SS-1290 toggle switch. The high-low level switch is manually toggled, for example, when the left-toggling high-low level switch is preset, the high-low level switch outputs high level to control the product 300 to be tested to enter a test state, and the product 300 to be tested receives a control instruction sent by the test host 100 and executes corresponding operation according to the control instruction; when the high-low level switch is shifted to the right in advance, the high-low level switch outputs low level to control the product 300 to be tested to enter an updating state, a program to be updated sent by the test host 100 is received, and the processor of the product 300 to be tested performs program updating according to the program to be updated.
In one embodiment of the present invention, the test board 200 further includes a voltage indicating module 207, where the voltage indicating module 207 is composed of a plurality of light emitting diodes and corresponding matching resistors, and each voltage corresponds to one light emitting diode, and when a certain light emitting diode emits light, indicates that the corresponding voltage is powered up.
In this embodiment, the indicated voltages include usb_5v, 3.3V, and 1.8V, which are input from the test host 100. Each voltage value corresponds to one light emitting diode. When the light emitting diode emits light, the voltage representing its indication is powered on. In practical applications, the light emitting diode is an LED lamp, and in order to light the corresponding LED lamp of 1.8V, a simple driving circuit is required to be used for implementation. Since a pressure difference of approximately 2V is required at both ends of the LED lamp if the LED lamp is to be lighted, the pressure difference of 1.8V is too small with respect to the pressure difference of 2V, and there is a possibility that the LED lamp cannot be lighted. A driving circuit is required to be designed through the NMOS transistor. In short, the characteristic that the turn-on voltage of the NMOS is smaller than the turn-on voltage of the diode is utilized, because the NMOS needs about 0.7V to turn on both upper and lower ends, and the diode may need to be close to about 2V. FIG. 2 is a driving circuit diagram of a power indication module according to an embodiment of the present invention, wherein the LED lamp D1 is used for displaying 1.8V voltage as shown in the left circuit diagram in FIG. 2; the LED lamp D2 is used to display a voltage of 3.3V. The NMOS transistor is arranged on the D1 display circuit, the 2 end and the 3 end of the NMOS transistor are conducted only when 1.8V exists, and the actual voltage of the driving diode D1 is 3.3V after the conduction, so that the voltage indication module can normally display 1.8V voltage. As shown in the middle-left circuit diagram of fig. 2, the LED lamp D2 is driven to light without the NMOS transistor when the 3.3V voltage exists.
In addition, when the test board is tested, the pins of the second Type-C connector and the pins of the Type-C interface of the product to be tested are required to be in one-to-one correspondence through the Cable, so that the product to be tested is tested in the whole machine state. It should be noted that, during connection, the pin attribute of Type-C must be cleared, especially the pin sequence of Type-C to Type-C Cable required in the test, because the standard 3.0Cable is not a direct connection in the conventional sense.
In order to make the technical solution of the present invention clearer, a specific example is explained below. The test host 100 mainly divides the debugging of the product 300 to be tested into two modes. One mode is a normal instruction input mode, and the other is a program update mode for the processor of the product 300 to be tested.
Normal command input mode
Manually toggling the state switching module 203 to enable the product 300 to be tested to enter a normal instruction input mode, and the test host 100 sends a 5V working voltage to the voltage conversion module 205 through a Micro USB connector and sends a control instruction in a USB form to the signal conversion module 204; the voltage conversion module 205 converts the 5V voltage from the Micro USB connector into 3.8V by using the TPS73233 chip, further converts the 3.8V voltage into 1.8V voltage by using the TLV70218 chip, and sends the obtained 3.8V voltage and 1.8V voltage to the signal conversion module 204, and at this time, the voltage indication module 207 indicates the power-on states of the 5V, 3.8V and 1.8V voltages, and the signal conversion module 204 converts the USB control command sent by the test host into the UART control command, and sends the converted UART control command to the product 300 to be tested through the second Type-C connector 202. The product 300 to be tested operates according to the control instruction, and sends a feedback signal in the form of UART to the test host 100 through the second Type-C connector, the feedback signal in the form of UART is converted into a USB signal by the signal conversion module 204, and the USB signal is sent to the test host 100 through the Micro USB connector 203.
Program update mode of processor
The state switching module 203 is manually toggled so that the product 300 to be tested enters a program update mode of the processor, the test host 100 sends a program to be updated in a USB signal form to the product 300 to be tested to update an internal program according to the received program to be updated through the first Type-C connector and the second Type-C connector, meanwhile, the update state signal in a UART form of the test host 300 is converted into an update state signal in a USB form through the signal conversion module 204, and the update state signal in the USB form is sent to the test host 100 through the Micro USB connector 203.
It should be noted that, no matter the Type-C interface of the product end to be tested uses the USB2.0 function or the USB3.0 function, the test board claimed by the invention can be used for testing. That is, when the Type-C interface utilizes the USB2.0 function, the idle pin is tested with the 6 pairs of Type-C interfaces; when the Type-C interface utilizes USB3.0 functionality, the RX pin and the TX pin of the Type-C interface are utilized for testing.
In summary, according to the technical scheme provided by the invention, the test board is designed by using the pins of the Type-C interface which can be compatible with other protocols, compared with the prior art, the electronic product based on the Type-C interface can be tested directly through the Type-C interface, the electronic product can be tested in a complete machine state without detaching a control main board, and meanwhile, the program update of a processor can be realized, so that the electronic product based on the Type-C interface is more convenient and time-saving to test, and the work efficiency of a test engineer is improved; meanwhile, UART test interfaces are not required to be reserved on the control main board, so that the design of the control circuit board of the electronic product is simplified to a certain extent, and the cost of the electronic product is saved.
The foregoing is merely a specific embodiment of the invention and other modifications and variations can be made by those skilled in the art in light of the above teachings. It is to be understood by persons skilled in the art that the foregoing detailed description is provided for the purpose of illustrating the invention more fully, and that the scope of the invention is defined by the appended claims.
Claims (8)
1. The test board is characterized by comprising a first Type-C connector, a second Type-C connector, a Micro USB connector and a signal conversion module, wherein the first Type-C connector and the Micro USB connector are used for being connected with a test host, the second Type-C connector is used for being connected with a product to be tested, and pins of the second Type-C connector are connected with pins of a Type-C interface of the product to be tested in a one-to-one correspondence manner; the signal conversion module is connected between the Micro USB connector and the second Type-C connector;
the test board provides a test channel for the product to be tested through the Micro USB connector, the signal conversion module and the second Type-C connector, and provides an update channel for a processor of the product to be tested through the first Type-C connector and the second Type-C connector;
the signal conversion module is used for converting a USB signal from the test host into a UART signal and transmitting the UART signal to the product to be tested through the second Type-C connector, converting the UART signal from the product to be tested into a USB signal and transmitting the USB signal to the test host through the Micro USB connector;
the test board provides input voltage for the product to be tested through the update channels provided by the first Type-C connector and the second Type-C connector, and sends an update program to the product to be tested;
the test board also comprises a voltage conversion module, wherein the voltage conversion module is connected with the Micro USB connector and each internal chip of the test board, and the test board acquires input voltage from the test host through the Micro USB connector;
the voltage conversion module is used for carrying out voltage conversion on the input voltage of the test host and providing working voltage for each internal chip of the test board.
2. The test board of claim 1, further comprising a state switching module, wherein the state switching module is connected to the voltage conversion module and the second Type-C connector, and is configured to output a high level or a low level to the second Type-C connector according to a user toggle operation, so as to control the product to be tested to enter a test state or an update state.
3. The test board of claim 2, further comprising a voltage indicating module, the voltage indicating module comprising a plurality of light emitting diodes and corresponding matching resistors, each voltage corresponding to a light emitting diode, when a light emitting diode emits light, indicating that the corresponding voltage has been powered up.
4. The test board of claim 1, wherein the voltage conversion module includes a first voltage conversion chip that converts 5V to 3.3V and a second voltage conversion chip that converts 3.3V to 1.8V.
5. The test board of claim 4, wherein a jumper cap position is reserved in said voltage conversion module;
and the jumper cap is used for directly providing the 5V voltage from the test host as an external power supply for the product to be tested.
6. The test board of claim 1, wherein said signal conversion module is a USB-to-UART bridge controller.
7. The test board of claim 6, wherein the voltage of the input signal of the signal conversion module is adjustable within a range from 1.8V to a reference voltage value of the product to be tested.
8. The test board of claim 2, wherein said status switching module employs an SS-1290 switch.
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| CN109856522B (en) * | 2019-01-09 | 2021-07-27 | 苏州华兴源创科技股份有限公司 | Test board and test system |
| CN111274076A (en) * | 2020-02-10 | 2020-06-12 | 深圳宝龙达信创科技股份有限公司 | Debugging system |
| CN112763893A (en) * | 2020-12-28 | 2021-05-07 | 南昌黑鲨科技有限公司 | Mainboard test system and method of intelligent terminal |
| CN113702802A (en) * | 2021-07-20 | 2021-11-26 | 昆山丘钛光电科技有限公司 | Adapter plate and test system |
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| CN207457368U (en) * | 2017-09-11 | 2018-06-05 | 歌尔科技有限公司 | A kind of test board |
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| CN107515341A (en) | 2017-12-26 |
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