CN107331732B - 一种垂直型多电流通道SiC光导开关及其制作方法 - Google Patents
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Abstract
本发明公开了一种垂直型多电流通道SiC光导开关及其制作方法,首先采用lift‑off工艺将所需电极图形转移到SiC衬底一侧表面,利用磁控溅射工艺在SiC衬底电极图形上依次制作Ti层和W层,然后在W层上利用真空蒸发镀膜工艺依次制作Au层和NiCr层,从而完成接触电极的制作,对制作完接触电极的SiC衬底进行去胶,使衬底形成多电流通道的,采用多电流通道的方法来减小现有开关中出现的电流丝效应,电流丝效应是电流集中在局部区域,会使得该区域温度升高很多,从而导致开关热损坏,降低器件寿命;多电流通道将电流分散在开关中,减少了热集中,增加了光导开光的寿命;通过在SiC光导开关上设置多电流通道,减小电流密度,从而提高开关耐压能力及可靠性。
Description
技术领域
本发明属于光导开关制备领域,具体涉及一种垂直型多电流通道SiC光导开关及其制作方法。
背景技术
光导开关由于响应快、功率容量大、重复频率高、抖动小、抗干扰能力强等优点,在脉冲功率系统具有十分广阔的应用前景,是当前超快大功率半导体开关领域的研究热点之一。SiC击穿场强大、热导率高,可满足更高电压、更大电流(功率)和高重频的应用需求,是当前最适合制备光导开关的材料。但是通常的横向光导开关耐压能力不足,难以胜任超高电压下使用情况,并且大电流通过开关时的集中现象也容易使器件发热,性能退化。因此,本发明提出一种垂直型多电流通道SiC光导开关来分散电流,减小电流密度,从而提高开关耐压能力及可靠性。
发明内容
本发明的目的在于提供一种垂直型多电流通道SiC光导开关及其制作方法,以克服现有技术的不足。
为达到上述目的,本发明采用如下技术方案:
一种垂直型多电流通道SiC光导开关的制作方法,具体包括以下步骤:
首先对SiC衬底做抛光处理,然后采用lift-off工艺将所需电极图形转移到SiC衬底一侧表面,利用磁控溅射工艺在SiC衬底电极图形上依次制作Ti层和W层,在W层上利用真空蒸发镀膜工艺依次制作Au层和NiCr层,完成接触电极的制作,对制作完接触电极的SiC衬底进行去胶,去胶后在SiC衬底的另一侧表面用蒸发镀膜蒸镀金锗镍合金层,通过退火处理得到SiC光导开关。
进一步的,对SiC衬底做抛光处理,去除SiC衬底表面的氧化物。
进一步的对SiC衬底做抛光处理:将SiC衬底依次通过丙酮、酒精、去离子水各超声清洗5-10min,然后用浓H2SO4浸泡5-10min,再依次通过丙酮、酒精和去离子水各超声清洗5-10min,然后通过氮气吹干。
进一步的,采用lift-off工艺,将所需图形转移到SiC衬底表面,具体的:将抛光后的SiC衬底安装在甩胶机上,在抛光后的SiC衬底表面滴入光刻胶,然后通过甩胶机匀速转动即得到均匀的、没有缺陷的光刻胶膜;将得到光刻胶膜的SiC衬底置于90-110℃的加热台上,烘烤85-95s;用波长为360-370nm的紫外光曝光175-185s,结束后取下样品;将曝光后的SiC衬底置于正胶显影液不少于55s,用去离子水冲洗不少于30s,除掉显影液残留,再用氮气吹干即可得到光刻后带有电极图像的SiC衬底。
进一步的,采用光刻胶为正性光刻胶SUN-110P;甩胶机转速为2000转/min-3000转/min。
进一步的,磁控溅射过程中在Ar气氛围下进行,功率为80W,溅射气压为1.2Pa。
进一步的,对制作完接触电极的SiC衬底进行去胶,将制作完接触电极的SiC衬底依次通过丙酮、酒精、去离子水各超声清洗3-5min,去除圆孔内的胶,同时胶上附着的金属也会脱落。
进一步的,其中酒精浓度大于95%,浓硫酸浓度大于95%。
进一步的,通过在惰性气体氛围下在700-800℃下退火50-70s完成退火处理。
一种垂直型多电流通道SiC光导开关,SiC衬底一面为接触电极,SiC衬底另一面为全电极,SiC衬底中间为多个通光孔,通光孔的半径为80μm,SiC衬底的半径为750μm,所述SiC光导开关的Ti层为40nm、W层为100nm、NiCr层为20nm、Au层为150nm。
与现有技术相比,本发明具有以下有益的技术效果:
本发明一种垂直型多电流通道SiC光导开关及其制作方法,首先采用lift-off工艺将所需电极图形转移到SiC衬底一侧表面,利用磁控溅射工艺在SiC衬底电极图形上依次制作Ti层和W层,然后在W层上利用真空蒸发镀膜工艺依次制作Au层和NiCr层,从而完成接触电极的制作,对制作完接触电极的SiC衬底进行去胶,使衬底形成多电流通道的,采用多电流通道的方法来减小现有开关中出现的电流丝效应,电流丝效应是电流集中在局部区域,会使得该区域温度升高很多,从而导致开关热损坏,降低器件寿命;多电流通道将电流分散在开关中,减少了热集中,增加了光导开光的寿命;去胶后在SiC衬底的另一侧表面用蒸发镀膜蒸镀金锗镍合金层,通过退火处理得到SiC光导开关,通过在SiC光导开关上设置多电流通道,减小电流密度,从而提高开关耐压能力及可靠性。
附图说明
图1为本发明俯视图。
图2为本发明截面示意图。
图3为本发明实物图。
具体实施方式
下面结合附图对本发明做进一步详细描述:
一种垂直型多电流通道SiC光导开关的制作方法,具体包括以下步骤:
首先对SiC衬底做抛光处理,然后采用lift-off工艺将所需电极图形转移到SiC衬底一侧表面,利用磁控溅射工艺在SiC衬底电极图形上依次制作Ti层和W层,在W层上利用真空蒸发镀膜工艺依次制作Au层和NiCr层,完成接触电极的制作,对制作完接触电极的SiC衬底进行去胶,去胶后在SiC衬底的另一侧表面用蒸发镀膜蒸镀金锗镍合金层,通过退火处理得到SiC光导开关。
具体的,对SiC衬底做抛光处理,去除SiC衬底表面的氧化物;
首先将SiC衬底依次通过丙酮、酒精、去离子水各超声清洗5-10min,然后用浓H2SO4浸泡5-10min,再依次通过丙酮、酒精和去离子水各超声清洗5-10min,然后通过氮气吹干,置于光学显微镜下观察,看表面是否洁净,采用这种处理方法除去SiC衬底表面的氧化物;其中酒精浓度大于95%,浓硫酸浓度大于95%;
然后采用lift-off工艺,将所需图形转移到SiC衬底表面,具体的:将抛光后的SiC衬底安装在甩胶机上,在抛光后的SiC衬底表面滴入光刻胶,然后通过甩胶机匀速转动即得到均匀的、没有缺陷的光刻胶膜;采用光刻胶为正性光刻胶SUN-110P;甩胶机转速为2000转/min-3000转/min;将得到光刻胶膜的SiC衬底进行前烘:将样品置于90-110℃的加热台上,烘烤85-95s;通过前烘挥发光刻胶膜中的溶剂,减小灰尘对光刻胶膜的污染,同时由于光刻胶膜高速旋转而产生的应力,提高了光刻胶膜与衬底之间的黏附性;使用URE2000光刻机,用显微镜将前烘后的SiC衬底与掩模板上所选图形进行对准,然后用波长为360-370nm的紫外光曝光175-185s,结束后取下样品,要注意不能接触短波长光源以免发生二次曝光;将曝光后的SiC衬底置于正胶显影液不少于55s,用去离子水冲洗不少于30s,除掉显影液残留,再用氮气吹干即可得到光刻后带有电极图像的SiC衬底,在显微镜下观测光刻后的图形是否完整;
利用磁控溅射工艺在SiC衬底电极图形上依次制作Ti层和W层,磁控溅射过程中在Ar气氛围下进行,功率为20-180W,溅射气压为1.1-1.3Pa;
对制作完接触电极的SiC衬底进行去胶,将制作完接触电极的SiC衬底依次通过丙酮、酒精、去离子水各超声清洗3-5min,去除圆孔内的胶,同时胶上附着的金属也会脱落,其中酒精浓度大于95%,浓硫酸浓度大于95%。
在SiC衬底的另一侧面采用真空蒸发镀膜蒸镀金锗镍合金层;真空度为5×10-4Pa。
制作完成的SiC衬底与金属层之间的接触是肖特基接触,通过在惰性气体氛围下在700-800℃下退火50-70s,使金属与半导体间形成电阻较小的化合物来降低接触电阻,所得到的SiC光导开关最小比接触电阻率为6.86×10-7Ω·cm2,实现了良好的欧姆接触,其中惰性气体为氩气或氮气中的一种。
如图1至图3所示,根据一种垂直型多电流通道SiC光导开关的制作方法制备的垂直型多电流通道SiC光导开关,SiC衬底一面为接触电极,SiC衬底另一面为全电极,SiC衬底中间为多个通光孔,通光孔的半径为80μm,SiC衬底的半径为750μm,所述SiC光导开关的Ti层为40nm、W层为100nm、NiCr层为20nm、Au层为150nm。
Claims (6)
1.一种垂直型多电流通道SiC光导开关的制作方法,其特征在于,具体包括以下步骤:
首先对SiC衬底做抛光处理,将SiC衬底依次通过丙酮、酒精、去离子水各超声清洗5-10min,然后用浓H2SO4浸泡5-10min,再依次通过丙酮、酒精和去离子水各超声清洗5-10min,然后通过氮气吹干,去除SiC衬底表面的氧化物,然后采用lift-off工艺将所需电极图形转移到SiC衬底一侧表面:将抛光后的SiC衬底安装在甩胶机上,在抛光后的SiC衬底表面滴入光刻胶,然后通过甩胶机匀速转动即得到均匀的、没有缺陷的光刻胶膜;将得到光刻胶膜的SiC衬底置于90-110℃的加热台上,烘烤85-95s;然后用波长为360-370nm的紫外光曝光175-185s,结束后取下样品;将曝光后的SiC衬底置于正胶显影液不少于55s,用去离子水冲洗不少于30s,除掉显影液残留,再用氮气吹干即可得到光刻后带有电极图像的SiC衬底,
利用磁控溅射工艺在SiC衬底电极图形上依次制作Ti层和W层,在W层上利用真空蒸发镀膜工艺依次制作Au层和NiCr层,完成接触电极的制作,对制作完接触电极的SiC衬底进行去胶,去除圆孔内的胶;磁控溅射过程中在Ar气氛围下进行,功率为80W,溅射气压为1.2Pa;对制作完接触电极的SiC衬底进行去胶,去胶后在SiC衬底的另一侧表面用真空蒸发镀膜蒸镀金锗镍合金层,通过退火处理得到SiC光导开关;SiC光导开关的SiC衬底一面为接触电极,SiC衬底另一面为全电极,SiC衬底中间为多个通光孔。
2.根据权利要求1所述的一种垂直型多电流通道SiC光导开关的制作方法,其特征在于,采用光刻胶为正性光刻胶SUN-110P;甩胶机转速为2000转/min-3000转/min。
3.根据权利要求1所述的一种垂直型多电流通道SiC光导开关的制作方法,其特征在于,对制作完接触电极的SiC衬底进行去胶,将制作完接触电极的SiC衬底依次通过丙酮、酒精、去离子水各超声清洗3-5min,去除圆孔内的胶,同时胶上附着的金属也会脱落。
4.根据权利要求3所述的一种垂直型多电流通道SiC光导开关的制作方法,其特征在于,其中酒精浓度大于95%,浓硫酸浓度大于95%。
5.根据权利要求1所述的一种垂直型多电流通道SiC光导开关的制作方法,其特征在于,通过在惰性气体氛围下在700-800℃下退火50-70s完成退火处理。
6.一种基于权利要求1所述的制作方法制作的SiC光导开关,其特征在于,SiC衬底一面为接触电极,SiC衬底另一面为全电极,SiC衬底中间为多个通光孔,通光孔的半径为80μm,SiC衬底的半径为750μm,所述SiC光导开关的Ti层为40nm、W层为100nm、NiCr层为20nm、Au层为150nm。
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5028971A (en) * | 1990-06-04 | 1991-07-02 | The United States Of America As Represented By The Secretary Of The Army | High power photoconductor bulk GaAs switch |
CN101315887A (zh) * | 2008-05-30 | 2008-12-03 | 西安电子科技大学 | 半绝缘SiC半导体器件的欧姆接触制作方法 |
CN101567383A (zh) * | 2008-04-24 | 2009-10-28 | 中国科学院物理研究所 | 一种用于碳化硅的欧姆电极结构及其制造方法 |
CN105244387A (zh) * | 2015-11-23 | 2016-01-13 | 重庆大学 | 一种光电导探测器 |
CN105702712A (zh) * | 2016-01-29 | 2016-06-22 | 大连理工大学 | 一种提高碳化硅半导体欧姆接触特性的方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100375348C (zh) * | 2004-09-30 | 2008-03-12 | 中国科学院半导体研究所 | 一次外延形成半导体激光器和模斑转换器的方法 |
CN103624388B (zh) * | 2013-11-13 | 2015-09-30 | 中国科学院合肥物质科学研究院 | 一种基于电致发热效应的一维纳米材料的焊接方法 |
CN103866247B (zh) * | 2014-03-12 | 2016-06-22 | 江阴职业技术学院 | 通过生物矿化法制备超疏水表面的方法 |
CN105842228A (zh) * | 2016-05-17 | 2016-08-10 | 南京信息工程大学 | 基于表面等离激元效应的纳米环形腔sers基底及其制作方法 |
-
2017
- 2017-07-06 CN CN201710547436.6A patent/CN107331732B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5028971A (en) * | 1990-06-04 | 1991-07-02 | The United States Of America As Represented By The Secretary Of The Army | High power photoconductor bulk GaAs switch |
CN101567383A (zh) * | 2008-04-24 | 2009-10-28 | 中国科学院物理研究所 | 一种用于碳化硅的欧姆电极结构及其制造方法 |
CN101315887A (zh) * | 2008-05-30 | 2008-12-03 | 西安电子科技大学 | 半绝缘SiC半导体器件的欧姆接触制作方法 |
CN105244387A (zh) * | 2015-11-23 | 2016-01-13 | 重庆大学 | 一种光电导探测器 |
CN105702712A (zh) * | 2016-01-29 | 2016-06-22 | 大连理工大学 | 一种提高碳化硅半导体欧姆接触特性的方法 |
Non-Patent Citations (2)
Title |
---|
"Design and Evaluation of a Compact Silicon Carbide Photoconductive Semiconductor Switch";Colt James;《IEEE TRANSACTIONS ON ELECTRON DEVICES》;20110228;图1 * |
"Development and Efficiency of High Voltage Silicon Carbide Photoconductive Semiconductor Switches";William W. Sullivan III;《Texas Tech University博士学位论文》;20130531;第4页第2段至第6页第1段,第46页第1段至50页第2段,图2.1、5.4 * |
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