CN107515341A - A kind of test board - Google Patents
A kind of test board Download PDFInfo
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- CN107515341A CN107515341A CN201710813361.1A CN201710813361A CN107515341A CN 107515341 A CN107515341 A CN 107515341A CN 201710813361 A CN201710813361 A CN 201710813361A CN 107515341 A CN107515341 A CN 107515341A
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 49
- 230000009466 transformation Effects 0.000 claims description 17
- 230000005611 electricity Effects 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 8
- 238000003756 stirring Methods 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 238000005516 engineering process Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 241000208340 Araliaceae Species 0.000 description 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
- 235000003140 Panax quinquefolius Nutrition 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 235000008434 ginseng Nutrition 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a kind of test board.The test board includes the first Type C connectors, the 2nd Type C connectors, a Micro USB connector and signal conversion module, and signal conversion module is connected between Micro USB connectors and the 2nd Type C connectors；Test board provides TCH test channel by Micro USB connectors, signal conversion module and the 2nd Type C connectors for product to be measured, and more new tunnel is provided for the processor of product to be measured by the first Type C connectors and the 2nd Type C connectors；Signal conversion module, usb signal for self-test in future main frame is converted to UART signal and sent through the 2nd Type C connectors to product to be measured, UART signal from product to be measured is converted into usb signal to send to test main frame through Micro USB connectors, electronic product based on Type C interface is directly tested by Type C interface, realization can be tested under complete machine state, the program renewal of processor can be realized simultaneously, it is simple operation, time saving.
Description
Technical field
The present invention relates to electronic technology field, and in particular to a kind of test board.
Background technology
With the rapid development of electronic technology, electronic product transport interface is varied, the periphery of various electronic products connects
Mouth is also to emerge in an endless stream, such as SATA interface, PS/2 interfaces, USB interface, USB Type-C interfaces, RJ45 interfaces, USB interface
With HDMI etc..But as electronic product develops to miniaturization, ultrathin, function diversification direction, product in itself can not
Excessive interface can be designed with.So need a kind of compatibility badly at present by force, powerful, the small interface of physical dimension.
Type-C interfaces have transmission speed fast (theoretical transmission speed is up to 10Gbps), slim regardless of positive anti-plug, body
(8.3*2.5cm), power supply capacity is strong, expandability is strong (its can transmitting audio-video signal, expand to the output of a variety of audio frequency and video and connect
Mouthful, such as HDMI, VGA, DVI interface) the advantages that, by increasing electronics applications.
Type-C interface internals have 12 pairs of pins, when Type-C interfaces possess USB2.0 functions, 6 pairs of pins therein
Compatible USB2.0 functions are defined for, 6 pairs of pins in addition can be idle pin, can be used for other compatible agreements and believe
Number.When Type-C interfaces possess USB3.0 functions, RX pins and TX pins therein can be used for other compatible protocol signals.
It can meet usb signal data transportation requirements although being currently based on the electronic product of Type-C interfaces, test
Or during more new procedures, electronic product is communicated due to that can only be based on UART signal, causes electronic product to be tested or updated
Control mainboard can only be separated complete machine during program, can just be carried out by the reserved UART interface in the control mainboard under separating
Debugging.This adjustment method operation inconvenience, largely wastes time and the energy of engineer, reduces Test Engineer
Operating efficiency.
The content of the invention
The invention provides a kind of test board, to solve the existing electronic product based on Type-C interfaces in test process
It is middle the problem of operation inconvenience, time-consuming larger to be present.
The invention provides a kind of test board, the test board includes the first Type-C connectors, the 2nd Type-C connections
Device, a Micro USB connector and signal conversion module, wherein the first Type-C connectors and the Micro USB
Connector is used for connecting test main frame, and the 2nd Type-C connectors are used to connect product to be measured, and the 2nd Type-
The pin of the pin of C connectors and the Type-C interfaces of product to be measured connects one to one；The signal conversion module is connected to
Between the Micro USB connectors and the 2nd Type-C connectors；
The test board is connected by the Micro USB connectors, the signal conversion module and the 2nd Type-C
Connect device and provide TCH test channel for the product to be measured, pass through the first Type-C connectors and the 2nd Type-C connectors
Processor for the product to be measured provides more new tunnel；
The signal conversion module, for the usb signal from the test main frame to be converted to described in UART signal warp
2nd Type-C connectors are sent to the product to be measured, and the UART signal from the product to be measured is converted into usb signal
Sent through the Micro USB connectors to the test main frame.
Preferably, the test board is provided by the first Type-C connectors and the 2nd Type-C connectors
More new tunnel provides input voltage for the product to be measured, and sends more new procedures to the product to be measured.
Preferably, the test board also includes voltage transformation module, and the voltage transformation module connects the Micro USB
Connector and each inside chip for connecting the test board, the test board is by the Micro USB connectors from described
Input voltage is obtained in test main frame；
The voltage transformation module, it is the test for carrying out voltage conversion to the input voltage of the test main frame
Each inside chip of plate provides operating voltage.
Preferably, the test board also includes state handover module, and the state handover module connects the voltage conversion
Module and the 2nd Type-C connectors, high electricity is exported to the 2nd Type-C connectors for stirring operation according to user
Flat or low level, the product to be measured is controlled to enter test mode or more new state.
Preferably, the test board also includes voltage indicating module, and the voltage indicating module is by multiple light emitting diodes
And corresponding build-out resistor composition, each voltage is corresponding with a light emitting diode, when some lumination of light emitting diode,
Indicate corresponding voltage upper electricity.
Preferably, the voltage transformation module includes that 5V turns 3.3V first voltage conversion chip and 3.3V turns the of 1.8V
Two voltage conversion chips.
Preferably, a jumper cap position is reserved with the voltage transformation module；
The jumper cap, for the 5V voltages from the test main frame to be supplied into described treat directly as external power supply
Survey product.
Preferably, the signal conversion module is that a kind of USB turns UART bridger controllers.
Preferably, reference voltage level model of the voltage of the input signal of the signal conversion module in 1.8V to product to be measured
Enclose interior adjustable.
Preferably, the state handover module is switched using SS-1290.
The beneficial effects of the invention are as follows：Technical scheme is drawn using other compatible agreements of Type-C interfaces
Pin designs a kind of test board, and compared with prior art, the invention enables the electronic product based on Type-C interfaces directly to lead to
Cross Type-C interfaces to be tested, realize that electronic product need not separate control mainboard, can be tested under complete machine state,
The program renewal of processor can be realized simultaneously so that the electronic product test based on Type-C interfaces is more convenient, time saving, has
Help improve the operating efficiency of Test Engineer；Simultaneously without UART test interfaces are reserved in control mainboard again, certain
In degree, the design of electronic product control board is simplified, has saved the cost of electronic product.
Brief description of the drawings
Fig. 1 is a kind of structural representation of test board of one embodiment of the invention；
Fig. 2 is a kind of drive circuit figure of the power supply instruction module of one embodiment of the invention.
Embodiment
The present invention design concept be：For the electronic product in the prior art based on Type-C interfaces in test process
In the presence of operation inconvenience, the problem of larger is taken, inventor expects, is set using the pin of other compatible agreements of Type-C interfaces
A kind of test board is counted, test board includes the first Type-C connectors, the 2nd Type-C connectors, a Micro USB connector
And signal conversion module, wherein the first Type-C connectors and Micro USB connectors are used for connecting test main frame, second
Type-C connectors are used to connect product to be measured；Signal conversion module is connected to Micro USB connectors and the 2nd Type-C connects
Connect between device；Test board is that product to be measured carries by Micro USB connectors, signal conversion module and the 2nd Type-C connectors
For TCH test channel, provide renewal for the processor of product to be measured by the first Type-C connectors and the 2nd Type-C connectors and lead to
Road；Signal conversion module, the usb signal for self-test in future main frame are converted to UART signal and sent out through the 2nd Type-C connectors
Product to be measured is delivered to, the UART signal from product to be measured is converted into usb signal sends to test through Micro USB connectors
Main frame, realize that the electronic product based on Type-C interfaces can be tested directly by Type-C interfaces, realize electronic product
It without control mainboard is separated, can be tested under complete machine state, while the program renewal of processor can be realized so that
Electronic product test based on Type-C interfaces is more convenient, time saving, is favorably improved the operating efficiency of Test Engineer；Simultaneously
Without UART test interfaces are reserved in control mainboard again, to a certain extent, electronic product control board is simplified
Design, has saved the cost of electronic product.
Embodiment one
Fig. 1 is a kind of structural representation of test board of one embodiment of the invention, as shown in figure 1,
Test board 200 includes the first Type-C connectors 201,202, Micro USB of the 2nd Type-C connectors connect
Device 203 and signal conversion module 204 are connect, wherein the first Type-C connectors 201 and Micro USB connectors 203 are used to connect
Test main frame 100, the 2nd Type-C connectors 202 are used to connect product 300 to be measured, and the 2nd Type-C connectors
The pin of pin and the Type-C interfaces of product to be measured connects one to one；Signal conversion module 204 is connected to Micro USB companies
Connect between the Type-C connectors 202 of device 203 and the 2nd；
Test board 200 passes through Micro USB connectors 203, the Type-C connectors 202 of signal conversion module 204 and the 2nd
TCH test channel is provided for product to be measured, is product to be measured by the first Type-C connectors 201 and the 2nd Type-C connectors 202
300 processor provides more new tunnel；
Signal conversion module 204, the usb signal for self-test in future main frame 100 are converted to UART signal through second
Type-C connectors 202 are sent to product 300 to be measured, and the UART signal from product 300 to be measured is converted into usb signal warp
Micro USB connectors 203 are sent to test main frame 100.
Pass through the test board shown in Fig. 1, it is known that, compared to prior art, the invention enables the electricity based on Type-C interfaces
Sub- product can be tested directly by Type-C interfaces, electronic product be realized without control mainboard is separated, in complete machine shape
It can be tested under state, while the program renewal of processor can be realized so that the electronic product based on Type-C interfaces is surveyed
Examination is more convenient, time saving, is favorably improved the operating efficiency of Test Engineer；Simultaneously without again in control mainboard reserve
UART test interfaces, to a certain extent, simplify the design of electronic product control board, saved electronic product into
This.
In one embodiment of the invention, signal conversion module is that a kind of USB turns UART bridger controllers.The signal
Modular converter can use the USB of the CP2104 models of Silicon Labs companies production to turn UART bridger controllers.The type
Number for CP2102 models USB turn UART bridger controllers upgrading products, it is necessary to explanation, the USB of CP2104 models
Can both UART signal be converted to usb signal by turning UART bridgers controller, also usb signal can be converted into UART signal.
The applied signal voltage of signal conversion module is that 1.8V~VDD is adjustable (it should be noted that VDD refers to the ginseng of product to be measured
Examine magnitude of voltage) so that the product treatment device to be measured of the compatible more different magnitudes of voltage of test board, expand to a certain extent
The application of test board.The reference voltage of current product treatment device chip to be measured has the different voltage such as 1.8V, 3.3V and 5V,
And the signal conversion module of the claimed test board of the application can simultaneously compatible magnitude of voltage be 1.8V, 3.3V and 5V UART
Signal voltage, and it is converted into corresponding usb signal.
In one embodiment of the invention, test board 200 is connected by the first Type-C connectors 201 and the 2nd Type-C
The more new tunnel for connecing the offer of device 202 provides input voltage for product 300 to be measured, and sends program to be updated to product 300 to be measured.
That is, more new tunnel has two functions, One function is that the voltage of self-test in future main frame 100 is conveyed directly to production to be measured
Product 300, power supply is provided for product 300 to be measured, another function is that the program to be updated of self-test in future main frame 100 is sent to treating
Survey product 300.
In one embodiment of the invention, test board 200 also includes voltage transformation module 205, voltage transformation module 205
Each inside chip of Micro USB connectors 203 and connecting test plate 200 is connected, test board 200 is connected by Micro USB
Connect device 203 and obtain input voltage from test main frame 100；Voltage transformation module 205, for the input electricity to test main frame 100
Pressure carries out voltage conversion, and operating voltage is provided for each inside chip of test board 200.
In one embodiment of the invention, voltage transformation module 205 includes the first voltage conversion chip that 5V turns 3.3V
Turn 1.8V second voltage conversion chip with 3.3V.During specific implementation, first voltage conversion chip can use
TPS73233 chips, second voltage conversion chip can use TLV70218 chips.Both chip performances are stable, peripheral circuit
Simply, required voltage can be provided for test board well.It should be noted that when the production to be measured of product 300 to be measured output
When UART datums are changed into the voltage of other numerical value inside the master chip of product, as long as converting the voltage into the first electricity in module 205
Pressure conversion chip and second voltage conversion chip replace with corresponding voltage conversion chip.As can be seen here, skill of the invention
Art scheme can compatible various different voltages UART signal.
In one embodiment of the invention, a jumper cap position is also reserved with, can be tested oneself in the future using the jumper cap
The 5V voltages of examination main frame are supplied to product to be measured directly as external power supply.
In actual applications, if in the case where the test power consumption of product 300 to be measured is larger, once test main frame 100 is powered
5V voltages can not meet the needs of product 300 to be measured, then need extraneous USB power source to be powered for product 300 to be measured, this is external
Supply voltage is USB_5V.But when product 300 to be measured is only that the simple test instruction action power consumption of execution is smaller, you can will
The 5VIN that USB_5V and test main frame are given directly uses jumper cap (such as short circuit cap) short circuit.As can be seen here, jumper cap position is set
Meaning be：In the case where product power consumption to be measured is little, product can be powered with an electric wire Cable less, to survey
Examination engineer provides the operating efficiency for conveniently, contributing to lift Test Engineer.
In one embodiment of the invention, test board 200 also includes state handover module 206, state handover module 206
The Type-C connectors 202 of voltage transformation module 205 and the 2nd are connected, for stirring operation to the 2nd Type-C connections according to user
Device 202 exports high level or low level, controls product 300 to be measured to enter test mode or more new state.
It should be noted that state handover module 206 is the switch of low and high level, low and high level switchs a termination voltage and turned
Change the mold block (for example, low pressure difference linearity Voltage stabilizing module), the other end by the 2nd Type-C connectors directly with interiors of products to be measured
Processor chips pin is connected, and when low and high level switches off, the processor chips pin of product 300 to be measured is low level；
When low and high level is switched and closed, the processor chips pin of product 300 to be measured is high level.In more new procedures or normal defeated
When entering to instruct, the position that processor chips start (Boot) is different, passes through the startup of low and high level switch control processor chip
(Boot) position.The switch of the low and high level is made up of a SS-1290 toggle switch.Low and high level switch is artificially to stir
Control, for example, pre-set stir to the left low and high level switch when, low and high level switch output high level, control production to be measured
Product 300 enter test mode, and product 300 to be measured receives the control instruction that test main frame 100 is sent and performed according to control instruction
Corresponding operating；Pre-set stir to the right low and high level switch when, low and high level switch output low level, control product to be measured
300 enter more new state, receive the program to be updated that test main frame 100 is sent, the processor of product 300 to be measured is according to journey to be updated
Sequence enters line program renewal.
In one embodiment of the invention, test board 200 also includes voltage indicating module 207, voltage indicating module 207
It is made up of multiple light emitting diodes and corresponding build-out resistor, each voltage is corresponding with a light emitting diode, when some
During lumination of light emitting diode, corresponding voltage upper electricity is indicated.
It should be noted that in this embodiment, the voltage of instruction has USB_5V voltages, 3.3V that test main frame 100 inputs
Voltage and 1.8V voltages.The corresponding light emitting diode of each magnitude of voltage.When lumination of light emitting diode, its instruction is represented
Voltage is upper electric.In actual applications, light emitting diode is LED, in order that the LED that must correspond to 1.8V is bright, it is necessary to use
One simple drive circuit is realized.If because if thinking that LED is bright, LED both ends need general 2V pressure difference, still
1.8V pressure difference is too small relative to 2V pressure difference, the possibility that LED can not be made bright be present.So need to design one by NMOS tube
Individual drive circuit.In simple terms, the characteristics of being exactly smaller than diode cut-in voltage using NMOS cut-in voltage, because NMOS is needed
Want 0.7V or so can upper and lower ends conducting, diode may need access to 2V or so.Fig. 2 is one embodiment of the invention
A kind of drive circuit figure of power supply instruction module, as shown in the left side circuit diagram in Fig. 2, LED D1 is used to show 1.8V voltages；
LED D2 is used to show 3.3V voltages.A NMOS tube is provided with D1 display circuits, the NMOS only when 1.8V is present
2 ends and the conducting of 3 ends, driving diode D1 reality is 3.3V after turning on, and so ensures that voltage indicating module can be just
Often display 1.8V voltages.As shown in Fig. 2 middle left side circuit diagram, without NMOS tube when 3.3V voltages are present
Drive LED D2 bright.
In addition, when carrying out test board test, it is necessary to by the pin of the 2nd Type-C connectors and product Type-C to be measured
The pin of interface is corresponded by Cable so that product to be measured completes test under complete machine state.Need what is illustrated
It is that, in connection, Type-C pin attribute, especially the Type-C to Type-C needed for test must be cleared
Cable pin sequence, because the 3.0Cable of standard is not traditional direct-connected.
Become apparent from order that obtaining technical scheme, be explained for a specific example below.Survey
Try debugging of the main frame 100 to product 300 to be measured and be broadly divided into both of which.A kind of pattern is normal instructions input pattern, a kind of
For the program generation patterns of the processor of product 300 to be measured.
(1) normal instructions input pattern
Artificially stir state handover module 203 so that product 300 to be measured enters normal instructions input pattern, test main frame
100 are sent 5V operating voltage to voltage transformation module 205 by Micro USB connectors, and the control of USB forms is referred to
Order is sent to signal conversion module 204；Voltage transformation module 205 will come from Micro USB connectors using TPS73233 chips
5V voltage conversions be 3.8V, and then by 3.8V voltage conversions be 1.8V voltages using TLV70218 chips, and will obtain
3.8V voltages and 1.8V voltages are sent to signal conversion module 204, the now instruction of voltage indicating module 207 5V, 3.8V and 1.8V
The power-up state of voltage, the control instruction for the USB forms that signal conversion module 204 sends test main frame are converted to UART forms
Control instruction, and the control instruction for the UART forms being converted to is sent to be measured by the 2nd Type-C connectors 202
Product 300.Product 300 to be measured is operated according to the control instruction, and by the 2nd Type-C connectors to test main frame
100 send the feedback signal of UART forms, and the feedback signal of the UART forms is converted to usb signal through signal conversion module 204,
And the usb signal is sent to test main frame 100 by Micro USB connectors 203.
(2) the program generation patterns of processor
Artificially stir state handover module 203 so that product 300 to be measured enters the program generation patterns of processor, test
Main frame 100 by the first Type-C connectors and the 2nd Type-C connectors by the program to be updated of usb signal form send to
The product 300 to be measured of product 300 to be measured updates internal processes according to the program to be updated that receives, while by the UART forms of itself
Renewal status signal be converted to the renewal status signals of USB forms by signal conversion module 204, and by the USB forms
Renewal status signal is sent to test main frame 100 by Micro USB connectors 203.
It should be noted that no matter the Type-C interfaces at product end to be measured utilize USB2.0 functions or USB3.0 functions,
Tested using the claimed test board of the present invention.That is, when Type-C interfaces utilize USB2.0 functions,
Tested using 6 pairs of idle pins of Type-C interfaces；When Type-C interfaces utilize USB3.0 functions, connect using Type-C
The RX pins and TX pins of mouth are tested.
In summary, technical scheme is a kind of using the pin design of other compatible agreements of Type-C interfaces
Test board, compared with prior art, the invention enables the electronic product based on Type-C interfaces directly to be connect by Type-C
Mouth is tested, and is realized that electronic product need not separate control mainboard, can be tested under complete machine state, while can be real
The program renewal of existing processor so that the electronic product test based on Type-C interfaces is more convenient, time saving, is favorably improved survey
Try the operating efficiency of engineer；Simultaneously without UART test interfaces are reserved in control mainboard again, to a certain extent, simplify
The design of electronic product control board, has saved the cost of electronic product.
The foregoing is only a specific embodiment of the invention, under the above-mentioned teaching of the present invention, those skilled in the art
Other improvement or deformation can be carried out on the basis of above-described embodiment.It will be understood by those skilled in the art that above-mentioned tool
The purpose of the present invention is simply preferably explained in body description, and protection scope of the present invention is defined by scope of the claims.
Claims (10)
- A kind of 1. test board, it is characterised in that the test board include the first Type-C connectors, the 2nd Type-C connectors, One Micro USB connector and signal conversion module, wherein the first Type-C connectors connect with the Micro USB Device is used for connecting test main frame, and the 2nd Type-C connectors are used to connect product to be measured, and the 2nd Type-C connects The pin for connecing the pin of device and the Type-C interfaces of product to be measured connects one to one；The signal conversion module is connected to described Between Micro USB connectors and the 2nd Type-C connectors；The test board passes through the Micro USB connectors, the signal conversion module and the 2nd Type-C connectors TCH test channel is provided for the product to be measured, is institute by the first Type-C connectors and the 2nd Type-C connectors The processor for stating product to be measured provides more new tunnel；The signal conversion module, for the usb signal from the test main frame to be converted into UART signal through described second Type-C connectors are sent to the product to be measured, and the UART signal from the product to be measured is converted into usb signal through institute Micro USB connectors are stated to send to the test main frame.
- 2. test board as claimed in claim 1, it is characterised in that the test board by the first Type-C connectors and The more new tunnel that the 2nd Type-C connectors provide provides input voltage for the product to be measured, and to the product to be measured Send more new procedures.
- 3. test board as claimed in claim 1, it is characterised in that the test board also includes voltage transformation module, the electricity Pressure modular converter connects the Micro USB connectors and connects each inside chip of the test board, and the test board leads to Cross the Micro USB connectors and obtain input voltage from the test main frame；The voltage transformation module, it is the test board for carrying out voltage conversion to the input voltage of the test main frame Each inside chip provides operating voltage.
- 4. test board as claimed in claim 3, it is characterised in that the test board also includes state handover module, the shape State handover module connects the voltage transformation module and the 2nd Type-C connectors, for stirring operation to institute according to user The 2nd Type-C connectors output high level or low level are stated, controls the product to be measured to enter test mode or renewal shape State.
- 5. test board as claimed in claim 4, it is characterised in that the test board also includes voltage indicating module, the electricity Pressure indicating module is made up of multiple light emitting diodes and corresponding build-out resistor, and each voltage is corresponding with a light-emitting diodes Pipe, when some lumination of light emitting diode, indicate corresponding voltage upper electricity.
- 6. test board as claimed in claim 3, it is characterised in that the voltage transformation module includes the first electricity that 5V turns 3.3V Pressure conversion chip and 3.3V turn 1.8V second voltage conversion chip.
- 7. test board as claimed in claim 6, it is characterised in that a jumper cap position is reserved with the voltage transformation module Put；The jumper cap, for the 5V voltages from the test main frame to be supplied into the production to be measured directly as external power supply Product.
- 8. test board as claimed in claim 1, it is characterised in that the signal conversion module is that a kind of USB turns UART bridge joints Device controller.
- 9. test board as claimed in claim 8, it is characterised in that the voltage of the input signal of the signal conversion module exists 1.8V is to adjustable in the range of the reference voltage level of product to be measured.
- 10. test board as claimed in claim 3, it is characterised in that the state handover module is switched using SS-1290.
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| CN201710813361.1A CN107515341B (en) | 2017-09-11 | 2017-09-11 | Test board |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109856522A (en) * | 2019-01-09 | 2019-06-07 | 苏州华兴源创科技股份有限公司 | A kind of test board and test macro |
| CN111274076A (en) * | 2020-02-10 | 2020-06-12 | 深圳宝龙达信创科技股份有限公司 | Debugging system |
| CN112763893A (en) * | 2020-12-28 | 2021-05-07 | 南昌黑鲨科技有限公司 | Mainboard test system and method of intelligent terminal |
| CN113702802A (en) * | 2021-07-20 | 2021-11-26 | 昆山丘钛光电科技有限公司 | Adapter plate and test system |
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| CN202798726U (en) * | 2012-07-27 | 2013-03-13 | 青岛海信宽带多媒体技术有限公司 | CFP optical module tester |
| CN102981093A (en) * | 2012-11-16 | 2013-03-20 | 许继集团有限公司 | Test system for central processing unit (CPU) module |
| US20170138998A1 (en) * | 2015-11-16 | 2017-05-18 | Mediatek Inc. | Testing Device for Connection Interface and Related Testing Methods |
| US20170147526A1 (en) * | 2015-11-20 | 2017-05-25 | Parade Technologies, Ltd. | Service Redirect Over USB Type-C |
| CN206363306U (en) * | 2016-08-30 | 2017-07-28 | 深圳市金立通信设备有限公司 | A kind of terminal and its serial communication circuit |
| CN106535077A (en) * | 2016-11-22 | 2017-03-22 | 歌尔股份有限公司 | Earphone test circuit |
| CN207457368U (en) * | 2017-09-11 | 2018-06-05 | 歌尔科技有限公司 | A kind of test board |
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| CN109856522A (en) * | 2019-01-09 | 2019-06-07 | 苏州华兴源创科技股份有限公司 | A kind of test board and test macro |
| CN111274076A (en) * | 2020-02-10 | 2020-06-12 | 深圳宝龙达信创科技股份有限公司 | Debugging system |
| CN112763893A (en) * | 2020-12-28 | 2021-05-07 | 南昌黑鲨科技有限公司 | Mainboard test system and method of intelligent terminal |
| CN113702802A (en) * | 2021-07-20 | 2021-11-26 | 昆山丘钛光电科技有限公司 | Adapter plate and test system |
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