CN107238558A - A kind of Multifunctional particulate matter sampling apparatus based on CCD/CMOS chips - Google Patents
A kind of Multifunctional particulate matter sampling apparatus based on CCD/CMOS chips Download PDFInfo
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- CN107238558A CN107238558A CN201710511572.XA CN201710511572A CN107238558A CN 107238558 A CN107238558 A CN 107238558A CN 201710511572 A CN201710511572 A CN 201710511572A CN 107238558 A CN107238558 A CN 107238558A
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- 239000013618 particulate matter Substances 0.000 title claims abstract description 32
- 238000005070 sampling Methods 0.000 title abstract description 20
- 239000000463 material Substances 0.000 claims description 7
- 230000001681 protective effect Effects 0.000 claims description 2
- 239000002245 particle Substances 0.000 abstract description 33
- 230000004907 flux Effects 0.000 abstract description 13
- 238000004458 analytical method Methods 0.000 abstract description 4
- 238000004062 sedimentation Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 3
- 239000000443 aerosol Substances 0.000 abstract description 2
- 230000004888 barrier function Effects 0.000 abstract description 2
- 238000003384 imaging method Methods 0.000 abstract description 2
- 238000002347 injection Methods 0.000 abstract 1
- 239000007924 injection Substances 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 239000004744 fabric Substances 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000002795 fluorescence method Methods 0.000 description 2
- 238000003947 neutron activation analysis Methods 0.000 description 2
- 238000000190 proton-induced X-ray emission spectroscopy Methods 0.000 description 2
- 206010061216 Infarction Diseases 0.000 description 1
- 230000001464 adherent effect Effects 0.000 description 1
- 239000000809 air pollutant Substances 0.000 description 1
- 231100001243 air pollutant Toxicity 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 208000006673 asthma Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000000711 cancerogenic effect Effects 0.000 description 1
- 231100000315 carcinogenic Toxicity 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000002189 fluorescence spectrum Methods 0.000 description 1
- 239000007850 fluorescent dye Substances 0.000 description 1
- 238000001215 fluorescent labelling Methods 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000007574 infarction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 210000000653 nervous system Anatomy 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000000241 respiratory effect Effects 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
- G01N15/0227—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging using imaging, e.g. a projected image of suspension; using holography
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/04—Investigating sedimentation of particle suspensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
-
- G01N15/075—
Abstract
The invention discloses a kind of Multifunctional particulate matter sampling apparatus based on CCD/CMOS chips.Its primary structure is：Nozzle (1), diaphragm (2), CCD/CMOS chips (3), crash panel (4), seal washer (6) and base (5).When hit sampling, aspiration pump is connected at the gas outlet of base, the air of carrier band particulate matter flows through nozzle injection, the stop of plate of being collided will move along a curved path to get around barrier, particulate matter in air-flow is because of its effect of inertia, there is the trend that linear motion is kept on original direction, particulate matter diameter is bigger, the inertia being had is also bigger, it is possible to be flushed on crash panel and is knocked plate trapping, due to being equipped with CCD/CMOS chips on crash panel, it can obtain being knocked the particle size distribution that plate is trapped by counting the Pixel Dimensions being blocked and number.When carrying out sedimentation sampling, by the base for being provided with CCD/CMOS chips among sampling environment, the settling amount of different diameter airborne particle is obtained again by the imaging of analysis CCD/CMOS chips.The present invention can effectively, easily measure the concentration and Flux of aerosol particle in air, with stable collecting efficiency.
Description
(1) technical field
The invention belongs to environmental monitoring technology field, it is related to a kind of Multifunctional particulate matter being imaged based on CCD/CMOS chips
Sampler, specifically, is related to the measuring concentration of granules in certain based on collision theory and the Flux measurement settled based on particulate matter.
(2) background technology
Contemporary epidemiological study shows, the exposure of particulate matter and various respiratory road and angiocardiopathy in air pollutants
There are very strong relevance, including PFT decline, asthma, miocardial infarction.Meanwhile, the particulate pollutant in air can adsorb sky
Nervous system and carcinogenic harmful substance can be damaged in gas, is propagated in atmosphere.Impact sampler is the normal of particle sampling
With instrument, designed according to aerodynamic principle, sampling air flow is by hitting during disk, wherein larger particle is made due to inertia
With, the surface for hitting disk is directly hit and rests on, and less particle is then passed through with air stream, is reached next stage and is hit disk.
The particulate of different aerodynamic sizes is separated and collected on sampling films at different levels according to aerodynamic principle, passes
The method of system is needed to take out on diaphragm, and the analysis of weight and particle size size is carried out with precision balance and microscope.This hair
It is bright to be combined CCD/CMOS chips and shock disk, directly while sampling, caught by being calculated to the analysis that chip is imaged
Obtain the particle diameter distribution and concentration of particulate matter.
In addition, the particulate matter sedimentation in air can cause to damage to some materials, such as some electronic components, particularly
In the semiconductor industry.Meanwhile, particulate matter is settled in the environment has important shadow with settling flux exposure also to personnel and health
Ring.For the measurement of particulate matter Flux, the method commonly used at present has fluorescence method, neutron activation analysis (NAA) and proton
Excite X fluorescence spectrum analytic approach (PIXE).This several method operate it is all more complicated, such as fluorescence method need first to
Grain thing carries out fluorescence labeling, extracts and carry out afterwards the measurement of fluorescence volume again, and the requirement of NAA and PIXE all to analysis of material is very
The high and special large-scale instrument of needs.High-resolution CCD/CMOS chips are exposed in air by the present invention, are settled by analyzing
The pixel distribution that particulate matter is blocked calculates the Flux of different diameter airborne particle, is particulate in air Flux
Measurement provides a kind of simple, efficiently method.
(3) content of the invention
The technical problem of solution
It is an object of the invention to provide a kind of Multifunctional particulate matter sampler；It can be realized for collection on crash panel
The particle diameter distribution of grain thing carries out direct measurement, can also realize the measurement of particulate in air Flux.
Technical scheme
To realize object above, the present invention is achieved by the following technical programs：
(1) a kind of particles hit formula single-stage samplers of, including crash panel, base, nozzle and CCD/CMOS chips.
(2) bases are the tubular structure of upper end open, and gas outlet is provided with tubular structure bottom surface or side wall；Nozzle
Be arranged at the top of base, between it is detachable, be the tubular structure of both ends open, the radial ruler of the internal cavity in lower end exit
The very little radial dimension more than upper end.
(3) crash panels are arranged at below nozzle, are installed on base, and CCD/CMOS chips are installed in upper surface, while core
Pasting protective film and adhesion material is scribbled on piece.
(4) nozzles are 1~5 to the ratio between the distance and nozzle diameter of crash panel (S/D)；Nozzle length and nozzle diameter it
It is 0~1 than (L/D)；The reynolds number Re of nozzle is in the range of 500~3000.
(5) is when hit sampling, connects aspiration pump at the gas outlet of base, the air of carrier band particulate matter flow through into
After inlet nozzle is projected, because the stop for the plate that is collided will move along a curved path to get around barrier, when air-flow is turned,
The particulate matter of all sizes has the trend that linear motion is kept on original direction because of its effect of inertia in air-flow；Particulate matter
Diameter is bigger, and the inertia having is also bigger, and the cut-off distance of particulate matter is longer, the big particle to a certain extent of cut-off distance
Thing, it is possible to be flushed on crash panel, so as to be knocked plate trapping；Due to being equipped with CCD/CMOS chips, Pixel Dimensions on crash panel
, it is known that can obtain being knocked the particle size distribution that plate is trapped by counting the Pixel Dimensions being blocked and number, enter one
The volume according to sample gas is walked, the concentration C (#/m3) for the particulate matter that is captured is tried to achieve；And smaller particle can follow air-flow
From gas outlet discharge, it is collected further to filter paper or into other detecting instruments；Hit sampler collecting efficiency with
S/D, L/D, Re and stokes number Stk are relevant, under the setting of step (4), hit sampler collecting efficiency it is main by
Stk determines that the Stk (50) that sampling efficiency is 50% can be obtained between 0.2~0.3 according to Stk (50) value and its expression formula
This hits the cutting diameter of sampler.
(6) nozzle is removed when carrying out sedimentation sampling, is directly exposed to the base for being provided with CCD/CMOS chips by
Among the environment for needing progress Flux sampling；Equally, by count the Pixel Dimensions being blocked on CCD/CMOS chips and
Number obtains the particle diameter distribution of particulate matter, further according to sedimentation time and chip area can calculate Flux J (#/
m2·h)。
Beneficial effect
The present invention combines CCD/CMOS chips with sampling instrument is hit, and can directly be calculated and hit by image recognition technology
The particle size distribution that sampling instrument is trapped is hit, particle is separated only by incising control supplemented with the general sampling instrument that hits
The simple function of thing；It is easy to operate simple there is provided a kind of measuring method of new particulate matter Flux.
(4) illustrate
Fig. 1 is schematic structural view of the invention.1 is nozzle in figure, and 2 be the diaphragm for scribbling adhesion material, and 3 be CCD/
CMOS chip, 4 be crash panel, and 5 be base.
Fig. 2 is the image by hitting the particulate matter of sampling on crash panel CMOS chip.
Fig. 3 is the bianry image of image on CMOS chip.
(5) embodiment
Below in conjunction with the accompanying drawings and example, the embodiment to the present invention is described in further detail, and following instance is used
In the explanation present invention, but it is not limited to the scope of the present invention.After the content of the invention lectured has been read, the skill of this area
Art personnel can make various changes or modifications to the present invention, and these equivalent form of values equally fall within the application appended claims institute
The scope of restriction.
(1) as shown in fig.1, the present invention be a kind of Multifunctional particulate matter sampling apparatus based on CCD/CMOS chips, its
Primary structure is followed successively by from top to bottom：Nozzle, diaphragm, CCD/CMOS chips, crash panel, seal washer and base are constituted.
(2) nozzles 1 are the tubular structure of both ends open, and upper end entrance is cylinder, and the radial dimension in lower end exit is big
It is bolted, is sealed with seal washer 6 in upper end and with base 5.
(3) bases 5 are similarly the tubular structure of both ends open, and upper end open is connected for cylinder, and nozzle 1, and lower end is set
Put gas outlet.
(4) crash panels 4 are installed on base by hollow out support, under nozzle；Imager chip uses CMOS chip,
It is installed on crash panel, and with diaphragm and adhesion material；Chip size is 2738.4 μm of 3673.6 μ m, and pixel is
2592 × 1944, therefore the size of each pixel is 1.4 μm of 1.4 μ m；By observing the picture that particulate matter is covered under illumination condition
Vegetarian refreshments, you can obtain the size of particulate matter, minimum can differentiate the particle that particle diameter is 1.4 μm.
(5) nozzles are 1 to the ratio between the distance and nozzle diameter of crash panel (S/D), the ratio between nozzle length and nozzle diameter
(L/D) it is 1；Nozzle flow Q is 3L/min, and nozzle diameter D is 2.22mm, and reynolds number Re is 1914.
(6) carry particulate matter air by crash panel when, particle follow the streamline of fluid or separated with streamline by
Crash panel is trapped, and is mainly determined in the present invention by stokes number Stk,Wherein, ρpIt is aerosol particle
Thing density, dpIt is particle diameter, U is the air velocity in nozzle, and η is the dynamic viscosity of air, DjFor nozzle diameter；Trapping effect
When rate is 50%, corresponding particle size is referred to as equivalent cutting diameter d (50), it is believed that the particle more than d (50) is whole
Plate trapping is knocked, and the particle less than d (50) follows the streamline of fluid to be discharged from gas outlet；It is right when arresting efficiency is 50%
The Stk (50)=0.23 answered, according to formulaEquivalent cutting diameter can be obtained, in the present invention d
=2.5 μm (50).
(7) cleans cmos sensor surface protection film, adherent grease in drop；Pan outlet is connected into sampling pump, adopted
Sample flow is 3L/min, and sample 1min, obtains the imaging of CMOS chip surface, such as Fig. 2.
(8) is handled image using Matlab softwares, and brightness of image regulation, Otsu threshold segmentation, two are carried out respectively
It is worth image completion, obtains Fig. 3.
(9) does connected region processing to Fig. 3 and particulate matter is numbered, to the number of pixel shared by different numbering particles
Counted, due to pixel point areas, it is known that the area A of different numbering particulate matters can be obtained；According to formulaCan
With the diameter d for the equivalent circular granular for obtaining same projection areae, and then obtain different diameter airborne particle frequency and concentration point
Cloth, as shown in table 1.
The different diameter airborne particle frequency of table 1 and concentration distribution
| Particle diameter (μm) | Frequency (individual) | Concentration (#/m3) |
| 3~5 | 179 | 59667 |
| 5~10 | 121 | 40333 |
| 10~25 | 53 | 17667 |
| 25~50 | 9 | 3000 |
| ＞ 50 | 4 | 1333 |
(10) the present invention can also be measured to the Flux of particulate matter in the environment, the nozzle of device be removed, directly
Connect CMOS chip among environment, allow particulate matter to be settled thereon；By taking Fig. 1 as an example, it is assumed that Fig. 1 is clean CMOS cores
Piece exposes the image after 120h in atmosphere, and different diameter airborne particle frequency point can be obtained also according to step (8), (9)
Cloth, by formulaN is particulate matter number, and T is open-assembly time, and S is CMOS chip area, you can obtain different-grain diameter particle
The Flux distribution of thing, as shown in table 2.
The different diameter airborne particle frequency of table 2 and Flux distribution
| Particle diameter (μm) | Frequency (individual) | Flux (#/m2·h) |
| 3~5 | 179 | 149167 |
| 5~10 | 121 | 100833 |
| 10~25 | 53 | 44167 |
| 25~50 | 9 | 7500 |
| ＞ 50 | 4 | 3333 |
Claims (5)
1. a kind of Multifunctional particulate matter sampler based on CCD/CMOS chips, it is characterised in that：
Including crash panel (4), base (5), nozzle (1) and CCD/CMOS chips (3)；
Base (5) is the tubular structure of upper end open, and gas outlet is provided with tubular structure bottom surface or side wall；Nozzle (1) is set
Be placed in the top of base, between it is detachable, be the tubular structure of both ends open, the radial dimension of the internal cavity in lower end exit
More than the radial dimension of upper end；
Crash panel (4) is arranged at below nozzle, is installed on base, and CCD/CMOS chips (3) are installed in upper surface.
2. sampler as claimed in claim 1, it is characterised in that：Nozzle is to the ratio between distance and the nozzle diameter of crash panel (S/
D it is) 1~5.
3. sampler as claimed in claim 1, it is characterised in that：The ratio between nozzle length and nozzle diameter (L/D) are 0~1.
4. sampler as claimed in claim 1, it is characterised in that：The reynolds number Re of nozzle is in the range of 500~3000.
5. sampler as claimed in claim 1, it is characterised in that：Pasting protective film and adhesiveness material is scribbled on CCD/CMOS chips
Material.
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| CN201710511572.XA CN107238558A (en) | 2017-06-23 | 2017-06-23 | A kind of Multifunctional particulate matter sampling apparatus based on CCD/CMOS chips |
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|---|---|---|---|
| CN201710511572.XA CN107238558A (en) | 2017-06-23 | 2017-06-23 | A kind of Multifunctional particulate matter sampling apparatus based on CCD/CMOS chips |
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Cited By (4)
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| CN110057730A (en) * | 2019-03-12 | 2019-07-26 | 天津大学 | A kind of human body particulate matter active inhaled concentration test method |
| CN111999221A (en) * | 2020-08-20 | 2020-11-27 | 南华大学 | Impact distance adjustable inertial impactor and dust concentration measuring method |
| CN113310853A (en) * | 2020-02-27 | 2021-08-27 | 北京慧荣和科技有限公司 | Aerodynamic particle size testing device |
| CN114018771A (en) * | 2021-10-29 | 2022-02-08 | 中车青岛四方机车车辆股份有限公司 | Method for detecting liquid particles in indoor flow field |
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Application publication date: 20171010 |